LED lamp bead testing device

Abstract

The utility model provides an LED lamp bead testing device comprising a power supply assembly which comprises a power supply cabinet and at least one power supply body installed on the power supply cabinet. The test fixture is connected to the power supply assembly, and the test fixture comprises a fixture shell, an insulating carrier, a protection plate and a plurality of fixing pieces; the protection plate is fixed to one end of the clamp shell through the multiple fixing pieces. The protection plate is internally provided with a conduction groove, the insulation carrier is embedded into the clamp shell so that the conduction groove can be divided into two connecting grooves, the connecting grooves are internally provided with a plurality of conduction parts, and the conduction parts are electrically connected with the power supply assembly so that pins of the LED lamp beads can be conducted with the power supply assembly through the conduction parts; and the insulating carrier is provided with a limiting groove, and the limiting groove is located between the two connecting grooves and used for limiting the LED lamp beads, so that the working efficiency is effectively improved.

Description

Technical Field

[0001] The utility model relates to the technical field of LED lamp bead testing, in particular to an LED lamp bead testing device. Background Art

[0002] In the field of LED testing, accurately acquiring various LED data is extremely critical for product development, quality control, and other aspects. Currently, commonly used test systems mainly adopt two modes: steady-state measurement mode and pulse measurement mode. The steady-state measurement mode is used to obtain LED data under stable operating conditions. Its advantage is that it can accurately capture the various performance indicators of the LED during stable operation, providing reliable data support for evaluating its long-term stability and reliability. The pulse measurement mode focuses on obtaining data on the LED under transient conditions. By applying a short pulse current or voltage to the LED and quickly measuring the response characteristics at the moment of pulse excitation, it can reveal the performance of the LED during transient processes, such as fast switching characteristics and instantaneous light intensity changes, which is of great significance for studying its dynamic performance.

[0003] However, both modes have significant limitations. They can only independently test a single LED light color at a single current and voltage within the same timeframe. To obtain data for LEDs with different light colors, multiple tests are required, reducing test efficiency. Utility Model Content

[0004] Based on this, the purpose of the present invention is to provide an LED lamp bead testing device to solve the problems of the above-mentioned background technology.

[0005] An LED lamp bead testing device includes a power supply assembly, wherein the power supply assembly includes a power supply cabinet and at least one power supply body installed on the power supply cabinet;

[0006] A test fixture connected to the power supply assembly, the test fixture comprising a fixture housing, an insulating carrier, a protection plate, and a plurality of fixing parts;

[0007] Wherein, the protection plate is fixed to one end of the fixture housing through a plurality of fixing members;

[0008] A conducting groove is provided in the protection plate, and the insulating carrier is embedded in the fixture housing so that the conducting groove is divided into two connecting grooves. A plurality of conducting parts are provided in the connecting groove, and the conducting parts are electrically connected to the power supply assembly so that the pins of the LED lamp beads are connected to the power supply assembly through the conducting parts.

[0009] A limiting groove is provided on the insulating carrier, and the limiting groove is located between the two connecting grooves and is used for limiting the LED lamp bead.

[0010] Compared to the existing technology, the beneficial effects of this application are as follows: the pins of the lamp bead are aligned with the test fixture, and the lamp bead is placed in the limit slot of the test fixture. At this time, the conductive part aligns with the pins of the lamp bead, thereby energizing the lamp bead and the test fixture, and then the power supply cabinet. By splicing and combining multiple single power supplies into an all-in-one modular power supply, and connecting the test power supply with a multi-channel test fixture, the corresponding current can be accurately provided to each light source of the all-in-one lamp bead, making it possible to perform independent testing and mixed light testing of different light sources, effectively improving work efficiency.

[0011] Furthermore, the limiting groove includes a placement groove and fixing grooves arranged at both ends of the placement groove, and both sides of the placement groove pass through both sides of the insulating carrier so that the size of the placement groove is larger than that of the fixing groove.

[0012] Furthermore, the bottom surface of the placement groove is flush with the bottom surface of the protection plate.

[0013] Furthermore, the power supply body includes a power supply shell, and a display screen, a sampling end, an output end and a voltage adjustment knob are provided on one side of the power supply shell. The output end is plugged into the fixing member through a wire.

[0014] Furthermore, the insulating carrier is made of ceramic or engineering plastic.

[0015] Furthermore, the power supply cabinet is provided with a plurality of mounting slots, and the mounting slots are used for mounting the power supply body.

[0016] Furthermore, four conducting portions are respectively provided in the two connecting grooves.

[0017] Furthermore, the surface of the protection plate is provided with mounting holes corresponding to the fixing members, and the fixing members are fixed to both sides of the protection plate through the mounting holes. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 This is a schematic diagram of the structure of the LED lamp bead testing device of the utility model;

[0019] Figure 2 This is a schematic diagram of the structure of the test fixture of the utility model;

[0020] Figure 3 For this utility model Figure 2 Enlarged structural diagram at K in the middle.

[0021] Explanation of the main component symbols: 10. Power supply assembly; 11. Power supply cabinet; 12. Power supply body; 121. Power supply casing; 122. Display screen; 123. Sampling end; 124. Output end; 125. Voltage adjustment knob; 20. Test fixture; 21. Fixture casing; 22. Insulation carrier; 23. Protection plate; 24. Fixing part; 25. Limiting groove; 251. Placement groove; 252. Fixing groove; 26. Conducting groove; 261. Connection groove; 262. Conducting part. DETAILED DESCRIPTION

[0022] To facilitate understanding of the present invention, a more comprehensive description of the present invention will be provided below with reference to the accompanying drawings. The drawings illustrate several embodiments of the present invention. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to provide a more thorough and comprehensive understanding of the present invention.

[0023] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may be an intermediate element. When an element is referred to as being "connected to" another element, it may be directly connected to the other element or there may be an intermediate element. The terms "vertical," "horizontal," "left," "right," and similar expressions used herein are for illustrative purposes only.

[0024] Unless otherwise defined, all technical and scientific terms used herein have the same meanings as those commonly understood by those skilled in the art to which this invention pertains. The terms used herein in the specification of this invention are for the purpose of describing specific embodiments only and are not intended to limit this invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0025] See also Figures 1 to 2 , shown is an LED lamp bead testing device in an embodiment of the present utility model, comprising a power supply assembly 10, wherein the power supply assembly 10 comprises a power supply cabinet 11 and at least one power supply body 12 mounted on the power supply cabinet 11;

[0026] A test fixture 20 is connected to the power supply assembly 10 , and includes a fixture housing 21 , an insulating carrier 22 , a protection plate 23 , and a plurality of fixing members 24 ;

[0027] The protection plate 23 is fixed to one end of the fixture housing 21 by a plurality of fixing members 24 , and the plurality of fixing members 24 are symmetrically distributed on both sides of the protection plate 23 ;

[0028] A conducting groove 26 is provided in the protective plate 23, the middle part of the insulating carrier 22 is embedded in the protective plate 23, and the two ends thereof are embedded in the fixture housing 21, so that the conducting groove 26 is divided into two connecting grooves 261, and a plurality of conducting parts 262 are provided in the connecting groove 261. The conducting parts 262 are electrically connected to the power supply component 10, so that the pins of the LED lamp beads are connected to the power supply component 10 through the conducting parts 262. A limiting groove 25 is provided on the insulating carrier 22, and the limiting groove 25 is located between the two connecting grooves 261, and is used to limit the LED lamp beads.

[0029] It is worth noting that, first, the pins of the lamp bead are aligned with the corresponding directions of the test fixture 20, and the lamp bead is placed in the limiting slot 25 of the test fixture 20. The conductive portion 262 corresponds to the pins of the lamp bead, so that the lamp bead and the test fixture 20 are energized, thereby connecting the power supply cabinet 11. By splicing and combining multiple single power supplies into an all-in-one modular power supply, when this power supply is used with a multi-channel test fixture 20 to connect the test power supply, the corresponding current is accurately provided to each light source of the all-in-one lamp bead, realizing independent testing and mixed light testing of different light sources, thereby improving work efficiency.

[0030] See also Figure 3 Eight conductive sections 262 are installed in two connecting slots 261. These eight conductive sections 262 correspond to channels A, B, C, D, E, F, G, and H, respectively. This allows for independent setting of drive currents for multiple channels, replacing the one-to-one (current-voltage) setting method used in existing test systems. This system and its equipment allow for testing and obtaining desired parameters based on varying drive currents. In addition to the existing functionality for testing light source parameters for each channel individually, the system also adds multiple light mixing testing capabilities. First, it allows for pairwise light mixing testing, such as AB, BC, and CD combinations. Second, it allows for multi-channel light mixing testing, such as ABC and ABCD color mixing testing, by flexibly setting current values for multiple channels based on specific parameter requirements. This multi-channel testing capability enables the system to not only provide single-color solutions but also customizable multi-color solutions. Its core value lies in providing accurate and optimized drive current data for testing light mixing solutions, significantly reducing the workload of customers who repeatedly adjust drive currents for color matching.

[0031] Specifically, the limiting groove 25 includes a placement groove 251 and fixing grooves 252 provided at both ends of the placement groove 251. The two sides of the placement groove 251 pass through the two sides of the insulating carrier 22, so that the size of the placement groove 251 is larger than the fixing groove 252. More specifically, the bottom surface of the placement groove 251 is flush with the bottom surface of the protective plate 23.

[0032] Furthermore, the power supply body 12 includes a power supply housing 121 , and a display screen 122 , a sampling terminal 123 , an output terminal 124 and a voltage adjustment knob 125 are provided on one side of the power supply housing 121 . The output terminal 124 is connected to the fixing member 24 via a wire.

[0033] In this embodiment, the display screen 122 includes a current display window (CURRENTA), a "stable current" working status indicator light (CC), a voltage display window (VOLTAGEV), and a "stable voltage" working status indicator light (CV); the sampling terminal 123 includes a long-distance "+" terminal (red) and a long-distance "-" terminal (black), and the output terminal 124 includes a power supply "-" (OUTPUT-) and a power supply "+" (OUTPUT+).

[0034] In this embodiment, the insulating carrier 22 is made of ceramic or engineering plastic.

[0035] Furthermore, the power cabinet 11 is provided with a plurality of mounting slots for mounting the power supply body 12. In this embodiment, the number of the mounting slots is four, and the number of the power supply body 12 is also four.

[0036] Furthermore, the conducting portion 262 is a metal probe.

[0037] Furthermore, the surface of the protection plate 23 is provided with mounting holes corresponding to the fixing members 24 , and the fixing members 24 are fixed to both sides of the protection plate 23 through the mounting holes.

[0038] In summary, the LED lamp bead testing device in the above embodiment of the present invention has the following beneficial effects:

[0039] First, the pins of the lamp bead need to be kept in the same direction as the test fixture 20, and the lamp bead must be placed in the limit slot 25 of the test fixture 20. At this time, the conductive part 262 corresponds to the pins of the lamp bead, so that the lamp bead and the test fixture 20 are powered on, and then the power cabinet 11 is turned on.

[0040] By splicing multiple single power supplies into an all-in-one modular power supply and connecting the test power supply with a multi-channel test fixture 20, the corresponding current can be accurately provided to each light source of the all-in-one lamp bead, so that independent testing and mixed light testing of different light sources can be carried out, effectively improving work efficiency.

[0041] Compared to the original test system (which used a one-to-one current and voltage setting method), this system has been optimized to independently set drive currents for multiple channels. Under this test system and equipment, different parameter requirements can be determined based on current variation tests. Not only can each channel's light source parameters be tested independently, but pairwise mixed light testing (such as AB, BC, CD, and other combinations) is also possible. Furthermore, multi-channel currents can be adjusted according to the required parameters for mixed light testing (such as ABC / ABCD and other light color mixing tests).

[0042] Based on the multi-color scheme, we can provide customers with corresponding color mixing schemes and give accurate color mixing scheme test currents, reducing the time and energy consumed by customers due to constantly adjusting the driving current when matching colors.

[0043] Throughout this specification, reference to terms such as "one embodiment," "some embodiments," "examples," "specific examples," or "some examples" means that the specific features, structures, materials, or characteristics described in conjunction with that embodiment or example are included in at least one embodiment or example of the present invention. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0044] The above-described embodiments merely represent several implementation methods of the present invention. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present invention. It should be noted that a person skilled in the art would be able to make various modifications and improvements without departing from the concept of the present invention, and these modifications and improvements fall within the scope of protection of the present invention. Therefore, the scope of protection of the present invention shall be determined by the appended claims.

Claims

1. A LED lamp bead testing device, characterized in that: include: A power supply assembly, comprising a power supply cabinet and at least one power supply body mounted on the power supply cabinet; A test fixture connected to the power supply assembly, the test fixture comprising a fixture housing, an insulating carrier, a protection plate, and a plurality of fixing parts; Wherein, the protection plate is fixed to one end of the fixture housing through a plurality of fixing members; A conducting groove is provided in the protection plate, and the insulating carrier is embedded in the fixture housing so that the conducting groove is divided into two connecting grooves. A plurality of conducting parts are provided in the connecting groove, and the conducting parts are electrically connected to the power supply assembly so that the pins of the LED lamp beads are connected to the power supply assembly through the conducting parts. A limiting groove is provided on the insulating carrier, and the limiting groove is located between the two connecting grooves and is used for limiting the LED lamp bead.

2. The LED lamp bead testing device according to claim 1, characterized in that: The limiting groove includes a placement groove and fixing grooves arranged at both ends of the placement groove. Both sides of the placement groove pass through both sides of the insulating carrier, so that the size of the placement groove is larger than that of the fixing groove.

3. The LED lamp bead testing device according to claim 2, characterized in that: The bottom surface of the placement groove is flush with the bottom surface of the protection plate.

4. The LED lamp bead testing device according to claim 1, characterized in that: The power supply body includes a power supply shell, and a display screen, a sampling end, an output end and a voltage adjustment knob are provided on one side of the power supply shell. The output end is plugged into the fixing part through a wire.

5. The LED lamp bead testing device according to claim 1, characterized in that: The insulating carrier is made of ceramic or engineering plastic.

6. The LED lamp bead testing device according to claim 1, characterized in that: The power cabinet is provided with a plurality of mounting slots, and the mounting slots are used for mounting the power supply body.

7. The LED lamp bead testing device according to claim 1, characterized in that: Four conducting parts are respectively arranged in the two connecting grooves.

8. The LED lamp bead testing device according to claim 1, characterized in that: The surface of the protection plate is provided with mounting holes corresponding to the fixing members, and the fixing members are fixed to both sides of the protection plate through the mounting holes.

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