Flying probe testing machine
By adopting a combined structure of upper and lower clamps in the fly needle tester, and using downforce and vacuum adsorption force, the problem of position shifting of the circuit board during the detection process is solved, and the detection accuracy is improved.
Patent Information
- Application Number
- CN202421541339.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-02
- Publication Date
- 2025-05-16
- Estimated Expiration
- 2034-07-02
AI Technical Summary
In existing flying needle test machines, the circuit board positioning fixture components cannot effectively restrict the position of the circuit board, resulting in the circuit board being easily offset in the fixture, affecting the detection accuracy.
A flying needle tester is designed, using a combined structure of upper clamp and lower clamp, and the downforce and vacuum adsorption force of upper clamp are used to ensure that the circuit board does not shift during the detection process.
Through the combined structure of the upper and lower fixtures, it is ensured that there will be no offset during the circuit board detection process, which improves the accuracy of the detection.
Smart Images

Figure CN222882799U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the field of circuit board testing equipment, in particular to a flying probe testing machine. Background Art
[0002] The flying probe test is an intelligent test device that automatically tests the circuit board to be tested by controlling the moving probe of the computer, and locates and identifies the fault of the circuit board. For example, the invention patent with application number CN202210785734.X discloses a desktop flying probe tester, which involves the field of PCB automatic testing. The tester includes a base plate, on which a group of gantry components and circuit board positioning fixture components are installed; the gantry component includes an X-axis moving component, a Y-axis moving component and a Z-axis component; the X-axis moving component includes an X-axis slide rail; the Y-axis moving component includes a Y-axis motor and two Y-axis slide rails, each Y-axis slide rail is composed of a slide rail and a transmission belt, the X-axis slide rail is vertically connected between the two Y-axis slide rails through a guide rail slider, the Z-axis component is connected to the X-axis slide rail through a guide rail slider, the Z-axis component includes a Z-axis motor, a Z-axis slide rail, a Z-axis slider and a probe bracket, and the Z-axis slide rail is vertically arranged. The circuit board positioning fixture assembly is used to clamp the circuit board and is located between the Y-axis slide rail I and the Y-axis slide rail II. Among them, the fixture assembly used to position the circuit board in this solution cannot well constrain the position of the circuit board, and the circuit board is prone to positional displacement in the fixture, affecting the accuracy of detection. Utility Model Content
[0003] The utility model aims to solve at least one of the technical problems existing in the prior art. To this end, the utility model provides a flying probe tester, which can ensure that no deviation occurs during the circuit board detection process and improve the accuracy.
[0004] According to the flying probe tester of the first aspect embodiment of the utility model, it includes a frame, a lower fixture, an upper fixture and a test mechanism, the frame is provided with a through slot, and vertical slide rails are provided on both sides of the slot; the lower fixture is fixed on the frame and is located at the bottom of the slot, and the upper edge of the lower fixture is provided with a lower clamping groove; the two ends of the upper fixture are respectively slidably connected with the two vertical slide rails, the upper fixture is arranged above the lower fixture, the lower edge of the upper fixture is provided with an upper clamping groove, the lower clamping groove and the upper clamping groove are arranged correspondingly, and the bottom of the upper clamping groove is provided with an adsorption hole, the adsorption hole is connected to the exhaust air path built into the upper fixture, the other end of the exhaust air path passes through the side wall of the upper fixture, and is connected to a pipe joint, and the pipe joint is connected to a vacuum pump; the test mechanism is movably connected to the frame, the test mechanism is provided with a test needle, and the test mechanism can move on the frame so that the test needle can move arbitrarily in the area between the upper fixture and the lower fixture.
[0005] The flying probe tester according to the embodiment of the utility model has at least the following beneficial effects: utilizing the downward pressure of the upper clamp in combination with the vacuum adsorption force provided inside the upper clamp groove to ensure that the circuit board will not deviate during the detection process, thereby improving accuracy.
[0006] According to some embodiments of the utility model, two moving mechanisms are provided on both sides of the frame, and four testing mechanisms are provided. The four testing mechanisms are fixedly connected to the moving mechanism and are driven to move by the moving mechanism.
[0007] According to some embodiments of the present utility model, the moving mechanism comprises:
[0008] A transverse guide rail fixedly connected to the upper side and the lower side of the frame, wherein the transverse guide rail is slidably connected to a slider;
[0009] A vertical guide rail has one end fixedly connected to the slider located on the upper side of the frame, and the other end fixedly connected to the slider located on the lower side of the frame. A moving part is slidably connected to the vertical guide rail, and the testing mechanism is fixedly connected to the moving part.
[0010] According to some embodiments of the utility model, an electric drive screw mechanism is provided on the vertical guide rail, and the electric drive screw mechanism cooperates with the moving part to drive the moving part to slide along the vertical guide rail.
[0011] According to some embodiments of the present invention, a plurality of the adsorption holes are provided, and the plurality of the adsorption holes are arranged at intervals along the length direction of the upper clamp.
[0012] According to some embodiments of the utility model, the exhaust gas circuit includes a main gas circuit and multiple branch gas circuits, one end of the branch gas circuit is connected to the main gas circuit, and the other end is connected to the adsorption hole, and the main gas circuit is connected to the pipeline joint.
[0013] According to some embodiments of the present invention, the interiors of the upper clamping groove and the lower clamping groove are covered with wear-resistant pads.
[0014] Additional aspects and advantages of the present invention will be given in part in the following description, and in part will become apparent from the following description, or will be learned through the practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] The present invention is further described below with reference to the accompanying drawings and embodiments, wherein:
[0016] Figure 1 A schematic diagram of a flying probe tester according to an embodiment of the present utility model;
[0017] Figure 2 for Figure 1An enlarged schematic diagram of section A is shown;
[0018] Figure 3 It is a cross-sectional schematic diagram of an upper fixture of a flying probe tester according to an embodiment of the utility model.
[0019] 100, rack; 110, slot; 120, vertical slide rail;
[0020] 200, lower clamp; 210, lower clamping groove;
[0021] 300, upper fixture; 310, upper clamping groove; 320, air extraction gas path; 321, main gas path; 322, branch gas path; 330, pipeline joint; 340, adsorption hole;
[0022] 400, testing mechanism; 410, testing needle;
[0023] 510, transverse guide rail; 520, vertical guide rail; 521, moving part; 522, electric drive screw mechanism;
[0024] 600, wear-resistant pad; DETAILED DESCRIPTION
[0025] The embodiments of the present invention are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.
[0026] In the description of the present invention, it should be understood that descriptions involving orientation, such as up, down, front, back, left, right, etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.
[0027] In the description of the present utility model, "several" means one or more, "more" means more than two, "greater than", "less than", "exceed" etc. are understood to exclude the number itself, and "above", "below", "within" etc. are understood to include the number itself. If there is a description of "first" or "second", it is only used for the purpose of distinguishing the technical features, and cannot be understood as indicating or implying the relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features.
[0028] In the description of the present invention, unless otherwise clearly defined, terms such as setting, installing, connecting, etc. should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meanings of the above terms in the present invention based on the specific content of the technical solution.
[0029] Reference Figures 1 to 3 The flying probe tester of the utility model embodiment includes a frame 100, a lower fixture 200, an upper fixture 300 and a test mechanism 400. The frame 100 is provided with a through slot 110 inside, and vertical slide rails 120 are provided on both sides of the slot 110; the lower fixture 200 is fixed on the frame 100 and is located at the bottom of the slot 110, and a lower clamping groove 210 is provided on the upper side edge of the lower fixture 200; the two ends of the upper fixture 300 are respectively slidably connected with the two vertical slide rails 120, the upper fixture 300 is arranged above the lower fixture 200, and the lower side edge of the upper fixture 300 is provided with an upper clamping groove 310, and the lower fixture The groove 210 and the upper clamp groove 310 are arranged correspondingly, and an adsorption hole 340 is arranged at the bottom of the upper clamp groove 310, and the adsorption hole 340 is connected to the exhaust air path 320 built into the upper clamp 300. The other end of the exhaust air path 320 passes through the side wall of the upper clamp 300 and is connected to a pipe joint 330, and the pipe joint 330 is connected to a vacuum pump; the test mechanism 400 is movably connected to the frame 100, and the test mechanism 400 is provided with a test needle 410. The test mechanism 400 can move on the frame 100 so that the test needle 410 can move arbitrarily in the area between the upper clamp 300 and the lower clamp 200.
[0030] In actual use, the test needle 410 on the test mechanism 400 is used to electrically connect with the detection contacts in various areas on the surface of the circuit board, and to perform a flying probe test, wherein the circuit board is placed in the lower clamping groove 210 of the lower clamp 200 for preliminary position constraint, and then the upper clamp 300 is slid down, and the upper edge of the circuit board is embedded in the upper clamping groove 310, and the circuit board is fixed with the lower clamping groove 210, and then the vacuum pump is started, and the upper edge of the circuit board is adsorbed and fixed through the vacuum air path 320 and the adsorption hole 340, and at the same time, the upper clamp 300 is continuously slid down so that the lower edge of the circuit board abuts against the bottom of the lower clamping groove 210, and finally, the test mechanism 400 is moved to make the test needle 410 reach any position of the circuit board, and the circuit board is tested. The specific testing process belongs to the common technology of technicians in this field and will not be elaborated here.
[0031] In summary, by utilizing the downward pressure of the upper clamp 300 and the vacuum adsorption force provided inside the upper clamping groove 310 , it is ensured that the circuit board will not be deviated during the detection process, thereby improving the accuracy.
[0032] Preferably, two moving mechanisms are provided on both sides of the rack 100, and four test mechanisms 400 are provided. The four test mechanisms 400 are all fixedly connected to the moving mechanism, and the moving mechanism drives the test mechanisms 400 to move. Two test mechanisms 400 are provided on both sides of the circuit board, respectively, so as to perform a comprehensive inspection on the circuit board.
[0033] Specifically, the moving mechanism includes a transverse guide rail 510 and a vertical guide rail 520. The transverse guide rail 510 is fixedly connected to the upper and lower sides of the rack 100, and a slider is slidably connected to the transverse guide rail 510; one end of the vertical guide rail 520 is fixedly connected to the slider located on the upper side of the rack 100, and the other end is fixedly connected to the slider located on the lower side of the rack 100; the vertical guide rail 520 is slidably connected to a moving member 521, and the test mechanism 400 is fixedly connected to the moving member 521. The vertical guide rail 520 slides on the transverse guide rail 510 to indirectly drive the test mechanism 400 to reciprocate along the transverse guide rail 510, and the test mechanism 400 can directly slide on the vertical guide rail 520, so that the test mechanism 400 can drive the test needle 410 to reach any position of the circuit board.
[0034] It should be mentioned that an electric drive screw mechanism 522 is provided on the vertical guide rail 520 , and the electric drive screw mechanism 522 cooperates with the moving member 521 to drive the moving member 521 to slide along the vertical guide rail 520 .
[0035] In some embodiments, a plurality of adsorption holes 340 are provided, and the plurality of adsorption holes 340 are arranged at intervals along the length direction of the upper fixture 300. The edges of the entire circuit board are matched, and the circuit board is tightly adsorbed from various positions of the circuit board.
[0036] In some embodiments, the exhaust gas circuit 320 includes a main gas circuit 321 and a plurality of branch gas circuits 322. One end of the branch gas circuit 322 is connected to the main gas circuit 321, and the other end is connected to the adsorption hole 340. The main gas circuit 321 is connected to the pipeline joint 330. A single vacuum pump can be used to achieve adsorption of the circuit board, reducing the cost of equipment replacement.
[0037] In order to avoid scratching the surface of the circuit board, the interior of the upper clamping groove 310 and the lower clamping groove 210 are covered with wear-resistant pads 600.
[0038] The embodiments of the present invention are described in detail above in conjunction with the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made within the knowledge scope of ordinary technicians in the relevant technical field without departing from the purpose of the present invention.
Claims
1. A flying probe tester, characterized in that: include: A rack (100) is provided with a through slot (110) inside, and vertical slide rails (120) are provided on both sides of the slot (110); A lower clamp (200) is fixed on the frame (100) and is located at the bottom of the slot (110), and a lower clamping groove (210) is provided on the upper edge of the lower clamp (200); The upper clamp (300) has two ends respectively connected to the two vertical slide rails (120) for sliding movement. The upper clamp (300) is arranged above the lower clamp (200). An upper clamp groove (310) is arranged at the lower edge of the upper clamp (300). The lower clamp groove (210) and the upper clamp groove (310) are arranged correspondingly. A suction hole (340) is arranged at the bottom of the upper clamp groove (310). The suction hole (340) is connected to an exhaust gas path (320) built into the upper clamp (300). The other end of the exhaust gas path (320) passes through the side wall of the upper clamp (300) and is connected to a pipe joint (330). The pipe joint (330) is connected to a vacuum pump. A testing mechanism (400) is movably connected to the frame (100), and the testing mechanism (400) is provided with a testing needle (410). The testing mechanism (400) can move on the frame (100) so that the testing needle (410) can move arbitrarily in the area between the upper clamp (300) and the lower clamp (200).
2. The flying probe tester according to claim 1, characterized in that: Two moving mechanisms are provided on both sides of the frame (100), four testing mechanisms (400) are provided, and the four testing mechanisms (400) are all fixedly connected to the moving mechanism, and the moving mechanism drives the testing mechanisms (400) to move.
3. The flying probe tester according to claim 2, characterized in that: The moving mechanism comprises: A transverse guide rail (510) fixedly connected to the upper side and the lower side of the frame (100), wherein the transverse guide rail (510) is slidably connected to a slider; A vertical guide rail (520) has one end fixedly connected to the slider located on the upper side of the frame (100), and the other end fixedly connected to the slider located on the lower side of the frame (100); a moving part (521) is slidably connected to the vertical guide rail (520); and the testing mechanism (400) is fixedly connected to the moving part (521).
4. The flying probe tester according to claim 3, characterized in that: An electric drive screw mechanism (522) is provided on the vertical guide rail (520), and the electric drive screw mechanism (522) cooperates with the moving member (521) to drive the moving member (521) to slide along the vertical guide rail (520).
5. The flying probe tester according to claim 1, characterized in that: A plurality of the adsorption holes (340) are provided, and the plurality of the adsorption holes (340) are arranged in an interval arrangement along the length direction of the upper clamp (300).
6. The flying probe tester according to claim 5, characterized in that: The exhaust gas path (320) comprises a main gas path (321) and a plurality of branch gas paths (322); one end of the branch gas path (322) is connected to the main gas path (321), and the other end is connected to the adsorption hole (340); the main gas path (321) is connected to the pipeline joint (330).
7. The flying probe tester according to claim 1, characterized in that: The interiors of the upper clamping groove (310) and the lower clamping groove (210) are both covered with wear-resistant pads (600).
Citation Information
Patent Citations
A desktop flying probe tester
CN114839516B