Probe driving device and testing device
Through the swing structure and power structure in the probe drive device, the synchronous movement of multiple probes is achieved, solving the problems of high control difficulty and poor synchronization in the capacitance test of bull horns, and reducing costs.
Patent Information
- Application Number
- CN202422413689.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-30
- Publication Date
- 2025-08-19
- Estimated Expiration
- 2034-09-30
AI Technical Summary
During the test of the horn capacitance, multiple cylinders need to be set up to drive the test probes separately, which is difficult to control and poor synchronization.
The probe drive device is adopted, including a frame, a swing structure, a power structure and a probe support assembly. The swing member is driven to drive the swing member to slide through a power structure, and the synchronous movement of multiple probes is achieved by using the cooperation of the drive arm assembly and the probe support assembly.
It reduces the number of power devices used, reduces the cost, and improves the synchronization control effect of the probe, solving the problems of high control difficulty and poor synchronization.
Smart Images
Figure CN223244671U_ABST
Abstract
Description
Technical Field
[0001] The present application belongs to the field of capacitance testing technology, and specifically relates to a probe driving device and a testing device. Background Art
[0002] During the horn capacitor test, the test probe must be driven toward the capacitor test socket, contacting and electrically connecting the probe with the conductive posts on the socket. The test device then tests the horn capacitor on the socket. After the test, the probe must be driven away from the posts. Because multiple test probes are arranged in a continuous pattern, multiple cylinders are required to drive each section of the test probes. This large number of cylinders makes control more difficult and synchronization is poor. Utility Model Content
[0003] The purpose of the embodiments of the present application is to provide a probe driving device and a testing device to solve the technical problems in the prior art that, during the horn capacitance testing process, multiple cylinder drives need to be set up to drive a section of the test probe respectively, which results in high control difficulty and poor synchronization.
[0004] To achieve the above-mentioned objectives, in a first aspect, an embodiment of the present application provides a probe driving device, comprising: a frame; a swinging structure, the swinging structure comprising a swinging member, a driving arm assembly and a probe supporting assembly; the swinging member is arranged on the frame to rotate around a first axis; the probe supporting assembly comprises at least two probe supporting members slidably connected to the frame; the driving arm assembly comprises a driving arm corresponding to the probe supporting members one by one; one end of the driving arm along its length direction is connected to the swinging member to rotate around a second axis, and the other end of the driving arm is connected to the probe supporting member to rotate around a third axis, so that when the swinging member swings around the first axis, the driving arm drives the probe supporting member to slide relative to the frame; the first axis, the second axis and the third axis are parallel; a power structure, arranged on the frame, the power structure is connected to the swinging member, and is used to drive the swinging member to swing back and forth.
[0005] In some embodiments, the swing structure includes at least one driving arm assembly and at least one probe support assembly; the probe support assembly includes two probe supports with the same sliding direction, and the two probe supports are arranged relative to each other along the sliding direction; the two driving arms in the driving arm assembly are arranged on both sides of a virtual line, the virtual line is parallel to the sliding direction of the probe support assembly and passes through the first axis, and the driving arm assembly is used to drive the two probe supports in the same probe support assembly to move closer to or away from each other.
[0006] In some embodiments, the second axes around which the two driving arms in the driving arm assembly rotate are symmetrical about the center of the first axis, and the two driving arms are symmetrical about a virtual line.
[0007] In some embodiments, there are at least two driving arm assemblies, and the number of probe support assemblies is at least two, and they are respectively connected to each driving arm assembly. The two probe support assemblies have the same sliding direction and are arranged opposite to each other along the sliding direction.
[0008] In some embodiments, the probe driving device includes a transmission arm and at least two swinging structures; the power structure is connected to any one of the multiple swinging members, and the transmission arm is rotatably connected to the swinging members of the two swinging structures at both ends along its length direction, and the rotation axis of the transmission arm is parallel to the first axis, so that the two swinging members connected to the transmission arm swing simultaneously.
[0009] In some embodiments, the swing member includes a star wheel, the star wheel includes gear teeth arranged around the first axis, and the drive arm is rotationally connected to the gear teeth; the number of the gear teeth is equal to the number of drive arms in one drive arm assembly.
[0010] In some embodiments, the power structure includes a swing arm and a driving member, one end of the swing arm is fixedly connected to the swing member and the other end extends away from the first axis; the driving member is used to drive the swing arm to swing around the first axis so that the swing member rotates synchronously around the first axis.
[0011] In some embodiments, the driving member includes a telescopic drive; one end of the telescopic drive along the telescopic direction is rotatable around a fourth axis and is arranged on the frame, and the other end of the telescopic drive is rotatably connected to the swing arm around a fifth axis; the fourth axis and the fifth axis are parallel to the first axis; or, one end of the telescopic drive along the telescopic direction is rotatable around the fourth axis and is arranged on the frame, and the other end of the telescopic drive is slidably connected to the swing arm along the length direction of the swing arm.
[0012] In some embodiments, the probe driving device also includes a buffer assembly arranged on at least one side of the swing direction of the swing arm; the buffer assembly includes an elastic telescopic part; the elastic telescopic part is fixed on the frame at one end away from the swing arm along its telescopic direction, and the other end of the elastic telescopic part is arranged opposite to the swing arm to press against the swing arm.
[0013] In some embodiments, the buffer assembly further includes a buffer head, which is connected to an end of the elastic telescopic member close to the swing arm, and the buffer head is used to press the swing arm.
[0014] In the second aspect, the embodiments of the present application also provide a testing device, including the probe driving device of any one of the embodiments of the first aspect, and also including a capacitor test seat and a test probe; the capacitor test seat is used to fix the capacitor and is electrically connected to the capacitor; the test probe is arranged on the probe support; the probe driving device is used to drive the test probe to contact or disengage with the capacitor test seat, so that the test probe and the capacitor are connected or disconnected.
[0015] The beneficial effects of the probe driving device and testing device provided by the present application are as follows: the power structure provided by the present application can drive the swinging member to swing, and when the swinging member swings, it can drive multiple probe support members to slide through multiple driving arms. Multiple probes can be set on a probe support member, and multiple sections of test probes can be driven by a power structure. Compared with multiple cylinder drives driving each section of test probe, the present application can use fewer power devices to drive multiple sections of test probes, and the cost is lower. The present application can solve the technical problems existing in the prior art in that during the horn capacitance test process, multiple cylinder drives need to be set to drive each section of test probe, which results in high control difficulty and poor synchronization. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments or descriptions of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.
[0017] Figure 1 A schematic diagram of a testing device provided in some embodiments of the present application;
[0018] Figure 2 Schematic diagram of a probe driving device provided in some embodiments of the present application Figure 1 ;
[0019] Figure 3 for Figure 2 A partial enlarged view of part B in the middle;
[0020] Figure 4 Schematic diagram of a probe driving device provided in some embodiments of the present application Figure 2 ;
[0021] Figure 5 for Figure 1 A partial enlarged view of part A in the middle.
[0022] Among them, the reference numerals in the figures are:
[0023] 1000. Test device
[0024] 100. Probe driving device;
[0025] 10. Swinging structure; 11. Swinging member; 111. Gear teeth; 12. Driving arm assembly; 121. Driving arm; 13. Probe support assembly; 131. Probe support member;
[0026] 20. Power structure; 21. Swing arm; 22. Driving member;
[0027] 30. Buffer assembly; 31. Elastic expansion member; 32. Buffer head;
[0028] 40. Transmission arm;
[0029] 50. Rack;
[0030] 61. First axis; 62. Second axis; 63. Third axis; 64. Fourth axis; 65. Fifth axis; 66. Virtual line;
[0031] 200, capacitance test socket;
[0032] 300. Test probe. DETAILED DESCRIPTION
[0033] In order to make the technical problems, technical solutions and beneficial effects to be solved by this application more clearly understood, this application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.
[0034] It should be noted that when an element is referred to as being “fixed on” or “disposed on” another element, it may be directly on the other element or indirectly on the other element. When an element is referred to as being “connected to” another element, it may be directly connected to the other element or indirectly connected to the other element.
[0035] It should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on this application.
[0036] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. Throughout the description of this application, "plurality" means two or more, unless otherwise specifically defined.
[0037] A first aspect of an embodiment of the present application provides a probe driving device for driving a probe to move. The embodiment of the present application is described by taking the probe used for testing the horn capacitor as an example. It can be understood that the probe driving device can also drive other probes.
[0038] In the first aspect, the present invention provides a probe driving device. Figures 2 to 4 The probe drive device 100 includes a frame 50, a swing structure 10, and a power structure 20. The swing structure 10 includes a swing member 11, a drive arm assembly 12, and a probe support assembly 13. The swing member 11 is rotatably mounted on the frame 50 about a first axis 61. The probe support assembly 13 includes at least two probe supports 131 slidably connected to the frame 50. The drive arm assembly 12 includes a drive arm 121 corresponding to each probe support 131.
[0039] One end of the driving arm 121 is rotatably connected to the swing member 11 about the second axis 62. The other end of the driving arm 121 is rotatably connected to the probe support 131 about the third axis 63. This allows the driving arm 121 to drive the probe support 131 to slide relative to the frame 50 as the swing member 11 swings about the first axis 61. The first axis 61, the second axis 62, and the third axis 63 are parallel. A power structure 20 is mounted on the frame 50 and connected to the swing member 11 to drive the swing member 11 to swing back and forth.
[0040] It can be understood that the frame 50 is used to support the swing structure 10 and the power structure 20 .
[0041] The power structure 20 is used to drive the swing member 11 to swing back and forth, that is, the power structure 20 can drive the swing member 11 to rotate clockwise around the first axis 61, and can also drive the swing member 11 to rotate counterclockwise. Optionally, the power structure 20 can be a crank rocker mechanism, a double crank mechanism, a stepper motor, or a cylinder.
[0042] When the swing member 11 rotates about the first axis 61, it drives the drive arm 121 connected thereto to move, causing the drive arm 121 to slide the probe support 131 connected thereto. Adjusting the swing angle of the swing member 11 changes the movement distance of the drive arm 121, thereby changing the sliding stroke of the probe support 131. Optionally, the swing member 11 includes a plate-like structure or a rod-like structure.
[0043] The probe support 131 is used to carry the test probe 300. One test probe 300 can be set on the probe support 131, or multiple test probes 300 can be set, so that the multiple test probes 300 move together with the probe support 131. The sliding direction of the probe support 131 is set according to the preset moving direction of the test probe 300, so that the test probe 300 is close to or away from the capacitor test seat 200. Optionally, the probe support 131 is a slider, and the frame 50 is provided with a slide groove, slide rail and other structures that are compatible with the slider. Optionally, the sliding direction of the probe support 131 is perpendicular to the distribution direction of the capacitor test seat 200 and perpendicular to the first axis 61.
[0044] The number of driving arms 121 is equal to the number of probe supports 131, with one driving arm 121 driving one probe support 131. The length of each driving arm 121 is determined based on the sliding direction of the probe support 131, and the length of each driving arm 121 is determined based on the distance between the probe support 131 to which it is connected and the swing member 11. When the driving arms 121 intersect, the intersecting driving arms 121 may be spaced apart along the direction of the first axis 61. Alternatively, the driving arms 121 may be rod-shaped, elongated, or other structures.
[0045] According to the distribution of the test probes 300 , the probe support assembly 13 and the drive arm assembly 12 can have various arrangements.
[0046] For examples, please refer to Figure 4 When a conductive column is set on one side of the capacitor test seat 200, the test probe 300 is only set on one side of the capacitor test seat 200 and is opposite to the conductive column. In this case, the probe support assembly 13 includes at least two probe supports 131, and each probe support 131 is respectively opposite to the capacitor test seat 200 at a different position. The probe support assembly 13 may include two, three or more probe supports 131, and the probe supports 131 are arranged in sequence along the distribution direction of the capacitor test seat 200; the probe supports 131 in the probe support assembly 13 are arranged along different sliding directions; or, the swing member 11 is arranged between the two probe supports 131. The driving arm assembly 12 includes all driving arms 121 connected to one swing member 11, and each driving arm 121 can respectively drive each probe support 131 to move along a different sliding direction.
[0047] For examples, please refer to Figure 2 and Figure 3 When conductive pillars are provided on both sides of the capacitor test seat 200, the test probes 300 are respectively provided on both sides of the capacitor test seat 200 and are provided opposite to the conductive pillars. In this case, a probe support assembly 13 includes two probe supports 131, and each probe support 131 of the same probe support assembly 13 is opposite to the capacitor test seat 200 at the same position to drive the test probes 300 provided on both sides of the capacitor test seat 200. The two probe supports 131 are both provided on one side of the swing member 11 along the sliding direction of the probe support 131. A driving arm assembly 12 includes two driving arms 121, and the two driving arms 121 respectively drive the two opposite probe supports 131 to move away from or towards each other, so that the two probe supports 131 drive the opposite test probes 300 to simultaneously approach or move away from the same capacitor test seat 200; at this time, one or more probe support assemblies 13 may be included, and one or more driving arm assemblies 12 may be included accordingly.
[0048] It is understandable that the probe support assembly 13 and the drive arm assembly 12 may also have other arrangements and are not limited to the above two.
[0049] The beneficial effects of the embodiments of the present application are as follows: the power structure 20 provided can drive the swinging member 11 to swing, and when the swinging member 11 swings, it can drive the multiple probe supports 131 to slide through the multiple drive arms 121. Multiple test probes 300 can be provided on one probe support 131, and multiple sections of test probes 300 can be driven by one power structure 20. Compared with multiple cylinders driving each section of the test probe 300, the present application can use fewer power devices to drive the multiple sections of the test probe 300, which is lower in cost. The probe drive device 100 can solve the technical problems existing in the prior art in that, during the horn capacitance test process, multiple cylinders need to be provided to drive each section of the test probe 300, which results in high control difficulty and poor synchronization.
[0050] In some embodiments, please refer to Figure 2 and Figure 3 The swing structure 10 includes at least one driving arm assembly 12 and at least one probe support assembly 13. The probe support assembly 13 includes two probe supports 131 that slide in the same direction and are spaced relative to each other along the sliding direction. The two driving arms 121 in the driving arm assembly 12 are positioned on either side of a virtual line 66 that is parallel to the sliding direction of the probe support assembly 13 and passes through the first axis 61. The driving arm assembly 12 is used to drive the two probe supports 131 in the same probe support assembly 13 toward or away from each other.
[0051] The number of the driving arm assembly 12 and the number of the probe support assembly 13 can be one or more. The number of the driving arm assembly 12 and the number of the probe support assembly 13 are equal.
[0052] The two probe support members 131 in the probe support assembly 13 are disposed on the same side of the swing member 11 along the sliding direction of the probe support assembly 13. The two probe support members 131 in the same probe support assembly 13 are also located on either side of the capacitance test socket 200 at the same location. That is, the two probe support members 131 in the same probe support assembly 13 correspond to the capacitance test socket 200 at the same location. The two probe support members 131 slide in the same direction, that is, the movement directions of the two probe support members 131 are parallel.
[0053] It can be understood that one driving arm assembly 12 includes two driving arms 121 , and the two driving arms 121 respectively drive two probe support members 131 in one probe support assembly 13 .
[0054] A virtual line 66 is defined with respect to each driving arm assembly 12 and the probe support assembly 13 connected to the driving arm assembly 12 , and the virtual line 66 is located between the two driving arms 121 in the driving arm assembly 12 .
[0055] The driving arm assembly 12 of the embodiment of the present application can drive the corresponding two probe supports 131 to drive the relative test probes 300 to simultaneously approach or move away from the capacitor test seat 200 at the same position. Because the two probe supports 131 are located on opposite sides of the capacitor test seat 200 at the same position, the movement directions of the two probe supports 131 are opposite at this time, and the capacitor test seat 200 can be connected to or disconnected from the test probes 300 on both sides at the same time, which is suitable for the situation where the test probes 300 are respectively arranged on both sides of the capacitor test seat 200.
[0056] The beneficial effects of the embodiment of the present application are: multiple probe support assemblies 13 and drive arm assemblies 12 can be set, which can drive multiple test probes 300 located on both sides of the capacitor test seat 200 to move synchronously. Compared with setting cylinders to drive the test probes 300 on both sides of the capacitor test seat 200, the embodiment of the present application sets a power structure 20 on one side of the capacitor test seat 200 to improve the synchronous control effect.
[0057] In some embodiments, please refer to Figure 2 and Figure 3 The second axis 62 around which the two driving arms 121 in the same driving arm assembly 12 are rotated is symmetrical about the center of the first axis 61 , and the two driving arms 121 are symmetrical about the virtual line 66 .
[0058] It can be understood that the second axis 62 around which the driving arm 121 in a driving arm assembly 12 rotates forms an angle of 180° with respect to the first axis 61 .
[0059] The beneficial effects of the embodiment of the present application are: the second axis 62 around which the driving arm 121 in a driving arm assembly 12 is arranged symmetrically with respect to the first axis 61, so that the trajectories of one end of the two driving arms 121 moving with the swing member 11 are symmetrical with respect to the center, so that the two symmetrical driving arms 121 can drive the two probe supports 131 to move the same distance, and the two probe supports 131 can be symmetrically arranged with respect to the capacitor test seat 200, which is convenient for design and installation.
[0060] In some embodiments, please refer to Figure 2 and Figure 3 There are at least two driving arm assemblies 12, and the number of probe support assemblies 13 is at least two, and they are respectively connected to each driving arm assembly 12. The sliding directions of the two probe support assemblies 13 are the same and are arranged oppositely along the sliding direction.
[0061] It can be understood that a driving arm assembly 12 is connected to a probe support assembly 13 .
[0062] The two probe support assemblies 13 having the same sliding direction and being arranged opposite to each other along the sliding direction are respectively arranged on both sides of the swinging member 11 along the sliding direction of the probe support assembly 13. The four probe support members 131 in the two probe support assemblies 13 move in two directions at the same time, that is, the movement directions of two of the probe support members 131 are the same, and the movement directions of the other two probe support members 131 are the same. Then, the two groups of second axes 62 around which the driving arms 121 in the two driving arm assemblies 12 connected to the two probe support assemblies 13 rotate can coincide; a group of second axes 62 is the two second axes 62 around which the two driving arms 121 in a driving arm assembly 12 rotate.
[0063] When there are three drive arm assemblies 12, two of them may share a set of second axes 62, while the other drive arm assembly 12 does not share the second axes 62 with the other drive arm assemblies 12. When there are four drive arm assemblies 12, two of them may share a set of second axes 62, while the other two drive arms 121 may share another set of second axes 62.
[0064] The beneficial effects of the embodiment of the present application are as follows: the two probe support assemblies 13 have the same sliding direction and are arranged relative to each other along the sliding direction, so the two driving arm assemblies 12 connected to the two probe support assemblies 13 can share a set of second axes 62, and the two driving arms 121 can be installed at the same position on the swinging member 11, thereby reducing the volume of the swinging member 11 and improving space utilization.
[0065] In some embodiments, please refer to Figures 2 to 4 The probe driving device 100 includes a transmission arm 40 and at least two swinging structures 10; the power structure 20 is connected to any one of the multiple swinging members 11, and the transmission arm 40 is rotatably connected to the swinging members 11 of the two swinging structures 10 at both ends along its length direction. The rotation axis of the transmission arm 40 is parallel to the first axis 61, so that the two swinging members 11 connected to the transmission arm 40 swing simultaneously.
[0066] It can be understood that two or more swing structures 10 can be provided.
[0067] It is understood that the power structure 20 only drives one of the swing members 11. The ends of the transmission arm 40 are rotatably connected to the two swing members 11. Rotation of one of the swing members 11 can drive the transmission arm 40, which in turn drives the rotation of the other swing member 11. The two rotation axes about which the transmission arm 40 rotates can coincide with the second axes of the two swing members 11.
[0068] The swing member 11 connected to the power structure 20 is defined as the main swing member 11, and the other swing members 11 are defined as auxiliary swing members 11. The auxiliary swing members 11 can be connected to the main swing member 11 through a transmission arm 40, and the auxiliary swing members 11 can also be connected and transmitted to each other through the transmission arm 40. Optionally, the transmission arm 40 can be a rod-shaped structure, a long plate structure, or other structures.
[0069] The beneficial effects of the embodiments of the present application are as follows: the power structure 20 drives the secondary oscillating member 11 to swing through the main oscillating member 11 and the transmission arm 40, and a single secondary oscillating member 11 can drive multiple probe supports 131 to slide. The transmission arm 40 allows the secondary oscillating member 11 to be positioned a certain distance from the main oscillating member 11, and the secondary oscillating member 11 and the main oscillating member 11 can each drive probe supports 131 in different areas. Therefore, the power structure 20 can drive more probe supports 131 in different areas to slide, further reducing costs.
[0070] In some embodiments, please refer to Figures 2 to 4 The swing member 11 includes a star wheel, which includes gear teeth 111 arranged around the first axis 61, and the driving arm 121 is rotatably connected to the gear teeth 111; the number of gear teeth 111 is equal to the number of driving arms 121 in one driving arm assembly 12.
[0071] The star wheel includes a main body with the first axis 61 as the center line, and the main body is used to be connected to the frame for rotation; one end of the gear tooth 111 is connected to the edge of the main body, and the other end extends outward from the main body in a direction perpendicular to the first axis 61. The gear tooth 111 is used to install the drive arm 121.
[0072] It can be understood that the star wheel is connected to the frame 50 by rotating around the first axis 61, the driving arm 121 is connected to the gear teeth 111 by rotating around the second axis 62, and one driving arm 121 is connected to one gear tooth 111. When a conductive column is provided on one side of the capacitance test socket 200, the test probe 300 is only provided on one side of the capacitance test socket 200 and is arranged opposite to the conductive column, and the number of gear teeth 111 and the driving arm 121 can be two or more. When conductive columns are provided on both opposite sides of the capacitance test socket 200, the test probe 300 is respectively provided on both sides of the capacitance test socket 200 and is arranged opposite to the conductive column, only one driving arm assembly 12 is provided, and the driving arm assembly 12 includes two driving arms 121, and two gear teeth 111 are provided.
[0073] The beneficial effects of the embodiments of the present application are as follows: there are gaps between the teeth 111 of the star wheel, which can reduce the material used to make the swinging part 11; the driving arm 121 is installed on the teeth 111 of the star wheel, and the number of teeth 111 is set to be consistent with the driving arm 121, which can minimize the number of teeth 111 and further reduce the material used to make the swinging part 11.
[0074] For other embodiments, please refer to Figures 2 to 4 The swinging member 11 includes a star wheel, which includes gear teeth 111 arranged around the first axis 61, and the driving arm 121 is rotatably connected to the gear teeth 111. A plurality of driving arm assemblies 12 are provided, and each driving arm assembly 12 includes two driving arms 121. The number of gear teeth 111 of the star wheel is less than or equal to the number of driving arms 121, and the difference between the number of driving arms 121 and the number of gear teeth 111 of the star wheel is an integer multiple of two. When the two driving arm assemblies 12 share a set of second axes 62, the two driving arm assemblies 12 share two gear teeth 111, and the number of gear teeth 111 of the star wheel is less than the number of driving arms 121. When the driving arm assemblies 12 do not share the second axis 62, the number of gear teeth 111 of the star wheel is equal to the number of driving arms 121.
[0075] In some embodiments, please refer to Figures 2 to 4 The power structure 20 includes a swing arm 21 and a driving member 22. One end of the swing arm 21 is fixedly connected to the swing member 11 and the other end extends in a direction away from the first axis 61; the driving member 22 is used to drive the swing arm 21 to swing around the first axis 61 so that the swing member 11 rotates synchronously around the first axis 61.
[0076] It is understood that the swing arm 21 can drive the swing member 11 to swing synchronously with it. Optionally, the center line of the swing arm 21 along the length direction passes through the first axis 61 and is perpendicular to the first axis 61. Optionally, the swing arm 21 is a long plate or rod-shaped structure.
[0077] Optionally, the driving member 22 may be a cylinder or a crank rocker mechanism.
[0078] The beneficial effects of the embodiment of the present application are: the swing arm 21 extends in a direction away from the first axis 61, and can serve as a labor-saving lever, so that the driving member 22 drives the swing member 11 through the swing arm 21 more labor-saving, and the driving member 22 can drive more probe supports 131 to slide.
[0079] In some embodiments, please refer to Figures 2 to 4 The driving member 22 includes a telescopic actuator. One end of the telescopic actuator is rotatably mounted on the frame 50 about a fourth axis 64 along its extension direction. The other end of the telescopic actuator is rotatably connected to the swing arm 21 about a fifth axis 65. The fourth axis 64 and the fifth axis 65 are both parallel to the first axis 61.
[0080] It is understood that, by rotating the ends of the telescopic actuator, the telescopic actuator's telescopic direction can change with the swinging of the swing arm 21. By adjusting the telescopic stroke of the telescopic actuator, the swinging angle between the swing arm 21 and the swing member 11 can be adjusted. Alternatively, the telescopic actuator can be a pneumatic cylinder or an electric push rod.
[0081] The beneficial effects of the embodiment of the present application are: compared with the crank rocker, using a telescopic drive to drive the swing arm 21 only requires one power part, without the need to set more connecting rods, and the structure is relatively simple.
[0082] In other embodiments, the driving member 22 includes a telescopic actuator, one end of which, along its telescopic direction, is rotatably mounted on the frame 50 about the fourth axis, and the other end of which is slidably connected to the swing arm 21 along the length of the swing arm 21. The swing arm 21 is provided with a slide groove along its length, and the end of the telescopic actuator is slidably connected to the slide groove in a direction perpendicular to the first axis 61.
[0083] In some embodiments, please refer to Figures 2 to 4 The probe driving device 100 also includes a buffer assembly 30 arranged on at least one side of the swing direction of the swing arm 21; the buffer assembly 30 includes an elastic telescopic member 31; the elastic telescopic member 31 is fixed on the frame 50 at one end away from the swing arm 21 along its telescopic direction, and the other end of the elastic telescopic member 31 is arranged opposite to the swing arm 21 to press against the swing arm 21.
[0084] It can be understood that the buffer assembly 30 can be provided on one side of the swing arm 21 along the swing direction, or the buffer assembly 30 can be provided on both sides of the swing arm 21 along the swing direction.
[0085] The elastic telescopic member 31 can be a spring, a rubber column, a damper, a hydraulic strut or other elastic structures.
[0086] It can be understood that the elastic telescopic member 31 has an extension limit position and a contraction limit position. When the swing arm 21 swings to the extension limit position of the elastic telescopic member 31, it contacts the elastic telescopic member 31 and presses against the swing arm 21. At this time, the swing arm 21 continues to swing and can push the elastic telescopic member 31 from the extension limit position to the contraction limit position. When the swing arm 21 swings to the contraction limit position of the elastic telescopic member 31, the elastic telescopic member 31 stops contracting and limits the swinging of the swing arm 21.
[0087] The beneficial effects of the embodiments of the present application are as follows: the elastic telescopic member 31 is fixed on the frame 50 and can be against the swing arm 21, so that the swing arm 21 cannot continue to approach the elastic telescopic member 31, and the elastic telescopic member 31 can accurately limit the swing range of the swing arm 21; by adjusting the installation position of the elastic telescopic member 31 on the frame 50, the swing angle of the swing arm 21 and the swing member 11 can be changed; when the elastic telescopic member 31 is against the swing arm 21, it will collide with the swing arm 21, and both the elastic telescopic member 31 and the swing arm 21 will be subjected to force, which will cause wear. When the elastic telescopic member 31 collides with the elastic telescopic member 31, the buffer will shrink, which can reduce the wear caused by the collision between the buffer assembly 30 and the swing arm 21.
[0088] In some embodiments, please refer to Figures 2 to 4 The buffer assembly 30 further includes a buffer head 32 , which is connected to one end of the elastic telescopic member 31 close to the swing arm 21 , and the buffer head 32 is used to press the swing arm 21 .
[0089] It is understood that the buffer head 32 is disposed between the elastic telescopic member 31 and the swing arm 21. Optionally, the buffer head 32 is fixed to the elastic telescopic member 31 and is made of a material having elastic deformation such as rubber. Optionally, the buffer assembly 30 is a buffer component such as an oil pressure buffer.
[0090] The beneficial effect of the embodiment of the present application is that the buffer head 32 can be deformed when colliding with the swing arm 21, further reducing the wear caused by the collision between the buffer assembly 30 and the swing arm 21.
[0091] In some embodiments, please refer to Figure 2 and Figure 3 The probe drive device 100 includes a frame 50, two swing structures 10, a power structure 20, and a transmission arm 40. The swing structure 10 includes a swing member 11, multiple drive arm assemblies 12, and multiple probe support assemblies 13. The swing member 11 is rotatably mounted on the frame 50 about a first axis 61. The probe support assembly 13 includes two probe supports 131. The drive arm assembly 12 includes two drive arms 121 corresponding to each probe support 131.
[0092] One end of the driving arm 121 along its length is rotatably connected to the swing member 11 about the second axis 62. The other end of the driving arm 121 is rotatably connected to the probe support 131 about the third axis 63. This allows the driving arm 121 to drive the probe support 131 to slide when the swing member 11 swings about its axis. The probe support 131 is slidably mounted on the frame 50. The first axis 61, the second axis 62, and the third axis 63 are parallel.
[0093] The probe support assembly 13 includes two probe supports 131 that slide in the same direction. The two probe supports 131 are arranged opposite each other along the sliding direction and are located on the same side of the swing member 11 along the sliding direction of the probe supports 131. The two drive arms 121 in the drive arm assembly 12 are located on either side of a virtual line 66 that is parallel to the sliding direction of the probe support assembly 13 and passes through the first axis 61. The drive arm assembly 12 is used to drive the probe supports 131 in a probe support assembly 13 toward or away from each other.
[0094] The second axes 62 around which the two driving arms 121 in the same driving arm assembly 12 are symmetrical about the center of the first axis 61, and the two driving arms 121 are symmetrical about the virtual line 66. The second axes 62 around which the driving arms 121 in at least two driving arm assemblies 12 are symmetrical coincide with each other, and the two probe support assemblies 13 respectively connected to the two driving arm assemblies 12 have the same sliding direction and are arranged opposite to each other along the sliding direction. The two probe support assemblies 13 are respectively arranged on either side of the swing member 11 along the sliding direction of the probe support assembly 13.
[0095] The power structure 20 is mounted on the frame 50 and is connected to either of the two swinging members 11 to drive the swinging member 11 to swing back and forth. The transmission arm 40 is rotatably connected to the swinging members 11 of the two swinging structures 10 at both ends along its length. The rotation axis of the transmission arm 40 is parallel to the first axis 61, so that the two swinging members 11 connected to the transmission arm 40 swing simultaneously.
[0096] The power structure 20 includes a swing arm 21 and a drive member 22. The swing arm 21 is fixedly connected to the swing member 11 and extends away from the first axis 61. The drive member 22 is used to drive the swing arm 21 to swing about the first axis 61. The drive member 22 includes a telescopic actuator. One end of the telescopic actuator is mounted on the frame 50 and rotates about a fourth axis 64 along its extension direction. The other end of the telescopic actuator is connected to the swing arm 21 and rotates about a fifth axis 65. Both the fourth axis 64 and the fifth axis 65 are parallel to the first axis 61. The telescopic actuator is a pneumatic cylinder.
[0097] The probe drive device 100 also includes two buffer assemblies 30, each positioned on either side of the swing arm 21 in the swing direction. The buffer assemblies 30 are hydraulic buffers. One end of the buffer assembly 30, facing away from the swing arm 21 along its extension and retraction direction, is fixed to the frame 50. The other end of the buffer assembly 30 is positioned opposite the swing arm 21 to press against it.
[0098] In the second aspect, the present application embodiment also provides a testing device 1000, please refer to Figures 1 to 5 The test device 1000 includes the probe driving device 100 of any one of the embodiments of the first aspect, and also includes a capacitor test socket 200 and a test probe 300; the capacitor test socket 200 is used to fix the capacitor and is electrically connected to the capacitor; the test probe 300 is arranged on the probe support 131; the probe driving device 100 is used to drive the test probe 300 to contact or disengage with the capacitor test socket 200, so that the test probe 300 is connected to or disconnected from the capacitor.
[0099] The capacitor test socket 200 is used to load capacitors. A conductive structure electrically connected to the capacitor is provided on the capacitor test socket 200. After the capacitor is connected to the conductive structure on the capacitor test socket 200, multiple capacitor test sockets 200 are provided, and multiple capacitor test sockets 200 are connected to a conveying mechanism.
[0100] The conveying mechanism is used to control the capacitor test socket 200 to move to a group of test probes 300 and then stop. Then, the probe driving device 100 controls the test probes 300 to approach the conductive structure of the capacitor test socket 200. After the test probes 300 are electrically connected to the capacitor test socket 200, the test assembly electrically connected to the test probes 300 tests the capacitance. After the test is completed, the probe driving device 100 controls the test probes 300 to move away from the capacitor test socket 200. Then, the conveying mechanism drives the capacitor test socket 200 to move to the position of the next group of test probes 300 and stops. The conveying mechanism also drives the subsequent capacitor test socket 200 to move to the position of the current test probe 300. The probe driving device 100 again controls the test probes 300 to approach the conductive structure of the capacitor test socket 200 to continue testing the capacitance.
[0101] It can be understood that one or more probe driving devices 100 can be provided.
[0102] The test probe 300 is a conductor. When the test probe 300 contacts the conductive structure on the capacitor test socket 200 , the test probe 300 is electrically connected to the capacitor through the conductive structure on the capacitor test socket 200 .
[0103] Optionally, a plurality of capacitance test sockets 200 are distributed in a ring shape, and the conveying mechanism drives the capacitance test sockets 200 to move along the distribution direction.
[0104] After the test probe 300 has finished testing the capacitance and is separated from the capacitance test seat 200 , the conveying mechanism drives the capacitance test seat 200 to move, so that the subsequent capacitance test seat 200 moves to the position corresponding to the test probe 300 , so that the test probe 300 tests the next capacitance test seat 200 .
[0105] The beneficial effects of the embodiments of the present application are as follows: the testing device 1000 uses the probe driving device 100 in the embodiment of the first aspect, which can use fewer power devices to drive multiple test probes 300, with lower costs, and can solve the technical problems in the prior art that during the horn capacitance test process, multiple cylinder drives need to be set up to drive each test probe 300, which has high control difficulty and poor synchronization.
[0106] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present application should be included in the scope of protection of the present application.
Claims
1. A probe driving device, characterized in that: include: frame; A swing structure, comprising a swing member, a drive arm assembly, and a probe support assembly; The swing member is rotatable around a first axis and is arranged on the frame; the probe support assembly includes at least two probe supports slidably connected to the frame; the drive arm assembly includes drive arms corresponding to the probe supports one by one; One end of the driving arm along the length direction is rotatably connected to the swing member around a second axis, and the other end of the driving arm is rotatably connected to the probe support member around a third axis, so that when the swing member swings around the first axis, the driving arm drives the probe support member to slide relative to the frame; The first axis, the second axis and the third axis are parallel; A power structure is provided on the frame, and the power structure is connected to the swing member and is used for driving the swing member to swing back and forth.
2. The probe driving device according to claim 1, wherein: The swing structure includes at least one driving arm assembly and at least one probe support assembly; The probe support assembly includes two probe supports with the same sliding direction, and the two probe supports are arranged relatively spaced apart along the sliding direction; The two driving arms in the driving arm assembly are arranged on both sides of a virtual line, which is parallel to the sliding direction of the probe support assembly and passes through the first axis. The driving arm assembly is used to drive the two probe support members in the same probe support assembly to move closer to or away from each other.
3. The probe driving device according to claim 2, wherein: The second axis around which the two driving arms in the driving arm assembly rotate is symmetrical with respect to the center of the first axis, and the two driving arms are symmetrical with respect to the virtual line.
4. The probe driving device according to claim 2, wherein: There are at least two drive arm assemblies. There are at least two probe support assemblies, which are respectively connected to the driving arm assemblies. The two probe support assemblies have the same sliding direction and are arranged opposite to each other along the sliding direction.
5. The probe driving device according to claim 1, wherein: The probe driving device includes a transmission arm and at least two swinging structures; the power structure is connected to any one of the multiple swinging members, and the transmission arm is rotatably connected to the swinging members of the two swinging structures at both ends along its length direction, and the rotation axis of the transmission arm is parallel to the first axis, so that the two swinging members connected to the transmission arm swing simultaneously.
6. The probe driving device according to claim 1, wherein: The swinging member includes a star wheel, which includes gear teeth arranged around the first axis, and the driving arm is rotationally connected to the gear teeth; the number of the gear teeth is equal to the number of the driving arms in one driving arm assembly.
7. The probe driving device according to any one of claims 1 to 6, characterized in that: The power structure includes a swing arm and a driving member, one end of the swing arm is fixedly connected to the swing member and the other end extends in a direction away from the first axis; the driving member is used to drive the swing arm to swing around the first axis so that the swing member rotates synchronously around the first axis.
8. The probe driving device according to claim 7, wherein: The driving member includes a telescopic driver; One end of the telescopic actuator along the telescopic direction is rotatably mounted on the frame around a fourth axis, and the other end of the telescopic actuator is rotatably connected to the swing arm around a fifth axis; the fourth axis and the fifth axis are parallel to the first axis; Alternatively, one end of the telescopic driver along the telescopic direction is rotatably arranged on the frame around a fourth axis, and the other end of the telescopic driver is slidably connected to the swing arm along the length direction of the swing arm.
9. The probe driving device according to claim 8, wherein: The probe driving device also includes a buffer assembly arranged on at least one side of the swinging direction of the swinging arm; the buffer assembly includes an elastic telescopic part; the elastic telescopic part is fixed on the frame at one end away from the swinging arm along its telescopic direction, and the other end of the elastic telescopic part is arranged opposite to the swinging arm to press against the swinging arm.
10. The probe driving device according to claim 9, wherein: The buffer assembly further includes a buffer head, which is connected to one end of the elastic telescopic member close to the swing arm, and is used for pressing the swing arm.
11. A testing device, characterized in that: The probe driving device according to any one of claims 1 to 10 further comprises a capacitance test socket and a test probe; The capacitor test socket is used to fix the capacitor and is electrically connected to the capacitor; The test probe is arranged on the probe support; The probe driving device is used to drive the test probe to contact or disengage with the capacitor test socket, so as to connect or disconnect the test probe with the capacitor.