Radio frequency testing device and radio frequency testing system

Abstract

The utility model provides a radio frequency testing device and a radio frequency testing system, and relates to the technical field of radio frequency testing. The radio frequency testing device comprises a probe seat, a probe base and a probe head, the first probe assembly is connected with the probe seat and is fixed relative to the probe seat; and the second probe assembly is movably connected with the probe seat, so that the second probe assembly can move to a target position relative to the first probe assembly.

Description

Technical Field

[0001] The present application relates to the field of radio frequency testing technology, and in particular to a radio frequency testing device and a radio frequency testing system. Background Art

[0002] Currently, in 5G RF test solutions, due to the large number of test sockets used in 5G products, factory testing requires one test probe per RF test socket, each probe being secured with a test probe holder. Multiple test sockets require multiple test probes, which can easily cause interference between the test probe holder fixtures. This results in the need to reserve more space for the RF test sockets in motherboard designs, increasing the motherboard footprint.

[0003] Therefore, how to reduce the space occupied by the motherboard becomes a technical problem that needs to be solved urgently. Utility Model Content

[0004] The purpose of this application is to provide a radio frequency testing device and a radio frequency testing system.

[0005] To solve the above technical problems, the embodiments of the present application provide the following technical solutions:

[0006] A first aspect of the present application provides a radio frequency testing device, comprising:

[0007] Probe holder;

[0008] A first probe assembly is connected to the probe base and fixed in relative position;

[0009] The second probe assembly is movably connected to the probe base, so that the second probe assembly can move to a target position relative to the first probe assembly.

[0010] In some modified embodiments of the first aspect of the present application, the first probe head of the first probe assembly and the second probe head of the second probe assembly are both located on the first side of the probe seat;

[0011] The second probe head is located at the target position relative to the first probe head and can be connected to the radio frequency test socket of the mainboard.

[0012] In some modified embodiments of the first aspect of the present application, the first probe tail of the first probe assembly and the second probe tail of the second probe assembly are both located on the second side of the probe base and can be connected to the RF tester, and the second side of the probe base is arranged opposite to the first side of the probe base.

[0013] In some modified embodiments of the first aspect of the present application, the first probe assembly further includes a first elastic structure, and the first elastic structure is disposed between the first probe head and the first probe tail;

[0014] The second probe assembly further includes a second elastic structure disposed between the second probe head and the second probe tail.

[0015] In some modified embodiments of the first aspect of the present application, the probe base is provided with a first track, the second probe assembly is movably connected to the probe base via the first track, and the second probe assembly can move to a target position along the first track relative to the first probe assembly.

[0016] In some modified implementations of the first aspect of the present application, the first track is an elliptical track, a circular track, or an irregularly shaped track.

[0017] In some modified implementations of the first aspect of the present application, the first probe assembly and the second probe assembly are both needle-shaped structures, and the first probe assembly and the second probe assembly both meet the vertical condition with respect to the probe seat.

[0018] In some modified implementations of the first aspect of the present application, the following further comprises:

[0019] A third probe assembly, the third probe assembly being connected to the probe seat; and / or

[0020] A fourth probe assembly is connected to the probe seat.

[0021] In some modified embodiments of the first aspect of the present application, the probe base is provided with a second track, the third probe assembly is movably connected to the probe base via the second track, and the third probe assembly can move to a target position along the second track relative to the first probe assembly; and / or

[0022] The probe base is provided with a third track, the fourth probe assembly is movably connected to the probe base via the third track, and the fourth probe assembly can move to a target position relative to the first probe assembly along the third track;

[0023] There is no interference between any two of the first track, the second track, and the third track.

[0024] A second aspect of the present application provides a radio frequency testing system, comprising:

[0025] RF tester;

[0026] A mainboard, wherein the mainboard is provided with a radio frequency test socket, and the radio frequency test socket is connected to the radio frequency tester through a radio frequency test device;

[0027] The frequency testing device includes: a probe base; a first probe assembly, which is connected to the probe base and fixed in relative position; and a second probe assembly, which is movably connected to the probe base so that the second probe assembly can move relative to the first probe assembly to a target position and can be connected to the RF test base. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] The above and other objects, features and advantages of the exemplary embodiments of the present application will become readily understood by reading the detailed description below with reference to the accompanying drawings. In the accompanying drawings, several embodiments of the present application are shown in an exemplary and non-limiting manner, and the same or corresponding reference numerals represent the same or corresponding parts, wherein:

[0029] Figure 1 The following schematically shows a structural diagram of a radio frequency testing device provided in an embodiment of the present application;

[0030] Figure 2 Schematically shows a top view of a radio frequency testing device provided in an embodiment of the present application;

[0031] Figure 3 Schematically shows a front view of a first probe assembly provided in an embodiment of the present application;

[0032] Figure 4 Schematically shows a front view of a second probe assembly provided in an embodiment of the present application;

[0033] Figure 5 A top view of another radio frequency testing device provided in an embodiment of the present application is schematically shown.

[0034] Description of Figure Numbers:

[0035] RF test device 1, probe base 11, first probe assembly 12, first probe head 121, first probe tail 122, first elastic structure 123, second probe assembly 13, second probe head 131, second probe tail 132, second elastic structure 133, first rail 14, third probe assembly 15, fourth probe assembly 16, second rail 17, third rail 18, main board 19, RF test base 191. DETAILED DESCRIPTION

[0036] The following describes exemplary embodiments of the present application in more detail with reference to the accompanying drawings. Although exemplary embodiments of the present application are shown in the accompanying drawings, it should be understood that the present application can be implemented in various forms and should not be limited by the embodiments described herein. Instead, these embodiments are provided to enable a more thorough understanding of the present application and to fully convey the scope of the present application to those skilled in the art.

[0037] like Figure 1 and Figure 2 As shown, the present application provides a radio frequency testing device 1, comprising:

[0038] Probe seat 11;

[0039] A first probe assembly 12 is connected to the probe base 11 and fixed in relative position;

[0040] The second probe assembly 13 is movably connected to the probe base 11 so that the second probe assembly 13 can move to a target position relative to the first probe assembly 12 .

[0041] In this embodiment, the probe base 11 is a plate-like structure for arranging the first probe assembly 12 and the second probe assembly 13. The fixed relative position means that the first probe assembly 12 is fixedly connected to the probe base 11, or the first probe assembly 12 is connected to the probe base 11 in a self-rotating manner. When the probe base 11 moves, the first probe assembly 12 moves along with the probe base 11. When the probe base 11 is stationary, the first probe assembly 12 is stationary along with the probe base 11. The second probe assembly 13 can move relative to the first probe assembly 12, that is, the second probe assembly 13 can move on the probe base 11, thereby being able to move relative to the first probe assembly 12.

[0042] In this embodiment, a main board 19 is provided on the first side of the probe seat 11, and an RF test seat 191 is provided on the main board 19. An RF tester is provided on the second side of the probe seat 11. The RF test device 1 provided in this application connects the RF test seat 191 on the main board 19 to the RF tester through a probe assembly. After the probe assembly contacts the signal on the RF test seat 191, the RF test seat 191 will cut off the connection between the RF path and the antenna feeding point, so that the RF signal can be transmitted to the RF tester through the probe assembly. The RF signal is tested by the RF tester to determine whether the RF signal from the main board 19 to the antenna meets expectations.

[0043] The embodiment of the present application provides a radio frequency test device 1, comprising a probe seat 11, a first probe assembly 12, and a second probe assembly 13. The probe seat 11 is connected to the first probe assembly 12 and the second probe assembly 13. The first probe assembly 12 and the probe seat 11 are fixed relative to each other, while the second probe assembly 13 is movably connected to the probe seat 11, so that it can move relative to the first probe assembly 12, or move relative to the first probe assembly 12 to a target position, where the target position is the position where the second probe assembly 13 adapts to the radio frequency test seat of the mainboard. Thus, at least two probe assemblies, the first probe assembly 12 and the second probe assembly 13, can be set on a probe seat 11, forming a one-to-two structure, reducing the number of probe seats 11 by 50%, thereby reducing the spatial interference between the probe seats 11, and making the spacing between the radio frequency test seats 191 on the mainboard 19 closer, thereby achieving the purpose of saving the area of the mainboard 19. At the same time, the reduction in the number of probe seats 11 also reduces costs. In addition, the second probe assembly 13 can move relative to the first probe assembly 12, so that the distance between the second probe assembly 13 and the first probe assembly 12 can be adjusted as needed to adapt to the position of the test socket on the PCB board, which is more convenient, flexible and practical.

[0044] In this embodiment, the radii of the first probe assembly 12 and the second probe assembly 13 on the probe seat 11 are also adjusted. The radii of the first probe assembly 12 and the second probe assembly 13 on the probe seat 11 are reduced and can be adjusted to 1.5mm. In this way, if it is necessary to perform RF testing on two RF test seats 191, the distance in the width direction of the probe seat 11 can be 3mm in diameter plus a reserved gap of 0.3mm, that is, the distance between the corresponding main board 19 in the direction parallel to the width direction of the probe seat 11 is 3.3mm, and the distance between the corresponding main board 19 in the length direction of the probe seat 11 can be 3mm in diameter plus a reserved gap of 0.3mm, that is, the distance between the corresponding main board 19 in the direction parallel to the length direction of the probe seat 11 is 3.3mm, thereby greatly reducing the required area of the main board 19 and saving costs.

[0045] like Figures 1 to 4 As shown, in the embodiment of the present application, the first probe head 121 of the first probe assembly 12 and the second probe head 131 of the second probe assembly 13 are both located on the first side of the probe seat 11;

[0046] The second probe head 131 is located at the target position relative to the first probe head 121 and can be connected to the RF test socket 191 of the mainboard 19 .

[0047] In this embodiment, the RF testing device 1 includes a first probe assembly 12 and a second probe assembly 13. The first probe assembly 12 and the second probe assembly 13 are both connected to the probe seat 11. The structures of the first probe assembly 12 and the second probe assembly 13 can be the same or different. They can be set according to the requirements of the RF test and are not limited here.

[0048] In this embodiment, the first probe assembly 12 includes a first probe head 121, and the second probe assembly 13 includes a second probe head 131. The first probe head 121 of the first probe assembly 12 and the second probe head 131 of the second probe assembly 13 are located on the same side of the probe base 11, both located on the first side of the probe base 11. The first side of the probe base 11 is provided with the RF test base 191 of the main board 19, so that the first probe head 121 of the first probe assembly 12 and the second probe head 131 of the second probe assembly 13 are both used to connect to the RF test base 191 on the main board 19. The first probe assembly 12 is fixed relative to the probe base 11, and the second probe assembly 13 can move on the probe base 11. Therefore, the position of the RF test device 1 can be determined first according to the position of a RF test socket 191 corresponding to the first probe head 121 of the first probe assembly 12, and then the second probe assembly 13 can be moved relative to the first probe assembly 12 so that the second probe head 131 of the second probe assembly 13 is connected to another RF test socket 191, and the positions of the two RF test sockets 191 can be set to be close to each other. It is only necessary to move the corresponding second probe assembly 13 according to the position of the RF test socket 191. It is flexible, convenient and practical. Therefore, while achieving the connection between the first probe assembly 12 and the second probe assembly 13 and the corresponding RF test socket 191, it can avoid the RF test socket 191 from occupying too much area on the main board 19, thereby greatly reducing the area of the main board 19 and saving costs accordingly.

[0049] like Figures 1 to 4 As shown, in the embodiment of the present application, the first probe tail 122 of the first probe assembly 12 and the second probe tail 132 of the second probe assembly 13 are both located on the second side of the probe seat 11 and can be connected to the RF tester. The second side of the probe seat 11 is arranged opposite to the first side of the probe seat 11.

[0050] In this embodiment, the first side of the probe base 11 is a side of the first surface of the probe base 11, and the second side of the probe base 11 is a side of the second surface of the probe base 11. The first surface and the second surface of the probe base 11 are arranged opposite to each other, so that the first side located on the side of the first surface of the probe base 11 is arranged opposite to the second side located on the side of the second surface of the probe base 11. Thus, the probe base 11 fixes the first probe head 121 and the first probe tail 122, and the probe base 11 fixes the second probe head 131 and the second probe tail 132. The probe base 11 can adopt a clamping structure to fix the probe assembly by a locating pin. The outer diameter of the locating pin on the probe base 11 can be 0.8 mm, and the diameter of the screw is 1.4 mm, so that the probe head and the probe tail can be better fixed.

[0051] In this embodiment, RF testers are primarily categorized into four types: spectrum analyzers, signal generators, network analyzers, and power probes. Spectrum analyzers can be used to detect and measure frequencies and signal types within the radio spectrum, including signal power and modulation. The most basic function of a spectrum analyzer is to display the relationship between power and frequency, and to measure RF location and quantity. Analyzers measure power relative to other powers in decibels (dB). Signal generators can generate different types of RF signals for designing and testing RF devices such as receivers. For example, mobile phones, car remote controls, and GPS satellites all generate RF signals. These signals range from simple unmodulated signals to complex modulated signals used in most wireless applications. Signal generators allow users to control all parameters of the generated signal, including power, frequency, and modulation. In the RF field, devices with one or more ports form a network, each capable of transmitting, reflecting, and / or absorbing RF energy. These are typically components within a system, and mobile phones typically have multiple components that can be referred to as a "network." To ensure that these components are functioning properly and guarantee overall system performance, accurate, reliable, and repeatable methods for measuring these components are required. When testing a network, RF is injected into a port and the amount of RF reflected from that port and from other ports is measured simultaneously. This test also measures the degree of delay introduced by the network and how the network alters other characteristics of the injected signal. A network analyzer is similar to a signal generator and spectrum analyzer combined, capable of both generating and measuring RF energy. A network analyzer can measure small signal variations, and sophisticated calibration procedures can be used to further reduce or eliminate errors. Network analyzers are most commonly used in laboratories, although portable network analyzers can be used in the field to test cables and antennas. Network analyzers are also known as vector network analyzers (VNAs); power probes can be used for simple received power measurements. The basic function of a power probe is to report power in numerical form, such as 10.92 dBm. Power probes are not as sophisticated as the other instruments mentioned above, but they are widely used in the RF field and are commonly found in most RF labs.

[0052] In this embodiment, a main board 19 is provided on the first side of the probe base 11, a radio frequency test base 191 is provided on the main board 19, a radio frequency tester is provided on the second side of the probe base 11, a first probe assembly 12 and a second probe assembly 13 are provided on the probe base 11, the first probe assembly 12 has a first probe head 121 and a first probe tail 122, the first probe head 121 is located on the first side of the probe base 11, for connecting to the radio frequency test base 191 on the main board 19, the first probe tail 122 is located on the second side of the probe base 11, for connecting to the radio frequency tester, thereby connecting the radio frequency test base 191 to the radio frequency tester through the first probe assembly 12; the second probe assembly 13 has a second probe head 131 and a second probe tail 132, the second probe head 131 is located on the first side of the probe base 11, for connecting to the radio frequency test base 191 on the main board 19, the second probe tail 132 is located on the second side of the probe base 11, for connecting to the radio frequency tester, thereby connecting the radio frequency test base 191 to the radio frequency tester through the second probe assembly 13. After the first probe assembly 12 or the second probe assembly 13 is connected to the corresponding RF test socket 191, the RF test socket 191 will cut off the connection between the RF path and the antenna feeding point, so that the RF signal can be transmitted to the corresponding RF tester through the first probe assembly 12 or the second probe assembly 13. The RF signal is tested by the RF tester to determine whether the RF signal from the mainboard 19 to the antenna meets expectations.

[0053] like Figure 3 and Figure 4 As shown, in the embodiment of the present application, the first probe assembly 12 further includes a first elastic structure 123 , and the first elastic structure 123 is disposed between the first probe head 121 and the first probe tail 122 ;

[0054] The second probe assembly 13 further includes a second elastic structure 133 , which is disposed between the second probe head 131 and the second probe tail 132 .

[0055] In this embodiment, the first elastic structure 123 and the second elastic structure 133 may be springs or other elastic structures, as long as they are suitable for production and application, and are not limited here.

[0056] In this embodiment, the first probe assembly 12 includes a first probe head 121, a first probe tail 122 and a first elastic structure 123. The first elastic structure 123 is arranged between the first probe head 121 and the first probe tail 122, and is used to connect the first probe head 121 with the first probe tail 122. The first probe tail 122 has a first connecting line. After the first probe tail 122 is connected to the first probe head 121, the first probe head 121 is connected to the first connecting line. The first connecting line is used to connect to a radio frequency tester, so that the signal is transmitted from the first probe head 121 to the radio frequency tester through the first connecting line for testing. The arrangement of the elastic member can ensure that the first connecting line between the first probe head 121 and the first probe tail 122 is well connected. Close contact; the second probe assembly 13 includes a second probe head 131, a second probe tail 132 and a second elastic structure 133. The second elastic structure 133 is arranged between the second probe head 131 and the second probe tail 132, and is used to connect the second probe head 131 with the second probe tail 132. The second probe tail 132 has a second connecting line. After the second probe tail 132 is connected to the second probe head 131, the second probe head 131 is connected to the second connecting line. The second connecting line is used to connect to the RF tester, so that the signal is transmitted from the second probe head 131 to the RF tester through the second connecting line for testing. The setting of the elastic member can ensure good and reliable contact between the second probe head 131 and the second connecting line in the second probe tail 132.

[0057] In this embodiment, the RF signal of the RF test socket 191 can be transmitted to the coaxial line through the first probe assembly 12 or the second probe assembly 13, and then transmitted to the RF tester through the coaxial line to measure the RF signal. The first connecting line and the second connecting line can be coaxial cables to avoid interference and attenuation by electromagnetic waves, and a common mode filter can be connected in series between the first connecting line and the second connecting line to reduce the loss of the RF signal on the way to the RF tester, so that the function of the RF signal can enter the RF tester for testing at a power equal to or close to the actual power, thereby ensuring the transmission quality of the signal and improving the accuracy of the test.

[0058] In the embodiment of the present application, the probe base 11 is provided with a first track 14 , and the second probe assembly 13 is movably connected to the probe base 11 through the first track 14 . The second probe assembly 13 can move to a target position along the first track 14 relative to the first probe assembly 12 .

[0059] In this embodiment, the first track 14 is an area where the second probe assembly 13 can move more smoothly. The friction on the first track 14 is small. It can be a sliding track, or a track that runs through the probe seat 11. The second probe assembly 13 extends into the first track 14. Under the restriction of the first track 14, the second probe assembly 13 can move along the first track 14 to achieve movement relative to the first probe assembly 12.

[0060] In this embodiment, a first probe assembly 12 and a second probe assembly 13 are provided on the probe seat 11. The first probe assembly 12 is fixed relative to the probe seat 11, and the second probe assembly 13 can move relative to the first probe assembly 12. A first track 14 is provided on the probe seat 11, so that the second probe assembly 13 can move on the first track 14 to adjust the relative distance between the second probe assembly 13 and the first probe assembly 12 to adapt to the corresponding RF test seat 191, which is more convenient, flexible and practical.

[0061] In this embodiment, at least one fixing member is further provided on the circumferential edge of the first track 14 to fix the second probe assembly 13 after the second probe assembly 13 is connected to the RF test seat 191. The fixing member can be a bolt, that is, a threaded hole is provided on the edge of the first track 14 to connect the second probe assembly 13 to the probe seat 11 by bolts, or other fixing members can also be used, such as a clamping structure, etc., as long as it is convenient to detachably connect the second probe assembly 13 to the probe seat 11 and is suitable for production and application, it is not limited here.

[0062] like Figure 1 As shown, in the embodiment of the present application, the first track 14 is an elliptical track, a circular track or a special-shaped track.

[0063] In this embodiment, the shape of the first track 14 may also be other shapes, as long as they are suitable for production and application, and are not limited here.

[0064] In the embodiment of the present application, the first probe assembly 12 and the second probe assembly 13 are both needle-shaped structures, and the first probe assembly 12 and the second probe assembly 13 are both perpendicular to the probe base 11 .

[0065] In this embodiment, satisfying the vertical condition means being approximately vertical, that is, the first probe assembly 12 and the second probe assembly 13 are both approximately vertical to the probe base 11 .

[0066] In this embodiment, the first probe head 121 and the second probe head 131 are both needle-shaped structures, so that they can better connect with the RF test socket 191, and thus can more accurately detect the RF signal of the RF test socket 191. In addition, the first probe assembly 12 and the second probe assembly 13 are both perpendicular to the probe socket 11, so that the length of the first probe assembly 12 and the second probe assembly 13 can be reduced, and the first probe assembly 121 can be connected with the shortest first connecting line length, and the second probe head 131 can be connected with the shortest second connecting line length, thereby reducing the loss during the transmission of the RF signal and improving the accuracy of the RF test.

[0067] like Figure 5 As shown, in the embodiment of the present application, it also includes:

[0068] A third probe assembly 15, the third probe assembly 15 is connected to the probe seat 11; and / or

[0069] The fourth probe assembly 16 is connected to the probe base 11 .

[0070] In this embodiment, the probe seat 11 can be provided with a first probe assembly 12, a second probe assembly 13, a third probe assembly 15 and / or a fourth probe assembly 16, that is, at least two probe assemblies are provided on the probe seat 11, and three probe assemblies, or four probe assemblies, or more probe assemblies can also be provided. As long as there is no interference between the multiple probe assemblies and they are suitable for production and application, there is no restriction here.

[0071] In this embodiment, a first probe assembly 12, a second probe assembly 13, a third probe assembly 15 and / or a fourth probe assembly 16 are provided on the probe seat 11. The first probe assembly 12 has a first probe head 121 and a first probe tail 122. The first probe head 121 is located on a first side of the probe seat 11 and is used to connect to the RF test seat 191 on the main board 19. The first probe tail 122 is located on a second side of the probe seat 11 and is used to connect to the RF tester, thereby connecting the RF test seat 191 to the RF tester through the first probe assembly 12. The second probe assembly 13 has a second probe head 131 and a second probe tail 132. The second probe head 131 is located on a first side of the probe seat 11 and is used to connect to the RF test seat 191 on the main board 19. The second probe tail 132 is located on a second side of the probe seat 11 and is used to connect to the RF tester, thereby connecting the RF test seat 191 to the RF tester through the second probe assembly 13. The third probe assembly 15 has a third probe head and a third probe tail. The third probe head is located on the first side of the probe seat 11 and is used to connect to the RF tester on the main board 19. The third probe tail is located on the second side of the probe seat 11, and is used to connect to the RF tester, so that the RF test seat 191 is connected to the RF tester through the third probe assembly 15; the fourth probe assembly 16 has a fourth probe head and a fourth probe tail, the fourth probe head is located on the first side of the probe seat 11, and is used to connect to the RF test seat 191 on the mainboard 19, and the fourth probe tail is located on the second side of the probe seat 11, and is used to connect to the RF tester, so that the RF test seat 191 is connected to the RF tester through the fourth probe assembly 16; after the first probe assembly 12, the second probe assembly 13, the third probe assembly 15, and / or the fourth probe assembly 16 are connected to the corresponding RF test seat 191, the RF test seat 191 will cut off the connection between the RF path and the antenna feeding point, so that the RF signal can be transmitted to the corresponding RF tester through the first probe assembly 12, the second probe assembly 13, the third probe assembly 15, and / or the fourth probe assembly 16, and the RF signal is tested by the RF tester to determine whether the RF signal from the mainboard 19 to the antenna meets expectations.

[0072] In this embodiment, a first probe assembly 12, a second probe assembly 13 and a third probe assembly 15 are provided on the probe seat 11. The first probe assembly 12 can be fixed relative to the probe seat 11, the second probe assembly 13 can move relative to the first probe assembly 12, and the third probe assembly 15 can move relative to the first probe assembly 12.

[0073] In this embodiment, a first probe assembly 12, a second probe assembly 13 and a fourth probe assembly 16 are provided on the probe seat 11. The first probe assembly 12 can be fixed relative to the probe seat 11, the second probe assembly 13 can move relative to the first probe assembly 12, and the fourth probe assembly 16 can move relative to the first probe assembly 12 or the second probe assembly 13.

[0074] In this embodiment, a first probe assembly 12, a second probe assembly 13, a third probe assembly 15 and a fourth probe assembly 16 are provided on the probe seat 11. The first probe assembly 12 can be fixed relative to the probe seat 11, the second probe assembly 13 can move relative to the first probe assembly 12, the third probe assembly 15 can move relative to the first probe assembly 12, the second probe assembly 13 or the fourth probe assembly 18, and the fourth probe assembly 16 can move relative to the first probe assembly 12, the second probe assembly 13 or the third probe assembly 15.

[0075] like Figure 5 As shown, in this embodiment, the first probe assembly 12, the second probe assembly 13, the third probe assembly 15 and / or the fourth probe assembly 16 are distributed in an array on the probe seat 11, and the first probe assembly 12, the second probe assembly 13, the third probe assembly 15 and / or the fourth probe assembly 16 can be arranged in sequence along the length direction of the probe seat 11 to form a straight-line structure, so as not to occupy too much of the length of the probe seat 11 along the width direction, so that the probe seat 11 occupies less, and correspondingly, the occupied area of the radio frequency test seat of the PCB board on the main board 19 will also be reduced, thereby saving the main board area and saving costs. In this embodiment, the first probe assembly 12, the second probe assembly 13, the third probe assembly 15 and / or the fourth probe assembly 16 can also be distributed in a polygonal shape on the probe seat 11 to further reduce the area of the probe seat 11, and correspondingly, the occupied area of the radio frequency test seat of the PCB board on the main board 19 will also be reduced, thereby saving the main board area and saving costs.

[0076] In this embodiment, the distribution of the first probe assembly 12, the second probe assembly 13, the third probe assembly 15 and / or the fourth probe assembly 16 on the probe base 11 can be set according to needs, without specific restrictions, as long as it is suitable for production and application.

[0077] like Figure 5 As shown, in the embodiment of the present application, the probe base 11 is provided with a second track 17, and the third probe assembly 15 is movably connected to the probe base 11 through the second track 17. The third probe assembly 15 can move along the second track 17 relative to the first probe assembly 12 to a target position, and the target position is the position where the third probe assembly 15 adapts to the RF test socket of the motherboard; and / or

[0078] The probe base 11 is provided with a third track 18, and the fourth probe assembly 16 is movably connected to the probe base 11 via the third track 18. The fourth probe assembly 16 can move along the third track 18 relative to the first probe assembly 12 to a target position, where the target position is the position where the fourth probe assembly 16 adapts to the RF test socket of the motherboard;

[0079] There is no interference between any two of the first track 14, the second track 17 and the third track 18. The first track 14, the second track 17 and / or the third track 18 are adapted and adjusted based on the probe seat 11 to avoid mutual interference while ensuring the movement of the corresponding probe assemblies on the first track 14, the second track 17 and / or the third track 18. The trajectories of the first track 14, the second track 17 and / or the third track 18 are determined based on the number and position of the RF test seats on the main board, so that the corresponding probe assemblies on the first track 14, the second track 17 and / or the third track 18 can be better connected to the RF test seats on the main board.

[0080] In this embodiment, the second track 17 is an area where the third probe assembly 15 can move more smoothly. The friction on the second track 17 is small, and it can be a sliding track, or a track that passes through the probe seat 11. The third probe assembly 15 extends into the second track 17. Under the restriction of the second track 17, the third probe assembly 15 can move along the second track 17 to achieve movement relative to the first probe assembly 12; the third track 18 is an area where the fourth probe assembly 16 can move more smoothly. The friction on the second track is small, and it can be a sliding track, or a track that passes through the probe seat 11. The fourth probe assembly 16 extends into the third track 18. Under the restriction of the third track 18, the fourth probe assembly 16 can move along the third track 18 to achieve movement relative to the fourth probe assembly 16.

[0081] In this embodiment, a first probe assembly 12, a second probe assembly 13, a third probe assembly 15 and / or a fourth probe assembly 16 are provided on the probe seat 11, and the first probe assembly 12 is fixed relative to the probe seat 11, and the second probe assembly 13, the third probe assembly 15 and / or the fourth probe can move relative to the first probe assembly 12, and a first track 14, a second track 17 and / or a third track 18 are provided on the probe seat 11, so that the second probe assembly 13, the third probe assembly 15 and / or the fourth probe assembly 16 can move on the corresponding first track 14, the second track 17 and / or the third track 18 to adjust the relative distance between the second probe assembly 13, the third probe assembly 15 and / or the fourth probe assembly 16 and the first probe assembly 12 to adapt the corresponding RF test seat 191, so that the distance between the two adjacent RF test seats 191 can be reduced, thereby further reducing the area occupied by the main board 19, and it is more convenient, flexible and practical.

[0082] In this embodiment, the second track 17 and / or the third track 18 can be an elliptical track, a circular track or a special-shaped track. The shape of the second track 17 and / or the third track 18 can also be other shapes as long as they are suitable for production and application, and are not limited here.

[0083] In this embodiment, the special-shaped track is a track without a fixed shape, that is, a track whose track is formed according to the distribution on the RF test socket on the mainboard. The special-shaped track can better connect the probe assembly set thereon with the RF test socket on the mainboard, further reducing the area occupied by the RF test socket on the mainboard.

[0084] In this embodiment, at least one fixing member is further provided on the circumferential edge of the second track 17 and / or the third track 18 to fix the third probe assembly 15 and / or the fourth probe assembly 16 after the third probe assembly 15 and / or the fourth probe assembly 16 are connected to the RF test seat 191. The fixing member can be a bolt, that is, a threaded hole is provided on the edge of the second track 17 and / or the third track 18 to connect the third probe assembly 15 and / or the fourth probe assembly 16 to the probe seat 11 by bolts, or other fixing members can also be used, such as a clamping structure, etc., as long as it is convenient to detachably connect the third probe assembly 15 and / or the fourth probe assembly 16 to the probe seat 11 and is suitable for production and application, and no limitation is made here.

[0085] On the other hand, the present application also provides a radio frequency test system, including a radio frequency tester;

[0086] Mainboard 19, the mainboard 19 is provided with a radio frequency test socket 191, and the radio frequency test socket 191 is connected to the radio frequency tester through the radio frequency test device 1;

[0087] The frequency testing device comprises:

[0088] Probe seat 11;

[0089] A first probe assembly 12 is connected to the probe base 11 and fixed in relative position;

[0090] The second probe assembly 13 is movably connected to the probe base 11 so that the second probe assembly 13 can move relative to the first probe assembly 12 to a target position and can be connected to the RF test base 191 .

[0091] In this embodiment, a main board 19 is provided on the first side of the probe base 11, and a radio frequency test base 191 is provided on the main board 19. A radio frequency tester is provided on the second side of the probe base 11. The radio frequency test device 1 provided in this application connects the radio frequency test base 191 on the main board 19 to the radio frequency tester through a probe assembly. After the probe assembly contacts the signal on the radio frequency test base 191, the radio frequency test base 191 cuts off the connection between the radio frequency path and the antenna feed point, so that the radio frequency signal can be transmitted to the radio frequency tester through the probe assembly. The radio frequency signal is tested by the radio frequency tester to determine whether the radio frequency signal from the main board 19 to the antenna meets expectations.

[0092] The radio frequency test device 1 includes a probe seat 11, a first probe assembly 12 and a second probe assembly 13. The first probe assembly 12 and the second probe assembly 13 are connected to the probe seat 11. The first probe assembly 12 is fixed relative to the probe seat 11, and the second probe assembly 13 is movably connected to the probe seat 11, so that it can move relative to the first probe assembly 12, and can also move to a target position relative to the first probe assembly 12. Therefore, at least two probe assemblies, the first probe assembly 12 and the second probe assembly 13, can be set on one probe seat 11, forming a one-to-two structure, reducing the number of probe seats 11, saving space, avoiding interference between too many probe seats 11, having high reliability, and reducing the area occupied by the PCB board, thereby reducing costs. Moreover, the second probe assembly 13 can move relative to the first probe assembly 12, so that the spacing between it and the first probe assembly 12 can be adjusted according to needs to adapt to the position of the test seat on the PCB board, thereby being more convenient, flexible and practical.

[0093] It is understood that the related features in the above devices can be referenced to each other. In addition, the "first", "second", etc. in the above embodiments are used to distinguish between the embodiments, and do not represent the advantages and disadvantages of the embodiments.

[0094] In the description provided herein, numerous specific details are described. However, it is understood that embodiments of the present invention may be practiced without these specific details. In some instances, well-known structures and techniques are not shown in detail so as not to obscure the understanding of this description.

[0095] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of this application. Therefore, the scope of protection of this application should be based on the scope of protection of the claims.

Claims

1. A radio frequency testing device, characterized in that: include: Probe holder; A first probe assembly is connected to the probe base and fixed in relative position; The second probe assembly is movably connected to the probe base, so that the second probe assembly can move to a target position relative to the first probe assembly.

2. The radio frequency testing device according to claim 1, wherein: The first probe head of the first probe assembly and the second probe head of the second probe assembly are both located on a first side of the probe seat; The second probe head is located at the target position relative to the first probe head and can be connected to the radio frequency test socket of the mainboard.

3. The radio frequency testing device according to claim 2, wherein: The first probe tail of the first probe assembly and the second probe tail of the second probe assembly are both located on the second side of the probe base and can be connected to a radio frequency tester. The second side of the probe base is arranged opposite to the first side of the probe base.

4. The radio frequency testing device according to claim 3, wherein: The first probe assembly further includes a first elastic structure, wherein the first elastic structure is disposed between the first probe head and the first probe tail; The second probe assembly further includes a second elastic structure disposed between the second probe head and the second probe tail.

5. The radio frequency testing device according to claim 1, wherein: The probe base is provided with a first track, and the second probe assembly is movably connected to the probe base via the first track. The second probe assembly can move to a target position along the first track relative to the first probe assembly.

6. The radio frequency testing device according to claim 5, characterized in that: The first track is an elliptical track, a circular track or a special-shaped track.

7. The radio frequency testing device according to claim 1, wherein: The first probe assembly and the second probe assembly are both needle-shaped structures, and the first probe assembly and the second probe assembly are both perpendicular to the probe base.

8. The radio frequency testing device according to claim 5, characterized in that: Also includes: a third probe assembly connected to the probe base; and / or A fourth probe assembly is connected to the probe seat.

9. The radio frequency testing device according to claim 8, characterized in that: The probe base is provided with a second track, the third probe assembly is movably connected to the probe base via the second track, and the third probe assembly can move to a target position relative to the first probe assembly along the second track; and / or The probe base is provided with a third track, the fourth probe assembly is movably connected to the probe base via the third track, and the fourth probe assembly can move to a target position relative to the first probe assembly along the third track; There is no interference between any two of the first track, the second track, and the third track.

10. A radio frequency testing system, characterized in that: include: RF tester; A mainboard, wherein the mainboard is provided with a radio frequency test socket, and the radio frequency test socket is connected to the radio frequency tester through a radio frequency test device; The frequency testing device comprises: Probe holder; A first probe assembly is connected to the probe base and fixed in relative position; The second probe assembly is movably connected to the probe seat, so that the second probe assembly can move relative to the first probe assembly to a target position and can be connected to the radio frequency test seat.

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