Power battery drop test device

Abstract

The embodiment of the utility model discloses a power battery drop test device which comprises a device frame body and a sample bearing assembly, and an elastic piece is arranged between the sample bearing assembly and the device frame body; the sample bearing assembly comprises a plurality of bearing plates and a control mechanism; the bearing plates comprise a first application state and a second application state, the control mechanism is used for controlling the bearing plates to be switched between the first application state and the second application state, and when the bearing plates are in the first application state, the multiple bearing plates support a sample; when the bearing plate is in the second application state, the sample is separated from the bearing of the bearing plate. In the scheme of the embodiment of the invention, the sample bearing assembly can be subjected to a certain elastic acting force through the arranged elastic piece, and compared with a natural falling mode, the speed of the to-be-tested sample at the preset falling node can be conveniently changed, so that different height conditions can be simulated to carry out a falling test.

Description

Technical Field

[0001] The present application relates to the technical field of power batteries, and in particular to a power battery drop test device. Background Art

[0002] In recent years, the new energy vehicle industry has developed rapidly. As a core component of new energy, power batteries are subjected to the test of complex working conditions in market applications. In order to simulate the risks caused by accidental product drops in production, assembly, transportation and other scenarios, the batteries are subjected to drop tests. However, with the increase in the scale of industrial production today, the height of the production line has gradually increased due to the stacking of layers. The range of conventional test equipment no longer meets the verification requirements, and changes in the upper limit of the range often require the test equipment to be re-commissioned and modified, which is not only time-consuming and labor-intensive, but also requires extremely high costs. Utility Model Content

[0003] In view of the above problems, the present application provides a power battery drop test device, which can simulate different height conditions to perform drop tests on power batteries, thereby improving the operating efficiency of the drop test and reducing application costs.

[0004] The technical means adopted by this application to solve the above technical problems are:

[0005] The embodiment of the present application provides a power battery drop test device, comprising:

[0006] Device frame;

[0007] A sample carrying assembly is disposed in the device frame so as to be movable up and down, and an elastic member is disposed between the sample carrying assembly and the device frame; the sample carrying assembly includes a plurality of carrying plates and a control mechanism;

[0008] The supporting plate includes a first application state and a second application state, and the control mechanism is used to control the supporting plate to switch between the first application state and the second application state. When the supporting plate is in the first application state, a plurality of the supporting plates form a support for the sample; when the supporting plate is in the second application state, the sample is detached from the support of the supporting plate.

[0009] In the embodiment scheme of the present application, the sample carrying assembly can be used to place and fix the sample to be tested; the elastic member can be subjected to a certain elastic force, which can facilitate changing the speed of the sample to be tested at a preset drop node compared to a natural drop method, thereby simulating different height conditions to perform corresponding drop tests.

[0010] In some embodiments, the sample holding assembly further comprises a first top plate and a plurality of lateral baffles, wherein one end of the plurality of lateral baffles is connected to the first top plate and the other end extends downward;

[0011] The carrying plate is swingably arranged on the lateral baffle plate, and a containing cavity for placing samples is formed between the carrying plate, the lateral baffle plate and the first top plate.

[0012] In the embodiment of the present application, by providing the lateral baffle, protection can be provided to the sample to be tested from the side, so that the sample to be tested can be more stably placed in the containing cavity.

[0013] In some embodiments, the control mechanism includes a first electromagnetic member disposed on the carrier plate and a second electromagnetic member disposed on the sample carrier assembly;

[0014] When the carrying plate is in the first application state, magnetic attraction is formed between the first electromagnetic component and the second electromagnetic component.

[0015] In the embodiment scheme of the present application, through the magnetic adsorption between the first electromagnetic component and the second electromagnetic component, the supporting plate can be placed in the first application state, thereby supporting the sample to be tested; and through the adsorption and separation between the first electromagnetic component and the second electromagnetic component, the supporting state of the sample to be tested can be released, so that the sample to be tested can fall down.

[0016] In some embodiments, the control mechanism includes a first electromagnetic member disposed on the carrier plate, a second electromagnetic member disposed on the sample carrier assembly, and a limit rod disposed on the device frame, wherein the limit rod is disposed on the movement path of the carrier plate;

[0017] When the carrying plate is in the first application state, magnetic adsorption is formed between the first electromagnetic component and the second electromagnetic component;

[0018] The carrying plate is provided with a contact portion facing away from the accommodating cavity, and the contact portion can move to contact the limiting rod.

[0019] In the embodiment scheme of the present application, through the adsorption effect between the first electromagnetic component and the second electromagnetic component, the supporting plate can form a supporting effect on the sample to be tested; and through the collision effect between the touch part and the limit rod, the mutual separation between the first electromagnetic component and the second electromagnetic component can be promoted, thereby facilitating the falling of the sample to be tested.

[0020] In some embodiments, the control mechanism includes a first electromagnetic member disposed on the carrier plate, a second electromagnetic member disposed on the sample carrier assembly, and an electromagnetic inductor disposed on the device frame;

[0021] When the carrying plate is in the first application state, magnetic adsorption is formed between the first electromagnetic component and the second electromagnetic component;

[0022] The electromagnetic inductor is arranged on the movement path of the sample supporting component.

[0023] In the embodiment scheme of the present application, the adsorption effect between the first electromagnetic component and the second electromagnetic component enables the support effect of the sample to be tested to be formed between the supporting plates; and the electromagnetic sensor is set to detect the position of the magnetic adsorption effect, thereby facilitating the control of the separation node between the first electromagnetic component and the second electromagnetic component.

[0024] In some embodiments, a weight sensor is disposed on the supporting plate.

[0025] In the embodiment of the present application, the weight sensor provided can be used to detect the weight of the sample to be tested.

[0026] In some embodiments, the device frame includes a plurality of frame columns, and at least one of the frame columns is provided with a scale.

[0027] In the embodiment of the present application, the scale provided can be used to confirm the current position of the sample supporting assembly, thereby facilitating the orderly conduct of the drop test.

[0028] In some embodiments, a second top plate is disposed on the device frame, the first top plate is located below the second top plate, and a movable plate is disposed between the first top plate and the second top plate;

[0029] The elastic member is disposed between the movable plate and the first top plate, and between the movable plate and the second top plate;

[0030] The shape of the movable plate is matched with the shape surrounded by the frame columns.

[0031] In the embodiment of the present application, the movable plate is provided to facilitate improving the stability of the drop test.

[0032] In some embodiments, the edge of the movable plate is configured as a smooth arc surface;

[0033] Alternatively, guide wheels are provided between the movable plate and the frame columns.

[0034] In the embodiment of the present application, by setting the edge of the movable plate as a smooth arc surface, or by providing the guide wheel on the movable plate, the smoothness of the relative movement between the movable plate and the frame column can be improved.

[0035] In some embodiments, an elastic buffer is disposed on the top of the accommodating cavity.

[0036] In the embodiment of the present application, the elastic buffer member can be used to provide a pre-force for the sample to be tested, so that the state of the sample to be tested can be more stable during the downward process.

[0037] Other features and advantages of the present application will be described in the subsequent description, or some features and advantages can be inferred or determined without doubt from the contents of the description, or can be learned by implementing the above-mentioned embodiments of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Various other advantages and benefits will become apparent to those of ordinary skill in the art by reading the detailed description of the preferred embodiments below. The accompanying drawings are only for the purpose of illustrating the preferred embodiments and are not to be considered as limiting the present application. Moreover, the same reference numerals are used throughout the drawings to represent the same components. In the drawings:

[0039] Figure 1 This is a schematic diagram of the structure of a power battery drop test device from one perspective in some embodiments of the present application.

[0040] Figure 2 This is a schematic diagram of the structure of a power battery drop test device from another perspective in some embodiments of the present application.

[0041] Figure 3 Schematic diagram of the installation position of the elastic buffer member in some embodiments of the present application.

[0042] Some of the reference numerals in the specific implementation manner are as follows:

[0043] 1-device frame, 11-frame column, 111-scale, 12-second top plate;

[0044] 2-sample carrying assembly, 21-carrying plate, 211-touch portion, 212-weight sensor, 22-control mechanism, 221-first electromagnetic member, 222-second electromagnetic member, 223-limiting rod, 23-first top plate, 24-lateral baffle, 25-accommodating chamber, 251-elastic buffer member;

[0045] 3- elastic member;

[0046] 4- Movable board. DETAILED DESCRIPTION

[0047] The following embodiments of the technical solution of the present application are described in detail in conjunction with the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present application, and are therefore only used as examples, and cannot be used to limit the scope of protection of the present application.

[0048] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.

[0049] In the description of the embodiments of the present application, the technical terms "first", "second", etc. are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features. In the description of the embodiments of the present application, the meaning of "multiple" is more than two, unless otherwise clearly and specifically defined.

[0050] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0051] In the description of the embodiments of the present application, the term "multiple" refers to more than two (including two). Similarly, "multiple groups" refers to more than two groups (including two groups), and "multiple pieces" refers to more than two pieces (including two pieces).

[0052] In the description of the embodiments of the present application, unless otherwise clearly specified and limited, technical terms such as "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be the internal connection of two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present application can be understood according to the specific circumstances.

[0053] At present, common drop test devices usually have a fixed height stroke. During the test, the sample to be tested is first installed and fixed, and then the sample to be tested is controlled to be lifted. When the sample rises to the set height condition, the restriction on the sample to be tested is released, so that the sample to be tested can be dropped according to the preset height.

[0054] However, as the production capacity of power batteries increases, the height of the production line is set higher and higher, so the height travel of conventional drop test equipment can no longer meet the drop test requirements at higher positions. The overall cost of modifying conventional drop test equipment based on the height travel is relatively high. When the height is higher, it is often necessary to design a height space to avoid it, or a specific space is required to place the drop test equipment. Therefore, the modification will bring greater application costs and does not meet the production capacity efficiency requirements.

[0055] In order to solve the above technical problems, the present embodiment provides a power battery drop test device, which can simulate different height conditions to perform a drop test on the power battery, thereby improving the operating efficiency of the drop test and reducing the application cost.

[0056] like Figures 1 to 3 As shown, a power battery drop test device provided according to some embodiments of the present application includes:

[0057] Device frame 1;

[0058] The sample carrying assembly 2 is disposed in the device frame 1 so as to be movable up and down, and an elastic member 3 is disposed between the sample carrying assembly 2 and the device frame 1; the sample carrying assembly 2 includes a plurality of carrying plates 21 and a control mechanism 22;

[0059] The supporting plate 21 includes a first application state and a second application state. The control mechanism 22 is used to control the supporting plate 21 to switch between the first application state and the second application state. When the supporting plate 21 is in the first application state, a plurality of the supporting plates 21 form a support for the sample; when the supporting plate 21 is in the second application state, the sample is detached from the support of the supporting plate 21.

[0060] In some embodiments, the elastic member 3 is configured as a compression spring.

[0061] When the sample-carrying component 2 continuously moves upward relative to the device frame 1, the elastic member 3 is in a compressed state. Therefore, when the force driving the sample-carrying component 2 to move upward is released, the sample-carrying component 2 will move downward under the action of gravity, and will also be affected by the elastic recovery force of the elastic member 3, thereby forming an accelerated downward movement.

[0062] In some embodiments, depending on the actual specifications of the sample to be tested, the force-applying object used to drive the sample supporting assembly 2 to move upward can be either an on-site operator or an external lifting device, such as a telescopic lifting device, etc.; the specific force-applying object is not limited here.

[0063] In some embodiments, when the supporting plate 21 switches from the first application state to the second application state, it can be understood that the sample to be tested switches from the accelerated drop stage to the free fall stage. Therefore, an equivalent calculation can be performed based on data such as the speed of the sample to be tested during stage switching, the elastic force and compression modulus of the elastic member 3, etc., to obtain the speed that the sample to be tested needs to reach when falling from different heights, thereby simulating different height requirements to perform a drop test.

[0064] In some embodiments, the sample to be tested is configured as a power battery.

[0065] The sample carrying component 2 can be used to place and fix the sample to be tested; the elastic member 3 can be applied to the sample carrying component 2 to a certain elastic force. Compared with the natural falling method, it is convenient to change the speed of the sample to be tested at the preset falling node, so that different height conditions can be simulated to carry out corresponding drop tests, which has a wider range of applications and lower overall application costs.

[0066] As an example of one of the applications, refer to Figure 1 , Figure 2 As shown, the sample holding assembly 2 further includes a first top plate 23 and a plurality of lateral baffles 24, one end of the plurality of lateral baffles 24 is connected to the first top plate 23, and the other end extends downward;

[0067] The carrying plate 21 is swingably disposed on the lateral baffle plate 24 , and a receiving cavity 25 for placing a sample is formed between the carrying plate 21 , the lateral baffle plate 24 and the first top plate 23 .

[0068] In some embodiments, reference Figure 1 , Figure 2 As shown, the first top plate 23 is arranged in a rectangular shape, and the lateral baffles 24 are arranged at the four corner ends of the first top plate 23 . The supporting plate 21 is arranged on each of the lateral baffles 24 , and at this time, four supporting plates 21 are arranged.

[0069] In some embodiments, the lateral baffles 24 are provided at the four corner ends of the first top plate 23, and a supporting plate 21 is provided between the two lateral baffles 24 on the opposite sides of the first top plate 23. In this case, two supporting plates 21 are provided.

[0070] It is understandable that the supporting plates 21 can together form a supporting function for the sample to be tested in the first application state, and the specific number of the supporting plates 21 is not limited here.

[0071] By setting the first top plate 23, the installation and connection of the elastic member 3 can be facilitated; by setting the lateral baffle 24, protection for the sample to be tested can be formed from the side, so that the sample to be tested can be more stably placed in the accommodating cavity 25.

[0072] As an example of one of the applications, refer to Figure 1 , Figure 2 As shown, the control mechanism 22 includes a first electromagnetic member 221 disposed on the carrier plate 21 and a second electromagnetic member 222 disposed on the sample carrier assembly 2;

[0073] When the supporting plate 21 is in the first application state, magnetic attraction is formed between the first electromagnetic member 221 and the second electromagnetic member 222 .

[0074] In some embodiments, the second electromagnetic member 222 is disposed on the inner side of the lateral baffle 24 , and the first electromagnetic member 221 is disposed on the supporting plate 21 at a position corresponding to the position of the second electromagnetic member 222 .

[0075] In some embodiments, the first electromagnetic member 221 and the second electromagnetic member 222 are both configured as electromagnets, and when the carrier plate 21 is in the first application state, the first electromagnetic member 221 and the second electromagnetic member 222 are mutually attracted. When the carrier plate 21 switches from the first application state to the second application state, the first electromagnetic member 221 and the second electromagnetic member 222 are separated from each other.

[0076] In some embodiments, the first electromagnetic member 221 can be set to a conventional magnetic metal, such as an iron block; at this time, by controlling the operation of the second electromagnetic member 222, the supporting plate 21 can be switched from the first application state to the second application state, and the overall application cost can be lower.

[0077] Through the magnetic adsorption between the first electromagnetic component 221 and the second electromagnetic component 222, the supporting plate 21 can be placed in a first application state, thereby supporting the sample to be tested; and through the adsorption and separation between the first electromagnetic component 221 and the second electromagnetic component 222, the supporting state of the sample to be tested can be released, so that the sample to be tested can fall down.

[0078] As an example of one of the applications, refer to Figure 1 , Figure 2 As shown, the control mechanism 22 includes a first electromagnetic member 221 disposed on the carrier plate 21, a second electromagnetic member 222 disposed on the sample carrier assembly 2, and a limiting rod 223 disposed on the device frame 1, and the limiting rod 223 is disposed on the movement path of the carrier plate 21;

[0079] When the carrying plate 21 is in the first application state, magnetic attraction is formed between the first electromagnetic member 221 and the second electromagnetic member 222;

[0080] The carrying plate 21 is provided with a contact portion 211 facing away from the accommodating cavity 25 . The contact portion 211 can move to contact the limiting rod 223 .

[0081] In some embodiments, the position height of the limiting rod 223 is the position height corresponding to the switching of the sample to be tested from the accelerated falling stage to the free falling stage.

[0082] In some embodiments, the middle portion of the supporting plate 21 is hinged to the bottom end of the lateral baffle 24 , one end of the supporting plate 21 can be extended into the accommodating cavity 25 , and the other end is arranged toward the outside to contact the limiting rod 223 .

[0083] Through the adsorption effect between the first electromagnetic component 221 and the second electromagnetic component 222, the supporting plate 21 can form a supporting effect on the sample to be tested; and through the collision effect between the touch portion 211 and the limit rod 223, the mutual separation between the first electromagnetic component 221 and the second electromagnetic component 222 can be promoted, thereby facilitating the falling of the sample to be tested.

[0084] As one application example, the control mechanism 22 includes a first electromagnetic member 221 disposed on the carrier plate 21, a second electromagnetic member 222 disposed on the sample carrier assembly 2, and an electromagnetic inductor disposed on the device frame 1;

[0085] When the carrying plate 21 is in the first application state, magnetic attraction is formed between the first electromagnetic member 221 and the second electromagnetic member 222;

[0086] The electromagnetic inductor is arranged on the movement path of the sample supporting component 2.

[0087] In some embodiments, the setting position of the electromagnetic sensor can refer to the limit rod 223 in the above example. At this time, the position height of the electromagnetic sensor is the position height corresponding to the switch from the accelerated fall stage to the free fall stage of the sample to be tested.

[0088] Through the adsorption between the first electromagnetic component 221 and the second electromagnetic component 222, the carrier plate 21 can form a supporting effect on the sample to be tested; and through the electromagnetic sensor, the magnetic adsorption position can be detected to control the separation node between the first electromagnetic component 221 and the second electromagnetic component 222. For example, when the sample carrier assembly 2 moves downward, the first electromagnetic component 221 and the second electromagnetic component 222 will continue to approach the electromagnetic sensor in the adsorption state. When the magnetic induction intensity of the electromagnetic sensor continues to increase and reaches a preset value, this is usually when the distance between the electromagnetic sensor and the first electromagnetic component 221 and / or the second electromagnetic component 222 is the shortest, and the electromagnetic sensor feedbacks a signal to control the first electromagnetic component 221 and the second electromagnetic component 222 to separate from each other.

[0089] As an example of one application, Figure 1 As shown, a weight sensor 212 is disposed on the carrying plate 21 .

[0090] In some embodiments, each of the supporting plates 21 is provided with the weight sensor 212 .

[0091] In some embodiments, the weight sensors 212 are arranged in pairs and are respectively located at two ends of the bottom end surface of the sample to be tested.

[0092] The weight sensor 212 can be used to detect the weight of the sample to be tested, thereby facilitating subsequent data statistics and analysis.

[0093] As an example of one of the applications, refer to Figure 1 , Figure 2 As shown, the device frame 1 includes a plurality of frame columns 11 , and at least one of the frame columns 11 is provided with a scale 111 .

[0094] In some embodiments, the device frame 1 is arranged in a rectangular structure, and in this case, four frame columns 11 are arranged and are respectively located at four corner ends of the device frame 1 .

[0095] In some embodiments, the scale 111 is arranged along the vertical direction on the outer side of one of the frame columns 11 .

[0096] The scale 111 can be used to confirm the current position of the sample supporting assembly 2 and to measure the current compression modulus of the elastic member 3, thereby facilitating the orderly conduct of the drop test and improving the test accuracy.

[0097] As an example of one of the applications, refer to Figure 1 , Figure 2 As shown, the device frame 1 is provided with a second top plate 12, the first top plate 23 is located below the second top plate 12, and a movable plate 4 is provided between the first top plate 23 and the second top plate 12;

[0098] The elastic member 3 is disposed between the movable plate 4 and the first top plate 23 and between the movable plate 4 and the second top plate 12;

[0099] The shape of the movable plate 4 matches the shape formed by the frame columns 11 .

[0100] In some embodiments, the first top plate 23 , the second top plate 12 and the movable plate 4 are arranged parallel to each other, a plurality of the elastic members 3 are arranged between the first top plate 23 and the movable plate 4 , and a plurality of the elastic members 3 are arranged between the movable plate 4 and the second top plate 12 .

[0101] In some embodiments, the movable plate 4 can be temporarily fixed to the device frame 1, for example, by bolting or setting a locking pin. When the movable plate 4 is in a relatively fixed state, the elastic force is applied by the elastic member 3 between the first top plate 23 and the movable plate 4; and when the movable plate 4 is in a relatively movable state, the elastic member 3 between the first top plate 23 and the second top plate 12 both participate in applying the elastic force.

[0102] In some embodiments, the movable plate 4 is configured to be rectangular, and the outer peripheral side surface of the movable plate 4 and the inner side surface of the frame column 11 are in sliding contact connection with each other.

[0103] By controlling the state of the movable plate 4, it is convenient to set the number of the elastic members 3 participating in the test according to actual experimental needs, which can be more flexible in use; and in the test when the movable plate 4 is in the active state, all the elastic members 3 are involved in applying the elastic force, and the elastic force is relatively large; therefore, the movable contact between the movable plate 4 and the device frame 1 can play a certain guiding role, avoiding the sample carrying assembly 2 and the sample to be tested from swaying during the descent, especially near the end stroke, thereby facilitating improving the stability and safety of the drop test.

[0104] As one application example, the edge of the movable plate 4 is set to be a smooth arc surface;

[0105] Alternatively, guide wheels are provided between the movable plate 4 and the frame column 11 .

[0106] In some embodiments, the side surface of the movable plate 4 for sliding contact with the frame column 11 is set as a smooth arc surface.

[0107] In some embodiments, guide wheels are provided on the side of the movable plate 4 for sliding contact with the frame column 11 .

[0108] By setting the edge side of the movable plate 4 to a smooth arc surface, or by setting the guide wheel on the edge side of the movable plate 4, the smoothness of the relative movement between the movable plate 4 and the frame column 11 can be improved.

[0109] As an example of one of the applications, refer to Figure 3 As shown, an elastic buffer 251 is disposed on the top of the accommodating cavity 25 .

[0110] In some embodiments, the elastic buffer 251 is configured as any one of a spring, foam, and rubber.

[0111] The elastic buffer 251 can be used to provide a pre-force for the sample to be tested, so that the state of the sample to be tested can be more stable during the downward process.

[0112] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them; although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein by equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application, and they should all be included in the scope of the claims and specification of the present application. In particular, as long as there is no structural conflict, the various technical features mentioned in the various embodiments can be combined in any way. The present application is not limited to the specific embodiments disclosed herein, but includes all technical solutions that fall within the scope of the claims.

Claims

1. A power battery drop test device, characterized in that: include: The device frame includes a plurality of frame columns, at least one of which is provided with a scale; A sample carrying assembly is disposed in the device frame so as to be movable up and down, and an elastic member is disposed between the sample carrying assembly and the device frame; the sample carrying assembly includes a plurality of carrying plates and a control mechanism; The supporting plate includes a first application state and a second application state, and the control mechanism is used to control the supporting plate to switch between the first application state and the second application state. When the supporting plate is in the first application state, a plurality of the supporting plates form a support for the sample; when the supporting plate is in the second application state, the sample is detached from the support of the supporting plate.

2. The power battery drop test device according to claim 1, characterized in that: The sample holding assembly further comprises a first top plate and a plurality of lateral baffles, wherein one end of the plurality of lateral baffles is connected to the first top plate and the other end extends downward; The carrying plate is swingably arranged on the lateral baffle plate, and a containing cavity for placing samples is formed between the carrying plate, the lateral baffle plate and the first top plate.

3. The power battery drop test device according to claim 2, characterized in that: The control mechanism includes a first electromagnetic member disposed on the carrier plate and a second electromagnetic member disposed on the sample carrier assembly; When the carrying plate is in the first application state, magnetic attraction is formed between the first electromagnetic component and the second electromagnetic component.

4. The power battery drop test device according to claim 3, characterized in that: The control mechanism comprises a limit rod arranged on the device frame, and the limit rod is arranged on the movement path of the carrying plate; The carrying plate is provided with a contact portion facing away from the accommodating cavity, and the contact portion can move to contact the limiting rod.

5. The power battery drop test device according to claim 3, characterized in that: The control mechanism includes an electromagnetic inductor disposed on the device frame; The electromagnetic inductor is arranged on the movement path of the sample supporting component.

6. The power battery drop test device according to any one of claims 3 to 5, characterized in that: A weight sensor is arranged on the carrying plate.

7. The power battery drop test device according to any one of claims 3 to 5, characterized in that: A second top plate is arranged on the device frame, the first top plate is located below the second top plate, and a movable plate is arranged between the first top plate and the second top plate; The elastic member is disposed between the movable plate and the first top plate, and between the movable plate and the second top plate; The shape of the movable plate is matched with the shape surrounded by the frame columns.

8. The power battery drop test device according to claim 7, characterized in that: The edge of the movable plate is configured as a smooth arc surface; Alternatively, guide wheels are provided between the movable plate and the frame columns.

9. The power battery drop test device according to claim 2 or 8, characterized in that: An elastic buffer is arranged on the top of the accommodating cavity.

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