An OLED device optical life test system

Abstract

The utility model discloses an OLED device optical life test system, comprising a test cabinet, an industrial computer, a fixture drawer, an electric signal reading module and a UPS uninterruptible power supply. The test cabinet is a rectangular vertical cabinet, the top of the test cabinet is provided with an industrial computer, the electric signal reading module and the UPS uninterruptible power supply are fixedly arranged in the test cabinet, a plurality of fixture drawers are arranged on the side panel of the test cabinet, the plurality of fixture drawers are arranged in an array, the fixture drawers can be independently pulled out and operated, a fixture is fixedly installed in each fixture drawer, the fixture is a flip cover structure, an OLED workpiece to be tested is placed in the fixture, the OLED workpiece can be enclosed in the fixture after the fixture is closed, so that the OLED workpiece is in a darkroom environment, a silicon photodiode probe is arranged in the fixture, and during testing, the silicon photodiode probe can read the optical signal of the OLED workpiece, and convert the optical signal into an electrical signal for external output; the utility model can perform batch detection on OLED devices, does not need to set a darkroom environment, has no interference in the detection process, and has high detection efficiency.

Description

Technical Field

[0001] The utility model belongs to the technical field of OLED device testing equipment, and in particular relates to an OLED device optical life testing system. Background Art

[0002] OLED is a device that uses a multi-layer organic thin film structure to generate electroluminescence. It can be used in various flat-panel displays. OLED displays have many advantages such as light weight, high brightness, low power consumption, and high clarity. They have been widely used in recent years. OLED devices need to undergo life tests before leaving the factory. The traditional OLED life test method requires testing in a darkroom environment using a three-axis machine equipped with optical instruments. The equipment occupies a large area, and the number of OLED samples that can be tested at one time is limited, so it is not possible to test in large quantities. In addition, in order to accurately measure, each luminous product needs to be precisely positioned, which is complicated to operate. The motion mechanism in the equipment may also interfere with the light emission of the OLED device during operation, affecting the test structure, reducing the test accuracy, and reducing the test efficiency. Utility Model Content

[0003] In view of the above problems and technical requirements, the utility model provides an OLED device optical life test system, which can perform batch detection of OLED devices without setting up a darkroom environment, and the detection process is interference-free, and has the advantages of high detection accuracy and high efficiency.

[0004] The technical scheme of the utility model is as follows: an OLED device optical life test system, including a test cabinet, an industrial computer, a fixture drawer, an electric signal reading module and a UPS uninterruptible power supply, the test cabinet is a rectangular vertical cabinet, the top of the test cabinet is provided with an industrial computer, the electric signal reading module and the UPS uninterruptible power supply are fixedly arranged in the test cabinet, a plurality of fixture drawers are arranged on the side panel of the test cabinet, the plurality of fixture drawers are arranged in an array, the fixture drawers can be independently pulled out and operated, each fixture drawer is fixedly installed with a fixture, the fixture is a flip cover structure, the OLED workpiece to be tested is placed in the fixture, the OLED workpiece can be enclosed inside after the fixture is closed, so that the OLED workpiece is in a darkroom environment, the fixture is provided with a silicon photodiode probe, the silicon photodiode probe can read the optical signal of the OLED workpiece during the test, and convert the optical signal into an electrical signal for external output. This scheme sets an array of fixture drawers as a test station, each test station is independent and closed, ensuring that the test environment is a darkroom, and each station can also be operated independently to test different samples, and changing samples during the test will not affect the test of other stations. Silicon photodiodes are used instead of optical instruments for measurement. The equipment is smaller, the floor space is reduced, the number of testable samples is greatly increased, and the measurement efficiency is higher. The signal receiving column of the silicon photodiode is aligned with the OLED light-emitting point for precise measurement. There is no moving mechanism in the test station, the test is more stable, the temperature and humidity are maintained, interference is reduced, and the test accuracy is higher.

[0005] Furthermore, the fixture includes a base, an upper cover, a silicon photodiode probe and a conduction probe. The base is fixedly installed on the fixture drawer, and the upper cover is hinged on one side of the base. The middle part of the base is recessed downward to form a rectangular cavity for accommodating the OLED workpiece. A circle of supporting strips is provided at the edge of the rectangular cavity, and a plurality of conduction probes are provided on the supporting strips; a circle of pressure strips corresponding to the supporting strips is provided in the upper cover, and a plurality of conduction probes are also provided on the pressure strips. The thin-sheet OLED workpiece is placed in the rectangular cavity, and the OLED workpiece is supported by the supporting strips. When the upper cover is combined with the base, the pressure strips are embedded in the rectangular cavity, and the pressure strips press the OLED workpiece from above. The conduction probes arranged above and below conduct the electrodes of the OLED workpiece, and the conduction probes are connected to the electrical signal reading module. The silicon photodiode probe is arranged in a circle of pressure strips on the upper cover. Conductive probes are set in the upper cover and base of the fixture. During testing, the conductive probes on the top or bottom of the OLED workpiece can complete the test of the OLED workpiece without flipping the workpiece. It is compatible with different workpieces and can set multiple probes. When the upper cover and the base are closed, except for the probes that are conductive to the electrodes, the remaining conductive probes around the OLED workpiece can provide auxiliary support to ensure the level of the product.

[0006] Furthermore, the base and the upper cover are provided with magnets correspondingly, and the magnets are embedded in the closing surfaces of the base and the upper cover. When the upper cover and the base are closed, the magnets attract each other to close the upper cover and the base. The magnets can assist in closing more conveniently. Compared with the traditional snap closing method, the magnet adsorption closing does not require additional operation, the opening and closing action is simple, and the operation efficiency is high.

[0007] Furthermore, a semiconductor heating sheet is provided in the middle of the rectangular cavity, and the semiconductor heating sheet can heat the OLED workpiece placed in the rectangular cavity. The semiconductor heating sheet can be configured to heat the OLED workpiece and test the life of the OLED workpiece under high temperature.

[0008] Furthermore, a drawer support frame is installed in the side panel of the detection cabinet, and a plurality of drawer grids are arranged in an array in the drawer support frame. The bottom plate of each fixture drawer is slidably connected in a drawer grid, and a handle is provided on the panel of the fixture drawer.

[0009] Furthermore, the industrial computer is connected to a UPS uninterruptible power supply, which is connected to an external power supply when the industrial computer is in operation. When the external power supply is cut off, the UPS uninterruptible power supply supplies power to the industrial computer. Setting up a UPS uninterruptible power supply can ensure the continuous operation of the equipment in the event of a power outage, and can process data during the continuous power supply time to prevent data loss in unexpected situations.

[0010] Furthermore, a heat dissipation grid is provided on the panel on the other side of the detection cabinet.

[0011] Furthermore, a plurality of vertical steel bars are provided in the detection cabinet, and the electric signal reading module and the UPS uninterruptible power supply support are installed on the vertical steel bars.

[0012] The beneficial effects of the utility model are as follows: 1) the detection cabinet sets an array of fixture drawers as the detection station, and each test station is independent and closed, which ensures that the test environment is a darkroom. At the same time, each station can be operated independently to test different samples, and the test has a high degree of independence and flexibility; 2) a silicon photodiode probe is used in the fixture instead of an optical instrument for testing. The silicon photodiode probe can convert the optical signal into an electrical signal. Therefore, the optical signal data can be calculated by analyzing the electrical signal, and the space required for the test is smaller. It can test a variety of workpieces with different signals at one time, which greatly improves the test efficiency; 3) the upper and lower layers of conductive probes can be set in the fixture, so that the fixture can be compatible with two OLED workpieces with electrodes on the top or bottom, and there is no need to flip and adjust the workpiece, which is more convenient to operate and more compatible; 4) a UPS uninterruptible power supply is set to power the industrial computer, which can ensure that the test can continue and the test data will not be lost when the main host of the industrial computer suddenly loses power. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1This is an external three-dimensional structural diagram of the optical life test device of the utility model;

[0014] Figure 2 This is the internal structure diagram of the optical life test device of the utility model;

[0015] Figure 3 This is a structural diagram of the side where the fixture drawer is located in the utility model;

[0016] Figure 4 It is a connection diagram of the fixture drawer and the drawer grid in the utility model;

[0017] Figure 5 This is a structural diagram of the fixture in the utility model;

[0018] Marked in the figure are: detection cabinet 1, drawer support frame 11, drawer grid 12, heat dissipation grid 13, vertical steel bar 14, industrial computer 2, fixture drawer 3, handle 31, bottom plate 32, electrical signal reading module 4, UPS uninterruptible power supply 5, fixture 6, base 61, rectangular cavity 611, support bar 612, upper cover 62, pressure bar 621, conduction probe 63, silicon photodiode probe 64, magnet 65, semiconductor heating plate 66. DETAILED DESCRIPTION

[0019] The present invention is further described below in conjunction with the accompanying drawings and embodiments.

[0020] like Figure 1-5 The utility model is shown as an OLED device optical life test system, including a test cabinet 1, an industrial computer 2, a fixture drawer 3, an electrical signal reading module 4 and a UPS uninterruptible power supply 5. The test cabinet 1 is a rectangular vertical cabinet. The industrial computer 2 is arranged on the top of the test cabinet 1. The electrical signal reading module 4 and the UPS uninterruptible power supply 5 are fixedly arranged in the test cabinet 1. A plurality of fixture drawers 3 are arranged on the side panel of the test cabinet 1. The plurality of fixture drawers 3 are arranged in an array, and the fixture drawers 3 can be independently pulled out.

[0021] A drawer support frame 11 is installed in the side panel of the detection cabinet 1. A plurality of drawer grids 12 are arranged in an array in the drawer support frame 11. The bottom plate 32 of each fixture drawer 3 is slidably connected in a drawer grid 12. A handle 31 is provided on the panel of the fixture drawer 3. A heat dissipation grid 13 is provided on the panel on the other side of the detection cabinet 1. A plurality of vertical steel bars 14 are also provided in the detection cabinet 1. The electric signal reading module 4 and the UPS uninterruptible power supply 5 are supported and installed on the vertical steel bars 14.

[0022] A fixture 6 is fixedly installed in each fixture drawer 3. The fixture 6 is a flip-cover structure. The OLED workpiece to be tested is placed in the fixture 6. When the fixture 6 is closed, the OLED workpiece can be enclosed inside, so that the OLED workpiece is in a darkroom environment. Specifically, a silicon photodiode probe 64 is provided in the fixture. During the test, the silicon photodiode probe 64 can read the optical signal of the OLED workpiece and convert the optical signal into an electrical signal for external output. The industrial computer 2 is connected to the UPS uninterruptible power supply 5. The industrial computer 2 is connected to the external power supply in the operating state. When the external power supply is cut off, the UPS uninterruptible power supply 5 supplies power to the industrial computer. The UPS uninterruptible power supply 5 is set to ensure the continuous operation of the equipment in the event of a power outage, and can process data during the continuous power supply time to prevent data loss in unexpected situations.

[0023] The fixture 6 comprises a base 61, an upper cover 62, a silicon photodiode probe 64 and a conductive probe 63. The base 61 is fixedly mounted on the fixture drawer 3. The upper cover 62 is hinged on one side of the base 61. The middle of the base 61 is recessed downward to form a rectangular cavity 611 for accommodating the OLED workpiece. A circle of support strips 612 are provided at the edge of the rectangular cavity 611. A plurality of conductive probes 63 are provided on the support strips 612. A circle of pressure strips 621 corresponding to the pressure strips 612 are provided in the upper cover 62. The pressure strips 621 are provided at the edges of the rectangular cavity 611. There are also multiple conduction probes 63 on the upper surface. The thin sheet OLED workpiece is placed in the rectangular cavity 611. The OLED workpiece is supported by the support strip 612. When the upper cover 62 and the base 61 are combined, the pressure strip 621 is embedded in the rectangular cavity 611. The pressure strip 621 presses the OLED workpiece from above. The conduction probes 63 arranged above and below conduct the electrodes of the OLED workpiece. The conduction probes 63 are connected to the electrical signal reading module 4. The silicon photodiode probe 64 is arranged in a circle of pressure strips 621 of the upper cover 62. The conduction probes 63 are arranged in the upper cover 62 and the base 61 of the fixture 6. During testing, the conduction probes 63 at the top or bottom of the OLED workpiece can complete the test of the OLED workpiece without turning over the workpiece. It can be compatible with different workpieces. Multiple probes are arranged. When the upper cover and the base are closed, in addition to the probes that conduct with the electrodes, the remaining conduction probes around the OLED workpiece can provide auxiliary support to ensure the level of the product.

[0024] The base 61 and the upper cover 62 are also provided with magnets 65 correspondingly. The magnets 65 are embedded in the covering surfaces of the base 61 and the upper cover 62. When the upper cover 62 and the base 61 are covered, the magnets 65 are attracted to each other to close the upper cover 62 and the base 61. The magnet 65 can assist in closing more conveniently. Compared with the traditional snap closing method, the magnet 65 does not require additional operation for adsorption and closing. The opening and closing action is simple and the operation efficiency is high. A semiconductor heating plate 66 is also provided in the middle of the rectangular cavity 611. The semiconductor heating plate 66 can heat the OLED workpiece placed in the rectangular cavity 611. The semiconductor heating plate 66 is configured to heat the OLED workpiece and test the life of the OLED workpiece under high temperature.

[0025] The detection process of the utility model is as follows: the jig 6 is installed in the jig drawer 3. When taking or placing the product, the jig drawer is pulled out by the handle 31, and the OLED workpiece is placed in the rectangular cavity 611, so that the conductive probe 63 on the jig 6 is facing the electrode of the OLED workpiece, and the upper cover 62 is closed on the base 61. The magnet 65 attracts the upper cover and the base 61, so that the conductive probe 63 and the electrode are fully in contact. The remaining probes around the OLED workpiece provide auxiliary support to keep the OLED workpiece in a horizontal state; during the test, the OLED workpiece emits light, the silicon photodiode probe 64 is aligned with the light-emitting point of the OLED workpiece, and the conductive probe 63 transmits the voltage and current data to the electrical signal reading module 4; during the test, the electrical signal reading module 4 outputs according to the set voltage or current, and reads the voltage and current data at the set time interval, the silicon photodiode probe 64 reads the light signal, converts it into an electrical signal and outputs it to the external software system, and the system converts it into life data according to the attenuation of the electrical signal.

[0026] The above are only several preferred embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any changes and substitutions that can be easily thought of by a person skilled in the art within the technical scope disclosed by the present invention should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.

Claims

1. An OLED device optical life test system, characterized by: The invention comprises a testing cabinet, an industrial computer, a fixture drawer, an electric signal reading module and a UPS uninterruptible power supply. The testing cabinet is a rectangular vertical cabinet. An industrial computer is arranged on the top of the testing cabinet. The electric signal reading module and the UPS uninterruptible power supply are fixedly arranged in the testing cabinet. A plurality of fixture drawers are arranged on the side panels of the testing cabinet. The plurality of fixture drawers are arranged in an array. The fixture drawers can be independently pulled out and operated. A fixture is fixedly installed in each fixture drawer. The fixture is a flip-cover structure. An OLED workpiece to be tested is placed in the fixture. When the fixture is closed, the OLED workpiece can be enclosed therein so that the OLED workpiece is in a darkroom environment. A silicon photodiode probe is arranged in the fixture. During the test, the silicon photodiode probe can read the optical signal of the OLED workpiece and convert the optical signal into an electrical signal for external output.

2. The optical lifetime test system of an OLED device according to claim 1, characterized in that: The fixture includes a base, an upper cover, a silicon photodiode probe and a conduction probe. The base is fixedly installed on the fixture drawer, and the upper cover is hinged on one side of the base. The middle part of the base is recessed downward to form a rectangular cavity for accommodating an OLED workpiece. A circle of supporting strips is provided at the edge of the rectangular cavity, and a plurality of conduction probes are provided on the supporting strips; a circle of pressure strips corresponding to the supporting strips is provided in the upper cover, and a plurality of conduction probes are also provided on the pressure strips. A thin-sheet OLED workpiece is placed in the rectangular cavity, and the OLED workpiece is supported by the supporting strips. When the upper cover is combined with the base, the pressure strips are embedded in the rectangular cavity, and the pressure strips press the OLED workpiece from above. The conduction probes arranged above and below conduct the electrodes of the OLED workpiece, and the conduction probes are connected to the electrical signal reading module. The silicon photodiode probe is arranged in a circle of pressure strips on the upper cover.

3. The optical lifetime testing system of an OLED device according to claim 2, characterized in that: The base and the upper cover are also provided with magnets correspondingly, and the magnets are embedded in the covering surfaces of the base and the upper cover. When the upper cover and the base are covered, the magnets are attracted to each other to close the upper cover and the base.

4. The optical lifetime testing system of an OLED device according to claim 3, characterized in that: A semiconductor heating plate is also provided in the middle of the rectangular cavity, and the semiconductor heating plate can heat the OLED workpiece placed in the rectangular cavity.

5. The optical lifetime testing system of an OLED device according to claim 4, characterized in that: A drawer support frame is installed in the side panel of the detection cabinet, and a plurality of drawer grids are arranged in an array in the drawer support frame. The bottom plate of each fixture drawer is slidably connected in a drawer grid, and a handle is arranged on the panel of the fixture drawer.

6. The optical lifetime testing system of an OLED device according to claim 5, characterized in that: The industrial computer is connected to a UPS uninterruptible power supply, and is connected to an external power supply when the industrial computer is in operation. When the external power supply is cut off, the UPS uninterruptible power supply supplies power to the industrial computer.

7. The optical lifetime testing system of an OLED device according to claim 1, characterized in that: A heat dissipation grid is provided on the panel on the other side of the detection cabinet.

8. The optical lifetime testing system of an OLED device according to claim 1, characterized in that: A plurality of vertical steel bars are also arranged in the detection cabinet, and the electric signal reading module and the UPS uninterruptible power supply support are installed on the vertical steel bars.

Images