Circuit board for testing hard disk
By adding a conversion circuit board to the hard disk test circuit board, the problem of high replacement cost due to frequent plug-in and unplugging wear of the hard disk test circuit board is solved, and the entire circuit board needs to be replaced due to damage to a single test slot is reduced, achieving lower test material costs and longer service life.
Patent Information
- Application Number
- CN202421683833.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-15
- Publication Date
- 2025-05-23
- Estimated Expiration
- 2034-07-15
AI Technical Summary
Existing hard disk test circuit boards wear out due to frequent plugging and unplugging of hard disks, resulting in high replacement costs, and when a test slot is damaged, the entire circuit board needs to be replaced.
A circuit board for hard disk testing is designed. By adding a conversion circuit board to the test circuit board, the conversion circuit board is plugged into the test slot of the test circuit board through a gold finger, and a second test slot is provided thereon for plugging the hard disk. When the second test slot is worn, you only need to replace the conversion circuit board without changing the test circuit board.
Reduces the material cost of hard disk testing, avoids the need to replace the entire circuit board due to damage to a single test slot, and reduces wear on the conversion circuit board through the design of glue columns and pads.
Smart Images
Figure CN222896544U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of electronic testing technology, and in particular to a circuit board for hard disk testing. Background Art
[0002] In the SSD (solid state drive) test scenario, a test circuit board is usually used. The main function of this test circuit board is to provide a standardized test platform for connecting and testing the performance and stability of the SSD hard drive. There are usually multiple test slots and conversion interfaces on the test circuit board. The test circuit board is connected to the test system through the conversion interface, and the SSD hard drive is plugged into the test circuit board through the test slot. The test circuit board can connect the SSD hard drive to the test system for various performance tests.
[0003] The test slots on the test circuit board are worn out due to frequent plugging and unplugging of SSD hard drives. When the wear is severe enough, the test circuit board needs to be replaced, and the replacement cost is high. Utility Model Content
[0004] In order to solve the technical problem of high replacement cost of a test circuit board, the present application provides a circuit board for hard disk testing.
[0005] The technical solution provided by the present application is as follows: a circuit board for hard disk testing, comprising a test circuit board, a first test slot being provided on the test circuit board, and a conversion circuit board, one end of the conversion circuit board being provided with a gold finger, and being plugged into the first test slot through the gold finger, the other end of the conversion circuit board being fixed to the test circuit board by screws, and a second test slot being provided on the conversion circuit board for plugging in the hard disk to be tested.
[0006] By adopting the above technical scheme, the hard disk test circuit board of the present application adds a conversion circuit board on the basis of the original test circuit board. The conversion circuit board is plugged into the first test slot of the test circuit board through a gold finger to realize the electrical connection between the conversion circuit board and the test circuit board. During the test process, the hard disk is plugged into the second test slot on the conversion circuit board. When the second test slot is worn to a certain extent due to frequent plugging and unplugging of the hard disk, the conversion circuit board is replaced instead of the test circuit board. Since the circuit on the conversion circuit board is simple and has few electronic components, the cost is very low, thereby reducing the cost of test materials. In addition, in the prior art, if one test slot of the test circuit board is damaged, the entire test circuit board must be replaced. In the present application, the conversion circuit board that is damaged is replaced, further reducing the cost of test materials.
[0007] Optionally, a first through hole is provided in the middle of the conversion circuit board for fixing a rubber column, a first annular groove is provided in the lower part of the rubber column, a rubber pad is formed below the first annular groove, the thickness of the rubber pad is equal to or slightly greater than the thickness of the conversion circuit board, and the conversion circuit board is inserted into the first annular groove.
[0008] By adopting the above technical solution, the two ends of the conversion circuit board of the present application are fixed, and the middle part is in a suspended state. When plugging and unplugging the hard disk, the conversion circuit board will be pressed down and bent and deformed. Since the rear end is fixed by screws, the front end will retreat a small distance, so that the gold finger of the conversion circuit board will still wear against the first test slot, affecting the service life of the first test slot. To this end, the glue column of the present application can not only limit the hard disk during the test to prevent the hard disk from retreating, but also make full use of the rubber pad under the glue column to support the middle part of the conversion circuit board, greatly reducing the degree of bending of the conversion circuit board when it is pressed down, thereby reducing the wear between the gold finger of the conversion circuit board and the first test slot, and reducing the adverse effects of adding a conversion circuit board.
[0009] Optionally, a second annular groove is provided above the first annular groove of the rubber column to increase the flexibility of the root of the rubber column.
[0010] By adopting the above technical solution, when inserting a hard disk onto the conversion circuit board, it is necessary to manually bend the glue column so that the hard disk can be smoothly inserted into the second test slot. After inserting the hard disk, loosen the glue column and the glue column will return to its original position, thereby limiting the hard disk and preventing the hard disk from retreating. Due to the existence of the first annular groove, the contact portion between the glue column and the conversion circuit board is most susceptible to wear and tear, resulting in breakage. The present application sets a second annular groove above the first annular groove of the glue column, which can increase the flexibility of the root of the glue column. The bending of the glue column mainly occurs at the second annular groove, and the second annular groove does not contact the conversion circuit board, so it is not easy to wear, which can greatly increase the service life of the glue column.
[0011] Optionally, the conversion circuit board is provided with a plurality of first through holes, and the distances between the plurality of first through holes and the second test slots are different. When the glue column is inserted into different first through holes, hard disks to be tested of different sizes can be fixed.
[0012] By adopting the above technical solution, the conversion circuit board of the present application can test hard disks of different sizes to be tested. As long as the glue column is inserted into the corresponding first through hole, the glue column can limit the hard disk.
[0013] Optionally, the first through hole on the conversion circuit board is composed of a circular hole and an inclined waist-shaped hole, the diameter of the circular hole is larger than the diameter of the glue column, and the width of the waist-shaped hole matches the size of the first annular groove.
[0014] By adopting the above technical solution, the rubber column can be easily inserted into the round hole, and then moved laterally into the waist-shaped hole. The waist-shaped hole clamps the rubber column to prevent the rubber column from falling out, thereby achieving the purpose of fixing the rubber column.
[0015] Optionally, there are multiple conversion circuit boards, which are arranged in a parallel array on the test circuit board.
[0016] By adopting the above technical solution, each conversion circuit board can be plugged into one hard disk, and multiple conversion circuit boards can be plugged into multiple hard disks, thereby improving test efficiency.
[0017] Optionally, a plurality of nuts are embedded on the test circuit board to fix the screws.
[0018] By adopting the above technical solution, since the conversion circuit board needs to be replaced frequently, and the strength of the test circuit board is average, the screws are prone to stripping. Therefore, the present application embeds multiple nuts on the test circuit board, and the nuts have good strength and are not prone to stripping.
[0019] Optionally, the test circuit board is provided with a plurality of second through holes for fixing glue columns, and the plurality of second through holes are at different distances from the first test slot. When the glue columns are inserted into different second through holes, hard disks to be tested of different sizes can be fixed.
[0020] By adopting the above technical solution, the test circuit board of the present application can also be used alone. Without installing the conversion circuit board, it is only necessary to insert the hard disk to be tested into the first test slot. A second through hole is set on the test circuit board to fix the glue column, and the glue column is used to limit the hard disk to prevent the hard disk from moving backward.
[0021] In summary, the present application includes at least one of the following beneficial technical effects:
[0022] 1. During the test process of this application, the hard disk is plugged into the second test slot on the conversion circuit board. When the second test slot is worn to a certain extent due to frequent plugging and unplugging of the hard disk, the conversion circuit board is replaced instead of the test circuit board. Since the circuit on the conversion circuit board is simple and has few electronic components, the cost is very low, thereby reducing the cost of test materials.
[0023] 2. In the prior art, if one test slot of a test circuit board is damaged, the entire test circuit board must be replaced. In the present application, only the damaged conversion circuit board is replaced, which further reduces the test material cost;
[0024] 3. The glue column of the present application can not only limit the hard disk during the test to prevent the hard disk from moving backward, but also support the middle part of the conversion circuit board, greatly reducing the degree of bending of the conversion circuit board when it is pressed down, thereby reducing the wear between the gold fingers of the conversion circuit board and the first test slot, and reducing the adverse effects of adding a conversion circuit board. BRIEF DESCRIPTION OF THE DRAWINGS
[0025] Figure 1 is a three-dimensional diagram of a circuit board for hard disk testing according to an embodiment of the present application;
[0026] Figure 2 This is a three-dimensional diagram of the hard disk test circuit board of the embodiment of the present application from another angle;
[0027] Figure 3 It is an exploded schematic diagram of a circuit board for hard disk testing according to an embodiment of the present application;
[0028] Figure 4 yes Figure 3 Enlarged view of point A in the middle.
[0029] Explanation of the reference numerals: 1. test circuit board; 11. first test slot; 12. second through hole; 13. nut; 2. conversion circuit board; 21. gold finger; 22. screw; 23. second test slot; 24. hard disk; 25. first through hole; 3. glue column; 31. first annular groove; 32. glue pad; 33. second annular groove. DETAILED DESCRIPTION
[0030] The following is combined with Figure 1-Figure 4 This application is described in further detail.
[0031] Reference Figures 1 to 3 The embodiment of the present application discloses a circuit board for testing a hard disk, comprising a test circuit board 1, on which a first test slot 11 and a plurality of second through holes 12 for fixing a glue column 3 are provided, and a plurality of nuts 13 are inlaid on the test circuit board 1 for fixing a screw 22, and the plurality of second through holes 12 are at different distances from the first test slot 11, and when the glue column 3 is inserted into different second through holes 12, hard disks 24 to be tested of different sizes can be fixed. The circuit board for testing a hard disk also comprises a plurality of conversion circuit boards 2 arranged in a parallel array on the test circuit board 1, and a gold finger 21 and a second test slot 23 for inserting a hard disk 24 to be tested are provided at one end of the conversion circuit board 2, and a plurality of first through holes 25 for fixing the glue column 3 are provided in the middle, and the plurality of first through holes 25 are at different distances from the second test slot 23, and when the glue column 3 is inserted into different first through holes 25, hard disks 24 to be tested of different sizes can be fixed, and the conversion circuit board 2 is plugged into the first test slot 11 through the gold finger 21, and the other end is fixed to the test circuit board 1 through the screw 22.
[0032] refer to Figure 3 and Figure 4The lower part of the glue column 3 is provided with a first annular groove 31, and the conversion circuit board 2 is inserted into the first annular groove 31. A second annular groove 33 is provided above the first annular groove 31 to increase the flexibility of the root of the glue column 3. A rubber pad 32 is formed below the first annular groove 31, and the thickness of the rubber pad 32 is equal to or slightly greater than the thickness of the conversion circuit board 2. The glue column 3 can not only limit the hard disk 24 during the test to prevent the hard disk 24 from retreating, but also make full use of the rubber pad 32 below the glue column 3 to support the middle part of the conversion circuit board 2, greatly reducing the bending degree of the conversion circuit board 2 when it is pressed down, thereby reducing the wear between the gold finger 21 of the conversion circuit board 2 and the first test slot 11, and reducing the adverse effects of adding the conversion circuit board 2.
[0033] refer to Figure 3 The first through hole 25 on the conversion circuit board 2 is composed of a circular hole and an inclined waist-shaped hole. The diameter of the circular hole is larger than the diameter of the rubber column 3, and the width of the waist-shaped hole matches the size of the first annular cut groove 31. The rubber column 3 can be easily inserted into the circular hole, and then moved laterally into the waist-shaped hole. The waist-shaped hole clamps the rubber column 3, which can prevent the rubber column 3 from falling out, thereby achieving the purpose of fixing the rubber column 3.
[0034] The implementation principle of the hard disk test circuit board described in the present application is as follows: the hard disk test circuit board of the present application is provided with a conversion circuit board 2 on the basis of the original test circuit board 1, and the conversion circuit board 2 is plugged into the first test slot 11 of the test circuit board 1 through the gold finger 21 to realize the electrical connection between the conversion circuit board 2 and the test circuit board 1. During the test process, the hard disk 24 is plugged into the second test slot 23 on the conversion circuit board 2. When the second test slot 23 is worn to a certain extent due to frequent plugging and unplugging of the hard disk 24, the conversion circuit board 2 is replaced without replacing the test circuit board 1. Since the circuit on the conversion circuit board 2 is simple and there are few electronic components, the cost is very low, thereby reducing the cost of test materials. In addition, in the prior art, if one test slot of the test circuit board 1 is damaged, the entire test circuit board 1 must be replaced. In the present application, the conversion circuit board 2 that is damaged is replaced, further reducing the cost of test materials.
[0035] The above are all preferred embodiments of the present application, and the protection scope of the present application is not limited thereto. Therefore, any equivalent changes made according to the structure, shape, and principle of the present application should be included in the protection scope of the present application.
Claims
1. A circuit board for hard disk testing, comprising a test circuit board (1), wherein the test circuit board (1) is provided with a first test slot (11), characterized in that: It also comprises a conversion circuit board (2), one end of the conversion circuit board (2) being provided with a gold finger (21) and being plugged into a first test slot (11) via the gold finger (21), the other end of the conversion circuit board (2) being fixed to the test circuit board (1) via a screw (22), and a second test slot (23) being provided on the conversion circuit board (2) for plugging in a hard disk (24) to be tested.
2. The hard disk test circuit board according to claim 1, characterized in that: A first through hole (25) is provided in the middle of the conversion circuit board (2) for fixing the rubber column (3); a first annular groove (31) is provided at the lower part of the rubber column (3); a rubber pad (32) is formed below the first annular groove (31); the thickness of the rubber pad (32) is equal to or slightly greater than the thickness of the conversion circuit board (2); and the conversion circuit board (2) is inserted into the first annular groove (31).
3. The hard disk test circuit board according to claim 2, characterized in that: A second annular groove (33) is provided above the first annular groove (31) of the rubber column (3) for increasing the flexibility of the root of the rubber column (3).
4. The hard disk test circuit board according to claim 2, characterized in that: The conversion circuit board (2) is provided with a plurality of first through holes (25), and the plurality of first through holes (25) are at different distances from the second test slot (23). When the glue column (3) is inserted into different first through holes (25), hard disks (24) to be tested of different sizes can be fixed.
5. The hard disk test circuit board according to claim 4, characterized in that: The first through hole (25) on the conversion circuit board (2) is composed of a circular hole and an inclined waist-shaped hole, the diameter of the circular hole is larger than the diameter of the rubber column (3), and the width of the waist-shaped hole matches the size of the first annular groove (31).
6. The hard disk test circuit board according to any one of claims 1 to 5, characterized in that: The conversion circuit boards (2) are multiple in number and are arranged in a parallel array on the test circuit board (1).
7. The hard disk test circuit board according to claim 6, characterized in that: The test circuit board (1) is inlaid with a plurality of nuts (13) for fixing the screws (22).
8. The hard disk test circuit board according to claim 7, characterized in that: The test circuit board (1) is provided with a plurality of second through holes (12) for fixing the glue column (3); the plurality of second through holes (12) are at different distances from the first test slot (11); when the glue column (3) is inserted into different second through holes (12), hard disks (24) to be tested of different sizes can be fixed.