Test switching structure and test system
By designing a test adapter structure for 5G communication module, using multiple probes and adapter components to automatically turn on signals, the problem of low testing efficiency in the prior art is solved, and fast and automatic power-on and down timing testing is achieved.
Patent Information
- Application Number
- CN202323669689.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2023-12-29
- Publication Date
- 2025-02-18
- Estimated Expiration
- 2033-12-29
AI Technical Summary
The prior art is inefficient when testing the power-on and down timing of the 5G communication module, and it takes two testers 2 hours to complete the 20 signal test.
A test adapter structure is designed, including a bracket, a plurality of first probes and a circuit board, for connecting the communication module and an oscilloscope, and through a plurality of probes and adapter components, the measured signal is drawn out and automatically turned on to Any channel of the oscilloscope.
Through this structure, the tester can automatically complete the power-on or power-off timing test without repeated operations, which significantly improves the testing efficiency.
Smart Images
Figure CN222506358U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to testing technology, in particular to a testing switching structure and a testing system. Background Art
[0002] For communication modules with communication functions such as 5G, it is very necessary and necessary to measure the power-on and power-off timing at the prototype stage, otherwise the final product may not meet the design specifications and cannot operate normally. The so-called power-on and power-off timing measurement refers to the change state and sequence of key signals during the power-on and power-off process of the test product. These key signals can be power signals, clock signals, enable signals, etc.
[0003] In the prior art, at least two testers usually use an oscilloscope to manually test whether the power-on and power-off timing of the communication module is normal. Specifically, one tester is responsible for turning on and off the machine and operating the oscilloscope, and the other tester is responsible for contacting the probe of the oscilloscope with the test point of the communication module. Due to the size of the probe and the internal space of the communication module, the communication module can only accommodate two probes at a time, so only two signals of the communication module can be tested at a time.
[0004] According to the inventor's observation and analysis, 5G communication modules generally need to test about 20 signals for power-on and power-off timing. When using the existing method to measure, two testers need about 2 hours to complete the test. Therefore, the current test solution has the problem of low test efficiency. Utility Model Content
[0005] The purpose of the utility model is to provide a test switching structure and a test system, which can improve the test efficiency.
[0006] A test adapter structure of an embodiment of the utility model is used to be arranged between a communication module to be tested and an oscilloscope, and includes: a bracket, a plurality of first probes and a circuit board, wherein the plurality of first probes and the circuit board are all mounted on the bracket, and a plurality of first interfaces, a plurality of fourth interfaces and a first adapter component are arranged on the circuit board; wherein the plurality of first probes are used to be respectively connected to the respective test contacts of the communication module to be tested; the plurality of first interfaces are respectively connected to the plurality of first probes, and are used to receive the measured signals from the test contacts through the first probes; the plurality of fourth interfaces are respectively connected to the respective channels of the oscilloscope, and are used to output the measured signals; and the first adapter component has a plurality of connection paths that can be controlled to be on and off, and the plurality of connection paths connect any one of the plurality of first interfaces with any one of the plurality of fourth interfaces.
[0007] The circuit board is arranged at one end of the bracket, and a receiving space for receiving the communication module to be tested is arranged on the circuit board, and the communication module to be tested is installed in the receiving space.
[0008] Wherein, the plurality of first probes are arranged on the other end of the bracket relative to the circuit board, and the plurality of first probes are rotatably mounted on the bracket.
[0009] The plurality of first probes are respectively connected to the plurality of first interfaces through probe connection lines.
[0010] Wherein, an insulating structure is provided at least on the side walls of the plurality of first probes.
[0011] The first adapter component is an N×M relay group, wherein N is the number of first interfaces, M is the number of fourth interfaces, and each of the relay groups has a corresponding drive circuit.
[0012] Among them, the test adapter structure also includes: a second probe, connected to the switch contact of the communication module under test; a third probe, connected to the power contact of the communication module under test; the circuit board is also provided with: a second interface, connected to the second probe; a third interface, connected to the third probe; a fifth interface, connected to an external power supply; a second adapter component, connected to the second interface, capable of connecting or disconnecting the second interface with a reference level point; a third adapter component, connected between the third interface and the fifth interface, capable of connecting or disconnecting the third interface with the fifth interface.
[0013] Among them, the circuit board is also provided with: a sixth interface connected to the host computer and to the first to third adapter components; a control circuit connected to the sixth interface and the first to third adapter components; a power conversion circuit connected between the sixth interface and the control circuit; and a plurality of indicator lights connected to the control circuit for indicating the on / off status of the first to third adapter components.
[0014] The first probe comprises: a probe body and a tip located at one end of the probe body, and the cross-sectional area of the tip gradually decreases.
[0015] A test system according to an embodiment of the utility model comprises: an oscilloscope and a test switching structure, wherein the test switching structure is connected between the oscilloscope and a communication module to be tested, and the test switching structure is as shown above.
[0016] Beneficial effects of the utility model:
[0017] The utility model adds a test adapter structure between the tested communication module and the oscilloscope, and the test adapter structure has a plurality of probes that can contact each test contact of the communication module to lead out the test signal. The test adapter structure also has a switching component that can connect the led-out test signal to any channel of the oscilloscope. With such a structure, the tester does not need to repeatedly perform manual operations during the test, thereby improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] One or more embodiments are exemplarily described by pictures in the corresponding drawings, and these exemplified descriptions do not constitute limitations on the embodiments. Elements with the same reference numerals in the drawings represent similar elements, and unless otherwise stated, the figures in the drawings do not constitute proportional limitations.
[0019] Figure 1 It is a structural schematic diagram of an embodiment of the test system of the utility model;
[0020] Figure 2 It is a structural schematic diagram of an embodiment of the test adapter structure of the utility model;
[0021] Figures 3 to 5 , is a schematic diagram of the structure of different test adapter embodiments. DETAILED DESCRIPTION
[0022] In order to make the purpose, technical scheme and advantages of the utility model clearer, the various embodiments of the utility model will be described in detail below with reference to the accompanying drawings. However, it can be understood by those skilled in the art that in the various embodiments of the utility model, many technical details are provided in order to enable readers to better understand the present application. However, even without these technical details and various changes and modifications based on the following embodiments, the technical schemes claimed for protection in the claims of the present application can be implemented.
[0023] In the embodiments of the present invention, the terms "upper", "lower", "left", "right", "front", "back", "top", "bottom", "inside", "outside", "middle", "vertical", "horizontal", "lateral", "longitudinal" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings. These terms are mainly used to better describe the present invention and its embodiments, and are not used to limit the indicated devices, elements or components to have a specific orientation, or to be constructed and operated in a specific orientation.
[0024] In addition, some of the above terms may be used to express other meanings in addition to indicating orientation or positional relationship. For example, the term "on" may also be used to express a certain dependency or connection relationship in some cases. For those skilled in the art, the specific meanings of these terms in this utility model can be understood according to specific circumstances.
[0025] In addition, the terms "installed", "set", "provided with", "opened", "connected", and "connected" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral structure; it can be a mechanical connection, or an electrical connection; it can be a direct connection, or an indirect connection through an intermediate medium, or it can be an internal connection between two devices, elements, or components. For those of ordinary skill in the art, the specific meanings of the above terms in this utility model can be understood according to specific circumstances.
[0026] In addition, the terms "first", "second", etc. are mainly used to distinguish different devices, elements or components (the specific types and structures may be the same or different), and are not used to indicate or imply the relative importance and quantity of the indicated devices, elements or components. Unless otherwise specified, "plurality" means two or more.
[0027] like Figure 1 and 2 As shown in FIG. 1 , they are schematic diagrams of the test system and the test adapter structure of the present utility model. Figure 1 As shown, the test adapter structure 32 of this embodiment is arranged between the communication module 30 to be tested, such as a 5G communication module, and the oscilloscope 33, so that the signal in the communication module 30 can be introduced and transmitted to the oscilloscope 33 to support various tests on the communication module 30, such as the test of the power-on or power-off timing. Since the test adapter structure 32 is arranged between the communication module 30 and the oscilloscope 33, the test adapter structure 32 can lead out the measured signal at one time and conduct it to the corresponding channel of the oscilloscope 33 as needed. Therefore, during the test, there is no need for the tester to operate the probe of the oscilloscope 33 to repeatedly contact the different test contacts of the communication module 30 for testing, thereby improving the test efficiency.
[0028] Figure 1 An example of the test switching structure 32 can be referred to Figure 2 As shown. Figure 2 As shown, the test adapter structure 32 includes: a bracket 1 , a plurality of first probes 4 and a circuit board 2 .
[0029] The bracket 1 may be a cube or a cuboid structure, and as a supporting structure of the test adapter structure 32 , it may be made of a hard material and has strong stability.
[0030] The plurality of first probes 4 and the circuit board 2 are mounted on the bracket 1. For example, the circuit board 2 is arranged at one end (such as the bottom) of the bracket 1, and the first probes 4 are arranged at the other end (such as the top) of the bracket 1 opposite to the end.
[0031] A storage space for accommodating the communication module 30 is provided in the circuit board 2. During testing, the communication module 30 is fixed in the storage space with the contacts facing upward, for example, the communication module 30 can be fixed in the storage space by a non-marking tape. A plurality of contacts 31 and 32 are provided on the communication module 30, and the first probe 4 contacts these contacts respectively to lead the measured signal out of the communication module 30, wherein the contact 31 leads the measured signal from the test point, and the contact 32 leads the test signal from the resistor-capacitor pin.
[0032] The first probe 4 can be rotatably mounted on the bracket 1, for example, by a movable joint, so that the tester can flexibly operate the first probe 4 to contact the contacts 31 and 32 on the communication module 30 and then fix the position of the probe.
[0033] In addition, the first probe 4 is provided with an insulating structure, such as an insulating film or insulating paint, at least on the side wall to prevent the probes from being electrically connected to each other.
[0034] In addition, a label 42 may be provided on each first probe 4 to indicate which signal the probe is specifically connected to, for example, indicating that the probe is connected to the measured signal A in the communication module 30 .
[0035] In addition, the first probe 4 may include: a probe body and a tip at one end of the probe body, the cross-sectional area of the tip gradually decreases so that the probe can more easily and stably contact the contact point. More specifically, the probe tip may be a particularly hard tip and have compression elasticity to improve the contact stability between the probe and the contact point.
[0036] In addition, the number of the first probes 4 is not limited to that shown in the figure. Generally, the number of the first probes 4 can be equal to the number of the signals to be tested, so as to facilitate the extraction of all the signals to be tested at one time. However, due to the fact that the test signals involved in different tests may be different, and the test signals involved in different communication modules may also be different, as well as the limitations of factors such as the structure of the bracket 1, the number of the first probes 4 may also be greater than or less than the number of the signals to be tested, and these are not limited by the present invention. In the case where the number of the first probes 4 is less than the number of the signals to be tested, the operator can operate the first probes 4 to extract the signals to be tested in batches.
[0037] In this embodiment, by providing the first probe 4, the signal to be tested can be easily led out to facilitate testing.
[0038] Continue as Figure 2 As shown, a plurality of first interfaces 61 , a plurality of fourth interfaces 62 and a first adapter component are further provided on the circuit board 2 .
[0039] The plurality of first interfaces 61 are respectively connected to the plurality of first probes 4, for example, through the probe connection lines 5. The plurality of fourth interfaces 62 respectively correspond to the respective channels of the oscilloscope to output the measured signal to the respective channels of the oscilloscope. The first adapter component is arranged between the first interface 61 and the fourth interface 62, and can output any measured signal to any oscilloscope channel.
[0040] in, Figure 2 The number of the first interfaces 61 and the fourth interfaces 64 shown is only an example and not a limitation. The number of the first interfaces 61 matches the number of the first probes 61, which is generally equal to the number of the tested signals, for example, the number is N, and the number of the fourth interfaces 64 matches the number of channels of the oscilloscope 33, for example, M.
[0041] The structure of the first adapter component is not Figure 2 It is shown in Figure 1 It constitutes a part of the adapter assembly 321, and an exemplary structure thereof can be referred to Figure 3 As shown, where, as an example, Figure 3 Only the structure corresponding to one measured signal is shown.
[0042] Specifically, the first adapter component is mainly used to transfer the measured signal to each channel of the oscilloscope 33, for example, to transfer N channels of measured signals to M channels of the oscilloscope. Specifically, the adapter component 321 can have multiple connection paths (such as Figure 3 As shown, it can be composed of relays and corresponding drive circuits), and the multiple connection paths can connect any one of the measured signals to any oscilloscope channel. For example, when the measured signal A is to be connected to channel 1 of the oscilloscope 33, the drive circuit is controlled to close relay 1 and disconnect relays 2 to M, so that the path between the measured signal A and channel 1 can be connected. Other similarities are not repeated here.
[0043] Therefore, in one embodiment, the first adapter component can be composed of an N×M relay group, so that any signal under test can be connected to any channel. Therefore, during testing, only the on and off of the relay in the first adapter component needs to be controlled to automatically map the test signal to the oscilloscope channel, thereby improving the test efficiency.
[0044] Continue as Figure 1 and 2As shown, a second interface (i.e., a power on / off control interface) 63 is also provided on the circuit board 3, and the communication module 3 includes a power on / off contact 33. The second interface 63 is connected to the power on / off contact 33 via a second probe and a probe connecting line, so that the communication module 3 can be started or shut down via the second interface 63, the probe connecting line, the second probe, and the power on / off contact 33. Among them, the structure of the second probe is similar to that of the first probe 4, which will not be repeated here. In addition, a second adapter component is correspondingly provided on the circuit board 3, which is connected to the second interface 63 and can connect or disconnect the second interface 63 with a reference level point (such as ground GND). Among them, the second adapter component constitutes Figure 2 A part of the intermediate transfer component 321, the specific structure of which can be referred to Figure 4 As shown. Figure 4 As shown, under the control of the driving circuit, the relay is closed to transfer the ground level (GND) to the second interface 63, thereby pulling down the level of the power-on / off contact 33 to instruct the communication module 3 to perform a power-on operation.
[0045] Continue as Figure 1 and 2 As shown, a third interface (i.e., a power output interface) 64 and 65 is also provided on the circuit board 3, and the communication module 3 includes power contacts 34 and 35. The third interface 64 and 65 is connected to the power contacts 34 and 35 via a third probe and a probe connecting line, so that power can be supplied to the communication module 3 via the third interface 64 and 65, the probe connecting line, the third probe, and the power contacts 34 and 35. Among them, the structure of the third probe is similar to that of the first probe 4, which will not be repeated here. In addition, a third adapter component is correspondingly provided on the circuit board 3, which is connected to the third interface 64 and 65, and can connect or disconnect the third interface 64 and 65 to the positive and negative poles of the power supply. Among them, the third adapter component constitutes Figure 2 A part of the intermediate transfer component 321, the specific structure of which can be referred to Figure 5 As shown. Figure 5 As shown, under the control of the driving circuit, the relay is closed to transfer the power + and power - to the third interface 64 and 65, thereby supplying power to the communication module 3. Figure 1 and 2 As shown, the power supply can come from an external DC power supply 35, which can convert the AC power into the voltage required for the communication module 30 to work, and then supply power to the communication module 30 through the fifth interface 67 and 68 (i.e., the power input interface) on the circuit board 3.
[0046] Continue as Figure 1 and 2As shown, the test adapter structure 32 also includes: a control circuit, such as an MCU (micro control unit), which is used to control the on and off of the relay in the adapter component 321. In addition, an indicator light 7 can be set in the test adapter structure 32 to indicate which channel the measured signal is conducted to. For example, when the indicator light with the silk screen 11 is on, it can indicate that the measured signal 1 is selected to the channel 1 of the oscilloscope.
[0047] In addition, the test switching structure 32 also includes: a sixth interface (eg, Figure 2 The sixth interface 66 is connected to the host computer 34 to receive control signals and power signals from the host computer 34. For example, through the sixth interface 66, the 5V power from the host computer 34 can be provided to the adapter component 321 as the driving power of the driving circuit (such as a triode) of the adapter component 321. And after being converted by the power conversion circuit, it is provided to the control circuit for use.
[0048] In addition, the host computer 34 is connected to the oscilloscope 33 for communication so as to control the oscilloscope 33, for example, to perform the settings required for testing the oscilloscope 33 and to obtain the test results.
[0049] When using Figure 1 and Figure 2 When testing the communication module 30 using the structure shown, the communication module 30 can be first fixed in the accommodation space in the circuit board 2, and then various probes are set to firmly contact various contacts in the communication module 30, such as test contacts, switch contacts, power contacts, etc. Next, the oscilloscope and the like are initially set before testing. Then, the host computer 34 is used to control the on and off of the relay in the adapter component 321 to realize the automatic startup and shutdown of the communication module 30, and to export the test signal to the oscilloscope 33 and other operations, so as to test the power-on timing or the power-off timing respectively. After the test is completed, the oscilloscope 33 sends the test results to the host computer 34.
[0050] It can be seen from the above test process that by using the test adapter structure of the embodiment of the utility model, the tester can automatically implement the power-on or power-off timing test after the initial setting, without the need for the tester to perform repeated operations, thereby improving the test efficiency.
[0051] The “subject name” provided for the implementation mode of the present invention is introduced in detail above. Specific examples are used in this article to illustrate the principle and implementation mode of the present invention. The description of the above implementation mode is only used to help understand the idea of the present invention. There may be changes in the specific implementation mode and the scope of application. In summary, the content of this specification should not be understood as a limitation on the present invention.
Claims
1. A test switching structure, used to be arranged between a communication module under test and an oscilloscope, characterized in that: include: A bracket, a plurality of first probes and a circuit board, wherein the plurality of first probes and the circuit board are mounted on the bracket, and a plurality of first interfaces, a plurality of fourth interfaces and a first adapter component are arranged on the circuit board; Wherein, the plurality of first probes are used to be respectively connected to the respective test contacts of the tested communication module; The plurality of first interfaces are respectively connected to the plurality of first probes and are used to receive the measured signals from the test contacts through the first probes; The plurality of fourth interfaces are respectively connected to the channels of the oscilloscope and are used to output the measured signal; and The first adapter component has a plurality of connection paths whose on / off can be controlled, and can connect any one of the plurality of first interfaces with any one of the plurality of fourth interfaces.
2. The test adapter structure according to claim 1, characterized in that: The circuit board is arranged at one end of the bracket, and a receiving space for receiving the communication module to be tested is arranged on the circuit board, and the communication module to be tested is installed in the receiving space.
3. The test adapter structure according to claim 2, characterized in that: The plurality of first probes are arranged on the other end of the bracket opposite to the circuit board, and the plurality of first probes are rotatably mounted on the bracket.
4. The test adapter structure according to claim 1, characterized in that: The plurality of first probes are respectively connected to the plurality of first interfaces through probe connection lines.
5. The test adapter structure according to claim 1, characterized in that: An insulating structure is provided at least on side walls of the plurality of first probes.
6. The test adapter structure according to claim 1, characterized in that: The first adapter component is an N×M relay group, wherein N is the number of first interfaces, M is the number of fourth interfaces, and each of the relay groups has a corresponding driving circuit.
7. The test adapter structure according to claim 1, characterized in that: Also includes: a second probe connected to a switch contact of the communication module under test; and a third probe connected to a power contact of the communication module under test; Also provided on the circuit board are: A second interface connected to the second probe; A third interface connected to the third probe; The fifth interface is connected to an external power supply; A second adapter component is connected to the second interface and is capable of connecting or disconnecting the second interface from the reference level point; The third adapter component is connected between the third interface and the fifth interface, and can connect or disconnect the third interface and the fifth interface.
8. The test switching structure according to claim 7, characterized in that: Also provided on the circuit board are: The sixth interface is connected to the host computer and to the first to third adapter components; A control circuit connected to the sixth interface and the first to third adapter components; A power conversion circuit, connected between the sixth interface and the control circuit; as well as A plurality of indicator lights are connected to the control circuit and are used to indicate the on and off status of the first to third adapter components.
9. The test switching structure according to claim 1, characterized in that: The first probe comprises: a probe body and a tip located at one end of the probe body, and the cross-sectional area of the tip gradually decreases.
10. A testing system, characterized in that: include: An oscilloscope and a test switching structure, wherein the test switching structure is connected between the oscilloscope and the communication module to be tested, and the test switching structure is the test switching structure as claimed in any one of claims 1 to 9.