Backscattered ray index testing tool

Abstract

The utility model provides a backscattered ray index testing tool, which is used for testing backscattered ray indexes of backscattered ray scanning inspection equipment positioned on the left side and / or the right side of the backscattered ray index testing tool, and comprises a fixed frame and a pose adjusting device. And the back scattering scanning inspection equipment tests back scattering ray indexes by detecting the test object. The fixing frame comprises a plurality of first connecting parts which are arranged in the front-back direction in the back scattered ray index testing process, and each first connecting part is used for being fixedly connected with a tested object. The pose adjusting device is configured to adjust the pose of the first connecting part so as to adjust the pose of the test object. The pose adjusting device comprises at least one of the following adjusting parts: a first angle adjusting part which is configured to enable the first connecting part to rotate around the vertical axis by at least 180 degrees; the second angle adjusting part is configured to enable the at least one first connecting part to change an included angle relative to the horizontal plane; and a first position adjusting part configured to change the position of the first connecting part in the left-right direction.

Description

Technical Field

[0001] The present application relates to the field of radiation inspection technology, and in particular to a backscattered radiation index testing tool. Background Art

[0002] Backscatter ray security inspection equipment usually needs to be tested for backscatter ray technical indicators in accordance with ANSI standards. These include four indicators: penetration, spatial resolution, wire detection, and contrast sensitivity, to ensure that the product functions meet the customer's on-site use requirements.

[0003] These index tests share a set of backscattered radiation index test equipment. Different test objects are used when testing different indexes.

[0004] When testing the penetration index, the test object includes a polyethylene arrow, a substrate steel plate and a shielding object. The shielding object is a steel sheet. The shielding object is located between the beam and the polyethylene arrow, and the substrate steel plate is located on the side of the polyethylene arrow away from the shielding object.

[0005] When testing spatial resolution, the test object includes a polyethylene structure with grooves as the test target and a substrate steel plate. The polyethylene structure with grooves can be a polyethylene flat plate with three grooves, or three polyethylene square columns arranged side by side and equally spaced can be fixed on a crossbar. During the test, the test target is located between the beam and the substrate steel plate.

[0006] When testing wire resolution, the test object includes multiple copper wires of different diameters arranged side by side and spaced apart, and a polyethylene reflector for arranging bare copper wires. Each copper wire is placed in a sinusoidal shape, and the side where the test copper wire is located faces the beam direction during the test.

[0007] When testing contrast, there are two indicators: layered contrast and isolated contrast. When testing layered contrast, the test object includes multiple stacked polyethylene arrows and polyethylene reflectors, and the multiple stacked polyethylene arrows are located between the beam and the polyethylene reflector. When testing isolated contrast, the test object includes multiple stacked polyethylene arrows and steel liner, and the multiple stacked polyethylene arrows are located between the beam and the steel liner.

[0008] like Figure 1 As shown, the backscattered radiation index test tool of the related art includes a test object 5', a fixing frame 6', a cushion block 7' and a chassis vehicle 8'. The number of the fixing frame 6' is one, which is used to install the test object. The chassis vehicle 8' can be moved along the front and rear ( Figure 1The fixing frame 6' can be moved in a direction perpendicular to the paper surface in the figure, and the fixing frame 6' can change its position along with the chassis 8'. There can be a plurality of cushion blocks 7', which are used to be placed between the fixing frame 6' and the chassis 8' to adjust the height of the fixing frame 6'. After the fixing frame 6', the cushion blocks 7' and the chassis 8' are arranged, they are fixed with straps.

[0009] The objects to be tested are arranged on the left and right sides of the backscattered radiation indicator test fixture ( Figure 1 Each backscatter detection device includes a ray source and a corresponding backscatter ray detector. Figure 1 The two backscatter detection devices are respectively a first backscatter scanning inspection device located on the left and a second backscatter scanning inspection device located on the right. The first backscatter scanning inspection device includes a first ray source 1' located on the left side of the figure and a first backscatter beam detector 3' located on the left side of the figure. The second backscatter scanning inspection device includes a second ray source 9' located on the right side of the figure and a second backscatter beam detector 4' located on the right side of the figure. The first ray source 1' and the second ray source 9' are, for example, X-ray sources.

[0010] When testing the backscatter scanning inspection device, the test object 5 ′ is fixed on the fixing frame 6 ′. Figure 1 FIG. 4 shows a case where the test penetration index of the first backscatter scanning inspection device is detected. Figure 1 As shown, the test object 5' includes a shielding object 51', a polyethylene arrow 52' and a substrate steel plate 53'. The shielding object 51' is arranged toward the side where the first radiation source 1' is located. The shielding object 51', a polyethylene arrow 52' and the substrate steel plate 53' are arranged in sequence from the side close to the first radiation source 1' emitting the radiation beam 2 to the side away from the first radiation source 1' ( Figure 1 During the test, the first ray source 1' emits a ray beam 2', which irradiates the test object 5', and the light reflected by the test object 5' is detected by the first backscattered ray detector 3'. The data measured by the first scattered ray detector 3' can be used for backscattered ray index analysis of the first backscattered scanning inspection device.

[0011] Because the types of indicators, test targets, obstructions, substrate steel plates, and test heights are different.

[0012] When performing the backscattered ray index test, since it is necessary to use a strap to fix the fixing frame 6', the cushion block 7' and the chassis 8' together, more space is required for the fixing position of the strap and the fixing operation. Therefore, one set of backscattered ray index test tools are generally arranged on the chassis 8' or two sets of backscattered ray index test tools are arranged at intervals in the front and rear directions. The test personnel can only test 1-2 indicators for the single-side backscattered scanning inspection equipment each time. After completing a test, the test object 5' needs to be replaced and the fixed test object 5' needs to be reinstalled. After the backscattered ray index test of the backscattered scanning inspection equipment on one side is completed, the backscattered ray index test of the backscattered scanning inspection equipment on the other side needs to repeat the above work. Each time different indicators are tested and the test direction is changed, the substrate steel plate needs to be repeatedly moved, which is time-consuming, labor-intensive and inefficient. In addition, in order to ensure the scanning height requirements, cushion blocks 7' of different heights are used to raise the bottom of the fixed frame 6', and the fixed frame 6', cushion block 7' and the chassis 8' are fixed with straps, which may be loosely fixed.

[0013] The above statements are only used to provide background information related to the present application and do not necessarily constitute prior art. Utility Model Content

[0014] The purpose of the present application is to provide a backscattered radiation index testing tool, aiming to improve the testing efficiency.

[0015] The present application provides a backscattered ray index test tool, which is used to test the backscattered ray index of a backscattered scanning inspection device located on the left and / or right side of the backscattered ray index test tool, comprising:

[0016] a fixing frame, comprising a plurality of first connecting parts arranged along the front-to-back direction during a backscattered ray index test of the backscattered scanning inspection device, each of the first connecting parts being used to fixedly connect a test object, and the backscattered scanning inspection device testing the backscattered ray index by detecting the test object; and

[0017] The posture adjustment device is configured to adjust the posture of the first connection part to adjust the posture of the test object, and includes at least one of the following adjustment parts:

[0018] a first angle adjustment portion, configured to rotate the first connection portion at least 180° around a vertical axis;

[0019] A second angle adjustment portion, configured to change an angle of at least one of the first connection portions relative to a horizontal plane; and

[0020] The first position adjusting portion is configured to change the position of the first connecting portion in the left-right direction.

[0021] In some embodiments of the backscattered radiation index test tool, the posture adjustment device further includes at least one of the following adjustment parts:

[0022] A second position adjustment portion configured to change the position of the first connection portion in a front-to-rear direction; and

[0023] The third position adjusting portion is configured to change the position of the first connecting portion in the up-down direction.

[0024] In some embodiments of the backscattered radiation index testing tool, the first angle adjustment portion includes a slewing bearing, the fixing frame is installed on the slewing bearing, and the first connecting portion is rotated at least 180° around the vertical axis through the slewing bearing.

[0025] In some embodiments of the backscattered radiation index testing tool, the second angle adjustment portion includes a hinged connection structure and a top screw structure;

[0026] The fixed frame includes a first frame body and one or more second frames stacked on the first frame body, the second frame body includes the first connecting portion, one of the two opposite sides of the first frame body and at least one of the second frames is rotatably connected by the hinge connection structure, and the other side is set to change the upper and lower spacing by the top screw structure, and the angle of the first connecting portion of the at least one second frame relative to the horizontal plane can be changed by adjusting the matching position of the top screw structure and the first frame body and / or the at least one second frame.

[0027] In some embodiments of the backscattered radiation index testing tool, the fixed frame includes four second frames, the first frame is fixedly connected to two second frames located on the outside, one of the opposite sides of the first frame and the two second frames located in the middle is rotatably connected through the hinge connection structure, and the other side can be set with a changeable upper and lower spacing through the top screw structure.

[0028] In some embodiments of the backscattered radiation index testing tool, the first position adjustment unit includes:

[0029] a guide rail extending along the left-right direction; and

[0030] A movable frame, the fixed frame is arranged on the movable frame, and the movable frame is reciprocally movable along the extending direction of the guide rail so that the first connecting part changes the position in the left-right direction.

[0031] In some embodiments of the backscattered radiation index testing tool, the second position adjustment part includes a chassis vehicle, the fixing frame is installed on the chassis vehicle, and the chassis vehicle is configured to move in the front-to-back direction to change the position of the first connecting part in the front-to-back direction.

[0032] In some embodiments of the backscattered radiation index testing tool, the third position adjustment portion includes a mounting stand, the mounting stand includes a plurality of fixed frame mounting portions distributed along the up-down direction, and the fixed frame can be selectively connected to one of the plurality of fixed frame mounting portions to allow the first connecting portion to change its position in the up-down direction.

[0033] In some embodiments of the backscattered radiation indicator test tool,

[0034] The first position adjustment part includes a guide rail and a movable frame, the guide rail extends along the left-right direction, the fixed frame is arranged on the movable frame, and the movable frame is arranged to be reciprocatingly movable along the extension direction of the guide rail so that the first connecting part changes the position in the left-right direction;

[0035] The second position adjustment portion includes a chassis vehicle, the fixing frame is mounted on the chassis vehicle, and the chassis vehicle is configured to move in the front-rear direction to change the position of the first connection portion in the front-rear direction;

[0036] The posture adjustment device also includes a mounting frame, the mounting frame is fixedly connected to the chassis vehicle, and the guide rail is installed on the mounting frame.

[0037] In some embodiments of the backscattered radiation index test tool, the mounting base includes:

[0038] A chassis body, wherein the chassis body is a frame structure composed of a plurality of beams; and

[0039] A fixed foot is arranged on at least part of the multiple beams, and the frame body is fixedly connected to the chassis vehicle via the fixed foot.

[0040] In some embodiments of the backscattered radiation indicator test tool,

[0041] The mounting chassis includes a first strap fixing portion, and the first strap fixing portion is disposed on at least some of the plurality of beams;

[0042] The third position adjustment portion includes a mounting stand, the mounting stand includes a plurality of fixing frame mounting portions distributed in the up-down direction, the fixing frame can be selectively connected to one of the plurality of fixing frame mounting portions so that the first connection portion changes the position in the up-down direction;

[0043] The mounting stand includes a second strap fixing portion;

[0044] The first strap fixing portion and the second strap fixing portion are configured to connect the mounting stand and the mounting base by strap fixing.

[0045] In some embodiments of the backscattered radiation indicator test tool,

[0046] The first angle adjustment portion includes a slewing bearing, the fixing frame is mounted on the slewing bearing, and the first connection portion is rotated at least 180° around a vertical axis through the slewing bearing;

[0047] The third position adjustment portion includes a mounting stand, the mounting stand includes a plurality of fixing frame mounting portions distributed in the up-down direction, the fixing frame can be selectively connected to one of the plurality of fixing frame mounting portions so that the first connection portion changes the position in the up-down direction;

[0048] The posture adjustment device also includes a rotating frame, the slewing bearing is installed between the moving frame and the rotating frame, the mounting stand is installed on the rotating frame, and the rotating frame is rotatably arranged around the vertical axis relative to the moving frame through the slewing bearing.

[0049] In some embodiments of the backscattered radiation index testing tool, the two mounting stands are respectively mounted at two ends of the rotating frame.

[0050] Based on the backscattered radiation index test tooling provided in the present application, since a posture adjustment device is provided to adjust the posture of the first connecting part to adjust the posture of the test object, the posture adjustment device includes at least one of a first angle adjustment part, a second angle adjustment part and a first position adjustment part, which can adjust the orientation of the test object, the angle relative to the horizontal plane and at least one of the left and right directions, which is beneficial for adjusting the test object to the desired position more quickly, thereby facilitating improving the test efficiency.

[0051] Other features and advantages of the present application will become apparent from the following detailed description of exemplary embodiments of the present application with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0052] The drawings described herein are used to provide a further understanding of the present application and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0053] Figure 1 It is a schematic diagram of the principle structure of the backscattered radiation index test tooling of the related technology.

[0054] Figure 2 This is a schematic diagram of the principle structure of the backscattered radiation index testing tooling according to an embodiment of the present application.

[0055] Figure 3 This is a schematic diagram of the structure of the backscattered radiation indicator testing tooling according to an embodiment of the present application.

[0056] Figure 4 for Figure 3 A schematic diagram of the local structure of the guide rail of the backscattered radiation index test fixture is shown.

[0057] Figure 5 for Figure 3 A schematic diagram of the local structure of the slewing bearing of the backscattered radiation index test fixture is shown.

[0058] Figure 6 for Figure 3 The schematic diagram of the structure of the hinged connection structure of the fixing frame of the backscattered radiation index testing tool is shown.

[0059] Figure 7 for Figure 3 The schematic diagram of the structure of the top screw structure of the fixing frame of the backscattered radiation index testing tool is shown.

[0060] Figure 8 for Figure 3 The schematic diagram of the structure of the mounting frame of the backscattered radiation index testing tool is shown.

[0061] Fig. 9 for Figure 3 The schematic diagram of the decomposition structure of the backscattered radiation indicator test tooling is shown. DETAILED DESCRIPTION

[0062] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments. The following description of at least one exemplary embodiment is actually only illustrative and is by no means intended to limit the present application and its application or use. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0063] Unless otherwise specifically stated, the relative arrangement, numerical expressions and numerical values ​​of the parts and steps set forth in these embodiments do not limit the scope of the application. Meanwhile, it should be understood that, for ease of description, the sizes of the various parts shown in the accompanying drawings are not drawn according to actual proportional relationships. The technology, methods and equipment known to those of ordinary skill in the relevant art may not be discussed in detail, but in appropriate cases, the technology, methods and equipment should be considered as a part of the specification. In all examples shown and discussed here, any specific value should be interpreted as being merely exemplary, rather than as a limitation. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters represent similar items in the following drawings, and therefore, once a certain item is defined in an accompanying drawing, it does not need to be further discussed in subsequent drawings.

[0064] In the description of the present application, it should be understood that the use of terms such as "first" and "second" to limit components is only for the convenience of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore cannot be understood as limiting the scope of protection of the present application.

[0065] In the description of the present application, it should be understood that the directions or positional relationships indicated by directional words such as "front, back, up, down, left, right", "lateral, vertical, perpendicular, horizontal" and "top, bottom" are usually based on the directions or positional relationships shown in the drawings, and are only for the convenience of describing the present application and simplifying the description. Unless otherwise specified, these directional words do not indicate or imply that the device or element referred to must have a specific direction or be constructed and operated in a specific direction, and therefore cannot be understood as limiting the scope of protection of the present application; the directional words "inside and outside" refer to the inside and outside relative to the contours of each component itself.

[0066] Furthermore, the expression “A is mounted on B” means that A is directly or indirectly mounted on B. The same shall apply to expressions such as “fixed” unless otherwise specified.

[0067] In addition, the technical features involved in the different embodiments of the present application described below can be combined with each other as long as they do not conflict with each other.

[0068] In order to clearly explain the present application, the definition of direction in the description of the present application refers to the direction of each component of the test object in a fixed state relative to the backscatter scanning inspection device during the backscatter ray index test of the backscatter scanning inspection device, that is, during the backscatter ray index test. Figure 2 The left-right direction in ; the front-back direction corresponds to Figure 2 In the direction perpendicular to the paper, "front" refers to the direction entering Figure 2 In the direction of the paper, "back" is opposite to "front"; the up and down directions correspond to Figure 2 The up and down directions in .

[0069] like Figures 2 to 9As shown, the present application provides a backscattered ray index test fixture. The backscattered ray index test fixture is used to test the backscattered ray index of the backscattered scanning inspection device located on the left and / or right side of the backscattered ray index test fixture, and includes a fixing frame 6 and a posture adjustment device. The fixing frame 6 includes a plurality of first connecting parts 621 arranged along the front-to-back direction during the backscattered ray index test of the backscattered scanning inspection device, and each first connecting part 621 is used to fix and connect a test object 5. The backscattered scanning inspection device tests the backscattered ray index by detecting the test object 5. The posture adjustment device is configured to adjust the posture of the first connecting part 621 to adjust the posture of the test object 5. The posture adjustment device includes at least one of the following adjustment parts: a first angle adjustment part, configured to rotate the first connecting part 621 around the vertical axis by at least 180°; a second angle adjustment part, configured to change the angle of at least one first connecting part 621 relative to the horizontal plane; a first position adjustment part, configured to change the position of the first connecting part 621 in the left-right direction.

[0070] Based on the backscattered ray index test tooling provided in the present application, since a posture adjustment device is provided to adjust the posture of the first connecting part 621 to adjust the posture of the test object 5, the posture adjustment device includes at least one of a first angle adjustment part, a second angle adjustment part and a first position adjustment part, which can adjust the orientation of the test object 5, the angle relative to the horizontal plane or at least one of the left and right directions, which is beneficial for the test object 5 to be adjusted to the desired position faster, thereby facilitating the improvement of the test efficiency.

[0071] The first angle adjustment part is provided, which is conducive to enabling the test object 5 to be installed once and the corresponding index test of the backscatter scanning inspection device on one side is completed. Then, the first connection part 621 and the test object 5 thereon are rotated 180° around the vertical axis, which is conducive to reaching the position required for the corresponding index test of the backscatter scanning inspection device on the opposite side, thereby facilitating the installation of the test object 5 once to complete the corresponding test work of the index to be tested by the backscatter scanning inspection device on both sides, which can reduce the handling and installation work of the test object and help improve the test efficiency. On the other hand, the first angle adjustment part is provided, and in the case where the test object 5 in at least two directions is provided on the fixing frame 6, the first connection part 621 and the test object 5 thereon are rotated around the vertical axis to the required angle, which is conducive to enabling the test objects 5 in at least two directions to be located in sequence for the corresponding test work of the index to be tested by the designated backscatter scanning inspection device. In this way, it is also conducive to improving the test efficiency.

[0072] The second angle adjustment unit is provided to better test the spatial resolution and contrast index. Previous test experience has found that when the test object 5 is placed vertically to the ground, the imaging effect of the penetration and wire resolution index is better, but the test results are poor when testing the spatial resolution and contrast index. It is necessary to manually adjust the angle base of the test object 5 relative to the horizontal plane, that is, the pitch angle, to ensure that the measured index is perpendicular to the beam so that the image effect meets the requirements.

[0073] A first position adjustment portion is provided to adjust the left and right position of the test object 5 mounted on the first connection portion 621, and the left and right position of the first connection portion 621 and the test object 5 thereon which are rotated 180° around the vertical axis by the first angle adjustment portion, thereby facilitating adjustment of the distance between the test object 5 and the radiation source of the backscatter scanning inspection equipment being tested, thereby facilitating satisfaction of the requirement in the ANSI standard that the test object is 50 cm away from the edge of the scanning area.

[0074] When the fixing frame 6 includes multiple first connecting parts 621, the test objects 5 required for testing different indicators can be connected to different first connecting parts 621. After the test starts, the posture of the test object 5 can be adjusted by adjusting the posture of the first connecting part 621, so that the required test object 5 can reach the appropriate position and be adjusted to the appropriate posture, and the test can be continued. There is no need to interrupt the test to replace the test object 5, which is conducive to further improving the test efficiency.

[0075] like Figures 3 to 9 As shown, in some embodiments of the backscattered ray index test tooling, the posture adjustment device also includes at least one of the following adjustment parts: a second position adjustment part, configured to change the position of the first connection part 621 in the front-to-back direction; and a third position adjustment part, configured to change the position of the first connection part 621 in the up-down direction.

[0076] The second position adjustment portion can adjust the front and rear position of the test object 5 mounted on the first connection portion 621, which is beneficial for adjusting the test object 5 corresponding to the ray source of the backscatter scanning inspection device being tested, thereby facilitating testing of more indicators in one test and improving test efficiency.

[0077] The third position adjustment part can be provided to make the height of the fixing frame 6 adjustable, thereby changing the height of the first connecting part 621 and the test object 5 to meet the scanning height requirements of different test items and adapt to more equipment and test scenarios.

[0078] like Figures 3 to 9 As shown, in some embodiments of the backscattered radiation index testing tooling, the first angle adjustment portion includes a swivel bearing 11, and the fixing frame 6 is installed on the swivel bearing 11, and the swivel bearing 11 is used to rotate the first connecting portion 621 around the vertical axis by at least 180°.

[0079] The use of the slewing bearing 11 can make the rotation range of the first connecting part 621 around the vertical axis unrestricted, and the adjustment is more flexible.

[0080] like Figures 3 to 9As shown, in some embodiments of the backscattered ray index test tooling, the second angle adjustment portion includes a hinged connection structure 601 and a top screw structure 602. The fixed frame 6 includes a first frame body 61 and one or more second frames 62 stacked on the first frame body 61. The second frame body 62 includes a first connection portion 621. One of the two opposite sides of the first frame body 61 and at least one second frame body 62 is rotatably connected by a hinged connection structure 601, and the other side is set to change the upper and lower spacing by the top screw structure 602. By adjusting the matching position of the top screw structure 602 and the first frame body 61 and / or at least one second frame body 62, the first connection portion 621 of at least one second frame body 62 can change the angle relative to the horizontal plane.

[0081] The second angle adjustment portion includes an articulated connection structure 601 and a top screw structure 602, which facilitates precise adjustment of the pitch angle and positioning after adjustment, thereby facilitating better testing of spatial resolution and contrast indicators.

[0082] In some embodiments of the backscattered radiation index test tooling, the fixed frame 6 includes four second frames 62, the first frame 61 is fixedly connected to the two second frames 62 located on the outside, and one of the opposite sides of the first frame 61 and the two second frames 62 located in the middle is rotatably connected through a hinged connection structure 601, and the other side can be set to change the upper and lower spacing through a top screw structure 602.

[0083] During the test, the first connection parts 621 of the two second frames 62 located in the middle of the front-to-back direction are connected to the test objects 5 corresponding to the test spatial resolution index and contrast index. The first connection parts 621 of the second frames 62 located on both sides are connected to the test objects 5 corresponding to other indexes other than the test spatial resolution index and contrast index.

[0084] like Figures 3 to 9 As shown, in some embodiments of the backscattered ray index test fixture, the first position adjustment part includes a guide rail 101 and a mobile frame 12. The guide rail 101 extends in the left-right direction. The fixed frame 6 is arranged on the mobile frame 12. The mobile frame 12 is reciprocally movable along the extension direction of the guide rail 101 so that the first connecting part 621 changes the position in the left-right direction, so as to change the spacing of the first connecting part 621 relative to the backscattered scanning inspection device.

[0085] The left-right position of the first connecting portion 621 is adjusted by the guide rail 101 and the movable frame 12 . The structure is simple and easy to implement, and the left-right position adjustment is convenient and fast.

[0086] like Figures 3 to 9As shown, in some embodiments of the backscattered radiation index test tool, the second position adjustment part includes a chassis 8. The fixing frame 6 is installed on the chassis 8. The chassis 8 is configured to move in the front-to-back direction so that the first connecting part 621 changes the position in the front-to-back direction.

[0087] The front-rear position is changed by changing the first connection portion 621 through the chassis vehicle 8. The structure is simple and easy to implement, and the front-rear position adjustment is convenient and fast.

[0088] like Figures 3 to 9 As shown, in some embodiments of the backscattered radiation index testing tooling, the third position adjustment portion includes a mounting stand 7, the mounting stand 7 includes a plurality of fixing frame mounting portions 71 distributed along the up and down directions, and the fixing frame 6 can be selectively connected to one of the plurality of fixing frame mounting portions 71 to allow the first connecting portion 621 to change its position in the up and down directions.

[0089] The mounting stand 7 includes a plurality of fixing frame mounting portions 71 distributed in the up-down direction. The fixing frame 6 can be selectively connected to one of the plurality of fixing frame mounting portions 71. The position of the fixing frame mounting portion 71 can be set according to the height of the test object 5 required for the test, so that after the fixing frame 6 is installed, it can reach the required position of the test object 5 without further adjustment, which is conducive to improving the test efficiency.

[0090] like Figures 3 to 9 As shown, in some embodiments of the backscattered ray index test tooling, the first position adjustment part includes a guide rail 101 and a mobile frame 12. The guide rail 101 extends in the left-right direction. The fixed frame 6 is arranged on the mobile frame 12. The mobile frame 12 is reciprocally movable along the extension direction of the guide rail 101 so that the first connecting part 621 changes its position in the left-right direction. The second position adjustment part includes a chassis 8. The fixed frame 6 is mounted on the chassis 8. The chassis 8 is configured to move in the front-to-back direction so that the first connecting part 621 changes its position in the front-to-back direction. The posture adjustment device also includes a mounting frame 13. The mounting frame 13 is fixedly connected to the chassis 8. The guide rail 101 is mounted on the mounting frame 13.

[0091] By installing the base frame 13 to connect the guide rail 101 and the chassis 8, the guide rail 101 can meet the installation requirements, and the mobile frame 12 and the various adjustment parts and the fixed frame 6 installed on the mobile frame 12 and the test object 5 thereon can be stably placed and moved relative to the chassis 8.

[0092] like Figures 3 to 9As shown, in some embodiments of the backscattered radiation index test tooling, the mounting base 13 includes a base body 131 and a fixed foot 1302. The base body 131 is a frame structure composed of a plurality of beams 1301. The fixed foot 1302 is disposed on at least part of the beams 1301. The base body 131 is fixedly connected to the chassis vehicle 8 through the fixed foot 1302.

[0093] The frame body 131 is composed of a plurality of beams 1301, and the frame body 131 has a stable structure, strong support force, and is not easily deformed. The fixed foot 1302 is fixedly connected to the chassis 8, and the connection is firm, which is conducive to the stable placement and movement of the mobile frame 12 and the various adjustment parts installed on the mobile frame 12, the fixed frame 6 and the test object 5 thereon relative to the chassis 8.

[0094] like Figures 3 to 9 As shown, in some embodiments of the backscattered radiation index test tooling, the mounting base 13 includes a first strap fixing portion 1303. The first strap fixing portion 1303 is arranged on at least part of the beams 1301 among the multiple beams 1301. The third position adjustment portion includes a mounting stand 7. The mounting stand 7 includes a plurality of fixing frame mounting portions 71 distributed in the up-down direction. The fixing frame 6 can be selectively connected to one of the plurality of fixing frame mounting portions 71 so that the first connecting portion 621 changes the position in the up-down direction. In addition, the fixing frame mounting portion 71 can be configured to be movable in the vertical direction along the body of the mounting stand 7, thereby changing the position of the first connecting portion 621 in the up-down direction. The mounting stand 7 also includes a second strap fixing portion 704. The first strap fixing portion 1303 and the second strap fixing portion 704 are configured to be fixedly connected to the mounting stand 7 and the mounting base 13 by a strap.

[0095] The mounting frame 7 and the mounting base 13 are fixedly connected by the strap and the first strap fixing portion 1303 and the second strap fixing portion 704, which is beneficial for loosening the connection between the mounting frame 7 and the mounting base 13 when they need to move relative to each other, and also convenient for connecting the two together after being adjusted into place, which is beneficial for adjusting the position of the test object 5 and stabilizing the test object 5 in the test position during the test process.

[0096] like Figures 3 to 9 As shown, in some embodiments of the backscattered ray index test tooling, the first angle adjustment part includes a swivel bearing 11. The fixed frame 6 is mounted on the swivel bearing 11. The first connecting part 621 is rotated at least 180° around the vertical axis through the swivel bearing 11. The third position adjustment part includes a mounting stand 7. The posture adjustment device also includes a rotating frame 14. The swivel bearing 11 is installed between the mobile frame 12 and the rotating frame 14. The mounting stand 7 is installed on the rotating frame 14. The rotating frame 14 is rotatably arranged around the vertical axis relative to the mobile frame 12 through the swivel bearing 11.

[0097] The rotating frame 14 is provided to facilitate the installation of the stand 7 and the fixed frame 6 and the test object 5 thereon to be stably placed and moved.

[0098] like Figures 3 to 9 As shown, in some embodiments of the backscattered radiation index testing tool, two mounting stands 7 are respectively mounted at two ends of the rotating frame 14 .

[0099] When two mounting stands 7 are provided, the fixed stand 6 is connected to the two mounting stands 7 to form a stable frame structure with the rotating stand 14 , which is beneficial for the stable placement and movement of the fixed stand 6 and the test object 5 .

[0100] The following combination Figures 2 to 9 The backscattered radiation index testing tooling of the embodiment of the present application is further described.

[0101] The backscattered radiation index test tool of this embodiment is used to test the backscattered radiation index of the backscattered scanning inspection equipment. Figure 2 As shown, two backscatter scanning inspection devices are respectively located on the left and right sides of the backscatter ray index test tooling (corresponding to Figure 2 Each backscatter detection device includes a ray source and a corresponding backscatter ray detector.

[0102] Figure 2 In the figure, the two backscatter detection devices are respectively a first backscatter scanning inspection device located on the left and a second backscatter scanning inspection device located on the right. The first backscatter scanning inspection device includes a first ray source 1 located on the left side of the figure and a first backscatter ray detector 3 located on the left side of the figure. The second backscatter scanning inspection device includes a second ray source 9 located on the right side of the figure and a second backscatter ray detector 4 located on the right side of the figure. The first ray source 1 and the second ray source 9 are, for example, X-ray sources.

[0103] The backscattered ray index test fixture includes a fixing frame 6 and a posture adjustment device. The backscattered ray scanning inspection equipment tests the backscattered ray index by detecting the test object 5. The fixing frame 6 includes a first connecting portion 621 for fixing the test object 5. As described in the background technology, the test object 5 is different when testing different technical indicators, which will not be repeated here.

[0104] The posture adjustment device is configured to adjust the posture of the first connection portion 621 to adjust the posture of the test object 5 .

[0105] The posture adjustment device includes a plurality of adjustment parts, a mounting base 13 and a rotating frame 14. The plurality of adjustment parts include a first angle adjustment part, a second angle adjustment part, a first position adjustment part, a second position adjustment part and a third position adjustment part.

[0106] The first angle adjustment portion is configured to rotate the first connection portion 621 at least 180° around the vertical axis. The first angle adjustment portion includes a slewing bearing 11, and the fixing frame 6 is installed on the slewing bearing 11. The first connection portion 621 is rotated at least 180° around the vertical axis through the slewing bearing 11, for example, a 360° rotation can be achieved. The present application does not limit the structure of the slewing bearing. However, among slewing bearings of the same size, the single-row ball slewing bearing has a higher load-bearing capacity than the cross-roller slewing bearing and the double-row ball slewing bearing, and has a more compact structure, lighter weight, and better cost-effectiveness. Therefore, a single-row ball slewing bearing is used in this embodiment.

[0107] The second angle adjustment part is configured to change the angle of at least one first connection part 621 relative to the horizontal plane, that is, the pitch angle. In this embodiment, the second angle adjustment part includes a hinged connection structure 601 and a top wire structure 602. The fixed frame 6 includes a first frame body 61 and four second frames 62 arranged along the front-to-back direction stacked on the first frame body 61. In this embodiment, each second frame body 62 includes a first connection part 621. The test object 5 connected to the four second frames 62 can be different according to the different indicators to be tested. In this embodiment, the pitch angles of the two second frames 62 located in the middle of the front-to-back direction and the hinged connection structure 601 thereon are adjustable through the second angle adjustment device, and the two second frames located on both sides are relatively fixed to the first frame, and there is no need to adjust the pitch angle. During the test, the first connection parts 621 of the two second frames 62 located in the middle of the front-to-back direction are connected to the test object 5 corresponding to the test spatial resolution index and contrast index.

[0108] In addition, since the test objects for some indicators use the same steel bottom lining plate, and other parts such as polyethylene blocks are different, but the other parts are lightweight and easy to replace, it is not necessary to set the first connection part 621 for all indicators one by one, but the first connection part 621 can be shared by some indicators.

[0109] like Figure 3 and Fig. 9 In the illustrated embodiment, the first frame 61 includes two crossbeams 612 extending in the front-to-back direction and arranged side by side in the left-to-right direction, and the crossbeams 612 can be formed by, for example, a square tube. Each second frame 62 includes a square frame connected in sequence by four first angle steels 622 and four second angle steels 623 standing at the four corners of the square frame. One of the two long strips of steel of each first angle steel 622 of the square frame is placed horizontally, and the other is placed upright on the outside. In this embodiment, the first connecting portion 621 includes the four second angle steels 623, and the corners of the four second angle steels 623 of the first connecting portion 621 are all facing outward, and the two long strips of steel of the second angle steel 623 are coplanar with the corresponding long strips of steel standing of the first angle steel 622.

[0110] In this embodiment, when the first connection part 621 is fixed to the test object 5, the test object 5 can be positioned on two angle steels on one side of the left and right sides of the same first connection part 621, and then the test object 5 can be fixed to the four second angle steels 623 by binding straps.

[0111] The first frame 61 is fixedly connected to two second frames 62 located on both sides in the front-to-back direction. Since the two second frames 62 on both sides in the front-to-back direction are fixedly connected to the first frame 61, the two crossbeams 612 of the first frame 61 can be relatively fixed by the second frames 62. In order to reduce the weight of the fixed frame 6, there is no need to set a connecting structure between the two crossbeams 612. Of course, in order to strengthen the strength of the first frame 61, a connecting structure can also be set. Alternatively, if the pitch angles of each second frame 62 relative to the first frame 61 are adjustable, a connecting structure needs to be set.

[0112] One of the two opposite sides of the first frame 61 and the two second frames 62 located in the middle of the front-to-back direction is rotatably connected via a hinged connection structure 601, and the other side is arranged to change the vertical spacing via a top screw structure 602. By adjusting the matching position of the top screw structure 602 and the first frame 61 and / or the two second frames 62 located in the middle of the front-to-back direction, the angle of the two first connecting parts 621 located in the middle of the front-to-back direction relative to the horizontal plane can be changed.

[0113] like Figure 6 and Figure 7 As shown, in this embodiment, the top screw structure 601 includes a top screw and a nut welded on the second frame 62. The second frame 62 is provided with a through hole at the position where the nut is installed corresponding to the threaded hole of the nut, and the top screw is threadedly matched with the nut. When the top screw is screwed in downward, the end face of the top screw abuts against the upper surface of the first frame 61, and the first frame 61 is separated from the second frame 62, so that the pitch angle of the second frame 62 and the first connecting portion 621 thereon can be adjusted.

[0114] The clearance between each adjacent two second frames 62 in the plurality of second frames 62 is matched so that the relative movement of some second frames 62 is not restricted when adjusting the pitch angle. Such arrangement of the second frames 62 can save space for arranging the second frames 62 in the front-back direction, which can reduce the size of the entire fixing frame 6 on the one hand, and reduce the activity space required for the first connecting portion 621 to adjust the posture on the other hand, thereby saving materials and reducing the required working space.

[0115] The first position adjustment unit is configured to change the position of the first connection unit 621 in the left-right direction. The first position adjustment unit includes a guide rail 101 and a movable frame 12. The guide rail 101 extends in the left-right direction. The fixed frame 6 is arranged on the movable frame 12. The movable frame 12 is arranged to be reciprocatingly movable along the extension direction of the guide rail 101 so that the first connection unit 621 changes its position in the left-right direction.

[0116] The second position adjustment unit is configured to change the position of the first connection portion 621 in the front-to-back direction. The second position adjustment unit includes a chassis 8. The fixing frame 6 is mounted on the chassis 8. The chassis 8 is configured to move in the front-to-back direction to change the position of the first connection portion 621 in the front-to-back direction (corresponding to Figure 2 The position of the paper plane).

[0117] The third position adjustment part is configured to change the position of the first connection part 621 in the vertical direction. The third position adjustment part includes a mounting stand 7, and the mounting stand 7 includes a plurality of fixing frame mounting parts 71 distributed in the vertical direction. The four corners of the first frame body 61 of the fixing frame 6 each include a second connection part 611. The second connection part 611 can be selectively connected to one of the plurality of fixing frame mounting parts 71 to change the position of the first connection part 621 in the vertical direction. The fixing frame mounting part 71 can be a mounting hole on the mounting stand 7. Figure 2 As shown, the mounting hole can face the mounting stand 7 on the opposite side. Figure 3 As shown, the mounting hole can also be located outside the left and right directions of the mounting stand 7. The second connecting portion 611 of the fixing frame 6 is configured to cooperate with the corresponding mounting hole. The second connecting portion 611 and the corresponding fixing frame mounting portion 71 can be fixedly connected by a latch.

[0118] When adjusting the height of the fixing frame 6 installed on the mounting stand 7, if the fixing frame 6 and the test object 5 thereon are too heavy, an auxiliary device may be used to carry the fixing frame 6 to the installation height before fixing it. The auxiliary device may be, for example, a forklift.

[0119] The mounting frame 13 is fixedly connected to the chassis 8. The mounting frame 13 includes a frame body 131 and four fixed feet 1302. The frame body 131 is a frame structure composed of a plurality of beams 1301. The four fixed feet 1302 are arranged on two beams 1301 in the middle of the frame structure. Bolts are inserted into the bolt holes of the fixed feet 1302 and connected to the threaded holes on the chassis 8, thereby realizing the fixed connection between the frame body 131 and the chassis 8.

[0120] The guide rail 101 is mounted on the mounting base 13. In this embodiment, the guide rail 101 is a track of the slide rail 10. Two slide rails are respectively mounted on the top surfaces of the front and rear ends of the mounting base 13 along the front and rear directions. The slide rail 10 also includes a slide table 102. The front and rear ends of the moving frame 12 are fixedly connected to the slide tables 102 of the two slide rails, so that the moving frame 12 can move left and right relative to the mounting base 13 through the relative sliding between the slide table 102 and the guide rail 101.

[0121] The mounting base 13 includes a first strap fixing portion 1303. The first strap fixing portion 1303 is disposed on at least a portion of the beams 1301. The mounting stand 7 includes a second strap fixing portion 704. The mounting stand 7 can be fixedly connected to the mounting base 13 by connecting the first strap fixing portion 1303 and the second strap fixing portion 704 with a strap, which helps to avoid the occurrence of dangerous situations such as sliding and tipping.

[0122] The slewing bearing 11 is installed between the mobile frame 12 and the rotating frame 14. The mounting stand 7 is installed on the rotating frame 14. The rotating frame 14 is rotatably arranged around the vertical axis relative to the mobile frame 12 through the slewing bearing 11. Two mounting stands 7 are respectively installed at both ends of the rotating frame 14. Fig. 9 As shown, the mounting frame 7 has two legs and a connecting beam connecting the two legs. The rotating frame 14 is a square frame structure, and each of its four corners is provided with an insertion portion extending up and down. The two legs of the mounting frame 7 are hollow below and are respectively mounted outside the insertion portion. Then, the latch is inserted into the pin holes on the legs and the insertion portion to realize the connection between the mounting frame 7 and the rotating frame 14.

[0123] like Figure 2 As shown, when the backscatter scanning inspection device is tested, the test object 5 that meets the backscatter ray index requirement to be tested is fixed on the first connecting portion 621 of the fixing frame 6. Figure 2 FIG. 4 shows a case where the test penetration index of the first backscatter scanning inspection device is detected. Figure 2 As shown, the test object 5 includes a shielding object 51, a polyethylene arrow 52 and a substrate steel plate 53. The shielding object 51 is arranged toward the side where the first radiation source 1 is located. The shielding object 51, the polyethylene arrow 52 and the substrate steel plate 53 are arranged in sequence from the side close to the first radiation source 1 emitting the radiation beam 2 to the side away from the first radiation source 1 ( Figure 2 During the test, the first ray source 1 emits a ray beam 2 to irradiate the test object 5, and the light reflected by the test object 5 is detected by the first backscattered ray detector 3. The data measured by the first scattered ray detector 3 can be used for backscattered ray index analysis of the first backscattered scanning inspection device.

[0124] According to the above description, the backscattered radiation index testing tooling of the embodiment of the present application, by providing a slewing bearing 11, allows the fixing frame 6 and its first connecting portion 621 to easily achieve a 180° rotation, thereby facilitating that after the test object 5 is installed once and the corresponding index test is completed on one side of the backscattering scanning inspection equipment, the test object 5 can be rotated 180° around the vertical axis through the first connecting portion 621 and the test object 5 thereon, so as to reach the position required for the corresponding index test of the opposite side backscattering scanning inspection equipment, thereby facilitating the one-time installation of the test object 5 to complete the corresponding test work of the index to be tested by the double-sided backscattering scanning inspection equipment, which can reduce the handling and installation work of the test object and help improve the test efficiency.

[0125] The backscattered radiation index test fixture of the embodiment of the present application can move the mobile frame 12 and the first connecting portion 621 thereon in the left-right direction by sliding between the track of the slide rail 10 and the slide table 102, thereby adjusting the left-right position of the test object 5 installed on the first connecting portion 621, which is conducive to adjusting the distance between the test object 5 and the radiation source of the backscattered scanning inspection equipment being tested, thereby facilitating meeting the requirement of the ANSI standard that the test object is 50 cm away from the edge of the scanning area. The linear guide has low friction and can be moved with little power. The mobile frame 12 can be pushed and slid on the guide rail 101 by manpower.

[0126] The angle of the test object 5 on the first connection portion 621 relative to the horizontal plane, ie, the pitch angle, can be adjusted by the hinged connection structure 601 and the top screw structure 602 .

[0127] The backscattered radiation index test tool can complete all backscattered radiation technical index tests of a single-sided backscattered scanning inspection device at one time, and then the guide rail 101 and the mobile frame 12 can be used to meet the test requirements of the backscattered scanning inspection device, which is conducive to fast and labor-saving switching of the backscattered scanning inspection device being tested.

[0128] By changing the installation positions of the fixing frame 6 and the mounting stand 7, the height of the fixing frame can be adjusted, thereby changing the height of the test object 5 to meet the scanning height requirements of different test items and adapt to more equipment and test scenarios.

[0129] The various parts of the backscattered radiation index testing tooling of this embodiment are detachably connected, for example, by using bolts and latches to fix the connection, and can be disassembled into different parts for transportation, thereby reducing the transportation volume and facilitating subsequent use on the shipping site.

[0130] After testing, the backscattered radiation index test jig of this embodiment is compared with the backscattered radiation index test jig of the related technology. It is easy to make the test object 5 meet the requirements of the index scanning distance and height in the ANSI standard through the posture adjustment device, and it is easy to replace the backscattered radiation index testing equipment being tested to achieve efficient and safe index testing results, which is beneficial to improving test efficiency and saving labor costs.

[0131] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present application and not to limit it. Although the present application has been described in detail with reference to the preferred embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present application can still be modified or some technical features can be replaced by equivalents, which should all be included in the scope of the technical solution requested for protection in this application.

Claims

1. A backscattered ray index test tool, used to test the backscattered ray index of a backscattered scanning inspection device located on the left and / or right side of the backscattered ray index test tool, characterized in that: include: A fixing frame (6), comprising a plurality of first connecting parts (621) arranged along the front-to-back direction during a backscattered ray index test of the backscattered scanning inspection device, each of the first connecting parts (621) being used for fixedly connecting a test object (5), the backscattered scanning inspection device testing the backscattered ray index by detecting the test object (5); and The posture adjustment device is configured to adjust the posture of the first connection part (621) to adjust the posture of the test object (5), and includes at least one of the following adjustment parts: A first angle adjustment portion, configured to rotate the first connection portion (621) around a vertical axis by at least 180°; a second angle adjustment portion, configured to change the angle of at least one of the first connection portions (621) relative to a horizontal plane; and The first position adjustment portion is configured to change the position of the first connection portion (621) in the left-right direction.

2. The backscattered radiation index testing tool according to claim 1, characterized in that: The posture adjustment device further includes at least one of the following adjustment parts: A second position adjustment portion configured to change the position of the first connection portion (621) in the front-rear direction; and The third position adjustment portion is configured to change the position of the first connection portion (621) in the up-down direction.

3. The backscattered radiation index testing tool according to claim 1 or 2, characterized in that: The first angle adjustment portion comprises a slewing bearing (11), the fixing frame (6) is mounted on the slewing bearing (11), and the first connecting portion (621) is rotated at least 180° around a vertical axis through the slewing bearing (11).

4. The backscattered radiation index testing tool according to claim 1 or 2, characterized in that: The second angle adjustment portion comprises a hinged connection structure (601) and a top screw structure (602); The fixed frame (6) comprises a first frame body (61) and one or more second frames (62) stacked on the first frame body (61), the second frame body (62) comprising the first connecting portion (621), one of the two opposite sides of the first frame body (61) and at least one of the second frame bodies (62) being rotatably connected via the hinged connection structure (601), and the other side being arranged with a changeable upper and lower spacing via the top screw structure (602), and the angle of the first connecting portion (621) of the at least one second frame body (62) relative to the horizontal plane being changed by adjusting the matching position of the top screw structure (602) and the first frame body (61) and / or the at least one second frame body (62).

5. The backscattered radiation index testing tool according to claim 4, characterized in that: The fixed frame (6) comprises four second frame bodies (62), the first frame body (61) is fixedly connected to two second frame bodies (62) located on the outside, one of the two opposite sides of the first frame body (61) and the two second frame bodies (62) located in the middle is rotatably connected via the hinge connection structure (601), and the other side is arranged to change the upper and lower spacing via the top screw structure (602).

6. The backscattered radiation index testing tool according to claim 1 or 2, characterized in that: The first position adjustment unit includes: a guide rail (101), the guide rail (101) extending along the left-right direction; and A movable frame (12), the fixed frame (6) being arranged on the movable frame (12), and the movable frame (12) being arranged to be reciprocatingly movable along the extension direction of the guide rail (101) so as to change the position of the first connecting portion (621) in the left-right direction.

7. The backscattered radiation index testing tool according to claim 2, characterized in that: The second position adjustment portion comprises a chassis (8), the fixing frame (6) is mounted on the chassis (8), and the chassis (8) is configured to move in a front-to-rear direction so that the first connection portion (621) changes its position in the front-to-rear direction.

8. The backscattered radiation index testing tool according to claim 2, characterized in that: The third position adjustment portion comprises a mounting stand (7), wherein the mounting stand (7) comprises a plurality of fixing frame mounting portions (71) distributed in the up-down direction, and the fixing frame (6) can be selectively connected to one of the plurality of fixing frame mounting portions (71) so that the first connecting portion (621) changes its position in the up-down direction.

9. The backscattered radiation index testing tool according to claim 2, characterized in that: The first position adjustment portion comprises a guide rail (101) and a movable frame (12), the guide rail (101) extending in the left-right direction, the fixed frame (6) being arranged on the movable frame (12), and the movable frame (12) being arranged to be reciprocatingly movable along the extending direction of the guide rail (101) so as to change the position of the first connecting portion (621) in the left-right direction; The second position adjustment portion comprises a chassis (8), the fixing frame (6) is mounted on the chassis (8), and the chassis (8) is configured to move in a front-to-rear direction so that the position of the first connection portion (621) changes in the front-to-rear direction; The posture adjustment device further comprises a mounting frame (13), the mounting frame (13) being fixedly connected to the chassis vehicle (8), and the guide rail (101) being mounted on the mounting frame (13).

10. The backscattered radiation index testing tool according to claim 9, characterized in that: The mounting base (13) comprises: A chassis body (131), wherein the chassis body (131) is a frame structure composed of a plurality of beams (1301); and A fixed foot (1302) is arranged on at least some of the beams (1301) among the plurality of beams (1301), and the chassis body (131) is fixedly connected to the chassis vehicle (8) via the fixed foot (1302).

11. The backscattered radiation index testing tool according to claim 10, characterized in that: The mounting base (13) comprises a first strap fixing portion (1303), wherein the first strap fixing portion (1303) is arranged on at least part of the beams (1301) among the plurality of beams (1301); The third position adjustment portion comprises a mounting stand (7), the mounting stand (7) comprises a plurality of fixing frame mounting portions (71) distributed in the up-down direction, the fixing frame (6) can be selectively connected to one of the plurality of fixing frame mounting portions (71) so that the first connecting portion (621) changes its position in the up-down direction; The mounting stand (7) comprises a second strap fixing portion (704); The first strap fixing portion (1303) and the second strap fixing portion (704) are configured to connect the mounting stand (7) and the mounting base (13) by means of straps.

12. The backscattered radiation index testing tool according to claim 2, characterized in that: The first angle adjustment portion comprises a slewing bearing (11), the fixing frame (6) is mounted on the slewing bearing (11), and the first connecting portion (621) is rotated at least 180° around a vertical axis through the slewing bearing (11); The third position adjustment portion comprises a mounting stand (7), the mounting stand (7) comprises a plurality of fixing frame mounting portions (71) distributed in the up-down direction, the fixing frame (6) can be selectively connected to one of the plurality of fixing frame mounting portions (71) so that the first connecting portion (621) changes its position in the up-down direction; The first position adjustment part comprises a guide rail (101) and a movable frame (12), wherein the guide rail (101) extends along the left-right direction, the fixed frame (6) is arranged on the movable frame (12), and the movable frame (12) is reciprocatingly arranged along the extension direction of the guide rail (101) so that the first connecting part (621) changes its position in the left-right direction. The posture adjustment device also comprises a rotating frame (14), the slewing bearing (11) is installed between the movable frame (12) and the rotating frame (14), the mounting stand (7) is installed on the rotating frame (14), and the rotating frame (14) is rotatably arranged around the vertical axis relative to the movable frame (12) through the slewing bearing (11).

13. The backscattered radiation index testing tool according to claim 12, characterized in that: The two mounting brackets (7) are respectively mounted on two ends of the rotating frame (14).

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