Rapid clamping device for test probe card

Abstract

The utility model discloses a test probe card rapid clamping device, which comprises a mounting seat, splicing slots are arranged on two sides of the lower end of the inner wall of the mounting seat, splicing insertion blocks are inserted into the inner walls of the splicing slots, clamping grooves are fixedly connected to the upper ends of the splicing insertion blocks, and connecting springs are fixedly connected to two sides of the inner wall of each clamping groove. Clamping blocks are fixedly connected to one ends of the connecting springs, limiting sliding blocks are fixedly connected to the front sides and the rear sides of the clamping blocks in parallel, the limiting sliding blocks and limiting sliding rails are installed in an inserted mode, and the limiting sliding rails are formed in the front sides and the rear sides of the inner walls of the clamping grooves. According to the rapid clamping device for the test probe card, the mounting seat can be driven by the rotating shaft to perform direction adjustment, front-back telescopic adjustment can be performed through the extension block and the extension groove, the probe card can be elastically limited and clamped through the connecting spring and the clamping block, the adaptation is better, the clamping block does not need to be replaced repeatedly, and the clamping efficiency is improved. And overall examination replacement can be carried out through the splicing slots and the splicing insertion blocks, so that the use is convenient.

Description

Technical Field

[0001] The utility model relates to the technical field of test probe cards, in particular to a quick clamping device for a test probe card. Background Art

[0002] A probe card is a component used to achieve electrical connection between a tester and a wafer. The probes on the probe card directly contact the tin pads or bumps on the wafer to draw out electrical signals, which are then measured with the tester. The number of probes on a probe card ranges from a few to hundreds. The larger the number, the more expensive the probe card. The service life of a probe card is generally more than 10 million times, so a new probe card requires multiple maintenance from the time it is put into use to the time it is scrapped. The probe card needs to be tested before use to ensure its accuracy, and a fixture is needed to hold the probe card during the test.

[0003] The existing CN210282029U universal probe card quick clamp allows users to easily replace auxiliary clips of different sizes, making the use of the clamp more convenient and more worthy of popularization and use. However, there are shortcomings. The existing equipment cannot be flexibly adjusted, has poor adaptability, and the clamping operation is not convenient and inconvenient to use. Therefore, a test probe card quick clamping device is needed to solve the above problems. Utility Model Content

[0004] The utility model aims to provide a test probe card quick clamping device to solve the problems mentioned in the above background technology that the universal probe card quick clamp cannot be flexibly adjusted, has poor adaptability, and has poor clamping operation convenience and is inconvenient to use.

[0005] To achieve the above-mentioned objectives, the utility model provides the following technical solutions: a test probe card quick clamping device, comprising a mounting seat, a support frame is installed on the outer wall of the mounting seat, and a clamping groove is installed on the inner wall of the mounting seat, rotating shafts are installed on both sides of the mounting seat, and one end of the rotating shaft is rotatably connected to the inner wall of the supporting frame, extension grooves are opened on both sides of the inner wall of the supporting frame, and extension blocks are inserted and installed on the inner wall of the extension groove, splicing slots are opened on both sides of the lower end of the inner wall of the mounting seat, and splicing blocks are inserted and installed on the inner wall of the splicing slot, the upper end of the splicing block is fixedly connected with the clamping groove, and connecting springs are fixedly connected on both sides of the inner wall of the clamping groove, one end of the connecting spring is fixedly connected with the clamping block, and the front and rear sides of the clamping block are fixedly connected with a limiting slider in parallel, the limiting slider is inserted and installed with a limiting slide rail, and the limiting slide rail is opened on the front and rear sides of the inner wall of the clamping groove, and a probe card is distributed between the clamping blocks.

[0006] Preferably, the mounting seat is rotationally connected to the support frame via a rotating shaft, and the rotating shaft is a damping structure.

[0007] Preferably, the support frame is telescopically connected to the extension block via the extension slot, and both the extension slot and the extension block are damping structures.

[0008] Preferably, the probe card is installed on the connection spring by elastically clamping the clamping groove through a clamping block, and the clamping block is an L-shaped structure.

[0009] Preferably, the clamping groove is installed in a positioning and plug-in manner with the mounting seat in the splicing slot through a splicing plug-in block, and the splicing plug-in block and the splicing slot are both made of magnetic materials.

[0010] Preferably, the clamping block is connected to the clamping groove in a limited sliding manner in the limited sliding rail via a limited sliding block.

[0011] Compared with the prior art, the beneficial effects of the utility model are: the test probe card quick clamping device can adjust the direction of the mounting seat by driving the rotating shaft, and can be adjusted forward and backward through the extension block and the extension slot, and the probe card can be elastically limited and clamped by connecting the spring and the clamping block, so the adaptability is better, and there is no need to repeatedly replace the clamping block. Moreover, the overall test can be replaced through the splicing slot and the splicing plug-in block, which is easy to use. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 This is a front view of a quick clamping device for a test probe card of the utility model;

[0013] Figure 2 This is a cross-sectional view of a quick clamping device for a test probe card of the utility model;

[0014] Figure 3 The utility model is a test probe card quick clamping device Figure 2 Enlarged view of point A in the middle;

[0015] Figure 4 The utility model is a test probe card quick clamping device Figure 2 Enlarged view of point B in the middle;

[0016] Figure 5 The utility model is a test probe card quick clamping device Figure 2 Enlarged view of center C.

[0017] In the figure: 1. mounting base, 2. supporting frame, 3. connecting spring, 4. probe card, 5. clamping groove, 6. extension block, 7. rotating shaft, 8. extension groove, 9. clamping block, 10. limiting slide rail, 11. limiting slider, 12. splicing slot, 13. splicing plug-in block. DETAILED DESCRIPTION

[0018] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0019] See also Figure 1-5 The utility model provides a technical solution: a test probe card quick clamping device, including a mounting seat 1, a support frame 2, a connecting spring 3, a probe card 4, a clamping groove 5, an extension block 6, a rotating shaft 7, an extension groove 8, a clamping block 9, a limiting slide rail 10, a limiting slider 11, a splicing slot 12 and a splicing plug-in block 13. The mounting seat 1 is provided with a support frame 2 on the outer wall, and the mounting seat 1 is provided with a clamping groove 5 on the inner wall. The mounting seat 1 is rotationally connected to the support frame 2 through the rotating shaft 7, and the rotating shaft 7 is a damping structure, so that the mounting seat 1 is convenient for damping rotation adjustment. The support frame 2 is telescopically connected to the extension block 6 through the extension groove 8, and the extension groove 8 and the extension block 6 are both damping structures, so that the support frame 2 is convenient for telescopic adjustment to the front and back, and is flexible to use.

[0020] The clamping groove 5 is installed in a positioning and plugging manner with the mounting seat 1 in the splicing slot 12 through the splicing plug block 13, and the splicing plug block 13 and the splicing slot 12 are both made of magnetic materials, so that the clamping groove 5 is convenient for overall positioning, disassembly and replacement.

[0021] Rotating shafts 7 are installed on both sides of the mounting seat 1, and one end of the rotating shaft 7 is rotationally connected to the inner wall of the support frame 2, extension grooves 8 are opened on both sides of the inner wall of the support frame 2, and extension blocks 6 are installed on the inner walls of the extension grooves 8, splicing slots 12 are opened on both sides of the lower end of the inner wall of the mounting seat 1, and splicing blocks 13 are installed on the inner walls of the splicing slots 12, the upper end of the splicing block 13 is fixedly connected with a clamping groove 5, and connecting springs 3 are fixedly connected on both sides of the inner wall of the clamping groove 5, one end of the connecting spring 3 is fixedly connected with a clamping block 9, and the front and rear sides of the clamping block 9 are fixedly connected with a limiting slider 11 in parallel, and the clamping block 9 is limitedly slidably connected to the clamping groove 5 in the limiting slide rail 10 through the limiting slider 11, so that the movement of the clamping block 9 is more stable and the clamping is more stable.

[0022] The limiting slider 11 is installed by plugging with the limiting slide rail 10, and the limiting slide rail 10 is opened on the front and rear sides of the inner wall of the clamping groove 5. The probe card 4 is distributed between the clamping blocks 9. The probe card 4 is elastically clamped and installed on the connecting spring 3 with the clamping groove 5 through the clamping block 9, and the clamping block 9 is an L-shaped structure, which makes it convenient to perform elastic limiting clamping of the probe card 4, and convenient and quick adjustment, and easy to use.

[0023] Working principle: When using the test probe card quick clamping device, first install the device in combination with the detection equipment, then place the probe card 4 in the clamping slot 5, and then drive the clamping block 9 to elastically clamp the probe card 4 through the connecting spring 3, the limiting slide rail 10 and the limiting slider 11. When it is necessary to replace the probe card 4 of a different size, the clamping block 9 can be slid and adjusted through the connecting spring 3. When it is necessary to adapt the detection equipment, the mounting base 1 can be driven to flip and telescope through the rotating shaft 7, the extension block 6 and the extension slot 8. When the clamping block 9 is damaged, the clamping slot 5 can be quickly spliced, disassembled and replaced through the splicing slot 12 and the splicing plug block 13. This is the use process of the test probe card quick clamping device.

[0024] Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art may still modify the technical solutions described in the aforementioned embodiments, or make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention shall be included in the protection scope of the present invention.

Claims

1. A test probe card quick clamping device, comprising a mounting seat (1), a support frame (2) being mounted on the outer wall of the mounting seat (1), and a clamping groove (5) being mounted on the inner wall of the mounting seat (1), characterized in that: The mounting seat (1) is provided with a rotating shaft (7) on both sides, and one end of the rotating shaft (7) is rotatably connected to the inner wall of the support frame (2); the inner wall of the support frame (2) is provided with an extension groove (8) on both sides, and an extension block (6) is inserted and installed in the inner wall of the extension groove (8); the lower end of the inner wall of the mounting seat (1) is provided with a splicing slot (12) on both sides, and a splicing plug-in block (13) is inserted and installed in the inner wall of the splicing slot (12); the upper end of the splicing plug-in block (13) is fixedly connected to a clamping groove (5), and the inner wall of the clamping groove (5) is fixedly connected to a connecting spring (3); one end of the connecting spring (3) is fixedly connected to a clamping block (9), and the front and rear sides of the clamping block (9) are parallelly fixedly connected to a limiting slider (11); the limiting slider (11) is inserted and installed with a limiting slide rail (10), and the limiting slide rail (10) is provided on the front and rear sides of the inner wall of the clamping groove (5); a probe card (4) is distributed between the clamping blocks (9).

2. A test probe card quick clamping device according to claim 1, characterized in that: The mounting seat (1) is rotationally connected to the support frame (2) via a rotating shaft (7), and the rotating shaft (7) is a damping structure.

3. A test probe card quick clamping device according to claim 2, characterized in that: The support frame (2) is connected to the extension block (6) in a forward and backward telescopic manner via the extension slot (8), and both the extension slot (8) and the extension block (6) are damping structures.

4. A test probe card quick clamping device according to claim 3, characterized in that: The probe card (4) is installed on the connection spring (3) and the clamping groove (5) in an elastic clamping manner through a clamping block (9), and the clamping block (9) is an L-shaped structure.

5. A test probe card quick clamping device according to claim 4, characterized in that: The clamping groove (5) is installed in a positioning and plug-in manner with the mounting seat (1) in the splicing slot (12) via a splicing plug-in block (13), and both the splicing plug-in block (13) and the splicing slot (12) are made of magnetic material.

6. A test probe card quick clamping device according to claim 5, characterized in that: The clamping block (9) is connected to the clamping groove (5) in a limited sliding manner in the limited sliding rail (10) via a limited sliding block (11).

Images