Test board card and test machine
By using a linked list architecture to pre-store configuration information data in the test board, the problem of low test efficiency caused by the long test process time in the existing technology is solved, and a more efficient test process is achieved.
Patent Information
- Application Number
- CN202420414699.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-04
- Publication Date
- 2025-01-21
- Estimated Expiration
- 2034-03-04
AI Technical Summary
In existing semiconductor automation testing, the test process time is long, resulting in inefficient testing.
Design a test board that uses a linked list architecture to store configuration information data in a storage device in advance. During the test process, there is no need to repeatedly send data from the main control board of the test machine. The linked list acquisition module and information acquisition module achieve data efficiency. acquisition and processing.
By reducing the number of data releases in the test process, the test time is significantly reduced and the test efficiency is improved.
Smart Images
Figure CN222380289U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of semiconductor testing technology, and in particular to a testing board and a testing machine. Background Art
[0002] Semiconductor automated testing refers to the use of automatic test equipment (ATE) to test various parameters of the device under test (DUT) to eliminate defective products and control the factory quality of semiconductor devices. In the tester, the configuration information of each test item is usually directly sent through the tester main control board to configure the relevant test parameters. Each time a piece of graphic data is run, the data used needs to be sent from the tester main control board to the tester digital board in real time. The test process takes a long time and has the disadvantage of low test efficiency. Utility Model Content
[0003] Based on this, it is necessary to provide a test board and a test machine that can improve the test efficiency in order to solve the above problems.
[0004] A test board, comprising:
[0005] A storage device storing linked list data and configuration information data, each of the linked list data including address data corresponding to the configuration information data;
[0006] The device is set up, including a linked list acquisition module that receives the linked list data returned by the storage device according to the linked list read instruction and sends data reading information to the storage device, and an information acquisition module that receives configuration information data returned by the storage device corresponding to the data reading information and sends a data packet to a functional module; wherein the linked list acquisition module is connected to the storage device, and the information acquisition module is connected to the storage device and the functional module.
[0007] In one of the embodiments, the linked list acquisition module includes a first cache unit and a delinking list information unit;
[0008] The first cache unit is connected to the storage device to receive the linked list data;
[0009] The delink table information unit connects the first cache unit and the storage device, and sends the data reading information to the storage device.
[0010] In one of the embodiments, the information acquisition module includes a second cache unit and a header adding unit;
[0011] The second cache unit is connected to the storage device to receive the configuration information data;
[0012] The packet header adding unit connects the second cache unit and the functional module, and sends the data packet to the functional module.
[0013] In one embodiment, the setting device also includes an arbitration unit, which connects the first cache unit, the delinking table information unit, the second cache unit and the storage device, and the arbitration unit performs back pressure communication with the storage device according to the remaining space of the first cache unit, receives the linked list data and transmits it to the first cache unit; and / or the arbitration unit performs back pressure communication with the storage device according to the remaining space of the second cache unit, receives the configuration information data and transmits it to the second cache unit.
[0014] In one embodiment, the first cache unit and / or the second cache unit is a FIFO unit.
[0015] In one embodiment, the storage device includes a storage unit and a reading module, and the reading module is connected to the storage unit, the linked list acquisition module and the information acquisition module.
[0016] In one of the embodiments, the storage unit includes storage blocks for storing the linked list data and the configuration information data respectively, and at least two pieces of configuration information data corresponding to each of the linked list data are respectively stored in the storage blocks.
[0017] In one embodiment, the reading module includes a first reading unit and a second reading unit, the first reading unit is connected to the linked list acquisition module and the storage unit, and the second reading unit is connected to the information acquisition module and the storage unit.
[0018] A testing machine comprises the above-mentioned testing board.
[0019] In one embodiment, the test machine also includes a main control board and a host computer, the host computer is connected to the main control board, the main control board is connected to the storage device of the test board, and sends the linked list data and configuration information data to the storage device for storage.
[0020] The above-mentioned test board and test machine, the setting device in the test board includes a linked list acquisition module and an information acquisition module, the linked list acquisition module receives the linked list data returned by the storage device according to the linked list read instruction, and sends the data reading information to the storage device; the information acquisition module receives the configuration information data returned by the storage device corresponding to the data reading information, and sends the data packet to the functional module. The configuration information data is stored in the storage device in advance through the linked list architecture, and there is no need to repeatedly send data from the main control board of the test machine during the test process, which reduces the test process time and effectively improves the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS
[0021] Figure 1 A structural block diagram of a test board in an embodiment;
[0022] Figure 2 A schematic diagram of a linked list architecture in an embodiment;
[0023] Figure 3 The figure is a schematic diagram of the structure of a test board in one embodiment. DETAILED DESCRIPTION
[0024] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.
[0025] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application.
[0026] It can be understood that the “connection” in the following embodiments should be understood as “electrical connection”, “communication connection”, etc. if the connected circuits, modules, units, etc. have electrical signals or data transmission between each other.
[0027] When used herein, the singular forms "a", "an", and "said / the" may also include plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "include / comprise" or "have" etc. specify the presence of stated features, wholes, operations, components, parts or combinations thereof, but do not exclude the possibility of the presence or addition of one or more other features, wholes, operations, components, parts or combinations thereof.
[0028] In one embodiment, Figure 1As shown, a test board 100 is provided, including a storage device 110 and a setting device 120, the storage device 110 stores linked list data and configuration information data, each linked list data includes address data corresponding to the configuration information data, the configuration information data is used to configure register data of the corresponding functional module, and the address data can be the starting address and ending address of the configuration information data, or the starting address and data length of the configuration information data. The test board 100 can also include a functional module 130, and the setting device 120 includes a linked list acquisition module 122 for receiving the linked list data returned by the storage device 110 according to the linked list read instruction and sending data read information to the storage device 110, and an information acquisition module 124 for receiving the configuration information data returned by the storage device 110 corresponding to the data read information and sending a data packet to the functional module 130; wherein the linked list acquisition module 122 is connected to the storage device 110, and the information acquisition module 124 is connected to the storage device 110 and the functional module 130. Specifically, the host computer of the test machine can be connected to the storage device 110 through the main control board. Before the test machine performs the test, the host computer generates the linked list data and the configuration information data, which are stored in the storage device 110 through the main control board. During the test, only the setting device 120 needs to be set to take out the configuration information data from the storage device 110, which greatly improves the efficiency of the test process. The host computer can store the configuration information data required for different test functions in the specified position of the storage device 110, so that the setting device 120 can retrieve the configuration information data and send it to the corresponding functional module 130. The storage device 110 can specifically use a DDR (Double Data Rate) storage unit for data storage, or other types of storage media for data storage. The setting device 120 can specifically use devices such as FPGA (Field-Programmable Gate Array), and the host computer can be, but not limited to, various personal computers, laptops, smart phones, tablet computers and portable wearable devices, and the portable wearable devices can be smart watches, smart bracelets, head-mounted devices, etc.
[0029] Furthermore, the setting device 120 may also receive a read link table instruction issued by the main control board, and send the read link table instruction to the storage device 110. The storage device 110 reads the corresponding link table data according to the read link table instruction and returns it to the link table acquisition module 122 of the setting device 120. The link table acquisition module 122 parses the link table data, obtains data reading information and sends it to the storage device 110. The information acquisition module 124 receives the configuration information data returned by the storage device 110 corresponding to the data reading information, adds header information to the configuration information data, and obtains a data packet and sends it to the corresponding function module 130. Among them, the read link table instruction may include read link table data enable information, address information and length information, and the data reading information may include read enable information, address information and length information.
[0030] Each link list data may include address data of one or more segments of configuration information data. In this embodiment, each link list data includes address data of two segments of configuration information data. Figure 2 As shown, Burstlist is a linked list, and the starting and ending addresses corresponding to each segment of configuration information data are stored in Burstlist, wherein Burstlist0 may be composed of the address data of configuration information data VOH1 and the address data of configuration information data VOL2 in series, and Burstlist1 may be composed of the address data of configuration information data VOH2 and the address data of configuration information data VOL0 in series. In addition, each segment of configuration information data may correspond to a different table chain (for example, Burstlist0 and Burstlist1 may also contain the address data of configuration information data VOH1), and the configuration information data may be repeatedly called in multiple test items. For example, if test item A requires configuration information data A1 and configuration information data A2, and test item B requires configuration information data A1 and configuration information data B1, then configuration information data A1, configuration information data A2, and configuration information data B1 can all be stored in the storage device 110, and linked list 1 contains address data of configuration information data A1 and configuration information data A2, and linked list 2 contains address data of configuration information data A1 and configuration information data B1, then the configuration information data can be called through linked list 1 and linked list 2 respectively to test test item A and test item B. Since the configuration information data required for different test items may be partially repeated, if all the required configuration information data are stored in the storage device 110 for each test item, the redundant configuration information data will cause insufficient storage space in the storage device 110. Therefore, by splitting the configuration information data required for each test item into multiple segments and storing them in the storage device 110, establishing a corresponding relationship between each linked list and two or more segments of configuration information data, and testing by repeatedly calling the configuration information data, the space occupied by the configuration information data in the storage device 110 can be greatly reduced.
[0031] The above-mentioned test board stores the configuration information data in the storage device 110 in advance through the linked list architecture. During the test process, there is no need to repeatedly send data from the test machine main control board, which reduces the test process time and effectively improves the test efficiency.
[0032] In one embodiment, Figure 3 As shown, the storage device 110 includes a storage unit 112 and a reading module 114, and the reading module 114 is connected to the storage unit 112, the linked list acquisition module 122 and the information acquisition module 124. The reading module 114 acquires the linked list data from the storage unit 112 according to the linked list read instruction, and sends it to the linked list acquisition module 122. The reading module 114 receives the data reading information sent by the linked list acquisition module 122, acquires the configuration information data from the storage unit 112 according to the data reading information, and sends it to the information acquisition module 124. In this embodiment, the storage unit 112 is a DDR storage unit. The storage unit 112 specifically includes storage blocks for storing linked list data and configuration information data respectively, and at least two pieces of configuration information data corresponding to each linked list data are respectively stored in the storage blocks. Among them, all or part of the linked list data may contain address data of at least one piece of the same configuration information data, for example, linked list 1 contains address data of configuration information data A1 and configuration information data A2, linked list 2 contains address data of configuration information data A1 and configuration information data B1, etc., a correspondence is established between each linked list data and at least two pieces of configuration information data, and the configuration information data is repeatedly called to perform testing, so as to reduce the space occupied by the configuration information data in the storage device 110.
[0033] Further, the reading module 114 may include a first reading unit and a second reading unit, the first reading unit is connected to the linked list acquisition module 122 and the storage unit 112, and the second reading unit is connected to the information acquisition module 124 and the storage unit 112. The first reading unit is used to read the linked list data, and the second reading unit is used to read the configuration information data. The two reading units are used to communicate with the linked list acquisition module 122 and the information acquisition module 124 respectively to read the corresponding data. In other embodiments, one reading unit may also be used to communicate with the linked list acquisition module 122 and the information acquisition module 124 at the same time to read the corresponding data.
[0034] In one embodiment, Figure 3As shown, the linked list acquisition module 122 includes a first cache unit 1222 and a delinking table information unit 1224. The first cache unit 1222 is connected to the storage device 110 to receive the linked list data; the delinking table information unit 1224 is connected to the first cache unit 1222 and the storage device 110 to send data reading information to the storage device 110. Further, the information acquisition module 124 includes a second cache unit 1242 and a header adding unit 1244. The second cache unit 1242 is connected to the storage device 110 to receive the configuration information data; the header adding unit 1244 is connected to the second cache unit 1242 and the function module 130 to send the data packet to the function module 130.
[0035] The first cache unit 1222 and / or the second cache unit 1242 are FIFO (First Input First Output) units. The linked list read instruction sent by the setting device 120 to the storage device 110 can be a batch read of multiple linked list data. The storage device 110 returns the batch linked list data to the first cache unit 1222 for caching. The delinking table information unit 1224 reads each linked list data from the first cache unit 1222 in sequence, and sends the data read information to the storage device 110 after parsing each linked list data. After receiving the data read information once, the storage device 110 returns the corresponding configuration information data to the second cache unit 1242, and then generates a data packet and sends it to the functional module 130 after adding the corresponding header information to the configuration information data through the header adding unit 1244.
[0036] Further, the setting device 120 also includes an arbitration unit 126, which is connected to the first cache unit 1222, the delinking table information unit 1224, the second cache unit 1242 and the storage device 110. The arbitration unit 126 performs back pressure communication with the storage device 110 according to the remaining space of the first cache unit 1222, and receives the linked list data and transmits it to the first cache unit 1222; and / or the arbitration unit 126 performs back pressure communication with the storage device 110 according to the remaining space of the second cache unit 1242, and receives the configuration information data and transmits it to the second cache unit 1242. In addition, the arbitration unit 126 is also used to receive a read linked list instruction issued by the main control board, and send the read linked list instruction to the storage device 110.
[0037] Specifically, the arbitration unit 126 is connected to the reading module 114 in the storage device 110 to obtain the linked list data and the configuration information data. The arbitration unit 126 detects the remaining space of the first cache unit 1222 and the second cache unit 1242. When the linked list data stored in the first cache unit 1222 is less than the preset threshold, the arbitration unit 126 sends a read linked list instruction to the storage device 110, and sends the linked list data returned by the storage device 110 to the first cache unit 1222. The specific value of the preset threshold is not unique, for example, it can be set to half of the storage capacity of the first cache unit 1222. Further, when the linked list data to be read by the read linked list instruction issued by the main control board is greater than half of the storage capacity of the first cache unit 1222, the arbitration unit 126 can first read the linked list data of half of the storage capacity of the first cache unit 1222 from the storage device 110 to avoid the first cache unit 1222 being full due to the first cache unit 1222 not having enough time to process the linked list. When the linked list in the first cache unit 1222 is processed to less than half of the storage capacity, the arbitration unit 126 can continue to initiate a read request to obtain the linked list data from the storage device 110, and repeat this process until the linked list data is extracted according to the read linked list instruction issued by the main control board.
[0038] The delinking table information unit 1224 parses the read enable, address, and length information of the configuration information data from the acquired linked table data, and sends it to the arbitration unit 126. When the arbitration unit 126 detects that the configuration information data stored in the second cache unit 1242 is less than the set threshold, the arbitration unit 126 may initiate a read request, send the parsed read enable, address, and length information to the storage device 110, obtain the configuration information data from the storage device 110, and send it to the second cache unit 1242. The specific value of the set threshold is not unique, for example, it can be set to half of the storage capacity of the second cache unit 1242. Further, when the configuration information data to be read is greater than half of the storage capacity of the second cache unit 1242, the arbitration unit 126 may first read the configuration information data of half of the storage capacity of the second cache unit 1242 from the storage device 110, so as to avoid the second cache unit 1242 being full due to the second cache unit 1242 not having enough time to process the configuration information data. When the configuration information data in the second cache unit 1242 is processed to less than half of the storage capacity, the arbitration unit 126 may continue to initiate a read request to obtain the configuration information data from the storage device 110, and repeat this process until the configuration information data extraction is completed.
[0039] In one embodiment, Figure 3As shown, a test machine is also provided, including the above-mentioned test board 100. Further, the test machine also includes a main control board 200 and a host computer 300, the host computer 300 is connected to the main control board 200, the main control board 200 is connected to the storage device 110 of the test board 100, and the linked list data and configuration information data are sent to the storage device 110 for storage. The host computer 300 can be, but is not limited to, various personal computers, laptops, smart phones, tablet computers and portable wearable devices, and the portable wearable devices can be smart watches, smart bracelets, head-mounted devices, etc.
[0040] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0041] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the utility model patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.
Claims
1. A test board, characterized in that: include: A storage device storing linked list data and configuration information data, each of the linked list data including address data corresponding to the configuration information data; The device is set up, including a linked list acquisition module that receives the linked list data returned by the storage device according to the linked list read instruction and sends data reading information to the storage device, and an information acquisition module that receives configuration information data returned by the storage device corresponding to the data reading information and sends a data packet to a functional module; wherein the linked list acquisition module is connected to the storage device, and the information acquisition module is connected to the storage device and the functional module.
2. The test board according to claim 1, characterized in that: The linked list acquisition module includes a first cache unit and a delinking list information unit; The first cache unit is connected to the storage device to receive the linked list data; The delink table information unit connects the first cache unit and the storage device, and sends the data reading information to the storage device.
3. The test board according to claim 2, characterized in that: The information acquisition module includes a second cache unit and a packet header adding unit; The second cache unit is connected to the storage device to receive the configuration information data; The packet header adding unit connects the second cache unit and the functional module, and sends the data packet to the functional module.
4. The test board according to claim 3, characterized in that: The setting device further includes an arbitration unit, the arbitration unit is connected to the first cache unit, the delinking table information unit, the second cache unit and the storage device, the arbitration unit performs back pressure communication with the storage device according to the remaining space of the first cache unit, receives the linked list data and transmits it to the first cache unit; And / or the arbitration unit performs back pressure communication with the storage device according to the remaining space of the second cache unit, receives the configuration information data and transmits it to the second cache unit.
5. The test board according to claim 3, characterized in that: The first cache unit and / or the second cache unit is a FIFO unit.
6. The test board according to any one of claims 1 to 5, characterized in that: The storage device comprises a storage unit and a reading module, wherein the reading module is connected to the storage unit, the linked list acquisition module and the information acquisition module.
7. The test board according to claim 6, characterized in that: The storage unit comprises storage blocks for storing the linked list data and the configuration information data respectively, and at least two pieces of configuration information data corresponding to each of the linked list data are respectively stored in the storage blocks.
8. The test board according to claim 6, characterized in that: The reading module includes a first reading unit and a second reading unit, the first reading unit is connected to the linked list acquisition module and the storage unit, and the second reading unit is connected to the information acquisition module and the storage unit.
9. A testing machine, characterized in that: A test board comprising any one of claims 1-8.
10. The testing machine according to claim 9, characterized in that: It also includes a main control board and a host computer, wherein the host computer is connected to the main control board, and the main control board is connected to the storage device of the test board to send linked list data and configuration information data to the storage device for storage.