Testing device

Abstract

The utility model relates to a testing device which comprises a testing mechanism which is provided with a sealing cavity for accommodating a testing plate, the sealing cavity is provided with an opening, and the testing plate is used for being electrically connected with a piece to be tested; the driving mechanism comprises a supporting plate and a driving assembly which are connected, and the supporting plate is used for installing the magnetic element; the sealing element is arranged on at least one of the supporting plate and the testing mechanism; the driving assembly can drive the supporting plate to move in the first direction so that the supporting plate can be switched between the first state and the second state. When the supporting plate is in the first state, the magnetic element can extend into the sealing cavity through the opening to provide a magnetic field environment for the to-be-tested piece, and the sealing piece is compressed between the supporting plate and the testing mechanism to seal the opening; when the supporting plate is in the second state, the magnetic element can stretch out of the sealing cavity through the opening. When the to-be-tested piece is replaced and tested, the supporting plate and the magnetic element do not interfere with the test plate, the test plate is convenient to disassemble and assemble, and the test efficiency is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of testing, in particular to a testing device. Background Art

[0002] When testing a device under test (such as a magnetic IC), the device under test is pressed into the test socket and electrically connected to the test board through the probe on the test socket. The magnetic element provides a magnetic field environment for the device under test, and the test assembly electrically connected to the test board tests the performance of the device under test. Generally, the test board is housed in a test mechanism to prevent frost on the surface of the test board when the device under test is tested at low temperature.

[0003] In traditional technology, the magnetic element is installed on the pallet, and the pallet is fixed relative to the test mechanism. When changing the test piece, because the magnetic element will interfere with the disassembly and assembly of the test seat and the test board, it is necessary to first disassemble the pallet and the magnetic element, replace the test seat and the test board, and then reassemble the pallet and the magnetic element. This repeated disassembly and assembly method leads to inconvenience in operation and reduces test efficiency. Utility Model Content

[0004] Based on this, it is necessary to provide a test device that is easy to operate and can improve test efficiency in order to solve the problems of inconvenient operation and low test efficiency when changing the test piece in the traditional technology.

[0005] A testing device, comprising:

[0006] A testing mechanism, comprising a sealed cavity for accommodating a testing board, wherein the sealed cavity has an opening, and the testing board is used for being electrically connected to the device to be tested;

[0007] A driving mechanism, comprising a connected support plate and a driving assembly, wherein the support plate is used to mount a magnetic element;

[0008] A sealing member, disposed on at least one of the support plate and the testing mechanism;

[0009] The driving assembly can drive the support plate to move along a first direction so as to switch it between a first state and a second state; when the support plate is in the first state, the magnetic element can extend into the sealed cavity through the opening to provide a magnetic field environment for the test piece, and the sealing element is compressed between the support plate and the testing mechanism to seal the opening; when the support plate is in the second state, the magnetic element can extend out of the sealed cavity through the opening.

[0010] The above-mentioned test device, because the driving component can drive the support plate to move along the first direction, the support plate can switch between the first state and the second state. When the support plate is in the first state, the sealing component can seal the opening, so that the test plate is in a completely sealed environment, avoiding frost on the surface of the test plate when the test piece is tested at a low temperature. At the same time, when the support plate is in the second state, the magnetic element extends out of the sealed cavity through the opening. At this time, the magnetic element and the support plate are far away from the test plate. When the test piece is replaced, the support plate and the magnetic element will not interfere with the test plate, which facilitates the disassembly and assembly of the test plate and improves the test efficiency.

[0011] In one embodiment, the sealing member is annular;

[0012] When the support plate is in the first state, the sealing member is disposed around the periphery of the opening.

[0013] In one embodiment, the sealing element comprises a plurality of sealing strips, and the plurality of sealing strips are arranged in sequence in a ring shape.

[0014] In one of the embodiments, the driving mechanism further includes a frame, and the driving assembly is mounted on the frame; when the driving assembly drives the support plate to move along the first direction, the testing mechanism and the frame remain relatively fixed.

[0015] In one embodiment, the driving assembly includes a driving member, a screw rod and a nut, the screw rod and the driving member are both connected to the frame, the nut is screwed to the screw rod, and the support plate is connected to the nut;

[0016] The driving member can drive the screw rod to rotate relative to the frame to drive the nut to move along the first direction, thereby causing the support plate to move along the first direction.

[0017] In one embodiment, the testing device further comprises a first sensing member and a first matching member, wherein one of the first sensing member and the first matching member is disposed on the frame, and the other is disposed on the pallet; when the pallet is in the first state and the distance between the pallet and the testing mechanism in the first direction reaches a first preset threshold, the first sensing member is able to sense the first matching member, and the driving assembly stops driving the pallet to move forward in the first direction; and / or

[0018] The testing device also includes a second sensing member and a second matching member, one of the second sensing member and the second matching member is arranged on the frame, and the other is arranged on the pallet; when the pallet is in the second state and the distance between the pallet and the testing mechanism in the first direction reaches a second preset threshold, the second sensing member can sense the second matching member, and the driving assembly stops driving the pallet to move in the opposite direction along the first direction.

[0019] In one embodiment, the testing device further comprises a first limiting portion and a first matching portion, one of the first limiting portion and the first matching portion is arranged on the frame, and the other is arranged on the support plate; when the support plate is in the first state and the distance between the support plate and the testing mechanism in the first direction reaches the minimum limit value, the first limiting portion abuts against the first matching portion, and the driving assembly stops driving the support plate to move forward along the first direction; and / or

[0020] The testing device also includes a second limiting portion and a second matching portion, one of which is arranged on the frame, and the other is arranged on the support plate; when the support plate is in the second state and the distance between the support plate and the testing mechanism in the first direction reaches the maximum limit value, the second limiting portion abuts against the second matching portion, and the driving assembly stops driving the support plate to move in the opposite direction along the first direction.

[0021] In one embodiment, the testing device also includes a slider and a guide rail extending along the first direction, one of the guide rail and the slider is connected to the frame, the other of the guide rail and the slider is connected to the pallet, and the slider cooperates with the guide rail to guide the pallet in the first direction.

[0022] In one embodiment, the driving mechanism further includes casters, wherein the casters are mounted on the frame, and the driving mechanism moves relative to the work surface via the casters.

[0023] In one of the embodiments, a plurality of fixing hole groups are provided on the support plate, and the fixing hole groups are used to install the magnetic elements, and the sizes of the magnetic elements installed by the fixing hole groups are different. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 An axonometric diagram of a test device provided in one embodiment of the present application;

[0025] Figure 2 for Figure 1 A partial exploded view of the test apparatus shown in;

[0026] Figure 3for Figure 1 A partial cross-sectional view of the test device shown in;

[0027] Figure 4 for Figure 1 An axonometric view of a partial structure of the test device shown in;

[0028] Figure 5 for Figure 1 An axonometric view of another perspective of the test device shown in ;

[0029] Figure 6 for Figure 4 Axonometric drawing of another view of the structure shown in;

[0030] Figure 7 for Figure 1 An axonometric view of the test device shown in yet another perspective;

[0031] Figure 8 for Figure 1 An exploded view of a partial structure of the test device shown in;

[0032] Fig. 9 for Figure 6 A magnified view of the structure shown in FIG.

[0033] Fig.10 for Figure 1 Axonometric view of the test apparatus shown in FIG.

[0034] Description of reference numerals:

[0035] 100, test device; 10, test mechanism; 11, sealed chamber; 12, opening; 13, panel; 131, mounting slot; 14, mounting seat; 15, test seat; 16, frost shield; 20, test board; 30, drive mechanism; 31, support plate; 311, fixing hole group; 312, connecting plate; 313, support plate; 314, support rib; 32, drive assembly; 321, drive member; 322, screw rod; 323, nut; 33, rack; 341, first installation Mounting plate; 342, second mounting plate; 35, transmission assembly; 351, pulley; 352, synchronous belt; 36, caster; 40, seal; 41, sealing strip; 50, magnetic element; 60, mounting block; 70, slider; 80, guide rail; 90, first sensing element; 110, first matching element; 120, first limiting portion; 130, first matching portion; 140, second sensing element; 150, second matching element; 160, second limiting portion; 170, second matching portion. DETAILED DESCRIPTION

[0036] In order to make the above-mentioned purposes, features and advantages of the utility model more obvious and easy to understand, the specific implementation methods of the utility model are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the utility model. However, the utility model can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the utility model, so the utility model is not limited by the specific embodiments disclosed below.

[0037] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0038] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of the present utility model, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0039] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0040] In the present utility model, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being "above", "above" or "above" a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" or "below" a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0041] It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. The terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used herein are for illustrative purposes only and are not intended to be the only implementation method.

[0042] See also Figure 1 and Figure 2 In one embodiment of the present application, a testing device 100 is provided to test the performance of a device under test. Specifically, the device under test is a magnetic IC. Of course, in other embodiments, the type of the device under test tested by the testing device 100 is not limited.

[0043] Continue reading Figure 1 and Figure 2 , and see Figure 3 The test device 100 includes a test mechanism 10 and a test board 20. The test mechanism 10 has a sealed cavity 11. The test board 20 is arranged in the sealed cavity 11. The test board 20 is electrically connected to the device under test. Specifically, the test board 20 is a PCB board. When the device under test is electrically connected to the test board 20, the test assembly electrically connected to the test board 20 can test the performance of the device under test.

[0044] See also Figure 2 and Figure 4 The test device 100 further includes a driving mechanism 30 and a sealing member 40. The driving mechanism 30 includes a support plate 31 and a driving assembly 32 connected to each other, and the support plate 31 is used to mount the magnetic element 50. The sealing member 40 is disposed on one of the support plate 31 and the test mechanism 10. For example, in some embodiments, the sealing member 40 is disposed on the support plate 31, in other embodiments, the sealing member 40 is disposed on the test mechanism 10, and in still other embodiments, the sealing member 40 is disposed on both the support plate 31 and the test mechanism 10.

[0045] In some embodiments, the magnetic element 50 is a coil, and the coil can provide a magnetic field environment to the device under test when it is energized. Specifically, when the coil is energized with alternating current, it can provide a changing magnetic field environment to the device under test. In other embodiments, the magnetic element 50 is a magnet, and the magnet can provide a magnetic field environment to the device under test. Specifically, when the magnet rotates, it can provide a changing magnetic field environment to the device under test.

[0046] The driving assembly 32 can drive the support plate 31 to move along the first direction so that the support plate 31 switches between the first state and the second state. Figure 1 In some embodiments, the first direction is the height direction of the test device 100. At this time, the driving assembly 32 can drive the support plate 31 to rise and fall to change the height position of the support plate 31 and the test mechanism 10. That is, when the support plate 31 is in the first state and the second state, its height position with the test mechanism 10 is different.

[0047] The sealed cavity 11 of the test mechanism 10 has an opening 12. When the support plate 31 is in the first state, the magnetic element 50 can extend into the sealed cavity 11 through the opening 12 to provide a magnetic field environment for the test piece, and the seal 40 is compressed between the support plate 31 and the test mechanism 10 to seal the opening 12. That is, when the support plate 31 is in the first state, the magnetic element 50 can enter the sealed cavity 11 through the opening 12. At this time, the distance between the magnetic element 50 and the test piece is relatively close, and the magnetic field environment required for the test piece can be provided for the test piece. At the same time, when the magnetic element 50 enters the sealed cavity 11, the seal 40 is compressed under the squeezing action of the support plate 31 and the test mechanism 10, and the compressed seal 40 seals the opening 12 of the sealed cavity 11, and the sealed cavity 11 will no longer be connected to the outside world. In this way, when the test piece is subjected to a low-temperature test, the test board 20 is in a completely sealed environment, and the outside air will not contact the test board 20 and frost on its surface.

[0048] When the support plate 31 is in the second state, the magnetic element 50 can extend out of the sealed cavity 11 through the opening 12. That is, after the test piece is tested, the driving assembly 32 can drive the support plate 31 to move along the first direction, so that the support plate 31 switches from the first state to the second state. At this time, the magnetic element 50 can extend out of the sealed cavity 11 through the opening 12, and the magnetic element 50 will not interfere with the disassembly and assembly of the test board 20.

[0049] The test device 100 provided in the embodiment of the present application, because the driving component 32 can drive the support plate 31 to move along the first direction, so that the support plate 31 switches between the first state and the second state. When the support plate 31 is in the first state, the sealing member 40 can seal the opening 12, so that the test board 20 is in a completely sealed environment, and frost is prevented from forming on the surface of the test board 20 when the test piece is tested at a low temperature. At the same time, when the support plate 31 is in the second state, the magnetic element 50 extends out of the sealed cavity 11 through the opening 12. At this time, the magnetic element 50 and the support plate 31 are both away from the test board 20. When the test piece is changed, the support plate 31 and the magnetic element 50 will not interfere with the test board 20, which facilitates the disassembly and assembly of the test board 20 and improves the test efficiency.

[0050] It should be noted here that, generally, when changing the test piece, before disassembling the previous test board 20, it is necessary to disassemble part of the structure of the test mechanism 10, and the support plate 31 and the magnetic element 50 will not interfere with the disassembly of the test mechanism 10; at the same time, after installing the test board 20, it is necessary to install the disassembled part of the test mechanism 10, and the support plate 31 and the magnetic element 50 will not interfere with the installation of the test mechanism 10.

[0051] In some embodiments, see Figure 3 , and see Figure 5 The test mechanism 10 includes a panel 13, a mounting seat 14, a test seat 15 and a frost protection cover 16. The panel 13 is provided with a mounting groove 131 in the first direction, the mounting seat 14 is mounted in the mounting groove 131, the test seat 15 is mounted in the mounting seat 14, and the frost protection cover 16 is mounted on one side of the panel 13 in the first direction (such as Figure 3 As shown, the frost protection 16 is installed on Figure 3 The panel 13, the mounting seat 14, the test seat 15 and the anti-frost cover 16 define a sealed cavity 11, the opening 12 is formed on the anti-frost cover 16, and the sealing member 40 is provided on the support plate 31 and / or the anti-frost cover 16. The test board 20 is provided in the sealed cavity 11, and the test seat 15 is electrically connected to the test board 20 through a probe. A pressure head device is provided on the other side of the panel 13 in the first direction, and the pressure head device is used to press the test piece into the test seat 15 to be electrically connected to the test board 20.

[0052] Optionally, when changing the test piece, the anti-frost cover 16 is first removed from the panel 13, and then the test board 20 and the test seat 15 are removed. When installing a new test board 20, the test seat 15 and the test board 20 are first installed, and then the anti-frost cover 16 is installed. The support plate 31 and the magnetic element 50 will not interfere with the disassembly and assembly of the test board 20, the test seat 15 and the anti-frost cover 16.

[0053] In other embodiments, the testing mechanism 10 may also be configured in other ways, which are not limited here.

[0054] In some embodiments, see Figure 4 , the sealing member 40 is annular. When the support plate 31 is in the first state, the sealing member 40 is disposed around the periphery of the opening 12. In this way, the sealing effect of the sealing member 40 in sealing the opening 12 is ensured.

[0055] Optionally, the seal 40 includes multiple sealing strips 41, which are arranged in a ring shape, so as to facilitate the installation of the seal 40. In other embodiments, the seal 40 is an integral sealing ring structure, so as to facilitate the manufacture of the seal 40.

[0056] It should be noted that when both the support plate 31 and the anti-frost cover 16 are provided with a seal 40, when the seal 40 seals the opening 12, the support plate 31 and the seal 40 on the anti-frost cover 16 are nested. For example, in one specific embodiment, when the seal 40 seals the opening 12, the seal 40 on the support plate 31 is nested in the seal 40 of the anti-frost cover 16. In another specific embodiment, when the seal 40 seals the opening 12, the seal 40 on the anti-frost cover 16 is nested in the seal 40 on the support plate 31.

[0057] In order to facilitate the fixing of the sealing member 40 , a mounting block 60 is provided on the support plate 31 . The mounting block 60 is installed in a groove on the support plate 31 , and the sealing member 40 is clamped on the mounting block 60 .

[0058] In some embodiments, a fixing hole group 311 is provided on the support plate 31, and the fixing hole group 311 is used to install the magnetic element 50 and is located within the encirclement of the mounting block 60. There are multiple fixing hole groups 311, and each fixing hole group 311 is used to install a magnetic element 50 of different sizes. In this way, magnetic elements 50 of different specifications can be installed on the support plate 31 to provide different magnetic field strengths to the test piece to meet the test requirements of various test pieces.

[0059] See also Figure 6 and Figure 7 The driving mechanism 30 further includes a frame 33, and the driving assembly 32 is mounted on the frame 33. When the driving assembly 32 drives the support plate 31 to move along the first direction relative to the frame 33, the testing mechanism 10 and the frame 33 remain relatively fixed. The frame 33 serves as a mounting base, so that the driving mechanism 30 has a high degree of integration. It is understandable that the driving mechanism 30 can also omit the frame 33.

[0060] In some embodiments, see Figure 8The driving assembly 32 includes a driving member 321, a screw rod 322 and a nut 323. The screw rod 322 and the driving member 321 are both connected to the frame 33, the nut 323 is screwed to the screw rod 322, and the support plate 31 is connected to the nut 323. The driving member 321 can drive the screw rod 322 to rotate relative to the frame 33, so as to drive the nut 323 to move along the first direction, thereby causing the support plate 31 to move along the first direction. The driving member 321 can be a motor, or other power member that can drive the screw rod 322 to rotate. The driving assembly 32 ensures the stability and position accuracy of the support plate 31 by the transmission method of the screw rod 322 and the nut 323.

[0061] Optionally, the driving mechanism 30 further includes a mounting plate, the mounting plate is connected to the frame 33, and the driving member 321 is mounted on the mounting plate. That is, the driving member 321 is indirectly mounted on the frame 33 through the mounting plate. In some other embodiments, the driving mechanism 30 may also omit the mounting plate, and in this case, the driving member 321 is directly mounted on the frame 33.

[0062] Continue reading Figure 6 The driving mechanism 30 further includes a transmission assembly 35, through which the driving member 321 is connected to the screw rod 322. The transmission assembly 35 includes two pulleys 351 and a synchronous belt 352, the two pulleys 351 are respectively connected to the driving member 321 and the screw rod 322, and the synchronous belt 352 is sleeved outside the two pulleys 351. The driving member 321 drives the pulley 351 connected thereto to rotate, and the synchronous belt 352 drives the pulley 351 connected to the screw rod 322 to rotate, so that the screw rod 322 rotates relative to the frame 33, and the nut 323 and the support plate 31 move in the first direction relative to the frame 33, so as to realize the lifting and lowering of the magnetic element 50.

[0063] Continue reading Figure 6 , and see Fig. 9 The mounting plate includes a first mounting plate 341 and a second mounting plate 342. The first mounting plate 341 is connected to the frame 33, the second mounting plate 342 is connected to the first mounting plate 341, and the driving member 321 is mounted on the second mounting plate 342. The position between the second mounting plate 342 and the first mounting plate 341 is adjustable to adjust the tension of the synchronous belt 352, so that the driving member 321 transmits the force to the screw rod 322 and drives the screw rod 322 to rotate.

[0064] In other embodiments, the driving assembly 32 may be arranged in other ways, such as arranging the driving assembly 32 to include only the driving member 321, omitting the screw rod 322 and the nut 323, and the support plate 31 is directly connected to the driving member 321. The driving member 321 is a cylinder.

[0065] Continue reading Figure 2The testing device 100 further includes a slider 70 and a guide rail 80 extending along a first direction, wherein one of the guide rail 80 and the slider 70 is connected to the frame 33, and the other of the guide rail 80 and the slider 70 is connected to the support plate 31. The slider 70 cooperates with the guide rail 80 to guide the support plate 31 in the first direction. In this way, when the support plate 31 moves relative to the frame 33 along the first direction, the slider 70 cooperates with the guide rail 80 to prevent the support plate 31 from running off.

[0066] In some embodiments, see Fig.10 The test device 100 further includes a first sensing member 90 and a first matching member 110, one of which is disposed on the frame 33 and the other on the support plate 31. When the support plate 31 is in the first state and the distance between the support plate 31 and the test mechanism 10 in the first direction reaches a first preset threshold, the first sensing member 90 can sense the first matching member 110, and the drive assembly 32 stops driving the support plate 31 to move in the positive direction along the first direction. When the first direction is the height direction, the test mechanism 10 is located above the drive mechanism 30, and the positive direction of the first direction is the upward direction of the height direction.

[0067] When the support plate 31 is in the first state, the seal 40 is compressed and sealed between the support plate 31 and the test mechanism 10. At this time, the distance between the support plate 31 and the test mechanism 10 in the first direction is small. Depending on the degree of compression of the seal 40, the distance between the support plate 31 and the test mechanism 10 in the first direction is different. The drive component 32 can change the degree of compression of the seal 40 by driving the support plate 31 to move, thereby changing the distance between the magnetic element 50 and the test plate 20, and then changing the magnetic field strength provided by the magnetic element 50 to the test piece. The setting of the first preset threshold is determined according to the magnetic field strength required by the test piece, that is, according to the distance between the magnetic element 50 and the test piece. Specifically, the position of the first sensing member 90 and / or the first matching member 110 is adjustable to change the size of the first preset threshold.

[0068] With the above arrangement, when the distance between the support plate 31 and the test mechanism 10 in the first direction reaches a first preset threshold, the first sensing member 90 can sense the first matching member 110, and the driving assembly 32 stops driving the support plate 31 to move in the positive direction along the first direction, thereby ensuring that the magnetic element 50 provides a suitable magnetic field strength to the test piece.

[0069] In some embodiments, the first sensing element 90 is a photoelectric sensor, and the first matching element 110 is a blocking piece.

[0070] Continue reading Figure 1, the test device 100 also includes a first limit portion 120 and a first matching portion 130, one of which is arranged on the frame 33, and the other is arranged on the support plate 31. When the support plate 31 is in the first state and the distance between the support plate 31 and the test mechanism 10 in the first direction reaches the minimum limit value, the first limit portion 120 abuts against the first matching portion 130, and the drive assembly 32 stops driving the support plate 31 to move forward in the first direction. Among them, the minimum limit value is less than the first preset threshold value. In some embodiments, the minimum limit value is 0, the seal 40 is compressed to the limit value, and the support plate 31 abuts against the test mechanism 10 in the first direction. Of course, in some other embodiments, the minimum limit value is not limited.

[0071] If the first sensing member 90 is damaged, the driving assembly 32 will continue to drive the support plate 31 to move forward along the first direction. According to the above arrangement, when the distance between the support plate 31 and the test mechanism 10 in the first direction reaches the minimum limit value, the first limit portion 120 abuts against the first matching portion 130, and the driving assembly 32 stops driving the support plate 31 to move forward along the first direction, thereby preventing some structures from being squeezed and damaged, such as preventing the magnetic element 50 and the test board 20 from being damaged by overpressure, and playing a certain protective role.

[0072] Continue reading Fig.10 The test device 100 further includes a second sensing member 140 and a second matching member 150, one of which is disposed on the frame 33 and the other on the support plate 31. When the support plate 31 is in the second state and the distance between the support plate 31 and the test mechanism 10 in the first direction reaches a second preset threshold, the second sensing member 140 can sense the second matching member 150, and the driving assembly 32 stops driving the support plate 31 to move in the reverse direction along the first direction. This arrangement can prevent the distance between the support plate 31 and the test mechanism 10 from being too large.

[0073] In some specific embodiments, the first sensing member 90 and the second sensing member 140 are integrated into one body, and the first matching member 110 and the second matching member 150 are spaced apart in the first direction. In other specific embodiments, the first sensing member 90 and the second sensing member 140 are spaced apart in the first direction, and the first matching member 110 and the second matching member 150 are integrated into one body.

[0074] In some embodiments, see Figure 1The test device 100 further includes a second position-limiting portion 160 and a second matching portion 170, one of which is disposed on the frame 33 and the other on the support plate 31. When the support plate 31 is in the second state and the distance between the support plate 31 and the test mechanism 10 in the first direction reaches the maximum limit value, the second position-limiting portion 160 abuts against the second matching portion 170, and the driving assembly 32 stops driving the support plate 31 to move in the reverse direction along the first direction. The maximum limit value is greater than the second preset threshold value.

[0075] If the second sensing member 140 is damaged, the driving assembly 32 will continue to drive the support plate 31 to move in the opposite direction along the first direction. According to the above arrangement, when the distance between the support plate 31 and the testing mechanism 10 in the first direction reaches the maximum limit value, the second limiting portion 160 abuts against the second matching portion 170, and the driving assembly 32 stops driving the support plate 31 to move in the opposite direction along the first direction, thereby preventing some structures from being squeezed and damaged, such as preventing the support plate 31 from contacting with the driving member 321 and causing damage to the driving member 321, thus playing a certain protective role.

[0076] In some embodiments, a part of the support plate 31 can be used as the above-mentioned matching part or limiting part. For example, the support plate 31 includes a connecting plate 312 and a supporting plate 313 connected to each other, the connecting plate 312 is connected to the guide rail 80 through a slider 70, and the magnetic element 50 and the sealing member 40 are arranged on the supporting plate 313. The above-mentioned matching part or limiting part is directly formed on the connecting plate 312. The support plate 31 also includes a supporting rib 314, which is obliquely supported between the connecting plate 312 and the supporting plate 313 to play a reinforcing role.

[0077] Further, the driving mechanism 30 also includes casters 36, which are mounted on the frame 33, and the driving mechanism 30 moves relative to the work surface via the casters 36. In this way, when the driving mechanism 30 is not needed, the driving mechanism 30 can be moved to a suitable position via the casters 36.

[0078] The testing device 100 provided in the embodiment of the present application has the following beneficial effects:

[0079] 1. When the support plate 31 is in the first state, the seal 40 can seal the opening 12 of the sealing cavity 11, so that the test board 20 is in a completely sealed environment, avoiding frost on the surface of the test board 20 when the test piece is tested at a low temperature, thereby ensuring the test effect of the test piece.

[0080] 2. When the second support plate 31 is in the second state, the magnetic element 50 extends out of the sealed cavity 11 through the opening 12. At this time, the magnetic element 50 and the support plate 31 are away from the test board 20. When the test piece is replaced, the support plate 31 and the magnetic element 50 will not interfere with the test board 20, which facilitates the disassembly and assembly of the test board 20 and improves the test efficiency.

[0081] 3. The driving assembly 32 can drive the support plate 31 to move in the first direction, thereby changing the distance between the magnetic element 50 and the test board 20 in the first direction to meet the requirements of different magnetic field strengths for different test pieces.

[0082] 4. Different fixing hole groups 311 on the support plate 31 can be used to install magnetic components 50 of different specifications to meet the testing requirements of various test pieces.

[0083] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0084] The above-mentioned embodiments only express several implementation methods of the utility model, and the description is relatively specific and detailed, but it cannot be understood as limiting the scope of the utility model patent. It should be pointed out that for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of the utility model, which all belong to the protection scope of the utility model. Therefore, the protection scope of the utility model patent shall be based on the attached claims.

Claims

1. A testing device, characterized in that: include: A testing mechanism (10) having a sealed cavity (11) for accommodating a testing board (20), wherein the sealed cavity (11) has an opening (12), and the testing board (20) is used for being electrically connected to a test piece; A driving mechanism (30) comprising a connected support plate (31) and a driving assembly (32), wherein the support plate (31) is used to mount a magnetic element (50); A sealing member (40) is provided on at least one of the support plate (31) and the testing mechanism (10); The driving assembly (32) is capable of driving the support plate (31) to move along a first direction so as to switch the support plate (31) between a first state and a second state; when the support plate (31) is in the first state, the magnetic element (50) is capable of extending into the sealed cavity (11) through the opening (12) to provide a magnetic field environment for the test piece, and the sealing element (40) is compressed between the support plate (31) and the test mechanism (10) to seal the opening (12); when the support plate (31) is in the second state, the magnetic element (50) is capable of extending out of the sealed cavity (11) through the opening (12).

2. The testing device according to claim 1, characterized in that: The sealing member (40) is annular; When the support plate (31) is in the first state, the sealing member (40) is arranged around the periphery of the opening (12).

3. The testing device according to claim 2, characterized in that: The sealing member (40) comprises a plurality of sealing strips (41), and the plurality of sealing strips (41) are arranged in sequence in a ring shape.

4. The testing device according to claim 1, characterized in that: The driving mechanism (30) further comprises a frame (33), and the driving component (32) is mounted on the frame (33); when the driving component (32) drives the support plate (31) to move along the first direction, the testing mechanism (10) and the frame (33) remain relatively fixed.

5. The testing device according to claim 4, characterized in that: The driving assembly (32) comprises a driving member (321), a screw rod (322) and a nut (323); the screw rod (322) and the driving member (321) are both connected to the frame (33); the nut (323) is threadedly connected to the screw rod (322); and the support plate (31) is connected to the nut (323); The driving member (321) can drive the screw rod (322) to rotate relative to the frame (33), so as to drive the nut (323) to move along the first direction, thereby causing the support plate (31) to move along the first direction.

6. The testing device according to claim 4, characterized in that: The testing device further comprises a first sensing member (90) and a first matching member (110); one of the first sensing member (90) and the first matching member (110) is arranged on the frame (33), and the other is arranged on the support plate (31); when the support plate (31) is in the first state and the distance between the support plate (31) and the testing mechanism (10) in the first direction reaches a first preset threshold, the first sensing member (90) is able to sense the first matching member (110), and the driving component (32) stops driving the support plate (31) to move in the forward direction along the first direction; and / or The testing device further comprises a second sensing member (140) and a second matching member (150); one of the second sensing member (140) and the second matching member (150) is arranged on the frame (33), and the other is arranged on the support plate (31); when the support plate (31) is in the second state and the distance between the support plate (31) and the testing mechanism (10) in the first direction reaches a second preset threshold, the second sensing member (140) is able to sense the second matching member (150), and the driving component (32) stops driving the support plate (31) to move in the opposite direction along the first direction.

7. The testing device according to claim 4, characterized in that: The testing device further comprises a first limiting portion (120) and a first matching portion (130); one of the first limiting portion (120) and the first matching portion (130) is arranged on the frame (33), and the other is arranged on the support plate (31); when the support plate (31) is in the first state and the distance between the support plate (31) and the testing mechanism (10) in the first direction reaches a minimum limit value, the first limiting portion (120) abuts against the first matching portion (130), and the driving component (32) stops driving the support plate (31) to move in the forward direction along the first direction; and / or The testing device further comprises a second limiting portion (160) and a second matching portion (170); one of the second limiting portion (160) and the second matching portion (170) is arranged on the frame (33), and the other is arranged on the support plate (31); when the support plate (31) is in the second state and the distance between the support plate (31) and the testing mechanism (10) in the first direction reaches a maximum limit value, the second limiting portion (160) abuts against the second matching portion (170), and the driving component (32) stops driving the support plate (31) to move in the opposite direction along the first direction.

8. The testing device according to claim 4, characterized in that: The testing device further comprises a slider (70) and a guide rail (80) extending along the first direction, wherein one of the guide rail (80) and the slider (70) is connected to the frame (33), and the other of the guide rail (80) and the slider (70) is connected to the support plate (31), and the slider (70) cooperates with the guide rail (80) to guide the support plate (31) in the first direction.

9. The testing device according to claim 4, characterized in that: The driving mechanism (30) further comprises a caster (36), wherein the caster (36) is mounted on the frame (33), and the driving mechanism (30) moves relative to the working surface via the caster (36).

10. The testing device according to claim 1, characterized in that: The support plate (31) is provided with a plurality of fixing hole groups (311), the fixing hole groups (311) being used to install the magnetic elements (50), and the sizes of the magnetic elements (50) installed in the fixing hole groups (311) are different.

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