Test adapter plate and test system of switch
By providing a test adapter board containing high-speed connectors and optical modules, the network blockage caused by failures of other modules when testing VPX switches is solved, and separate testing of VPX switches is realized, which improves the independence and accuracy of the test and reduces costs.
Patent Information
- Application Number
- CN202421941085.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-12
- Publication Date
- 2025-06-20
- Estimated Expiration
- 2034-08-12
AI Technical Summary
When testing a VPX switch, failures in the VPX computing board, VPX storage board or VPX chassis backplane will cause network failure and it is impossible to determine whether there are problems with the VPX switch, which increases the difficulty of fault diagnosis. In addition, building a test environment requires the cooperation of multiple components, which is inefficient and cost-effective.
It provides a test adapter board, including a high-speed connector and an optical module, which can independently connect the VPX switch to the network tester to transmit data through optical communication, realize separate testing of the VPX switch to avoid the failure of other modules affecting the test results.
It improves the independence and accuracy of VPX switch testing, reduces the testing cost, simplifies the construction of the test environment, and reduces the difficulty of fault diagnosis.
Smart Images
Figure CN223007577U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of network equipment testing, and in particular to a test adapter board and a test system for a switch. Background Art
[0002] Versa Module Europa (VME) bus extension switch architecture (VMEbus International Trade Association, VITA46 or VPX) switches play a vital role in high-performance computing and storage systems, especially in military, aerospace and industrial control applications that require high reliability and high bandwidth. To test a VPX switch, the VPX switch needs to be inserted into the backplane at the rear of the VPX chassis together with the VPX computing board and the VPX storage board, and high-speed data exchange is used to determine whether the VPX switch is normal.
[0003] However, when testing the performance of a VPX switch, any problem in any link of the entire test link, such as the VPX computing board, VPX storage board, or VPX chassis backplane, will cause network failure. In this case, it is impossible to determine whether there is a problem with the VPX switch alone, which increases the difficulty of fault diagnosis. At the same time, building a test environment requires the cooperation of multiple components, including the VPX chassis, VPX computing board, and VPX storage board, making the work of testing whether there is a problem with the VPX switch inefficient and costly. Utility Model Content
[0004] In view of this, the present application provides a switch test adapter board and a test system, which can improve the accuracy of testing the VPX switch.
[0005] The present application provides a test adapter board for a switch, comprising: a high-speed connector and an optical module; the first end of the high-speed connector is used to connect to a VPX switch to be tested; the second end of the high-speed connector is connected to the first end of the optical module; the second end of the optical module is used to connect to a network tester; the network tester is used to test the VPX switch to be tested through data forwarded by the test adapter board.
[0006] Preferably, a high-speed differential line is further provided on the test adapter board; the second end of the high-speed connector is connected to the first end of the optical module through the high-speed differential line.
[0007] Preferably, the high-speed differential line includes: a high-speed differential receiving line and a high-speed differential transmitting line; a first end of the high-speed differential receiving line is connected to a receiving port of a second end of the high-speed connector; a second end of the high-speed differential receiving line is connected to a transmitting port of a first end of the optical module; a first end of the high-speed differential transmitting line is connected to a transmitting port of a second end of the high-speed connector; a second end of the high-speed differential transmitting line is connected to a receiving port of a first end of the optical module.
[0008] Preferably, there are N high-speed differential receiving lines and N high-speed differential transmitting lines, where N is an integer greater than or equal to 2; the N high-speed differential receiving lines and the N high-speed differential transmitting lines correspond one by one and form differential pair lines.
[0009] Preferably, the test adapter board includes a signal female socket; both the first end and the second end of the high-speed connector are arranged on the signal female socket.
[0010] Preferably, the optical module includes: N optical cages; the N optical cages correspond one by one to N groups of differential pair lines; each optical cage is used for inserting an optical conversion module; the optical conversion module converts the high-speed differential signal received by the receiving port of the first end of the optical module into an optical signal and sends it to the transmitting port of the second end of the optical module; the optical conversion module converts the optical signal received by the receiving port of the second end of the optical module into a high-speed differential signal and sends it to the transmitting port of the first end of the optical module.
[0011] Preferably, the test adapter board further includes: a switch and a power supply module; a first end of the switch is connected to the power supply module, and the power supply module is used to connect to an external power supply; a second end of the switch is connected to a power supply port; the power supply port is used to connect to a power supply port of the VPX switch to be tested.
[0012] Preferably, the test adapter board includes a power female socket, and the power supply port is arranged on the power female socket.
[0013] Preferably, the test adapter board is a printed circuit board.
[0014] This application also provides a test system, including: a VPX switch to be tested, a network tester, and the test adapter board introduced above; the network tester is used to test the VPX switch to be tested through the test adapter board.
[0015] Thus, this application has the following beneficial effects:
[0016] The test adapter board provided by this application includes a high-speed connector and an optical module. Among them, the high-speed connector can be inserted and matched with the high-speed connector on the VPX switch to be tested. The optical module can be connected to a network tester to achieve optical communication transmission of data. The network tester can perform tests on the VPX switch to be tested, so that the VPX switch to be tested can be separated from the VPX chassis for individual testing. The test adapter board realizes high-speed data forwarding between the VPX switch to be tested and the network tester, avoiding the influence of other module failures on the test results, such as the VPX computing board or the VPX storage board, etc., thereby improving the independence and accuracy of VPX switch testing. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] Figure 1 It is a schematic diagram of a test adapter board provided by an embodiment of this application;
[0018] Figure 2 It is a schematic diagram of another test adapter board provided by an embodiment of this application;
[0019] Figure 3 It is a schematic diagram of yet another test adapter board provided by an embodiment of this application;
[0020] Figure 4 It is a schematic diagram of another test adapter board provided by an embodiment of this application;
[0021] Figure 5 It is a schematic diagram of a test system provided by an embodiment of this application. DETAILED DESCRIPTION OF THE EMBODIMENTS
[0022] To make the above objects, features, and advantages of this application more obvious and understandable, the following further details the embodiments of this application in conjunction with the drawings and specific implementation manners.
[0023] In the traditional solution, the VPX switch needs to be inserted into the VPX backplane in the VPX chassis together with the VPX computing board and the VPX storage board, and the signal is exchanged through the VPX backplane to determine whether the VPX switch is normal. However, if any one of the VPX backplane, the VPX storage board, and the VPX computing board is damaged, the signal cannot be transmitted normally. At this time, it is impossible to determine whether the VPX switch is functioning properly. At the same time, using the VPX chassis to test the VPX switch requires the cooperation of multiple components, with low work efficiency and high cost.
[0024] The purpose of the test adapter board provided by this application is to: simulate the application of the VPX chassis through the test adapter board and test the VPX switch individually.
[0025] See Figure 1 , which is a schematic diagram of a test adapter board for a switch provided by an embodiment of this application.
[0026] The test adapter board 100 of the switch provided by the embodiment of the present application includes: a high-speed connector 101 and an optical module 102. The first end of the high-speed connector 101 is used to connect to the VPX switch 200 to be tested. The second end of the high-speed connector 101 is connected to the first end of the optical module 102. The second end of the optical module 102 is used to connect to the network tester 300.
[0027] The working principle of the test adapter board provided by the embodiment of the present application is introduced below.
[0028] After the high-speed connector 101 of the test adapter board 100 receives the electrical signal sent by the VPX switch 200 to be tested, the electrical signal is sent to the optical module 102 through the internal circuit of the test adapter board. After the optical module 102 converts the electrical signal into an optical signal, the optical signal is sent to the network tester 300 through an optical fiber.
[0029] After the optical module 102 of the test adapter board receives the optical signal sent by the network tester through the optical fiber, the optical signal is converted into an electrical signal and sent to the high-speed connector 101. The high-speed connector 101 sends the received electrical signal to the VPX switch 200 to be tested.
[0030] So far, one test of the VPX switch 200 to be tested is completed.
[0031] The test adapter board provided by the embodiment of the present application only connects the VPX switch to be tested and the network tester, and completes the data exchange between the VPX switch to be tested and the network tester. The test adapter board provided by the embodiment of the present application simulates the function of the backplane in the VPX chassis, avoids the construction of a complex environment in the VPX chassis, reduces the cost and improves the test efficiency at the same time. At the same time, the network tester undertakes the functions of the VPX computing board and the VPX storage board in the VPX chassis. By testing the VPX switch to be tested through the test adapter board, it can accurately judge whether the function of the VPX switch to be tested is normal. In addition, the test adapter board and the network tester provided by the embodiment of the present application are connected by an optical fiber, ensuring the portability of the test adapter board.
[0032] See Figure 2 , this figure is a schematic diagram of another test adapter board provided by the embodiment of the present application.
[0033] The purpose of another test adapter board provided by the embodiment of the present application is to specifically describe the internal circuit of the test adapter board.
[0034] A high-speed differential line 103 is also provided on the test adapter board 100. The second end of the high-speed connector is connected to the first end of the optical module through the high-speed differential line 103.
[0035] It should be understood that the embodiments of the present application do not specifically limit the type of high-speed differential signals transmitted by the high-speed differential lines. For example, it can be 1000BASE-X (gigabit rate), SGMII (gigabit rate), or 10GBASE-KR (10-gigabit rate). These high-speed differential signals can all be converted into optical signals by the optical module and then transmitted to the network tester through the optical fiber.
[0036] The high-speed differential line 103 includes: a high-speed differential receiving line and a high-speed differential transmitting line.
[0037] The first end of the high-speed differential receiving line is connected to the receiving port of the second end of the high-speed connector. The second end of the high-speed differential receiving line is connected to the receiving port of the first end of the optical module. The first end of the high-speed differential transmitting line is connected to the transmitting port of the second end of the high-speed connector. The second end of the high-speed differential transmitting line is connected to the transmitting port of the first end of the optical module.
[0038] There are N high-speed differential receiving lines and N high-speed differential transmitting lines, where N is an integer greater than or equal to 2. The N high-speed differential receiving lines and the N high-speed differential transmitting lines form differential pair lines in one-to-one correspondence, namely 1031, 1032 to 103N.
[0039] Next, the working principle of another test adapter board provided by the embodiments of the present application will be introduced.
[0040] After the first end of the high-speed connector of the test adapter board 100 receives the high-speed differential signal sent by the VPX switch to be tested, the transmitting port of the second end of the high-speed connector sends the high-speed differential signal to the receiving port of the first end of the optical module through the high-speed differential transmitting line. After converting the high-speed differential signal into an optical signal, the optical module sends the optical signal to the network tester through the optical fiber.
[0041] After the optical module receives the optical signal sent back by the network tester through the optical fiber, it converts the optical signal into a high-speed differential signal, and the transmitting port of the first end of the optical module sends the high-speed differential signal to the receiving port of the second end of the high-speed connector through the high-speed differential receiving line.
[0042] So far, one test of the VPX switch to be tested is completed.
[0043] Since the test adapter board of the embodiments of the present application has multiple sets of differential pair lines, the test adapter board provided by the embodiments of the present application can test multiple pairs of differential signals of the connector of the VPX switch to be tested in one test cycle. The embodiments of the present application do not specifically limit the value of N, and it can be specifically determined according to the number of differential interfaces of the connector of the VPX switch to be tested.
[0044] In the test adapter board provided by the embodiment of the present application, the high-speed differential receiving line is used to receive the high-speed differential signal transmitted back by the network tester, and the high-speed differential transmitting line is used to send the high-speed differential signal to the network tester. The high-speed differential receiving line and the high-speed differential transmitting line have clear division of labor, ensuring the accuracy of the high-speed differential signal transmission between the VPX switch under test and the network tester. At the same time, the test adapter board provided by the embodiment of the present application further improves the accuracy of judging the switching function of the VPX switch under test by exchanging the signals between the VPX switch under test and the network tester multiple times within one test time.
[0045] See Figure 3 , which is a schematic diagram of another test adapter board provided by the embodiment of the present application.
[0046] Another test adapter board 100 provided by the embodiment of the present application, wherein the optical module 102 includes: N optical cages, namely Figure 3 1021, 1022 to 102N in it, and N is an integer greater than or equal to 2. The N optical cages correspond to N groups of differential pair lines one by one, that is, 1031 corresponds to 1021, 1032 corresponds to 1022 to 103N corresponds to 102N. Each optical cage is used to insert an optical conversion module.
[0047] It should be understood that the embodiment of the present application does not limit the specific model of the optical conversion module, as long as it can complete the mutual conversion between optical signals and high-speed differential signals.
[0048] Next, the working principle of the optical module of another test adapter board provided by the embodiment of the present application is introduced.
[0049] When the VPX switch under test sends a signal to the network tester, the optical conversion module converts the high-speed differential signal received by the receiving port at the first end of the optical module into an optical signal and sends it to the transmitting port at the second end of the optical module.
[0050] When the network tester sends a signal to the VPX switch under test, the optical conversion module converts the optical signal received by the receiving port at the second end of the optical module into a high-speed differential signal and sends it to the transmitting port at the first end of the optical module.
[0051] The optical module of another test adapter board provided by the embodiment of the present application completes the conversion function between high-speed differential signals and optical signals. Therefore, the test adapter board can be connected to the network tester through an optical fiber, thus eliminating the need to build a complex VPX chassis test environment and improving the test efficiency of the VPX switch under test. In addition, the test adapter board provided by the embodiment of the present application and the network tester are connected through an optical fiber, ensuring the portability of the test adapter board.
[0052] See Figure 4 , which is a schematic diagram of another test adapter board provided by the embodiment of the present application.
[0053] Another test adapter board provided by an embodiment of the present application further includes a power supply module 104 and a switch 105. The power supply module 104 can supply power to the VPX switch to be tested, so as to realize the power-off test of the VPX switch to be tested. The first end of the switch 105 is connected to the power supply module 104, and the power supply module 104 is used to connect to an external power supply. In a possible implementation manner, the external power supply is a 12V power supply. The second end of the switch 105 is connected to the power supply port. The power supply port is used to connect to the power supply port of the VPX switch to be tested.
[0054] Another test adapter board provided by an embodiment of the present application includes a signal female socket 107. The first end and the second end of the high-speed connector are arranged on the signal female socket 107. The test adapter board further includes a power female socket 106, and the power supply port is arranged on the power female socket 106.
[0055] In a possible implementation manner, the test adapter board is a printed circuit board.
[0056] Another test adapter board provided by an embodiment of the present application controls whether to supply power to the VPX switch to be tested through a switch. When testing is required, the switch is turned on, and when the test is completed, the switch is turned off, avoiding waste of energy. Another test adapter board provided by an embodiment of the present application fixes the high-speed connector on the signal female socket, making the high-speed connector more stable in structural connection and ensuring the stability of the test adapter board. Another test adapter board provided by an embodiment of the present application is a printed circuit board, which facilitates the production of the circuit board and reduces the cost.
[0057] See Figure 5 , which is a schematic diagram of a test system provided by an embodiment of the present application.
[0058] An embodiment of the present application provides a test system, including: a VPX switch 200 to be tested, a network tester 300, and the test adapter board 100 introduced in any of the above embodiments.
[0059] The network tester 300 is used to test the VPX switch to be tested through the test adapter board.
[0060] The working principle of a test system provided by an embodiment of the present application is introduced below.
[0061] In a possible implementation manner, the VPX switch 200 to be tested includes: a switching chip and a male high-speed connector. The switching chip is used to control the male high-speed connector to send and receive high-speed differential signals. The number of differential pair lines of the VPX switch to be tested is 2.
[0062] The number of paired lines of the test adapter board 100 introduced in any of the above embodiments is 2, the number of optical modules of the test adapter board introduced in any of the above embodiments is 2, and the high-speed connector of the test adapter board introduced in any of the above embodiments is a female high-speed connector. The working principle of the test adapter board provided in the embodiments of the present application is the same as that of the test adapter board introduced in any of the above embodiments, and will not be explained in detail here.
[0063] For example, the network tester 300 includes: 2 optical modules. The network tester is used to compare the sizes of the data packets sent and received by itself to determine whether the bandwidth of the VPX switch under test and the functions of the VPX switch under test are normal.
[0064] Since the embodiments of the present application use the test adapter board introduced in any of the above embodiments to test the VPX switch under test, it gets rid of the complex VPX chassis test system and can accurately determine whether the functions of the VPX switch under test are normal. At the same time, because the test system of the embodiments of the present application uses the test adapter board introduced in any of the above embodiments, the cost is much lower than that of the VPX chassis test system.
[0065] It should be noted that the various embodiments in this specification are described in a progressive manner. Each embodiment focuses on the differences from other embodiments. The same or similar parts among the various embodiments can be referred to each other. For the systems or devices disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the descriptions are relatively simple, and the relevant parts can be referred to the descriptions in the method part.
[0066] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present application. Various modifications to these embodiments will be obvious to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims
1. A test adapter board for a switch, characterized in that: include: High-speed connectors and optical modules; The first end of the high-speed connector is used to connect to the VPX switch to be tested; The second end of the high-speed connector is connected to the first end of the optical module; The second end of the optical module is used to connect to a network tester; The network tester is used to test the VPX switch to be tested through the data forwarded by the test adapter board.
2. The test adapter board according to claim 1, characterized in that: A high-speed differential line is also provided on the test adapter board; the second end of the high-speed connector is connected to the first end of the optical module through the high-speed differential line.
3. The test adapter board according to claim 2, characterized in that: The high-speed differential circuit includes: a high-speed differential receiving circuit and a high-speed differential transmitting circuit; The first end of the high-speed differential receiving line is connected to the receiving port of the second end of the high-speed connector; the second end of the high-speed differential receiving line is connected to the transmitting port of the first end of the optical module; The first end of the high-speed differential transmission line is connected to the transmission port of the second end of the high-speed connector; the second end of the high-speed differential transmission line is connected to the receiving port of the first end of the optical module.
4. The test adapter board according to claim 3, characterized in that: The high-speed differential receiving circuits include N circuits, and the high-speed differential transmitting circuits include N circuits, where N is an integer greater than or equal to 2; The N high-speed differential receiving lines correspond one-to-one to the N high-speed differential transmitting lines, and form a differential pair of lines.
5. The test adapter board according to claim 3, characterized in that: The test adapter board includes a signal female socket; The first end and the second end of the high-speed connector are both arranged on the signal female socket.
6. The test adapter board according to claim 4, characterized in that: The optical module includes: N optical cages; N optical cages correspond to N groups of differential pair lines one by one; each optical cage is used to insert an optical conversion module; The optical conversion module converts the high-speed differential signal received by the receiving port at the first end of the optical module into an optical signal and sends the optical signal to the sending port at the second end of the optical module; The optical conversion module converts the optical signal received by the receiving port at the second end of the optical module into a high-speed differential signal and sends the signal to the sending port at the first end of the optical module.
7. The test adapter board according to any one of claims 1 to 6, characterized in that: The test adapter board also includes: a switch and a power supply module; The first end of the switch is connected to the power module, and the power module is used to connect to an external power source; The second end of the switch is connected to the power supply port; The power supply port is used to connect to the power supply port of the VPX switch to be tested.
8. The test adapter board according to claim 7, characterized in that: The test adapter board comprises a power socket, and the power supply port is arranged on the power socket.
9. The test adapter board according to any one of claims 1 to 6, characterized in that: The test adapter board is a printed circuit board.
10. A testing system, characterized in that: include: A VPX switch to be tested, a network tester, and a test adapter board as described in any one of claims 1 to 9; The network tester is used to test the VPX switch to be tested through the test adapter board.