Impact test equipment for composite tantalum capacitor

Abstract

Impact test equipment of a composite tantalum capacitor comprises an impact test device, a test clamp used for installing a capacitor to be tested, and an installation rack arranged on the impact test device and used for installing the test clamp. The test clamp comprises a test board, an installation member arranged on the test board and used for installing a capacitor, and a plurality of positioning holes arranged on the test board at intervals. The mounting frame comprises a mounting frame body, a weight reduction cavity formed in the mounting frame body, a plurality of first weight reduction holes formed in the top of the mounting frame body, extending downwards and communicating with the weight reduction cavity, and a plurality of second weight reduction holes formed in the side face of the mounting frame body and communicating with the weight reduction cavity. The first mounting holes are formed in the top of the mounting rack body; the second mounting holes are formed in the side surface of the mounting rack body; by limiting the structures of the test fixture and the mounting rack, the impact test of a plurality of composite tantalum capacitors can be realized at the same time, so that the plurality of composite tantalum capacitors to be tested are in the same test environment, and the accuracy of the test result is ensured.

Description

Technical Field

[0001] The utility model belongs to the field of capacitor performance testing equipment, and in particular relates to impact testing equipment for composite tantalum capacitors. Background Art

[0002] According to the development trend of existing components, mechanical testing is the most effective way to restore the actual use environment of the product. Mechanical testing can loosen the structure of the component and cause relative movement of the internal parts. It can cause desoldering, poor contact, deterioration of working characteristics, noise, wear, physical failure, leakage, and even structural fatigue. The existing test fixtures do not have a unified test fixture and fixed installation method. In the absence of uniformity, uncontrollable factors are likely to occur during the test. Two batches of comparative tests will have different test results and test waveforms. In addition, the existing test fixtures are too limited to small test products. They cannot meet the test requirements for large-size products and are not efficient. Utility Model Content

[0003] The utility model aims to overcome the shortcomings of the prior art and provide an impact test device for a composite tantalum capacitor.

[0004] The utility model adopts the following technical solutions:

[0005] An impact test device for a composite tantalum capacitor comprises an impact test device, a test fixture for mounting a capacitor to be tested and a mounting frame arranged on the impact test device for mounting the test fixture; the test fixture comprises a test board, a mounting piece arranged on the test board for mounting the capacitor and a plurality of positioning holes arranged at intervals on the test board; the mounting frame comprises a mounting frame body, a weight reduction cavity arranged in the mounting frame body, a plurality of first weight reduction holes arranged at the top of the mounting frame body and extending downward to communicate with the weight reduction cavity, a plurality of second weight reduction holes arranged at the side of the mounting frame body and communicating with the weight reduction cavity, a plurality of first mounting holes arranged at the top of the mounting frame body and a plurality of second mounting holes arranged at the side of the mounting frame body, the positioning holes cooperate with the first mounting holes or the second mounting holes to fix the test fixture on the top surface or the side surface of the mounting frame body.

[0006] Furthermore, the impact test device includes a base, an impact test block that can move up and down, a driving mechanism connected to the base and driving the impact test block to move up and down, and a fixing mechanism arranged between the impact test block and the mounting frame body.

[0007] Furthermore, the fixing mechanism includes a plurality of fixing nut seats arranged on the impact test block, a plurality of fixing holes arranged at the bottom of the weight reduction chamber and extending downwardly opposite to the plurality of fixing nut seats, and fixing bolts passing through the fixing holes and cooperating with the relative fixing nut seats.

[0008] Furthermore, the mounting member includes a mounting plate, a mounting groove extending inward from the top of the mounting plate for mounting a capacitor, a clearance hole extending inward from the top surface of the mounting plate and connected to the mounting groove, two through holes spaced apart on the test board for the capacitor pin ends to pass through, and a locking member arranged between the mounting plate and the test board.

[0009] Furthermore, the locking member includes a plurality of first locking holes spaced apart on the mounting plate, a second locking hole disposed on the test plate opposite to the plurality of first locking holes, a locking bolt passing through the first locking hole and the second locking hole in sequence, and a locking nut cooperating with the locking bolt.

[0010] Furthermore, the weight reduction cavity extends inwardly from one side surface of the mounting frame body to penetrate the other opposite side surface.

[0011] Furthermore, the hole diameter of the first weight-reducing hole is larger than the hole diameter of the first mounting hole, and the hole diameter of the second weight-reducing hole is larger than the hole diameter of the second mounting hole.

[0012] From the above description of the utility model, it can be seen that compared with the prior art, the beneficial effects of the utility model are as follows: the present application limits the structure of the test fixture and the mounting frame, and through the cooperation of the two, it can simultaneously realize the impact test of multiple composite tantalum capacitors, so that the multiple composite tantalum capacitors to be tested are in the same test environment, ensuring the accuracy of the test results; it can be suitable for mass production, can ensure that the requirements of the test equipment are met and take into account the installation of the test table and the required test weight, so that the test can be carried out normally. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 Schematic diagram of the impact test equipment Figure 1 ;

[0014] Figure 2 Schematic diagram of the impact test equipment Figure 2 ;

[0015] Figure 3 The structure of the mounting frame is shown in Figure 1. Figure 1 ;

[0016] Figure 4 The structure of the mounting frame is shown in Figure 1. Figure 2 ;

[0017] Figure 5 This is a schematic diagram of the test fixture.

[0018] In the figure, 1-impact test device, 2-test fixture, 3-mounting frame, 11-base, 12-impact test block, 13-driving mechanism, 14-fixing mechanism, 141-fixing nut seat, 142-fixing hole, 21-test plate, 22-mounting piece, 23-positioning hole, 24-mounting plate, 25-mounting slot, 26-make way hole, 27-through hole, 28-locking piece, 281-first locking hole, 282-second locking hole, 283-locking bolt, 31-mounting frame body, 32-weight reduction cavity, 33-first weight reduction hole, 34-second weight reduction hole, 35-first mounting hole, 36-second mounting hole. DETAILED DESCRIPTION

[0019] The present invention is further described below through specific implementation methods.

[0020] Reference Figures 1 to 5 As shown, an impact test device for a composite tantalum capacitor comprises an impact test device 1, a test fixture 2 for mounting the capacitor to be tested, and a mounting frame 3 arranged on the impact test device 1 for mounting the test fixture 2.

[0021] The test fixture 2 comprises a test board 21, a mounting member 22 for mounting a capacitor disposed on the test board 21, and a plurality of positioning holes 23 disposed on the test board 21. Specifically, the mounting member 22 comprises a mounting plate 24, a mounting groove 25 extending inward from the top of the mounting plate 24 for mounting the capacitor, a clearance hole 26 extending inward from the top surface of the mounting plate 24 and communicating with the mounting groove 25, two through holes 27 disposed at intervals on the test board 21 for the capacitor pin ends to pass through, and a locking member 28 disposed between the mounting plate 24 and the test board 21. By providing the clearance holes 26, the capacitor test The heat generated during the test process is dissipated; further, the locking member 28 includes a plurality of first locking holes 281 arranged at intervals on the mounting plate 24, a second locking hole 282 arranged on the test plate 21 and opposite to the plurality of first locking holes 281, a locking bolt 283 passing through the first locking hole 281 and the second locking hole 282 in sequence, and a locking nut matched with the locking bolt 283. During the test, the capacitor is placed in the mounting groove 25, and then the mounting plate 24 equipped with the capacitor is fixed to the test plate 21 through the cooperation of the various components of the locking member 28 to complete the clamping of the capacitor.

[0022] The mounting frame 3 includes a mounting frame body 31, a weight reduction cavity 32 arranged in the mounting frame body 31, a plurality of first weight reduction holes 33 arranged at the top of the mounting frame body 31 and extending downwardly to communicate with the weight reduction cavity 32, a plurality of second weight reduction holes 34 arranged at the side of the mounting frame body 31 and communicating with the weight reduction cavity 32, a plurality of first mounting holes 35 arranged at the top of the mounting frame body 31, and a plurality of second mounting holes 36 arranged at the side of the mounting frame body 31. When the test fixture 2 is installed, the positioning hole 23 cooperates with the first mounting hole 35 or the second mounting hole 36 to fix the test fixture 2 on the top surface or side surface of the mounting frame body 31; by limiting the installation The structure of the frame 3 allows the test fixture 2 to be installed on multiple surfaces thereof to complete the impact test of multiple capacitors at the same time, so that multiple capacitors are placed in the same test environment, thereby improving the accuracy of the test results; and the setting of the weight reduction cavity 32, the first weight reduction hole 33 and the second weight reduction hole 34 can effectively reduce the weight of the mounting frame 3 to meet the test weight requirement of the test table of the impact test device 1; specifically, the weight reduction cavity 32 extends inward from one side surface of the mounting frame body 31 to pass through the other opposite side surface; further, the aperture of the first weight reduction hole 33 is larger than the diameter of the first mounting hole 35, and the diameter of the second weight reduction hole 34 is larger than the diameter of the second fixing hole 36.

[0023] The impact test device 1 includes a base 11, an impact test block 12 that can move up and down, a driving mechanism 13 arranged on the base 11 and connected to drive the impact test block 12 to move up and down, and a fixing mechanism 14 arranged between the impact test block 12 and the mounting frame 3; specifically, the fixing mechanism 14 includes a plurality of fixing nut seats 141 arranged on the impact test block 12, a plurality of fixing holes 142 arranged at the bottom of the weight reduction cavity 32 and extending downward and opposite to the plurality of fixing nut seats 141, and fixing bolts passing through the fixing holes 142 and cooperating with the relative fixing nut seats 141. Through the cooperation between the fixing nut seats 141 and the fixing bolts, the mounting frame 3 is fixed on the impact test block 12, and moves up and down with the impact test block 12 to complete the impact test of the capacitor; further, the impact test device 1 is a commonly used device in the field of capacitor performance testing, and its specific structure and working principle with the driving mechanism 13 will not be further described here.

[0024] The present application limits the structure of the test fixture 2 and the mounting frame 3, and through the cooperation of the two, can simultaneously realize the impact test of multiple composite tantalum capacitors, so that the multiple composite tantalum capacitors to be tested are in the same test environment, ensuring the accuracy of the test results; it can be suitable for mass production, can ensure that the requirements of the test equipment are met and take into account the installation of the test table and the required test weight, so that the test can be carried out normally.

[0025] The above description is only a preferred embodiment of the present invention, and therefore cannot be used to limit the scope of implementation of the present invention. That is, equivalent changes and modifications made according to the scope of application of the present invention and the contents of the specification should still fall within the scope covered by the present invention.

Claims

1. An impact test device for composite tantalum capacitors, characterized in that: It comprises an impact test device, a test fixture for mounting a capacitor to be tested and a mounting frame arranged on the impact test device for mounting the test fixture; the test fixture comprises a test board, a mounting piece arranged on the test board for mounting the capacitor and a plurality of positioning holes arranged at intervals on the test board; the mounting frame comprises a mounting frame body, a weight reduction cavity arranged in the mounting frame body, a plurality of first weight reduction holes arranged at the top of the mounting frame body and extending downward to communicate with the weight reduction cavity, a plurality of second weight reduction holes arranged at the side of the mounting frame body and communicating with the weight reduction cavity, a plurality of first mounting holes arranged at the top of the mounting frame body and a plurality of second mounting holes arranged at the side of the mounting frame body, the positioning holes cooperate with the first mounting holes or the second mounting holes to fix the test fixture on the top surface or the side surface of the mounting frame body.

2. The impact test equipment for composite tantalum capacitors according to claim 1, characterized in that: The impact test device comprises a base, an impact test block which can move up and down, a driving mechanism which is connected to the base and drives the impact test block to move up and down, and a fixing mechanism which is arranged between the impact test block and the mounting frame body.

3. The impact test equipment for composite tantalum capacitors according to claim 2, characterized in that: The fixing mechanism includes a plurality of fixing nut seats arranged on the impact test block, a plurality of fixing holes arranged at the bottom of the weight reduction cavity and extending downwardly and opposite to the plurality of fixing nut seats, and fixing bolts passing through the fixing holes and cooperating with the relative fixing nut seats.

4. The impact test equipment for composite tantalum capacitors according to claim 1, characterized in that: The mounting member includes a mounting plate, a mounting groove extending inward from the top of the mounting plate for mounting a capacitor, a clearance hole extending inward from the top surface of the mounting plate and communicating with the mounting groove, two through holes spaced apart on the test board for the capacitor pin ends to pass through, and a locking member arranged between the mounting plate and the test board.

5. The impact test equipment for composite tantalum capacitors according to claim 4, characterized in that: The locking member includes a plurality of first locking holes spaced apart on the mounting plate, a second locking hole disposed on the test plate opposite to the plurality of first locking holes, a locking bolt passing through the first locking hole and the second locking hole in sequence, and a locking nut cooperating with the locking bolt.

6. The impact test equipment for composite tantalum capacitors according to claim 1, characterized in that: The weight reduction cavity extends inwardly from one side surface of the mounting frame body to penetrate the other opposite side surface.

7. The impact test equipment for composite tantalum capacitors according to claim 1, characterized in that: The hole diameter of the first weight-reducing hole is larger than the hole diameter of the first mounting hole, and the hole diameter of the second weight-reducing hole is larger than the hole diameter of the second mounting hole.

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