Test system
By using the first linked device in the test system to send target data packets to the device to be tested, the problem of high design cost of the device to be tested is solved, and the consistency testing of the Ethernet interface is realized, which saves equipment costs.
Patent Information
- Application Number
- CN202422088355.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-27
- Publication Date
- 2025-06-17
- Estimated Expiration
- 2034-08-27
AI Technical Summary
In the Ethernet interface 10M TX consistency test of the equipment to be tested, the prior art requires adding a random data generation circuit to the equipment to be tested, resulting in high design costs.
Through a test system, the system includes a first linked device, a device to be tested and an oscilloscope. The first linked device sends target data packets to the target Ethernet interface of the device to be tested in a linked state, and the device to be tested forwards these data packets to the oscilloscope to complete the consistency test.
There is no need to set up a random data generation circuit in the device to be tested, which saves the design cost of the device to be tested and realizes consistency testing of the Ethernet interface.
Smart Images
Figure CN222996566U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the field of testing, in particular to a testing system. Background Art
[0002] In the test scenario of the 10M TX (transmission signal with a data transmission rate of 10 megabits) consistency test of the Ethernet interface of the device under test, in the related art, it is generally necessary to generate random data packets through the device under test itself and send the random data packets through the Ethernet interface of the device under test.
[0003] In order to enable the device under test to implement the function of generating random data packets, it is necessary to add a random data generation circuit related to generating random data packets in the device under test, which increases the design cost of the device under test and results in a relatively high design cost of the device under test. Summary of the Utility Model
[0004] This application provides a testing system, which can solve the problem of relatively high design cost of the device under test in the related art.
[0005] An embodiment of this application provides a testing system, including:
[0006] A first link device, a device under test, and an oscilloscope;
[0007] The first link device has a first Ethernet interface, and the first Ethernet interface of the first link device is used to receive a link pulse signal to make the first Ethernet interface in a link state;
[0008] The first Ethernet interface of the first link device is connected to the target Ethernet interface of the device under test, and the first Ethernet interface is used to send a target data packet to the target Ethernet interface of the device under test in the link state;
[0009] The target Ethernet interface of the device under test is connected to the oscilloscope and is used to output the received target data packet to the oscilloscope, so that the oscilloscope performs the consistency test of the target Ethernet interface based on the target data packet.
[0010] In an embodiment of the present application, the test system includes a first link device, a device under test, and an oscilloscope; the first link device has a first Ethernet interface, and the first Ethernet interface of the first link device is used to receive a link pulse signal to enable the first Ethernet interface to be in a linked state; the first Ethernet interface of the first link device is connected to a target Ethernet interface of the device under test, and the first Ethernet interface is used to send a target data packet to the target Ethernet interface of the device under test in the linked state; the target Ethernet interface of the device under test is connected to the oscilloscope and is used to output the received target data packet to the oscilloscope, so that the oscilloscope performs a compliance test on the target Ethernet interface based on the target data packet. In this way, since the first link device can send a target data packet to the target Ethernet interface of the device under test in the linked state, the target Ethernet interface of the device under test can forward the target data packet from the first link device to the oscilloscope, so that the oscilloscope performs a compliance test on the target Ethernet interface based on the target data packet. Compared with the related art, there is no need to set up a circuit for generating the target data packet inside the device under test, saving the cost of the device under test. Brief Description of the Drawings
[0011] The drawings described herein are used to provide a further understanding of the present invention, and constitute a part of the present invention. The illustrative embodiments and descriptions thereof of the present invention are used to explain the embodiments of the present invention and do not constitute an improper limitation of the present invention. In the drawings:
[0012] Figure 1 is a schematic diagram of a test system built in the related art;
[0013] Figure 2 is in the related art Figure 1 corresponding to the schematic diagram of the internal circuit connection relationship of the test system;
[0014] Figure 3 is a structural schematic diagram of a test system provided by an embodiment of the present application;
[0015] Figure 4 is another structural schematic diagram of a test system provided by an embodiment of the present application;
[0016] Figure 5 is still another structural schematic diagram of a test system provided by an embodiment of the present application.
[0017] Description of the Reference Numerals:
[0018] 10 - Test system; 100 - First link device; 101 - First Ethernet interface; 102 - Third Ethernet interface; 103 - Fourth Ethernet interface; 104 - Data generation module; 200 - Device under test; 201 - Target Ethernet interface; 300 - Oscilloscope; 301 - Differential probe; 400 - Second link device; 401 - Second Ethernet interface; 500 - Data sending device; 501 - Sending interface; 600 - Ethernet test fixture; 601 - First interface; 602 - Second interface; 603 - Target load; 604 - Target test point; 100Ω - 100 - ohm load; Load1 - Load 1; Load2 - Load 2; Ch1 - Channel 1; Ch1 - Channel 2; Ch1 - Channel 3; Ch1 - Channel 4. Detailed implementation manners
[0019] To make the objectives, technical solutions, and advantages of the present application clearer, the technical solutions of the present application will be clearly described below in conjunction with specific embodiments of the present application and the corresponding drawings. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.
[0020] The terms "first" and "second" in the description and claims of the present application may explicitly or implicitly include one or more of such features. In the description of the present application, unless otherwise specified, the meaning of "a plurality" is two or more. In addition, "and / or" in the description and claims means at least one of the connected objects, and the character " / " generally means an "or" relationship between the associated objects before and after.
[0021] In the description of the present application, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "coupled" should be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or an integral connection; it may be a mechanical connection or an electrical connection; it may be directly connected or indirectly connected through an intermediate medium, and it may be the internal communication of two components. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific situations.
[0022] As described in the background art, in the test scenario of the 10M TX compliance test of the Ethernet interface of the device under test, in the related art, it is generally necessary to generate random data packets through the device under test itself and send the random data packets through the Ethernet interface of the device under test. In order to enable the device under test to implement the function of generating random data packets, it is necessary to add a random data generation circuit related to generating random data packets in the device under test, which increases the design cost of the device under test.
[0023] For example, as Figure 1 shown, the test system built in the related art includes: a link device (Link Partner, LP), a device under test (Device Under Test, DUT), an Ethernet test fixture, and an oscilloscope. The link device and the device under test are connected to the network interface (such as RJ45) of the Ethernet test fixture through a network cable, and channel 1 (Ch1) of the oscilloscope is connected to the TP12 test point of the Ethernet test fixture through a differential probe.
[0024] Among them, the 10M TX compliance test of the Ethernet interface includes multiple test items. Taking one of them (Peak voltage, the maximum voltage value) as an example, loads such as Load1 / Load2 are disconnected, and the 100Ω load is short-circuited with a jumper cap; when the load is 100 ohms, the device under test continuously sends random data packets, and the Ethernet test suite (such as an APP application program) supporting the oscilloscope is used to test the TX signal of the device under test, and the maximum voltage value of the Ethernet interface is measured.
[0025] Among them, referring to Figure 2 , in Figure 1 the shown test system, the link device is specifically connected to the device under test only through a pair of network cables (network cable pair Pair12), and the other pair of network cables (network cable pair Pair36, that is, the receiving line) of the link device is disconnected. According to the IEEE Std 802.3 protocol, there is no signal on the receiving line of the link device, making the link device unable to link at 10M. When the link device fails to link, it is unable to send and receive data packets. And since the device under test needs to continuously send random data during the test, otherwise the oscilloscope will not be able to measure the maximum voltage value. To implement this function, the device under test itself needs to be able to generate random data and send it out through the Ethernet interface. To enable the device under test to implement the function of generating random data packets, a random data generation circuit related to generating random data packets needs to be added to the device under test, increasing the cost of the device under test.
[0026] Based on this, in order to enable the device under test to send (TX) random data packets on the premise of successfully connecting to 10M, and further save the cost of the device under test, the embodiments of the present application can enable the linking device to connect to 10M, and control the linking device to send random data packets to the device under test through the transmission line (Ethernet pair 12), and at the same time, the device under test is configured with a remote loop back to send the received random data packets to the oscilloscope again, completing the test of the TX signal of the device under test. In this way, since the linking device can send random data packets to the device under test in the linked state of connecting to 10M, the device under test can forward the random data packets from the linking device, and compared with the related art, there is no need to set a random data generation circuit in the device under test, further saving the cost of the device under test.
[0027] The following will Figures 3-5 be described in detail in conjunction with the accompanying
[0028] As Figures 3 to 5 shown, the test system 10 provided by the embodiments of the present application may include: a first linking device 100, a device under test 200, and an oscilloscope 300;
[0029] The first linking device 100 has a first Ethernet interface 101, and the first Ethernet interface 101 of the first linking device is used to receive a link pulse signal to make the first Ethernet interface 101 in a linked state;
[0030] The first Ethernet interface 101 of the first linking device is connected to the target Ethernet interface 201 of the device under test 200, and the first Ethernet interface 101 is used to send a target data packet to the target Ethernet interface 201 of the device under test in the linked state;
[0031] The target Ethernet interface 201 of the device under test 200 is connected to the oscilloscope 300, and is used to output the received target data packet to the oscilloscope 300, so that the oscilloscope performs a compliance test on the target Ethernet interface 201 based on the target data packet.
[0032] Wherein, each Ethernet interface provided by the embodiments of the present application may be an RJ45 type network interface, or other types of network interfaces, and the embodiments of the present application do not limit the specific model of the Ethernet interface.
[0033] In the embodiment of the present application, it is possible to set the first Ethernet interface 101 of the first link device to receive a link pulse signal for Pair 36 through a network cable. After the first Ethernet interface 101 of the first link device receives the link pulse signal, the first Ethernet interface 101 can be brought into a link state, for example, successfully linked to 10M. According to the IEEE Std 802.3 protocol, when the first Ethernet interface 101 is in the link state, the first Ethernet interface 101 can send a target data packet to the target Ethernet interface 201 of the device under test. Furthermore, after the target Ethernet interface of the device under test is configured with the remote loopback mode, the received target data packet can be forwarded to the oscilloscope 300 so that the oscilloscope 300 can perform the compliance test on the target Ethernet interface 201.
[0034] Among them, the specific type of the target data packet can be set according to the requirements of the target test item, and the embodiment of the present application does not make specific restrictions on the type of the target data packet. For example, according to the IEEE Std 802.3 protocol, the compliance test of the target Ethernet interface 201 can include multiple test items, and for each test item, the type of the target data packet sent by the target Ethernet interface 201 is different. For example, the target data packet can include, but is not limited to, all "0" data packets, all "1" data packets, random data packets, or specified data packets, etc. When the current target test item is to test the maximum voltage value of the transmitted signal of the target Ethernet interface 201, the target data packet can be a random data packet. When performing tests for other test items, the target data packet can be an all "0" data packet, etc. The embodiment of the present application can determine the type of the target data packet according to the IEEE Std 802.3 protocol and actual requirements.
[0035] It should be noted that since the first link device can send a target data packet to the target Ethernet interface of the device under test in the link state, the target Ethernet interface of the device under test can forward the target data packet from the first link device to the oscilloscope. Compared with the related art, there is no need to design a circuit for generating the target data packet inside the device under test, saving the cost of the device under test.
[0036] The test system provided by an embodiment of the present application includes a first link device, a device under test, and an oscilloscope; the first link device has a first Ethernet interface, and the first Ethernet interface of the first link device is used to receive a link pulse signal to make the first Ethernet interface in a link state; the first Ethernet interface of the first link device is connected to a target Ethernet interface of the device under test, and the first Ethernet interface is used to send a target data packet to the target Ethernet interface of the device under test in the link state; the target Ethernet interface of the device under test is connected to the oscilloscope and is used to output the received target data packet to the oscilloscope, so that the oscilloscope performs a compliance test on the target Ethernet interface based on the target data packet. In this way, since the first link device can send a target data packet to the target Ethernet interface of the device under test in the link state, the target Ethernet interface of the device under test can forward the target data packet from the first link device to the oscilloscope, so that the oscilloscope performs a compliance test on the target Ethernet interface based on the target data packet. Compared with the related art, there is no need to set a circuit for generating a target data packet inside the device under test, saving the cost of the device under test.
[0037] In a specific embodiment, in order to make the first Ethernet interface 101 of the first link device receive a link pulse signal (Link pulse) and enter the link state, an embodiment of the present application can introduce a second link device into the test system, and use the second link device to send a link pulse signal to the first Ethernet interface of the first link device.
[0038] For example, as Figure 3 shown, in the test system provided by an embodiment of the present application, the test system 10 may further include a second link device 400. The second link device 400 has a second Ethernet interface 401, and the second Ethernet interface 401 of the second link device 400 is connected to the first Ethernet interface 101 of the first link device 100;
[0039] wherein, the second Ethernet interface 401 is configured in a link state, and the second Ethernet interface 401 is used to send a link pulse signal to the first Ethernet interface 101 in the link state to make the first Ethernet interface 101 in a link state.
[0040] In practical applications, embodiments of the present application can pre-configure the second link device 400. Specifically, the auto-negotiation capability of the second link device 400 is turned off, and at the same time, it is forced to link to 10M. According to the IEEE Std802.3 protocol, after the configuration is completed, the second link device 400 can continuously send link pulse signals to the first Ethernet interface 101 of the first link device 100 through the second Ethernet interface 401 and a pair of network cables (such as network cable pair 36). After the first Ethernet interface 101 detects the link pulse signal, it can successfully link to 10M and enter the link state.
[0041] At this time, the first Ethernet interface 101 can send the target data packet to the target Ethernet interface 201 of the device under test 200, so that the device under test 200 can subsequently forward any type of target data packet to the oscilloscope to achieve 10MTX compliance testing.
[0042] In this way, embodiments of the present application can introduce a second link device, and use the second link device to send link pulse signals to the first Ethernet interface of the first link device, so that the first Ethernet interface of the first link device can successfully enter the link state, facilitating the subsequent first Ethernet interface of the first link device to send the target data packet to the device under test in the link state.
[0043] In another specific embodiment, in order to enable the first Ethernet interface 101 of the first link device to receive the link pulse signal and enter the link state, and at the same time reduce the number of devices in the test system, embodiments of the present application can introduce another third Ethernet interface in the first link device, and use the third Ethernet interface to send link pulse signals to the first Ethernet interface of the first link device.
[0044] For example, as Figure 4 shown, in the test system provided by embodiments of the present application, the first link device 100 further has a third Ethernet interface 102, and the third Ethernet interface 102 of the first link device 100 is connected to the first Ethernet interface 101 of the first link device 100;
[0045] Among them, the third Ethernet interface 102 is configured in the link state, and the third Ethernet interface 102 sends link pulse signals to the first Ethernet interface 101 in the link state, so that the first Ethernet interface 101 is in the link state.
[0046] In practical applications, the embodiments of the present application can pre-configure the third Ethernet interface 102. Specifically, the third Ethernet interface 102 can be forced to link to 10M, so that the third Ethernet interface 102 enters the link state. According to the IEEE Std802.3 protocol, after the configuration is completed, the third Ethernet interface 102 can continuously send link pulse signals (Link pulse) to the first Ethernet interface 101 through a pair of network cables (such as network cable pair 36). After the first Ethernet interface 101 detects the link pulse signal (Link pulse), it can successfully link to 10M and enter the link state.
[0047] At this time, the first Ethernet interface 101 can send the target data packet to the target Ethernet interface 201 of the device under test 200, so that the device under test 200 can subsequently forward any type of target data packet to the oscilloscope to achieve 10MTX compliance testing.
[0048] In this way, the embodiments of the present application can set a third Ethernet interface 102 that is forced to link to 10M in the first link device, and use the third Ethernet interface 102 to send link pulse signals to the first Ethernet interface 101 of the first link device, so that the first Ethernet interface 101 of the first link device successfully enters the link state, so that the first Ethernet interface 101 of the first link device can send the target data packet to the device under test in the link state subsequently. And, compared with Figure 3 the embodiment shown, there is no need to introduce a second link device, reducing the number of devices in the test system, and the device architecture in the test system is simpler.
[0049] In practical applications, in order to enable the first Ethernet interface of the first link device to send the target data packet to the target Ethernet interface of the device under test in the link state, the first link device can obtain the target data packet from other devices or generate the target data packet itself. The embodiments of the present application do not specifically limit the source of the target data packet obtained by the first Ethernet interface of the first link device. Examples are given below respectively.
[0050] In a specific embodiment, referring to Figure 3 or Figure 4 , the first link device 100 can be a switch, and the first link device 100 also has a fourth Ethernet interface 103, and the fourth Ethernet interface 103 is connected to the first Ethernet interface 101;
[0051] Among them, the fourth Ethernet interface 103 of the first link device 100 is used to receive the target data packet and transmit the target data packet to the first Ethernet interface 101 of the first link device 100.
[0052] It can be understood that since the first link device 100 is a switch, the fourth Ethernet interface 103 can automatically forward the received data to the first Ethernet interface 101, and the first Ethernet interface 101 then forwards the data to the target Ethernet interface 201 of the device under test 200 through a network cable.
[0053] Wherein, the test system may further include a data sending device 500, and the data sending device 500 is connected to the fourth Ethernet interface 103; the data sending device 500 is configured to send a target data packet to the fourth Ethernet interface 103 of the first link device 100.
[0054] Specifically, the data sending device 500 can be a device that can generate and send Ethernet data of any type. The data sending device 500 can generate a target data packet required for a target test item, and send the target data packet to the fourth Ethernet interface 103 of the first link device 100 through a sending interface 501. Then, the fourth Ethernet interface 103 can automatically forward the received target data packet to the first Ethernet interface 101, and the first Ethernet interface 101 then forwards the target data packet to the target Ethernet interface 201 of the device under test 200 through a network cable. When the target Ethernet interface 201 is configured with a remote loopback function, it forwards the received target data packet to the oscilloscope 300.
[0055] In this way, the embodiment of the present application can use the data sending device 500 to generate a target data packet of the type required for a target test item, and then send the target data packet to the fourth Ethernet interface 103 of the first link device 100. The fourth Ethernet interface 103 can automatically forward the received target data packet to the first Ethernet interface 101, and the first Ethernet interface 101 then forwards the target data packet to the target Ethernet interface 201 of the device under test 200 through a network cable, and the target Ethernet interface 201 forwards the received target data packet to the oscilloscope 300. Wherein, the data sending device 500 can generate and send Ethernet data of any type, which is convenient for testing multiple test items.
[0056] In another specific embodiment, the target data packet can be generated and sent by a data generation module in the first link device. For example, referring to Figure 5 , the first link device 100 may further include a data generation module 104, and the data generation module 104 is connected to the fourth Ethernet interface 103;
[0057] Wherein, the data generation module 104 is configured to generate the target data packet and output the target data packet to the fourth Ethernet interface 103 of the first link device.
[0058] In this way, the data generation module 104 of the first link device 100 in the embodiment of the present application can generate target data packets of the required type for the target test item, and then send the target data packets to the fourth Ethernet interface 103. The fourth Ethernet interface 103 can automatically forward the received target data packets to the first Ethernet interface 101. The first Ethernet interface 101 then forwards the target data packets to the target Ethernet interface 201 of the device under test 200 through a network cable. The target Ethernet interface 201 forwards the received target data packets to the oscilloscope 300. And, compared with Figure 3 or Figure 4 the embodiment shown, there is no need to introduce a data sending device, reducing the number of devices in the test system, and the device architecture in the test system is simpler.
[0059] In addition, the types of the interfaces of the target Ethernet interface 201 of the device under test 200 and the input channel of the oscilloscope 300 are different. In order to connect the target Ethernet interface 201 of the device under test 200 to the input channel interface of the oscilloscope 300, the embodiment of the present application can use an Ethernet test fixture with interface conversion function and connection function, so that the target Ethernet interface of the device under test is connected to the oscilloscope through the Ethernet test fixture.
[0060] For example, as Figure 3 or Figure 4 shown, the test system 10 may further include an Ethernet test fixture 600. The first Ethernet interface 101 of the first link device 100 is connected to the target Ethernet interface 201 of the device under test 200 through the Ethernet test fixture 600. The target Ethernet interface 201 of the device under test 200 is connected to the oscilloscope 300 through the Ethernet test fixture 600.
[0061] In this way, the Ethernet test fixture can be respectively connected to two different types of interfaces, namely the first Ethernet interface 101 of the first link device 100 and the input channel interface of the oscilloscope 300, and conveniently connect the target Ethernet interface 201 of the test device 200 to the oscilloscope 300.
[0062] In practical applications, the conformance test of the target Ethernet interface 201 may include multiple test items. When testing each test item, different types of loads are also connected between the target Ethernet interface 201 of the device under test 200 and the oscilloscope 300. Different types of loads can be integrated in the Ethernet test fixture. By switchably connecting different types of loads on the Ethernet test fixture, it is more convenient to test each test item.
[0063] For example, as Figure 3As shown, the Ethernet test fixture 600 may include a first interface 601, a second interface 602, a target load 603, and a target test point 604. The first interface 601 and the second interface 602 are connected, and the second interface 602 is connected to the target test point 604 through the target load 603;
[0064] The first Ethernet interface 101 of the first link device 100 is connected to the first interface 601 through a first pair of network cables, so that the first Ethernet interface 601 of the first link device is conducted to the target Ethernet interface 201 of the device under test through the first pair of network cables, the first interface 601, and the second interface 602; the first Ethernet interface 101 of the first link device is configured to send a target data packet to the target Ethernet interface 201 of the device under test through the first pair of network cables, the first interface 601, and the second interface 602 in the link state;
[0065] The target test point 604 of the Ethernet test fixture 600 is connected to the oscilloscope 300, so that the target Ethernet interface 201 of the device under test is conducted to the oscilloscope 300 through the second interface 602, the target load 603, and the target test point 604; the target Ethernet interface 201 of the device under test is configured to send a target data packet to the oscilloscope 300 through the second interface 602, the target load 603, and the target test point 604 in the link state.
[0066] Wherein, the first interface 601 and the second interface 602 provided in the embodiments of the present application may be RJ45 type network interfaces, or other types of Ethernet interfaces. The embodiments of the present application do not limit the specific models of the first interface 601 and the second interface 602.
[0067] Wherein, the target test point 604 of the Ethernet test fixture 600 may be connected to the target input channel of the oscilloscope 300 through a differential probe 301.
[0068] Wherein, the target load 603 may be the load required for the target test item. The target load 603 may be selected and accessed from multiple loads integrated on the Ethernet test fixture according to the actual requirements of the target test item. The embodiments of the present application do not specifically limit the type of the target load 603. For example, when the target load 603 is a 100-ohm load, the target test item is to test and obtain the maximum voltage value of the transmitted signal output by the Ethernet interface.
[0069] Among them, the target test point 604 can also be the test point to be accessed for the target test item. The target test point 604 can be selected and accessed from multiple test points integrated on the Ethernet test fixture according to the actual requirements of the target test item. This application does not specifically limit the type of the target test point 604.
[0070] In this way, different types of loads are integrated on the Ethernet test fixture. When the target Ethernet interface 201 of the device under test 200 is connected to the oscilloscope 300 through the Ethernet test fixture 600, it is more convenient to test each test item through the interface provided by the Ethernet test fixture.
[0071] In addition, it should also be pointed out that in practical applications, the network cable can include 8 cores: among them, a pair of network cables numbered 1 and 2 are generally used as transmission lines, a pair of network cables numbered 3 and 6 are generally used as receiving lines, a pair of network cables numbered 4 and 5 are generally reserved, and a pair of network cables numbered 7 and 8 are generally reserved. Among them, the network cable pair 12 is used as a twisted pair and the network cable pair 36 is used as a twisted pair and integrated into one network cable. In the prior art, refer to Figure 2 , when the linking device accesses the Ethernet test fixture through a network cable, although the network cable pair Pair36 (i.e., the receiving line) in the network cable also accesses the Ethernet test fixture, however, the linking device is specifically electrically connected to the device under test only through a pair of network cables (network cable pair Pair12), and the other pair of network cables (network cable pair Pair36, i.e., the receiving line) of the linking device is substantially disconnected. According to the IEEE Std802.3 protocol, there is no signal on the receiving line of the linking device, making the linking device unable to link at 10M.
[0072] Based on this, an embodiment of this application provides a special one-to-two network cable. The first end of the one-to-two network cable is connected to the first Ethernet interface 101, the second end of the one-to-two network cable is connected to the first interface 601 of the Ethernet test fixture, and the third end of the one-to-two network cable is connected to the second Ethernet interface 401 of the second linking device 400 or the third Ethernet interface 102 of the first linking device 100, thereby realizing that the one-to-two network cable accesses three network interfaces at the same time, enabling the first Ethernet interface 101 to receive link pulse signals through the third end of the one-to-two network cable and send link pulse signals or target data packets through the second end of the one-to-two network cable. The following is an example.
[0073] For example, as Figure 3 shown, when the test system includes the second linking device 400, the first Ethernet interface 101 of the first linking device 100 is connected to the second Ethernet interface 401 of the second linking device 400 through the second pair of network cables;
[0074] The second Ethernet interface 401 of the second link device 400 is used to send link pulse signals to the first Ethernet interface 101 through the second pair of network cables in the link state.
[0075] Among them, the first Ethernet interface 101 and the first interface 601 are connected by a first pair of network cables, the first Ethernet interface 101 and the second Ethernet interface 401 are connected via a second pair of network cables, and the first pair of network cables and the second pair of network cables can be integrated into one network cable, which is a one-to-two network cable and can connect the first Ethernet interface 101, the second Ethernet interface 401 and the first interface 601 at the same time, so that the first Ethernet interface 101 can receive link pulse signals from the second Ethernet interface 401 through the one-to-two network cable, and can also send link pulse signals or target data packets to the target Ethernet interface 201 through the one-to-two network cable.
[0076] For another example, as Figure 4 shown, when the first link device 100 further has a third Ethernet interface 102, the first Ethernet interface 101 of the first link device 100 is connected to the third Ethernet interface 102 of the first link device 100 through a third pair of network cables;
[0077] The third Ethernet interface 102 is used to send link pulse signals to the first Ethernet interface 101 through the third pair of network cables in the link state.
[0078] Among them, the first Ethernet interface 101 and the first interface 601 are connected by a first pair of network cables, the first Ethernet interface 101 and the third Ethernet interface 102 are connected via a third pair of network cables, and the first pair of network cables and the third pair of network cables can be integrated into one network cable, which is a one-to-two network cable and can connect the first Ethernet interface 101, the third Ethernet interface 102 and the first interface 601 at the same time, so that the first Ethernet interface 101 can receive link pulse signals from the third Ethernet interface 102 through the one-to-two network cable, and can also send link pulse signals or target data packets to the target Ethernet interface 201 through the one-to-two network cable.
[0079] In this way, the embodiment of the present application can access the first Ethernet interface 101 through a customized one-to-two network cable, so that the first Ethernet interface 101 can receive link pulse signals from one Ethernet interface through the one-to-two network cable, and can also send link pulse signals or target data packets to another Ethernet interface through the one-to-two network cable, ensuring that the first Ethernet interface 101 of the first link device 100 can send and receive data when successfully entering the link state (for example, linked to 10M).
[0080] In addition, the embodiments of the present application can be applied to the 10M TX compliance test of the device under test 200, or can also be applied to the 100M TX compliance test of the device under test 200. The embodiments of the present application do not limit the specific application scenarios.
[0081] Moreover, regardless of the type of Ethernet interface device of the device under test 200, the test system provided by any embodiment of the present application can be used to implement the 10M TX compliance test without complex configuration of the device under test 200.
[0082] In addition, it should be noted that according to the IEEE Std 802.3 protocol, since the target Ethernet interface 201 of the device under test 200 cannot actively send data packets in the 10M TX compliance test, the embodiments of the present application applied to the 10M TX compliance test of the device under test 200 can significantly reduce the design cost of the device under test 200.
[0083] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit them. Although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements for some of the technical features. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the present invention.
Claims
1. A testing system, characterized in that: include: A first linking device (100), a device to be tested (200) and an oscilloscope (300); The first linking device (100) has a first Ethernet interface (101), and the first Ethernet interface (101) of the first linking device (100) is used to receive a link pulse signal so that the first Ethernet interface (101) is in a link state; The first Ethernet interface (101) of the first linking device (100) is connected to a target Ethernet interface (201) of the device to be tested (200), and the first Ethernet interface (101) is used to send a target data packet to the target Ethernet interface (201) of the device to be tested (200) in a linking state; The target Ethernet interface (201) of the device to be tested (200) is connected to the oscilloscope (300) and is used to output the received target data packet to the oscilloscope (300), so that the oscilloscope (300) performs a consistency test on the target Ethernet interface (201) based on the target data packet.
2. The test system according to claim 1, characterized in that: The test system further comprises a second linking device (400), wherein the second linking device (400) has a second Ethernet interface (401), and the second Ethernet interface (401) of the second linking device (400) is connected to the first Ethernet interface (101) of the first linking device (100); The second Ethernet interface (401) is configured to be in a link state, and the second Ethernet interface (401) is used to send a link pulse signal to the first Ethernet interface (101) in the link state, so that the first Ethernet interface (101) is in a link state.
3. The test system according to claim 1, characterized in that: The first linking device (100) further has a third Ethernet interface (102), and the third Ethernet interface (102) of the first linking device (100) is connected to the first Ethernet interface (101) of the first linking device (100); The third Ethernet interface (102) is configured to be in a link state, and the third Ethernet interface (102) sends a link pulse signal to the first Ethernet interface (101) in the link state, so that the first Ethernet interface (101) is in a link state.
4. The test system according to any one of claims 1 to 3, characterized in that: The first linking device (100) is a switch, and the first linking device (100) further has a fourth Ethernet interface (103), and the fourth Ethernet interface (103) is connected to the first Ethernet interface (101); The fourth Ethernet interface (103) of the first link device (100) is used to receive the target data packet and transmit the target data packet to the first Ethernet interface (101) of the first link device (100).
5. The test system according to claim 4, characterized in that: The test system further comprises a data sending device, wherein the data sending device is connected to the fourth Ethernet interface (103); The data sending device is used to send a target data packet to the fourth Ethernet interface (103) of the first link device (100).
6. The test system according to claim 4, characterized in that: The first linking device (100) comprises a data generation module (104), the data generation module being connected to the fourth Ethernet interface (103); The data generation module (104) is used to generate the target data packet and output the target data packet to the fourth Ethernet interface (103) of the first link device (100).
7. The test system according to any one of claims 1 to 3, characterized in that: The test system further comprises an Ethernet test fixture (600), wherein the first Ethernet interface (101) of the first linking device (100) is connected to the target Ethernet interface (201) of the device to be tested (200) via the Ethernet test fixture (600), and the target Ethernet interface (201) of the device to be tested (200) is connected to the oscilloscope (300) via the Ethernet test fixture (600).
8. The test system according to claim 7, characterized in that: The Ethernet test fixture (600) comprises a first interface (601), a second interface (602), a target load (603) and a target test point (604), wherein the first interface (601) is connected to the second interface (602), and the second interface (602) is connected to the target test point (604) via the target load (603); The first Ethernet interface (101) of the first link device (100) is connected to the first interface (601) via a first pair of network cables, so that the first Ethernet interface (101) of the first link device (100) is connected to the target Ethernet interface (201) of the device to be tested (200) via the first pair of network cables, the first interface (601), and the second interface (602); the first Ethernet interface (101) of the first link device (100) is used to send a target data packet to the target Ethernet interface (201) of the device to be tested (200) via the first pair of network cables, the first interface (601), and the second interface (602) in a link state; The target test point (604) of the Ethernet test fixture (600) is connected to the oscilloscope (300) so that the target Ethernet interface (201) of the device to be tested (200) is connected to the oscilloscope (300) via the second interface (602), the target load (603) and the target test point (604); the target Ethernet interface (201) of the device to be tested (200) is used to send a target data packet to the oscilloscope (300) via the second interface (602), the target load (603) and the target test point (604) in a linked state.
9. The test system according to claim 8, characterized in that: In the case where the test system includes a second link device (400), the first Ethernet interface (101) of the first link device (100) is connected to the second Ethernet interface (401) of the second link device (400) via a second pair of network cables; The second Ethernet interface (401) of the second linking device (400) is used to send a link pulse signal to the first Ethernet interface (101) through the second pair of network cables in a link state.
10. The test system according to claim 8, characterized in that: In the case where the first link device (100) further has a third Ethernet interface (102), the first Ethernet interface (101) of the first link device (100) is connected to the third Ethernet interface (102) of the first link device (100) via a third pair of network cables; The third Ethernet interface (102) is used to send a link pulse signal to the first Ethernet interface (101) through the third pair of network cables in a link state.