Substrate detection circuit and device

Abstract

The utility model relates to a substrate detection circuit and device, and the circuit comprises a controller which is configured as follows: a first end is connected with a first interface of a to-be-tested substrate through a data bus, and the controller is used for generating a plurality of first control signals; each switch is configured as follows: a first end is connected with a second end of the controller, a second end is connected with a second interface of the substrate to be tested, a control end is connected with a third end of the controller, and the switches are switched on under the condition that the first control signal is received; the controller receives detection signals and / or detection data of the to-be-tested substrate and generates detection information for indicating whether the to-be-tested substrate has defects, the detection data comprises storage data of the to-be-tested substrate, and the detection signals comprise voltage signals and / or current signals. The detection cost of the substrate is reduced, and the consumption of manpower and material resources is reduced.

Description

Technical Field

[0001] This application relates to the technical field of substrate detection, and particularly to a substrate detection circuit and device. Background Art

[0002] A substrate generally refers to a PCBA board, also known as a printed circuit board, whose purpose is to implement the functions required by circuit users. The printed circuit board forms a complete circuit through the connection of multiple internal electronic components and metal wires to achieve the designed functions of the circuit.

[0003] Currently, the detection of substrates (PCBA) is all carried out manually. Since there are many detection items for substrates, to ensure the normal functions of the substrates, it is necessary for humans to detect each detection item separately, resulting in a large detection cost for the substrates and consuming a lot of manpower and material resources. Summary of the Utility Model

[0004] Based on this, it is necessary to provide a substrate detection circuit and device for the problems in the above background art, which can at least reduce the detection cost of the substrate to be tested and reduce the consumption of manpower and material resources.

[0005] To solve the above technical problems and other problems, according to some embodiments, one aspect of this application provides a substrate detection circuit. The substrate detection circuit includes: a controller configured to: connect the first end to the first interface of the substrate to be tested through a data bus, and the controller is used to generate a plurality of first control signals; a plurality of switches, each switch configured to: connect the first end to one of the second ends of the controller, the second end to one of the second interfaces of the substrate to be tested, and the control end to one of the third ends of the controller, and is used to conduct when receiving the first control signal, so that the controller receives the detection signal and / or detection data of the substrate to be tested, and generates detection information for indicating whether the substrate to be tested has defects. The detection data includes the stored data of the substrate to be tested, and the detection signal includes a voltage signal and / or a current signal.

[0006] In some embodiments, the substrate detection circuit further includes: a voltage converter configured to: connect the input end to the first power supply, the first output end to the power supply terminal of the controller to provide a first voltage to the controller, and the second output end to the power supply interface of the substrate to be tested to provide a second voltage to the substrate to be tested.

[0007] In some embodiments, the voltage converter includes: a first sub-voltage converter configured such that its input terminal is connected to a first power supply as the input terminal of the voltage converter, and its output terminal is connected to the power supply terminal of the controller as the first output terminal of the voltage converter, for providing a first voltage to the controller; a second sub-voltage converter configured such that its output terminal is connected to the power supply interface of the substrate to be tested as the second output terminal of the voltage converter, and its input terminal is connected to the input terminal of the first sub-voltage converter, for providing a second voltage to the substrate to be tested.

[0008] In some embodiments, the controller includes a plurality of buttons, each button configured to generate a control instruction when pressed, and each control instruction is used to instruct the controller to generate a first control signal.

[0009] In some embodiments, the substrate detection circuit further includes: a data acquisition module configured such that its output terminal is connected to the data acquisition terminal of the controller, for acquiring environmental data, where the environmental data includes temperature data.

[0010] In some embodiments, the voltage output interface of the substrate to be tested is connected to the voltage detection terminal of the controller.

[0011] In some embodiments, the substrate detection circuit further includes: a plurality of displays, each display configured to be connected to a display control terminal of the controller, for indicating whether the substrate to be tested has a defect corresponding to the display.

[0012] In some embodiments, the substrate detection circuit further includes: a data output interface configured such that its data transmission terminal is connected to the serial data transmission terminal of the controller, and its interface terminal is used to connect to a host computer, for transmitting detection data, detection signals, or a second control signal of the host computer to the controller.

[0013] In some embodiments, the data bus includes an I2C data bus.

[0014] Another aspect of the present application provides a substrate detection device, where the substrate detection device includes the substrate detection circuit in any of the above embodiments.

[0015] In the substrate detection circuit and device of the above embodiments, through the connection between the controller and a plurality of switches and the substrate to be detected, the controller can automatically obtain a plurality of detection data and detection signals of the substrate to be tested through the data bus and the control of the switches, reducing the detection cost of the substrate and reducing the consumption of manpower and material resources. Description of the Drawings

[0016] To more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings of embodiments can also be obtained based on these drawings.

[0017] Figure 1 One of the schematic diagrams of the principle of the substrate detection circuit provided in an embodiment of the present application;

[0018] Figure 2 Another schematic diagram of the principle of the substrate detection circuit provided in an embodiment of the present application;

[0019] Figure 3 Another schematic diagram of the principle of the substrate detection circuit provided in an embodiment of the present application.

[0020] Explanation of reference numerals:

[0021] 101, controller; 102, switch; 103, substrate to be tested; 201, voltage converter; VCC1, first power supply; 203, key; 202, data acquisition module; VCC2, second power supply; 301, first sub-voltage converter; 302, second sub-voltage converter; 303, temperature detector; 304, display; 305, data output interface; 306, host computer; VCC3, third power supply. Detailed implementation manners

[0022] To facilitate the understanding of the present application, the following will describe the present application more comprehensively with reference to the relevant drawings. The preferred embodiments of the present application are given in the drawings. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the understanding of the disclosure content of the present application more thorough and comprehensive.

[0023] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those of ordinary skill in the technical field to which the present application belongs. The terms used in the description of the present application herein are only for the purpose of describing specific embodiments and are not intended to limit the present application. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.

[0024] When using "including", "having", and "comprising" described herein, unless a clear limiting term is used, such as "only", "consisting of", etc., another component can also be added. Unless otherwise mentioned, the singular form of a term can include the plural form and cannot be understood as having a quantity of one.

[0025] It should be understood that although terms such as "first" and "second" may be used herein to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element from another. For example, without departing from the scope of the present application, the first element may be referred to as the second element, and similarly, the second element may be referred to as the first element.

[0026] In the present application, unless otherwise clearly specified and defined, terms such as "connected" and "coupled" should be understood in a broad sense. For example, it may be directly connected or indirectly connected through an intermediate medium, and it may be the internal connection of two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific circumstances.

[0027] At present, the detection of the substrate (PCBA) is carried out manually. Since there are many detection items for the substrate, such as open circuit detection, short circuit detection, voltage detection, register information detection, etc., in order to ensure the normal function of the substrate, it is necessary for manual operation to detect each detection item separately, resulting in a large detection cost for the substrate and consuming a lot of manpower and material resources.

[0028] Please refer to Figure 1 , Figure 1 which is one of the schematic diagrams of the substrate detection circuit principle provided in an embodiment of the present application. The substrate detection circuit provided in this embodiment includes: a controller 101, a plurality of switches 102, and a substrate to be tested 103.

[0029] Among them, the first end of the controller 101 is connected to the first interface of the substrate to be tested 103 through a data bus.

[0030] Among them, the controller 101 is used to generate a plurality of first control signals and generate detection information for indicating whether the substrate to be tested 103 has defects.

[0031] The first end of each switch 102 is connected to a second end of the controller 101, the second end of each switch 102 is connected to a second interface of the substrate to be tested 103, and the control end of each switch 102 is connected to a third end of the controller 101.

[0032] Each switch 102 is used to conduct when receiving the first control signal, so that the controller 101 receives at least one of the detection signal and detection data of the substrate to be tested. The detection data includes the stored data of the substrate to be tested 103, and the detection signal includes at least one of a voltage signal and a current signal.

[0033] Here, the controller 101 may be a controller such as an MCU or a single-chip microcomputer.

[0034] Here, the data bus can be an I2C bus.

[0035] In this way, the communication function of the substrate 103 to be tested can be detected through the I2C bus, and the content of the EPROM (Erasable Programmable Read Only Memory) of the substrate 103 to be tested can also be read to achieve open circuit detection, short circuit detection or functional testing of the substrate. Among them, the functional testing includes performance testing, electromagnetic compatibility (EMC) testing, aging testing and other tests.

[0036] Among them, the switch 102 can be a relay. The control end of the relay serves as the control end of the switch 102, one contact of the relay serves as the first end of the switch 102, and the other contact of the relay serves as the second end of the switch 102. In this way, the relay can control whether the two contacts are conducting according to the control signal of the controller.

[0037] In the substrate detection circuit of the above embodiment, the controller 101 can control the switch 102 to conduct according to requirements, receive the detection signal or detection data of the substrate 103 to be tested, and can also receive detection data such as the stored data of the substrate 103 to be tested through the data bus. Thereby reducing the detection cost of the substrate 103 to be tested and reducing the consumption of manpower and material resources.

[0038] Please refer to Figure 2 , in some embodiments, the substrate detection circuit further includes a voltage converter 201 and a data acquisition module 202.

[0039] Among them, the voltage converter 201 is configured as follows: the input end is connected to the first power supply VCC1, the first output end is connected to the power supply end of the controller 101 to provide a first voltage to the controller 101, and the second output end is connected to the power supply interface of the substrate 103 to be tested to provide a second voltage to the substrate 103 to be tested. The first power supply VCC1 is used to provide the voltage to be converted to the voltage converter 201, the first voltage is used to supply power to the controller 101, and the second voltage is used to supply power to the substrate 103 to be tested.

[0040] Here, the first power supply VCC1 can be a DC current of 12V / 5A, the first voltage can be 3.3V, and the second voltage can be 5V.

[0041] Please continue to refer to Figure 2 , in some embodiments, the substrate detection circuit further includes a data acquisition module 202; the data acquisition module 202 is configured as follows: the output end is connected to the data acquisition end of the controller 101 and is used to acquire environmental data, and the environmental data includes temperature data.

[0042] In this way, the controller 101 can determine whether the substrate 103 to be tested has abnormal heating according to the temperature data.

[0043] Please continue to refer to Figure 2 , in some embodiments, the controller 101 includes a plurality of keys 203. Each key 203 is configured to generate a control instruction when being pressed, and each control instruction is used to instruct the controller 101 to generate a first control signal.

[0044] Exemplarily, the controller 101 can control a switch 102 to turn on according to the control instruction issued by the pressing of the key 203, thereby obtaining a detection data corresponding to the control instruction, and determining whether there is an abnormality in the chip to be tested according to the detection data.

[0045] Please continue to refer to Figure 2 , the voltage output interface of the substrate 103 to be tested is connected to the voltage detection end of the controller 101 to detect the voltage value of the substrate 103 to be tested, so that the controller 101 can determine whether there is a short circuit or an open circuit in the substrate 103 to be tested according to the voltage value of the substrate 103 to be tested.

[0046] Please refer to Figure 3 , in some embodiments, the voltage converter 201 includes a first sub-voltage converter 301 and a second sub-voltage converter 302. The first sub-voltage converter 301 is configured such that: the input end is used as the input end of the voltage converter and is connected to the first power supply VCC1, and the output end is used as the first output end of the voltage converter 201 and is connected to the power supply end of the controller 101; the second sub-voltage converter 302 is configured such that: the output end is used as the second output end of the voltage converter and is connected to the power supply interface of the substrate 103 to be tested, and the input end is connected to the input end of the first sub-voltage converter 301.

[0047] Here, the first sub-voltage converter 301 is used to convert the voltage of the first power supply VCC1 into a first voltage, and the second sub-voltage converter 302 is used to convert the voltage of the first power supply VCC1 into a second voltage.

[0048] Please continue to refer to Figure 3 , in some embodiments, the substrate detection circuit further includes a target wire. One end of the target wire is connected to the second power supply VCC2, and the other end of the target wire is connected to another power supply end of the substrate to be tested. Here, the second power supply can be 220V to provide a 220V voltage to the substrate to be tested.

[0049] Please continue to refer to Figure 3 , in some embodiments, the data acquisition module 202 can be a temperature detector 303 for detecting the operating temperature of the substrate to be tested.

[0050] Please continue to refer toFigure 3 In some embodiments, the substrate detection circuit further includes a plurality of displays 304. Each display 304 is configured to be connected to a display control terminal of the controller 101 and is used to indicate whether the substrate 103 to be tested has a defect corresponding to the display 304.

[0051] Please continue to refer to Figure 3 In some embodiments, each display 304 includes a light-emitting diode. The positive electrode of the light-emitting diode is connected to the third power supply VCC3, and the negative electrode of the light-emitting diode is connected to the display control terminal of the controller 101. When the controller 101 determines that the substrate 103 to be tested has a defect, the controller 101 can control the display control terminal corresponding to the defect to output a target level, so that the light-emitting diode corresponding to the defect of the substrate 103 to be tested emits light, enabling the staff to directly determine the defect of the substrate 103 to be tested by visually observing the situation of the light-emitting diode.

[0052] Please continue to refer to Figure 3 In some embodiments, the substrate detection circuit further includes a data output interface 305. The data output interface 305 is configured such that the data transmission terminal is connected to the serial data transmission terminal of the controller 101, and the interface terminal is used to connect to the host computer 306 to transmit detection data, detection signals, or the second control signal of the host computer 306 to the controller 101.

[0053] In this way, the staff can control the substrate detection circuit through the host computer 306, and can also upload the detection results of various detections of the substrate 103 to be tested to the server for storage through the host computer 306. Controlling the substrate test circuit through the host computer 306 is simple in operation, and uploading the detection results to the server facilitates the storage of the detection results.

[0054] In an optional embodiment, a memory (EPROM) is provided on the substrate to be tested. The controller can send a memory data acquisition command to the substrate to be detected by controlling the I2C bus, and identify the memory information according to the data transmitted back by the substrate to be detected through the I2C bus. For example, if the information transmitted back by the memory is "11111101101", which is different from the correct information stored in the microprocessor, the controller determines that there is an abnormality in the controller of the substrate to be tested. At this time, it can control the display control terminal corresponding to the memory abnormality to be at a low level, so that the display corresponding to the memory abnormality emits light, prompting the staff that there is an abnormality in the memory of the substrate to be tested.

[0055] In another alternative embodiment, the controller can obtain the voltage information of the substrate to be tested by controlling the conduction of a switch for obtaining the voltage data of the substrate to be tested. For example, when the voltage provided for the substrate to be tested is 5 volts, if the voltage of the substrate to be tested obtained by the controller is less than 5 volts, it is determined that there is an open-circuit abnormality in the substrate to be tested; if the voltage of the substrate to be tested obtained by the controller is 0 volts, it is determined that there is a short-circuit abnormality in the substrate to be tested. When the controller determines that there is an open-circuit abnormality in the substrate to be tested, it can control the display control terminal corresponding to the open-circuit abnormality of the substrate to be tested to be at a low level, so that the display corresponding to the open-circuit abnormality of the substrate to be tested emits light, prompting the staff of the open-circuit abnormality of the substrate to be tested; when the controller determines that there is a short-circuit abnormality in the substrate to be tested, it can control the display control terminal corresponding to the short-circuit abnormality of the substrate to be tested to be at a low level, so that the display corresponding to the short-circuit abnormality of the substrate to be tested emits light, prompting the staff of the short-circuit abnormality of the substrate to be tested.

[0056] In the substrate detection circuit and device of the above embodiment, through the connection between the controller and multiple switches and the substrate to be detected, the controller can automatically obtain multiple detection data and detection signals of the substrate to be tested through the data bus and the control of the switches, reducing the detection cost of the substrate and reducing the consumption of manpower and material resources.

[0057] Please note that the above embodiments are for illustrative purposes only and do not imply a limitation to the present invention.

[0058] Each embodiment in this specification is described in a progressive manner. The key point of each embodiment is to illustrate the differences from other embodiments. The same or similar parts among the embodiments can be referred to each other.

[0059] The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope recorded in this specification.

[0060] The above embodiments only represent several implementation manners of the present application. The description is relatively specific and detailed, but it should not be construed as a limitation to the scope of the patent application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application should be subject to the appended claims.

Claims

1. A substrate detection circuit, characterized in that, The substrate detection circuit includes: A controller configured such that: its first end is connected to a first interface of the substrate to be tested through a data bus, and the controller is used to generate a plurality of first control signals; A plurality of switches, each switch configured such that: its first end is connected to a second end of the controller, its second end is connected to a second interface of the substrate to be tested, and its control end is connected to a third end of the controller, and is used to conduct when receiving the first control signal, so that the controller receives the detection signal and / or detection data of the substrate to be tested, and generate detection information for indicating whether the substrate to be tested has defects. The detection data includes the stored data of the substrate to be tested, and the detection signal includes a voltage signal and / or a current signal.

2. The substrate detection circuit according to claim 1, wherein, The substrate detection circuit further includes: A voltage converter configured such that: its input end is connected to a first power supply, its first output end is connected to the power supply end of the controller to provide a first voltage to the controller, and its second output end is connected to the power supply interface of the substrate to be tested to provide a second voltage to the substrate to be tested.

3. The substrate detection circuit according to claim 2, characterized in that The voltage converter includes: A first sub-voltage converter configured such that: its input end is used as the input end of the voltage converter and is connected to the first power supply, and its output end is used as the first output end of the voltage converter and is connected to the power supply end of the controller to provide a first voltage to the controller; A second sub-voltage converter configured such that: its output end is used as the second output end of the voltage converter and is connected to the power supply interface of the substrate to be tested, and its input end is connected to the input end of the first sub-voltage converter to provide a second voltage to the substrate to be tested.

4. The substrate detection circuit according to claim 1, wherein The controller includes a plurality of buttons, each button is used to generate a control instruction when being pressed, and each control instruction is used to instruct the controller to generate a first control signal.

5. The substrate detection circuit according to claim 1, characterized in that, The substrate detection circuit further includes: [[ID= 6. The substrate detection circuit according to claim 1, characterized in that, ​ 7. The substrate detection circuit according to claim 1, wherein ​ ​ 8. The substrate detection circuit according to claim 1, wherein ​ ​ 9. The substrate detection circuit according to claim 1, wherein ​ 10. A substrate detection device, characterized in that, ​

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