SMD product testing device
By introducing test tracks, transmission mechanisms and limits into the SMD product test device, combined with the probe's automatic alignment of the pin, the problems of pin flatness affected and manual operation are solved, and efficient and reliable automated testing is achieved.
Patent Information
- Application Number
- CN202422401715.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-30
- Publication Date
- 2025-08-19
- Estimated Expiration
- 2034-09-30
AI Technical Summary
The existing SMD product testing devices are likely to affect the pin flatness of the product to be tested during testing, and rely on manual operation, which poses a risk of pin damage.
The automatic testing method is adopted with the combination of test tracks, transmission mechanisms and limits. The probe is automatically aligned with the pins of the product to be tested, and combined with the sensor controller to achieve automatic positioning and testing to avoid the impact of lateral pressure on the pins.
Ensure the flatness of the pins of the product to be tested, avoid pin damage, improve the reliability and efficiency of the test, reduce human error, and simplify the operation process.
Smart Images
Figure CN223244661U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of testing devices, in particular to a testing device for SMD products. Background Art
[0002] As key components in modern electronic products, SMD products are widely used in consumer electronics, communications equipment, and industrial automation due to their small size, light weight, and excellent electrical performance. The continuous advancement of SMD technology has driven the miniaturization and high performance of electronic products, but at the same time, the testing requirements for SMD products have also increased. Testing is not only a key step in ensuring product quality, but also an indispensable part of the production process.
[0003] Currently, testing of many SMD products relies primarily on manual operation. This manual testing method typically requires workers to insert the pins of the product under test into the testing equipment and inspect them one by one, which is time-consuming and cumbersome. This manual operation can also cause physical damage to the pins of the product under test, especially when handling tiny SMD components.
[0004] Among existing SMD product testing equipment, although some test devices have certain automation functions, there are still limitations. When testing SMD components, existing test equipment often tests by clamping the pins of the product to be tested. Since the pins of the product to be tested are clamped by lateral force, this testing method seriously affects the flatness of the pins of the product to be tested, resulting in poor contact during testing and unstable test results. At the same time, the pins are easily damaged due to uneven force. Summary of the Invention
[0005] The technical problem to be solved by the utility model is to solve the problem that the flatness of the pins of the product to be tested is easily affected and manual labor is relied upon when the existing SMD product testing device is testing.
[0006] In order to solve the above technical problems, the present invention provides a SMD product testing device, which includes:
[0007] A test carrier, the test carrier comprising a test track, the test track being located on the top side of the test carrier, the test track being used to convey the product to be tested, and the test carrier being provided with a plurality of through holes;
[0008] a test circuit, the test circuit being located inside the test carrier, the test circuit comprising a test circuit board and a probe, one end of the probe being connected to the test circuit board, the other end of the probe passing through the through hole, and the other end of the probe being provided with a pin connection port;
[0009] A limiting portion, the limiting portion is used to limit the movement of the product to be tested on the test track;
[0010] A transmission mechanism is connected to the test circuit board and is used to drive the test circuit board to move so that the probe contacts or releases the pin of the product to be tested.
[0011] Furthermore, the SMD product testing device includes a sensor controller, which is used to sense the position information of the product to be tested. When the product to be tested is located at a preset position, the sensor controller sends a control signal to control the limit part and the transmission mechanism. The sensor controller is located on both sides of the test carrier.
[0012] Furthermore, the SMD product testing device also includes a support plate, which is used to fix the test carrier, the sensor controller and the limit part. The support plate is located on the bottom side of the test carrier, and the transmission mechanism is connected to the test circuit through the support plate.
[0013] Furthermore, the limiting lever includes a limiting lever body and a lever, the limiting lever body is connected to the lever, a first driving device is provided in the limiting lever body, the first driving device drives the lever to move so that the lever is located at the top of the test track, the limiting pressure block includes a limiting pressure block body and a pressure block, a second driving device is provided in the limiting pressure block body, the limiting pressure block body is connected to the pressure block, and the second driving device drives the pressure block to move so that the pressure block contacts the product to be tested.
[0014] Furthermore, there is a height difference between two ends of the test track, and the height of one end of the test track is higher than the height of the other end of the test track.
[0015] Furthermore, the through holes of the SMD product testing device are arranged on both sides of the test track.
[0016] Furthermore, the width of the test track is W1, the width of the pin of the product to be tested is W2, and W2≥W1.
[0017] Furthermore, the probe has a height adjustment mechanism, and the material of the probe is elastic material.
[0018] Furthermore, the transmission mechanism includes a third drive device and a transmission connecting plate, the third drive device is connected to the transmission connecting plate, the top of the transmission connecting plate is connected to the bottom of the test circuit board, and the third drive device drives the transmission connecting plate to move along the bottom direction of the test circuit board.
[0019] Furthermore, the third driving device is driven by a motor or a cylinder.
[0020] Compared with the prior art, the SMD product testing device according to the embodiment of the present invention has the following beneficial effects:
[0021] The embodiment of the utility model replaces the traditional manual clamping test method with a method in which the probe automatically aligns with the pins of the product to be tested, thereby effectively avoiding the lateral pressure exerted by the test device on the pins of the product to be tested. The SMD product testing device ensures that the flatness of the pins of the product to be tested is not affected, avoids damage or deformation of the pins of the product to be tested due to improper clamping of the test device, and improves the reliability of SMD product testing. The embodiment of the utility model sets a test track, a transmission mechanism and a limit part, and then cooperates with each other to achieve automatic positioning and automatic testing of the product to be tested. Compared with traditional manual operation, the automated testing process can significantly shorten the test time, improve the test efficiency of the production line, reduce the test errors caused by human factors, and ensure the integrity and quality of the product to be tested. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] Figure 1 This is a structural diagram of an SMD product testing device provided by an embodiment of the present utility model;
[0023] Figure 2 yes Figure 1 A magnified view of the product under test, probes, test tracks, and through-holes;
[0024] Figure 3 This is another structural diagram of the SMD product testing device provided by an embodiment of the present utility model;
[0025] Figure 4 This is a schematic diagram of a partial cross section of a test carrier and a test circuit in an SMD product test device provided by an embodiment of the present utility model;
[0026] Figure 5 This is a schematic structural diagram of a probe and a test circuit board in an SMD product test device provided by an embodiment of the present utility model;
[0027] Figure 6 This is a structural diagram of a test circuit and a transmission mechanism in an SMD product test device provided by an embodiment of the present utility model;
[0028] Figure 7 This is a structural diagram of an SMD product testing device provided by another embodiment of the present invention;
[0029] Figure 8 This is a structural diagram of an SMD product testing device provided by yet another embodiment of the present utility model;
[0030] Figure 9 This is a structural schematic diagram of a product to be tested and a test track in an SMD product testing device provided by another embodiment of the present utility model.
[0031] In the figure, 100, test carrier; 110, test track; 120, through hole; 200, test circuit; 210, test circuit board; 220, probe; 300, limit part; 310, limit lever; 311, limit lever body; 312, lever; 313, first driving device; 320, limit pressure block; 321, limit pressure block body; 322. Pressure block; 323, second driving device; 400, transmission mechanism; 410, third driving device; 420, transmission connecting plate; 500, sensor controller; 600, product to be tested; 700, support plate. DETAILED DESCRIPTION
[0032] The following is a further detailed description of specific embodiments of the present invention in conjunction with the accompanying drawings and examples. The following examples are intended to illustrate the present invention but are not intended to limit the scope of the present invention. It should be noted that unless otherwise specifically stated, the relative arrangement of components and steps, and numerical values described in these examples do not limit the scope of the present invention.
[0033] The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the present invention, its application, or uses.
[0034] Technologies, methods, and equipment known to ordinary technicians in the relevant art may not be discussed in detail, but where appropriate, the technologies, methods, and equipment should be considered part of the specification.
[0035] In all examples shown and discussed herein, any specific values should be interpreted as merely exemplary and not limiting. Therefore, other examples of the exemplary embodiments may have different values.
[0036] It should be noted that like reference numerals and letters refer to like items in the following figures, and therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.
[0037] like Figure 1-6 As shown, an embodiment of the present invention provides an SMD product testing device, the SMD product testing device comprising:
[0038] A test carrier 100, the test carrier 100 being located on the top side of the support plate 700, the test carrier 100 including a test track 110, the test track 110 being located on the top side of the test carrier 100, the test track 110 being used to transport the product 600 to be tested, and the top side of the test carrier 100 being provided with a plurality of through holes 120;
[0039] A test circuit 200 is located inside the test carrier 100 and includes a test circuit board 210 and a probe 220. One end of the probe 220 is connected to the test circuit board 210, and the other end of the probe 220 passes through the through hole 120. The other end of the probe 220 is provided with a pin connection port.
[0040] The limiting portion 300 is used to limit the movement of the product to be tested 600 on the test track 110;
[0041] The transmission mechanism 400 is connected to the test circuit board 210 . The transmission mechanism 400 is used to drive the test circuit board 210 to move, so that the probe 220 contacts or releases the pin of the product to be tested 600 .
[0042] The test track 110 refers to a track for effectively guiding the product to be tested 600 to slide along a specific path. The test track 110 can use a conveyor belt, gravity, or a drive device to achieve the sliding of the product to be tested 600 along the test track 110. Preferably, the test track 110 can convey the product to be tested 600 by gravity. In the embodiment of the present invention, the test track 110 can be set as a test track 110 with a height difference. Due to the height difference of the test track 110, the test track 110 at the higher end can be used as the starting end of the SMD product testing device. When conducting product testing, the staff places the product to be tested 600 at the starting end. Under the action of gravity, the product to be tested 600 will slide from the starting end along the test track 110 to the lower end. When sliding to a preset position, the limit part 300 restricts the test object from sliding on the test track 110. This preferred embodiment drives the product to be tested 600 to slide on the test track 110 by setting a height difference. The structural design is simple, and the use of gravity sliding reduces the dependence on complex mechanical drives, reduces the difficulty of operation, and effectively reduces energy consumption, thereby saving electricity.
[0043] Among them, the test circuit 200 is used to test whether the various parameters of the product under test 600 are working properly. When the probe 220 is connected to the pins of the product under test 600, the various parameters of the product under test 600 can be tested by turning on the test circuit 200. The various parameters here refer to the signal transmission performance, electrical characteristics, current and resistance parameters of the product under test 600. Among them, the probe 220 is a tool used to connect the pins of the product under test 600 with the test circuit board 210, and the electrical signal is transmitted through the probe 220. The interface of the probe 220 and the pins of the product under test 600 can be adapted to each other, and the connection between them does not require the use of a clamping device. When the interface of the probe 220 is aligned with the pins of the device under test, this method only overcomes the lateral pressure on the pins during the test process, ensures the flatness of the pins, and reduces the risk of damage to the pins of the product under test 600.
[0044] In the embodiment of the present invention, the embodiment of the present invention effectively avoids lateral pressure exerted by the testing device on the pins of the product to be tested 600 by replacing the traditional manual clamping test method with a method in which the probe 220 automatically aligns with the pins of the product to be tested 600. The SMD product testing device ensures that the flatness of the pins of the product to be tested 600 is not affected, avoids damage or deformation of the pins of the product to be tested 600 due to improper clamping of the testing device, and improves the reliability of SMD product testing.
[0045] like Figure 1 As shown, in an optional embodiment of the present invention, the SMD product testing device includes a sensor controller 500, which is used to sense the position information of the product to be tested 600. When the product to be tested 600 is located at a preset position, the sensor controller 500 sends a control signal to control the limit part 300 and the transmission mechanism 400. The sensor controller 500 is located on both sides of the test carrier 100.
[0046] The sensor controller 500 is used to sense the position of the product under test 600. This means that when the product under test 600 moves on the test track 110, the sensor controller 500 obtains the position information of the product under test 600. When the sensor detects that the product under test 600 has moved to a preset position, the sensor will send a control signal to control the limit part 300 to limit the product under test 600, thereby restricting the movement of the product under test 600. At the same time, the sensor controller 500 will also control the transmission mechanism 400 to drive the test circuit 200 to move. The preset position refers to the position where the pin of the product under test 600 is located at the corresponding position of the through hole 120 of the test carrier 100. When the product under test 600 is at this position, the probe 220 is driven by the transmission mechanism 400 to pass through the through hole 120 and connect with the pin of the product under test 600, thereby conducting the test circuit 200 and the product under test 600, and testing the product under test 600. After the product to be tested 600 is tested, the sensor controller 500 sends a control signal to control the limit part 300 to release the restriction on the product to be tested 600. At this time, the product to be tested 600 continues to move along the test track 110, and a new product to be tested 600 starts to wait for testing from the starting end of the test track 110. The SMD product testing device can perform continuous and automatic testing on multiple SMD products.
[0047] Specifically, the working process of the SMD product testing device in this embodiment is as follows: first, the staff puts the product to be tested 600 on one end of the test track 110; second, the product to be tested 600 is transported along the test track 110 to a preset position; then, when the product to be tested 600 is at the preset position, the sensor controller 500 sends a control signal to control the limit part 300 to limit the product to be tested 600, and the sensor controller 500 also sends a control signal to control the transmission mechanism; then, the transmission mechanism 400 drives the product to be tested 600 to move to the preset position. The test circuit 200 moves up and down, and the probe 220 of the test circuit 200 passes through the through hole 120 under the action of the transmission mechanism 400 to connect with the pin of the product under test 600; finally, the test circuit 200 tests the product under test 600; when the test is completed, the sensor controller 500 controls the limit part 300 to release the product under test 600, and the sensor controller 500 controls the transmission mechanism 400 to drive the probe 220 to be pulled out from the pin of the product under test 600, and the product under test 600 slides out along the test track 110.
[0048] In an embodiment of the utility model, the utility model realizes automatic positioning and automatic testing of the product to be tested 600 by setting a test track 110, a transmission mechanism 400, a limit part 300 and a sensor controller 500, and then cooperating them with each other. Compared with traditional manual operation, the automated testing process can significantly shorten the testing time, improve the testing efficiency of the production line, reduce the testing errors caused by human factors, and ensure the integrity and quality of the product to be tested 600.
[0049] like Figure 7 As shown, in an optional embodiment of the present utility model, the limiting portion 300 includes a limiting lever 310 and a limiting pressure block 320, the limiting lever 310 includes a limiting lever body 311 and a lever 312, the limiting lever body 311 is connected to the lever 312, a first driving device 313 is provided in the limiting lever body 311, the first driving device 313 drives the lever 312 to move so that the lever 312 is located at the top of the test track 110, the limiting pressure block 320 includes a limiting pressure block body 321 and a pressure block 322, a second driving device 323 is provided in the limiting pressure block body 321, the limiting pressure block body 321 is connected to the pressure block 322, the second driving device 323 drives the pressure block 322 to move so that the pressure block 322 contacts the product to be tested 600.
[0050] Among them, the limiting blocking rod 310 refers to a component that limits the movement of an object in a certain direction. In this embodiment, the function of the limiting blocking rod 310 is to limit the sliding of the product 600 to be tested on the test track 110 when the product to be tested 600 is in a preset position. The first driving device 313 in the limiting blocking rod body 311 drives the blocking rod 312 to place the blocking rod 312 on the test track 110, blocking the sliding direction of the product to be tested 600 along the test track 110. The blocking rod 312 forms an obstacle to limit the movement of the product to be tested 600; the function of the limiting pressure block 320 is to limit the movement of the product to be tested 600 in the limiting position when the product to be tested 600 is affected by the limiting baffle. The second driving device 323 in the position pressure block body 321 drives the product to be tested 600 to apply a downward force. During the test, the probe 220, driven by the transmission mechanism 400, will pass through the through hole 120 and contact the pin of the product to be tested 600. The contact between the probe 220 and the pin will exert an upward force on the pin of the product to be tested 600. This upward force may cause the product to be tested 600 to be pushed out of the test track 110 by the probe 220. The position limiting pressure block 320 applies a downward force to the product to be tested 600, ensuring the stability of the product to be tested 600. The position limiting pressure block 320 enables the pin of the product to be tested 600 to be smoothly connected with the probe 220.
[0051] Specifically, the working process of the limiting part 300 in this embodiment is: first, when the sensor controller 500 senses that the product to be tested 600 slides to a preset position along the test track 110, the sensor controller 500 sends a control signal to the limiting part 300; then, the limiting blocking rod body 311 in the limiting part 300 drives the blocking rod 312 to a preset position to block the product to be tested 600, limiting the movement of the product to be tested 600 along the test track 110; then, the limiting pressure block body 321 in the limiting part 300 controls the pressure block 322 to apply downward pressure to the product to be tested 600; finally, the probe 220, driven by the transmission mechanism 400, passes through the through hole 120 and is connected to the pin of the product to be tested 600.
[0052] The embodiment of the present invention applies a downward force to the product under test 600 through the limiting pressure block 320, effectively preventing the upward force generated by the probe 220 contacting the pin, which would cause the product to move, thereby ensuring the stability of the product during the test process. The embodiment of the present invention accurately limits the movement of the product under test 600 through the limiting lever 310, so that the product under test 600 can be maintained in a preset position for testing, thereby improving the reliability of the test. The automated limiting unit 300 also reduces manual intervention, improves test efficiency, and simplifies the operating process. By providing the limiting pressure block 320 and the limiting lever 310, the present invention improves the stability and reliability of the SMD product testing device.
[0053] In an optional embodiment of the present invention, there is a height difference between the two ends of the test track 110 , and the height of one end of the test track 110 is higher than the height of the other end of the test track.
[0054] Among them, the test track 110 can transport the product to be tested 600 by gravity. In the embodiment of the utility model, the test track 110 can be set as a test track 110 with a height difference. Since the test track 110 has a height difference, the test track 110 at the higher end can be used as the starting end of the SMD product testing device. When conducting product testing, the staff places the product to be tested 600 at the starting end. The product to be tested 600 under the action of gravity will slide from the starting end along the test track 110 to the lower end. When sliding to the preset position, the limit part 300 limits the item to be tested from sliding on the test track 110.
[0055] The embodiment of the present invention drives the product to be tested 600 to slide on the test track 110 by setting a height difference. The structural design is simple, and the use of gravity sliding reduces the dependence on complex mechanical drives, reduces the difficulty of operation, and effectively reduces energy consumption, thereby saving electricity.
[0056] like Figure 8As shown, in an optional embodiment of the present invention, the SMD product testing device also includes a support plate 700, which is used to fix the test carrier 100, the sensor controller 500 and the limiting part. The support plate 700 is located on the bottom side of the test carrier 100, and the transmission mechanism 400 is connected to the test circuit 200 through the support plate 700.
[0057] The support plate 700 securely holds the test carrier 100, sensor controller 500, and position limiter 300, ensuring that each component is immobile during testing, thereby ensuring test stability. The support plate 700 provides a solid foundation for the entire test system, reducing test deviations caused by vibration or external interference. The design of the support plate 700 facilitates the installation and commissioning of SMD product test equipment, allowing users to quickly complete equipment setup and conduct tests.
[0058] In the embodiment of the present invention, the support plate 700 improves the stability of SMD product testing, reduces external interference, and simplifies the installation and testing process of the SMD testing device.
[0059] In an optional embodiment of the present invention, the width of the test track 110 is W1, and the width of the pins of the product to be tested 600 is W2, where W2≥W1.
[0060] Among them, under normal circumstances, the pins of SMD products are arranged on both sides of the product. In this embodiment of the utility model, since the through hole 120 is set on the top side of the test carrier 100, and the test track 110 is also located on the top side of the test track 110, if the test track 110 is too wide, the entire product under test 600 will be placed on the test track 110. The overly wide test track 110 causes the pins of the product under test 600 to also be on the test track 110. At this time, the pins of the product under test 600 cannot correspond to the through holes 120 on the test carrier 100, and the probe 220 cannot connect to the pins of the product under test 600 through the through holes 120. Therefore, when the width W2 of the pins of the product under test 600 ≥ the width W1 of the test track 110, the pins of the product under test 600 can correspond to the through holes 120 on the test carrier 100, and normal testing can be performed.
[0061] In the embodiment of the present invention, the pin width W2 of the product under test 600 ≥ the test track 110W1 can ensure that the pins of the product under test 600 correspond to the through holes 120, so that the pins of the product under test 600 can contact the probes 220, ensuring the normal use of the SMD product testing device.
[0062] In an optional embodiment of the present invention, the probe 220 has a height adjustment mechanism, and the material of the probe 220 is an elastic material.
[0063] The probe 220 is provided with a height adjustment mechanism. The probe 220 can adapt to the pin heights of different types of products 600 to be tested. Selecting an elastic and retractable probe 220 can ensure that the pins will not be crushed or damaged.
[0064] In an embodiment of the present invention, a probe 220 with a height adjustment mechanism and made of an elastic material is used, which can adapt to different types of SMD products, thereby improving the compatibility of SMD product testing equipment. The probe 220 made of elastic material reduces the possibility of the pins being damaged during the test process, thereby ensuring the flatness of the pins of the product 600 to be tested.
[0065] In an optional embodiment of the present invention, the transmission mechanism 400 includes a third driving device 410 and a transmission connecting plate 420, the third driving device 410 is connected to the transmission connecting plate 420, the top of the transmission connecting plate 420 is connected to the bottom of the test circuit board 200, and the third driving device 410 drives the transmission connecting plate 420 to move along the bottom direction of the test circuit board 210.
[0066] A drive device is a mechanical or electrical device used to provide power to drive the movement of other components or systems. It can achieve power transmission through various means, such as an electric motor. The third drive device 410 drives the transmission connecting plate 420 to move along the bottom of the test circuit board 210. Because the test circuit board 210 is connected to the probe 220, the probe 220, indirectly driven by the transmission mechanism 400, passes through the through-hole 200 and contacts or releases the pin of the product under test 600.
[0067] In the embodiment of the present invention, the third driving device 410 drives the transmission connecting plate 420 to move, so that the probe 220 contacts the pins of the product to be tested 600, thereby ensuring normal testing of SMD products.
[0068] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and replacements can be made without departing from the technical principles of the present invention. These improvements and replacements should also be regarded as the scope of protection of the present invention.
Claims
1. A SMD product testing device, characterized in that: The SMD product testing device includes: A test carrier, the test carrier comprising a test track, the test track being located on the top side of the test carrier, the test track being used to convey the product to be tested, and the test carrier being provided with a plurality of through holes; a test circuit, the test circuit being located inside the test carrier, the test circuit comprising a test circuit board and a probe, one end of the probe being connected to the test circuit board, the other end of the probe passing through the through hole, and the other end of the probe being provided with a pin connection port; A limiting portion, the limiting portion is used to limit the movement of the product to be tested on the test track; A transmission mechanism is connected to the test circuit board and is used to drive the test circuit board to move so that the probe contacts or releases the pin of the product to be tested.
2. The SMD product testing device according to claim 1, characterized in that: The SMD product testing device includes a sensor controller, which is used to sense the position information of the product to be tested. When the product to be tested is located at a preset position, the sensor controller sends a control signal to control the limit part and the transmission mechanism. The sensor controller is located on both sides of the test carrier.
3. The SMD product testing device according to claim 2, characterized in that: The SMD product testing device further includes a support plate, which is used to fix the test carrier, the sensor controller and the limit portion. The support plate is located on the bottom side of the test carrier, and the transmission mechanism is connected to the test circuit through the support plate.
4. The SMD product testing device according to claim 2, characterized in that: The limiting part includes a limiting lever and a limiting pressure block, the limiting lever includes a limiting lever body and a lever, the limiting lever body is connected to the lever, a first driving device is provided in the limiting lever body, the first driving device drives the lever to move so that the lever is located at the top of the test track, the limiting pressure block includes a limiting pressure block body and a pressure block, a second driving device is provided in the limiting pressure block body, the limiting pressure block body is connected to the pressure block, the second driving device drives the pressure block to move so that the pressure block contacts the product to be tested.
5. The SMD product testing device according to claim 1, characterized in that: There is a height difference between the two ends of the test track, and the height of one end of the test track is higher than the height of the other end of the test track.
6. The SMD product testing device according to claim 1, characterized in that: The through holes of the SMD product testing device are arranged on both sides of the testing track.
7. The SMD product testing device according to claim 6, characterized in that: The width of the test track is W1, and the width of the pin of the product to be tested is W2, where W2≥W1.
8. The SMD product testing device according to claim 1, characterized in that: The probe has a height adjustment mechanism, and the material of the probe is elastic material.
9. The SMD product testing device according to claim 1, characterized in that: The transmission mechanism includes a third driving device and a transmission connecting plate. The third driving device is connected to the transmission connecting plate. The top of the transmission connecting plate is connected to the bottom of the test circuit board. The third driving device drives the transmission connecting plate to move along the bottom direction of the test circuit board.
10. The SMD product testing device according to claim 9, characterized in that: The third driving device is driven by a motor or a cylinder.