Test board for overhauling frequency converter

Abstract

The utility model discloses a test bench used for frequency converter maintenance, comprising a first switch power supply, a second switch power supply and a driving detection unit, the first switch power supply is configured to supply power to a voltage regulation circuit where an IGBT module of a frequency converter is located, and the second switch power supply is configured to supply power to a control chip unit of the frequency converter. The control chip unit is configured to control the output of the voltage regulation circuit; the control chip unit comprises a photoelectric coupler and a buffer, and the buffer, the photoelectric coupler and the IGBT module are electrically connected in sequence; the driving detection unit comprises a first switch group and a first lamp bead group; when the frequency converter is in a maintenance state, the second switch power supply, the first switch group and the buffer are connected in sequence, and the first lamp bead group is connected to the output end of the frequency converter. The test board provided by the utility model can quickly eliminate most driving problems, and effectively improves the factory efficiency.

Description

Technical Field

[0001] The utility model relates to the technical field of frequency converter maintenance equipment, in particular to a test bench for frequency converter maintenance. Background Art

[0002] At present, the main production equipment used by chemical fiber textile companies is the Barmag winding machine, which uses a Siemens customized inverter drive motor. When the inverter has a problem, it can only be tested on the machine after repair. The test steps are cumbersome and there is a risk of board explosion. There is a lack of simple and fast testing methods.

[0003] The disclosure of the above background technology content is only used to assist in understanding the technical concept and technical solution of the utility model. It does not necessarily belong to the prior art of this patent application, nor does it necessarily provide technical guidance. In the absence of clear evidence that the above content has been disclosed before the filing date of this patent application, the above background technology should not be used to evaluate the novelty and creativity of the present application. Utility Model Content

[0004] In order to solve the problems existing in the prior art, the utility model provides a test bench for inverter maintenance. The technical solution is as follows:

[0005] The utility model provides a test bench for frequency converter maintenance.

[0006] A test bench for inverter maintenance, characterized in that it comprises a first switching power supply, a second switching power supply and a drive detection unit, wherein the first switching power supply is configured to supply power to a voltage regulating circuit where an IGBT module of the inverter is located, and the second switching power supply is configured to supply power to a control chip unit of the inverter, and the control chip unit is configured to control the output of the voltage regulating circuit;

[0007] The control chip unit includes a photocoupler and a buffer, and the buffer, the photocoupler and the IGBT module are electrically connected in sequence; the drive detection unit includes a first switch group and a first lamp bead group; the inverter is placed on a test bench and is in a maintenance state, the second switch power supply, the first switch group and the buffer are electrically connected in sequence, and the first lamp bead group is connected to the output end of the inverter; the first switch group is in a closed state, and the inverter outputs a voltage to the first lamp bead group when triggered by the voltage signal of the second switch power supply, so that the first lamp bead group works.

[0008] Furthermore, the control chip unit is provided with a chip power supply for powering itself, and the frequency converter is provided with an adapter board, the adapter board includes a first terminal group for powering the chip power supply, and a second terminal group for inputting signals to the IGBT module; the second switch power supply is connected to the first terminal group, and is connected to the second terminal group through the first switch group, and the second terminal group, the buffer, the photocoupler and the IGBT module are electrically connected in sequence.

[0009] Furthermore, the first switch group includes a plurality of first button switches, each of which is connected to the second switch power supply and correspondingly connected to different terminals in the second terminal group, and the first lamp bead group includes a plurality of first lamp beads, and the first button switches and the first lamp beads are integrated one-to-one to form a lighted button.

[0010] Furthermore, the test bench also includes a fault detection unit, which includes a second switch group and a second lamp bead group. The inverter is provided with a current detection module at its output end, and the current detection module is electrically connected to the control chip unit. The adapter board includes a third terminal group for connecting the output end of the buffer, and the second lamp bead group is connected to the third terminal group. The second switch group is configured to be connected between the second lamp bead and the second switching power supply.

[0011] Furthermore, the second switch group includes a plurality of second button switches, the second lamp bead group includes a plurality of second lamp beads, the second button switches and the second lamp beads are integrated one-to-one to form a lighted button, and the second button switch is configured to control the conduction state of the corresponding second lamp bead and the second switch power supply.

[0012] Furthermore, there are multiple IGBT modules and adapter boards, which are matched one by one.

[0013] Furthermore, the output voltage of the first switching power supply is 20-28V, and the output voltage of the second switching power supply is 3-7V.

[0014] Furthermore, the photoelectric coupler model is HCNW3120, the buffer model is 74HC126, and the frequency converter is a Siemens frequency converter.

[0015] Furthermore, the test bench also includes a protection switch, and the first switching power supply and the second switching power supply are respectively connected to external alternating current through the protection switch.

[0016] Furthermore, the protection switch is an air switch.

[0017] The beneficial effects brought about by the technical solution provided by the utility model are as follows: using simple switches and lamp bead components to perform drive detection and feedback on the interface terminals of the inverter respectively, without the need for on-machine testing, most drive problems can be quickly eliminated, downtime can be reduced, and factory efficiency can be effectively improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0019] Figure 1 It is a schematic diagram of the structure of the test bench provided by the embodiment of the utility model;

[0020] Figure 2 It is a structural schematic diagram of the test bench corresponding to the frequency converter provided by the embodiment of the utility model;

[0021] Figure 3 This is a schematic diagram of the first switch voltage power supply connection in the test bench provided by the embodiment of the utility model;

[0022] Figure 4 It is a schematic diagram of the connection of the second switch voltage power supply driving function detection area in the test bench provided by the embodiment of the utility model;

[0023] Figure 5 It is a connection diagram of the second switch voltage power supply fault detection function test area in the test bench provided by the embodiment of the utility model;

[0024] Figure 6 This is a schematic diagram of the layout of the adapter plate of the test bench corresponding to the frequency converter provided by the embodiment of the utility model;

[0025] Figure 7 This is a schematic diagram of the structure of the adapter plate corresponding to the frequency converter of the test bench provided in the embodiment of the utility model;

[0026] Figure 8 It is a schematic diagram of the connection of a protection switch in a test bench provided by an embodiment of the utility model.

[0027] Among them, the figure markings are as follows: 1-protection switch; 2-second switching power supply; 3-first switching power supply; 4-flat cable; 5-adapter board, 5-1 is the first adapter board, 5-2 is the second adapter board; 6-drive detection unit; 6-1~6-12 are 12 lighted buttons; 7-fault detection unit, 7-1~7-12 are 12 lighted buttons; 8-inverter; 8-1 is a 24V power plug; 8-2 is 6 A786J (digital current detector); 8-3 is 2 74HC541 (8-way buffer); 8-4 is 3 20-way wiring plugs; 8-5 is 4 5046X005 (electronic transformer); 8-6 is 12 HCNW3120 (drive optocoupler); 8-7 is two sets of IGBT contacts; 8-8 is 2 74HC126 (high-speed CMOS logic four-way buffer); 9-IGBT housing. DETAILED DESCRIPTION

[0028] In order to enable those skilled in the art to better understand the solution of the utility model, the technical solution in the embodiment of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiment of the utility model. Obviously, the described embodiment is only a part of the embodiment of the utility model, not all of the embodiments. Based on the embodiment of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the utility model.

[0029] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0030] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0031] In this application, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0032] In the present application, unless otherwise clearly specified and limited, a first feature being “above” or “below” a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being “above”, “above”, and “above” a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being “below”, “below”, and “below” a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0033] It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. The terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used herein are for illustrative purposes only and are not intended to be the only implementation method.

[0034] In one embodiment of the present invention, a test bench for inverter maintenance is provided. Figure 1 , including a first switching power supply 3, a second switching power supply 2 and a driving detection unit 6, see Figure 2 and Figure 3 The first switching power supply is configured to supply power to the voltage regulating circuit (such as the high-voltage circuit part) where the IGBT module of the inverter 8 is located, and the second switching power supply is configured to supply power to the control chip unit of the inverter, and the control chip unit is configured to control the output of the voltage regulating circuit; wherein the test bench body is a rectangular parallelepiped with a length of 600 mm, a width of 500 mm, and a height of 220 mm, and is made of epoxy resin board with a thickness of 3 mm.

[0035] The control chip unit includes a photoelectric coupler and a buffer, and the buffer, the photoelectric coupler and the IGBT module are electrically connected in sequence; the drive detection unit includes a first switch group and a first lamp bead group; see Figure 4, when the inverter is in the maintenance state, the second switching power supply, the first switch group and the buffer are connected in sequence, and the first lamp bead group is connected to the output end of the inverter; when the first switch group is in the closed state, the control chip unit controls the voltage regulation circuit to output voltage to the first lamp bead group, so that the first lamp bead group works.

[0036] The control chip unit is provided with a chip power supply for powering itself, and the frequency converter is provided with an adapter board 5, which includes a first terminal group for powering the chip power supply and a second terminal group for inputting signals to the IGBT module. The IGBT module is provided with an IGBT housing 9, and the IGBT housing 9 is configured with a plurality of ports connected to the IGBT module; the second switch power supply is connected to the first terminal group, and is connected to the second terminal group through the first switch group at the same time, and the second terminal group, the buffer, the photocoupler and the IGBT module are electrically connected in sequence.

[0037] The first switch group includes multiple first button switches, each of which is connected to the second switch power supply and correspondingly connected to different terminals in the second terminal group. The first lamp bead group includes multiple first lamp beads. The first button switches and the first lamp beads are integrated one-to-one to form illuminated buttons 6-1 to 6-12.

[0038] This embodiment utilizes an external high level input to operate the driving circuit and drive the lamp beads to work, and can intuitively judge whether the driving circuit is good or not.

[0039] In one embodiment of the present invention, see Figure 5 The test bench also includes a fault detection unit 7, which includes a second switch group and a second lamp bead group. The inverter is provided with a current detection module at its output end, and the current detection module is electrically connected to the control chip unit. The adapter board includes a third terminal group for connecting the output end of the buffer, and the second lamp bead group is connected to the third terminal group. The second switch group is configured to be connected between the second lamp bead and the second switch power supply. The connection between the terminals of the adapter board and the inverter interface can be specifically referred to Figure 7 and Table 1.

[0040] Table 1

[0041]

[0042] The second switch group includes a plurality of second button switches, the second lamp bead group includes a plurality of second lamp beads, the second button switches correspond to the second lamp beads and are integrated to form lighted buttons 7-1 to 7-12, and the second button switches are configured to control the conduction state of the corresponding second lamp beads and the second switch power supply. It should be noted that the above-mentioned lamp beads can be LED lamp beads or other light display devices. Simply replacing the lamp beads with other types of reminder devices, such as speakers, also falls within the protection scope of this embodiment.

[0043] In one embodiment of the utility model, the number of the IGBT modules and the adapter board are both multiple, and they are matched one by one. The output voltage of the first switching power supply is 20-28V, and the output voltage of the second switching power supply is 3-7V. The photocoupler model is HCNW3120, the buffer model is 74HC126, and the inverter is a Siemens inverter. Figure 8 The test bench also includes a protection switch 1, and the first switch power supply and the second switch power supply are connected to the external 220V AC power through the protection switch. The protection switch is an air switch. The second switch power supply, the switch group, and the adapter board are connected through 1mm 2 Connect the BVR wires; see Figure 6 The adapter board 5 includes the first adapter board 5-1 and the second adapter board 5-2, and the first adapter board 5-1 and the second adapter board 5-2 are respectively connected to the two wiring plugs of the inverter through the flat cable 4; the LED lamp bead and the voltage output end of the IGBT shell are connected through a 1mm 2 The BVR wire is connected; the IGBT housing and the inverter are fixed and crimped by M6*30mm bolts.

[0044] Specifically, see Figure 2 The inverter is equipped with a 24V power plug 8-1, 6 A786J (digital current detectors) 8-2, 2 74HC541 (8-way buffers) 8-3, 3 20-way wiring plugs 8-4, 4 5046X005 (electronic transformers) 8-5, 12 HCNW3120 (drive optocouplers) 8-6, two sets of IGBT contacts 8-7, and 2 74HC126 (high-speed CMOS logic four-way buffers) 8-8; the external power supply is supplied to the DC5V switching power supply and DC24V switching power supply through the circuit breaker; DC The 5v switching power supply provides DC5v power to the button, LED lamp beads and inverter; the DC24v switching power supply provides DC24V power to the inverter; at this time, the circuit detection function test is running and the corresponding LED light is lit, indicating that this current detection function is normal. The button simulates the inverter to output a high level to the inverter drive circuit, and the internal circuit operation drives the LED lamp beads to work; if the drive circuit is normal, the corresponding LED light will be on, otherwise it will not be on.

[0045] Among them, the drive circuit detection is to simulate the inverter output high level to the inverter drive circuit through the button, and drive the LED lamp beads to work through the internal circuit operation. The specific implementation is as follows

[0046] 1) The inverter includes two integrated IGBTs, each of which contains 6 IGBTs to control a set of three-phase AC outputs. Each IGBT integrated block relies on two 74HC126s to control 6 hcnw3120s to complete inverter output control;

[0047] 2) The input signals of 1, 3, and 9 of 74HC126 (4-way buffer) are controlled by opening and closing the above-mentioned buttons. When the button is pressed, the above-mentioned pins input high level (internal circuits of 2, 4, and 10 give high level), and pins 3, 6, and 8 of 74HC126 output high level;

[0048] 3) Each output pin of 74HC126 is connected to the 3-pin of a hcnw3120 (IGBT drive optocoupler) to drive the optocoupler; the 7-pin of hcnw3120 outputs a high level to drive the IGBT gate to turn on;

[0049] 4) In the circuit of the lamp bead with a light button in the middle of the IGBT shell contact gate and the emitter, when the hcnw3120 is triggered, the lamp bead is powered and lights up, proving that this drive circuit is normal;

[0050] 5) This method takes 5 minutes for each test. It is easy to operate, highly practical and has a high safety factor.

[0051] The current detection function of the current detection module relies on the A786J digital-to-analog conversion optocoupler (digital current detector) to realize the inverter output current detection. Specifically, the 2nd and 3rd pins of the A786J detect the voltage change of 0v-0.2v on the external resistor, so that the 6th pin of the A786J outputs a 3.3-1MHz analog current digital signal, and the 7th pin outputs a 10MHz equal-width pulse clock signal; through the 74HC541 transfer input to the microcontroller in the control chip unit, the 1st and 19th pins of the 74HC541 are both connected to a low level, and the input waveform received by the 74HC541 is consistent with the output waveform. Now connect the output pin of the 74HC541 to the lamp bead of the lighted button, and the lamp bead is lit, indicating that the detection circuit functions normally.

[0052] In one embodiment of the utility model, the inverter includes two integrated IGBTs, i.e., IGBT modules, each of which contains 6 IGBTs to control a group of three-phase AC outputs, and each IGBT module relies on two 74HC126s to control 6 hcnw3120s to complete the inverter output control; the input signals of 1, 3, and 9 of 74HC126 (4-way buffer) are controlled by opening and closing the above-mentioned switch button, and when the button is pressed, the above-mentioned pins input a high level (2, 4, and 10 internal circuits give a high level), then the 3, 6, and 8 pins of 74HC126 output a high level; each output pin of the above-mentioned 74HC126 is respectively connected to the 3 pin of an hcnw3120 (IGBT drive optocoupler) to drive the optocoupler; the 7 pin of hcnw3120 outputs a high level to drive the IGBT gate to turn on; the gate of the IGBT shell contact and the emitter lead to the intermediate series diode, and when the hcnw3120 is triggered, the diode is energized and lights up, proving that this drive circuit is normal.

[0053] Among them, in the drive circuit detection, when each button is pressed to turn on the light, a high level is output to the 74HC126 input. HCNW3120 judges and compares the collected input signal through the internal circuit, and outputs a high level to one of the gates of the IGBT at the corresponding output point. Whether the corresponding LED lamp bead is lit can be used to judge whether the inverter drive circuit is normal.

[0054] In the fault detection circuit function test, after power is turned on, A786 detects the input voltage of 0v, and pins 13 and 11 output high-level pulse signals to 74HC541, which are transferred to the inverter plug. Each output signal is connected to a lighted button using an adapter board. At this time, the lighted button lights up and the detection circuit is normal.

[0055] The test bench provided in the embodiment of the utility model utilizes simple switches and lamp bead components to perform drive detection and feedback on the interface terminals of the inverter respectively, without the need for on-machine testing, and can quickly eliminate most problems, effectively improving factory efficiency.

[0056] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A test bench for inverter maintenance, characterized in that: It includes a first switching power supply, a second switching power supply and a drive detection unit, wherein the first switching power supply is configured to supply power to a voltage regulating circuit where an IGBT module in the frequency converter is located, and the second switching power supply is configured to supply power to a control chip unit of the frequency converter, and the control chip unit is configured to control the output of the voltage regulating circuit; The control chip unit includes a photocoupler and a buffer, and the buffer, the photocoupler and the IGBT module are electrically connected in sequence; the drive detection unit includes a first switch group and a first lamp bead group; when the inverter is in an overhaul state, the second switch power supply, the first switch group and the buffer are electrically connected in sequence, and the first lamp bead group is connected to the output end of the inverter; when the first switch group is in a closed state, the inverter outputs a voltage to the first lamp bead group under the triggering of the voltage signal of the second switch power supply, so that the first lamp bead group works.

2. The test bench for inverter maintenance according to claim 1, characterized in that: The control chip unit is provided with a chip power supply for powering itself, and the frequency converter is provided with an adapter board, which includes a first terminal group for powering the chip power supply and a second terminal group for inputting signals to the IGBT module; the second switch power supply is connected to the first terminal group and is connected to the second terminal group through the first switch group, and the second terminal group, the buffer, the photocoupler and the IGBT module are electrically connected in sequence.

3. The test bench for inverter maintenance according to claim 2, characterized in that: The first switch group includes multiple first button switches, each of which is connected to the second switch power supply and correspondingly connected to different terminals in the second terminal group. The first lamp bead group includes multiple first lamp beads, and the first button switches and the first lamp beads are integrated one-to-one to form a lighted button.

4. The test bench for inverter maintenance according to claim 2, characterized in that: It also includes a fault detection unit, which includes a second switch group and a second lamp bead group. The inverter is provided with a current detection module at its output end, and the current detection module is electrically connected to the control chip unit. The adapter board includes a third terminal group for connecting the output end of the buffer, and the second lamp bead group is connected to the third terminal group. The second switch group is configured to be connected between the second lamp bead and the second switch power supply.

5. The test bench for inverter maintenance according to claim 4, characterized in that: The second switch group includes a plurality of second button switches, the second lamp bead group includes a plurality of second lamp beads, the second button switches and the second lamp beads are integrated one-to-one to form a lighted button, and the second button switch is configured to control the conduction state of the corresponding second lamp bead and the second switch power supply.

6. The test bench for inverter maintenance according to claim 2, characterized in that: There are multiple IGBT modules and adapter boards, and they are matched one by one.

7. The test bench for inverter maintenance according to claim 1, characterized in that: The output voltage of the first switching power supply is 20-28V, and the output voltage of the second switching power supply is 3-7V.

8. The test bench for inverter maintenance according to claim 1, characterized in that: The photoelectric coupler model is HCNW3120, the buffer model is 74HC126, and the frequency converter is a Siemens frequency converter.

9. The test bench for inverter maintenance according to claim 1, characterized in that: It also includes a protection switch, and the first switching power supply and the second switching power supply are respectively connected to external AC power through the protection switch.

10. The test bench for inverter maintenance according to claim 9, characterized in that: The protection switch is an air switch.

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