Material receiving device for chip testing

Abstract

The utility model relates to the technical field of chip testing, in particular to a material receiving device for chip testing, which comprises a mounting seat, a material receiving box, a cover plate driving mechanism and a controller, the material receiving box is arranged on the mounting seat, the material receiving box is provided with an accommodating cavity for accommodating a material receiving tray, and the upper end of the accommodating cavity is provided with an opening; the cover plate is movably arranged on the mounting seat and is higher than the material receiving box; the driving mechanism is arranged on the mounting seat and is used for driving the cover plate to be switched between a covering position covering the opening and an opening position staggered from the opening; the driving mechanism and the testing device are electrically connected with the controller, and the controller is used for receiving a testing signal of the testing device so as to control the driving mechanism to drive the cover plate to the covering position or the opening position when the testing device tests that the chip is qualified or unqualified; and when the chip tested by the testing device is unqualified, the cover plate is in a covering position, and a tester cannot put the unqualified product into the material receiving box, so that the risk that the unqualified product is mixed into the qualified product is avoided.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a material receiving device for chip testing. Background Art

[0002] During the chip production process, the chips need to be tested. Testers need to place chips that pass the test in a qualified product tray and chips that fail the test in a rejected product tray. During the test process, due to fatigue and lack of concentration, testers may place failed chips in a qualified product tray, resulting in rejected products mixed in the qualified product tray and causing customer complaints. Utility Model Content

[0003] The technical problem to be solved by the present invention is that during the chip testing process, the tester may put the chips that failed the test into the qualified product tray, resulting in the mixing of unqualified products into the qualified product tray, causing customer complaints.

[0004] In order to solve the above technical problems, the purpose of the present invention is to provide a chip testing receiving device for collecting qualified chips tested by a chip testing device, comprising:

[0005] Mounting seat;

[0006] A material receiving box, the material receiving box being arranged on the mounting seat, the material receiving box having an accommodating cavity for accommodating the material receiving tray, and an upper end of the accommodating cavity having an opening;

[0007] A cover plate, the cover plate being movably arranged on the mounting seat and arranged higher than the material receiving box;

[0008] a driving mechanism, the driving mechanism being disposed on the mounting seat and configured to drive the cover plate to switch between a covering position covering the opening and an open position offset from the opening;

[0009] The controller, the driving mechanism and the testing device are both electrically connected to the controller, and the controller is used to receive the test signal of the testing device to control the driving mechanism to drive the cover to the closed position or the open position when the testing device tests that the chip is qualified or unqualified.

[0010] As a preferred solution, the end of the cover plate facing the material receiving box when it is in the open position is defined as the first end, the end of the cover plate away from the material receiving box is defined as the second end, the square from the first end of the cover plate to the second end of the cover plate is defined as the first direction, and the end of the first end of the cover plate is connected to an anti-collision monitoring mechanism, and the anti-collision monitoring mechanism is electrically connected to the controller.

[0011] As a preferred solution, the anti-collision monitoring mechanism includes an anti-collision plate, an elastic member and a first stop switch, and the anti-collision plate and the first stop switch are sequentially arranged at intervals along the first direction;

[0012] One end of the elastic member is connected to the cover plate, and the other end of the elastic member abuts against one end of the anti-collision plate facing the first stop switch;

[0013] The anti-collision plate at least partially protrudes out of the first end of the cover plate.

[0014] As a preferred solution, a connecting block is fixed to the first end of the cover plate, a connecting bolt is slidably inserted into the connecting block, the threaded end of the connecting bolt is connected to the anti-collision plate, and the elastic member is a compression spring sleeved on the outside of the connecting bolt, one end of the compression spring abuts against the connecting block, and the other end of the compression spring abuts against the anti-collision plate.

[0015] As a preferred embodiment, the anti-collision plate includes a vertical plate-like portion and a transverse plate-like portion located at the upper end of the vertical plate-like portion; the vertical plate-like portion and the cover plate are arranged at intervals along the first direction, and the transverse plate-like portion and the cover plate are arranged at intervals up and down, and the elastic member and the first stop switch are both located in the gap between the transverse plate-like portion and the cover plate.

[0016] As a preferred solution, a plurality of positioning slots are provided in the material receiving box, and each positioning slot is used to position the material receiving trays of different specifications.

[0017] As a preferred solution, the driving mechanism includes a screw slider mechanism fixed on the mounting seat, and the cover plate is connected to the slider of the screw slider mechanism.

[0018] As a preferred solution, the driving mechanism also includes a guide rail and a sliding block slidably connected to the guide rail, the guide rail and the screw slider mechanism are respectively arranged on both sides of the material receiving box, and the two ends of the cover plate are respectively connected to the slider and the sliding block.

[0019] As a preferred solution, a second stop switch electrically connected to the controller is connected to the mounting seat, and when the cover moves to the open position, the slider abuts against the second stop switch.

[0020] As a preferred solution, a third stop switch electrically connected to the controller is connected to the mounting seat, and when the cover moves to the closing position, the slider abuts against the third stop switch.

[0021] Compared with the prior art, the beneficial effects of the present invention are:

[0022] The chip testing material receiving device of the present invention is used for collecting qualified chips tested by the chip testing device, and includes a mounting seat, a material receiving box, a cover driving mechanism and a controller. The material receiving box is arranged on the mounting seat, and the material receiving box has a accommodating cavity for accommodating the material receiving tray, and the upper end of the accommodating cavity has an opening; the cover is movably arranged on the mounting seat and the cover is arranged higher than the material receiving box; the driving mechanism is arranged on the mounting seat, and the driving mechanism is used to drive the cover to switch between a closed position covering the opening and an open position staggered with the opening; the driving mechanism and the testing device are both electrically connected to the controller, and the controller is used to receive a test signal from the testing device, so as to control the driving mechanism to drive the cover to the closed position or the open position when the testing device tests that the chip is qualified or unqualified; when the chip tested by the testing device is unqualified, the cover is in the closed position, and the tester cannot put the unqualified product into the material receiving box, thereby eliminating the risk of unqualified products being mixed into qualified products. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 This is an axonometric diagram of the chip testing receiving device of the present invention;

[0024] Figure 2 This is a front view of the chip testing receiving device of the present invention;

[0025] Figure 3 for Figure 2 Middle AA section;

[0026] Figure 4 for Figure 3 A partial enlarged view of point C in the middle;

[0027] Figure 5 This is an axonometric view of the chip testing receiving device of the present invention after the protective plate is removed;

[0028] Figure 6 This is an axonometric view of the chip testing receiving device of the present invention after removing the protective plate and the cover plate;

[0029] In the figure, 1. mounting base, 2. material receiving box, 3. cover plate, 41. anti-collision plate, 411. vertical plate-shaped portion, 412. horizontal plate-shaped portion, 42. elastic member, 43. first stop switch, 44. connecting block, 45. connecting bolt, 51. slider, 52. guide rail, 53. sliding block, 61. second stop switch, 62. third stop switch, 7. protective plate. DETAILED DESCRIPTION

[0030] The following embodiments are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0031] In the description of the present invention, it should be understood that the terms "upper", "lower", "left", "right", "top", "bottom", etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation of the present invention. It should be understood that the terms "first", "second", etc. are used in the present invention to describe various information, but such information should not be limited to these terms. These terms are only used to distinguish information of the same type from each other. For example, without departing from the scope of the present invention, "first" information may also be referred to as "second" information, and similarly, "second" information may also be referred to as "first" information.

[0032] like Figures 1 to 6 As shown, the chip testing receiving device of the present invention is used to collect qualified chips tested by the chip testing device. The preferred embodiment of the chip testing receiving device of the present invention includes:

[0033] Mounting base 1; the mounting base 1 serves as a mounting base for other components; in this embodiment, the mounting base 1 is a plate; in other embodiments of the present invention, the mounting base 1 may be a frame;

[0034] A material receiving box 2 is provided on the mounting base 1 and has a receiving cavity for accommodating a material receiving tray, and an upper end of the receiving cavity has an opening; a cover plate 3 is movably provided on the mounting base 1 and arranged higher than the material receiving box 2; a driving mechanism is provided on the mounting base 1 and is used to drive the cover plate 3 to switch between a covering position covering the opening and an open position offset from the opening;

[0035] The controller, drive mechanism, and test device are all electrically connected to the controller. The controller receives test signals from the test device and controls the drive mechanism to move the cover plate 3 to the closed or open position when the test device determines that the chip is qualified or unqualified. If the test device determines that the chip is unqualified, the cover plate 3 is in the closed position, preventing the tester from placing the unqualified product into the receiving bin 2, completely eliminating the risk of unqualified products being mixed with qualified products.

[0036] To prevent the cover plate 3 from accidentally striking a human hand during movement, in this embodiment, the end of the cover plate 3 facing the material receiving bin 2 when in the open position is defined as the first end, the end of the cover plate 3 facing away from the material receiving bin 2 is defined as the second end, and the square from the first end of the cover plate 3 to the second end of the cover plate 3 is defined as the first direction. The first end of the cover plate 3 is connected to an anti-collision monitoring mechanism, which is electrically connected to the controller. When a human hand is within the movement range of the cover plate 3, the anti-collision monitoring mechanism detects the human hand, and the bin controller sends an electrical signal to the drive mechanism to stop the movement of the cover plate 3.

[0037] In this embodiment, the anti-collision monitoring mechanism includes an anti-collision plate 41, an elastic member 42, and a first trigger switch 43. The anti-collision plate 41 and the first trigger switch 43 are arranged in sequence along a first direction. One end of the elastic member 42 is connected to the cover plate 3, and the other end of the elastic member 42 abuts against the end of the anti-collision plate 41 facing the first trigger switch 43. The anti-collision plate 41 at least partially protrudes beyond the first end of the cover plate 3. After a person's hand touches the anti-collision plate 41, the anti-collision plate 41 compresses the elastic member 42 and releases the first trigger switch. The first trigger switch sends an electrical signal to the controller to stop the drive mechanism. This ensures the safety of the tester and avoids safety accidents caused by the tester's misoperation. In other embodiments of the utility model, the anti-collision monitoring mechanism can be set to install a grating.

[0038] Specifically, a connecting block 44 is fixed to the first end of the cover plate 3. A connecting bolt 45 is slidably inserted into the connecting block 44. The threaded end of the connecting bolt 45 is connected to the anti-collision plate 41. The elastic member 42 is a compression spring sleeved on the outside of the connecting bolt 45. One end of the compression spring abuts the connecting block 44, and the other end of the compression spring abuts the anti-collision plate 41. The connecting bolt 45 guides the compression spring, ensuring stable deformation of the compression spring.

[0039] Furthermore, the anti-collision plate 41 includes a vertical plate-shaped portion 411 and a transverse plate-shaped portion 412 located above the vertical plate-shaped portion 411. The vertical plate-shaped portion 411 is spaced apart from the cover plate 3 along a first direction, while the transverse plate-shaped portion 412 is spaced apart from the cover plate 3 above and below. The elastic member 42 and the first stop switch 43 are both located in the space between the transverse plate-shaped portion 412 and the cover plate 3. The transverse plate-shaped portion 412 covers the elastic member 42 and the first stop switch 43, preventing a hand or object from accidentally touching the first stop switch 43. The material receiving bin 2 is a rectangular box, and the cover plate 3 moves along the width of the bin 2 (i.e., the first direction is the width of the bin 2). In this embodiment, at least two connecting blocks 44 and two elastic members 42 are provided, and the multiple connecting blocks 44 and elastic members 42 are spaced apart along the length of the bin 2. The length of the vertical plate matches or slightly exceeds the length of the cover plate 3 to ensure that the monitoring range covers the entire cover plate 3.

[0040] Chips of different sizes often require trays of different sizes. In this embodiment, to ensure that trays of different sizes can be stably placed in the receiving box 2, the receiving box 2 is provided with multiple positioning slots, each for positioning a receiving tray of different sizes. Specifically, the receiving trays of different sizes can be positioned by providing multiple partitions in the receiving box 2.

[0041] In this embodiment, the driving mechanism includes a screw slider 51 mechanism fixed to the mounting base 1, and the cover plate 3 is connected to the slider 51 of the screw slider 51 mechanism. The screw slider 51 mechanism operates stably and at a relatively slow speed, further preventing the cover plate 3 from accidentally hitting a person's hand.

[0042] Specifically, the drive mechanism further includes a guide rail 52 and a sliding block 53 slidably connected to the guide rail 52. The guide rail 52 and the screw slider 51 are respectively arranged on both sides of the material receiving box 2, and the two ends of the cover plate 3 are respectively connected to the slider 51 and the sliding block 53. The provision of the guide rail 52 increases the stability of the cover plate 3 in operation.

[0043] To facilitate control of the travel of the cover 3, in this embodiment, a second stop switch 61 electrically connected to the controller is connected to the mounting base 1. When the cover 3 moves to the open position, the slider 51 abuts the second stop switch 61. A third stop switch 62 electrically connected to the controller is connected to the mounting base 1. When the cover 3 moves to the closed position, the slider 51 abuts the third stop switch 62.

[0044] To prevent people from accidentally touching the second stop switch 61 and the third stop switch 62, in this embodiment, a protective plate 7 is connected to the mounting assembly. The protective plate 7 is L-shaped, with the lower portion of the protective plate 7 connected to the mounting base 1, and the upper portion of the protective plate 7 covers the screw slider 51 mechanism, the second stop switch 61, and the third stop switch 62. Among them, the first stop switch 43, the second stop switch 61, and the third stop switch 62 are all micro switches.

[0045] In this embodiment, one side panel of the receiving box 2 is connected to other side panels or the bottom panel of the receiving box 2 in a hinged manner. When a tray full of chips in the receiving box 2 needs to be taken out, the side panel is opened to facilitate taking out the tray.

[0046] In summary, the chip testing material receiving device of the present invention includes a mounting seat 1, a material receiving box 2, a cover plate 3 driving mechanism and a controller. The material receiving box 2 is arranged on the mounting seat 1, and the material receiving box 2 has a accommodating cavity for accommodating a material receiving tray, and the upper end of the accommodating cavity has an opening; the cover plate 3 is movably arranged on the mounting seat 1 and the cover plate 3 is arranged higher than the material receiving box 2; the driving mechanism is arranged on the mounting seat 1, and the driving mechanism is used to drive the cover plate 3 to switch between a closed position covering the opening and an open position offset from the opening; the driving mechanism and the testing device are both electrically connected to the controller, and the controller is used to receive a test signal from the testing device, so as to control the driving mechanism to drive the cover plate 3 to the closed position or the open position when the testing device tests that the chip is qualified or unqualified; when the chip tested by the testing device is unqualified, the cover plate 3 is in the closed position, and the tester cannot put the unqualified product into the material receiving box 2, thereby eliminating the risk of unqualified products being mixed into qualified products.

[0047] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and replacements can be made without departing from the technical principles of the present invention. These improvements and replacements should also be regarded as the scope of protection of the present invention.

Claims

1. A chip testing receiving device for collecting qualified chips tested by a chip testing device, characterized in that: include: Mounting seat (1); A material receiving box (2), the material receiving box (2) being arranged on the mounting seat (1), the material receiving box (2) having a receiving cavity for accommodating a material receiving tray, the upper end of the receiving cavity having an opening; A cover plate (3), the cover plate (3) being movably arranged on the mounting seat (1) and the cover plate (3) being arranged higher than the material receiving box (2); A driving mechanism, the driving mechanism being arranged on the mounting seat (1), the driving mechanism being used to drive the cover plate (3) to switch between a covering position covering the opening and an open position offset from the opening; A controller, wherein the driving mechanism and the testing device are both electrically connected to the controller, and the controller is used to receive a test signal from the testing device so as to control the driving mechanism to drive the cover plate (3) to the closed position or the open position when the testing device tests that the chip is qualified or unqualified.

2. The chip testing receiving device according to claim 1, wherein: The end of the cover plate (3) facing the material receiving box (2) when in the open position is defined as the first end, the end of the cover plate (3) facing away from the material receiving box (2) is defined as the second end, the square from the first end of the cover plate (3) to the second end of the cover plate (3) is defined as the first direction, the end of the first end of the cover plate (3) is connected to an anti-collision monitoring mechanism, and the anti-collision monitoring mechanism is electrically connected to the controller.

3. The chip testing receiving device according to claim 2, wherein: The anti-collision monitoring mechanism comprises an anti-collision plate (41), an elastic member (42) and a first touch-stop switch (43), wherein the anti-collision plate (41) and the first touch-stop switch (43) are sequentially arranged at intervals along the first direction; One end of the elastic member (42) is connected to the cover plate (3), and the other end of the elastic member (42) abuts against one end of the anti-collision plate (41) facing the first stop switch (43); The anti-collision plate (41) at least partially protrudes beyond the first end of the cover plate (3).

4. The chip testing receiving device according to claim 3, wherein: A connecting block (44) is fixed to the first end of the cover plate (3), a connecting bolt (45) is slidably inserted into the connecting block (44), a threaded end of the connecting bolt (45) is connected to the anti-collision plate (41), and the elastic member (42) is a compression spring sleeved on the outside of the connecting bolt (45), one end of the compression spring abuts against the connecting block (44), and the other end of the compression spring abuts against the anti-collision plate (41).

5. The chip testing receiving device according to claim 3, wherein: The anti-collision plate (41) comprises a vertical plate-shaped portion (411) and a transverse plate-shaped portion (412) located at the upper end of the vertical plate-shaped portion (411); the vertical plate-shaped portion (411) and the cover plate (3) are arranged at intervals along the first direction, the transverse plate-shaped portion (412) and the cover plate (3) are arranged at intervals up and down, and the elastic member (42) and the first stop switch (43) are both located in the interval between the transverse plate-shaped portion (412) and the cover plate (3).

6. The chip testing receiving device according to claim 1, wherein: A plurality of positioning slots are provided in the material receiving box (2), and each positioning slot is used to position material receiving trays of different specifications.

7. The chip testing receiving device according to claim 1, wherein: The driving mechanism comprises a screw slider (51) mechanism fixed on the mounting seat (1), and the cover plate (3) is connected to the slider (51) of the screw slider (51) mechanism.

8. The chip testing receiving device according to claim 7, wherein: The driving mechanism further comprises a guide rail (52) and a sliding block (53) slidably connected to the guide rail (52); the guide rail (52) and the screw slider (51) mechanism are respectively arranged on both sides of the material receiving box (2); and the two ends of the cover plate (3) are respectively connected to the slider (51) and the sliding block (53).

9. The chip testing receiving device according to claim 7, wherein: The mounting seat (1) is connected to a second stop switch (61) electrically connected to the controller, and when the cover plate (3) moves to the open position, the slider (51) abuts against the second stop switch (61).

10. The chip testing receiving device according to claim 7, wherein: The mounting seat (1) is connected to a third stop switch (62) electrically connected to the controller. When the cover plate (3) moves to the cover-closed position, the slider (51) abuts against the third stop switch (62).

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