High-temperature insulation resistance test fixture for multi-core ceramic dielectric capacitor

Abstract

A high-temperature insulation resistance test fixture for a multi-core-group ceramic dielectric capacitor comprises a base, a test plate arranged on the base, a mounting mechanism arranged on the test plate and used for mounting the multi-core-group ceramic dielectric capacitor, and a locking adjusting mechanism arranged on the mounting mechanism and used for pressing the capacitor. The mounting mechanism comprises a mounting plate arranged on the test plate, a plurality of test grooves formed in the mounting plate at intervals, and a plurality of test gasket groups arranged in the plurality of test grooves respectively; the stock bin plate is arranged on the mounting plate; the plurality of mounting grooves are formed in the stock bin plate at intervals, are opposite to the plurality of test grooves one by one and are used for mounting the multi-core-group ceramic dielectric capacitors; the structure of the test fixture is specifically limited, and the adjusting locking mechanism is introduced to press down the multi-core ceramic dielectric capacitor in the mounting groove to enable the multi-core ceramic dielectric capacitor to be in close contact with the test gasket group, so that the high-temperature insulation resistance test of the multi-core ceramic dielectric capacitor is ensured to be stably carried out.

Description

Technical Field

[0001] The utility model belongs to the field of capacitor performance testing, and particularly relates to a high-temperature insulation resistance testing fixture for multi-core ceramic capacitors. Background Art

[0002] With the rapid development of the electronic information industry, the development of MLCC has gradually shown diversification. At present, the development of MLCC technology has been difficult to meet the existing needs, and there are some inherent deficiencies in MLCC itself. Therefore, multi-core ceramic capacitors have emerged, realizing the high-difficulty design of ultra-large capacitance and ultra-low ESR of ceramic capacitors. This type of capacitor can be used for input / output filtering of high-frequency high-current switching power supplies, power bus filtering, DC-DC converters, etc.

[0003] The multi-core ceramic capacitor is designed with special pins, which can eliminate the linear displacement caused by different expansion coefficients between the ceramic capacitor and the PCB board, solve the problem of solder joint fatigue, and prevent the ceramic body of the capacitor from cracking due to PCB board bending, improving the reliability of product use.

[0004] The appearance of the multi-core ceramic capacitor is different from that of conventional chip MLCC or leaded capacitors. The traditional MLCC testing methods and testing tooling fixtures cannot meet its testing requirements and need to be further improved. Content of the Utility Model

[0005] The purpose of the utility model is to overcome the shortcomings of the prior art and provide a high-temperature insulation resistance testing fixture for multi-core ceramic capacitors.

[0006] The utility model adopts the following technical scheme:

[0007] A high-temperature insulation resistance testing fixture for multi-core ceramic capacitors, the multi-core ceramic capacitor includes a ceramic capacitor body and two lead-out ends oppositely arranged at both ends of the ceramic capacitor body, and includes a base, a test board arranged on the base, an installation mechanism arranged on the test board for installing the multi-core ceramic capacitor, and a locking and adjusting mechanism arranged on the installation mechanism for pressing down the capacitor. The installation mechanism includes an installation board arranged on the test board, a plurality of test slots spaced on the installation board, a plurality of test gasket groups respectively arranged in the plurality of test slots, a bin board arranged on the installation board, and a plurality of installation slots spaced on the bin board and corresponding to the plurality of test slots one by one for installing the multi-core ceramic capacitor.

[0008] Further, the test gasket group includes two metal gaskets spaced oppositely in the test slot and connected to the test board. When the multi-core ceramic capacitor is arranged in the installation slot, its two lead-out ends are respectively abutted against the two metal gaskets.

[0009] Furthermore, the locking adjustment mechanism includes a test pressure strip arranged above the hopper plate, a plurality of elastic pressure rods spaced apart on the test pressure strip, and a locking member arranged between the mounting plate and the test pressure strip. The locking member works to press the elastic pressure rod down against the relative multi-core ceramic capacitor so that the two lead ends are respectively kept in contact with the two metal gaskets.

[0010] Furthermore, the elastic pressure rod includes a test rod body extending downwardly on the test pressure strip, a pressure block arranged at the front end of the test rod body and abutting against the multi-core ceramic capacitor, and a compression spring sleeved on the test rod body with one end connected to the pressure block and the other end connected to the test pressure strip.

[0011] Furthermore, the elastic pressure rod also includes a fixing nut arranged on the test pressure strip and threadedly connected to the test rod body, and the test pressure strip is provided with a clearance hole for the upper end of the test rod body to pass through.

[0012] Furthermore, the locking member includes locking rods spaced apart on the mounting plate and extending upward through the silo plate and the test strip in sequence, and a butterfly locking nut abutting against the top of the test strip and cooperating with the locking rod.

[0013] Furthermore, the test pressure strip includes a pressure strip body and a locking portion arranged on the pressure strip body, a plurality of elastic pressure rods are respectively arranged on both sides of the locking portion, and the butterfly locking nut abuts against the top surface of the locking portion.

[0014] Furthermore, it also includes a connecting mechanism arranged on the base to connect the test equipment and the test board, the connecting mechanism includes two connecting blocks extending outward from the side of the base, a connecting base arranged between the two connecting blocks, and a plurality of connecting pins arranged at intervals on the connecting base opposite to the side of the test board, one end of the connecting pin is connected to the test equipment and the other end is connected to the test board through a wire.

[0015] From the above description of the utility model, it can be seen that compared with the prior art, the beneficial effects of the utility model are: the present application specifically defines the structure of the test fixture, introduces an adjusting locking mechanism to press down the multi-core ceramic capacitor in the installation slot so that it is in close contact with the test gasket group, ensuring the stable high-temperature insulation resistance test of the multi-core ceramic capacitor, and through the test fixture defined in this application, the corresponding hopper plate can be flexibly replaced according to different product sizes, with the characteristics of simple and convenient operation, flexibility, and strong versatility. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a structural diagram of the test fixture;

[0017] Figure 2 Schematic diagram of part of the test fixture structure;

[0018] Figure 3Schematic diagram of the installation mechanism;

[0019] In the figure, 1 - base, 2 - test board, 3 - installation mechanism, 4 - locking and adjusting mechanism, 5 - connection mechanism, 31 - mounting plate, 32 - test slot, 33 - metal gasket, 34 - bin plate, 35 - installation slot, 41 - test pressure bar, 411 - pressure bar body, 412 - locking part, 413 - relief hole, 42 - elastic pressure rod, 421 - test rod body, 422 - pressing block, 423 - compression spring, 424 - fixing nut, 43 - locking piece, 431 - locking rod, 432 - butterfly locking nut, 51 - connecting block, 52 - connecting seat, 53 - connecting thimble. Detailed implementation mode

[0020] The present utility model will be further described below through specific implementation modes.

[0021] Refer to Figures 1 to 3 As shown, a high - temperature insulation resistance test fixture for multi - core ceramic dielectric capacitors includes a base 1, a test board 2, an installation mechanism 3, a locking and adjusting mechanism 4, and a connection mechanism 5.

[0022] The multi - core ceramic dielectric capacitor includes a ceramic capacitor body and two lead - out ends provided at both ends of the ceramic capacitor body.

[0023] The test board 2 is arranged on the base 1 and is provided with a plurality of contact bumps thereon.

[0024] The installation mechanism 3 is arranged on the test board 2 for installing multi - core ceramic dielectric capacitors, and includes a mounting plate 31 arranged on the test board 2, a plurality of test slots 32 arranged at intervals on the mounting plate 31, a plurality of test gasket groups respectively arranged in the plurality of test slots 32, a bin plate 34 arranged on the mounting plate 31, and a plurality of installation slots 35 arranged at intervals on the bin plate 34 and corresponding to the plurality of test slots 32 one by one for installing multi - core ceramic dielectric capacitors. Specifically, the test gasket group includes two metal gaskets 33 arranged oppositely at intervals in the test slot 32 and connected to the test board 2. When the multi - core ceramic dielectric capacitor is arranged in the installation slot 35, its two lead - out ends are respectively abutted against the two metal gaskets 33, so that the multi - core ceramic dielectric capacitor is electrically connected to the test board 2.

[0025] The locking and adjusting mechanism 4 includes a test pressure bar 41 arranged above the bin plate 34, a plurality of elastic pressure rods 42 arranged at intervals on the test pressure bar 41, and a locking piece 43 arranged between the mounting plate 31 and the test pressure bar 41. The locking piece 43 works to press the plurality of elastic pressure rods 42 down against the corresponding multi - core ceramic dielectric capacitors so that the two lead - out ends are respectively kept in contact with the two metal gaskets 33, ensuring the stability of the high - temperature insulation resistance test.

[0026] The elastic pressure rod 42 includes a test rod body 421 extending downwardly from the test pressure strip 42, a pressure block 422 arranged at the front end of the test rod body 421 and abutting against the multi-core ceramic capacitor, a compression spring 423 sleeved on the test rod body 421 and connected to the pressure block 422 at one end and the test pressure strip 41 at the other end, and a fixing nut 424 arranged on the test pressure strip 41 and threadedly connected to the test rod body 421. Specifically, a clearance hole 413 is provided on the test pressure strip 41 for the upper end of the test rod body 421 to pass through.

[0027] The locking member 43 includes a locking rod 431 that is spaced apart and extends upwardly through the hopper plate 34 and the test pressure strip 41 in sequence, and a butterfly locking nut 432 that abuts against the top of the test pressure strip 41 and cooperates with the locking rod 431. The test pressure strip 41 is driven downward by the cooperation between the butterfly locking nut 432 and the locking rod 431, so that the elastic pressure rod 42 presses down the multi-core ceramic capacitor to maintain good contact with the metal gasket 33.

[0028] The test pressure strip 41 includes a pressure strip body 411 and a locking portion 412 arranged on the pressure strip body 411. Multiple elastic pressure rods 42 are respectively arranged on both sides of the locking portion 412. The locking rod 431 is arranged on the mounting plate 31 and extends upward through the locking portion 412. The butterfly locking nut 432 abuts against the top of the locking portion 412 and cooperates with the locking rod 431.

[0029] The connecting mechanism 5 is provided on the base 1 to connect the test equipment and the test board 2. It includes two connecting blocks 51 extending outward from the side of the base 1, a connecting seat 52 provided between the two connecting blocks 51, and a plurality of connecting pins 53 spaced apart on the connecting seat 52 and opposite to the side of the test board 2. One end of the connecting pin 53 is connected to the test equipment, and the other end is connected to the test board 2 via a wire. During the high-temperature insulation resistance test, the test fixture is connected to the test equipment via the plurality of connecting pins 53 to test the plurality of multi-core ceramic capacitors in the test fixture.

[0030] The present application specifically defines the structure of the test fixture, introduces an adjustment locking mechanism 4 to press down the multi-core ceramic capacitor in the installation slot so that it is in close contact with the test gasket group, ensuring the stable high-temperature insulation resistance test of the multi-core ceramic capacitor. Through the test fixture defined in the present application, the corresponding hopper plate 34 can be flexibly replaced according to different product sizes, and has the characteristics of simple and convenient operation, flexibility, and strong versatility.

[0031] The above description is merely a preferred embodiment of the present invention and therefore cannot be used to limit the scope of implementation of the present invention. In other words, equivalent changes and modifications made according to the scope of application of the present invention and the contents of the specification should still fall within the scope of the present invention.

Claims

1. A high-temperature insulation resistance test fixture for a multi-core ceramic capacitor, the multi-core ceramic capacitor comprising a ceramic capacitor body and two lead-out ends oppositely arranged at both ends of the ceramic capacitor body, characterized in that: The invention comprises a base, a test board arranged on the base, a mounting mechanism arranged on the test board for mounting a multi-core ceramic capacitor, and a locking adjustment mechanism arranged on the mounting mechanism for pressing down the capacitor. The mounting mechanism comprises a mounting plate arranged on the test board, a plurality of test slots arranged at intervals on the mounting plate, a plurality of test gasket groups respectively arranged in the plurality of test slots, a hopper plate arranged on the mounting plate, and a plurality of mounting slots arranged at intervals on the hopper plate and corresponding to the plurality of test slots one by one for mounting the multi-core ceramic capacitor.

2. The high-temperature insulation resistance test fixture for multi-core ceramic capacitors according to claim 1, characterized in that: The test gasket group includes two metal gaskets that are arranged in the test slot and connected to the test board. When the multi-core ceramic capacitor is arranged in the installation slot, its two lead ends respectively abut against the two metal gaskets.

3. A high-temperature insulation resistance test fixture for a multi-core ceramic capacitor according to claim 1, characterized in that: The locking and adjusting mechanism includes a test pressure strip arranged above the hopper plate, a plurality of elastic pressure rods spaced apart on the test pressure strip, and a locking member arranged between the mounting plate and the test pressure strip. The locking member works to press the elastic pressure rods down against the relative multi-core ceramic capacitor so that the two lead ends are respectively kept in contact with the two metal gaskets.

4. The high-temperature insulation resistance test fixture for multi-core ceramic capacitors according to claim 3, characterized in that: The elastic pressure rod includes a test rod body arranged on the test pressure strip and extending downward, a pressure block arranged at the front end of the test rod body and abutting against the multi-core ceramic capacitor, and a compression spring sleeved on the test rod body, one end of which is connected to the pressure block and the other end is connected to the test pressure strip.

5. The high-temperature insulation resistance test fixture for multi-core group ceramic capacitors according to claim 4, characterized in that: The elastic pressure rod further comprises a fixing nut which is arranged on the test pressure strip and is threadedly connected to the test rod body. The test pressure strip is provided with a clearance hole for the upper end of the test rod body to pass through.

6. The high-temperature insulation resistance test fixture for multi-core ceramic capacitors according to claim 3, wherein: The locking member includes a locking rod spaced apart on the mounting plate and extending upwardly through the silo plate and the test strip in sequence, and a butterfly locking nut abutting against the top of the test strip and cooperating with the locking rod.

7. The high-temperature insulation single-group test fixture for a multi-core ceramic capacitor according to claim 6, wherein: The test pressure strip includes a pressure strip body and a locking portion arranged on the pressure strip body, a plurality of elastic pressure rods are respectively arranged on both sides of the locking portion, and the butterfly locking nut abuts against the top surface of the locking portion.

8. The high-temperature insulation resistance test fixture for a multi-core ceramic capacitor according to claim 1, wherein: It also includes a connecting mechanism arranged on the base to connect the test equipment and the test board, the connecting mechanism includes two connecting blocks extending outward from the side of the base, a connecting base arranged between the two connecting blocks, and a plurality of connecting pins arranged at intervals on the connecting base opposite to the side of the test board, one end of the connecting pin is connected to the test equipment and the other end is connected to the test board through a wire.

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