Integrated probe structure

Abstract

The utility model discloses an integrated probe structure comprising a probe body which comprises an installation section, and a test end and a connection end which are respectively arranged at two ends of the installation section; an insulating layer is arranged on the outer surface of the mounting section; the test end is a needle end and is used for connecting the detection end; the connecting end is a round end and is used for connecting the system end; the mounting sleeve is arranged outside the structure formed by the at least two probe bodies in a sleeving manner, and insulating filling structures are arranged among the probe bodies; the mounting section is located in the mounting sleeve, and the testing end and the connecting end extend out of the mounting sleeve. According to the integrated probe structure designed by the utility model, the probe body is integrated in the mounting sleeve for use, so that the strength of the probe structure is increased, the rigidity is enhanced, and the service life of the probe body is prolonged; and meanwhile, the machining difficulty of the mounting hole in the corresponding jig is reduced, the number of drilled holes is reduced, the machining efficiency is improved, the diameter of the mounting hole can be machined relatively larger, and the machining precision can be improved conveniently.

Description

Technical Field

[0001] The utility model belongs to the technical field of probe development, and in particular relates to an integrated probe structure. Background Art

[0002] At present, the diameter of traditional probes is usually around 0.05mm. Before using the probe to test the PCB board, it is necessary to first make a fixture, drill the corresponding mounting holes on the fixture, and then install the probe into the mounting holes before testing.

[0003] Since the probe diameter is small and the number of mounting holes to be processed corresponds to the number of probes required for the test, in order to ensure that the probe can detect the PAD point of the PCB, the processing distance between the mounting holes is very close, which makes it difficult to process the mounting holes on the fixture and requires high processing accuracy; in order to process qualified mounting holes, it is necessary to use expensive Japanese or German drilling rigs to process the fixture, resulting in high processing costs; and when installing traditional probes, the installation requirements for the staff are high. If the installation is not in place, the probe is easy to move when testing the PAD point of the PCB, resulting in inaccurate test results. In addition, the traditional probe is not rigid enough, resulting in few uses and a short life. Therefore, an integrated probe structure is designed to solve the above problems.

[0004] It should be noted that the above introduction to the technical background is only for the convenience of providing a clear and complete description of the technical solutions of the utility model and for the convenience of understanding by those skilled in the art. It cannot be considered that the above technical solutions are well known to those skilled in the art simply because these solutions are described in the background technology section of the utility model. Utility Model Content

[0005] In order to overcome the above-mentioned deficiencies in the prior art, the purpose of the present utility model is to provide an integrated probe structure.

[0006] In order to achieve the above objectives and other related objectives, the technical solution provided by the utility model is: an integrated probe structure, comprising:

[0007] The probe body comprises a mounting section and a test end and a connection end respectively arranged at two ends thereof; the outer surface of the mounting section is provided with an insulating layer; the test end is a needle end for connecting to the detection end; the connection end is a round end for connecting to the system end;

[0008] An installation sleeve, wherein the installation sleeve is sleeved on the outside of at least two of the probe body structures, and an insulating filling structure is provided between the probe bodies; an insulating coating is provided on the outer surface of the installation sleeve;

[0009] The installation section is located inside the installation sleeve, and the test end and the connection end are both arranged to extend out of the installation sleeve.

[0010] In this solution, the probe body is integrated into the mounting sleeve for use, which increases the strength of the probe structure, enhances the rigidity, and extends the service life of the probe body; at the same time, it reduces the processing of the mounting holes on the corresponding fixture, reduces the number of drilling holes, improves efficiency, and also allows the diameter of the mounting holes to be processed larger, thereby improving processing accuracy.

[0011] Furthermore, the center line of the mounting sleeve is arranged parallel to the center line of the probe body. In this solution, the straightness of the integrated probe structure is ensured so that it can be better mounted with the corresponding mounting hole on the fixture.

[0012] Furthermore, the two ends of each probe body are arranged flush. In this solution, the two ends of each probe body are arranged flush, so that the test end and the connection end of each probe body can be connected stably to ensure the test accuracy.

[0013] Furthermore, the connecting end extends out of the installation sleeve by a length of 0.8 mm to 1.2 mm. In this solution, the connecting end extends out by a length of 0.8 mm, 1 mm or 1.2 mm, preferably 1 mm, to facilitate docking of the connecting end with the test system end.

[0014] Furthermore, the length of the test end extending from the mounting sleeve is 0.8 mm to 1.2 mm. In this solution, the test end extends by 0.8 mm, 1 mm or 1.2 mm, preferably 1 mm, so that the test end can be easily connected to the position to be tested.

[0015] Furthermore, the distance between the center lines of the probe bodies is 0.07 mm to 0.09 mm. In this embodiment, the distance between the probe bodies is 0.07 mm, 0.08 mm or 0.09 mm, with 0.08 mm being preferred, so as to facilitate the filling of the insulating filling structure between the probe bodies. The insulating filling structure with sufficient volume can make the integrated probe structure obtain higher rigidity and extend the service life of the probe.

[0016] Furthermore, the insulating filling structure is made of a hard insulating material. In this solution, the use of hardened insulating material filling can ensure the stability of the connection structure between the probe bodies, so that the probe bodies remain parallel, prevent the probe bodies from bending, facilitate installation corresponding to the mounting holes on the fixture, and extend the service life of the probe structure.

[0017] Furthermore, the material of the mounting sleeve is an alloy material. In this solution, the mounting sleeve is made of an alloy material, which ensures the hardness of the mounting sleeve, so that the integrated probe structure inside the mounting sleeve maintains structural stability and prolongs the service life; it is also convenient to install it corresponding to the mounting hole on the fixture.

[0018] Due to the application of the above technical solution, the utility model has the following beneficial effects compared with the prior art:

[0019] The integrated probe structure designed by the utility model integrates the probe body into the installation sleeve for use, so that the strength of the probe structure is increased, the rigidity is enhanced, and the service life of the probe body is extended; at the same time, the processing difficulty of the mounting holes on the corresponding fixture is reduced, the number of drilling holes is reduced, the fixture production is simpler and more convenient, and the scrap rate is low; moreover, the installation difficulty is reduced, the installation requirements for personnel are low, the requirements for equipment for fixture production are also reduced, and the overall processing cost is reduced; in addition, the diameter of the mounting hole can be processed relatively larger, which is convenient for improving the processing accuracy, and the integrated probe is accurate for testing the PAD point of the PCB without displacement, and the rigidity and service life of the test PCB are greatly improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 This is a schematic diagram of the integrated probe structure of the utility model;

[0021] Figure 2 This is a schematic diagram of the probe body structure of the utility model;

[0022] Figure 3 This is a schematic diagram of an application scenario of the integrated probe structure of the utility model;

[0023] In the above drawings, 1. probe body; 11. mounting section; 12. test end; 13. connection end; 2. mounting sleeve; 3. insulating filling structure; 4. fixture. DETAILED DESCRIPTION

[0024] The following is a description of the implementation of the present invention by means of specific embodiments. People familiar with the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification.

[0025] It should be noted that in the description of the present utility model, it should be noted that the terms "center", "up", "down", "left", "right", "vertical", "horizontal", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, or the positions or positional relationships in which the utility model product is usually placed when in use, which are only for the convenience of describing the present utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present utility model. In addition, the terms "first", "second", "third" and the like are only used to distinguish the description, and cannot be understood as indicating or implying relative importance. Terms such as "horizontal", "vertical", and "overhanging" do not mean that the components are required to be absolutely horizontal or overhanging, but can be slightly tilted. For example, "horizontal" only means that its direction is more horizontal than "vertical", and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0026] In the description of the present invention, it is also necessary to explain that, unless otherwise clearly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection, it can be a mechanical connection, it can be an electrical connection, it can be a direct connection, it can be indirectly connected through an intermediate medium, and it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0027] In the description of the present application, it should be understood that the directions or positional relationships indicated by directional words such as "front, back, up, down, left, right", "lateral, vertical, perpendicular, horizontal" and "top, bottom" are usually based on the directions or positional relationships shown in the drawings, and are only for the convenience of describing the present application and simplifying the description. Unless otherwise specified, these directional words do not indicate or imply that the device or element referred to must have a specific direction or be constructed and operated in a specific direction, and therefore cannot be understood as limiting the scope of protection of the present application; the directional words "inside and outside" refer to the inside and outside relative to the contours of each component itself.

[0028] The preferred embodiments of the present invention are described in detail below in conjunction with the accompanying drawings so that the advantages and features of the present invention can be more easily understood by those skilled in the art, thereby making a clearer and more definite definition of the protection scope of the present invention.

[0029] Embodiment 1: See attached Figure 1 and attached Figure 2 As shown, this embodiment provides an integrated probe structure, including:

[0030] The probe body 1 includes a mounting section 11 and a test end 12 and a connection end 13 respectively arranged at two ends thereof; the outer surface of the mounting section 11 is provided with an insulating layer; the test end 12 is a needle end for connecting to the detection end; the connection end 13 is a round end for connecting to the system end;

[0031] The installation sleeve 2 is sleeved on the outside of the structure composed of at least two probe bodies 1, and an insulating filling structure 3 is arranged between each probe body 1; an insulating coating is arranged on the outer surface of the installation sleeve 2;

[0032] The installation section 11 is located inside the installation sleeve 2 , and the test end 12 and the connection end 13 are both extended out of the installation sleeve 2 .

[0033] In this embodiment, as shown in the attached Figure 3 As shown, the probe body 1 is integrated into the mounting sleeve 2 for use, so that the strength of the probe structure is increased, the rigidity is enhanced, and the service life of the probe body 1 is extended; at the same time, the processing difficulty of the mounting holes on the corresponding fixture 4 is reduced, the number of drilling holes is reduced, and the processing efficiency is improved. The diameter of the mounting hole can be processed relatively larger, which is convenient for improving the processing accuracy.

[0034] Embodiment 2: See attached Figure 1 As shown, this embodiment is a further improvement on the basis of the first embodiment, and its specific method is: the center line of the mounting sleeve 2 is arranged parallel to the center line of the probe body 1. In this embodiment, the straightness of the integrated probe structure is ensured so that it can be better installed with the corresponding mounting hole on the fixture 4.

[0035] Embodiment 3: See attached Figure 1 As shown, this embodiment is a further improvement on the basis of the first embodiment, and its specific method is: the two ends of each probe body 1 are arranged flush. In this embodiment, the two ends of each probe are flush, so that the test end 12 and the connection end 13 of each probe body 1 can be connected stably to ensure the test accuracy.

[0036] Embodiment 4: See attached Figure 1 As shown, this embodiment is a further improvement on the basis of the first embodiment, and its specific method is: the length of the connection end 13 extending out of the installation sleeve 2 is 0.8mm~1.2mm. In this embodiment, the extension length of the connection end 13 is 0.8mm, 1mm or 1.2mm, and the length of 1mm is preferred, so that the connection end 13 can be connected to the test system end.

[0037] Embodiment 5: See attached Figure 1As shown, this embodiment is a further improvement on the basis of the first embodiment, and its specific method is: the length of the test end 12 extending out of the mounting sleeve 2 is 0.8mm~1.2mm. In this embodiment, the length of the test end 12 extending out is 0.8mm, 1mm or 1.2mm, and 1mm is preferred, so that the test end 12 can be easily connected to the position to be detected.

[0038] Embodiment 6: See attached Figure 1 As shown, this embodiment is a further improvement on the basis of the first embodiment, and its specific method is: the distance between the center lines of each probe body 1 is 0.07mm~0.09mm. In this embodiment, the distance between the probe bodies 1 is 0.07mm, 0.08mm or 0.09mm, with 0.08mm being the best distance, which is convenient for filling the insulating filling structure 3 between the probe bodies 1. The insulating filling structure 3 with sufficient volume can make the integrated probe structure obtain higher rigidity and extend the service life of the probe.

[0039] Embodiment 7: Not shown in the drawings, this embodiment is a further improvement on the basis of embodiment 1, and its specific method is as follows: the material of the insulating filling structure 3 is a hard insulating material. In this embodiment, the insulating filling structure 3 is made of a hardened insulating material, such as PEFT; the use of hardened insulating material filling can ensure the stability of the connection structure between the probe bodies 1, so that the probe bodies 1 remain parallel, prevent the probe bodies 1 from bending, facilitate installation corresponding to the mounting holes on the fixture 4, and also extend the service life of the probe structure.

[0040] Embodiment 8: Not shown in the drawings, this embodiment is a further improvement on the basis of Embodiment 1, and its specific method is as follows: the material of the mounting sleeve 2 is an alloy material. In this embodiment, the mounting sleeve 2 is made of an alloy material, which ensures the hardness of the mounting sleeve 2, so that the integrated probe structure inside the mounting sleeve 2 maintains a stable structure and prolongs the service life; it is also convenient to install it corresponding to the mounting hole on the fixture 4. Among them, the mounting sleeve 2 is made by electroforming process.

[0041] The integrated probe structure designed by the utility model integrates the probe body into the installation sleeve for use, so that the strength of the probe structure is increased, the rigidity is enhanced, and the service life of the probe body is extended; at the same time, the processing difficulty of the mounting holes on the corresponding fixture is reduced, the number of drilling holes is reduced, the fixture manufacturing is simpler and more convenient, and the scrap rate is low; moreover, the installation difficulty is reduced, the installation requirements for personnel are low, the requirements for equipment for fixture manufacturing are also reduced, and the overall processing cost is reduced; in addition, the diameter of the mounting hole can be processed relatively larger, which is convenient for improving the processing accuracy, and the integrated probe is accurate for testing the PAD point of the PCB without displacement, and the rigidity and service life of the test PCB are greatly improved.

[0042] The above implementation modes are only for illustrating the technical concept and features of the utility model, and their purpose is to allow people familiar with this technology to understand the content of the utility model and implement it. It cannot be used to limit the protection scope of the utility model. Any equivalent changes or modifications made according to the spirit of the utility model should be included in the protection scope of the utility model.

Claims

1. An integrated probe structure, characterized in that: include: A probe body (1), the probe body (1) comprising a mounting section (11) and a test end (12) and a connection end (13) respectively arranged at two ends thereof; an outer surface of the mounting section (11) is provided with an insulating layer; the test end (12) is a needle end for connecting to a detection end; the connection end (13) is a round end for connecting to a system end; A mounting sleeve (2), the mounting sleeve (2) being sleeved on the outside of a structure composed of at least two of the probe bodies (1), and an insulating filling structure (3) being arranged between the respective probe bodies (1); an insulating coating being arranged on the outer surface of the mounting sleeve (2); The installation section (11) is located inside the installation sleeve (2), and the test end (12) and the connection end (13) are both arranged to extend out of the installation sleeve (2).

2. An integrated probe structure according to claim 1, characterized in that: The center line of the mounting sleeve (2) is arranged parallel to the center line of the probe body (1).

3. An integrated probe structure according to claim 1, characterized in that: Both ends of each probe body (1) are arranged flush.

4. The integrated probe structure according to claim 1, characterized in that: The length of the connecting end (13) extending out of the mounting sleeve (2) is 0.8 mm to 1.2 mm.

5. The integrated probe structure according to claim 1, characterized in that: The length of the test end (12) extending out of the installation sleeve (2) is 0.8 mm to 1.2 mm.

6. The integrated probe structure according to claim 1, characterized in that: The distance between the center lines of the probe bodies (1) is 0.07 mm to 0.09 mm.

7. The integrated probe structure according to claim 1, characterized in that: The insulating filling structure (3) is made of hard insulating material.

8. The integrated probe structure according to claim 1, characterized in that: The material of the mounting sleeve (2) is an alloy material.

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