Signal switching and testing device between T-CON board and mainboard of display panel

Abstract

The utility model provides a signal switching and testing device between a T-CON board and a mainboard of a display panel, and the device comprises a switching testing body, the switching testing body is provided with an input terminal seat and an output terminal seat, the input terminal seat is provided with a plurality of first connection pins, second connection pins and third connection pins, the switching testing body is provided with a through hole, and the first connection pins, the second connection pins and the third connection pins are connected through the through hole. The wire of the second connection pin is arranged around the periphery of the through hole and then is connected to the output terminal seat. The wire between each third connection pin and the output terminal seat is provided with a connection via hole. According to the device, screen signal switching and matching test of the T-CON board and the mainboard are carried out on the T-CON board with different display interface protocols through the switching test body, so that the compatibility is high; through the arrangement of the through holes, the second connecting pins are independently wired to adapt to detection parts of the detection equipment, so that current testing is facilitated, the testing efficiency is high, the convenience is high, and the accuracy is guaranteed.

Description

Technical Field

[0001] This application belongs to the technical field of performance testing of display panels, and particularly relates to a signal transfer and testing device between a T-CON board and a main board of a display panel. Background Art

[0002] With the development of display panel technologies such as LCD and OLED, display panel manufacturers continuously develop the functions of the T-CON board to meet the higher-end display requirements of the panel; the display panel for the T-CON input signal is implemented based on display interface protocols (such as V-by-One, LVDS, eDP, etc.). While the display interface protocol meets the signal pin definitions, there are multiple idle user-selectable pins remaining (such as Data Format 0, Data Format 1, SDA, SCL, etc.). Each display panel manufacturer opens the T-CON input interface to LCD or OLED manufacturers, and these user-selectable pins are used to implement the function call of the developed T-CON through control signals such as I2C / GPIO.

[0003] With the main board of the display panel matching the multiple function calls of the T-CON of each display panel manufacturer and the load differences of large and small-sized panels, the differences in the voltage and current input from the main board to the T-CON board and the input of function control bits will affect whether the display panel can achieve the expected display effect. Therefore, the requirements for the matching of the main board of display panel manufacturers are higher, and more stringent matching tests are required to improve the reliability of the whole machine.

[0004] Due to the dense pins of the FFC interface at the input end of the T-CON board, directly testing the pins is likely to cause short circuits and damage to the devices; if looking for the corresponding resistors of the signals on the main board circuit, it is necessary to find the corresponding test points according to the circuit schematic diagram of the main board, which is a cumbersome process and prone to errors, seriously affecting the test efficiency and accuracy. Summary of the Utility Model

[0005] An embodiment of this application provides a signal transfer and testing device between a T-CON board and a main board of a display panel to solve the problems of low test efficiency and inability to guarantee accuracy in the existing signal matching test method between the main board and the T-CON board in a display panel.

[0006] In a first aspect, an embodiment of the present application provides a signal transfer and test device between a T-CON board and a main board of a display panel, including a transfer test body, an input terminal block and an output terminal block matching the input terminal block are arranged on the transfer test body, several first connection pins for defining a display interface protocol, several second connection pins for power supply and several third connection pins for user-defined selection are arranged on the input terminal block, a through hole is formed on the transfer test body, the wiring of the second connection pins is arranged around the outer periphery of the through hole and then connected to the output terminal block, and connection vias are formed on the wiring between each third connection pin and the output terminal block.

[0007] Optionally, the input terminal block is used to connect to the output interface of the main board in the display panel, and the output terminal block is used to connect to the input interface of the T-CON board in the display panel.

[0008] Optionally, the input terminal block and the output interface of the main board are connected by metal pins, and the output terminal block and the input interface of the T-CON board are connected by metal pins.

[0009] Optionally, the input terminal block and the output interface of the main board are connected by metal pins, and the output terminal block and the input interface of the T-CON board are connected by metal pins.

[0010] Optionally, both the input terminal block and the output terminal block have thirty connection pins.

[0011] Optionally, four of the connection pins in the input terminal block and the output terminal block serve as the second connection pins, and insertion vias for metal pin connection are arranged on the wiring between the second connection pins and the output terminal block.

[0012] Optionally, the first connection pins are connection pins for defining LVDS signals, eDp signals or V-By-One signals.

[0013] Optionally, the first connection pins are connection pins for defining LOCKN signals and / or HTPDN signals.

[0014] Optionally, both the input terminal block and the output terminal block include a first terminal block with fifty-one connection pins and a second terminal block with forty-one connection pins.

[0015] Optionally, the second connection pins are arranged on the first terminal block, and several of the first connection pins and several of the third connection pins are included on both the first terminal block and the second terminal block.

[0016] A signal transfer and test device between a T-CON board and a main board of a display panel provided by an embodiment of the present application includes a transfer and test body. An input terminal block and an output terminal block matching the input terminal block are arranged on the transfer and test body. The input terminal block is provided with several first connection pins for defining a display interface protocol, several second connection pins for power supply, and several third connection pins for user-defined selection. A through hole is formed on the transfer and test body. The traces of the second connection pins are arranged around the outer periphery of the through hole and then connected to the output terminal block. Connection vias are formed on the traces between each third connection pin and the output terminal block. The signal transfer and test device between the T-CON board and the main board of the display panel transfers the screen signal of the T-CON board with different display interface protocols through the transfer and test body and performs the matching test between the T-CON board and the main board, realizing strong compatibility; the connection pins of the output terminal block adopt metal pins to adapt to the detection components of the detection device, facilitating the inspection and test of the functional positions between the T-CON board and between the T-CON board and the main board. The independent traces of the second connection pins are adapted to the detection components of the detection device through the setting of the through hole, facilitating current testing. The testing efficiency is high, the convenience is strong, and the accuracy is guaranteed, solving the problems of low testing efficiency and inability to guarantee accuracy in the existing signal matching test method between the main board and the T-CON board in the display panel. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in an embodiment of the present application, the following will briefly introduce the drawings required for the description of the embodiment. Obviously, the following drawings are only some embodiments of the present application. For those skilled in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0018] In order to more completely understand the present application and its beneficial effects, the following will be described in conjunction with the drawings. Among them, the same reference numerals represent the same parts in the following description.

[0019] Figure 1 It is a schematic structural diagram of a signal transfer and test device between a T-CON board and a main board of a display panel provided by an embodiment of the present application.

[0020] Figure 2 It is a schematic structural diagram of a signal transfer and test device between a T-CON board and a main board of a display panel provided by another embodiment of the present application.

[0021] Figure 3 It is a schematic structural diagram of a signal transfer and test device between a T-CON board and a main board of a display panel provided by still another embodiment of the present application. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0022] Next, the technical solutions in an embodiment of the present application will be clearly and completely described in conjunction with the accompanying drawings in an embodiment of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative efforts belong to the scope of protection of the present application.

[0023] An embodiment of the present application provides a signal transfer and test device between a T-CON board and a main board of a display panel to solve the problems of low test efficiency and inability to guarantee accuracy in the signal matching test method between the main board and the T-CON board in the existing display panel.

[0024] Embodiment 1:

[0025] The signal transfer and test device between the T-CON board and the main board of the display panel provided by an embodiment of the present application. Exemplarily, please refer to Figure 1 , Figure 1 which is a schematic structural diagram of the signal transfer and test device between the T-CON board and the main board of the display panel provided by an embodiment of the present application.

[0026] As Figure 1 shown, the present utility model provides a signal transfer and test device between the T-CON board and the main board of the display panel, including a transfer test body 10. An input terminal 11 seat and an output terminal seat 12 matching the input terminal seat 11 are arranged on the transfer test body 10. A plurality of first connection pins 111 for defining a display interface protocol, a plurality of second connection pins 112 for power supply, and a plurality of third connection pins 113 for user-defined selection are arranged on the input terminal seat 11. A through hole 13 is formed on the transfer test body 10. The wiring of the second connection pins 112 is arranged around the outer periphery of the through hole 13 and then connected to the output terminal seat 12. Connection vias 14 are formed on the wiring between each third connection pin 113 and the output terminal seat 12.

[0027] It should be further noted that the wiring refers to the wiring on the transfer test body 10. The transfer test body 10 can be a circuit board, and the wiring of the circuit board is usually referred to as Track or Trace. The wiring on the circuit board is a copper wire for electrical connection between devices. The display interface protocol can be display interface protocols such as LVDS, eDP, and V-By-One. The first connection pin 111 can be a connection pin for defining the LOCKN signal and / or the HTPDN signal.

[0028] In the embodiment of the present application, the input terminal seat 11 is used to connect to the output interface of the main board in the display panel, and the output terminal seat 12 is used to connect to the input interface of the T-CON board in the display panel.

[0029] Furthermore, the input terminal block 11 is connected to the output interface of the main board by metal pins, and the output terminal block 12 is connected to the input interface of the T-CON board by metal pins. In this embodiment, the first connection pin 111 is used for signal transfer between the main board and the T-CON board. The connection pins for the function control signal between the input terminal block 11 and the output terminal block 12 are tested by the probe clamp of a detection device (such as an oscilloscope) on the metal pins to realize the test of the input power supply voltage and current between the main board and the T-CON board. Among them, both the input terminal block 11 and the output terminal block 12 are connected and led out by metal pins for easy connection with other components.

[0030] In this embodiment, the transfer test body of the signal transfer and test device between the T-CON board and the main board of the display panel can be used to transfer the screen signal of the T-CON board with different display interface protocols and test the compatibility between the T-CON board and the main board, achieving strong compatibility; the connection pins of the output terminal block 13 adopt metal pins to adapt to the voltage probe clamp of the detection device (such as an oscilloscope), which is convenient for testing the functional positions between the T-CON board and between the T-CON board and the main board. The second connection pin 112 is independently routed through the through-hole to adapt to the current probe fixture of the detection device (such as an oscilloscope) for current testing, improving the efficiency, convenience and stability of the test.

[0031] A signal transfer and test device between the T-CON board and the main board of a display panel provided by an embodiment of the present application includes a transfer test body. The transfer test body is provided with an input terminal block and an output terminal block matching the input terminal block. The input terminal block is provided with several first connection pins for defining the display interface protocol, several second connection pins for power supply, and several third connection pins for user-defined selection. A through-hole is formed on the transfer test body. The routing of the second connection pin is arranged around the outer periphery of the through-hole and then connected to the output terminal block. A connection via is formed on the routing between each third connection pin and the output terminal block. The signal transfer and test device between the T-CON board and the main board of the display panel transfers the screen signal of the T-CON board with different display interface protocols and tests the compatibility between the T-CON board and the main board through the transfer test body, achieving strong compatibility; the connection pins of the output terminal block adopt metal pins to adapt to the detection components of the detection device, which is convenient for testing the functional positions between the T-CON board and between the T-CON board and the main board. The second connection pin is independently routed through the through-hole to adapt to the detection components of the detection device for current testing. The test efficiency is high, the convenience is strong, and the accuracy is guaranteed, solving the problems of low test efficiency and inability to guarantee accuracy in the existing signal matching test method between the main board and the T-CON board of the display panel.

[0032] Further, the signal transfer and test device between the T-CON board and the main board of the display panel welds and fixes metal pins on the first connection pins, the third connection pins and the connection vias reserved on the transfer test body. When performing the matching test between the main board and the T-CON board, according to the control signals required by the main board input by the T-CON designed and developed by different display panel enterprises, the detection components of the detection device are placed on the pins corresponding to the required test signals, so as to conveniently and stably test the required signal states. Using the direct test of the reserved pins instead of the original method of testing the FFC interface pins or finding the corresponding signal resistors for testing at the main board end avoids the short circuit caused by the test pins resulting in device damage or the cumbersome process of finding the test points according to the circuit schematic diagram, greatly improving the efficiency, safety and accuracy of the test.

[0033] As Figure 1 shown, in the embodiment of the present utility model of this application, the connection via 14 is used to connect with the metal pin.

[0034] Further, the setting of the connection via 14 is, firstly, used to connect with the metal pin to facilitate the connection with the detection components of the detection device; secondly, to ensure the accuracy of the matching test between the T-CON board and the main board and avoid the detection components of the detection device detecting the wrong connection pins.

[0035] Figure 2 The structural schematic diagram of the signal transfer and test device between the T-CON board and the main board of the display panel provided for another embodiment of this application.

[0036] As Figure 2 shown, in an embodiment of the present utility model of this application, both the input terminal block 11 and the output terminal block 12 include a first terminal block 101 with fifty-one connection pins and a second terminal block 102 with forty-one connection pins. Among them, the second connection pin 112 is arranged on the first terminal block 101, and both the first terminal block 101 and the second terminal block 102 include several first connection pins 111 and several third connection pins 113.

[0037] Further, the input terminal block 11 and the output terminal block 12 are both welded to the pad of the adapter test body 10. The first terminal block 101 is an FFC block with fifty-one connection pins using the V-By-One protocol. Among them, the first to eighth connection pins serve as the second connection pins 112. The power supply pad VCC supply pin of the second connection pin 112 is led out through a pin and is used for testing the supply voltage and current between the main board and the T-CON board. In this embodiment, all the connection pins in the input terminal block 11 and the output terminal block 12 are welded and fixed through metal pins and are exposed outside the adapter test body 10. The adapter test body 10 of the signal transfer and test device between the T-CON board and the main board of the display panel supports the transfer of up to 16lane V-by-One 4K120Hz screen signals, function control signals, and power supply signals at most, so that the signal transfer and test device between the T-CON board and the main board of the display panel is applicable to the matching test and signal transfer between the T-CON board and the main board that meet the V-By-One protocol developed by different display panel enterprises. The signal transfer and test device between the T-CON board and the main board of the display panel is compatible with the matching test between the T-CON board and the main board developed by each display panel enterprise, avoiding frequent replacement of the adapter board during the test process and greatly improving the test efficiency.

[0038] Figure 3 The structural schematic diagram of the signal transfer and test device between the T-CON board and the main board of the display panel provided by another embodiment of the present application.

[0039] As Figure 3 shown, in an embodiment of the utility model of the present application, both the input terminal block 11 and the output terminal block 12 have thirty connection pins. Four connection pins in the input terminal block 11 and the output terminal block 12 serve as the second connection pins 112, and via holes 15 for metal pin connection are provided on the trace between the second connection pins 112 and the output terminal block 12. The first connection pin 111 is a connection pin for defining signals such as LVDS signals, eDp signals, or V-By-One signals.

[0040] Further, as Figure 3As shown, select the pad positions of the FFC socket with thirty connection pins for soldering the input terminal block 11; select the pad positions of the FFC socket with thirty connection pins for soldering the output terminal block 12. In this embodiment, the input terminal block 11 and the output terminal block 12 can be selected as FFC sockets. According to the general definition of the LVDS interface with thirty connection pins, the first to fourth connection pins of the FFC socket are used as the second connection pin 112 for the common power supply of the T-CON board. The independent trace of the transfer test body 10 reserves an insertion via hole 15 with an opening design. The trace of the second connection pin 112 is arranged around the outer periphery of the through hole 13 and then connected to the independent trace design of the output terminal block 12, the design of the insertion via hole 15, and the pin of the second connection pin 112, which is convenient for testing the power supply voltage and current between the main board and the T-CON board. The trace via hole design of the first connection pin 111 and the third connection pin 113 of the LVDS interface general definition specification is used for soldering and fixing the metal pins. The design of this transfer test body 10 can support the transfer of HD 60Hz LVDS screen signals, function control signals, and power supply signals. The signal transfer and test device between the T-CON board and the main board of the display panel is applicable to the matching test and signal transfer between the T-CON board and the main board of the HD 60Hz LVDS screen developed by different display panel enterprises.

[0041] In the embodiment of the utility model of the present application, the signal transfer and test device between the T-CON board and the main board of the display panel realizes the signal transfer required for the T-CON board of the existing LCD liquid crystal screen and OLED screen to support display interface protocols (V-by-One, LVDS, eDP, etc.) and the comprehensive matching test with the main board. The transfer test body 10 adopts a pin design to insert the pin of the third connection pin at the T-CON input end to adapt to the detection component of the detection device for function position and voltage inspection and test. The structure of the through hole 13 is used to independently trace the detection component of the detection device for the second connection pin 112 to perform current test, which improves the efficiency and flexibility of the matching test between the main board and the T-CON board in the display panel. The same transfer test body 10 can be compatible with the functional tests of T-CON boards developed by different display panel enterprises that support display interface protocols (V-by-One, LVDS, eDP, etc.), greatly improving the efficiency, convenience, and practicality of the test.

[0042] In the above embodiments, the descriptions of the various embodiments have their own emphases. For the parts not detailed in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0043] In the description of the present application, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more features.

[0044] The above has introduced in detail the signal transfer and testing device between the T-CON board and the main board of the display panel provided by an embodiment of the present application. Specific examples are used in this article to elaborate on the principle and implementation manner of the present application. The description of the above embodiments is only used to help understand the method and its core idea of the present application; at the same time, for those skilled in the art, according to the idea of the present application, there will be changes in the specific implementation manner and application scope. In summary, the content of this specification should not be construed as a limitation to the present application.

Claims

1. A signal transfer and testing device between a T-CON board and a main board of a display panel, characterized in that: The adapter test body comprises an input terminal seat and an output terminal seat matching the input terminal seat, the input terminal seat is provided with a plurality of first connection pins for defining a display interface protocol, a plurality of second connection pins for power supply and a plurality of third connection pins for user-defined selection, the adapter test body is provided with a through hole, the wiring of the second connection pin is arranged around the periphery of the through hole and then connected to the output terminal seat, and a connecting via is provided on the wiring between each of the third connection pins and the output terminal seat.

2. The signal transfer and testing device between the T-CON board and the main board of the display panel according to claim 1, characterized in that: The input terminal seat is used to connect to the output interface of the main board in the display panel, and the output terminal seat is used to connect to the input interface of the T-CON board in the display panel.

3. The signal transfer and testing device between the T-CON board and the main board of the display panel according to claim 2, characterized in that: The input terminal seat is connected to the output interface of the main board by using metal pins, and the output terminal seat is connected to the input interface of the T-CON board by using metal pins.

4. The signal transfer and testing device between the T-CON board and the main board of the display panel according to claim 1, characterized in that: The connecting via is used to connect with the metal pin.

5. The signal transfer and testing device between the T-CON board and the main board of the display panel according to claim 1, characterized in that: The input terminal block and the output terminal block each have thirty connecting pins.

6. The signal transfer and testing device between the T-CON board and the main board of the display panel according to claim 5, characterized in that: The four connecting pins in the input terminal block and the output terminal block serve as the second connecting pins, and a plug-in via for metal pin connection is arranged on a line between the second connecting pin and the output terminal block.

7. The signal transfer and testing device between the T-CON board and the main board of the display panel according to claim 5, characterized in that: The first connection pin is a connection pin used to define an LVDS signal, an eDp signal or a V-By-One signal.

8. The signal transfer and testing device between the T-CON board and the main board of the display panel according to claim 1, characterized in that: The first connection pin is a connection pin used to define a LOCKN signal and / or a HTPDN signal.

9. The signal transfer and testing device between the T-CON board and the main board of the display panel according to claim 1, characterized in that: The input terminal block and the output terminal block each include a first terminal block with fifty-one connecting pins and a second terminal block with forty-one connecting pins.

10. The signal transfer and testing device between the T-CON board and the main board of the display panel according to claim 9, characterized in that: The second connecting pin is arranged on the first terminal seat, and the first terminal seat and the second terminal seat both include a plurality of the first connecting pins and a plurality of the third connecting pins.

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