Quantum efficiency measuring device

Abstract

The utility model discloses a quantum efficiency measuring device, which comprises a base, a bearing piece and a probe, the base comprises a testing part and a supporting part connected to the testing part, the supporting part extends along a first direction, the testing part is used for placing an object to be measured, the bearing piece is connected to the supporting part in a sliding manner, and the probe is arranged on the bearing piece in a sliding manner. The probe can be driven by the bearing part to move along a first direction, so that the probe can abut against or be far away from the object to be detected, and the probe can slide along the first direction relative to the bearing part. By adopting the scheme of the utility model, the pressure when the probe abuts against the object to be detected is stable, and the condition that the probe punctures the object to be detected is reduced.

Description

Technical Field

[0001] The utility model relates to the technical field of photovoltaics, in particular to a quantum efficiency measuring device. Background Art

[0002] In solar cells, quantum efficiency refers to the ratio of the number of charge carriers generated by the solar cell per unit time to the number of photons incident on the solar cell, and is currently an important indicator for evaluating the performance of solar cells. In related technologies, a quantum efficiency measuring device is usually used to measure the quantum efficiency of a solar cell. The quantum efficiency measuring device includes a probe, and the probe abuts against the electrode of the solar cell to achieve the purpose of measuring the quantum efficiency of the solar cell through the quantum efficiency measuring device. However, when the probe moves to abut against the electrode of the solar cell, the pressure of the probe on the electrode is difficult to control, and it is easy to pierce the electrode, thereby causing the solar cell to be scrapped. Utility Model Content

[0003] The embodiment of the utility model discloses a quantum efficiency measurement device, which can make the pressure when the probe abuts against the object to be measured more stable, and reduce the occurrence of the probe piercing the object to be measured.

[0004] In order to achieve the above object, the utility model discloses a quantum efficiency measurement device, comprising:

[0005] A base, the base comprising a testing portion and a supporting portion connected to the testing portion, the supporting portion extending along a first direction, and the testing portion being used to place an object to be tested;

[0006] a bearing member, the bearing member being slidably connected to the supporting portion; and

[0007] The probe can be slidably disposed on the carrier, and the probe can move along the first direction driven by the carrier so that the probe abuts against or moves away from the object to be tested, and the probe can slide relative to the carrier along the first direction.

[0008] As an optional implementation, in an embodiment of the present utility model, the quantum efficiency measurement device further includes a pressure structure, the pressure structure is connected to the probe, and the pressure structure is used to configure the pressure applied by the probe to the object to be measured.

[0009] As an optional implementation, in an embodiment of the utility model, the pressure structure includes a counterweight block, which is detachably connected to an end of the probe facing away from the testing part, and the counterweight block is configured to be replaceable so that the probe applies different pressures to the object to be tested.

[0010] As an alternative implementation, in the embodiment of the present utility model, a first through hole penetrating the carrier itself along the first direction is provided on the carrier, and the probe is slidably connected to the first through hole;

[0011] The quantum efficiency measuring device further includes a limiting member, the limiting member is provided on a side of the carrier facing away from the testing portion, and the limiting member is connected to an end of the probe facing away from the testing portion, and the counterweight is provided on a side of the limiting member facing away from the carrier.

[0012] As an alternative implementation, in the embodiment of the present utility model, the pressure structure includes a first magnetic member and a second magnetic member, the first magnetic member is connected to an end of the probe facing away from the testing portion, the second magnetic member is provided on the carrier, and the second magnetic member is spaced apart from the first magnetic member in the first direction, and the first magnetic member and / or the second magnetic member is configured to be energized to generate a magnetic field.

[0013] As an alternative implementation, in the embodiment of the present utility model, the carrier includes a main body portion, a first carrier portion and a second carrier portion, the main body portion is slidably connected to the support portion, the first carrier portion and the second carrier portion are connected to the main body portion at intervals along the first direction, a first through hole penetrating the first carrier portion itself along the first direction is provided on the first carrier portion, the probe is slidably connected to the first through hole, the first magnetic member is located on a side of the first carrier portion facing the second carrier portion, and the second magnetic member is provided on a side of the second carrier portion facing the first carrier portion.

[0014] As an alternative implementation, in the embodiment of the present utility model, the probe includes a needle body and a contact head provided at one end of the needle body, the needle body can move along the first direction under the drive of the carrier, and the needle body can slide relative to the carrier along the first direction, and the contact head is used for abutting against the object to be measured.

[0015] As an alternative implementation, in the embodiment of the present utility model, an end of the contact head facing away from the needle body is configured as a plane, and the plane is used for abutting against the object to be measured.

[0016] As an alternative implementation, in the embodiment of the present utility model, an installation hole is provided at an end of the needle body facing the testing portion, the probe further includes a pressure sensor and a buffer member, the pressure sensor and the buffer member are sequentially arranged in the installation hole, the contact head is connected to the buffer member, and the pressure sensor is used for detecting the pressure of the contact head.

[0017] As an alternative embodiment, in the embodiment of the present utility model, a slide rail portion extending along the first direction is provided on the support portion, a slider portion is provided on the carrier, the slider portion is slidably connected to the slide rail portion, a threaded hole penetrating through the carrier itself along the first direction is provided on the carrier, the quantum efficiency measuring device further includes a screw rod and a motor, the screw rod is provided on the testing portion and connected to the threaded hole, and the motor is provided at an end of the screw rod away from the testing portion.

[0018] Compared with the prior art, the beneficial effects of the present utility model are as follows:

[0019] For the quantum efficiency measuring device provided by the embodiment of the present utility model, the carrier can slide along the first direction on the support portion of the base, so as to drive the probe to move along the first direction, make the probe approach the object to be measured until it abuts against the object to be measured, or make the probe move away from the object to be measured until it is far away from the object to be measured, realizing multiple measurements of the quantum efficiency of different objects to be measured. At the same time, the probe can slide relative to the carrier along the first direction. When the probe abuts against the object to be measured, even if the carrier continues to slide, the probe will not continue to press down, and the pressure on the object to be measured is the self-weight of the probe, so that the pressure when the probe abuts against the object to be measured can be relatively stable, reducing the situation of the probe piercing through the object to be measured, and improving the unity of the test environment when measuring the object to be measured, thereby improving the stability of the test results. Description of the Drawings

[0020] In order to more clearly illustrate the technical solutions in the embodiments of the present utility model, the following will briefly introduce the drawings required to be used in the embodiments. Obviously, the drawings in the following description are only some embodiments of the present utility model. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0021] Figure 1 It is a three-dimensional structural schematic diagram of the quantum efficiency measuring device disclosed in the embodiment of the present application;

[0022] Figure 2 It is a structural schematic diagram of the first quantum efficiency measuring device disclosed in the embodiment of the present application;

[0023] Figure 3 It is a structural schematic diagram of the second quantum efficiency measuring device disclosed in the embodiment of the present application;

[0024] Figure 4 It is a sectional view of the probe disclosed in the embodiment of the present application.

[0025] Icon: 1. Quantum efficiency measurement device; 10. Base; 100. Test part; 101. Support part; 101a. Slide rail part; 11. Carrier; 110. Slide block part; 111. Main body part; 111a. Screw hole; 112. First bearing part; 113. Second bearing part; 12. Probe; 120. Needle body; 120a. Mounting hole; 121. Contact head; 122. Pressure sensor; 123. Buffer; 13. Screw; 14. Motor; 15. Pressure structure; 150. Counterweight; 151. First magnetic part; 152. Second magnetic part; 16. Limiting part; 2. Object to be measured; X. First direction. Detailed implementation manners

[0026] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0027] The technical solutions of the present invention will be further described below with reference to the embodiments and the accompanying drawings.

[0028] Please refer to Figure 1 , the embodiment of the present invention provides a quantum efficiency measurement device 1, which includes a base 10, a carrier 11 and a probe 12. The base 10 includes a test part 100 and a support part 101 connected to the test part 100. The support part 101 extends along the first direction X. The test part 100 is used to place the object to be measured 2. The carrier 11 is slidably connected to the support part 101. The probe 12 is slidably arranged on the carrier 11. The probe 12 can move along the first direction X under the drive of the carrier 11 so that the probe 12 abuts against or moves away from the object to be measured 2. In addition, the probe 12 can slide relative to the carrier 11 along the first direction X.

[0029] The quantum efficiency measurement device 1 provided by the embodiment of the present utility model has a carrier 11 that can slide along the first direction X on the support portion 101 of the base 10, so as to drive the probe 12 to move along the first direction X, making the probe 12 approach the object to be measured 2 until it abuts against the object to be measured 2, or making the probe 12 move away from the object to be measured 2 until it is far away from the object to be measured 2, realizing multiple measurements of the quantum efficiency of different objects to be measured 2. At the same time, the probe 12 can slide relative to the carrier 11 along the first direction X. When the probe 12 abuts against the object to be measured 2, even if the carrier 11 continues to slide, the probe 12 will not continue to press down. The pressure on the object to be measured 2 is the self-weight of the probe 12, so that the pressure when the probe 12 abuts against the object to be measured 2 can be relatively stable, reducing the occurrence of the probe 12 piercing through the object to be measured 2, and improving the uniformity of the test environment when the object to be measured 2 is tested, thereby improving the stability of the measurement result.

[0030] Optionally, the object to be measured 2 can be a solar cell, and the probe 12 abuts against the electrode of the solar cell.

[0031] Optionally, the test portion 100 can be a fixture or a platform with a fixture, etc., which can be specifically selected according to the actual situation and is not specifically limited in this embodiment.

[0032] In some embodiments, a slide rail portion 101a extending along the first direction X is provided on the support portion 101, the carrier 11 is provided with a slider portion 110, the slider portion 110 is slidably connected to the slide rail portion 101a, the carrier 11 is provided with a screw hole 111a penetrating itself along the first direction X, and the quantum efficiency measurement device 1 further includes a screw rod 13 and a motor 14. The screw rod 13 is provided on the test portion 100 and connected to the screw hole 111a, and the motor 14 is provided at one end of the screw rod 13 away from the test portion 100.

[0033] In this way, by providing the slide rail portion 101a and the slider portion 110, the sliding of the carrier 11 relative to the support portion 101 can be made more stable. At the same time, by providing the motor 14 and the screw rod 13, the motor 14 can drive the screw rod 13 to rotate, so that under the cooperation of the screw rod 13 and the screw hole 111a, a driving force is provided for the sliding of the carrier 11 relative to the support portion 101, and the sliding speed of the carrier 11 can be better controlled, making the sliding of the carrier 11 relatively slow and stable, further reducing the occurrence of the probe 12 piercing through the object to be measured 2.

[0034] Optionally, the number of the slide rail portion 101a and the slider portion 110 can be one or more, which can be specifically selected according to the actual situation and is not specifically limited in this embodiment. Exemplarily, Figure 1As shown, the number of the slide rail parts 101a and the slider parts 110 can both be two. The two slide rail parts 101a are symmetrically arranged on the support part 101, and the two slider parts 110 are symmetrically arranged on the carrier 11, which can make the sliding of the carrier 11 relative to the support part 101 more stable.

[0035] Optionally, the carrier 11 can be a block structure, a plate structure, a bracket structure, etc., and can be specifically selected according to the actual situation, and is not specifically limited in this embodiment.

[0036] In some embodiments, the carrier 11 includes a main body part 111 and a first carrier part 112. The main body part 111 is slidably connected to the support part 101, the first carrier part 112 is connected to the main body part 111, and the probe 12 is slidably connected to the first carrier part 112. In this embodiment, the slider part 110 and the screw hole 111a are arranged on the main body part 111.

[0037] In this way, the first carrier part 112 only needs to carry the probe 12, and the required load is relatively small. The thickness of the first carrier 11 can be made smaller than that of the main body part 111, which can reduce the overall mass of the carrier 11, thereby reducing the load that the support part 101 needs to bear and improving the service life of the quantum efficiency measurement device 1. At the same time, by setting the carrier 11 as the main body part 111 and the first carrier part 112, the components related to transmission such as the support part 101 and the screw 13 are all connected to the main body part 111, while the components related to testing such as the probe 12 and the pressure structure 15 are all arranged on the first carrier part 112, which can avoid the mutual influence of the movements between the two.

[0038] In some embodiments, the quantum efficiency measurement device 1 further includes a pressure structure 15. The pressure structure 15 is connected to the probe 12, and the pressure structure 15 is used to configure the pressure applied by the probe 12 to the object to be measured 2.

[0039] In this way, by setting the pressure structure 15, the pressure applied by the probe 12 to the object to be measured 2 can be configured according to the requirements during measurement, thereby further improving the flexibility of measurement.

[0040] Optionally, the pressure structure 15 can include a counterweight 150, a magnetic part, etc., and can be specifically selected according to the actual situation. The following will specifically describe two examples in which the pressure structure 15 includes a counterweight 150 and the pressure structure 15 includes a magnetic part respectively.

[0041] The pressure structure 15 includes a counterweight 150

[0042] Please refer to Figure 2, in some embodiments, the pressure structure 15 includes a counterweight 150, the counterweight 150 is detachably connected to one end of the probe 12 away from the test portion 100, and the counterweight 150 is configured to be replaceable so that the probe 12 applies different pressures to the object 2 to be measured.

[0043] In this way, by providing a configuration block detachably connected to the probe 12, when the probe 12 abuts against the object 2 to be measured, the pressure on the object 2 to be measured is the self-weight of the probe 12 and the self-weight of the counterweight 150. By replacing the counterweight 150 with different weights, the pressure applied by the probe 12 to the object 2 to be measured can be changed, which is convenient to use.

[0044] Exemplarily, the counterweight 150 may include, but is not limited to, for example, weights, iron blocks, etc.

[0045] In some embodiments, the carrier 11 is provided with a first through hole penetrating itself along the first direction X, the probe 12 is slidably connected to the first through hole, the quantum efficiency measuring device 1 further includes a limiting member 16, the limiting member 16 is provided on the side of the carrier 11 away from the test portion 100, and the limiting member 16 is connected to one end of the probe 12 away from the test portion 100, and the counterweight 150 is provided on the side of the limiting member 16 away from the carrier 11. In this embodiment, the first carrier portion 112 is provided with a first through hole penetrating itself along the first direction X, and the limiting member 16 is provided on the side of the first carrier portion 112 away from the test portion 100.

[0046] In this way, by providing the limiting member 16, when the probe 12 is not in contact with the object 2 to be measured, under the action of gravity, the limiting member 16 will abut against the side of the carrier 11 away from the test portion 100, so that both the limiting member 16 and the probe 12 will move in the first direction X following the carrier 11. When the probe 12 is in contact with the object 2 to be measured, since the probe 12 can slide relative to the first through hole, even if the carrier 11 continues to slide, the probe 12 will slide relative to the first through hole and will not continue to press down. The pressure on the object 2 to be measured is the self-weight of the probe 12, the limiting member 16 and the counterweight 150, so that the pressure when the probe 12 is in contact with the object 2 to be measured can be relatively stable. In addition, when it is necessary to adjust the pressure applied to the object 2 to be measured, only need to place counterweights 150 with different weights on the limiting member 16, which is convenient to use.

[0047] Optionally, the limiting member 16 may be a block structure or a plate structure, etc., which can be specifically selected according to the actual situation and is not specifically limited in this embodiment.

[0048] The following briefly describes the process of detecting the object 2 to be measured by adopting the scheme that the pressure structure 15 includes the counterweight 150:

[0049] First, set the pressure to be applied to the object 2 to be measured. After calculation, place the counterweight 150 of an appropriate weight on the limiting member 16. Then, turn on the motor 14 so that the carrier 11 drives the limiting member 16 and the probe 12 to move in the first direction X and away from the test portion 100. After the probe 12 is at a certain distance from the test portion 100, turn off the motor 14, place the object 2 to be measured on the test portion 100, and turn on the motor 14 again so that the carrier 11 drives the limiting member 16 and the probe 12 to move in the first direction X and close to the test portion 100 until the probe 12 abuts against the object 2 to be measured and the carrier 11 slides relative to the probe 12. At this time, the pressure applied by the probe 12 to the object 2 to be measured is the self-weight of the probe 12, the limiting member 16, and the counterweight 150. Finally, perform a quantum efficiency measurement on the object 2 to be measured.

[0050] The pressure structure 15 includes a magnetic member

[0051] Please refer to Figure 3 , in some embodiments, the pressure structure 15 includes a first magnetic member 151 and a second magnetic member 152. The first magnetic member 151 is connected to one end of the probe 12 facing away from the test portion 100. The second magnetic member 152 is provided on the carrier 11, and the second magnetic member 152 and the first magnetic member 151 are spaced apart in the first direction X. The first magnetic member 151 and / or the second magnetic member 152 are configured to be energized to generate a magnetic field.

[0052] In this way, by setting the first magnetic member 151 and the second magnetic member 152, when the probe 12 abuts against the object 2 to be measured, the pressure on the object 2 to be measured is the self-weight of the probe 12 and the magnetic force (repulsive force or attractive force) received by the first magnetic member 151. By adjusting the magnitude of the energizing current, the magnetic force received by the first magnetic member 151 can be adjusted, thereby changing the pressure applied by the probe 12 to the object 2 to be measured.

[0053] Optionally, the polarities of the first magnetic member 151 and the second magnetic member 152 can be the same or different, and can be specifically selected according to the magnitude of the pressure required to be applied to the object 2 to be measured (for example, if a relatively large pressure is required to be applied to the object 2 to be measured and the self-weight of the probe 12 is insufficient, the first magnetic member 151 and the second magnetic member 152 with the same polarity can be selected, and a repulsive force is generated between the first magnetic member 151 and the second magnetic member 152 to increase the pressure applied by the probe 12 to the object 2 to be measured; if a relatively small pressure is required to be applied to the object 2 to be measured and the self-weight of the probe 12 is already sufficient, the first magnetic member 151 and the second magnetic member 152 with different polarities can be selected, and an attractive force is generated between the first magnetic member 151 and the second magnetic member 152 to reduce the pressure applied by the probe 12 to the object 2 to be measured). No specific limitation is made in this embodiment.

[0054] Optionally, the first magnetic part 151 may be a permanent magnet and the second magnetic part 152 may be an electromagnet, or the first magnetic part 151 may be an electromagnet and the second magnetic part 152 may be a permanent magnet, or the first magnetic part 151 may be an electromagnet and the second magnetic part 152 may be an electromagnet. The specific selection can be made according to actual conditions and is not specifically limited in the embodiments.

[0055] In some embodiments, the carrier 11 also includes a second carrier portion 113, the first carrier portion 112 and the second carrier portion 113 are connected to the main body portion 111 at intervals along the first direction X, the first magnetic component 151 is located on the side of the first carrier portion 112 facing the second carrier portion 113, and the second magnetic component 152 is located on the side of the second carrier portion 113 facing the first carrier portion 112.

[0056] In this way, the first magnetic component 151 and the second magnetic component 152 are respectively arranged on the first bearing portion 112 and the second bearing portion 113, so that the first magnetic component 151 and the second magnetic component 152 are spaced apart and arranged opposite to each other in the first direction X. After the first magnetic component 151 and / or the second magnetic component 152 are energized, a magnetic force in the first direction X can be generated between the first magnetic component 151 and the second magnetic component 152, and the gravity of the probe 12 is in the same straight line as the magnetic force, which is beneficial to improve the accuracy of controlling the pressure applied by the probe 12 to the object 2 to be measured.

[0057] In some embodiments, the first bearing portion 112 is a block structure, the second bearing portion 113 is an L-shaped plate structure, and the two ends of the second bearing portion 113 are respectively connected to the main body portion 111 and the first bearing portion 112, thereby enclosing a accommodating space, which can accommodate the first magnetic component 151 and the second magnetic component 152, and protect the first magnetic component 151 and the second magnetic component 152.

[0058] The following is a brief description of the process of testing the object to be tested for the pressure structure including magnetic parts:

[0059] First, set the pressure that needs to be applied to the object 2 to be measured. After calculation, adjust the magnitude of the current passed by the external power supply to the electromagnets in the first magnetic member 151 and the second magnetic member 152, so that the magnetic force between the first magnetic member 151 and the second magnetic member 152 meets the required magnitude for calculation. Then, turn on the motor 14, so that the carrier 11 drives the limiting member 16 and the probe 12 to move in the first direction X and away from the test portion 100. After the probe 12 and the test portion 100 have a certain distance, turn off the motor 14, place the object 2 to be measured on the test portion 100, turn on the motor 14 again, so that the carrier 11 drives the limiting member 16 and the probe 12 to move in the first direction X and close to the test portion 100 until the probe 12 abuts against the object 2 to be measured and the carrier 11 slides relative to the probe 12. At this time, the pressure applied by the probe 12 to the object 2 to be measured is the self-weight of the probe 12, the limiting member 16 and the counterweight 150. Finally, perform quantum efficiency measurement on the object 2 to be measured.

[0060] Please refer to Figure 4 , in some embodiments, the probe 12 includes a needle body 120 and a contact head 121 provided at one end of the needle body 120. The needle body 120 can move along the first direction X under the drive of the carrier 11, and further, the needle body 120 can slide relative to the carrier 11 along the first direction X. The contact head 121 is used to abut against the object 2 to be measured. In this embodiment, the needle body 120 is slidably connected to the first through hole of the first carrier portion 112.

[0061] In this way, under the drive of the carrier 11, the needle body 120 can bring the contact head 121 close to the object 2 to be measured until it abuts against the object 2 to be measured, or make the contact head 121 away from the object 2 to be measured until it is far away from the object 2 to be measured. At the same time, the needle body 120 can slide relative to the carrier 11 along the first direction X. When the probe 12 abuts against the object 2 to be measured, even if the carrier 11 continues to slide, it will not cause the contact head 121 to continue to press down, reducing the occurrence of the probe 12 piercing through the object 2 to be measured.

[0062] Optionally, at least part of the material of the contact head 121 can be metal or alloy, etc., which can be specifically selected according to the actual situation and is not specifically limited in this embodiment.

[0063] In some embodiments, the contact head 121 is detachably connected to the needle body 120. In this way, different sizes or models of contact heads 121 can be replaced to adapt to different objects 2 to be measured.

[0064] In some embodiments, one end of the contact head 121 facing away from the needle body 120 is configured as a plane, and the plane is used to abut against the object 2 to be measured.

[0065] In this way, by making the end of the contact head 121 facing away from the needle body 120 a plane, that is, the side of the contact head 121 in contact with the object 2 to be measured is a plane without protrusions and sharp parts, the occurrence of the probe 12 piercing the object 2 to be measured can be further reduced.

[0066] Exemplarily, the contact head 121 may be a block-shaped structure connected to the needle body 120, and the outer diameter of the contact head 121 may be larger than the outer diameter of the needle body 120, so that the plane area formed by the end of the contact head 121 away from the needle body is larger, which can increase the contact area between the contact head 121 and the object to be tested 2, and further reduce the occurrence of the probe 12 piercing the object to be tested 2.

[0067] In some embodiments, a mounting hole 120a is provided at one end of the needle body 120 facing the test part 100, and the probe 12 also includes a pressure sensor 122 and a buffer 123. The pressure sensor 122 and the buffer 123 are sequentially arranged in the mounting hole 120a, the contact head 121 is connected to the buffer 123, and the pressure sensor 122 is used to detect the pressure of the contact head 121.

[0068] In this way, the mounting hole 120a can accommodate the pressure sensor 122 and the buffer 123. By setting the pressure sensor 122, the pressure between the contact head 121 and the object to be measured 2 can be detected in real time. At the same time, by setting the buffer 123, it can play a role of buffering and shock absorption when the contact head 121 contacts the object to be measured 2, further reducing the risk of the contact head 121 piercing the object to be measured 2.

[0069] Optionally, the buffer member 123 may be a spring or a gasket, etc., which may be selected according to actual conditions and is not specifically limited in this embodiment.

[0070] The quantum efficiency measurement device disclosed in the embodiment of the utility model is introduced in detail above. The principle and implementation mode of the utility model are explained in this article by using specific examples. The description of the above embodiments is only used to help understand the quantum efficiency measurement device of the utility model and its core idea. At the same time, for those skilled in the art, according to the idea of the utility model, there will be changes in the specific implementation mode and application scope. In summary, the content of this specification should not be understood as a limitation on the utility model.

Claims

1. A quantum efficiency measurement device, characterized in that, Comprising: A base, the base includes a testing portion and a supporting portion connected to the testing portion, the supporting portion extends along a first direction, and the testing portion is used for placing an object to be tested; A carrier, the carrier is slidably connected to the supporting portion; and A probe, the probe is slidably disposed on the carrier, the probe can move along the first direction driven by the carrier so that the probe abuts against or away from the object to be tested, and the probe can slide relative to the carrier along the first direction.

2. The quantum efficiency measurement device according to claim 1, characterized in that, The quantum efficiency measuring device further includes a pressure structure, the pressure structure is connected to the probe, and the pressure structure is used for configuring the pressure applied by the probe to the object to be tested.

3. The quantum efficiency measurement device according to claim 2, characterized in that, The pressure structure includes a counterweight, the counterweight is detachably connected to an end of the probe facing away from the testing portion, and the counterweight is configured to be replaceable so that the probe applies different pressures to the object to be tested.

4. The quantum efficiency measurement device according to claim 3, characterized in that, A first through hole extending through the carrier itself along the first direction is provided on the carrier, and the probe is slidably connected to the first through hole; The quantum efficiency measuring device further includes a limiting member, the limiting member is provided on a side of the carrier facing away from the testing portion, and the limiting member is connected to an end of the probe facing away from the testing portion, and the counterweight is provided on a side of the limiting member facing away from the carrier.

5. The quantum efficiency measuring device according to claim 2, characterized in that, The pressure structure includes a first magnetic member and a second magnetic member, the first magnetic member is connected to an end of the probe facing away from the testing portion, the second magnetic member is provided on the carrier, and the second magnetic member and the first magnetic member are spaced apart in the first direction, and the first magnetic member and / or the second magnetic member is configured to be energized to generate a magnetic field.

6. The quantum efficiency measurement device according to claim 5, characterized in that The carrier includes a main body portion, a first bearing portion and a second bearing portion, the main body portion is slidably connected to the supporting portion, the first bearing portion and the second bearing portion are connected to the main body portion at intervals along the first direction, a first through hole extending through the first bearing portion itself along the first direction is provided on the first bearing portion, the probe is slidably connected to the first through hole, the first magnetic member is located on a side of the first bearing portion facing the second bearing portion, and the second magnetic member is provided on a side of the second bearing portion facing the first bearing portion.

7. The quantum efficiency measurement device according to any one of claims 1-6, characterized in that, The probe includes a needle body and a contact head provided at one end of the needle body, the needle body can move along the first direction driven by the carrier, and the needle body can slide relative to the carrier along the first direction, and the contact head is used for abutting against the object to be tested.

8. The quantum efficiency measurement device according to claim 7, characterized in that, An end of the contact head facing away from the needle body is configured to be a plane, and the plane is used for abutting against the object to be tested.

9. The quantum efficiency measurement device according to claim 7, characterized in that An installation hole is provided at an end of the needle body facing the testing portion, the probe further includes a pressure sensor and a buffer member, the pressure sensor and the buffer member are sequentially disposed in the installation hole, the contact head is connected to the buffer member, and the pressure sensor is used for detecting the pressure of the contact head.

10. The quantum efficiency measurement device according to any one of claims 1-6, characterized in that, A slide rail portion extending along the first direction is provided on the support portion, a slider portion is provided on the carrier, the slider portion is slidably connected to the slide rail portion, a threaded hole penetrating through the carrier itself along the first direction is provided on the carrier, the quantum efficiency measuring device further includes a screw rod and a motor, the screw rod is arranged on the testing portion and connected to the threaded hole, and the motor is arranged at one end of the screw rod away from the testing portion.

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