Fault detection device

Abstract

The utility model relates to a fault detection device. Comprising a channel selection unit, a current acquisition unit and an ADC acquisition unit. The channel selection unit comprises a plurality of signal test channels and is configured to receive the test signals and switch the conduction states of the signal test channels based on the control signals, so that the test signals are output through different signal test channels; the current acquisition unit is configured to acquire a test signal output by the channel selection unit and send the acquired signal to the ADC acquisition unit; the ADC acquisition unit is configured to receive the acquisition signal, output a digital signal, and determine a fault based on the output digital signal.

Description

Technical Field

[0001] The utility model relates to the technical field of new energy vehicles, and particularly relates to a fault detection device. Background Art

[0002] With the rapid development of automotive electronics technology, the degree of electronization is getting higher and higher, and the demand for fault location detection of electronic devices is also becoming more and more urgent. Since automotive electronic devices are different from industrial electronic devices, they have higher safety requirements and need to report fault risks in a timely manner. However, they are not easy to disassemble when assembled in the vehicle. In the current technology, only some circuits have a fault detection function, and only the internal functional circuits of the electronic devices are detected. Fault analysis is very inconvenient, and it is necessary to disassemble many automotive parts before the electronic device can be taken out for further analysis. Therefore, it is urgent to improve the fault location detection efficiency. Content of the Utility Model

[0003] The purpose of the utility model is to provide a fault detection device to solve the technical problem of low fault detection efficiency of automotive electronic devices.

[0004] An embodiment of the utility model discloses a fault detection device, which includes a channel selection unit, a current acquisition unit, and an ADC acquisition unit;

[0005] The channel selection unit includes a plurality of signal test channels and is configured to receive a test signal and switch the conduction state of the signal test channels based on a control signal, so that the test signal is output via different signal test channels;

[0006] The current acquisition unit is configured to acquire the test signal output by the channel selection unit and send the acquired signal to the ADC acquisition unit;

[0007] The ADC acquisition unit is configured to receive the acquired signal, output a digital signal, and judge a fault based on the output digital signal.

[0008] Optionally, the number of the channel selection units and the current acquisition units is the same and is a plurality;

[0009] A plurality of the channel selection units and a plurality of the current acquisition units correspond one by one;

[0010] A plurality of the channel selection units respectively receive different test signals.

[0011] Optionally, the channel selection unit includes an enable pin and a plurality of control pins.

[0012] Optionally, when a low level is input to the enable pin, all the signal test channels are not conducted;

[0013] When the enable pin inputs a high level, one of the multiple signal test channels is controlled to conduct according to the combination of the levels input by the multiple control pins.

[0014] Optionally, the number of the signal test channels is 7; the number of the multiple control pins is 3.

[0015] Optionally, the current acquisition unit includes an isolation amplifier and an operational amplifier;

[0016] Both ends of the input end of the isolation amplifier are electrically connected to the input end and the output end of the loop of the test signal respectively;

[0017] The output end of the isolation amplifier is electrically connected to the input end of the operational amplifier;

[0018] The output end of the operational amplifier outputs the acquired signal.

[0019] Optionally, the input end of the isolation amplifier includes an input end Vin1+ and an input end Vin1-; the output end of the isolation amplifier includes an output end Vout+ and an output end Vout-;

[0020] The input end of the operational amplifier includes an input end Vin2+ and an input end Vin2-;

[0021] The output end Vout+ is connected to the input end Vin2+ through a resistor R2, and the input end Vin1- is connected to the input end Vin2- through a resistor R1; and

[0022] A capacitor C1 and a resistor R3 in parallel are connected between the input end Vin2- and the output end of the operational amplifier;

[0023] A capacitor C2 and a resistor R4 in parallel are connected between the input end Vin2+ and the ground.

[0024] Optionally, judging the fault based on the output digital signal includes:

[0025] When the value of the digital signal is within a predetermined range, it indicates that the loop corresponding to the conducting signal test channel is normal;

[0026] When the value of the digital signal exceeds the predetermined range, it indicates that the loop corresponding to the conducting signal test channel has a fault.

[0027] Optionally, the predetermined range is obtained by collecting data of multiple groups of normal test signals and performing statistics.

[0028] Optionally, judging the fault based on the output digital signal further includes:

[0029] When the value of the digital signal is less than the first predetermined threshold, it indicates that the loop corresponding to the signal test channel representing conduction is open, or the external loop where the test signal is located is open;

[0030] When the value of the digital signal is greater than the second predetermined threshold, it indicates that the loop corresponding to the signal test channel representing conduction is short-circuited, or the external loop where the test signal is located is short-circuited.

[0031] Compared with the prior art, the main differences and effects of the embodiments of the present invention are as follows:

[0032] The present invention can be applied to automotive electronic devices, enabling the fault location detection function and the fault diagnosis function to be included in the overall design in advance. Different signal test channels can be selected by the control signal to control the channel selection unit for fault diagnosis, realizing the reuse of the detection circuit and reducing costs; and at the initial power-on moment, the signal of the external interface can also be introduced by the control signal to control the channel selection unit, and the software reads the test data for safety inspection, thereby realizing self-checking and reporting to the system to improve the safety of the circuit; and after installation, the fault point can be located by reading the test data through software without disassembling the vehicle parts, greatly improving the efficiency of on-site fault troubleshooting. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] Figure 1 A block diagram of a fault detection device according to an embodiment of the present application is shown.

[0034] Figure 2 A block diagram of a fault detection device according to another embodiment of the present application is shown.

[0035] Figure 3 A block diagram of a channel selection unit according to an embodiment of the present application is shown.

[0036] Figure 4 A circuit diagram of a current acquisition unit according to an embodiment of the present application is shown. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0037] To make the objectives, technical solutions, and advantages of the present application clearer, the embodiments of the present application will be further described in detail below with reference to the accompanying drawings.

[0038] In the current technology, only some circuits have a fault detection function, and only the internal functional circuits of electronic devices are detected. When there are faults in the devices connected to the outside of the electronic device or the connection harness is abnormal, it is difficult to troubleshoot; in addition, it is difficult to disassemble the automotive parts on the vehicle, which is very inconvenient for quickly locating and troubleshooting faults on-site. In view of these problems, the embodiments of the present application propose a fault detection device. As Figure 1As shown, the fault detection device 10 includes a channel selection unit 11, a current acquisition unit 12, and an ADC acquisition unit 13. More specifically, by way of example, the channel selection unit 11 may include an external signal input terminal and a signal transmission terminal; the current acquisition unit 12 includes a signal acquisition terminal and an analog signal output terminal, and the signal acquisition terminal is electrically connected to the signal transmission terminal of the channel selection unit 11; the ADC acquisition unit 13 includes an analog signal input terminal and a digital signal output terminal, and the analog signal input terminal is electrically connected to the analog signal output terminal of the current acquisition unit 12.

[0039] The channel selection unit 11 includes a plurality of signal test channels and is configured to receive a test signal and switch the conduction state of the signal test channels based on a control signal, so that the test signal is output via different signal test channels. More specifically, by way of example, the test signal y0 may be introduced by an external interface Y0 and then input to the external signal input terminal; the channel selection unit 11 switches the conduction state of the signal test channels based on the control signal, so that the test signal y0 reaches the signal transmission terminal via different signal test channels and is output.

[0040] The current acquisition unit 12 is configured to acquire the test signal output by the channel selection unit 11 and send the acquired signal to the ADC acquisition unit 13. More specifically, by way of example, the signal acquisition terminal of the current acquisition unit 12 acquires the test signal y0 output by the signal transmission terminal; after the current acquisition unit 12 processes the acquired test signal y0, its analog signal output terminal outputs an analog signal Vout to the analog signal input terminal of the ADC acquisition unit 13.

[0041] The ADC acquisition unit 13 is configured to receive an acquisition signal, output a digital signal, and determine a fault based on the output digital signal. More specifically, as an example, the ADC acquisition unit 13 receives an analog signal Vout from the current acquisition unit 12 through an analog signal input terminal, performs analog-to-digital conversion, and outputs a digital signal through a digital signal output terminal. For example, finally, specific ADC acquisition values are output through a screen. By collecting and statistically analyzing data of multiple groups of normal test signals, the range (a, b) of the ADC acquisition values corresponding to the test signals introduced from the external interface Y0 can be obtained. In each subsequent test, when the ADC acquisition value is within the range (a, b), it can be determined that this signal is normal, that is, the circuit loop corresponding to the selected signal test channel (the currently conducting signal test channel) is normal; when the ADC acquisition value exceeds the range (a, b), there is an abnormality, including two cases: when the ADC acquisition value is much smaller than a (less than a first predetermined threshold), it can be determined that the circuit loop corresponding to the selected signal test channel is open, or the external loop where the test signal y0 introduced from the external interface Y0 is located is open; when the ADC acquisition value is much larger than b (greater than a second predetermined threshold), it can be determined that the circuit loop corresponding to the selected signal test channel is short-circuited, or there is a short circuit in the external loop where the test signal y0 introduced from the external interface Y0 is located, including a short connection or an internal short circuit. The ADC acquisition value can be read by software, so as to automatically determine the abnormal loop of the signal based on the above logic, quickly locate the fault, and perform self-check during power-on and power-off, which can effectively screen out faults before operation, report to the system, and improve the system security.

[0042] The utility model can be applied to automotive electronic devices, so that the functions of fault location detection and fault diagnosis are included in the overall design in advance. Different signal test channels can be selected by the channel selection unit through a control signal for fault diagnosis, realizing the reuse of the detection circuit and reducing costs; and at the initial power-on moment, the signal of the external interface can also be introduced by the channel selection unit through a control signal, and the software reads the test data for safety inspection, so as to perform self-check, report to the system, and improve the safety of the circuit; and after installation, the fault point can be located by reading the test data through software without disassembling the vehicle parts, greatly improving the efficiency of on-site fault troubleshooting.

[0043] As a preferred embodiment, in order to input different test signals to different circuits to be measured, the number of channel selection units and current acquisition units is the same and is multiple; the multiple channel selection units and the multiple current acquisition units correspond one by one; the multiple channel selection units respectively receive different test signals. For example, as Figure 2As shown in the figure, the number of channel selection units in the fault detection device 20 is 4, including: the channel selection unit 211 corresponding to the external interface Y1, the channel selection unit 212 corresponding to the external interface Y2, the channel selection unit 213 corresponding to the external interface Y3, and the channel selection unit 214 corresponding to the external interface Y4, which form the channel selection module 21; the number of current acquisition units is 4, including: the current acquisition unit 221 corresponding to the channel selection unit 211, the current acquisition unit 222 corresponding to the channel selection unit 212, the current acquisition unit 223 corresponding to the channel selection unit 213, and the current acquisition unit 224 corresponding to the channel selection unit 214, which form the current acquisition module 22. The analog signals output by different current acquisition units are all transmitted to the ADC acquisition module 23. In this way, the test signals introduced by different external interfaces correspond to different channel selection unit-current acquisition unit pairs. By collecting multiple groups of data and performing statistics, the ranges of the ADC acquisition values corresponding to the test signals introduced from the external interfaces Y1, Y2, Y3, and Y4 can be respectively obtained. During subsequent tests, fault judgments are made on the circuits corresponding to the corresponding signal test channels or the circuits where the test signals are located based on these ranges of ADC acquisition values.

[0044] As a preferred embodiment, the channel selection unit includes an enable pin and multiple control pins; when a low level is input to the enable pin, all signal test channels are not conducted; when a high level is input to the enable pin, according to the combination of the levels input to the multiple control pins, one signal test channel among the multiple signal test channels is controlled to be conducted. Optionally, the number of signal test channels is 7; the number of multiple control pins is 3. As an example, as Figure 3 shown, the channel selection unit 30 includes an enable pin EN, control pins A0, A1, A2, signal test channels D0, D1, D2, D3, D4, D5, D6, D7, and an output port Y. Based on the high and low levels of the control signals input to the enable pin EN, control pins A0, A1, A2, the working logic of the channel selection unit is as shown in Table 1 below, where 0 represents a low level, 1 represents a high level, and X represents any level. As can be seen from Table 1, when the level on the enable pin EN is low level 0, all signal test channels are not conducted. When the EN enable pin is at high level 1, by collecting the corresponding digital signals sent by the control module to A0, A1, A2, the conduction states of a total of 8 channels D0 - D7 are controlled.

[0045] Table 1

[0046]

[0047] As a preferred embodiment, the current acquisition unit includes an isolation amplifier and an operational amplifier; both ends of the input terminal of the isolation amplifier are electrically connected to the input terminal and the output terminal of the loop of the test signal respectively; the output terminal of the isolation amplifier is electrically connected to the input terminal of the operational amplifier; the output terminal of the operational amplifier outputs the acquired signal. Specifically, as Figure 4 shown, the current acquisition unit 40 has an isolation amplifier A1 and an operational amplifier A2. The isolation amplifier A1 includes input terminals Vin1+ and Vin1-, and output terminals Vout+ and Vout-. The operational amplifier A2 includes input terminals Vin2+ and Vin2-, and an output terminal Vout. Vout+ is connected to Vin2+ through a resistor R2, and Vin1- is connected to Vin2- through a resistor R1. And a capacitor C1 and a resistor R3 in parallel are connected between Vin2- and Vout. A capacitor C2 and a resistor R4 in parallel are connected between Vin2+ and the ground.

[0048] Both ends Vin1+ and Vin1- of the input terminal of the isolation amplifier A1 actually constitute the signal acquisition end of the current acquisition unit 40. The output terminal Vout of the operational amplifier A2 actually constitutes the analog signal output end of the current acquisition unit 40. Vin1+ and Vin1- are respectively connected to the input terminal and the output terminal of the loop of the test signal. Taking the external interface Y1 and its signal y1 as an example, Vin1+ and Vin1- are respectively electrically connected to the input terminal and the output terminal of the circuit or wire harness of signal A, and these input and output terminals are used as the acquisition points. In this way, the circuit or wire harness between Vin1+ and Vin1- is equivalent to a high-precision resistor Rsense. When a weak current signal flows through the equivalent resistor Rsense, a voltage drop signal will be formed on the equivalent resistor Rsense; the isolation amplifier A1 acquires this voltage drop signal and outputs it to the operational amplifier A2; the operational amplifier A2 processes it to form an analog signal Vout, and then transmits it to the ADC acquisition unit 13.

[0049] Under normal circumstances, the working current of the circuit or wire harness of signal A is stable, so the voltages acquired by Vin1+ and Vin1- from the acquisition points are also specific values. When the circuit or wire harness of signal A is abnormally short-circuited, the impedance of the equivalent resistor Rsense becomes smaller, and the voltages actually acquired by Vin1+ and Vin1- will be smaller than the normal specific values; when the circuit or wire harness of signal A is abnormally open-circuited, the impedance of the equivalent resistor Rsense becomes larger, and the voltages actually acquired by Vin1+ and Vin1- will be larger than the normal specific values. Based on this, it can be preliminarily determined whether there is an open circuit or a short circuit in the measured circuit or wire harness.

[0050] Applied in the fault detection scenario of the circuit or wiring harness of an automobile, by switching the signal test channels of the channel selection unit to test the conduction state of the channels, so that the test signal reaches the signal transmission end of the channel selection unit via different signal test channels and is output to the current acquisition unit, enabling the current acquisition unit to collect the voltage of different circuits or wiring harnesses. In this way, the current acquisition unit will collect the voltage change at the acquisition point caused by the short circuit or open circuit of the circuit or wiring harness, and convert it into an analog signal and output it to the ADC acquisition unit. Finally, based on the digital signal output by the ADC acquisition unit, it can be determined which specific circuit or wiring harness is abnormal. Specifically, when applied to the battery management system of an automobile, it can determine which specific circuit or wiring harness of a string of battery cells is abnormal; it can also be applied to the use scenarios such as the troubleshooting of the entire vehicle wiring harness or the entire vehicle circuit of an automobile, and can also determine which specific circuit or wiring harness in the entire vehicle is abnormal; improving the efficiency of troubleshooting fault problems on site.

[0051] It can be understood that the specific embodiments described herein are only for explaining the present application, rather than limiting the present application. In addition, for the convenience of description, only the parts related to the present application rather than all the structures or processes are shown in the drawings. It should be noted that in this specification, similar reference numerals and letters denote similar items in the drawings.

[0052] In the description of the present application, it should also be noted that unless otherwise clearly specified and limited, the term "connection" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the internal communication of two components. For those of ordinary skill in the art, the specific meanings of the above terms in this embodiment can be understood according to specific situations.

[0053] The illustrative embodiments of the present application include but are not limited to the fault detection device.

[0054] The various aspects of the illustrative embodiments will be described using the terms commonly employed by those skilled in the art to convey the substance of their work to other skilled artisans in the art. However, it will be apparent to those skilled in the art that some alternative embodiments can be practiced using some of the features described. For purposes of explanation, specific numbers and configurations are set forth to provide a more thorough understanding of the illustrative embodiments. However, it will be apparent to those skilled in the art that alternative embodiments can be practiced without specific details. In some other cases, some well-known features are omitted or simplified to avoid obscuring the illustrative embodiments of the present application.

[0055] In addition, various operations will be described as multiple operations that are separate from each other in a manner most conducive to understanding the illustrative embodiments; however, the order of description should not be construed as implying that these operations must be dependent on the described order, and many of these operations can be implemented in parallel, concurrently, or simultaneously. In addition, the order of the various operations can also be rearranged. When the described operations are completed, the process can be terminated, but there can also be additional steps not included in the drawings. The process can correspond to a method, function, procedure, subroutine, subprogram, and the like.

[0056] References in the specification to "an embodiment", "a preferred embodiment", "another embodiment", etc. mean that the described embodiment may include a particular feature, structure, or property, but each embodiment may or may not necessarily include the particular feature, structure, or property. Moreover, these phrases are not necessarily directed to the same embodiment. In addition, when a particular feature is described in connection with a specific embodiment, the knowledge of those skilled in the art can affect the combination of these features with other embodiments, whether or not those embodiments are explicitly described.

[0057] Unless the context otherwise requires, the terms "having" and "including" are synonyms. The phrase "A and / or B" means "(A), (B), or (A and B)".

[0058] As used herein, the term "module" can refer to, as part of it, or include: a memory (shared, dedicated, or group) for running one or more software or firmware programs, an application specific integrated circuit (ASIC), an electronic circuit, and / or a processor (shared, dedicated, or group), combinational logic circuitry, and / or other suitable components that provide the function.

[0059] In the drawings, some structural or method features may be shown in a particular arrangement and / or order. However, it should be understood that such a particular arrangement and / or ordering is not required. Rather, in some embodiments, these features can be illustrated in a manner and / or order different from that shown in the illustrative drawings. Additionally, the structural or method features included in a particular drawing do not mean that all embodiments need to include such features. In some embodiments, these features may not be included or may be combined with other features.

[0060] In some cases, the disclosed embodiments may be implemented in hardware, firmware, software, or any combination thereof. The disclosed embodiments may also be implemented in the form of instructions or programs carried or stored on one or more transient or non-transient machine-readable (e.g., computer-readable) storage media, which may be read and executed by one or more processors, etc. When the instructions or programs are run by a machine, the machine may perform the various methods described above. For example, the instructions may be distributed via a network or other computer-readable media. Thus, machine-readable media may include, but are not limited to, any mechanism for storing or transmitting information in a form readable by a machine (e.g., a computer), such as a floppy disk, an optical disk, a compact disc read-only memory (CD-ROMs), a magneto-optical disk, a read-only memory (ROM), a random access memory (RAM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), a magnetic or optical card, or a flash memory or tangible machine-readable memory for transmitting network information by electrical, optical, acoustic, or other forms of signals (e.g., carrier waves, infrared signals, digital signals, etc.). Thus, machine-readable media include any form of machine-readable media suitable for storing or transmitting electronic instructions or machine (e.g., computer) readable information.

[0061] The embodiments of the present application have been described in detail above in conjunction with the accompanying drawings. However, the use of the technical solutions of the present application is not limited to the various applications mentioned in the embodiments of the present application. Various structures and variations can be easily implemented with reference to the technical solutions of the present application to achieve the various beneficial effects mentioned herein. All changes made without departing from the spirit of the present application within the scope of knowledge possessed by those of ordinary skill in the art shall fall within the scope covered by the patent of the present application.

Claims

1. A fault detection device, characterized in that, It includes a channel selection unit, a current acquisition unit, and an ADC acquisition unit; the channel selection unit includes a plurality of signal test channels and is configured to receive a test signal and switch the conduction state of the signal test channels based on a control signal, so that the test signal is output via different signal test channels; The current acquisition unit is configured to acquire the test signal output by the channel selection unit and send the acquired signal to the ADC acquisition unit; The ADC acquisition unit is configured to receive the acquired signal, output a digital signal, and judge a fault based on the output digital signal.

2. The fault detection device according to claim 1, characterized in that The number of the channel selection unit and the current acquisition unit is the same and is a plurality; A plurality of the channel selection units and a plurality of the current acquisition units correspond one by one; A plurality of the channel selection units respectively receive different test signals.

3. The fault detection device according to claim 1, characterized in that, The channel selection unit includes an enable pin and a plurality of control pins.

4. The fault detection device according to claim 3, wherein When a low level is input to the enable pin, all the signal test channels are not conducting; When a high level is input to the enable pin, according to the combination of the levels input by the plurality of control pins, one signal test channel among the plurality of signal test channels is controlled to conduct.

5. The fault detection device according to claim 4, characterized in that The number of the signal test channels is 7; the number of the plurality of control pins is 3.

6. The fault detection device according to claim 1, wherein The current acquisition unit includes an isolation amplifier and an operational amplifier; Both ends of the input end of the isolation amplifier are electrically connected to the input end and the output end of the loop of the test signal respectively; The output end of the isolation amplifier is electrically connected to the input end of the operational amplifier; The output end of the operational amplifier outputs the acquired signal.

7. The fault detection device according to claim 6, wherein, The input end of the isolation amplifier includes an input end Vin1+ and an input end Vin1-; the output end of the isolation amplifier includes an output end Vout+ and an output end Vout-; The input end of the operational amplifier includes an input end Vin2+ and an input end Vin2-; The output end Vout+ is connected to the input end Vin2+ through a resistor R2, and the input end Vin1- is connected to the input end Vin2- through a resistor R1; and A capacitor C1 and a resistor R3 in parallel are connected between the input end Vin2- and the output end of the operational amplifier; A capacitor C2 and a resistor R4 in parallel are connected between the input end Vin2+ and the ground.

8. The fault detection device according to claim 1, characterized in that Judging the fault based on the output digital signal includes: When the value of the digital signal is within a predetermined range, it indicates that the loop corresponding to the conducting signal test channel is normal; When the value of the digital signal exceeds the predetermined range, it indicates that the loop corresponding to the conducting signal test channel has a fault.

9. The fault detection device according to claim 8, characterized in that, The predetermined range is obtained by collecting data of multiple groups of normal test signals and performing statistics.

10. The fault detection device according to claim 8, characterized in that, Judging the fault based on the output digital signal further includes: When the value of the digital signal is less than a first predetermined threshold, it indicates that the loop corresponding to the conducting signal test channel is open, or the external loop where the test signal is located is open; When the value of the digital signal is greater than a second predetermined threshold, it indicates that the loop corresponding to the signal test channel representing conduction is short-circuited, or the external loop where the test signal is located is short-circuited.

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