Elastic pressing test seat suitable for chip test of automatic double-opening pressing claw type

Abstract

The utility model relates to the technical field of chip test seats, and discloses an elastic pressure test seat suitable for an automatic double-opening press claw type chip test, which comprises a bearing platform, a test groove is arranged at the top of the bearing platform, a plurality of probes are arranged at the bottom side in the test groove, clamping arms are movably connected to two sides of the top of the bearing platform, and the clamping arms are movably connected to the top of the bearing platform. A limiting frame is arranged in the center of the interior of the testing groove, positioning grooves matched with the clamping arms are formed in the two sides of the top of the limiting frame, and a chip fixing groove is formed in the middle of the top side of the limiting frame. According to the utility model, through the arrangement of the limiting frame, during use, the chip can be limited, so that the chip can be placed at a fixed position, the condition that the probe is damaged due to chip position deviation is avoided, and the problems that the probe cannot be well protected and the chip is not damaged when being fixed in the prior art are solved. And the problem that the probe is possibly damaged due to the incorrect position of the chip is solved.

Description

Technical Field

[0001] The utility model relates to the technical field of chip test sockets, in particular to a spring-loaded test socket suitable for chip testing of an automatic double-opening jaw type machine. Background Technique

[0002] A chip, also known as a microcircuit, microchip, wafer or integrated circuit, is a way to miniaturize a circuit and is often fabricated on the surface of a semiconductor wafer in electronics.

[0003] In modern life, due to the development of technology, various advanced technologies have emerged. Among them, the chip, as the brain of all machinery, is very important. When manufacturing chips, it is necessary to detect them, and a detection carrier platform is required during the detection. To sum up, when the existing detection carrier platform detects a chip, the pins of the chip are bent due to the pressure of being limited and clamped, resulting in the chip being unusable after detection, thus causing a waste phenomenon, increasing the use cost, and being inconvenient for users to use.

[0004] After retrieval, a packaging chip detection carrier platform (with the publication number CN 214585857 U) that avoids pin deformation under pressure belongs to the technical field of chips. The key points of its technical solution include a carrier table. A test slot is opened at the top of the carrier table, and a chip body is movably connected to the inner wall of the test slot. By setting the test slot, after the chip body enters the inner cavity of the test slot, through the cooperation with the clamping arm, the test slot can limit the chip body, preventing it from tilting and moving. At the same time, it can also cooperate with the drag table to avoid the pins of the chip being bent during the test, solving the problem that when the existing detection carrier platform detects a chip, the pins of the chip are bent due to the pressure of being limited and clamped, resulting in the chip being unusable after detection, thus causing a waste phenomenon, increasing the use cost, and being inconvenient for users to use.

[0005] When the existing technology is in use, the test slot is used to limit the chip body to prevent it from tilting and moving. However, in the actual use process, the probe cannot be well protected. When fixing the chip, if the chip position is incorrect, it is very likely to damage the probe. Summary of the Utility Model

[0006] The purpose of the present utility model is to solve the problems existing in the prior art, and a spring-loaded test socket suitable for chip testing of an automatic double-opening jaw type machine is proposed.

[0007] In order to achieve the above purpose, the present utility model adopts the following technical solutions:

[0008] A spring-loaded test socket for chip testing applicable to an automated double-opening press jaw model, comprising a carrier table. A test slot is provided at the top of the carrier table. A number of probes are arranged on the bottom side inside the test slot. Clamping arms are movably connected to both sides of the top of the carrier table. A limiting frame is provided in the center of the inside of the test slot. Positioning slots adapted to the clamping arms are provided on both sides of the top of the limiting frame. A chip fixing slot is provided in the middle of the top side of the limiting frame and extends to the bottom of the limiting frame.

[0009] Preferably, a number of the probes are all installed on a probe mounting seat. The probe mounting seat is embedded in the bottom of the carrier table and is detachably connected to the bottom of the carrier table by bolts. A number of the probes are located in the center of the top of the probe mounting seat, and the center position of the top of the probe mounting seat communicates with the test slot.

[0010] Preferably, a first rotating shaft is fixedly installed at the outer end of the clamping arm in the horizontal direction. The first rotating shaft is rotatably installed on a mounting seat. A spring is installed at the bottom of the mounting seat, and the bottom of the spring is fixedly connected to the top of the carrier table.

[0011] Preferably, limiting blocks are detachably installed on both sides inside the test slot by bolts. The limiting frame is arranged between the two limiting blocks.

[0012] Preferably, a second rotating shaft is installed on the inner side of the clamping arm in the horizontal direction. Rotating seats are installed at both ends of the second rotating shaft. The rotating seats are fixedly installed on the carrier table, and the carrier table is located between the test slot and the mounting seat.

[0013] Preferably, mounting slots are provided on both sides of the carrier table. The rotating seats and the mounting seats are both arranged in the mounting slots.

[0014] Compared with the prior art, the beneficial effects of the present utility model are:

[0015] By providing the limiting frame, during use, the present utility model can play a role in limiting the placement of the chip, so that the chip can be placed at a fixed position, thereby avoiding the situation of probe damage caused by chip position deviation, and solving the problem that the prior art cannot well protect the probe, and when fixing the chip, incorrect chip position is very likely to cause damage to the probe. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 is a normal state three-dimensional schematic diagram of a spring-loaded test socket for chip testing applicable to an automated double-opening press jaw model proposed by the present utility model;

[0017] Figure 2 is a normal state front view of a spring-loaded test socket for chip testing applicable to an automated double-opening press jaw model proposed by the present utility model;

[0018] Figure 3 The normal rear view of a spring-loaded test seat for chip testing applicable to an automated double-opening press jaw model proposed by the present utility model;

[0019] Figure 4 The normal left view of a spring-loaded test seat for chip testing applicable to an automated double-opening press jaw model proposed by the present utility model;

[0020] Figure 5 The normal right view of a spring-loaded test seat for chip testing applicable to an automated double-opening press jaw model proposed by the present utility model;

[0021] Figure 6 The normal top view of a spring-loaded test seat for chip testing applicable to an automated double-opening press jaw model proposed by the present utility model;

[0022] Figure 7 The normal bottom view of a spring-loaded test seat for chip testing applicable to an automated double-opening press jaw model proposed by the present utility model;

[0023] Figure 8 The schematic diagram of the second rotating shaft of a spring-loaded test seat for chip testing applicable to an automated double-opening press jaw model proposed by the present utility model;

[0024] Figure 9 The schematic diagram of the pressing state of a spring-loaded test seat for chip testing applicable to an automated double-opening press jaw model proposed by the present utility model;

[0025] Figure 10 The front view of the pressing state of a spring-loaded test seat for chip testing applicable to an automated double-opening press jaw model proposed by the present utility model;

[0026] Figure 11 The rear view of the pressing state of a spring-loaded test seat for chip testing applicable to an automated double-opening press jaw model proposed by the present utility model;

[0027] Figure 12 The side view of the pressing state of a spring-loaded test seat for chip testing applicable to an automated double-opening press jaw model proposed by the present utility model;

[0028] Figure 13 The top view of the pressing state of a spring-loaded test seat for chip testing applicable to an automated double-opening press jaw model proposed by the present utility model;

[0029] Figure 14 The bottom view of the pressing state of a spring-loaded test seat for chip testing applicable to an automated double-opening press jaw model proposed by the present utility model;

[0030] Figure 15 The front sectional view of a spring-loaded test socket for chip testing applicable to an automated double-opening press jaw model proposed by the present utility model.

[0031] In the figure: 1, a bearing table; 2, a test slot; 3, a probe; 4, a clamping arm; 5, a limiting frame; 6, a positioning slot; 7, a chip fixing slot; 8, a probe mounting seat; 9, a first rotating shaft; 10, a mounting seat; 11, a spring; 12, a limiting block; 13, a second rotating shaft; 14, a rotating seat; 15, a mounting slot. Specific implementation manners

[0032] Next, the technical solutions in the embodiments of the present utility model will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all of the embodiments.

[0033] Embodiment 1

[0034] Referring to Figures 1 - 15 , a spring-loaded test socket for chip testing applicable to an automated double-opening press jaw model, includes a bearing table 1. A test slot 2 is opened at the top of the bearing table 1. A plurality of probes 3 are arranged on the bottom side inside the test slot 2. Both sides of the top of the bearing table 1 are movably connected with clamping arms 4. A limiting frame 5 is arranged in the center of the inside of the test slot 2. Positioning slots 6 adapted to the clamping arms 4 are opened on both sides of the top of the limiting frame 5. A chip fixing slot 7 is opened in the middle of the top side of the limiting frame 5, and the chip fixing slot 7 extends to the bottom of the limiting frame 5.

[0035] When the device is in use, through the provided limiting frame 5, the placement of the chip can be limited, so that the chip can be placed at a fixed position (i.e., at the chip fixing slot 7). Then, the limiting frame 5 and the chip are fixed by pressing the positioning slot 6 with the clamping arm 4. The chip is detected by the probe 3, thus avoiding the situation of probe 3 damage caused by the offset of the chip position, and solving the problem that the prior art cannot well protect the probe 3. When fixing the chip, if the chip position is incorrect, it is very likely to cause damage to the probe 3.

[0036] In this embodiment, a plurality of the probes 3 are all installed on the probe mounting seat 8. The probe mounting seat 8 is embedded in the bottom of the bearing table 1 and is detachably connected to the bottom of the bearing table 1 through bolts. A plurality of the probes 3 are located at the center of the top of the probe mounting seat 8, and the center position of the top of the probe mounting seat 8 is communicated with the test slot 2, which is convenient for the overall disassembly and assembly of the probes 3.

[0037] In this embodiment, limit blocks 12 are detachably installed on both sides inside the test slot 2 through bolts. The limit frame 5 is arranged between the two limit blocks 12. The two limit blocks 12 can limit the position of the limit frame 5, ensuring the stability of the position of the limit frame 5 in the test slot 2, and at the same time facilitating the replacement of the limit frame 5.

[0038] In this embodiment, a first rotating shaft 9 is fixedly installed at the outer end of the clamping arm 4 in the horizontal direction. The first rotating shaft 9 is rotatably installed on the mounting base 10. A spring 11 is installed at the bottom of the mounting base 10. The bottom of the spring 11 is fixedly connected to the top of the carrier table 1. A second rotating shaft 13 is installed on the inner side of the clamping arm 4 in the horizontal direction. Rotating seats 14 are installed at both ends of the second rotating shaft 13. The rotating seats 14 are fixedly installed on the carrier table 1. The carrier table 1 is located between the test slot 2 and the mounting base 10. Taking the second rotating shaft 13 as the base point, the position of the clamping arm 4 can be changed to realize the fixing function of the chip. The spring 11 can act as a pressing force here to act on the clamping arm 4 to realize the clamping function of the clamping arm 4. When it is necessary to cancel the acting force of the clamping arm 4, only an upward force needs to be applied to the clamping arm 4.

[0039] In this embodiment, mounting grooves 15 are formed on both sides of the carrier table 1. The rotating seats 14 and the mounting base 10 are both arranged in the mounting grooves 15, which is convenient for the installation of the rotating seats 14 and the mounting base 10.

[0040] Embodiment 2

[0041] Refer to Figures 1 - 15 A spring-loaded test seat applicable to chip testing of an automated double-opening jaw model includes a carrier table 1. A test slot 2 is formed at the top of the carrier table 1. A plurality of probes 3 are arranged at the bottom side inside the test slot 2. Clamping arms 4 are movably connected to both sides of the top of the carrier table 1. A limit frame 5 is arranged in the center of the inside of the test slot 2. Positioning grooves 6 adapted to the clamping arms 4 are formed on both sides of the top of the limit frame 5. A chip fixing groove 7 is formed in the middle of the top side of the limit frame 5 and extends to the bottom of the limit frame 5.

[0042] When this device is in use, through the arranged limit frame 5, the placement of the chip can be limited, so that the chip can be placed at a fixed position (i.e., the chip fixing groove 7). Then, the limit frame 5 and the chip are fixed by pressing the positioning groove 6 with the clamping arm 4. The chip is detected by the probe 3, thus avoiding the situation of probe 3 damage caused by chip position deviation, and solving the problem that the prior art cannot well protect the probe 3. When fixing the chip, if the chip position is incorrect, it is very likely to cause damage to the probe 3.

[0043] In this embodiment, several of the probes 3 are all installed on the probe mounting base 8. The probe mounting base 8 is embedded in the bottom of the carrier 1 and is detachably connected to the bottom of the carrier 1 by bolts. Several of the probes 3 are located at the center of the top of the probe mounting base 8, and the central position of the top of the probe mounting base 8 communicates with the test slot 2, facilitating the overall disassembly and assembly of the probes 3.

[0044] In this embodiment, both sides inside the test slot 2 are detachably installed with limit blocks 12 by bolts. The limit frame 5 is arranged between the two limit blocks 12. The two limit blocks 12 can limit the position of the limit frame 5, ensuring the stability of the position of the limit frame 5 in the test slot 2 and also facilitating the replacement of the limit frame 5.

[0045] In this embodiment, a first rotating shaft 9 is fixedly installed at the outer end of the clamping arm 4 in the horizontal direction. The first rotating shaft 9 is rotatably installed on the mounting base 10. A spring 11 is installed at the bottom of the mounting base 10, and the bottom of the spring 11 is fixedly connected to the top of the carrier 1. The first rotating shaft 9 can also be connected to an external rotary drive device, such as a servo motor, to rotate the first rotating shaft 9, thereby realizing the clamping operation of the clamping arm 4.

[0046] In this embodiment, mounting grooves 15 are formed on both sides of the carrier 1, and the rotating seat 14 and the mounting base 10 are both arranged in the mounting grooves 15.

[0047] The limit frame 5 is a replaceable component and has multiple selectable sizes.

[0048] Three springs 11 are arranged at the bottom of the mounting base 10, and the three springs 11 are arranged at equal intervals.

[0049] The above is only a preferred specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention, according to the technical solution of the present invention and its inventive concept, makes equivalent substitutions or changes, and should be covered by the protection scope of the present invention.

Claims

1. A spring pressure test seat suitable for chip testing of an automated double-opening pressure claw machine, comprising a carrier, a test slot is provided on the top of the carrier, a plurality of probes are provided on the bottom of the test slot, and clamping arms are movably connected to both sides of the top of the carrier, characterized in that: A limit frame is arranged in the center of the test slot, positioning grooves adapted to the clamping arms are provided on both sides of the top of the limit frame, a chip fixing groove is provided in the middle of the top side of the limit frame, and the chip fixing groove extends to the bottom of the limit frame.

2. According to claim 1, a spring pressure test seat suitable for chip testing of an automated double-open pressure claw machine is characterized in that: Several of the probes are installed on a probe mounting seat, which is embedded in the bottom of the carrier platform and detachably connected to the bottom of the carrier platform by bolts. Several of the probes are located in the center of the top of the probe mounting seat, and the center position of the top of the probe mounting seat is connected to the test slot.

3. The spring pressure test socket for chip testing of an automated double-open pressure claw machine according to claim 1, characterized in that: A first rotating shaft is fixedly installed at one end of the clamping arm facing outward in the horizontal direction. The first rotating shaft is rotatably installed on a mounting seat. A spring is installed at the bottom of the mounting seat. The bottom of the spring is fixedly connected to the top of the bearing platform.

4. The spring pressure test socket for chip testing in an automated double-open pressure claw machine according to claim 1, characterized in that: Limit blocks are detachably mounted on both sides of the test slot by bolts, and the limit frame is arranged between the two limit blocks.

5. The spring pressure test socket for chip testing in an automated double-open pressure claw machine according to claim 3, characterized in that: A second rotating shaft is installed on the inner side of the clamping arm in the horizontal direction, and a rotating seat is installed at both ends of the second rotating shaft. A bearing platform is fixedly installed on the rotating seat, and the bearing platform is located between the test slot and the mounting seat.

6. The spring pressure test socket for chip testing in an automated double-open pressure claw machine according to claim 5, characterized in that: Both sides of the bearing platform are provided with mounting grooves, and the rotating seat and the mounting seat are both arranged in the mounting grooves.

7. The spring pressure test socket for chip testing in an automated double-open pressure claw machine according to claim 4, characterized in that: The limiting frame is a replaceable component and has a variety of optional sizes.

8. The spring pressure test socket for chip testing in an automated double-open pressure claw machine according to claim 3, characterized in that: The mounting seat is provided with three bottom springs, and the three springs are arranged equidistantly.

Images