Test seat for 1553B transceiver test system

Abstract

The utility model discloses a test seat for a 1553B transceiver test system, which comprises a base, a guide frame, a connecting frame, a connecting cover and a pressing mechanism, a plurality of elastic telescopic probes are arranged on the base, an embedded guide groove is arranged on the upper side of the base, the guide frame is movably embedded into the embedded guide groove, and the connecting cover is arranged on the guide frame. The guide frame is provided with a limiting step through hole for placing a 1553B transceiver, the connecting frame is fixedly connected to the upper end face of the base, the bottom of the rear end of the connecting cover is hinged to the upper portion of the rear end of the connecting frame, the front end of the connecting cover is provided with an elastic clamping tongue, and the elastic clamping tongue can be clamped into a clamping hole in the front end of the connecting frame. The pressing mechanism is installed in the middle of the connecting cover and vertically penetrates through the connecting cover, and the pressing mechanism is elastically pressed on the upper end face of the 1553B transceiver. According to the 1553B transceiver test system composed of the test board and the test seat, the customized test seat is adopted, the welding-free test of the to-be-tested piece can be realized, the test efficiency is high, and product pins are prevented from being damaged.

Description

Technical Field

[0001] The utility model relates to a test seat for a 1553B transceiver test system, belonging to the technical field of 1553B transceiver test. Background Art

[0002] like Figure 1-3 The 1M 1553B bus transceiver with integrated isolation transformer (pin-in and pin-free structures) shown in the figure adopts CDIP24 package. Compared with traditional transceivers, it has an isolation transformer integrated inside and has a higher degree of integration. The overall structure includes a metal shell and a ceramic base, an isolation transformer encapsulated in the shell, an integrated circuit encapsulated in the ceramic base, and pins arranged at the bottom of the ceramic base. The pin definitions are shown in the following table.

[0003]

[0004] The test principle is as follows Figure 4-5 As shown, the existing 1553B bus transceiver test system usually requires an external test board with an isolation transformer integrated thereon. After the 1553B transceiver to be tested is installed by welding, it is connected to the Agilent 93000 oscilloscope for testing through the internal wiring and connectors of the test board. According to the requirements of the 1553B transceiver test system, the Agilent 93000 programming simulates the Manchester coded signal in the complementary CMOS format and inputs it into the transmitter. The transmitter part converts the Manchester coded signal in the complementary CMOS format output by the terminal device into a dual-phase Manchester coded 1553 signal, and drives the isolation transformer to couple to the system analog bus; the receiver uses the Agilent 93000 programming to simulate the dual-phase Manchester coded data on the bus and converts it into a complementary CMOS format Manchester coded signal; the Agilent 93000 oscilloscope samples the signal to test related parameters, such as Figure 1-3 The 1553B bus transceiver in the test is a customized product (with pins and pinless structures), and it is necessary to test the differential output voltage, rise / fall time, threshold voltage, quiescent power supply current, output noise, threshold voltage, receiving delay, receiver interval time, receiver enable delay, drive delay and other parameters. In the conventional test plan, the product is installed by welding, which has the risk of tearing off the product pins, and the residual tin affects the product appearance. Summary of the invention

[0005] The technical problem to be solved by the utility model is to provide a test socket for a 1553B transceiver test system to solve the problems existing in the above-mentioned prior art.

[0006] The technical scheme adopted by the utility model is: a test seat for a 1553B transceiver test system, comprising a base, a guide frame, a connection frame, a connection cover and a clamping mechanism, a plurality of elastic telescopic probes capable of facing the pads on the 1553B transceiver are arranged on the base, an inlay guide groove is arranged on the upper side of the base, the guide frame is movably embedded in the inlay guide groove and the four corners are movably limited by limit pins, a reset spring is arranged between the bottom of the guide frame and the bottom of the inlay guide groove, the limit screws at the four corners of the guide frame are connected to the base and can keep the guide frame moving up and down, a limit step through hole for placing the 1553B transceiver is arranged on the guide frame, the connection frame is fixedly connected to the upper end surface of the base, the bottom of the rear end of the connection cover is hinged to the upper part of the rear end of the connection frame, an elastic clamping tongue is arranged at the front end of the connection cover, the elastic clamping tongue can be clamped into the clamping hole at the front end of the connection frame, the clamping mechanism is installed in the middle of the connection cover and passes through the connection cover up and down, and the clamping mechanism is elastically clamped on the upper end surface of the 1553B transceiver. The utility model adopts a 1553B transceiver test system composed of a test board and a test socket, and adopts a customized test socket, which can realize welding-free testing of a test piece, has high test efficiency, and avoids damage to product pins.

[0007] Furthermore, the above-mentioned clamping mechanism includes a pressing block, a pressing seat and a rotating disk. The pressing block is T-shaped, and the upper end is movably inserted into the stepped square hole of the pressing seat. The pressing seat is fixedly connected to the middle part of the connecting cover. A compression spring is arranged in the stepped square hole. The two ends of the compression spring respectively abut against the upper end of the pressing block and the bottom end of the pressing plate. A cover body is arranged at the upper end of the stepped square hole. The pressure plate moves in the stepped square hole and the upper end abuts against the bottom of the stud of the rotating disk. The stud is spirally connected to the cover body.

[0008] Furthermore, a cross groove is provided at the bottom of the pressing block.

[0009] Furthermore, the pressing seat is provided with four elastic telescopic rods, and the four elastic telescopic rods can elastically lean against the guide frame.

[0010] Furthermore, a limit pin is provided at the bottom of the base, and the limit pin is inserted into the test plate and then locked with bolts.

[0011] Furthermore, the guide frame is provided with gaps on four sides.

[0012] Beneficial effects of the utility model: Compared with the prior art, the utility model adopts a 1553B transceiver test system consisting of a test board and a test socket, and adopts a customized test socket, which can realize welding-free testing of the test piece, has high testing efficiency, and avoids damage to product pins. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 This is a front view diagram of the 1553B transceiver structure;

[0014] Figure 2This is a schematic diagram of the left view of the 1553B transceiver;

[0015] Figure 3 This is a top view of the structure of the 1553B transceiver;

[0016] Figure 4 This is a direct coupling test circuit diagram;

[0017] Figure 5 It is the transformer coupling test circuit diagram;

[0018] Figure 6 This is the layout diagram of the front door of the PCB test board;

[0019] Figure 7 This is the layout diagram of the back of the PCB test board;

[0020] Figure 8 It is the wiring diagram of the PCB test board;

[0021] Fig. 9 It is a schematic diagram of the three-dimensional structure of the test seat;

[0022] Fig.10 This is a schematic diagram of the test socket in the open state;

[0023] Fig.11 This is a schematic diagram of the test socket structure from a top view;

[0024] Fig.12 This is a schematic diagram of the front view structure of the test seat;

[0025] Fig.13 is a schematic diagram of the structure of an elastic telescopic probe;

[0026] Fig.14 It is a schematic diagram of the exploded structure of the base installation limit frame;

[0027] Fig.15 It is a schematic diagram of the structure viewed from above after the base is installed with the limit frame (the device to be tested is installed);

[0028] Fig.16 This is a schematic diagram of the structure of the base when viewed from above;

[0029] Fig.17 is a schematic diagram of the elastic retractable probe extending structure;

[0030] Fig.18 is a schematic diagram of the retracted structure of the elastic telescopic probe;

[0031] Fig.19 It is the test circuit schematic. DETAILED DESCRIPTION

[0032] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0033] Example 1: Figure 1-19 As shown, the test socket 2 includes a base 201, a guide frame 202, a connection frame 203, a connection cover 204 and a clamping mechanism. The base 201 is provided with a plurality of elastic retractable probes 205 that can face the pads on the 1553B transceiver 3. An inlay guide groove 206 is provided on the upper side of the base 201. The guide frame 202 is movably embedded in the inlay guide groove 206 and the four corners are movably limited by limit pins 220. A reset spring 207 is provided between the bottom of the guide frame 202 and the bottom of the inlay guide groove 206. The limit screws 208 at the four corners of the guide frame 202 are connected to the base 201 and can keep the guide frame 202 moving up and down. The guide frame 202 is provided with a limit step through hole 209 for placing the 1553B transceiver 3. The connection frame 203 is fixedly connected to the base 201 On the end surface, the bottom of the rear end of the connection cover 204 is hinged to the upper part of the rear end of the connection frame 203, and the front end of the connection cover 204 is provided with an elastic tongue 210, which can be inserted into the hole 211 at the front end of the connection frame 203. The clamping mechanism is installed in the middle of the connection cover 204 and passes through the connection cover 204 up and down. The clamping mechanism is elastically pressed on the upper end surface of the 1553B transceiver 3, and the guide frame 202 is provided with a placement groove. The device to be tested is placed on the limiting step through hole 209, and the connection cover is closed after the elastic tongue is embedded in the hole. Then, the device to be tested is clamped by the clamping mechanism. If it is a pin-type device to be tested, avoidance bar holes are arranged on both sides of the elastic telescopic probe to facilitate the insertion of the pin for avoidance, so that the pad on the inner side of the pin can face the elastic telescopic probe to achieve rapid measurement.

[0034] In order to facilitate the clamping and play an elastic buffering and protective role during the clamping process, the clamping mechanism includes a clamping block 212, a clamping seat 213 and a rotating disk 214. The clamping block 212 is T-shaped, and the upper end is movably inserted into the stepped square hole of the clamping seat 213. The clamping seat 213 is fixedly connected to the middle part of the connecting cover 204. A compression spring is arranged in the stepped square hole. The two ends of the compression spring respectively abut against the upper end of the clamping block 212 and the bottom end of the pressure plate. A cover body is arranged at the upper end of the stepped square hole. The pressure plate moves in the stepped square hole and the upper end abuts against the bottom of the stud of the rotating disk 214. The stud is spirally connected to the cover body. The seat cover is thick, and the rotating disk is rotated to move the stud inward, thereby gradually clamping the device to be tested, and the compression spring plays an elastic protective role.

[0035] In order to improve the stability of the clamping force, a cross groove 215 is provided at the bottom of the above-mentioned pressing block 212. The four blocks are in contact, the effective contact area is increased, and the clamping stability is better.

[0036] In order to achieve follow-up pressing of the guide frame, the pressing seat 213 is provided with four elastic telescopic rods 216, which can elastically lean against the guide frame 202, and the four elastic telescopic rods and the pressing block simultaneously press the guide frame and the device under test.

[0037] In order to achieve rapid positioning and installation of the base, a limit pin 217 is provided at the bottom of the base 201. After the limit pin 217 is inserted into the test board 1, it is locked with a bolt 218, which can achieve accurate and rapid installation and improve test stability.

[0038] In order to facilitate taking the device under test, the four sides of the guide frame 202 are provided with notches 219 to facilitate taking and placing the device under test, because some devices are very small and need to be clamped with tweezers for placement and removal.

[0039] The base 201 is provided with a plurality of through holes 221 passing through the elastic telescopic probe in the middle, and a limiting sleeve 224 having a diameter larger than the through hole 221 is provided near the lower end of the elastic telescopic probe. A groove 223 communicating with the through hole is provided at the bottom of the base 201, and the limiting sleeve 224 is located in the groove 223. The base 201 is fixedly connected with a hole guard plate 222, and the hole guard plate 222 is provided with a protective step hole 225 extending from the lower end of the elastic telescopic probe.

[0040] Example 2: Figure 1-19 As shown, a 1553B transceiver test system includes a test board 1 and a test socket 2. The test board 1 is provided with a product test socket interface, a bus interface, an external signal source interface, an enable switch, a signal detection interface, a signal detection interface, an input signal control switch, a connector, a ground port x5, a power switch, a +5V power interface, a short connector storage area, an ammeter interface, an FPGA field programmable logic chip, a crystal oscillator, a Schmitt trigger, a capacitor, a resistor and a power chip. The test socket 2 is fixedly connected to the test socket interface and maintains an electrical connection therewith. The test socket 2 is used to place the 1553B transceiver 3.

[0041] The numbers and names on the test board and test socket are shown in the following table:

[0042]

[0043]

[0044] The product pins are interconnected to the test board through the test socket. The internal wiring of the test board connects the pin BUS output to the BUSA and BUSB output ports, the transmit TXA and TXB are connected to the FPGA chip and the transmit detection port, RXA and RXB are connected to the receive detection port, the GND pin is connected to the PCB ground, the transmit enable TXINHA / B and the receive enable RXENA / B are connected to the enable switch, and VDDA and VDDB are connected to the power input.

[0045] The product test socket includes an openable and closable connection cover, a needle module (elastic retractable probe installation structure), a base, and a guide frame for positioning. The needle module is embedded with twenty-four elastic retractable probes, corresponding to a total of twenty-four terminals on the left and right sides of the 1553B bus transceiver. The base matches the design size of the test board product placement position, and is hollowed out to place the needle module. The guide frame is hollowed out based on the product shape and size, and is installed on the base with nuts. The fixing plate is provided with four screw holes. When installing, it is placed on the back of the test board, and the screws are passed through the base and the test board, and screwed into the screw holes of the fixing plate to achieve the installation of the test socket and the test board.

[0046] The test board is provided with a test socket limit indication frame, which is larger than the test socket, for easy and quick positioning.

[0047] There are through holes at the four corners of the test board, which can be used to install hexagonal copper columns as support for the test board;

[0048] The test system uses a conventional digital oscilloscope (sampling rate 1Ga / s), and the test board is connected to the oscilloscope port via a BAC-BAC RF cable or an oscilloscope probe.

[0049] The 1553B transceiver test system, which is composed of a test board and a test socket, uses a customized test socket, which can realize welding-free testing of the DUT, with high test efficiency and avoidance of damage to product pins. The power chip integrated in the test board converts 5V to 3.3V to power the FPGA unit, which serves as the transmitter input of the 1553B transceiver to be tested. After the 1553B transceiver is transcoded, it is coupled to the BUS end through the built-in isolation transformer. The oscilloscope is connected to the BUS output port of the test board through an RF line to detect the BUS output signal. At the same time, the test board also sets A / B channel sending and receiving signals, sending enable and receiving enable signal detection interfaces, current detection points, and can realize full coverage detection tests of all signals. Sending and receiving enable switches and duty cycle control switches are set for precise control. In summary, the test system can perform reliable and stable tests on new customized 1553B bus transceivers, with accurate data testing and low testing costs.

[0050] In order to quickly place the device under test, the test socket 2 includes a base 201, a guide frame 202, a connection frame 203, a connection cover 204 and a clamping mechanism. The base 201 is provided with a plurality of elastic retractable probes 205 that can face the pads on the 1553B transceiver 3. An inlay guide groove 206 is provided on the upper side of the base 201. The guide frame 202 is movably embedded in the inlay guide groove 206 and the four corners are movably limited by limit pins 220. A reset spring 207 is provided between the bottom of the guide frame 202 and the bottom of the inlay guide groove 206. The limit screws 208 at the four corners of the guide frame 202 are connected to the base 201 and can keep the guide frame 202 moving up and down. The guide frame 202 is provided with a limit step through hole 209 for placing the 1553B transceiver 3. The connection frame 203 is fixedly connected to the base On the upper end surface 201, the bottom of the rear end of the connection cover 204 is hinged to the upper part of the rear end of the connection frame 203, and the front end of the connection cover 204 is provided with an elastic tongue 210, which can be inserted into the hole 211 at the front end of the connection frame 203. The clamping mechanism is installed in the middle of the connection cover 204 and passes through the connection cover 204 up and down. The clamping mechanism is elastically pressed on the upper end surface of the 1553B transceiver 3, and the guide frame 202 is provided with a placement groove. The device to be tested is placed on the limiting step through hole 209, and the connection cover is closed after the elastic tongue is embedded in the hole. Then, the device to be tested is clamped by the clamping mechanism. If it is a pin-type device to be tested, avoidance bar holes are arranged on both sides of the elastic telescopic probe to facilitate the insertion of the pin for avoidance, so that the pad on the inner side of the pin can face the elastic telescopic probe to achieve rapid measurement.

[0051] In order to facilitate the clamping and play an elastic buffering and protective role during the clamping process, the clamping mechanism includes a clamping block 212, a clamping seat 213 and a rotating disk 214. The clamping block 212 is T-shaped, and the upper end is movably inserted into the stepped square hole of the clamping seat 213. The clamping seat 213 is fixedly connected to the middle part of the connecting cover 204. A compression spring is arranged in the stepped square hole. The two ends of the compression spring respectively abut against the upper end of the clamping block 212 and the bottom end of the pressure plate. A cover body is arranged at the upper end of the stepped square hole. The pressure plate moves in the stepped square hole and the upper end abuts against the bottom of the stud of the rotating disk 214. The stud is spirally connected to the cover body. The seat cover is thick, and the rotating disk is rotated to move the stud inward, thereby gradually clamping the device to be tested, and the compression spring plays an elastic protective role.

[0052] In order to improve the stability of the clamping force, a cross groove 215 is provided at the bottom of the above-mentioned pressing block 212. The four blocks are in contact, the effective contact area is increased, and the clamping stability is better.

[0053] In order to achieve follow-up pressing of the guide frame, the pressing seat 213 is provided with four elastic telescopic rods 216, which can elastically lean against the guide frame 202, and the four elastic telescopic rods and the pressing block simultaneously press the guide frame and the device under test.

[0054] In order to achieve rapid positioning and installation of the base, a limit pin 217 is provided at the bottom of the base 201. After the limit pin 217 is inserted into the test board 1, it is locked with a bolt 218, which can achieve accurate and rapid installation and improve test stability.

[0055] In order to facilitate taking the device under test, the four sides of the guide frame 202 are provided with notches 219 to facilitate taking and placing the device under test, because some devices are very small and need to be clamped with tweezers for placement and removal.

[0056] A plurality of through holes 221 for passing the elastic telescopic probe are provided in the middle of the base 201, a limiting sleeve 224 whose diameter is larger than the through hole 221 is provided near the lower end of the elastic telescopic probe, a groove 223 connecting the through hole is provided at the bottom of the base 201, the limiting sleeve 224 is located in the groove 223, and the base 201 is fixedly connected with a hole guard plate 222, and the hole guard plate 222 is provided with a protective step hole 225 for extending the probe at the lower end of the elastic telescopic probe.

[0057] Embodiment 3: A test method of a 1553B transceiver test system, the method comprising the following steps:

[0058] 1. Preparation before the test

[0059] (1) Adjust the DC power supply to 5V, adjust the current limit to the middle right, and use the power cord to connect the test board in the correct order of positive and negative poles;

[0060] (2) Prepare two oscilloscope probes;

[0061] (3) Use two RF cables to connect the bus BUSA / BUSB output port to the oscilloscope respectively;

[0062] (4) Modulate the signal source to output a sine wave with a frequency of 1 MHz and an amplitude of 0.86 Vpp;

[0063] 2. Receive delay test method, tDR

[0064] Connect the wires according to the design diagram, connect the oscilloscope probe to RXB_P, connect the RF line to the bus BUSB, then turn on the test board TEN_B send enable and REN_B receive enable switches, and then use the cursor function on the oscilloscope to take the zero-crossing point of the BUSB bus waveform to the rising edge of the RXB_P receive waveform to test and read the ΔX parameter, which is the B channel tDR;

[0065] Repeat the above steps, connect the oscilloscope probe to RXA_P, connect the RF line to BUSA, turn on the test board TEN_A transmit enable and REN_A receive enable switches, and then use the cursor function on the oscilloscope to test and read the ΔX parameter from the zero-crossing point of the BUSA bus waveform to the rising edge of the RXA_P receive waveform, which is the A channel tDR;

[0066] 3. Receiver interval time tRG test method

[0067] Connect the wires according to the design diagram, connect the oscilloscope probe to RXA_N and RXA_P respectively, then turn on the test board TEN_A send enable and REN_A receive enable switches, and then use the cursor function on the oscilloscope to take the test from the falling edge of the received waveform to the rising edge of another received waveform to read the ΔX parameter, which is the A channel tRG;

[0068] Repeat the above steps, connect the oscilloscope probe to RXB_N and RXB_P respectively, turn on the test board TEN_B transmit enable and REN_B receive enable switches, and then use the cursor function on the oscilloscope to test and read the ΔX parameter from the falling edge of the received waveform to the rising edge of another received waveform, which is the B channel tRG;

[0069] 4 Receiver Enable Delay tREN Test Method

[0070] Connect wires according to the design diagram, connect the oscilloscope probe to RXA_P and RXENA respectively, then turn on the test board TEN_A send enable and REN_A receive enable switches, and then use the cursor function on the oscilloscope to take the midpoint of the rising edge of the RXENA waveform to the rising edge of the RXA_P receive waveform to test and read the ΔX parameter, which is the A channel tREN;

[0071] Repeat the above steps, connect the oscilloscope probe to RXB_P and RXENB respectively, turn on the test board TEN_B transmit enable and REN_B receive enable switches, and then use the cursor function on the oscilloscope to take the midpoint of the rising edge of the RXENB waveform to the rising edge of the RXB_P receive waveform to test and read the ΔX parameter, which is the B channel tREN;

[0072] 5. Drive delay tDT test method

[0073] Connect the wires according to the design diagram, connect the oscilloscope probe to TXB_P, connect the RF line to BUSB, then turn on the send enable switch of the test board TEN_B, and then use the cursor function on the oscilloscope to take the test from the rising edge starting point of the TXB_P waveform to the zero crossing point of the BUSB waveform to read the ΔX parameter, which is the B channel tDT;

[0074] Repeat the above steps, connect the oscilloscope probe to TXA_P, connect the RF line to BUSA, turn on the TEN_A transmit enable switch on the test board, and use the cursor function on the oscilloscope to take the value from the rising edge starting point of the TXA_P waveform to the upper zero crossing point of the BUSA waveform to test and read the ΔX parameter, which is the tDT of channel A.

[0075] 6 Rise time tr, fall time tf, differential output voltage Vout test method

[0076] Connect the wires according to the design diagram, connect the RF line to BUSA, turn on the transmit enable switch of the test board TEN_A, and then call up the rise time, fall time, and Vp-p peak-to-peak test items on the oscilloscope and read the values, which are the rise time tr, fall time tf, and differential output voltage Vout of channel A respectively;

[0077] Repeat the above steps, connect the RF line to BUSB, turn on the transmit enable switch of the test board TEN_B, and then call up the rise time, fall time, and Vp-p peak-to-peak test items on the oscilloscope and read the values, which are the rise time tr, fall time tf, and differential output voltage Vout of channel B respectively;

[0078] 7 Output noise VON test method

[0079] Connect the wires according to the design diagram, connect the oscilloscope probe to RXA_p, turn on the test board RXEN_A receiving enable switch, and then press the automatic coordinate setting switch AutoScale on the oscilloscope to call up the Vp-p peak-to-peak test item and read the values, which are the values ​​of the A channel output noise VON respectively;

[0080] Repeat the above steps, connect the oscilloscope probe to RXB_p, turn on the receive enable switch of the test board RXEN_B, and then call up the Vp-p peak-to-peak test item in the oscilloscope's AutoScale automatic coordinate setting switch and read the values, which are the values ​​of the B channel output noise VON.

[0081] 8Threshold voltage VTHND and VTHD test method

[0082] Connect the wires as shown below, connect the oscilloscope probe to RXA_P and RXA_N, and then connect BUSA to the signal source with an RF cable. Turn on the test board RXEN_A receiving enable switch, unplug the straight-through head corresponding to BUSA and place it in the straight-through head storage area, and then set the signal source to a sine wave with a frequency of 1MHz and a peak-to-peak value of 0.86Vpp. Then set the parameters on the oscilloscope to test the positive pulse width and negative pulse width. If the pulse width is ≥70nS, it is qualified and the data is recorded as Pass. Then set the signal source to a sine wave with a frequency of 500KHz and a peak-to-peak value of 0.20Vpp. If there is no signal after the test, it is qualified and the data is recorded as Pass.

[0083] Repeat the above steps, connect the oscilloscope probe to RXB_P and RXB_N, and then connect BUSB to the signal source with an RF cable. Turn on the test board RXEN_B receiving enable switch, unplug the straight-through plug corresponding to BUSB and place it in the straight-through plug storage area, and then set the signal source to a sine wave with a frequency of 1MHz and a peak-to-peak value of 0.86Vpp. Then set the parameters on the oscilloscope to test the positive pulse width and negative pulse width. If the pulse width is ≥70nS, it is qualified and the data is recorded as Pass. Then set the signal source to a sine wave with a frequency of 500KHz and a peak-to-peak value of 0.20Vpp. If there is no signal after the test, it is qualified and the data is recorded as Pass.

[0084] 9Test method of static power supply current ICC1 and ICC2

[0085] Connect the wires according to the design drawing, unplug the straight-through plug of the current test point and place it in the storage area, then use the red and black test leads of the multimeter to detect the current test point, adjust the ICC1 multimeter to the mA gear, connect the red test lead to the mA output test gear, and read the value; that is the ICC1 value of channel A / B;

[0086] ICC2 Turn on the TEN_B send enable switch, adjust the multimeter to the 20A position, connect the red test lead to the 20A output test position, and read the value, which is the ICC2 value of channel B. Then turn off the TEN_B send enable switch, turn on the TEN_A send enable switch, and read the value, which is the ICC2 value of channel A.

[0087] The above description is only a specific implementation method of the present utility model, but the protection scope of the present utility model is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed by the present utility model, which should be included in the protection scope of the present utility model. Therefore, the protection scope of the present utility model should be based on the protection scope of the claims.

Claims

1. A test socket for a 1553B transceiver test system, characterized in that: The invention comprises a base (201), a guide frame (202), a connection frame (203), a connection cover (204) and a clamping mechanism. The base (201) is provided with a plurality of elastic retractable probes (205) capable of facing the pads on the 1553B transceiver (3). An inlay guide groove (206) is provided on the upper side of the base (201). The guide frame (202) is movably embedded in the inlay guide groove (206) and its four corners are movably limited by limit pins (220). A return spring (207) is provided between the bottom of the guide frame (202) and the bottom of the inlay guide groove (206). The four corners of the guide frame (202) are connected to the base (201) by limit screws (208). The guide frame (202) can be kept movable up and down. A limiting step through hole (209) for placing the 1553B transceiver (3) is provided on the guide frame (202). The connection frame (203) is fixedly connected to the upper end surface of the base (201). The bottom of the rear end of the connection cover (204) is hinged to the upper part of the rear end of the connection frame (203). The front end of the connection cover (204) is provided with an elastic latch (210). The elastic latch (210) can be latched into a latch hole (211) at the front end of the connection frame (203). The clamping mechanism is installed in the middle of the connection cover (204) and passes through the connection cover (204) up and down. The clamping mechanism is elastically clamped on the upper end surface of the 1553B transceiver (3).

2. The test socket for a 1553B transceiver test system according to claim 1, characterized in that: The clamping mechanism comprises a clamping block (212), a clamping seat (213) and a rotating disk (214); the clamping block (212) is T-shaped, and the upper end thereof is movably inserted into the stepped square hole of the clamping seat (213); the clamping seat (213) is fixedly connected to the middle of the connecting cover (204); a compression spring is arranged in the stepped square hole, and the two ends of the compression spring respectively abut against the upper end of the clamping block (212) and the bottom end of the clamping plate; a cover body is arranged at the upper end of the stepped square hole; the clamping plate is movably arranged in the stepped square hole and the upper end thereof abuts against the bottom of the stud of the rotating disk (214); the stud is spirally connected to the cover body.

3. The test socket for a 1553B transceiver test system according to claim 2, characterized in that: A cross groove (215) is provided at the bottom of the pressing block (212).

4. The test socket for a 1553B transceiver test system according to claim 2, characterized in that: The pressing seat (213) is provided with four elastic telescopic rods (216), and the four elastic telescopic rods (216) are capable of elastically abutting against the guide frame (202).

5. The test socket for a 1553B transceiver test system according to claim 1, characterized in that: A limit pin (217) is provided at the bottom of the base (201), and the limit pin (217) is inserted into the test plate (1) and then locked with a bolt (218).

6. The test socket of the 1553B transceiver test system according to claim 2, characterized in that: Notches (219) are provided on four inner sides of the guide frame (202).

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