High and low temperature test fixture

Abstract

The utility model discloses a high and low temperature test clamp, and aims to solve the technical problem that the applicability of the clamp in the market is reduced because the test clamp in the market in the prior art can only clamp and fix chips of one type and then carry out high and low temperature test experiments. The test fixture comprises a placement plate, and adjusting rods are connected to openings in the two ends of the placement plate; an adjusting rod is arranged on the surface of the placing plate, one end of the adjusting rod is connected with a connecting block, one end, close to the connecting block, of the adjusting rod is connected with a rotating block, the other side of the connecting block is connected with a clamping plate, and the surface of one side of the clamping plate is connected with a protection pad. And the protection pad on one side of the clamping plate is stably clamped with the chip, so that high and low temperature tests can be conveniently carried out on the chip, clamping tests can be conveniently carried out on signals of different models, and the applicability of the clamp is improved.

Description

Technical Field

[0001] The utility model belongs to the technical field of chip testing, and particularly relates to a high and low temperature testing fixture. Background Art

[0002] In modern electronic devices, as the core component, the chip needs to work properly under various temperature conditions. However, due to the limitations of manufacturing processes and the influence of material properties, the chip may experience problems such as performance degradation, faults, or even failures when the temperature changes;

[0003] Therefore, performing high and low temperature tests on chips is an important means to ensure their reliability and stability. During the high and low temperature test process, many challenges are faced. First, temperature changes may cause thermal stress inside the chip, resulting in changes in the microscopic structure inside the chip and affecting its performance and reliability. Second, temperature changes may cause changes in the physical properties of the chip material, such as thermal expansion and thermal contraction, leading to a decrease in the mechanical properties of the chip. Finally, temperature changes may cause changes in the electrical properties of the chip, such as resistance and capacitance, resulting in signal transmission distortion and errors;

[0004] However, the existing high and low temperature test fixtures have the following problems during use:

[0005] When using a high and low temperature test fixture to clamp and fix a chip, the test fixtures on the market can only clamp and fix one type of chip and then conduct high and low temperature test experiments. As a result, the applicability of the fixtures on the market is reduced, increasing the consumption of experiments in enterprises or factories and reducing the efficiency of chip test experiments for experimenters. Summary of the Utility Model

[0006] (1) Technical Problems to be Solved

[0007] Aiming at the deficiencies of the existing technology, the purpose of the utility model is to provide a high and low temperature test fixture, which aims to solve the technical problem that when using a high and low temperature test fixture to clamp and fix a chip, the test fixtures on the market can only clamp and fix one type of chip and then conduct high and low temperature test experiments. As a result, the applicability of the fixtures on the market is reduced, increasing the consumption of experiments in enterprises or factories and reducing the efficiency of chip test experiments for experimenters.

[0008] (2) Technical Solutions

[0009] To solve the above technical problems, the utility model provides such a high and low temperature test fixture, which includes a placement plate, and adjustment rods are connected to both open ends of the placement plate;

[0010] One end of the adjusting rod is connected with a connecting block. One end of the adjusting rod close to the connecting block is connected with a rotating block. The other side of the connecting block is connected with a clamping plate, and one side surface of the clamping plate is connected with a protective pad.

[0011] When using the test fixture of this technical solution, first place the chip on the installation groove on the surface of the placement plate, and then rotate the adjusting rod to clamp the protective pad on one side of the clamping plate stably with the chip, so as to facilitate the high and low temperature test of the chip, and then facilitate the clamping test of signals of different models, improving the applicability of the fixture.

[0012] Preferably, a rotating groove is opened on one side of the connecting block close to the adjusting rod. The placement plate and the rotating block form a rotating structure with the rotating groove on one side of the connecting block. By rotating the rotating block along the opening on one side of the connecting block, it is convenient to move the clamping plate forward stably.

[0013] Furthermore, the adjusting rod is threadedly connected with the placement plate. The protective pad is made of silica gel and is adhesively connected with the clamping plate. By using the protective pad, it is convenient to protect the edge of the chip and avoid the phenomenon of chip damage during the test.

[0014] Even further, a receiving shaft is connected to the bottom surface of the placement plate. The bottom end of the receiving shaft is connected with a base, and a driving motor is installed on the inner wall of the base. By using the receiving shaft, it is convenient to rotate the placement plate at an angle.

[0015] Even further, the output end of the driving motor is connected to the bottom end of the receiving shaft, and the driving motor is threadedly connected to the bottom surface of the base through bolts. By connecting the driving motor to the power supply of the high and low temperature test machine, it is convenient to control the rotation angle of the chip.

[0016] Even further, two limiting blocks are connected to the bottom surface of the placement plate. The limiting blocks are arc-shaped structures, and limiting grooves are opened on the surface of the base. The inner wall size of the limiting grooves is adapted to the surface size of the limiting blocks. By rotating the limiting blocks along the limiting grooves, it is convenient to rotate the placement plate stably.

[0017] Even further, a linkage spring is connected to the inner wall of the opening of the installation groove on the surface of the placement plate. The other end of the linkage spring is connected with a spring block, and the spring block and the linkage spring form an elastic telescopic structure. By the rebound of the linkage spring, it is convenient to eject the tested chip.

[0018] (3) Beneficial effects

[0019] Compared with the prior art, the beneficial effects of the present utility model are as follows:

[0020] 1. The utility model places the chip on the mounting groove on the surface of the placement board, then rotates the adjusting rod to stably clamp the chip with the protective pad on one side of the clamping board, thereby facilitating the high and low temperature testing of the chip, and further facilitating the clamping test of signals of different models, improving the applicability of the fixture.

[0021] 2. The utility model starts the driving motor to drive the receiving shaft to rotate, thereby driving the placement board to rotate at an angle. During the process, the limiting block is driven to rotate along the limiting groove. Then, through the mutual cooperation between the linkage spring and the elastic block, it is convenient to adjust the chip at different angles. In addition, it is convenient to pick up the tested chip. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 It is the front view structural schematic diagram of a specific embodiment of the device of the utility model;

[0023] Figure 2 It is the bottom view structural schematic diagram of a specific embodiment of the device of the utility model;

[0024] Figure 3 It is the top view sectional view of the placement board in a specific embodiment of the device of the utility model;

[0025] Figure 4 It is the connection structural schematic diagram of the adjusting rod in a specific embodiment of the device of the utility model;

[0026] Figure 5 It is the bottom view exploded structural schematic diagram of the fixture in a specific embodiment of the device of the utility model;

[0027] Figure 6 It is the top view exploded structural schematic diagram of the fixture in a specific embodiment of the device of the utility model;

[0028] Figure 7 It is the connection structural schematic diagram of the elastic block in a specific embodiment of the device of the utility model.

[0029] The marks in the drawings are: 1, base; 2, receiving shaft; 3, placement board; 4, adjusting rod; 5, connection block; 6, rotating block; 7, clamping board; 8, protective pad; 9, driving motor; 10, limiting block; 11, limiting groove; 12, linkage spring; 13, elastic block. DETAILED DESCRIPTION OF THE EMBODIMENT

[0030] This specific embodiment is a high and low temperature test fixture, and its structural schematic diagram is as Figure 1-7 shown. The test fixture includes a placement board 3, and adjusting rods 4 are connected to both ends of the placement board 3 where it is open;

[0031] One end of the adjusting rod 4 is connected with a connecting block 5. One end of the adjusting rod 4 close to the connecting block 5 is connected with a rotating block 6. The other side of the connecting block 5 is connected with a clamping plate 7. One side surface of the clamping plate 7 is connected with a protective pad 8.

[0032] Wherein, a rotating groove is provided on one side of the connecting block 5 close to the adjusting rod 4. The placing plate 3 and the rotating groove on one side of the connecting block 5 form a rotating structure through the rotating block 6. The adjusting rod 4 is threadedly connected with the placing plate 3. The protective pad 8 is made of silica gel material, and the protective pad 8 is adhesively connected with the clamping plate 7.

[0033] In addition, a receiving shaft 2 is connected to the bottom surface of the placing plate 3. The bottom end of the receiving shaft 2 is connected with a base 1. A driving motor 9 is installed on the inner wall of the base 1. The output end of the driving motor 9 is connected with the bottom end of the receiving shaft 2. The driving motor 9 is threadedly connected with the bottom surface of the base 1 through bolts. Two limiting blocks 10 are connected to the bottom surface of the placing plate 3. The limiting blocks 10 are arc-shaped structures. A limiting groove 11 is provided on the surface of the base 1. The inner wall size of the limiting groove 11 is adapted to the surface size of the limiting blocks 10. The inner wall of the opening of the installation groove on the surface of the placing plate 3 is connected with a linkage spring 12. The other end of the linkage spring 12 is connected with a spring block 13. The spring block 13 and the linkage spring 12 form an elastic telescopic structure.

[0034] Working principle: When using the device of this technical solution, first place the chip on the installation groove on the surface of the placing plate 3, and then rotate the adjusting rod 4 to drive the rotating block 6 at one end of the adjusting rod 4 to rotate along the rotating groove on one side of the connecting block 5, thereby driving the two clamping plates 7 to approach the chip synchronously, clamping the protective pad 8 on one side of the clamping plate 7 and the chip stably, so as to facilitate the high and low temperature test of the chip, and then facilitate the clamping test of signals of different models, improving the applicability of the fixture; further, by starting the driving motor 9, drive the receiving shaft 2 to rotate, thereby driving the placing plate 3 to rotate at an angle. During the process, drive the limiting blocks 10 on the bottom surface of the placing plate 3 to rotate along the limiting groove 11. After the chip is tested, loosen the clamp, and then the linkage spring 12 rebounds, driving the spring block 13 to move upward, ejecting the tested chip, facilitating the adjustment of the chip at different angles, and in addition, facilitating the taking of the tested chip.

[0035] The above embodiments are the preferred implementation schemes of the present invention. In addition, the present invention can also be implemented in other ways. Any obvious replacement without departing from the concept of this technical solution is within the protection scope of the present invention.

Claims

1. A high and low temperature test fixture, the test fixture comprising a placement plate (3), characterized in that: Adjustment rods (4) are connected to the openings at both ends of the placement plate (3); One end of the adjusting rod (4) is connected to a connecting block (5), one end of the adjusting rod (4) close to the connecting block (5) is connected to a rotating block (6), the other side of the connecting block (5) is connected to a clamping plate (7), and one side surface of the clamping plate (7) is connected to a protective pad (8).

2. The high and low temperature test fixture according to claim 1, characterized in that: A rotating groove is provided on one side of the connecting block (5) close to the adjusting rod (4), and the placing plate (3) forms a rotating structure through the rotating block (6) and the rotating groove on one side of the connecting block (5).

3. The high and low temperature test fixture according to claim 2, characterized in that: The adjusting rod (4) is threadedly connected to the placement plate (3); the protection pad (8) is made of silica gel; and the protection pad (8) is bonded to the clamping plate (7).

4. The high and low temperature test fixture according to claim 3, characterized in that: The bottom surface of the placement plate (3) is connected to a receiving shaft (2), the bottom end of the receiving shaft (2) is connected to a base (1), and a driving motor (9) is installed on the inner wall of the base (1).

5. The high and low temperature test fixture according to claim 4, characterized in that: The output end of the driving motor (9) is connected to the bottom end of the receiving shaft (2), and the driving motor (9) is threadedly connected to the bottom surface of the base (1) via bolts.

6. The high and low temperature test fixture according to claim 4, characterized in that: The bottom surface of the placement plate (3) is connected to two limit blocks (10), the limit blocks (10) are arc-shaped structures, and the surface of the base (1) is provided with a limit groove (11), and the inner wall size of the limit groove (11) is matched with the surface size of the limit block (10).

7. The high and low temperature test fixture according to claim 5, characterized in that: A linkage spring (12) is connected to the inner wall of the opening of the mounting groove on the surface of the placement plate (3); the other end of the linkage spring (12) is connected to a spring block (13); the spring block (13) and the linkage spring (12) form an elastic telescopic structure.

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