Detection device and testing device

Abstract

The utility model belongs to the technical field of circuit testing, and discloses a detection device and a testing device.The detection device comprises a supporting assembly; the conveying assembly is used for conveying a to-be-detected workpiece to move in the first direction, and the to-be-detected workpiece comprises two conductive structures; the testing mechanism comprises an on-off detector and two testing head assemblies, and the two testing head assemblies are used for being electrically connected with the two conductive structures; the positive electrode and the negative electrode of the on-off detector are electrically connected with the two test head assemblies respectively so as to detect the on-off of the two conductive structures; the translation assembly is used for driving the testing head assembly to get close to or away from the conveying assembly in the second direction; and the two communication assemblies comprise conductive parts movably connected to the supporting assembly, the two conductive parts in the two communication assemblies are electrically connected, and the two conductive parts are used for being electrically connected with the two conductive structures correspondingly. The technical problem that the test result of the test device is inaccurate due to the fact that the interior of the conductive structure of the capacitor test seat is disconnected in the prior art can be solved.

Description

Technical Field

[0001] The present application belongs to the field of circuit testing technology, and specifically relates to a detection device and a testing device. Background Art

[0002] When testing a horn capacitor, you first need to connect the horn capacitor to the capacitor test socket, ensuring that the positive and negative terminals of the horn capacitor are electrically connected to the two conductive structures on the capacitor test socket. When testing a horn capacitor, the test device is electrically connected to the two conductive structures of the capacitor test socket, and then connected to the horn capacitor through the capacitor test socket to test the horn capacitor. If the conductive structure of the capacitor test socket is disconnected, the test device will not be able to form an effective connection with the horn capacitor, resulting in inaccurate test results. Utility Model Content

[0003] The purpose of the embodiments of the present application is to provide a detection device and a test device to solve the technical problem in the prior art that the internal disconnection of the conductive structure of the capacitor test socket leads to inaccurate test results of the test device.

[0004] To achieve the above-mentioned objectives, in a first aspect, an embodiment of the present application provides a detection device, comprising: a support assembly; a conveying assembly, used to convey a workpiece to be tested to move along a first direction, the workpiece to be tested including two conductive structures; a testing mechanism, including a continuity detector and two test head assemblies, the two test head assemblies being used to be electrically connected to the two conductive structures, the positive and negative poles of the continuity detector being electrically connected to the two test head assemblies, respectively, to detect the continuity of the two conductive structures; a translation assembly, connected to the support assembly, the translation assembly being also connected to the two test head assemblies, to drive the test head assembly to approach or move away from the conveying assembly along a second direction, the second direction being set at an angle to the first direction; two connecting assemblies, the connecting assembly including a conductive member movably connected to the support assembly, the two conductive members in the two connecting assemblies being electrically connected, and the two conductive members being respectively used to be electrically connected to the two conductive structures, to conduct the two conductive structures.

[0005] In some embodiments, the connecting component further includes two first elastic members, the first elastic members are connected to the supporting component and the conductive member, and the first elastic members are used to apply elastic force to the conductive member so that the conductive member is pressed against the conductive structure.

[0006] In some embodiments, the support assembly includes two first support structures respectively connected to two first elastic members, and the two first support structures are arranged on both sides of the conveying assembly in a direction perpendicular to the first direction; the conductive member extends from the first support structure toward the conveying assembly and is inclined in the first direction; the conductive member is bent at one end close to the conveying assembly in a direction close to the first support structure, and the conductive member forms a connecting portion and a guiding portion on both sides of its bending line, and the guiding portion and the connecting portion are arranged in sequence along the first direction, and the guiding portion is used to support the workpiece to be measured and moves relative to the first support structure as the workpiece to be measured moves, so that the connecting portion is supported against the workpiece to be measured.

[0007] In some embodiments, the testing mechanism also includes a first support member; the test head assembly includes a conductive probe and a second elastic member, the conductive probe is slidably connected to the first support member along the second direction, the second elastic member is connected to the first support member and the conductive probe, and the second elastic member is used to apply an elastic force along the second direction to the conductive probe to press the conductive probe against the conductive structure.

[0008] In some embodiments, the first support member has a sliding guide structure extending along the second direction, and the sliding guide structure is used to guide the conductive probe to move along the second direction; a first limiting flange is provided on the conductive probe, and the first limiting flange is provided on the side of the first support member close to the conveying component along the second direction, and the first limiting flange is used to support the first support member to limit the displacement of the conductive probe in the second direction.

[0009] In some embodiments, a second limiting flange is further provided on the conductive probe, and the second limiting flange is provided on a side of the first support member away from the first limiting flange along the second direction. The second limiting flange is used to support the first support member to prevent the conductive probe from approaching the conveying component along the second direction; the two ends of the second elastic member along the second direction are respectively pressed against the first limiting flange and the first support member.

[0010] In some embodiments, the testing mechanism further includes a first support member and an adjustment assembly, the first support member is connected to the two test head assemblies; the adjustment assembly is connected to the translation assembly and the first support member, and the adjustment assembly is used to adjust the position of the first support member relative to the translation assembly in a direction perpendicular to the second direction.

[0011] In some embodiments, the adjustment assembly includes a second support member and a connecting member, the second support member is connected to the translation assembly; the connecting member includes a fixing portion and a guide portion, the guide portion is detachably connected to the first support member, and the fixing portion is used to press the second support member against the first support member.

[0012] In some embodiments, the second support member has a guide hole that passes through the second support member along the second direction, and the guide hole extends along an arc trajectory around the first axis, and the first axis is parallel to the second direction; the adjustment assembly includes at least two connecting members, and the guide parts of the connecting members are spaced apart in the guide hole to guide the first support member to rotate along the arc trajectory.

[0013] In some embodiments, the detection device further includes an adjusting member connected to the support assembly and the translation assembly, and the adjusting member is used to adjust the position of the translation assembly relative to the support assembly in the second direction.

[0014] In a second aspect, an embodiment of the present application further provides a testing device, comprising the detection device of any one of the first aspects, and further comprising a capacitance test socket, wherein the detection device is used to detect the on / off state of the capacitance test socket.

[0015] The beneficial effects of the detection device and test device provided by the present application are: the test head assembly and conductive part of the present application can connect the two conductive structures with the continuity detector, so that the continuity detector can detect the continuity of the two conductive structures. After screening out the disconnected conductive structure, the corresponding workpiece to be tested can be replaced with a good product. When the workpiece to be tested is used to detect products such as horn capacitors, the detection results are more accurate, and the technical problem of inaccurate test results of the test device caused by the internal disconnection of the conductive structure of the capacitor test socket can be solved. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments or descriptions of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0017] Figure 1 A schematic diagram of a testing device provided for some embodiments of the present application;

[0018] Figure 2 for Figure 1 A partial enlarged view of part A in the middle;

[0019] Figure 3 for Figure 1 Schematic diagram of the exploded state of the first support member and the adjustment assembly;

[0020] Figure 4 for Figure 1 Schematic diagram of the workpiece to be tested.

[0021] Among them, the reference numerals in the figures are:

[0022] 1000. Testing device;

[0023] 100. Detection device;

[0024] 10. Test mechanism; 11. Test head assembly; 111. Second elastic member; 112. Conductive probe; 113. First limiting flange; 114. Second limiting flange; 12. First support member; 121. Sliding guide structure; 13. Adjustment assembly; 131. Second support member; 1311. Guide hole; 132. Connector; 1321. Fixing portion; 1322. Guide portion;

[0025] 20. Connecting component; 21. Conductive member; 211. Guide portion; 212. Connecting portion; 213. Bending line; 22. First elastic member;

[0026] 30. Support assembly; 31. First support structure; 32. Second support structure;

[0027] 40. Conveying components;

[0028] 50. Translation component;

[0029] 60. Adjustment parts;

[0030] 71. First axis;

[0031] 200, workpiece to be measured; 201, conductive structure; 2011, conductive column; 2012, conductive sheet. DETAILED DESCRIPTION

[0032] In order to make the technical problems, technical solutions and beneficial effects to be solved by this application more clearly understood, this application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0033] It should be noted that when an element is referred to as being “fixed on” or “disposed on” another element, it may be directly on the other element or indirectly on the other element. When an element is referred to as being “connected to” another element, it may be directly connected to the other element or indirectly connected to the other element.

[0034] It should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on this application.

[0035] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. Throughout the description of this application, "plurality" means two or more, unless otherwise specifically defined.

[0036] An embodiment of the first aspect of the present application provides a detection device for detecting whether a workpiece is conductive. The embodiment of the present application is described using a capacitor test socket as an example. It can be understood that the workpiece can also be other items that need to be detected for conductivity.

[0037] In the first aspect, the present invention provides a detection device. Figure 1 and Figure 4 The detection device 100 includes a support assembly 30, a conveying assembly 40, a testing mechanism 10, a translation assembly 50 and two connecting assemblies 20. The conveying assembly 40 is used to convey the workpiece 200 to be tested and move along the first direction X. The workpiece 200 to be tested includes two conductive structures 201. The testing mechanism 10 includes a continuity detector and two test head assemblies 11. The two test head assemblies 11 are used to be electrically connected to the two conductive structures 201; the positive and negative poles of the continuity detector are electrically connected to the two test head assemblies 11 respectively to detect the continuity of the two conductive structures 201. The translation assembly 50 is connected to the support assembly 30; the translation assembly 50 is also connected to the two test head assemblies 11 to drive the test head assembly 11 to approach or move away from the conveying assembly 40 along the second direction Z, and the second direction Z is set at an angle to the first direction X. The two connecting components 20 correspond to the two conductive structures 201 respectively; the connecting component 20 includes a conductive part 21 movably connected to the supporting component 30, and the two conductive parts 21 in the two connecting components 20 are electrically connected. The two conductive parts 21 are respectively used to electrically connect to the two conductive structures 201 to conduct the two conductive structures 201.

[0038] The support assembly 30 is used to support the translation assembly 50 and the communication assembly 20 , that is, the translation assembly 50 and the communication assembly 20 are both connected to the support assembly 30 .

[0039] The conveying assembly 40 is used to convey the workpiece 200 to be measured to move along the first direction X. Optionally, the conveying assembly 40 is a conveying chain or a linear motor, etc. It can be understood that the first direction X refers to the direction in which the workpiece 200 to be measured moves and the reverse direction.

[0040] The workpiece 200 to be tested is fixed on the conveyor assembly 40. Multiple workpieces 200 to be tested can be placed on a single conveyor assembly 40. Optionally, the workpiece 200 to be tested and the conveyor assembly 40 are connected by a fixed connection or a detachable connection. Optionally, the workpiece 200 to be tested can be a capacitance test socket for a horn capacitor, or a socket, adapter, etc.

[0041] The conductive structure 201 is a conductor used for conducting a circuit. The two conductive structures 201 are spaced apart in the workpiece 200 to avoid direct electrical connection between the two conductive structures 201 in the workpiece 200 .

[0042] The continuity detector is used to detect the continuity of the circuit, and the continuity detector includes a power supply, and the positive and negative poles of the power supply are respectively electrically connected to the two test head assemblies 11. Optionally, the continuity detector includes a cable continuity tester or a multimeter.

[0043] The two test head assemblies 11 are arranged on one side of the conveying assembly 40 along the second direction Z. The two test head assemblies 11 both include conductors, and the two test head assemblies 11 are arranged at intervals; the two test head assemblies 11 can be respectively connected to the two conductive structures 201 to connect the conductive structures 201 with the on-off detector.

[0044] The translation assembly 50 drives the test head assembly 11 toward the conveyor assembly 40, that is, the translation assembly 50 drives the test head assembly 11 toward the workpiece 200 to be tested on the conveyor assembly 40, so that the test head assembly 11 contacts and electrically connects with the conductive structure 201 of the workpiece 200 to be tested. The translation assembly 50 drives the test head assembly 11 away from the conveyor assembly 40, that is, the translation assembly 50 drives the test head assembly 11 away from the conductive structure 201. Optionally, the translation assembly 50 includes a pneumatic cylinder, an electric push rod, etc.

[0045] The second direction Z includes the direction from the test head assembly 11 to the conveyor assembly 40 and also includes the direction from the conveyor assembly 40 to the test head assembly 11. The second direction Z is arranged at an angle to the first direction X. That is, the angle between the second direction Z and the first direction X can be 90° or other angles. Optionally, the second direction Z is aligned with the height direction of the workpiece 200 to be tested.

[0046] The conductive member 21 is a conductor, and two conductive members 21 can be electrically connected to two conductive structures 201. The conductive member 21 and the test head assembly 11 are connected to different positions of the conductive structure 201 to test the continuity of the conductive structure 201 between the conductive member 21 and the test head assembly 11.

[0047] Optionally, the conductive member 21 can be brought into contact with or out of contact with the conductive structure 201 by a device such as a cylinder, an electric push rod, or an elastic member. The cylinder or electric push rod can drive the conductive member 21 toward or away from the conductive structure 201, and the elastic member can use elastic force to bring the conductive member 21 toward the conductive structure 201. When the conveying assembly 40 drives the conductive structure 201 to move, the conductive structure 201 can squeeze the conductive member 21 and the elastic member, causing the elastic member to passively contract.

[0048] The testing process of the embodiment of the present application is as follows: the conveyor assembly 40 conveys the workpiece 200 to be tested. When the workpiece 200 to be tested moves to one side of the test head assembly 11 along the second direction Z, the conveyor assembly 40 and the workpiece 200 to be tested stop. The translation assembly 50 drives the test head assembly 11 close to the conductive structure 201, so that the two test head assemblies 11 are connected to the two conductive structures 201 respectively. The two conductive members 21 are connected to the two conductive structures 201 respectively. At this time, the two conductive structures 201 are connected to the power supply of the continuity detector through the two test head assemblies 11 and the two conductive members 21. Finally, a continuity test is performed using a continuity detector to determine whether the two conductive structures 201 are conductive. During the test, the current flows from the positive pole of the power supply in the continuity detector through the first test head assembly 11 connected to the positive pole, the first conductive structure 201 connected to the first test head assembly 11, the first conductive member 21 connected to the first conductive structure 201, the second conductive member 21 connected to the first conductive member 21, and then passes through the second conductive structure 201 connected to the second conductive member 21 and the second test head assembly 11 connected to the second conductive structure 201 to reach the negative pole of the power supply to form a loop. If the current can form a loop, it means that the two conductive structures 201 are conductive. If the current cannot form a loop, it means that at least one of the conductive structures 201 is not conductive.

[0049] After the test is completed, the translation assembly 50 is used to drive the test head assembly 11 to separate from the conductive structure 201, and the conveying assembly 40 conveys the workpiece 200 to be tested to move so that the conductive part 21 is separated from the conductive structure 201, and the subsequent workpiece 200 to be tested is conveyed to the side of the test head assembly 11 along the second direction Z for testing.

[0050] The beneficial effects of the embodiments of the present application are: through the test head assembly 11 and the conductive part 21, the two conductive structures 201 can be connected to the on-off detector, so that the on-off detector can detect the on-off of the two conductive structures 201. After screening out the disconnected conductive structure 201, the corresponding workpiece to be tested 200 can be replaced with a good product. When the workpiece to be tested is used to detect products such as horn capacitors, the detection results are more accurate, and the technical problem of inaccurate test results of the test device 1000 caused by the internal disconnection of the conductive structure 201 of the capacitor test seat can be solved.

[0051] In some embodiments, please refer to Figure 1 and Figure 2 The connecting component 20 also includes two first elastic members 22 ; the first elastic member 22 is connected to the supporting component 30 and the conductive member 21 , and the first elastic member 22 is used to apply elastic force to the conductive member 21 so that the conductive member 21 is pressed against the conductive structure 201 .

[0052] The first elastic member 22 can be a device such as a shock-absorbing support rod that can limit the movement direction of the conductive member 21, or a device such as a spring or a torsion spring that only provides elastic force. When the first elastic member 22 is a spring or a torsion spring, a guide structure is required to limit the movement direction of the conductive member 21.

[0053] It can be understood that when the conductive structure 201 on the workpiece 200 to be measured moves to the position of the conductive part 21, the elastic force exerted by the first elastic part 22 on the conductive part 21 causes the conductive part 21 to press against the conductive structure 201; when the conductive structure 201 moves out of the position of the conductive part 21, the conductive structure 201 can squeeze the conductive part 21 and the first elastic part 22, causing the first elastic part 22 to passively contract.

[0054] The beneficial effects of the embodiment of the present application are: a first elastic member 22 is provided to apply elastic force to the conductive member 21, and when the conductive structure 201 reaches the position of the conductive member 21, the conductive member 21 can automatically connect with the conductive member 21; compared with the cylinder, there is no need to actively control the first elastic member 22 to move, which reduces the control difficulty.

[0055] In some embodiments, please refer to Figure 1 and Figure 2 The support assembly 30 includes two first support structures 31 connected to two first elastic members 22, respectively. The two first support structures 31 are arranged on either side of the conveying assembly 40 in a direction perpendicular to the first direction X. The conductive member 21 extends from the first support structure 31 toward the conveying assembly 40 and is inclined in the first direction X. The end of the conductive member 21 near the conveying assembly 40 is bent toward the first support structure 31. The conductive member 21 forms a connecting portion 212 and a guiding portion 211 on either side of a bending line 213 of the conductive member 21. The guiding portion 211 and the connecting portion 212 are arranged sequentially along the first direction X. The guiding portion 211 is used to abut the workpiece 200 to be measured and moves relative to the first support structure 31 as the workpiece 200 moves, so that the connecting portion 212 abuts the workpiece 200 to be measured.

[0056] The two first supporting structures 31 are used to support the two first elastic members 22 respectively. The first supporting structures 31 are spaced apart from the conveying assembly 40 .

[0057] There are multiple directions perpendicular to the first direction X. The two first support structures 31 can be arranged on the same side of the conveying assembly 40 or on different sides of the conveying assembly 40 .

[0058] The conductive member 21 extends from the first supporting structure 31 connected thereto toward the workpiece to be measured 200, and the extension direction of the conductive member 21 is inclined toward the direction of movement of the workpiece to be measured 200, that is, the extension direction of the conductive member 21 is inclined relative to the arrangement direction of the first supporting structure 31 and the conveying assembly 40 and the first direction X.

[0059] The end of the conductive member 21 near the conveying assembly 40 is bent toward the first support structure 31, and a bend line 213 is formed at the bent position. The bend line 213 divides the conductive member 21 into a guide portion 211 and a connecting portion 212. The guide portion 211 and the connecting portion 212 are arranged in sequence along the first direction X, that is, the guide portion 211 is arranged near the first support structure 31, and the connecting portion 212 is arranged near the conveying assembly 40. The bent end of the conductive member 21 forms the connecting portion 212. The extension direction of the conductive member 21 is the extension direction of the guide portion 211, and the extension direction of the connecting portion 212 is the extension direction after the conductive member 21 is bent. Optionally, the bend line is arranged along the height direction of the conductive member 21.

[0060] The guide portion 211 and the connecting portion 212 are arranged sequentially along the first direction X. When the workpiece 200 to be measured reaches the position of the conductive member 21, the workpiece 200 to be measured first contacts the guide portion 211 and then moves along the guide portion 211 to the connecting portion 212. To increase the contact area between the connecting portion 212 and the conductive structure 201, the connecting portion 212 can be arranged in various ways depending on the installation conditions of the conductive member 21.

[0061] For example, when the conductive member 21 is slidably connected to the first support structure 31 , the connecting portion 212 may be parallel to the first direction X, so that the connecting portion 212 can be flush with the conductive structure 201 on the workpiece 200 to increase the contact area.

[0062] For example, when the conductive member 21 is rotatably connected to the first support structure 31, the connecting portion 212 can be set at an angle to the first direction X, so that after the guide portion 211 is squeezed and rotated by the workpiece 200 to be measured, the connecting portion 212 can be parallel to the first direction X, so that the connecting portion 212 can be flush with the conductive structure 201 on the workpiece 200 to be measured, thereby increasing the contact area.

[0063] It is understandable that the connection portion 212 may also have other arrangements and is not limited to the above two.

[0064] The beneficial effects of this embodiment are as follows: the conductive member 21 extends from the support assembly 30 toward the workpiece 200 to be measured, so that the conductive member 21 can contact the conductive structure 201 on the workpiece 200 to be measured, and thus can be electrically connected to the conductive structure 201; the guide portion 211 is arranged obliquely with respect to the first direction X, so that the workpiece 200 to be measured can apply a component of force perpendicular to the first direction X to the guide portion 211, so that the guide portion 211 can drive the connecting portion 212 away from the workpiece 200 to be measured, thereby reducing the influence of the conductive member 21 on the movement of the workpiece 200 to be measured; the connecting portion 212 is bent toward the support assembly 30, so that the connecting portion 212 can be flush with the conductive structure 201 when pressed against the workpiece 200 to be measured, thereby increasing the contact area between the connecting portion 212 and the conductive structure 201, and ensuring stable contact between the conductive member 21 and the conductive structure 201.

[0065] In some embodiments, please refer to Figure 1 and Figure 2 The test mechanism 10 also includes a first support member 12; the test head assembly 11 includes a conductive probe 112 and a second elastic member 111, and the conductive probe 112 is slidably connected to the first support member 12 along the second direction Z; the second elastic member 111 is connected to the first support member 12 and the conductive probe 112, and the second elastic member 111 is used to apply an elastic force along the second direction Z to the conductive probe 112 so that the conductive probe 112 is pressed against the conductive structure 201.

[0066] The first support member 12 is used to support the conductive probes 112 and the second elastic member 111 of the two test head assemblies 11 .

[0067] It can be understood that each test head assembly 11 includes a conductive probe 112 and a second elastic member 111 .

[0068] Optionally, the conductive probe 112 includes a conductor such as a conductive probe or a conductive block.

[0069] Optionally, the second elastic member 111 may include a device such as a pneumatic or hydraulic telescopic rod capable of limiting the movement of the conductive probe 112 in the second direction Z. Alternatively, it may be a device that only provides elastic force, such as a spring or an elastic rubber rod. When the second elastic member 111 is a spring, a guide structure is required to limit the movement of the conductive probe 112 in the second direction Z. The amount of expansion and contraction of the second elastic member 111 is sufficient to limit the position of the conductive probe 112 in the second direction Z.

[0070] The beneficial effects of the embodiments of the present application are as follows: the second elastic member 111 applies an elastic force along the second direction Z to the conductive probe 112, enabling the conductive probe 112 to move in the second direction Z. The conductive probe 112 can be configured to be longer in the second direction Z, enabling it to contact the conductive structure 201. Under the action of the second elastic member 111, the conductive probe 112 applies a certain amount of pressure to the conductive structure 201, further stabilizing the contact between the conductive probe 112 and the conductive structure 201. Furthermore, the movement of the conductive probe 112 in the second direction Z provides a cushioning effect, reducing the pressure generated when the conductive probe 112 collides with the conductive structure 201, thereby lowering the risk of damage to the conductive probe 112 or the conductive structure 201.

[0071] In some embodiments, please refer to Figure 1 and Figure 2 The first support member 12 has a sliding guide structure 121 extending along the second direction Z, and the sliding guide structure 121 is used to guide the conductive probe 112 to move along the second direction Z; a first limiting flange 113 is provided on the conductive probe 112, and the first limiting flange 113 is provided on the side of the first support member 12 close to the conveying component 40 along the second direction Z. The first limiting flange 113 is used to support the first support member 12 to limit the displacement of the conductive probe 112 in the second direction Z.

[0072] The sliding guide structure 121 is slidably connected to the conductive probe 112 along the second direction Z. Optionally, the sliding guide structure 121 may be a through hole or a sliding groove.

[0073] It will be appreciated that the first limiting flange 113 is used to abut against the end of the first support member 12 that is closer to the conveying assembly 40 along the second direction Z, so that at least a portion of the conductive probe 112 is positioned between the first support member 12 and the conductive structure 201. Optionally, the first limiting flange 113 is spaced apart from the end of the conductive probe 112 that is closer to the conveying assembly 40 along the second direction Z. The first limiting flange 113 may include an annular or C-shaped structure, such as a nut or a retaining spring, disposed around the conductive probe 112. The first limiting flange 113 and the conductive probe 112 may be fixedly connected or detachably connected.

[0074] The beneficial effects of the embodiment of the present application are: setting the first limiting flange 113 can limit the position of the conductive probe 112 close to one end of the conveying component 40, so that at least part of the conductive probe 112 is located between the first support member 12 and the conductive structure 201, avoiding the conductive probe 112 from completely entering the first support member 12, so that the conductive probe 112 can be in stable contact with the conductive structure 201.

[0075] In some embodiments, please refer to Figure 1 and Figure 2A second limiting flange 114 is also provided on the conductive probe 112. The second limiting flange 114 is provided on the side of the first support member 12 away from the first limiting flange 113 along the second direction Z. The second limiting flange 114 is used to abut against the first support member 12 to prevent the conductive probe 112 from approaching the conveying assembly 40 along the second direction Z; the two ends of the second elastic member 111 along the second direction Z are respectively pressed against the first limiting flange 113 and the first support member 12.

[0076] The second limiting flange 114 is used to abut against an end of the first support member 12 that is away from the conveying assembly 40 along the second direction Z, so that at least a portion of the conductive probe 112 is located on the side of the first support member 12 that is away from the conveying assembly 40 along the second direction Z. The second limiting flange 114 includes an annular or C-shaped structure, such as a nut or a retaining spring, disposed around the conductive probe 112. The second limiting flange 114 and the conductive probe 112 can be fixedly connected or detachably connected.

[0077] Optionally, the second elastic member 111 may be a spring sleeved on the conductive probe 112 , or a hydraulic telescopic rod whose two ends along the length direction are respectively connected to the first limiting flange 113 and the first support member 12 .

[0078] When the second direction Z is the same or approximately the same as the direction of gravity, the second limiting flange 114 can prevent the conductive probe 112 from falling in the sliding guide structure 121 under the action of gravity, so that the conductive probe 112 can be stably connected to the sliding guide structure 121.

[0079] The beneficial effects of the embodiment of the present application are as follows: a second limiting flange 114 is provided to cooperate with the first limiting flange 113 to limit the conductive probe 112 at both ends of the first support member 12 along the second direction Z, so that the conductive probe 112 is stably connected to the first support member 12, reducing the risk of the conductive probe 112 detaching from the first support member 12.

[0080] In some embodiments, please refer to Figure 1 and Figure 3 The testing mechanism 10 also includes a first support member 12 and an adjustment assembly 13. The first support member 12 is connected to the two test head assemblies 11; the adjustment assembly 13 is connected to the translation assembly 50 and the first support member 12. The adjustment assembly 13 is used to adjust the position of the first support member 12 relative to the translation assembly 50 in a direction perpendicular to the second direction Z.

[0081] The adjustment assembly 13 is connected to the translation assembly 50 and the first support member 12 , that is, the translation assembly 50 supports the adjustment assembly 13 , and the adjustment assembly 13 supports the first support member 12 ; the translation assembly 50 can drive the adjustment assembly 13 and the first support member 12 to move together.

[0082] The adjustment component 13 is used to adjust the position of the first support member 12 relative to the translation component 50 in a direction perpendicular to the second direction Z. That is, the adjustment component 13 can adjust the distance between the first support member 12 and the translation component 50 in a direction perpendicular to the second direction Z. Optionally, the adjustment component 13 may include an electric push rod or a lead screw nut. Alternatively, the adjustment component 13 can also adjust the rotation angle of the first support member 12 around the axis (the axis extends along the second direction Z). Optionally, the adjustment component 13 includes an angle adjuster or a stepper motor. Alternatively, the adjustment component 13 can adjust both the distance between the first support member 12 and the translation component 50 in a direction perpendicular to the second direction Z and the rotation angle of the first support member 12 around the axis (the axis extends along the second direction Z). Optionally, the adjustment component 13 includes a combination of an electric push rod and a stepper motor or a combination of an electric push rod and a angle adjuster.

[0083] The beneficial effects of the embodiments of the present application are as follows: an adjustment component 13 is provided to adjust the position of the first support member 12 relative to the translation component 50 in a direction perpendicular to the second direction Z, so that the positions of the two test head assemblies 11 in a direction perpendicular to the second direction Z can be adjusted; the two test head assemblies 11 can be aligned with the two conductive structures 201 of different models of workpieces 200 to be tested in the second direction Z, so that the two test head assemblies 11 can be in stable contact with the conductive structures 201 on different models of workpieces 200 to be tested.

[0084] In some embodiments, please refer to Figure 1 and Figure 3 The adjustment component 13 includes a second support member 131 and a connecting member 132. The second support member 131 is connected to the translation component 50. The connecting member 132 includes a fixing portion 1321 and a guide portion 1322. The guide portion 1322 is detachably connected to the first support member 12. The fixing portion 1321 is used to press the second support member 131 against the first support member 12.

[0085] The second support member 131 is fixedly connected to the translation assembly 50 . The translation assembly 50 is used to support the second support member 131 and to drive the second support member 131 to move.

[0086] The guide portion 1322 can be fixedly connected to the first support member 12 by a threaded connection or the like. Optionally, the guide portion 1322 includes a rod-shaped structure or a block-shaped structure. Optionally, the guide portion 1322 and the first support member 12 can be connected by a threaded connection or a snap-fit connection or the like.

[0087] The fixing portion 1321 can press against different positions on the second support member 131, and different positions on the second support member 131 can be pressed against the first support member 12, so that the second support member 131 is clamped between the fixing portion 1321 and the first support member 12, so that a friction force of pressure and vertical pressure is generated between the second support member 131 and the fixing portion 1321, and a friction force of pressure and vertical pressure is generated between the second support member 131 and the first support member 12, so that the second support member 131 and the first support member 12, and the second support member 131 and the fixing portion 1321 are fixed by friction. Optionally, the fixing portion 1321 includes a plate-like structure or a nut, etc.

[0088] A plurality of connecting members 132 may be provided, and the connecting members 132 may use bolts or other structures.

[0089] The beneficial effects of the embodiment of the present application are as follows: the fixing portion 1321 is used to press the second support member 131 against the first support member 12, that is, the fixing portion 1321 can be pressed against different positions on the second support member 131, and the position of the first support member 12 relative to the second support member 131 in the direction perpendicular to the second direction Z can be adjusted, and the connecting member 132 only includes the guide portion 1322 and the fixing portion 1321, and the structure is relatively simple.

[0090] In some embodiments, please refer to Figure 1 and Figure 3 The second support member 131 has a guide hole 1311 that penetrates the second support member 131 along the second direction Z. The guide hole 1311 extends along an arc trajectory around the first axis 71, and the first axis 71 is parallel to the second direction Z. The adjustment assembly 13 includes at least two connecting members 132, and the guide portions 1322 of the connecting members 132 are spaced apart in the guide hole 1311 to guide the first support member 12 to rotate along the arc trajectory.

[0091] The second support member 131 is disposed on one side of the first support member 12 along the second direction Z.

[0092] The cross-sectional profile of the guide hole 1311 perpendicular to the second direction Z is an arc with the center passing through the first axis 71. One or more guide holes 1311 may be provided.

[0093] The first axis 71 is a virtual line; when the workpiece 200 is moved directly below the two test head assemblies 11, the two conductive structures 201 on the workpiece 200 are symmetrical about the first axis 71. Optionally, the two test head assemblies 11 are symmetrical about the first axis 71 to facilitate alignment with the conductive structures 201 on the workpiece 200.

[0094] It is understood that two or more connecting members 132 may be provided. The guide portion 1322 of the connecting member 132 cooperates with the guide hole 1311, and the guide portion 1322 can move along the extension direction of the guide hole 1311, that is, the guide portion 1322 can move along an arcuate trajectory. Providing two connecting members 132 can prevent the connecting member 132 from rotating within the guide hole 1311, so that the two connecting members 132 can only move along an arcuate trajectory. The guide hole 1311 can then guide the guide portion 1322 to rotate about the first axis 71, thereby guiding the first support member 12 to rotate about the first axis 71 relative to the second support member 131.

[0095] There are multiple connecting members 132, and there can be one or more guide holes 1311.

[0096] For example, there are two connecting members 132 and one guiding hole 1311 , and the guiding portions 1322 of the two connecting members 132 are disposed in one guiding hole 1311 and are distributed in an arc shape along the extending direction of the guiding hole 1311 .

[0097] For example, there are two connecting members 132 and two guiding holes 1311 , and the guiding portions 1322 of the two connecting members 132 are respectively disposed in the two guiding holes 1311 .

[0098] For example, there are three connecting members 132 and two guide holes 1311 . The guide portions 1322 of the two connecting members 132 are arranged in one guide hole 1311 , and the guide portion 1322 of the other connecting member 132 is arranged in the other guide hole 1311 .

[0099] The beneficial effects of the embodiments of the present application are as follows: the guide hole 1311 is provided to guide the guide portions 1322 of two or more connecting members 132 to rotate around the first axis 71, so that the first support member 12 and the test head assembly 11 rotate around the first axis 71; the two conductive structures 201 on the workpiece to be measured 200 are symmetrical about the center of the first axis 71, which facilitates the rotation of the two test head assemblies 11 to a position aligned with the two conductive structures 201.

[0100] In some embodiments, please refer to Figure 1 The detection device 100 further includes an adjusting member 60 , which is connected to the support assembly 30 and the translation assembly 50 , and is used to adjust the position of the translation assembly 50 relative to the support assembly 30 in the second direction Z.

[0101] The support assembly 30 further includes a second support structure 32, and the second support structure 32 is used to support the adjustment member 60. Optionally, the second support structure 32 includes a shaft, a tube or a plate-like structure.

[0102] The adjusting member 60 is used to support the translation assembly 50 and is fixedly connected to the translation assembly 50. The adjusting member 60 can directly adjust the position of the translation assembly 50 in the second direction Z. The adjusting member 60 can also indirectly adjust the position of the translation assembly 50 by adjusting its own position on the second support structure 32 along the second direction Z. Optionally, the adjusting member 60 includes a structure such as an optical axis support seat or a lead screw nut.

[0103] The beneficial effects of the embodiment of the present application are as follows: by adjusting the position of the translation assembly 50 relative to the support assembly 30 in the second direction Z through the adjustment member 60, the distance between the translation assembly 50 and the conveying assembly 40 can be adjusted, and then the distance between the test head assembly 11 and the conductive structure 201 on the workpiece 200 to be tested is adjusted when the translation assembly 50 drives the test head assembly 11 to approach the workpiece 200 to be tested, so that the test head assembly 11 can stably contact the conductive structure 201.

[0104] In some embodiments, please refer to Figures 1 to 4 The detection device 100 includes a support assembly 30, a conveying assembly 40, a testing mechanism 10, a translation assembly 50, two connecting assemblies 20, and an adjusting member 60. The conveying assembly 40 is used to convey a workpiece 200 to be tested to move along a first direction X. The workpiece 200 to be tested includes two conductive structures 201.

[0105] The testing mechanism 10 includes a first support member 12, a continuity detector, two test head assemblies 11, and an adjustment assembly 13. The two test head assemblies 11 are located on one side of the conveyor assembly 40 along a second direction Z, which is perpendicular to the first direction X. The test head assembly 11 includes a conductive probe 112 and a second elastic member 111. The conductive probe 112 is slidably connected to the first support member 12 along the second direction Z. The second elastic member 111 is used to apply an elastic force along the second direction Z to the conductive probe 112, pressing the conductive probe 112 against the conductive structure 201. The positive and negative electrodes of the continuity detector are electrically connected to the two conductive probes 112, respectively, to detect the continuity of the two conductive structures 201.

[0106] The first support member 12 has a sliding guide structure 121 extending along the second direction Z. The sliding guide structure 121 includes two through-holes that are slidably connected to the two conductive probes 112. The sliding guide structure 121 is used to guide the conductive probes 112 to move along the second direction Z. The conductive probes 112 are provided with a first limiting flange 113 and a second limiting flange 114. The first limiting flange 113 is disposed on a side of the first support member 12 that is closer to the conveying assembly 40 along the second direction Z. The first limiting flange 113 is used to abut the first support member 12 to prevent the conductive probes 112 from moving away from the conveying assembly 40 along the second direction Z. The second limiting flange 114 is arranged on the side of the first support member 12 away from the first limiting flange 113 along the second direction Z. The second limiting flange 114 is used to press against the first support member 12 to prevent the conductive probe 112 from approaching the conveying assembly 40 along the second direction Z; the second elastic member 111 is a spring sleeved on the conductive probe 112, and the two ends of the second elastic member 111 along the second direction Z are respectively pressed against the first limiting flange 113 and the first support member 12.

[0107] The translation assembly 50 is connected to the support assembly 30 ; the translation assembly 50 is also connected to the two test head assemblies 11 to drive the test head assemblies 11 to move closer to or away from the conveying assembly 40 along the second direction Z. The translation assembly 50 includes a cylinder.

[0108] The adjustment assembly 13 is connected to the translation assembly 50 and the first support member 12. The adjustment assembly 13 is used to adjust the position of the first support member 12 relative to the translation assembly 50 in a direction perpendicular to the second direction Z. The adjustment assembly 13 includes a second support member 131 and a connecting member 132. The second support member 131 is disposed on one side of the first support member 12 along the first direction X and is fixedly connected to the translation assembly 50. The connecting member 132 includes a fixing portion 1321 and a guide portion 1322. The guide portion 1322 is detachably connected to the first support member 12 via threads. The fixing portion 1321 is used to press the second support member 131 against the first support member 12.

[0109] The second support member 131 has a guide hole 1311 that passes through the second support member 131 along the second direction Z. The guide hole 1311 extends along an arc trajectory around the first axis 71. The first axis 71 is parallel to the second direction Z, and the first axis 71 passes through the center of the arc trajectory. The adjustment assembly 13 includes two connecting members 132. The guide portions 1322 of the connecting members 132 are spaced apart in the guide hole 1311 to guide the first support member 12 to rotate along the arc trajectory.

[0110] The two connecting components 20 correspond to the two conductive structures 201 respectively; the connecting component 20 includes a conductive part 21 movably connected to the supporting component 30, and the two conductive parts 21 in the two connecting components 20 are electrically connected. The two conductive parts 21 are respectively used to electrically connect to the two conductive structures 201 to conduct the two conductive structures 201.

[0111] The support assembly 30 includes two first support structures 31 connected to two first elastic members 22. The two first support structures 31 are respectively provided on either side of the conveying assembly 40 along the third direction Y, which is perpendicular to the first direction X and the second direction Z. The connecting assembly 20 also includes two first elastic members 22; the first elastic members 22 are connected to the support assembly 30 and the conductive member 21, and are used to apply elastic force to the conductive member 21, thereby pressing the conductive member 21 against the conductive structure 201.

[0112] The conductive member 21 extends from the first support structure 31 toward the conveying assembly 40 and is inclined in the first direction X. One end of the conductive member 21 close to the conveying assembly 40 is bent toward the first support structure 31. The conductive member 21 forms a connecting portion 212 and a guide portion 1322 on both sides of the bending line. The guide portion 1322 and the connecting portion 212 are arranged sequentially along the first direction X. The guide portion 1322 is used to support the workpiece 200 to be measured and moves relative to the first support structure 31 as the workpiece 200 to be measured moves, so that the connecting portion 212 is supported against the workpiece 200 to be measured.

[0113] The adjusting member 60 is fixedly connected to the supporting assembly 30 and the translation assembly 50 . The adjusting member 60 is used to adjust the position of the translation assembly 50 in the second direction Z relative to the supporting assembly 30 .

[0114] In the second aspect, the present application also provides a testing device, please refer to Figure 1 and Figure 4 The testing device 1000 includes the detection device 100 of any one of the embodiments of the first aspect, and also includes a capacitance test socket, and the detection device 100 is used to detect the on / off state of the capacitance test socket.

[0115] The capacitance test socket is a type of workpiece 200 to be tested. The capacitance test socket includes two spaced apart conductive structures 201. Each conductive structure 201 includes a conductive sheet 2012 and a conductive post 2011. The conductive sheet 2012 and the conductive post 2011 are electrically connected. The conductive posts 2011 of the two conductive structures 201 are respectively disposed at opposite ends of the capacitance test socket along a third direction Y. The conductive posts 2011 extend along the third direction Y, which is arranged at an angle to the first direction X. Optionally, the third direction Y is perpendicular to the second direction Z and the first direction X.

[0116] The test head assembly 11 of the detection device 100 is used to electrically connect to the conductive sheet 2012 , and the conductive member 21 is used to electrically connect to the conductive column 2011 . The two conductive members 21 are respectively provided on both sides of the conveying assembly 40 along the third direction Y.

[0117] The beneficial effects of the embodiments of the present application are: the testing device 1000 uses the above-mentioned detection device 100 to detect the continuity of the two conductive structures 201 of the capacitor test socket, and after screening out the disconnected conductive structure 201, the corresponding capacitor test socket can be replaced with a good product. When the capacitor test socket is used to detect the horn capacitor, the detection result is more accurate, and the technical problem of inaccurate test results of the testing device 1000 caused by the internal disconnection of the conductive structure 201 of the capacitor test socket can be solved.

[0118] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present application should be included in the scope of protection of the present application.

Claims

1. A detection device, characterized in that: include: Support components; A conveying assembly, configured to convey a workpiece to be measured to move along a first direction, wherein the workpiece to be measured includes two conductive structures; A testing mechanism comprising a continuity detector and two test head assemblies, wherein the two test head assemblies are electrically connected to the two conductive structures, and the positive and negative electrodes of the continuity detector are electrically connected to the two test head assemblies respectively to detect the continuity of the two conductive structures; a translation assembly connected to the support assembly, the translation assembly further connected to the two test head assemblies to drive the test head assemblies toward or away from the conveying assembly along a second direction, the second direction being arranged at an angle to the first direction; Two connecting components, each of which includes a conductive member movably connected to the supporting component, wherein the two conductive members in the two connecting components are electrically connected, and the two conductive members are respectively used to electrically connect to the two conductive structures to conduct the two conductive structures.

2. The detection device according to claim 1, wherein The connecting component further includes two first elastic members, which are connected to the supporting component and the conductive member. The first elastic members are used to apply elastic force to the conductive member so that the conductive member is pressed against the conductive structure.

3. The detection device according to claim 2, wherein: The support assembly includes two first support structures respectively connected to the two first elastic members, and the two first support structures are arranged on opposite sides of the conveying assembly along a direction perpendicular to the first direction; The conductive member extends from the first supporting structure toward the conveying assembly and is inclined in the first direction; one end of the conductive member close to the conveying assembly is bent toward the first supporting structure, and the conductive member forms a connecting portion and a guiding portion on both sides of its bending line. The guiding portion and the connecting portion are sequentially arranged along the first direction, and the guiding portion is used to support the workpiece to be measured and moves relative to the first supporting structure as the workpiece to be measured moves, so that the connecting portion is supported against the workpiece to be measured.

4. The detection device according to claim 1, wherein The testing mechanism further includes a first support member; The test head assembly includes a conductive probe and a second elastic member. The conductive probe is slidably connected to the first support member along the second direction. The second elastic member is connected to the first support member and the conductive probe. The second elastic member is used to apply an elastic force along the second direction to the conductive probe to press the conductive probe against the conductive structure.

5. The detection device according to claim 4, characterized in that The first support member has a sliding guide structure extending along the second direction, and the sliding guide structure is used to guide the conductive probe to move along the second direction; The conductive probe is provided with a first limiting flange, which is arranged on a side of the first support member close to the conveying assembly along the second direction. The first limiting flange is used to abut the first support member to limit the displacement of the conductive probe in the second direction.

6. The detection device according to claim 5, characterized in that The conductive probe is further provided with a second limiting flange, which is provided on a side of the first support member away from the first limiting flange along the second direction, and is used to abut against the first support member to prevent the conductive probe from approaching the conveying assembly along the second direction; Two ends of the second elastic member along the second direction are respectively pressed against the first limiting flange and the first supporting member.

7. The detection device according to claim 1, wherein: The testing mechanism also includes a first support member and an adjustment assembly, the first support member is connected to the two test head assemblies; the adjustment assembly is connected to the translation assembly and the first support member, and the adjustment assembly is used to adjust the position of the first support member relative to the translation assembly in a direction perpendicular to the second direction.

8. The detection device according to claim 7, characterized in that The adjustment assembly includes a second support member and a connecting member, the second support member is connected to the translation assembly; the connecting member includes a fixing portion and a guide portion, the guide portion is detachably connected to the first support member, and the fixing portion is used to press the second support member against the first support member.

9. The detection device according to claim 8, characterized in that The second support member has a guide hole extending through the second support member along the second direction, the guide hole extending along an arc track around a first axis, and the first axis is parallel to the second direction; The adjustment assembly includes at least two connecting members, and the guide portions of the connecting members are spaced apart in the guide holes to guide the first supporting member to rotate along the arc track.

10. The detection device according to any one of claims 1 to 9, characterized in that: The detection device further includes an adjusting member connected to the support assembly and the translation assembly, and the adjusting member is used to adjust the position of the translation assembly relative to the support assembly in the second direction.

11. A testing device, characterized in that: The detection device comprises the detection device according to any one of claims 1 to 10, further comprising a capacitance test socket, wherein the detection device is used to detect the on / off state of the capacitance test socket.

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