Probe test drawing tool device

Abstract

The utility model discloses a probe test drawing tool device, which comprises a test machine main body, two ends of the front side wall of the test machine main body are respectively provided with a quick-release pressing clamp, and an electric wood loading plate is arranged between the two quick-release pressing clamps; left driving mechanisms and right driving mechanisms are assembled on the two sides of the testing machine body, each left driving mechanism comprises a left X-axis air cylinder, a left Y-axis air cylinder and a left Z-axis air cylinder which are installed at the driving end of the left side of the testing machine body, and connecting blocks a are assembled at the driving ends of the left X-axis air cylinder, the left Y-axis air cylinder and the left Z-axis air cylinder; according to the probe test drawing tool device, challenges in electronic component testing are effectively solved, the testing quality and efficiency are improved, intelligent and lean management of the production process is promoted, remarkable benefits are brought to the electronic manufacturing industry, in addition, an integrated precise mechanical structure and a high-quality probe system cooperate, and the production efficiency is improved. And each test point can be accurately positioned, the error rate is obviously reduced, and the test result can be highly accurate.

Description

Technical Field

[0001] This patent relates to the field of automated machinery technology, specifically a probe testing and pulling tooling device. Background Art

[0002] The probe test pull-out fixture is a specialized device used in the manufacturing and testing of electronic products, designed to improve test efficiency and accuracy. This type of fixture is primarily used for functional testing of circuit boards, semiconductor components, and other microelectronic devices. By precisely controlling the contact points between the probe and the component under test, electrical connections and signal transmission are achieved at the circuit nodes.

[0003] However, the tooling devices in the existing technology still have some shortcomings. For example, during repeated testing, physical damage to the circuit board and its components is easy to occur. In particular, fragile components are easily damaged due to excessive force applied during the testing process. Therefore, there is a need to improve the existing technology. Utility Model Content

[0004] The purpose of this patent is to provide a probe test pull-out tooling device to solve the problems raised in the above background technology.

[0005] To achieve the above objectives, this patent provides the following technical solutions: a probe test pull-out tooling device, comprising a test machine body, wherein both ends of the front side wall of the test machine body are equipped with quick-release clamps, and a bakelite tooling plate is placed between the two quick-release clamps;

[0006] Both sides of the testing machine body are equipped with a left drive mechanism and a right drive mechanism. The left drive mechanism includes a left X-axis cylinder, a left Y-axis cylinder and a left Z-axis cylinder installed at the left drive end of the testing machine body. The drive ends of the left X-axis cylinder, the left Y-axis cylinder and the left Z-axis cylinder are all equipped with a connecting block a;

[0007] The right driving mechanism includes a right X-axis cylinder, a right Y-axis cylinder and a right Z-axis cylinder installed on the right driving end of the testing machine body, and the driving ends of the right X-axis cylinder, the right Y-axis cylinder and the right Z-axis cylinder are all equipped with a connecting block b;

[0008] The connection block a is equipped with a probe assembly a, and the connection block b is equipped with a probe assembly b;

[0009] The probe assembly a and the probe assembly b include a carrier, a fixing body is mounted on the lower end of the carrier, and a probe is mounted on the lower end of the fixing body;

[0010] The upper end of the testing machine body is equipped with a switch button.

[0011] Preferably, the upper and lower side walls of the fixing body are both provided with connection ports, and the upper end of the probe extends into the carrier body after passing through the connection ports.

[0012] Preferably, the probe is fitted with a sealing assembly, and the sealing assembly is arranged inside the fixed body, the sealing assembly includes a rubber pad a and a rubber pad b, a fixing ring is installed on the side wall of the rubber pad a facing the rubber pad b, and rubber blocks are evenly and equidistantly installed on the side wall of the fixing ring along its axis.

[0013] Preferably, the outer diameters of the rubber pad a and the rubber pad b are both larger than the inner diameter of the connecting port.

[0014] Preferably, the outer wall of the probe is provided with an external thread, and the inner wall of the fixing body is provided with an internal thread, and the internal thread and the external thread match each other.

[0015] Preferably, an equipment housing is assembled on the upper end of the outer wall of the testing machine body.

[0016] Compared with the existing technology, the beneficial effects of this patent are: the probe test pull-out tooling device has a simple structure and is easy to operate. It effectively solves the challenges faced in electronic component testing, not only improves the test quality and efficiency, but also promotes the intelligent and lean management of the production process, bringing significant benefits to the electronics manufacturing industry. In addition, the integrated precision mechanical structure and high-quality probe system work together to accurately locate each test point, significantly reducing the error rate, and the test results can achieve a high degree of accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 This is a schematic diagram of the structure of this patent;

[0018] Figure 2 This is an internal schematic diagram of this patent;

[0019] Figure 3 This is a local diagram of the probe point of this patent;

[0020] Figure 4 This is a schematic diagram of the probe assembly of this patent;

[0021] Figure 5 This is a cross-sectional view of the fixed body of this patent.

[0022] In the figure: 1 disassembly clamp, 2 switch button, 3 tooling plate, 4 probe assembly, 5 left X-axis cylinder, 6 left Y-axis cylinder, 7 left Z-axis cylinder, 8 right X-axis cylinder, 9 right Y-axis cylinder, 10 right Z-axis cylinder, 11 probe assembly b, 111 carrier, 112 fixed body, 113 probe, 12 test machine body, 13 equipment housing, 14 rubber pad a, 15 fixing ring, 16 rubber fastener, 17 rubber pad b, 18 connecting port, 19 external thread, 20 internal thread. DETAILED DESCRIPTION

[0023] The following will be combined with the drawings in the embodiments of this patent to clearly and completely describe the technical solutions in the embodiments of this patent. Obviously, the embodiments described are only part of the embodiments of this patent, not all of them. Based on the embodiments of this patent, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this patent.

[0024] See also Figures 1 to 5 This patent provides a technical solution: a probe test pulling tooling device, including a test machine body 12, characterized in that: both ends of the front side wall of the test machine body 12 are equipped with quick-release clamps 1, and a bakelite tooling board 3 is placed between the two quick-release clamps 1;

[0025] The upper end of the testing machine body 12 is equipped with a switch button 2;

[0026] Both sides of the testing machine body 12 are equipped with a left drive mechanism and a right drive mechanism. The left drive mechanism includes a left X-axis cylinder 5, a left Y-axis cylinder 6, and a left Z-axis cylinder 7 installed on the left drive end of the testing machine body 12. The drive ends of the left X-axis cylinder 5, the left Y-axis cylinder 6, and the left Z-axis cylinder 7 are all equipped with a connecting block a.

[0027] The right drive mechanism includes a right X-axis cylinder 8, a right Y-axis cylinder 9 and a right Z-axis cylinder 10 installed on the right driving end of the testing machine body 12. The driving ends of the right X-axis cylinder 8, the right Y-axis cylinder 9 and the right Z-axis cylinder 10 are all equipped with a connecting block b

[0028] The connection block a is equipped with a probe assembly a4, and the connection block b is equipped with a probe assembly b11;

[0029] The probe assembly a4 and the probe assembly b11 include a carrier 111, a fixed body 112 is installed at the lower end of the carrier 111, and a probe 113 is assembled at the lower end of the fixed body 112. The carrier 111 is installed at the lower end of the connecting block a and the connecting block b, and the probe 113 can be installed through the fixed body 112 set at the lower end of the carrier 111.

[0030] The upper and lower side walls of the fixed body 112 are both provided with connection ports 18. The upper end of the probe 113 passes through the connection port 18 and extends into the carrier 111. The upper end of the probe 113 passes through the fixed body 112 through the connection port 18 and then extends into the carrier 111 and connects to the probe testing mechanism.

[0031] The probe 113 is equipped with a sealing assembly, and the sealing assembly is arranged inside the fixed body 112. The sealing assembly includes a rubber pad a14 and a rubber pad b17. A fixing ring 15 is installed on the side wall of the rubber pad a14 facing the rubber pad b17. The side wall of the fixing ring 15 is evenly and equidistantly installed with rubber blocks 16 along its axis. After the probe 113 enters the fixed body 112, the gap between the probe 113 and the connecting port 18 is sealed by the sealing assembly.

[0032] The outer diameters of the rubber pad a14 and the rubber pad b17 are both larger than the inner diameter of the connecting port 18 .

[0033] The outer wall of the probe 113 is provided with an external thread 19, and the inner wall of the fixed body 112 is provided with an internal thread 20. The internal thread 20 and the external thread 19 cooperate with each other. Through the thread cooperation, the probe 113 enters the fixed body 112 by rotating and inserting.

[0034] An equipment housing 13 is mounted on the upper end of the outer wall of the testing machine body 12 .

[0035] Tooling process and principle: The operator adjusts the quick pressing clamps 1 on both sides to the open and closed state, inserts the bakelite tooling board 3 in the horizontal direction of the notches on both sides, adjusts the quick pressing clamp 1 to the closed state, and clicks the switch button 2 with both hands. The air circuit and the circuit of the device are opened, and the electric cylinder 7 is controlled by the signal of the driver to drive the connecting block to move along the X-axis direction. The cylinder 6 connected to the X-axis connecting block is also driven to move along the X-axis direction. The cylinder 6 extends to the working position, driving the Y-axis connecting block to move, and the cylinder 5 connected to the Y-axis connecting block is also driven to move along the Y-axis direction. The cylinder 5 extends to the working position, driving the Z-axis connecting block to move up and down, and the probe assembly 4 connected to the Z-axis connecting block is also driven The Z-axis moves up and down to the working position, so that the probe reaches the specified point to be measured on the tooling plate for testing. The electric cylinder 8 on the left side is controlled by the signal of the driver, driving the connecting block to move along the X-axis direction. The cylinder 9 connected to the X-axis connecting block is also driven to move along the X-axis direction. The cylinder 9 extends to the designated working position, driving the Y-axis connecting block to move, and the cylinder 10 connected to the Y-axis connecting block is also driven to move along the Y-axis direction. The cylinder 10 extends to the working position, driving the Z-axis connecting block to move up and down, and the probe assembly 11 connected to the Z-axis connecting block is also driven to move up and down on the Z-axis to the working position, so that the probe reaches the specified point to be measured on the tooling plate for testing. After the points on the tooling board are tested by the left and right probe assemblies, the left Z-axis cylinder 10 and the right Z-axis cylinder 5 are retracted to their original positions, the left cylinder 9 and the right cylinder 6 in the Y-axis direction are retracted to their original positions, and the left electric cylinder 8 and the right electric cylinder 7 in the X-axis direction are controlled by the driver signal to retract to their original positions. Then, the operator adjusts the quick pressing clamps 1 on both sides to the open and closed state, takes out the bakelite tooling board 3, and completes the test.

[0036] It will be apparent to those skilled in the art that this patent is not limited to the details of the exemplary embodiments described above, and that this patent can be implemented in other specific forms without departing from the spirit or essential characteristics of this patent. Therefore, the embodiments should be considered in all respects as illustrative and non-restrictive, and the scope of this patent is defined by the appended claims rather than the foregoing description, and it is intended that all changes that fall within the meaning and range of equivalents of the claims be encompassed within this patent. Any reference sign in a claim should not be construed as limiting the claim to which it relates.

[0037] In addition, it should be understood that although this specification is described in terms of implementation methods, not every implementation method contains only one independent technical solution. This narrative method of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment can also be appropriately combined to form other implementation methods that can be understood by those skilled in the art.

Claims

1. A probe test pulling fixture device, comprising a test machine body (12), characterized in that: Both ends of the front side wall of the testing machine body (12) are equipped with quick-release clamps (1), and a bakelite work panel (3) is placed between the two quick-release clamps (1); Both sides of the testing machine body (12) are equipped with a left driving mechanism and a right driving mechanism, the left driving mechanism comprises a left X-axis cylinder (5), a left Y-axis cylinder (6) and a left Z-axis cylinder (7) installed at the left driving end of the testing machine body (12), and the driving ends of the left X-axis cylinder (5), the left Y-axis cylinder (6) and the left Z-axis cylinder (7) are all equipped with a connecting block a; The right driving mechanism comprises a right X-axis cylinder (8), a right Y-axis cylinder (9) and a right Z-axis cylinder (10) mounted on the right driving end of the testing machine body (12), and the driving ends of the right X-axis cylinder (8), the right Y-axis cylinder (9) and the right Z-axis cylinder (10) are all equipped with a connecting block b The connection block a is equipped with a probe assembly a (4), and the connection block b is equipped with a probe assembly b (11); The probe assembly a (4) and the probe assembly b (11) comprise a carrier (111), a fixing body (112) is mounted on the lower end of the carrier (111), and a probe (113) is mounted on the lower end of the fixing body (112); The upper end of the testing machine body (12) is equipped with a switch button (2).

2. The probe test pulling fixture device according to claim 1, characterized in that: The upper and lower side walls of the fixed body (112) are both provided with connection openings (18), and the upper end of the probe (113) passes through the connection opening (18) and extends into the carrier (111).

3. The probe test pulling fixture device according to claim 2, characterized in that: The probe (113) is sheathed with a sealing assembly, and the sealing assembly is arranged inside the fixed body (112), the sealing assembly includes a rubber pad a (14) and a rubber pad b (17), a fixing ring (15) is installed on the side wall of the rubber pad a (14) facing the rubber pad b (17), and rubber blocks (16) are evenly and equidistantly installed on the side wall of the fixing ring (15) along its axis.

4. The probe test pulling fixture device according to claim 3, characterized in that: The outer diameters of the rubber pad a (14) and the rubber pad b (17) are both larger than the inner diameter of the connecting port (18).

5. The probe test pulling fixture device according to claim 1, characterized in that: The outer wall of the probe (113) is provided with an external thread (19), and the inner wall of the fixing body (112) is provided with an internal thread (20), and the internal thread (20) and the external thread (19) are matched.

6. The probe test pulling fixture device according to claim 1, characterized in that: The upper end of the outer wall of the testing machine body (12) is equipped with a device housing (13).

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