Millimeter wave radar chip testing and sorting device

Abstract

The utility model discloses a millimeter wave radar chip testing and sorting device. The device comprises a box body, a main control board is arranged in the box body, a top plate is arranged at the upper end of the main control board, a plurality of containing grooves are formed in the top plate, bottom plates connected with pins for millimeter wave radar chip testing are arranged at the bottoms of the containing grooves, a pressing plate is detachably and fixedly connected to the upper side of the top plate, and pressing blocks are arranged at the positions, corresponding to the containing grooves, of the lower side of the pressing plate. The processor is connected with a plurality of relays through a plurality of driving circuits, one end of a normally open contact of each relay is connected with the bottom plate, the processor and the other end of the normally open contact of each relay are both connected with a data interface arranged on the box body, and a power interface is arranged on the box body and connected with the main control board. According to the utility model, the accessed millimeter-wave radar chips can be controlled by controlling the actuation of the relay, and the millimeter-wave radar chips on the device can be tested one by one after the data interface is connected with the external test circuit, so that the test efficiency is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of millimeter wave radar chip testing and sorting, in particular to a millimeter wave radar chip testing and sorting device. Background Art

[0002] The wavelength emitted by millimeter-wave radar is 1 to 10 mm, which is between microwaves and centimeter waves. Therefore, millimeter-wave radar has some advantages of both microwave radar and photoelectric radar. Millimeter-wave radar will have different degrees of errors in the production process, which may cause greater errors in detection. In order to ensure the detection accuracy, the performance of the millimeter-wave radar chip itself needs to be tested and calibrated before leaving the factory, and those with large errors are screened out as defective products. In the prior art, the test of millimeter-wave radar chips is usually carried out one by one in a darkroom. After each test, the millimeter-wave radar chip needs to be removed and a new millimeter-wave radar chip needs to be put in. Each operation requires entering and exiting the darkroom, and the test efficiency is low. With the development of technology, it has become a reality to use robots to replace manual labor to pick up and place millimeter-wave radar chips, but robots can only pick up and place one millimeter-wave radar chip at a time. It can significantly reduce labor costs, but it cannot significantly improve test efficiency. Utility Model Content

[0003] The utility model aims to provide a millimeter wave radar chip testing and sorting device in view of the deficiencies in the prior art.

[0004] To achieve the above-mentioned purpose, the utility model provides a millimeter-wave radar chip testing and sorting device, including a box body, a main control board is arranged in the box body, and a top plate is arranged at the upper end thereof, a plurality of accommodating grooves are arranged on the top plate, and a bottom plate connected to the test pins of the millimeter-wave radar chip is arranged at the bottom of the accommodating grooves, a pressure plate is detachably and fixedly connected to the upper side of the top plate, a pressure block is arranged at the lower side of the pressure plate at a position corresponding to the accommodating groove, the main control board includes a processor, the processor is connected to a plurality of relays through a plurality of driving circuits, one end of the normally open contact of the relay is connected to the bottom plate, and the other ends of the processor and the normally open contact of the relay are both connected to a data interface arranged on the box body, and a power interface is arranged on the box body, and the power interface is connected to the main control board.

[0005] Furthermore, one end of the pressing plate is hinged to the top plate, and a magnetic attraction structure is provided between the other end of the pressing plate and the top plate.

[0006] Furthermore, the magnetic attraction structure includes a plurality of magnetic columns fixed on the lower side of the pressing plate and a suction plate fixed on the upper side of the top plate.

[0007] Furthermore, the accommodating grooves are arranged in a rectangular array on the top plate, and an installation groove is provided on the upper side of the pressure plate on the upper side of each row of accommodating grooves, and avoidance holes are provided at the corresponding positions of the installation grooves and the accommodating grooves. The upper end of the pressure block is fixedly connected to the connecting plate arranged in the accommodating groove, and its lower end passes through the avoidance hole and protrudes from the lower surface of the top plate. A fixing plate is provided on the upper side of the connecting plate, and the fixing plate is fixedly connected to the installation groove with bolts.

[0008] Furthermore, a plurality of indicator lights are provided on one side of each receiving slot, and the indicator lights are connected to the processor.

[0009] Furthermore, the indicator lights include a test indicator light, a test pass indicator light and a test fail indicator light.

[0010] Furthermore, a through hole is provided on the pressure plate on the upper side of the indicator light.

[0011] Furthermore, a handle is provided on the upper side of one end of the pressing plate having the magnetic attraction structure.

[0012] Beneficial effect: The utility model arranges multiple accommodating grooves on the top plate to place multiple millimeter-wave radar chips. After the millimeter-wave radar chips are placed in, the pins used for testing are connected to the connecting board, and the connecting board is connected to the data interface through the normally open contact of the relay, and then the connected millimeter-wave radar chip is controlled by controlling the relay to be attracted. After the data interface is connected to the external test circuit, the millimeter-wave radar chips on the device can be tested one by one to improve the test efficiency. By arranging an indicator light on one side of the accommodating groove, it is convenient to observe the current test progress and the results of the completed tests, and it is convenient to sort the millimeter-wave radar chips after the test is completed. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 It is a structural schematic diagram of a millimeter wave radar chip testing and sorting device according to an embodiment of the utility model;

[0014] Figure 2 It is a schematic diagram of a partial explosion structure of a millimeter wave radar chip testing and sorting device according to an embodiment of the utility model;

[0015] Figure 3 It is a partial cross-sectional structural schematic diagram of a millimeter-wave radar chip testing and sorting device according to an embodiment of the utility model;

[0016] Figure 4 It is the structural schematic diagram of the drive circuit. DETAILED DESCRIPTION

[0017] The present invention is further explained below in conjunction with the accompanying drawings and specific embodiments. The embodiments are implemented based on the technical solution of the present invention. It should be understood that these embodiments are only used to illustrate the present invention and are not used to limit the scope of the present invention.

[0018] like Figures 1 to 4 As shown, the embodiment of the utility model provides a millimeter wave radar chip testing and sorting device, including a box body 1, a main control board is arranged in the box body 1, a top plate 2 is arranged at the upper end of the box body 1, a plurality of receiving grooves 3 are arranged on the top plate 2, the receiving grooves 3 are used to place the millimeter wave radar chip 4, a bottom plate is arranged at the bottom of the receiving groove 3, and the bottom plate is a PCB board. When the millimeter wave radar chip 4 is placed in the receiving groove 3 according to a specific direction, its test pins can be connected to the preset circuit on the bottom plate. A pressure plate 5 is detachably fixedly connected to the upper side of the top plate 2, and a plurality of pressing blocks 6 are arranged on the lower side of the pressure plate 5, each of which corresponds to the position of the receiving groove 3. After the pressure plate 5 is fixed on the top plate 2, the pressing blocks 6 can be pressed on the upper side of the millimeter wave radar chip 4, so that the millimeter wave radar chip 4 is stably connected to the bottom plate. The above-mentioned main control board includes a processor, and a processor of the STM32 series can be used. The processor is connected to multiple relays through multiple driving circuits, and the processor controls the operation of multiple relays. One end of the normally open contact of the relay is connected to the bottom plate, and the other ends of the processor and the normally open contact of the relay are connected to the data interface 7 set on the box 1. The data interface 7 is used to connect to the external test circuit, and the external test circuit includes a radio frequency module and a video antenna, etc. A power interface 8 is provided on the box 1. The power interface 8 is used to connect to an external power adapter. The power interface 8 is connected to the main control board to provide the required working power. When working, the processor can receive external control instructions through the data interface. After receiving the start test instruction, the processor controls the first group of relays to work according to the set order, and then connects the corresponding millimeter wave radar chip 4 to the data interface. The external test circuit is connected to the millimeter wave radar chip 4 through the data interface, so as to perform a functional test on the millimeter wave radar chip 4. After the test of the current millimeter-wave radar chip 4 is completed, the external device feeds back a test completion signal to the processor through the data interface 7, and the processor controls the currently engaged relay to be disconnected, and then controls the relay corresponding to the next millimeter-wave radar chip 4 to be engaged, and then continues to test the next millimeter-wave radar chip 4 until all millimeter-wave radar chips 4 on the device are tested. The above test completion signal can be automatically sent by the external test circuit setting, or it can be switched by manually controlling the switch button.

[0019] One end of the pressing plate 5 of the embodiment of the utility model is hinged to the top plate 2, and a magnetic attraction structure is provided between the other end of the pressing plate 5 and the top plate 2. Specifically, the magnetic attraction structure includes a magnetic column 9 and a suction plate 10 matched with the magnetic column 9, and the suction plate 10 is an iron plate that can be adsorbed by the magnetic column 9. Preferably, the magnetic column 9 is fixed to the lower side of the pressing plate 5, and the suction plate 10 is fixed to the upper side of the top plate 2. In order to facilitate opening and closing of the pressing plate 5, a handle 51 is provided on the upper side of one end of the pressing plate 5 where the magnetic attraction structure is provided.

[0020] The accommodating grooves 3 of the embodiment of the utility model are preferably arranged in a rectangular array on the top plate 2, and the upper side of the pressing plate 5 on the upper side of each row of accommodating grooves 3 is provided with a mounting groove 11, and the mounting groove 11 is provided with a avoidance hole 12 at the corresponding position of the accommodating groove 3. The upper end of the pressing block 6 is fixedly connected to the connecting plate 13 arranged in the accommodating groove 3, and the lower end of the pressing block 6 is protruded from the lower surface of the top plate 2 through the avoidance hole 12. A fixing plate 14 is provided on the upper side of the connecting plate 13, and the fixing plate 14 is fixedly connected with bolts in the mounting groove 11. The pressing block 6 is preferably a silicone block, and the pressing block 6 of each row can be formed integrally with the connecting plate 13.

[0021] In order to facilitate the observation of the test results, it is preferred that a plurality of indicator lights are provided on one side of each accommodating groove 3, and the indicator lights are connected to the processor. Specifically, the indicator lights are preferably LEDs, and a corresponding LED driving circuit is provided between the indicator lights and the processor. The indicator lights can be specifically divided into a test indicator light 15, a test pass indicator light 16, and a test fail indicator light 17. Among them, the test indicator light 15 is preferably white, the test pass indicator light is preferably green, and the test fail indicator light is preferably red. The test indicator light 15 lights up during the test of the corresponding millimeter-wave radar chip 4. After the test is completed, the external test circuit feeds back the test results to the processor through the data interface 7, and the processor controls the test pass indicator light 16 or the test fail indicator light 17 according to the test results. This facilitates the sorting of the millimeter-wave radar chip 4 according to the indicator lights after the test. In order to facilitate the observation of the test progress and the results of the completed tests, it is also preferred to provide a through hole 18 on the pressure plate 5 on the upper side of the indicator light.

[0022] See also Figure 4 The driving circuit includes a voltage divider circuit composed of resistors R1 and R2, a transistor Q1, a diode D1 and a capacitor C1, etc. The left end of the resistor R1 is connected to the processor, and the relay is connected in reverse parallel with the diode D1. This is the prior art and will not be described in detail.

[0023] The above is only a preferred embodiment of the utility model. It should be pointed out that for ordinary technicians in this technical field, other parts not specifically described belong to the prior art or common knowledge. Under the premise of not departing from the principle of the utility model, several improvements and modifications can be made, and these improvements and modifications should also be regarded as the protection scope of the utility model.

Claims

1. A millimeter wave radar chip testing and sorting device, characterized in that: It includes a box body, a main control board is arranged in the box body, and a top plate is arranged on the upper end of the box body, a plurality of accommodating grooves are arranged on the top plate, a bottom plate connected to the test pins of the millimeter-wave radar chip is arranged at the bottom of the accommodating groove, a pressure plate is detachably and fixedly connected to the upper side of the top plate, a pressure block is arranged at the lower side of the pressure plate at a position corresponding to the accommodating groove, the main control board includes a processor, the processor is connected to a plurality of relays through a plurality of driving circuits, one end of the normally open contact of the relay is connected to the bottom plate, the other ends of the processor and the normally open contact of the relay are connected to a data interface arranged on the box body, a power interface is arranged on the box body, and the power interface is connected to the main control board.

2. A millimeter wave radar chip testing and sorting device according to claim 1, characterized in that: One end of the pressing plate is hinged to the top plate, and a magnetic attraction structure is provided between the other end of the pressing plate and the top plate.

3. A millimeter wave radar chip testing and sorting device according to claim 2, characterized in that: The magnetic attraction structure includes a plurality of magnetic columns fixed on the lower side of the pressing plate and an attraction plate fixed on the upper side of the top plate.

4. The millimeter wave radar chip testing and sorting device according to claim 1, characterized in that: The accommodating grooves are arranged in a rectangular array on the top plate, and an installation groove is provided on the upper side of the pressure plate on the upper side of each row of accommodating grooves. Avoidance holes are provided at the corresponding positions of the installation grooves and the accommodating grooves. The upper end of the pressure block is fixedly connected to the connecting plate arranged in the accommodating groove, and its lower end passes through the avoidance hole and protrudes from the lower surface of the top plate. A fixing plate is provided on the upper side of the connecting plate, and the fixing plate is fixedly connected in the installation groove by bolts.

5. The millimeter wave radar chip testing and sorting device according to claim 1, characterized in that: A plurality of indicator lights are arranged on one side of each receiving slot, and the indicator lights are connected to the processor.

6. A millimeter wave radar chip testing and sorting device according to claim 5, characterized in that: The indicator lights include a test indicator light, a test pass indicator light and a test fail indicator light.

7. The millimeter wave radar chip testing and sorting device according to claim 5, characterized in that: A through hole is arranged on the pressure plate on the upper side of the indicator light.

8. The millimeter wave radar chip testing and sorting device according to claim 2, characterized in that: The upper side of one end of the pressing plate provided with the magnetic attraction structure is provided with a handle.

Images