Dynamic response tester

Abstract

The utility model relates to a dynamic response tester, which is characterized in that a first single-chip microcomputer controls connection and disconnection of a multi-path relay to complete path number selection of a multi-path tested power supply module; the second single-chip microcomputer continuously outputs pulse signals with the same time interval for N times to act on the relay, so that the relay is automatically closed and disconnected, the tested power supply module generates N pulse waveforms, the N times of response time of the tested power supply module is recorded and analyzed by the recording instrument, and a screening test of dynamic response of the power supply module is completed; the relay module comprises a plurality of relays and is used for directly controlling the power-on and power-off of the tested power supply module; the input voltage manual switching module is used for switching the test voltage of the tested power supply module in a key form; the digital display + switch and the digital display-switch are used for sending control signals to the first single-chip microcomputer and selecting which relay in the current relay module is closed. According to the utility model, the overall period of the batch-production dynamic response test is shortened, and the stability of the waveform acquired in each test is ensured.

Description

Technical Field

[0001] The utility model belongs to the technical field of screening and verification tests for aerospace electronic products, and relates to a dynamic response tester used for screening work of screening tests of dynamic responses of power modules. Background Art

[0002] The performance of the power supply system in aerospace systems is crucial to the success of a launch. Power modules are crucial components in various subsystems of the power supply system during a space launch, so various screening tests are essential.

[0003] The dynamic response screening test is a key test in power module commissioning and production. This test screens the reliability of the power module by measuring its response time. This test verifies the stability of its output voltage function under different environments.

[0004] The dynamic response test has strict technical requirements, requiring the power module to be powered at 24V, 28V, and 32V, and its output voltage response time to be measured. The output voltage dynamic response time measures the time difference between power-up and the stabilization of the 5V output voltage, which is then used to determine the quality of the power module. The on-off process requires multiple switching cycles with stable time intervals. Manual control of the switching time cannot be precisely controlled, necessitating the development of a device that can precisely control the on-off switching to achieve this goal.

[0005] The existing technology presents two challenges: 1. Each power module is manually powered on and off using a toggle switch, requiring a total of 180 switching operations per module, which is time-consuming and labor-intensive. 2. Each manual switching operation cannot guarantee the stability of the waveforms captured by the recorder. 3. A single screening test can only be completed on one machine. Utility Model Content

[0006] The technical problem addressed by this utility model is to overcome the shortcomings of the existing technology and provide a dynamic response tester that solves the following problems: 1. Each power module is manually powered on and off using a toggle switch, requiring multiple on / off operations for each module, which is time-consuming and labor-intensive. 2. Each manual on / off operation cannot guarantee the stability of the waveforms collected by the recorder. 3. A single screening test can only be completed on one machine.

[0007] The solution of the utility model is: a dynamic response tester, comprising a first single chip microcomputer, a second single chip microcomputer, a relay module, an input voltage manual switching module, and digital display + and - switches;

[0008] The output of the first single-chip microcomputer is connected to the relay module, and each output pin is connected to a relay in the relay module. The first single-chip microcomputer sends a pull-in or pull-out instruction to each relay to complete the selection of the number of paths of the multi-path power supply module under test;

[0009] The output of the second single-chip microcomputer is connected to the test input point of the relay module, and a pulse signal with the same time interval is output to the relay N times continuously. After receiving the pulse signal, the relay performs a closing or opening action;

[0010] The relay module includes multiple relays. The output of one relay is connected to a power module under test. The relay receives a pulse signal to close or open, directly controlling the power on and off of the power module under test. The power module under test generates N pulse waveforms. The subsequent module completes the screening test of the dynamic response of the power module by analyzing the response time of the power module under test N times, where N is a positive integer.

[0011] The input voltage manual switching module is used to switch the test voltage of the power module under test through buttons;

[0012] The digital display + and - switches are used to send control signals to the first single chip microcomputer to select which relay in the current relay module is closed. The digital display + switch increases the number of relays, and the digital display - switch decreases the number of relays.

[0013] Furthermore, it also includes a channel digital display module; after receiving the control signal, the first single chip computer sends a corresponding relay pull-in or disconnection instruction, and at the same time the channel digital display module displays the current test channel number.

[0014] Furthermore, the input terminal Ki of each relay is connected to the output terminal of the first single-chip microcomputer, and the input terminal of each relay is connected to a light-emitting diode to indicate the on / off state of the relay; the output terminal Ki' of each relay is connected to the input terminal of a power module under test, and an output collection point is provided at the output terminal of the relay module.

[0015] Furthermore, an adapter plug is provided, which controls the power on and off of multiple other tested power modules by connecting an adapter cable to a switching relay module.

[0016] Furthermore, an automatic test button is provided for powering the power module currently being tested and triggering the second single chip microcomputer to start timing.

[0017] The beneficial effects of the present invention compared with the prior art are:

[0018] (1) The present invention uses the interaction between dual single-chip microcomputers, relays and switches to achieve a leap from a single screening test of only one machine to 20 machines. Compared with the methods in the prior art, the overall cycle of the dynamic response test of batch production is shortened while meeting the technical conditions.

[0019] (2) The present invention ensures the stability of the collected waveform in each experiment by using a second single chip microcomputer to control the 2-second time interval of the switch.

[0020] (3) The utility model realizes automatic testing, and does not require manual toggling of the switch to the breakpoint, thus freeing up labor and reducing the uncertainty of manual opening and closing 180 times. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 This is the working principle diagram of the first single chip microcomputer;

[0022] Figure 2 This is a partial enlarged view of the relay module. DETAILED DESCRIPTION

[0023] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0024] Example 1

[0025] A dynamic response tester proposed in this embodiment includes a first single-chip microcomputer, a second single-chip microcomputer, a relay module, an input voltage manual switching module, digital display + and - switches, and a channel digital display module;

[0026] The output of the first single-chip microcomputer is connected to the relay module, which is mainly used to control the closure or disconnection of the ten relays contained in the relay module, complete the number of paths of the ten power modules under test, and realize the free switching of the ten power modules under test under the same conditions without opening the high and low temperature chamber door to manually replace the cables;

[0027] The output of the second single-chip microcomputer is connected to the test input point of the relay module to output a pulse signal with the same time interval ten times continuously to act on the relay, causing it to automatically close or open. At the same time, the power module under test generates ten pulse waveforms, which are recorded by an external recorder for subsequent analysis of the ten response times of the power module under test, completing the screening test of the dynamic response of the power module;

[0028] The relay module contains ten relays, which are used to directly control the power on and off of the power module under test. This solves the problem of being unable to replace the power module under test in high and low temperature environments. It overcomes the bottleneck of only being able to perform dynamic response tests on one unit in each environment, and enables the free switching of multiple power modules under test to be completed simultaneously.

[0029] The input voltage manual switching module enables the test voltage supplied to the power module under test to be automatically switched between 24V, 28V, and 32V by pressing a button. This eliminates the need to manually rotate the DC regulated power supply output terminal, reducing the risk of switching the wrong voltage.

[0030] The digital + and - switches send control signals to the first microcontroller, selecting which relay in the relay module is currently closed. The + switch increments the relay number, while the - switch decrements it. Upon receiving the control signals, the first microcontroller controls the corresponding relays to close and close, and controls the channel digital display module to display the current relay number.

[0031] like Figure 1 、 Figure 2 As shown, the input terminal Ki of each relay is connected to the output terminal of the first single-chip microcomputer. Preferably, the input terminal of each relay is connected to a light-emitting diode to indicate the on / off state of the relay; the output terminal Ki' of each relay is connected to the input terminal of a power module under test, and an output collection point is provided at the output terminal of the relay module; i = 1, 2, ..., 10.

[0032] The dynamic response tester is also provided with an adapter plug, which controls the power on and off of another 10 power modules under test by connecting an adapter cable switching relay module, thereby achieving a leap in completing the dynamic response test of 20 power modules under test in a single screening test.

[0033] The dynamic response tester is further provided with an automatic test button for powering on the power supply module currently being tested and triggering the second single chip microcomputer to start timing.

[0034] The test process of the dynamic response tester in this embodiment is as follows:

[0035] The first microcontroller is set to control the first relay. The second microcontroller is set to perform ten consecutive dynamic response tests at a 2-second interval. The + and - digital display switches are pressed once, and the channel digital display module shows "1," representing the first power module. The input voltage manual switch module selects the current test voltage of 24V. The automatic test button is turned on, triggering the second microcontroller to begin timing. The relay automatically closes and closes, and the power module under test is powered on and off ten times. A recorder is used to capture the signal waveform ten times. Finally, the waveforms are analyzed to determine the power module's application environment. The test sequence is sequentially completed, switching between 28V and 32V, switching between the second and 20th power modules, and performing dynamic response tests under three different temperature environments: normal, low, and high. Each power module undergoes these steps twice, totaling approximately 180 dynamic response tests, or 3,600 for a 20-channel product. This significantly improves test efficiency, allowing 3,600 dynamic response tests to be easily completed with just a few button presses.

[0036] Although the present invention has been disclosed above in terms of preferred embodiments, this is not intended to limit the present invention. Any person skilled in the art may, without departing from the spirit and scope of the present invention, make possible changes and modifications to the technical solutions of the present invention by utilizing the methods and technical contents disclosed above. Therefore, any simple modifications, equivalent changes, and modifications made to the above embodiments based on the technical essence of the present invention without departing from the content of the technical solutions of the present invention shall fall within the scope of protection of the technical solutions of the present invention.

Claims

1. A dynamic response tester, characterized in that: It includes a first single chip microcomputer, a second single chip microcomputer, a relay module, an input voltage manual switching module, and digital display + and - switches; The output of the first single-chip microcomputer is connected to the relay module, and each output pin is connected to a relay in the relay module. The first single-chip microcomputer sends a pull-in or pull-out instruction to each relay to complete the selection of the number of paths of the multi-path power supply module under test; The output of the second single-chip microcomputer is connected to the test input point of the relay module, and a pulse signal with the same time interval is output to the relay N times continuously. After receiving the pulse signal, the relay performs a closing or opening action; The relay module includes multiple relays. The output of one relay is connected to a power module under test. The relay receives a pulse signal to close or open, directly controlling the power on and off of the power module under test. The power module under test generates N pulse waveforms. The subsequent module completes the screening test of the dynamic response of the power module by analyzing the response time of the power module under test N times, where N is a positive integer. The input voltage manual switching module is used to switch the test voltage of the power module under test through buttons; The digital display + and - switches are used to send control signals to the first single chip microcomputer to select which relay in the current relay module is closed. The digital display + switch increases the number of relays, and the digital display - switch decreases the number of relays.

2. A dynamic response tester according to claim 1, characterized in that: It also includes a channel digital display module; after receiving the control signal, the first single chip computer sends a corresponding relay pull-in or disconnection instruction, and at the same time the channel digital display module displays the current test channel number.

3. A dynamic response tester according to claim 1, characterized in that: The input terminal Ki of each relay is connected to the output terminal of the first single-chip microcomputer. The input terminal of each relay is connected to a light-emitting diode to indicate the on / off state of the relay. The output terminal Ki' of each relay is connected to the input terminal of a power module under test. An output collection point is provided at the output terminal of the relay module.

4. A dynamic response tester according to claim 1, characterized in that: An adapter plug is also provided, which controls the power on and off of multiple other tested power modules by connecting an adapter cable to a switching relay module.

5. A dynamic response tester according to claim 1, characterized in that: An automatic test button is also provided for powering on the power module currently being tested and triggering the second single chip microcomputer to start timing.

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