Anti-interference test system

Abstract

The utility model discloses an anti-interference test system, comprising a plurality of test parts, each test part comprises an AC contactor, and a preset distance is arranged between the AC contactor and a substrate to be tested; a null line or a live line in a power supply lead of the alternating current contactor is wound by at least one circle to form the magnetic field area, and the magnetic field area wraps the substrate to be tested; a normally open switch of the relay is connected to a live wire or a zero wire of a power supply lead of the alternating current contactor; the relay driving circuit is provided with a plurality of driving output ends corresponding to a plurality of relays in the plurality of test parts, and is used for outputting driving signals for driving the relays; the controller is connected with the relay driving circuit; and the selection unit outputs a selection signal for selecting the relay to the controller, and when the controller receives the selection signal, the relay driving circuit drives the coil of the selected relay to be powered on and powered off at a preset frequency. According to the utility model, the anti-interference test of the to-be-tested substrate under different magnetic field intensities is satisfied.

Description

Technical Field

[0001] The utility model relates to the technical field of electrical appliance testing, in particular to an anti-interference testing system. Background Technique

[0002] The coil of an AC contactor is generally powered by an AC power supply. During the process of power on and off, strong electromagnetic interference will be generated. By quickly turning on and off the AC contactor, strong electromagnetic interference is continuously generated, and the AC contactor is placed close to the board (or MCU) to verify the anti-electromagnetic interference ability of the board (or MCU).

[0003] In the existing technical solutions, generally two methods are adopted: (1) externally connect a timing device to quickly turn on and off the AC contactor; (2) use the board to control the on and off of the AC contactor; neither of these two solutions can adjust the magnetic field strength generated when the AC contactor is turned on, and cannot flexibly meet the tests under various magnetic interference conditions.

[0004] The above information disclosed in this background technique is only used to increase the understanding of the background of this application. Therefore, it may include prior art that is not known to those of ordinary skill in the art. Content of the Utility Model

[0005] In view of the problems pointed out in the background technique, this application provides an anti-interference testing system, which forms multiple magnetic field regions through various different winding methods, and provides magnetic interference with different magnetic field levels for the substrate under test when the AC contactor is turned on and off, so as to meet the anti-interference tests of the substrate under test under different magnetic field strengths.

[0006] To achieve the above-mentioned utility model purpose, the utility model adopts the following technical solutions to be realized:

[0007] This application relates to an anti-interference testing system, including:

[0008] A plurality of test parts, and each test part includes:

[0009] An AC contactor, which has a predetermined distance from the substrate under test;

[0010] A magnetic field region, in which the neutral wire or the live wire of the power supply lead of the AC contactor is wound at least one turn to form the magnetic field region. The magnetic field region wraps the substrate under test. The number of winding turns is an integer, and different numbers of winding turns result in different magnetic field strengths of the magnetic field region; the magnetic field strengths of the magnetic field regions in each test part are different from each other;

[0011] A relay, whose normally open switch is connected to the live wire or the neutral wire of the power supply lead of the AC contactor;

[0012] A relay driving circuit having a plurality of driving output terminals corresponding to a plurality of relays in a plurality of test units for outputting driving signals for driving the relays;

[0013] A controller connected to the relay driving circuit;

[0014] A selection unit that outputs a selection signal for selecting a relay to the controller. When the controller receives the selection signal, it drives the coil of the selected relay to be powered on and off at a predetermined frequency through the relay driving circuit;

[0015] A power supply circuit for receiving an AC power supply and providing a DC power supply to electrical components in the anti-interference test system.

[0016] The anti-interference test system involved in this application forms magnetic field regions with different magnetic field intensities through a plurality of test units, meeting the anti-interference test requirements of the substrate to be tested under various different magnetic field intensities, and improving the comprehensiveness and reliability of the anti-interference test of the substrate to be tested.

[0017] In some embodiments of this application, the controller has a variety of preset square waves built-in;

[0018] After the controller receives the selection signal, the controller drives the corresponding relay to gain and lose power through the relay driving circuit with a selected preset square wave.

[0019] A variety of different built-in preset square waves can be preset as needed.

[0020] And through a variety of different built-in preset square waves, the corresponding preset square wave can be selected as needed to control the on-off situation of the AC contactor, meeting the anti-interference test of the substrate to be tested under different on-off situations of the AC contactor, with strong flexibility and effectively improving the test reliability of the substrate to be tested.

[0021] In some embodiments of this application, a current-limiting resistor and a reminder element are connected in series and then connected in parallel with the coil of the relay between the DC power supply and the driving output terminal of the corresponding relay of the relay driving circuit;

[0022] When the preset square wave output by the controller is to control the corresponding relay to be powered on, the reminder element gives a reminder;

[0023] When the preset square wave output by the controller is to control the corresponding relay to lose power, the reminder element does not give a reminder.

[0024] By the reminder given by the reminder element, it can be known which relay is currently in the working state, and correspondingly, the user will know which test unit is being used to perform the anti-interference test on the substrate to be tested.

[0025] In some embodiments of the present application, the reminder element is a light reminder element, a sound reminder element, or an acoustic-optic reminder element;

[0026] When the reminder element is a light reminder element, the light reminder element emits a light reminder;

[0027] When the reminder element is a sound reminder element, the sound reminder element emits a sound reminder;

[0028] When the reminder element is an acoustic-optic reminder element, the acoustic-optic reminder element emits an acoustic-optic reminder.

[0029] In some embodiments of the present application, the anti-interference test system further includes:

[0030] A key circuit, which is connected to the controller and is used for outputting different key signals by pressing keys, and different key signals correspond to selecting different preset square waves.

[0031] By using the key circuit to select a preset square wave built in the controller, after selection, the controller controls the relay to conduct and cut off power with this preset square wave.

[0032] In some embodiments of the present application, the anti-interference test system further includes:

[0033] A display circuit, which includes a seven-segment digital tube and its driving circuit, and the driving circuit is connected to the controller and is used for displaying different numbers corresponding to different preset square waves;

[0034] When the anti-interference test system is powered on, the display circuit displays the default number corresponding to the default preset square wave.

[0035] The display circuit displays the number corresponding to the preset square wave selected through the key circuit, which is convenient for the user to visually change. The default number corresponds to the default square wave. Changing the number means changing the square wave selected by the controller. The user can determine which square wave the controller is currently using to conduct and cut off power to the relay, that is, to conduct and cut off power to the AC contactor.

[0036] In some embodiments of the present application, the key circuit includes an up button, a down button, and a confirmation button;

[0037] One end of the up button is connected to the DC power supply, and the other end is connected to the first input end of the controller. When pressing the up button, the number displayed by the seven-segment digital tube increases;

[0038] One end of the down button is connected to the DC power supply, and the other end is connected to the second input end of the controller. When pressing the down button, the number displayed by the seven-segment digital tube decreases;

[0039] One end of the confirmation button is connected to the DC power supply, and the other end is connected to the third input terminal of the controller. When the confirmation button is pressed, the preset square wave corresponding to the current number is confirmed.

[0040] Since there are multiple different preset square waves, the corresponding numbers are also different, that is, some are large and some are small. Therefore, during adjustment, the corresponding number can be adjusted by setting the up button, down button, and confirmation button to select the square wave corresponding to the number.

[0041] In some embodiments of the present application, the power supply circuit includes:

[0042] A first power module, which is used to receive an AC power supply and rectify it to a DC power supply of +5V;

[0043] A second power module, which is used to convert the DC power supply of +5V into a DC power supply of +3.3V.

[0044] By converting the AC power supply into DC power supplies of +5V and +3.3V, it is convenient to provide electrical energy for the controller, relay drive circuit, relay coil, and selection unit.

[0045] In some embodiments of the present application, an anti-interference test system is also involved, including:

[0046] An AC contactor, which has a predetermined distance from the substrate under test;

[0047] A magnetic field region, in which at least one turn of the neutral wire or live wire in the power supply lead of the AC contactor forms the magnetic field region, and the magnetic field region wraps the substrate under test. The number of turns of the winding is an integer, and different numbers of turns result in different magnetic field intensities in the magnetic field region;

[0048] A relay, whose normally open switch is connected to the live wire or neutral wire of the power supply lead of the AC contactor;

[0049] A relay drive circuit, which has a drive output terminal corresponding to the relay and is used to output a drive signal for driving the relay;

[0050] A controller, which is connected to the relay drive circuit. The controller has multiple different preset square waves built-in, and the controller drives the coil of the corresponding relay to gain or lose power through the relay drive circuit with a selected preset square wave;

[0051] A power supply circuit, which is used to receive an AC power supply and provide a DC power supply for the electrical components in the anti-interference test system.

[0052] The anti-interference test system involved in the present application forms different magnetic fields in the magnetic field region by selecting different preset square waves to achieve anti-interference tests on the substrate under test under multiple different magnetic field intensities.

[0053] After reading the specific embodiments of the present utility model in conjunction with the accompanying drawings, other features and advantages of the present utility model will become clearer. Description of the Drawings

[0054] In order to more clearly illustrate the technical solutions in the embodiments of the present utility model or the prior art, the following will briefly introduce the accompanying drawings required for use in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are some embodiments of the present utility model. For those of ordinary skill in the art, other accompanying drawings can be obtained based on these drawings without creative efforts.

[0055] Figure 1 It is a block diagram of an anti-interference test system according to the present application;

[0056] Figure 2 It is a schematic diagram of an embodiment of an anti-interference test system according to the present application;

[0057] Figure 3 It is a schematic diagram of another embodiment of an anti-interference test system according to the present application;

[0058] Figure 4 It is a schematic diagram of the connection between the controller and the relay drive circuit in the anti-interference test system according to the present application;

[0059] Figure 5 It is a circuit diagram of the peripheral circuit of the first relay in the anti-interference test system according to the present application;

[0060] Figure 6 It is a circuit diagram of the peripheral circuit of the second relay in the anti-interference test system according to the present application;

[0061] Figure 7 It is a circuit diagram of an embodiment of the selection unit in the anti-interference test system according to the present application;

[0062] Figure 8 It is a schematic diagram of the connection between the controller, the relay drive circuit and the display circuit in the anti-interference test system according to the present application;

[0063] Figure 9 It is a circuit diagram of the key circuit in the anti-interference test system according to the present application;

[0064] Figure 10 It is a circuit diagram of the power supply circuit in the anti-interference test system according to the present application;

[0065] Reference Signs:

[0066] 10. Controller; 20. Relay driving circuit; 30. First test unit; 31. First AC contactor; 32. First relay; 40. Second test unit; 41. Second AC contactor; 42. Second relay; 50. Display circuit; 60. Key circuit; 70. First power supply module; 80. Second power supply module. Detailed implementation mode

[0067] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present application without creative efforts shall fall within the protection scope of the present application.

[0068] In the description of the present application, it should be understood that the orientation or positional relationship indicated by the terms "center", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation of the present application.

[0069] The terms "first" and "second" are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the present application, unless otherwise specified, the meaning of "plurality" is two or more.

[0070] In the description of the present application, it should be noted that unless otherwise clearly specified and limited, the terms "installation", "connection" and "connection" should be understood in a broad sense. For example, it may be a fixed connection, a detachable connection or an integral connection; it may be a mechanical connection or an electrical connection; it may be a direct connection or an indirect connection through an intermediate medium, and it may be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific situations.

[0071] In the present utility model, unless otherwise clearly specified or limited, the first feature being "above" or "below" the second feature may include the direct contact between the first and second features, or may include the situation where the first and second features are not in direct contact but in contact through additional features therebetween. Moreover, the first feature being "above", "over" and "on top of" the second feature includes the first feature being directly above and obliquely above the second feature, or merely indicating that the horizontal height of the first feature is higher than that of the second feature. The first feature being "under", "beneath" and "underneath" the second feature includes the first feature being directly below and obliquely below the second feature, or merely indicating that the horizontal height of the first feature is lower than that of the second feature.

[0072] The following disclosure provides many different embodiments or examples for implementing different structures of the present utility model. To simplify the disclosure of the present utility model, components and settings of specific examples are described below. Of course, they are merely examples and are not intended to limit the present utility model. In addition, the present utility model may repeat reference numerals and / or reference letters in different examples. Such repetition is for the purpose of simplification and clarity, and does not itself indicate the relationship between various embodiments and / or settings discussed. In addition, the present utility model provides examples of various specific processes and materials, but those of ordinary skill in the art can be aware of the application of other processes and / or the use of other materials.

[0073] In actual use, existing electronic products with a substrate having an MCU often experience system crashes due to electromagnetic interference caused by the opening and closing of AC contactors. This is because the substrate of the electronic product has poor anti-interference ability, which may be due to imperfect hardware or software design. Therefore, before the substrate is officially put into use in an electronic product, it is necessary to conduct anti-interference tests on the substrate to simulate the electromagnetic interference from the AC contactor during actual operation.

[0074] The electronic products as described above may include any electronic products with an MCU substrate, such as refrigerators, air conditioners, washing machines, mobile phones, etc., without limitation here.

[0075] Based on the principle that an alternating magnetic field will be generated inside a current-carrying circular coil through which alternating current flows, and a pulsed alternating magnetic field will be generated by quickly turning on and off the alternating current, in some embodiments of the present application, by controlling the on and off of the AC contactor, an alternating magnetic field is generated in the current-carrying circular coil formed by the winding on the power supply lead to test the anti-interference performance of the substrate to be tested.

[0076] When the number of windings of the coil of the current-carrying circle is different, the intensity of the alternating magnetic field generated by it is also different. Therefore, the interference effects on the substrate to be tested are also different.

[0077] Therefore, in some embodiments of the present application, refer to Figures 1 to 10, a variety of different forms of current-carrying circles are set to test the substrate to be measured, so as to reliably detect the anti-interference performance of the substrate and simultaneously meet the anti-interference tests of various substrates under different magnetic field intensities.

[0078] In some embodiments of the present application, the anti-interference test system includes a plurality of test units, and setting a plurality of test units meets the anti-interference test requirements of different substrates for different magnetic field intensities.

[0079] A certain test unit is selected through relay control. Therefore, each test unit includes an AC contactor, a magnetic field area, and a relay.

[0080] The AC contactor can be selected according to needs. In some embodiments of the present application, an AC contactor with the model NCK3 can be selected.

[0081] The AC contactor has a predetermined distance from the substrate to be measured for anti-interference testing using it. This predetermined distance can be set according to requirements. The main purpose is to ensure that the alternating magnetic field generated when the AC contactor is powered on and off can effectively interfere with the substrate, and to avoid inaccurate anti-interference ability testing due to insufficient interference intensity.

[0082] In some embodiments of the present application, the AC contactor can directly receive alternating current from an AC power plug, or the alternating current for powering the substrate to be measured can be led out to supply power to the AC contactor

[0083] Regardless of which of the above power supply schemes, in the power supply lead of the AC contactor, the neutral wire N phase or the live wire L phase is wound at least one turn to form a magnetic field area, and the magnetic field area is the current-carrying circle as described above.

[0084] The number of winding turns is different, and the magnetic field intensity of the magnetic field area is different.

[0085] In order to implement tests on the substrate with different magnetic field intensities, the number of winding turns of the magnetic field areas in each test unit is different, that is, the magnetic field intensities of the magnetic field areas in each test unit are different from each other.

[0086] Among them, in order to form a current-carrying circle, therefore, the above-mentioned winding turns are integers.

[0087] For example, the one with one winding turn can be recorded as the first test unit, and the one with two winding turns can be recorded as the second test unit.

[0088] See Figure 1 , which shows the first test unit 30 and the second test unit 40.

[0089] The first test unit 30 includes a first relay 32 and a first AC contactor 31, and the second test unit 40 includes a second relay 42 and a second AC contactor 41.

[0090] In some embodiments of the present application, refer to Figure 2 , the power supply lead of the first AC contactor 31 is led out from the substrate to be tested. The live wire L phase is directly connected to the coil A1 of the first AC contactor 31. After the neutral wire N phase passes through the normally open switch of the first relay K1 32, it is wound around a circle with a diameter of 3 cm and then connected to the coil A2 of the first AC contactor 31.

[0091] In some embodiments of the present application, refer to Figure 3 , the power supply lead of the second AC contactor 41 is led out from the substrate to be tested. The live wire L phase is directly connected to the coil A1 of the second AC contactor 41. After the neutral wire N phase passes through the normally open switch of the second relay K2 42, it is wound around two circles with a diameter of 3 cm and then connected to the coil A2 of the second AC contactor 41.

[0092] The winding diameter can be set according to the test requirements and is not limited here.

[0093] Alternatively, winding can also be performed on the L phase.

[0094] Since during the test, the magnetic field region formed by the winding coil should wrap the substrate to be tested, therefore, in some embodiments of the present application, the magnetic field region can be controlled to have a predetermined distance from the AC contactor to ensure that the alternating magnetic field generated by the magnetic field region when the AC contactor is energized generates effective electromagnetic interference on the substrate to be tested.

[0095] In some embodiments of the present application, the distance between the control substrate and the AC contactor is controlled to be less than or equal to 10 cm, further ensuring the intensity of the interference on the substrate, thereby further improving the accuracy of the anti-interference ability test.

[0096] That is, in some embodiments of the present application, refer to Figure 2 , the distance between the magnetic field region and the first AC contactor can be set to 10 cm, and the distance between the magnetic field region and the second AC contactor can be set to 10 cm to ensure the formation of effective interference.

[0097] In some embodiments of the present application, the test unit further includes a relay.

[0098] The normally open switch of the relay is arranged on the live wire L phase or the neutral wire N phase of the power supply lead of the AC contactor, so as to achieve the purpose of controlling the on-off of the AC contactor by controlling the power-on or power-off of the relay coil.

[0099] In some embodiments of the present application, for the above-mentioned multiple test units, each includes an AC contactor, a magnetic field region, and a relay. Thus, when selecting a certain test unit for the anti-interference test, the controller 10 can control the corresponding relay to be powered on or off.

[0100] For the convenience of the following description, as described above, the first test unit 30 and the second test unit 40 can be set.

[0101] To achieve the on-off control of the relay by the controller 10, refer to Figure 4 , the anti-interference test system further includes a relay drive circuit 20, which is connected to the controller 10 and can output a plurality of drive signals at a plurality of drive output terminals, respectively for driving a corresponding plurality of relays.

[0102] The plurality of drive output terminals and the plurality of relays are in one-to-one correspondence.

[0103] Refer to Figures 1 to 4 , corresponding to the first test unit 30 and the second test unit 40, a first relay 32 and a second relay 42 are set, and a first drive output terminal and a second drive output terminal are set.

[0104] Refer to Figure 4 , the first drive output terminal outputs a first drive signal K11, and the second drive output terminal outputs a second drive signal K22.

[0105] The first test unit 30, the first relay 32, and the first drive output terminal correspond to each other, and the second test unit 40, the second relay 42, and the second drive output terminal correspond to each other.

[0106] When the first signal MCU_K1 output by the controller 10 controls the relay drive circuit 20 to output the first drive signal K11 at the first drive output terminal, the first drive signal K11 causes the first relay 32 to turn on and off at a predetermined frequency.

[0107] When the second signal MCU_K2 output by the controller 10 controls the relay drive circuit 20 to output the second drive signal K22 at the second drive output terminal, the second drive signal K22 causes the second relay 42 to turn on and off at a predetermined frequency.

[0108] In some embodiments of the present application, the relay drive circuit 20 can select a ULN2003 chip.

[0109] In some embodiments of the present application, the peripheral circuit of the relay can include a current-limiting resistor and a reminder element.

[0110] Refer to Figure 5 , for the first relay K1 32, a first current-limiting resistor R3 and a first reminder element are connected in series and then connected in parallel with the coil of the first relay K1 32 between the DC power supply +5V and the first drive signal K11.

[0111] The normally open switch of the first relay 32 is connected in series on the N phase of the power supply lead of the first AC contactor 31 of the first test unit 30 (refer to Figure 2 ).

[0112] When the controller 10 outputs the first signal MCU_K1 that controls the on / off of the first relay K1 32 at a predetermined frequency, the corresponding relay drive circuit 20 outputs the first drive signal K11 at the first drive output terminal to make the first relay K1 32 turn on and off at a predetermined frequency, that is, the normally open switch of the first relay 32 turns on and off at a predetermined frequency, which also means that the first AC contactor 31 of the first test unit 30 turns on and off at a predetermined frequency. Thus, a first alternating magnetic field is generated in the magnetic field region of the first test unit 30.

[0113] When the coil of the first relay K1 32 is energized, the first reminder element gives a reminder. When the coil of the first relay K1 32 is not energized, the first reminder element does not give a reminder.

[0114] In some embodiments of the present application, the first reminder element is a light reminder element, a sound reminder element or an acoustic-optic reminder element.

[0115] See Figure 5 , when the first reminder element is a light reminder element, the light reminder element gives a light reminder. For example, the light reminder element can select the LED lamp LED1.

[0116] When the first reminder element is a sound reminder element, the sound reminder element gives a sound reminder. For example, the sound reminder element can select a buzzer.

[0117] When the first reminder element is an acoustic-optic reminder element, the acoustic-optic reminder element gives an acoustic-optic reminder. For example, the acoustic-optic reminder element can select a series-connected LED lamp and a buzzer.

[0118] When the first reminder element gives a reminder, it means that the coil of the first relay K1 32 is energized, and the user uses the first test unit 30 for testing.

[0119] When the first reminder element does not give a reminder, it means that the coil of the first relay K1 32 is de-energized, and the user does not use the first test unit 30 for testing.

[0120] See Figure 6 , for the second relay K2 42, the second current-limiting resistor R33 and the second reminder element are connected in series and then connected in parallel with the coil of the second relay K2 42 between the DC power supply +5V and the second drive signal K22.

[0121] The normally open switch of the second relay K2 42 is connected in series to the N phase of the power supply lead of the second AC contactor 41 of the second test unit 40. See Figure 3 .

[0122] When the MCU_K2 outputs a second signal to control the second relay K2 42 to be powered on and off at a predetermined frequency, the corresponding relay driving circuit 20 outputs a second driving signal K22 at the second driving output terminal to make the second relay K2 42 be powered on and off at a predetermined frequency, that is, the normally open switch of the second relay K2 42 is powered on and off at a predetermined frequency, that is, the second AC contactor 41 of the second test unit 40 is powered on and off at a predetermined frequency. Thus, a second alternating magnetic field is generated in the magnetic field region of the second test unit 40.

[0123] When the coil of the second relay K2 42 is powered on, the second reminder element gives a reminder. When the coil of the second relay K2 42 is not powered on, the second reminder element does not give a reminder.

[0124] In some embodiments of the present application, the second reminder element is a light reminder element, a sound reminder element or a sound and light reminder element.

[0125] See Figure 6 When the second reminder element is a light reminder element, the light reminder element gives a light reminder. For example, the light reminder element can select an LED lamp LED2.

[0126] When the second reminder element is a sound reminder element, the sound reminder element gives a sound reminder. For example, the sound reminder element can select a buzzer.

[0127] When the second reminder element is a sound and light reminder element, the sound and light reminder element gives a sound and light reminder. For example, the sound and light reminder element can select a series-connected LED lamp and a buzzer.

[0128] When the second reminder element gives a reminder, it means that the coil of the second relay K2 42 is powered on, and the user uses the second test unit 40 for testing.

[0129] When the second reminder element does not give a reminder, it means that the coil of the second relay K2 42 loses power, and the user does not use the second test unit 40 for testing.

[0130] In some embodiments of the present application, a third test unit and its corresponding third relay can also be set.

[0131] The third test unit, the third relay and the third driving output terminal correspond to each other.

[0132] In some embodiments of the present application, other numbers of test units and their corresponding relays can also be set.

[0133] In some embodiments of the present application, the controller 10 being powered on and off at a predetermined frequency as described above can be understood as the controller 10 outputting a predetermined square wave.

[0134] The form of the square wave can be a square wave with a period of 200 ms and a duty cycle of 50%. In this way, when the square wave is at a high level, the coil of the first relay K1 32 is energized; otherwise, the coil of the first relay K1 32 is de-energized.

[0135] When the duty cycle of the square wave remains unchanged, the period can be changed. For example, the period can be 500 ms, 1000 ms, 3000 ms, etc.

[0136] The period of the square wave can be continuously changed. For example, the duty cycle of the first period is 50% and the period is 1000 ms, the duty cycle of the second period is 50% and the period is 2000 ms, the duty cycle of the third period is 50% and the period is 5000 ms, etc.

[0137] The set form of the square wave can be set according to the test requirements and is not limited herein.

[0138] In some embodiments of the present application, in order to select a certain test unit, the anti-interference test system further includes a selection unit.

[0139] The selection unit is connected to the controller 10 and is used to output different selection signals when selecting a certain test unit. The selection signal is sent to the controller 10, and the controller 10 correspondingly drives the corresponding relay to be energized or de-energized through the relay drive circuit 20.

[0140] In some embodiments of the present application, different test units selected correspond to different relays and different selection signals.

[0141] Therefore, a test unit, a relay, a drive output terminal, and a selection signal are in one-to-one correspondence.

[0142] Taking the setting of the first test unit 30 and the second test unit 40 as an example for introduction.

[0143] See Figure 7 , the selection unit may include a DIP switch DSW and a grounding resistor R1.

[0144] One end of the DIP switch DSW is connected to the DC power supply +3.3V, and the other end is respectively connected to one end of the grounding resistor R1 and the selection input terminal of the controller 10.

[0145] For example, when the DIP switch DSW is ON, the first relay K1 32 is selected; when the DIP switch DSW is OFF, the second relay K2 42 is selected.

[0146] See Figure 7 , when the DIP switch DSW is set to ON, the selection unit outputs a selection signal DSW1 with a high level.

[0147] When the controller 10 receives the high-level selection signal DSW1 at the selection input terminal, the controller 10 controls the relay drive circuit 20 to output a first drive signal K11 at the first drive output terminal, so that the first relay K1 32 is turned on and off at a predetermined frequency, that is, the first test unit 30 is selected to test the substrate.

[0148] When the dip switch is set to OFF, the selection unit outputs a low-level selection signal DSW1.

[0149] When the controller 10 receives the low-level selection signal DSW1 at the selection input terminal, the controller 10 controls the relay drive circuit 20 to output a second drive signal K22 at the second drive output terminal, so that the second relay K2 42 is turned on and off at a predetermined frequency, that is, the second test unit 40 is selected to test the substrate.

[0150] In some embodiments of the present application, if more than two relays are provided, the selection unit can select to provide a controllable switch and a current-limiting resistor for one relay, and the resistance values of the current-limiting resistors are different for different relays.

[0151] According to whether the corresponding relay switch is closed or open, different voltage values are received at the input terminal of the controller 10 correspondingly, and which relay is selected is judged according to the voltage value.

[0152] For example, when the first switch corresponding to the first relay K1 32 is closed, the selection unit outputs a first selection signal; otherwise, the selection unit does not output the first selection signal.

[0153] When the second switch corresponding to the second relay K2 42 is closed, the selection unit outputs a second selection signal; otherwise, the selection unit does not output the second selection signal.

[0154] When the third switch corresponding to the third relay is closed, the selection unit outputs a third selection signal; otherwise, the selection unit does not output the third selection signal.

[0155] Since the resistance values of the provided current-limiting resistors are different, the first selection signal, the second selection signal, and the third selection signal are different from each other.

[0156] As described above, the controller 10 internally stores a variety of different preset square waves. Specifically, which square wave is used to control the on and off of the relay requires square wave selection.

[0157] In some embodiments of the present application, referring to Figure 8 and Figure 9 , a key circuit 60 is used for square wave selection. The key circuit 60 is connected to the controller 10 and is used to select different preset square waves when different key signals are output by the keys.

[0158] Different key signals correspond to different selected preset square waves.

[0159] In some embodiments of the present application, in order to facilitate the user to clearly know the selected square wave, different preset square waves correspond to different numbers and are displayed through the display circuit 50.

[0160] For example, in some embodiments of the present application, 9 different preset square waves are built in, which respectively correspond to 0 to 8.

[0161] The display circuit 50 in the present application includes two seven-segment digital tubes and their driving circuits. The driving circuit is connected to the controller 10 and is used for the controller 10 to drive the two seven-segment digital tubes to perform digital display through the driving circuit.

[0162] When the anti-interference test system is powered on, the two seven-segment digital tubes respectively display 00 and 00, which can correspond to the preset square wave corresponding to the number 0.

[0163] In some embodiments of the present application, in order to facilitate the user to adjust the selected preset square wave, see Figure 9 , the key circuit 60 includes an up button PSW1, a down button PSW2 and a confirmation button PSW3.

[0164] One end of the up button PSW1 is connected to the DC power supply +3.3V, and the other end is connected to the first input end of the controller 10. When the up button PSW1 is pressed, the numbers displayed by the two seven-segment digital tubes are increased.

[0165] For example, when the two seven-segment digital tubes currently display 00 and 00 (i.e., corresponding to the preset square wave corresponding to the number 0), pressing the up button PSW1 once, the two seven-segment digital tubes respectively display 00 and 01 (i.e., corresponding to the preset square wave corresponding to the number 1), and pressing the up button PSW1 twice, the two seven-segment digital tubes respectively display 00 and 02 (i.e., corresponding to the preset square wave corresponding to the number 2).

[0166] One end of the down button PSW2 is connected to the DC power supply +3.3V, and the other end is connected to the second input end of the controller 10. When the down button PSW2 is pressed, the numbers displayed by the two seven-segment digital tubes are decreased.

[0167] For example, when the two seven-segment digital tubes currently display 00 and 03 (i.e., corresponding to the preset square wave corresponding to the number 3), pressing the down button PSW2 once, the two seven-segment digital tubes respectively display 00 and 02 (i.e., corresponding to the preset square wave corresponding to the number 2), and pressing the down button PSW2 twice, the two seven-segment digital tubes respectively display 00 and 01 (i.e., corresponding to the preset square wave corresponding to the number 1).

[0168] One end of the confirmation button PSW3 is connected to the DC power supply +3.3V, and the other end is connected to the third input terminal of the controller 10. When the confirmation button PSW3 is pressed, the preset square wave corresponding to the current number is confirmed.

[0169] For example, if the current two seven-segment digital tubes respectively display 00 and 03 (that is, the preset square wave corresponding to the number 3), after pressing the confirmation button PSW3, the controller 10 selects the preset square wave corresponding to the number 3.

[0170] If the current two seven-segment digital tubes respectively display 00 and 02 (that is, the preset square wave corresponding to the number 2), after pressing the confirmation button PSW3, the controller 10 selects the preset square wave corresponding to the number 2.

[0171] If three test parts are set as described above, and the controller 10 has nine different preset square waves built in, in this way, twenty-seven electromagnetic test scenarios can be formed, which is convenient for users to flexibly implement electromagnetic interference tests on the substrate under multiple scenarios.

[0172] Moreover, the electromagnetic anti-interference tests under multiple scenarios can cover a variety of test schemes, greatly improving the integrity of the substrate test and being conducive to the accurate evaluation of the anti-interference performance of the substrate.

[0173] In some embodiments of the present application, referring to Figure 10 , the anti-interference test system further includes a power supply circuit, which is used to convert the AC power supply into a DC power supply and supply it to the electrical components in the anti-interference test system.

[0174] As described above, the relay drive circuit 20 in the anti-interference test system requires a DC power supply +5V, the display circuit 50 requires a DC power supply +5V, the selection unit requires a DC power supply +3.3V, the button circuit 60 requires a DC power supply +3.3V, and the controller 10 requires a DC power supply +3.3V.

[0175] Therefore, referring to Figure 10 , the power supply circuit includes a first power module 70 and a second power module 80.

[0176] The first power module 70 is used to receive the AC power supply and rectify it to the DC power supply +5V.

[0177] In some embodiments of the present application, the first power module 70 can select the LD1AC-DC power module to rectify AC220V to the DC power supply +5V.

[0178] Among them, a fuse F1, a current-limiting resistor R25, and a variable resistor RV1 are arranged at the front end of the LD1 AC-DC power module to form a front-end protection circuit, and a filtering and voltage-stabilizing circuit formed by a polar capacitor E1, a common capacitor C1, and a voltage-regulating diode VT1 connected in parallel is arranged at the rear end of the LD1 AC-DC power module to stably output DC5V.

[0179] The second power module 80 is used to convert the DC power supply +5V into a DC power supply +3.3V.

[0180] In some embodiments of the present application, the second power module 80 selects a DC-DC power module, which is used to convert and output DC5V to DC3.3V.

[0181] As described above for setting multiple test parts, in some embodiments of the present application, one test part can also be set.

[0182] The test part (such as the first test part 30) includes the AC contactor (such as the first AC contactor 31), the magnetic field area, the relay (such as the first relay K1 32), the relay drive circuit 20, the controller 10, and the power supply circuit as described above.

[0183] The test part controls the on-off of the relay according to a variety of different preset square waves built in the controller 10.

[0184] For example, the magnetic field area in the test part is a current-carrying circle formed by a circle with a diameter of 3 cm and two turns.

[0185] Nine different preset square waves are built in the controller 10.

[0186] During the test, nine electromagnetic test scenarios can be formed for the substrate, which is convenient for users to flexibly implement electromagnetic interference tests on the substrate in multiple scenarios.

[0187] The selection of the above nine preset square waves can be referred to the selection unit as described above, and will not be elaborated here.

[0188] In the description of the above embodiments, specific features, structures, materials, or characteristics can be combined in a suitable manner in any one or more embodiments or examples.

[0189] The above is only the specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any changes or substitutions that can be easily thought of by those skilled in the art within the technical scope disclosed by the present invention should be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope of the claims.

Claims

1. An anti-interference test system, characterized in that, Comprising: A plurality of test units, each test unit comprising: An AC contactor having a predetermined distance from the substrate to be tested; A magnetic field region, wherein at least one turn of the neutral wire or the live wire in the power supply lead of the AC contactor forms the magnetic field region, the magnetic field region wraps the substrate to be tested, the number of turns of the winding is an integer, and different numbers of turns of the winding result in different magnetic field intensities of the magnetic field region; the magnetic field intensities of the magnetic field regions in each test unit are different from each other; A relay, whose normally open switch is connected to the live wire or the neutral wire of the power supply lead of the AC contactor; A relay drive circuit having a plurality of drive output terminals corresponding to a plurality of relays in a plurality of test units, for outputting drive signals for driving the relays; A controller connected to the relay drive circuit; A selection unit for outputting a selection signal for selecting a relay to the controller, and when the controller receives the selection signal, driving the coil of the selected relay to be powered on and off at a predetermined frequency through the relay drive circuit; A power supply circuit for receiving an AC power supply and providing a DC power supply to the electrical components in the anti-interference test system.

2. The anti-interference test system according to claim 1, wherein: The controller internally stores a variety of different preset square waves; After the controller receives the selection signal, the controller drives the corresponding relay to gain or lose power through the relay drive circuit with a selected preset square wave.

3. The anti-interference test system according to claim 1, wherein: A current-limiting resistor and a reminder element are connected in series and then connected in parallel with the coil of the relay between the DC power supply and the drive output terminal of the corresponding relay of the relay drive circuit; When the preset square wave output by the controller is for controlling the corresponding relay to gain power, the reminder element emits a reminder; When the preset square wave output by the controller is for controlling the corresponding relay to lose power, the reminder element does not emit a reminder.

4. The anti-interference test system according to claim 3, characterized in that, The reminder element is a light reminder element, a sound reminder element or an acoustic-optic reminder element; When the reminder element is a light reminder element, the light reminder element emits a light reminder; When the reminder element is a sound reminder element, the sound reminder element emits a sound reminder; When the reminder element is an acoustic-optic reminder element, the acoustic-optic reminder element emits an acoustic-optic reminder.

5. The anti-interference test system according to claim 2, wherein The anti-interference test system further comprises: A key circuit connected to the controller, for outputting different key signals through keys, and different key signals correspond to different selected preset square waves.

6. The anti-interference test system according to claim 5, characterized in that The anti-interference test system further comprises: A display circuit comprising a seven-segment digital tube and its drive circuit, the drive circuit being connected to the controller, for displaying different numbers corresponding to different preset square waves; When the anti-interference test system is powered on, the display circuit displays the default number corresponding to the default preset square wave.

7. The anti-interference test system according to claim 6, characterized in that The key circuit includes an up-arrow key, a down-arrow key and an enter key; One end of the up-arrow key is connected to the DC power supply, and the other end is connected to the first input terminal of the controller. When the up-arrow key is pressed, the number displayed by the seven-segment digital tube is increased; One end of the downward turning key is connected to the DC power supply, and the other end is connected to the second input end of the controller. When the downward turning key is pressed, the number displayed on the eight-segment digital tube is decreased; One end of the confirmation key is connected to the DC power supply, and the other end is connected to the third input end of the controller. When the confirmation key is pressed, the preset square wave corresponding to the current number is confirmed.

8. The anti-interference test system according to claim 1, wherein The power supply circuit includes: A first power module, which is used to receive an AC power supply and rectify it to a DC power supply of +5V; A second power module, which is used to convert the DC power supply of +5V into a DC power supply of +3.3V.

9. An anti-interference test system, characterized in that, Comprising: An AC contactor, which has a predetermined distance from the substrate to be measured; A magnetic field area, in which at least one turn of the neutral wire or the live wire in the power supply lead of the AC contactor forms the magnetic field area. The magnetic field area wraps the substrate to be measured. The number of turns of the winding is an integer, and different numbers of turns of the winding result in different magnetic field intensities of the magnetic field area; A relay, whose normally open switch is connected to the live wire or the neutral wire of the power supply lead of the AC contactor; A relay drive circuit, which has a drive output end corresponding to the relay and is used to output a drive signal for driving the relay; A controller, which is connected to the relay drive circuit. The controller has a variety of different preset square waves built in. The controller drives the coil of the corresponding relay to gain or lose power through the relay drive circuit with a selected preset square wave; A power supply circuit, which is used to receive an AC power supply and provide a DC power supply to the electrical components in the anti-interference test system.

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