Leeb hardness tester

Abstract

The utility model discloses a Leeb hardness tester, which comprises a host, the host is connected with a detection pen, the detection pen comprises a probe, and an impact cone capable of entering and exiting from the probe is arranged in the probe. The Leeb hardness tester is characterized in that a bundling assembly is arranged on the impact cone, a bundling area for placing a detected object is formed between the bundling assembly and the impact cone, the probe is provided with an abutting assembly for preventing the detected object from shaking, and the Leeb hardness tester has the following advantages and effects that when the Leeb hardness tester is used for measuring the detected object, the detected object is not easy to shake, so that the error of measured data is greatly improved.

Description

Technical Field

[0001] The utility model relates to the technical field of hardness detection, and particularly relates to a Leeb hardness tester. Background Art

[0002] The Leeb hardness tester, also known as the Leeb-Rockwell hardness tester, is a commonly used instrument for measuring the hardness of metals. The Leeb hardness tester has various functional characteristics, such as a large-screen display, small and convenient, automatic recognition of impact devices, soft calibration function of the displayed value, pre-setting of upper and lower hardness limits, automatic alarm, large-capacity storage, support for multiple hardness tester systems, etc. In addition, the Leeb hardness tester also has the characteristics of high test accuracy, small volume, easy operation, convenient to carry, wide measurement range, etc., and can meet the needs of different industries for metal hardness testing.

[0003] The structure of the existing Leeb hardness tester includes a main body, and a detection pen is connected to the main body. The detection pen includes a probe. During detection, hold the probe, first push down the loading sleeve of the probe to lock the impact hammer, press the probe tightly against the surface of the object to be measured and keep it still, and then press the release button on the top of the probe, and the impact cone pops out from the top of the probe, then the hardness value of the object to be measured can be obtained.

[0004] When the existing Leeb hardness tester detects an object to be measured, it needs to ensure absolute stability to obtain relatively accurate results. However, some of the existing objects to be measured are mostly curved, such as some round pipes, oval pipes, special-shaped pipes, etc., and it is impossible to ensure that the detection probe is perpendicular to the arc surface of the object to be measured, resulting in the probe being prone to shaking during detection, inconvenient to fix, and increasing the error of the measured data. Therefore, a Leeb hardness tester is proposed to solve the above problems. Content of the Utility Model

[0005] The purpose of the utility model is to provide a Leeb hardness tester. When the Leeb hardness tester measures an object to be measured, the object to be measured is not prone to shaking, greatly improving the error of the measured data.

[0006] The above technical purpose of the utility model is achieved through the following technical solutions: a Leeb hardness tester, including a main body, a detection pen is connected to the main body. The detection pen includes a probe, and an impact cone that can enter and exit the probe is provided in the probe. It is characterized in that: a bundling component for bundling the object to be detected is arranged on one side of the probe facing the detection area, a bundling area for placing the object to be detected is formed between the bundling component and the impact cone, and a pressing component for preventing the object to be detected from shaking is arranged on the probe.

[0007] By adopting the above technical solutions, the object to be detected is restricted in the bundling area by the bundling component, and the object to be detected is fixed in the bundling area by the pressing component and the pressing component. At this time, when the probe faces the detection area, the impact cone is not prone to shaking when impacting the object to be detected, greatly improving the error of the measured data.

[0008] Further set as: The bundling assembly includes a bundling strip hinged to the probe head and having a bending function. On the other side of the bundling strip away from the hinged part, a plurality of bundling holes are arranged at intervals along the length direction of the bundling strip, and a bundling rod is arranged on the other side of the probe head facing away from the hinged part of the bundling strip and the probe head. A limiting ball for restricting the bundling strip from detaching from the bundling rod is arranged at the free end of the bundling rod.

[0009] By adopting the above technical solution, the bundling strip has a bending function, and the bundling strip can adapt to bundling objects of many shapes to facilitate bundling the objects to be detected in the bundling area. The bundling rod is for the bundling holes to be sleeved, and the limiting ball restricts the bundling holes from detaching from the bundling rod.

[0010] Further set as: The pressing component includes a plurality of guiding blocks fixedly arranged on the probe head and circumferentially arranged at intervals, sleeves slidably arranged on each guiding block and reciprocatingly moving toward the bundling area on one side, pressing nails slidably arranged in the sleeves, and a compression spring connected between the pressing nails and located in the sleeves. The head of the pressing nail extends out of the sleeve, and the head of the pressing nail faces the bundling area. An adjusting member for driving the pressing nail to move is arranged on the probe head.

[0011] By adopting the above technical solution, the pressing spring enables the pressing nail to have a telescopic function, so that the head of each pressing nail can adapt to different arc surface shapes for pressing, and the object to be detected is fixed.

[0012] Further set as: The adjusting member includes a pressing disk threadedly connected to the probe head and reciprocatingly moving toward the bundling area on one side, and a turning handle arranged on the pressing disk. Each of the pressing nails is located below the orthographic projection of the end face of the pressing disk.

[0013] By adopting the above technical solution, the pressing disk threadedly connected to the probe head has a simple structure, and the rotation of the pressing disk is conveniently controlled through the setting of the turning handle.

[0014] Further set as: It includes an annular linkage groove arranged on the end face of the pressing disk facing the sleeve and surrounding the center of the pressing disk, and a linkage part arranged on each sleeve and extending into the linkage groove. The linkage part is slidably matched with the linkage groove and constitutes linkage along the axial direction of the sleeve.

[0015] By adopting the above technical solution, the pressing disk controls the simultaneous movement of each sleeve in a linked manner, saving work efficiency. Description of the Drawings

[0016] Figure 1 It is a schematic diagram of the overall structure of the embodiment;

[0017] Figure 2 It is a partial structural sectional view of the embodiment;

[0018] Figure 3 It is a sectional view of the pressing component of the embodiment;

[0019] In the figure: 1. Main body; 2. Detection pen; 21. Probe; 22. Impact cone; 35. Strapping area; 4. Tightening component; 31. Strapping strip; 32. Strapping holes; 33. Strapping rod; 34. Limit ball; 41. Guide block; 42. Sleeve; 43. Tightening nail; 44. Compression spring; 51. Tightening disc; 52. Rotating handle; 61. Linkage groove; 62. Linkage part. Specific embodiments

[0020] The present utility model will be further described in detail below with reference to the accompanying drawings.

[0021] Reference Figures 1 to 3 , A Leeb hardness tester, comprising a main body 1, the main body 1 is fixedly connected with a detection pen 2 through a data cable, the detection pen 2 includes a probe 21, and an impact cone 22 capable of entering and exiting the probe 21 is arranged in the probe 21. A strapping component for strapping the object to be detected is arranged on one side of the probe 21 facing the detection area. A strapping area 35 for placing the object to be detected is formed between the strapping component and the impact cone 22, and a tightening component 4 for preventing the object to be detected from shaking is arranged on the probe 21.

[0022] The strapping component includes a strapping strip 31 hinged to the probe 21 and having a bending function, a plurality of strapping holes 32 arranged at intervals along the length direction of the strapping strip 31 on the other side of the strapping strip 31 away from the hinge, and a strapping rod 33 arranged on the other side of the probe 21 opposite to the hinge of the strapping strip 31 and the probe 21. A limit ball 34 for restricting the strapping strip 31 from detaching from the strapping rod 33 is arranged at the free end of the strapping rod 33. The tightening component 4 includes a plurality of guide blocks 41 fixedly arranged on the probe 21 and circumferentially arranged at intervals, sleeves 42 slidably arranged on each guide block 41 and reciprocatingly moving towards the strapping area 35, tightening nails 43 slidably arranged in the sleeves 42, and a compression spring 44 fixedly connected between the sleeves 42 and the tightening nails 43. The head of the tightening nail 43 extends out of the sleeve 42, and the head of the tightening nail 43 faces the strapping area 35. An adjusting member for driving the tightening nail 43 to move is arranged on the probe 21.

[0023] The adjusting member includes a tightening disc 51 threadedly connected to the probe 21 and reciprocatingly moving towards the strapping area 35, and a rotating handle 52 fixedly arranged on the tightening disc 51. Each tightening nail 43 is located below the orthographic projection of the end face of the tightening disc 51. It includes an annular linkage groove 61 formed on the end face of the tightening disc 51 facing the sleeve 42 and surrounding the center of the tightening disc 51, and a linkage part 62 arranged on each sleeve 42 and extending into the linkage groove 61. The linkage part 62 is slidably matched with the linkage groove 61 and forms a linkage along the axial direction of the sleeve 42.

[0024] This specific embodiment is only an interpretation of the present utility model, and it is not a limitation to the present utility model. After reading this specification, those skilled in the art can make modifications to this embodiment that do not contribute creatively as needed, but as long as it is within the scope of the claims of the present utility model, it is protected by the patent law.

Claims

1. A Leeb hardness tester, comprising a main unit (1), the main unit (1) is connected with a detection pen (2), the detection pen (2) includes a probe (21), and an impact cone (22) capable of entering and exiting the probe (21) is provided in the probe (21), and is characterized in that: On the side of the probe (21) facing the detection area, a bundling assembly for bundling the object to be detected is provided. A bundling area (35) for placing the object to be detected is formed between the bundling assembly and the impact cone (22). A pressing assembly (4) for preventing the object to be detected from shaking is provided on the probe (21).

2. The Leeb hardness tester according to claim 1, characterized in that: The bundling assembly includes a bundling strip (31) hinged to the probe (21) and having a bending function. A plurality of bundling holes (32) are provided at intervals along the length direction of the bundling strip (31) on the other side of the bundling strip (31) away from the hinged part. A bundling rod (33) is provided on the other side of the probe (21) facing away from the hinged part of the bundling strip (31) and the probe (21). A limiting ball (34) for restricting the bundling strip (31) from detaching from the bundling rod (33) is provided at the free end of the bundling rod (33).

3. The Leeb hardness tester according to claim 2, characterized in that: The pressing assembly (4) includes a plurality of guiding blocks (41) fixedly arranged on the probe (21) and circumferentially spaced apart, a sleeve (42) slidably arranged on each guiding block (41) and reciprocatingly moving towards the bundling area (35) on one side, a pressing nail (43) slidably arranged in the sleeve (42), and a compression spring (44) connected between the pressing nail (43) and the sleeve (42) inside the sleeve (42). The head of the pressing nail (43) extends out of the sleeve (42), and the head of the pressing nail (43) faces the bundling area (35). An adjusting member for driving the pressing nail (43) to move is provided on the probe (21).

4. The Leeb hardness tester according to claim 3, characterized in that: The adjusting member includes a pressing disc (51) threadedly connected to the probe (21) and reciprocatingly moving towards the bundling area (35) and a turning handle (52) arranged on the pressing disc (51). Each pressing nail (43) is located below the orthographic projection of the end face of the pressing disc (51).

5. The Leeb hardness tester according to claim 4, wherein: It includes an annular linkage groove (61) provided on the end face of the pressing disc (51) facing the sleeve (42) and surrounding the center of the pressing disc (51), and a linkage part (62) provided on each sleeve (42) and extending into the linkage groove (61). The linkage part (62) is slidably matched with the linkage groove (61) and constitutes linkage along the axial direction of the sleeve (42).

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