Adjustable pressing device and infrared spectrum testing device

Abstract

The utility model provides an adjustable pressing device and an infrared spectrum testing device, and relates to the technical field of infrared spectrum testing. The infrared spectrum testing device comprises an optical detection device and an adjustable pressing device, and the adjustable pressing device is detachably connected with the optical detection device. Wherein the adjustable pressing device is used for pressing a sample placed on the optical detection device, and the adjustable pressing device comprises a base which is detachably mounted on the optical detection device; the connecting piece is rotationally connected with the base; the pressing head is used for pressing the sample; the pressing head is connected with the connecting piece, and the connecting piece at least drives the pressing head to conduct pitching rotation. The adjustable pressing device provided by the utility model can help the infrared spectrum testing device to detect a sample with a relatively large size, expands the use scene of the infrared spectrum testing device, and also can prolong the service life of the infrared spectrum testing device.

Description

Technical Field

[0001] The present application relates to the field of infrared spectrum testing technology, and in particular to an adjustable pressing device and an infrared spectrum testing device. Background Art

[0002] Infrared spectroscopy testing equipment is an indispensable and important tool in modern analytical chemistry, and plays a key role in many fields such as organic chemistry and materials science.

[0003] Infrared spectroscopy testing devices typically include an optical detection device and a pressing device. The sample is placed on the crystal of the optical detection device, and then the sample and crystal are tightly pressed together using the pressing head of the pressing device. The optical engine of the optical detection device emits infrared light and directs it onto the crystal. Because the refractive index of the crystal is higher than that of the sample, most of the infrared light is totally reflected at the interface between the crystal and the sample. A small amount of infrared light forms an attenuated reflected wave at the interface, penetrates into the sample, and then returns to the surface. During this process, the molecules in the sample absorb infrared light of specific wavelengths, thereby changing the intensity of the infrared light. The reflected infrared light is then directed to the detector to form a spectrum of the sample, thereby determining the chemical composition and molecular structure of the sample.

[0004] However, the existing pressing device cannot adjust the distance between the pressing head and the crystal or the adjustment range is small. When the sample size is large, it cannot be placed between the pressing head and the crystal, resulting in the infrared spectrum testing device being unable to detect the sample. Utility Model Content

[0005] In view of the above problems, the embodiments of the present application provide an adjustable pressing device and an infrared spectroscopy testing device. The adjustable pressing device can help the infrared spectroscopy testing device detect samples with larger sizes, expand the use scenarios of the infrared spectroscopy testing device, and extend the service life of the infrared spectroscopy testing device.

[0006] In order to achieve the above objectives, the embodiments of the present application provide the following technical solutions:

[0007] One aspect of an embodiment of the present application provides an adjustable pressing device for pressing a sample placed on an optical detection device, the adjustable pressing device comprising:

[0008] a base, detachably mounted on the optical detection device;

[0009] A connecting piece, rotatably connected to the base;

[0010] The pressing head is used to press the sample; the pressing head is connected to the connecting piece, and the connecting piece at least drives the pressing head to pitch and rotate.

[0011] In a possible implementation, the connecting member includes a rotating portion and a supporting portion that are connected to each other, the rotating portion is rotatably connected to the base, and the supporting portion is connected to the outer side wall of the pressure head.

[0012] In a possible embodiment, the base includes a base body, a mounting groove is formed on the base body, the mounting groove has a notch facing the pressure head, and the rotating portion extends into the mounting groove and is rotatably connected to the base body.

[0013] In a possible embodiment, the base also includes a self-locking part, and a self-locking hole is provided on the base body. The self-locking hole extends from the side wall of the base body away from the rotating part to the groove wall of the installation groove. The self-locking part slides along the self-locking hole and passes through the self-locking hole to abut the rotating part.

[0014] In a possible implementation manner, the rotating portion is provided with at least one positioning groove, and the self-locking member is inserted into the positioning groove.

[0015] In a possible implementation manner, the support portion is movably connected to the pressing head, and the support portion can be fixed relative to different positions of the pressing head in a height direction.

[0016] In a possible embodiment, one of the support portion and the side wall of the pressure head is provided with a plurality of adjustment holes spaced apart in the height direction, and the other is provided with a positioning portion that can be matched and connected with each adjustment hole.

[0017] In a possible embodiment, one of the support portion and the side wall of the pressure head is provided with a slide rail extending in the height direction, and the other is provided with a slider that slides along the slide rail.

[0018] In a possible implementation, fixing feet are provided on two opposite sides of the base, and the fixing feet are configured to be detachably connected to the optical detection device.

[0019] Another aspect of the present application provides an infrared spectrum testing device, which includes an optical detection device and the adjustable pressing device as described above, and the adjustable pressing device is detachably connected to the optical detection device.

[0020] The infrared spectrum testing device provided in the embodiment of the present application includes an optical detection device and an adjustable pressing device, the adjustable pressing device is detachably connected to the optical detection device, and the adjustable pressing device is used to press the sample placed on the optical detection device. Among them, the adjustable pressing device includes a base, a connector and a pressure head. The base is detachably mounted on the optical detection device, the connector is rotatably connected to the base, and the pressure head is connected to the connector. The pressure head is used to press the sample placed on the optical detection device. By rotating the connector around the base, the connector can at least drive the pressure head to pitch and rotate, thereby adjusting the distance between the pressure head and the optical detection device. In this way, the adjustable pressing device can help the optical detection device detect samples of larger sizes, expand the use scenarios of the infrared spectrum testing device, and prevent the pressure head from crushing samples or crystals, thereby extending the service life of the infrared spectrum testing device. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0022] Figure 1 A schematic diagram of the structure of the infrared spectrum testing device provided in an embodiment of the present application;

[0023] Figure 2 for Figure 1 A structural diagram of one state of the adjustable pressing device;

[0024] Figure 3 for Figure 2 A schematic diagram of the structure of the base;

[0025] Figure 4 for Figure 2 A top view of the base in FIG;

[0026] Figure 5 for Figure 2 Schematic diagram of the structure of the connecting parts;

[0027] Figure 6 for Figure 2 A top view of the adjustable pressing device in FIG.

[0028] Figure 7 for Figure 6 A full cross-sectional view of the adjustable pressing device along AA;

[0029] Figure 8 for Figure 2 A structural schematic diagram of another state of the adjustable pressing device in FIG.

[0030] Description of reference numerals:

[0031] 1-Infrared spectrum testing device;

[0032] 10- Optical detection device;

[0033] 110-crystal; 120-crystal disk;

[0034] 20-Adjustable pressing device;

[0035] 210-base; 220-connector; 230-pressing head;

[0036] 211 - seat body; 212 - mounting slot; 213 - self-locking member; 214 - fixing foot; 221 - rotating part; 222 - supporting part; 231 - pressure needle; 232 - adjustment hole;

[0037] 2110-self-locking hole; 2210-positioning groove; 2221-positioning part. DETAILED DESCRIPTION

[0038] As described in the background, infrared spectroscopy testing devices typically include an optical detection device and a clamping device. A sample is placed on a crystal in the optical detection device, and then a pressing head on the clamping device tightly presses the sample and crystal together. However, existing clamping devices cannot adjust the distance between the pressing head and the crystal, or the adjustment range is small. For large samples, the pressing head cannot fit between the pressing head and the crystal, resulting in the infrared spectroscopy testing device being unable to detect the sample.

[0039] In view of this, the infrared spectrum testing device provided in the embodiment of the present application includes an optical detection device and an adjustable pressing device, the adjustable pressing device is detachably connected to the optical detection device, and the adjustable pressing device is used to press the sample placed on the optical detection device. Among them, the adjustable pressing device includes a base, a connector and a pressure head. The base is detachably mounted on the optical detection device, the connector is rotatably connected to the base, and the pressure head is connected to the connector. The pressure head is used to press the sample placed on the optical detection device. By rotating the connector around the base, the connector can at least drive the pressure head to pitch and rotate, thereby adjusting the distance between the pressure head and the optical detection device. In this way, the adjustable pressing device can help the optical detection device detect samples of larger sizes, expand the use scenarios of the infrared spectrum testing device, and prevent the pressure head from crushing samples or crystals, thereby extending the service life of the infrared spectrum testing device.

[0040] In order to make the above-mentioned purposes, features and advantages of the embodiments of the present application more obvious and easy to understand, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0041] Figure 1 This is a schematic diagram of the structure of the infrared spectrum testing device provided in the embodiment of the present application. Figure 1 As shown, an embodiment of the present application provides an infrared spectroscopy testing device 1, which is used to detect the molecular structure and chemical composition of a sample. The infrared spectroscopy testing device 1 includes a transmission spectrometer, a reflection spectrometer, and a spectral scanner. The infrared spectroscopy testing device 1 may also include a Fourier transform attenuated total reflection infrared spectrometer. A Fourier transform attenuated total reflection infrared spectrometer can perform nondestructive testing on samples and is particularly suitable for analyzing solid and thin film samples.

[0042] The sample detected by the infrared spectrum testing device 1 can be materials such as leather, plastic, rubber, etc. The sample can also be materials such as liquid, powder, sol, paste, polymer film, etc.

[0043] The infrared spectrum testing device 1 includes an optical detection device 10 , which is a core component of the infrared spectrum testing device 1 and is mainly used for detecting and analyzing samples.

[0044] The optical detection device 10 includes an optical engine, a beam splitting and interference system, an attenuated total reflection accessory (ATR accessory), a detector, and a data processing system. Figure 1 The optical detection device 10 is also provided with a housing, an optical engine, an ATR accessory, a detector and a data processing system are located in Figure 1 Inside the housing of the optical detection device 10, Figure 1 Not shown.

[0045] The ATR accessory includes a crystal 110 and a crystal plate 120. Crystal plate 120 is fixed to the ATR accessory and is used to hold crystal 110. Crystal 110 is fixed in the center of crystal plate 120. Crystal 110 is typically made of a high-refractive-index material, such as diamond, zinc selenide, or germanium.

[0046] The sample is placed on crystal 110 of optical detection device 10. The optical engine generates infrared light, which, after passing through a beam splitting and interference system, illuminates crystal 110 of the ATR accessory. Because crystal 110 has a higher refractive index than the sample, most of the infrared light is totally reflected at the interface between crystal 110 and the sample. A small portion of the infrared light forms an attenuated reflection wave at the inflection point of the infrared light at the interface. This attenuated reflection wave penetrates a certain depth into the sample before returning to the surface.

[0047] During this process, the molecules in the sample interact with the attenuated reflected waves. The molecules in the sample absorb infrared light of specific frequencies, causing them to vibrate or rotate, ultimately changing the intensity of the infrared light. The reflected infrared light is directed to a detector, which converts the intensity of the infrared light into an electrical signal. A data processing system processes this signal to produce a spectrum similar to that of transmission absorption. Researchers can use this spectrum to identify the chemical composition and molecular structure of the sample.

[0048] Reference Figure 1 As shown, the infrared spectrum testing device 1 also includes an adjustable pressing device 20. The adjustable pressing device 20 is used to compress a sample placed on the optical detection device 10. The adjustable pressing device 20 presses the sample against the crystal 110 on the optical detection device 10, ensuring close contact between the sample and the crystal 110. This prevents infrared light scattering or leakage at the interface between the sample and the crystal 110, which could result in inaccurate spectra and problems with sample analysis.

[0049] The adjustable pressing device 20 is detachably connected to the optical detection device 10. For example, the adjustable pressing device 20 and the optical detection device 10 can be connected by fasteners, the adjustable pressing device 20 can also be connected to the optical detection device 10 by a snap connection, or the adjustable pressing device 20 and the optical detection device 10 can also be connected by magnetic attraction.

[0050] Figure 2 for Figure 1 A schematic diagram of a structure of an adjustable pressing device in one state. Figure 2 As shown, the adjustable pressing device 20 includes a base 210, a connector 220 and a pressure head 230. The connector 220 is rotatably connected to the base 210, and the connector 220 can rotate relative to the base 210. The pressure head 230 is connected to the connector 220, and the pressure head 230 is used to compress the sample. With such an arrangement, the distance between the pressure head 230 and the crystal 110 can be adjusted by rotating the connector 220 relative to the base 210 to detect samples of larger sizes, thereby expanding the use scenarios of the infrared spectrum testing device 1. In addition, the adjustable pressing device 20 can adjust the distance between the pressure head 230 and the crystal 110, and can also prevent the pressure head 230 from crushing the crystal 110, thereby extending the service life of the infrared spectrum testing device 1.

[0051] The adjustable pressing device 20 is fixed to the optical detection device 10 via the base 210. The connection between the base 210 and the optical detection device 10 creates a force. A sample is placed on the crystal 110 of the optical detection device 10. The pressing head 230 is connected to the fixed base 210 via a connector 220. The pressing head 230 uses the force between the base 210 and the optical detection device 10 to press the sample tightly against the crystal 110, ensuring that the sample and crystal are in close contact. This ensures that infrared light is fully reflected at the interface between the sample and the crystal, thereby obtaining an accurate sample spectrum.

[0052] The base 210 is mounted on the optical detection device 10 to maintain the reliability and stability of the adjustable pressing device 20. Furthermore, the base 210 is detachable from the optical detection device 10, which facilitates replacement of the adjustable pressing device 20. The adjustable pressing device 20 can also be mounted on different optical detection devices 10 for use, thereby reducing the cost of using the infrared spectrum testing device 1.

[0053] For ease of explanation, the interface between the base 210 and the optical inspection device 10 is defined as the bottom surface of the base 210, and the surface opposite the bottom surface is defined as the top surface of the base 210. The plane of the base 210 closest to the indenter 230 is defined as the front surface of the base 210, and the surface opposite the front surface is defined as the back surface of the base 210.

[0054] Figure 3 for Figure 2 Schematic diagram of the structure of the base. Figure 4 for Figure 2 A top view of the base in . Figure 3 and Figure 4 As shown, the base 210 includes a base body 211, which is provided with a mounting slot 212. The mounting slot 212 has a notch facing the pressure head 230. The notch is continuous on the front and top surfaces of the base 210. The connector 220 extends through the notch into the mounting slot 212 and is rotatably connected to the base body 211. The connector 220 drives the pressure head 230 to rotate more smoothly, making the pressure applied by the pressure head 230 on the sample more balanced.

[0055] As an embodiment, the base 210 is provided with components such as a motor, gears, and a transmission belt. The motor drives the connector 220 to rotate. By starting and stopping the motor, the connector 220 is stopped at different angles, so that the indenter 230 follows the connector 220, and the distance between the indenter 230 and the base 210 is adjusted. In this way, the distance between the indenter 230 and the crystal 110 is changed, and samples of different sizes can be tested.

[0056] In another embodiment, the base 210 further includes a self-locking member 213, which is used to lock the connector 220 to prevent relative rotation between the connector 220 and the base 210, which could cause changes in the pressure applied by the indenter 230 on the sample and affect the accuracy of sample analysis. For example, the self-locking member 213 can be a fastener such as a bolt, or a self-locking spring plunger or a self-locking indexing pin. This application is not limited to this.

[0057] The following description will be made based on a connection method in which the base 210 includes the self-locking member 213 and the self-locking member 213 locks the connecting member 220 .

[0058] Furthermore, the base 211 is provided with a self-locking hole 2110. The self-locking hole 2110 extends from the side wall of the base 211 facing away from the connection between the connector 220 and the base 211 to the groove wall of the mounting groove 212. In other words, the self-locking hole 2110 extends from the back of the base 211 to the groove wall of the mounting groove 212. The self-locking member 213 moves along the self-locking hole 2110 and passes through the self-locking hole 2110 to abut the connector 220. The self-locking hole 2110 abuts the connector 220, and friction exists between the self-locking member 213 and the connector 220 to lock the connector 220. The self-locking member 213 moves along the self-locking hole 2110, and the rotation angle of the connector 220 can be adjusted at any time, which is very convenient to use when frequently changing samples.

[0059] For example, the self-locking hole 2110 can be processed with an internal thread, and the self-locking member 213 can be a bolt. When the self-locking member 213 rotates, the self-locking member 213 moves relative to the self-locking hole 2110 until it abuts the connecting member 220. Alternatively, the self-locking hole 2110 can be processed with an internal thread, and the self-locking member 213 can be a self-locking spring plunger. The self-locking member 213 is installed in the self-locking hole 2110. The plunger pin of the self-locking member 213 can be pulled out toward the back of the base 210 and will not fall out due to the action of the internal spring. After the connecting member 220 is adjusted to a desired angle, the plunger pin is released. Under the action of the spring, the plunger pin abuts against the connecting member 220 to lock the connecting member 220.

[0060] In addition, fixed feet 214 are provided on opposite sides of the base 210, and the fixed feet 214 are configured to be detachably connected to the optical detection device 10. The fixed feet 214 are used to fix the adjustable pressing device 20 on the optical detection device 10. The fixed feet 214 can be designed to be smaller in size to reduce the material used for the base 210. Moreover, the smaller size of the fixed feet 214 can also reduce the weight of the adjustable pressing device 20 and save the cost of the adjustable pressing device 20. Exemplarily, a through hole is provided on the fixed feet 214, and a corresponding threaded hole is processed on the optical detection device 10. After the through hole on the fixed feet 214 is aligned with the threaded hole on the optical detection device 10, the adjustable pressing device 20 is fixed to the optical detection device 10 using fasteners such as bolts.

[0061] Figure 5 for Figure 2 Schematic diagram of the structure of the connector. Figure 2 and Figure 5 As shown, the connecting member 220 includes a rotating portion 221 and a supporting portion 222, and the rotating portion 221 and the supporting portion 222 are connected as a whole. The rotating portion 221 is rotatably connected to the base 210. Specifically, the rotating portion 221 extends into the mounting groove 212 and is rotatably connected to the base body 211. The supporting portion 222 is connected to the pressure head 230, and the connecting member 220 at least drives the pressure head 230 to perform a pitch rotation. In other words, the supporting portion 222 at least drives the pressure head 230 to perform a pitch rotation. With such a configuration, the distance between the pressure head 230 and the crystal 110 can be adjusted to detect samples of larger sizes, thereby expanding the use scenarios of the infrared spectrum testing device 1.

[0062] As an embodiment, the direction in which the pressure applied by the pressure head 230 is perpendicular to the bottom surface of the base 210 is the natural state of the adjustable pressing device 20. That is to say, when the pressure applied by the pressure head 230 is perpendicular to the bottom surface of the base 210, the rotating part 221 does not rotate. In the embodiment of the present application, the rotating part 221 can be rotated 90 degrees in pitch, and the support part 222 drives the pressure head 230 to be rotated 90 degrees in pitch. When the support part 222 drives the pressure head 230 to rotate 90 degrees, the pressure head 230 is parallel to the bottom surface of the base 210. At this time, the distance between the pressure head 230 and the crystal 110 is the largest, and the sample size that can be detected is larger. Furthermore, the pitch rotation angle of the rotating part 221 is less than 90 degrees, and the pressure head 230 can be pressed on the sample under the action of gravity, which can reduce the pressure applied by the pressure head 230.

[0063] Specifically, the surface of the rotating portion 221 facing the wall of the mounting slot 212 and the surface parallel to the top surface of the base 210 are both smooth, arcuate surfaces. A self-locking hole 2110 extends from the side wall of the base 211 facing away from the rotating portion 221 to the wall of the mounting slot 212. The self-locking member 213 moves along the self-locking hole 2110 and abuts the rotating portion 221, preventing the connecting member 220 from rotating.

[0064] The rotating portion 221 can be provided with a positioning groove 2210, which can be located on a plane opposite the rotating portion 221 and the mounting groove 212. When the infrared spectrum testing device 1 is not performing sample testing, that is, when the adjustable pressing device 20 is in a neutral state, the pressure direction of the pressing head 230 is perpendicular to the bottom surface of the base 210. The self-locking member 213 is inserted into the positioning groove 2210 to prevent the rotating portion 221 from rotating, causing the pressing head 230 connected to the support portion 222 to strike the crystal 110 and damage the crystal 110.

[0065] Alternatively, the rotating portion 221 may be provided with two positioning grooves 2210. One positioning groove 2210 is provided on the plane of the rotating portion 221 opposite the mounting groove 212, and the other is provided perpendicular to this plane. In this case, the pressure direction of the indenter 230 is perpendicular to or parallel to the bottom surface of the base 210. By inserting the self-locking member 213 into the positioning groove 2210, damage to the crystal 110 can be prevented, and the indenter 230 connected to the support portion 222 can be prevented from colliding with the base 210 and damaging the indenter 230.

[0066] Alternatively, the rotating portion 221 may be provided with multiple positioning grooves 2210 evenly spaced on the abutting surface of the rotating portion 221. By inserting the self-locking members 213 into each of the positioning grooves 2210, the rotating portion 221 can be fixed at various angles. This approach offers a simple structure and high reliability, making it suitable for use when high pressure is applied to the sample.

[0067] The rotating portion 221 and the supporting portion 222 are connected as one body, and the supporting portion 222 is connected to the outer wall of the indenter 230. In this way, the indenter 230 is driven by the rotating portion 221 to have a greater distance from the crystal 110, so that larger samples can be tested.

[0068] Specifically, the support portion 222 is located on the upper side of the rotating portion 221 and at one end of the rotating portion 221. The support portion 222 is connected to the outer wall of the pressure head 230. That is, the support portion 222 and the rotating portion 221 form an L-shaped structure, and the distance between the pressure head 230 and the crystal 110 is 0.

[0069] The support portion 222 is movably connected to the indenter 230, and the support portion 222 can be fixed relative to the indenter 230 at different locations in the height direction. By adjusting the relative height position of the support portion 222 and the indenter 230, and adjusting the distance between the indenter 230 and the crystal 110, samples of different sizes can be tested, thereby expanding the use cases of the infrared spectroscopy testing device 1.

[0070] As an embodiment, the support portion 222 and the pressure head 230 can be movably connected by a self-locking slide rail. Alternatively, the support portion 222 and the pressure head 230 can also be connected by a self-locking adjustable support rod.

[0071] Specifically, a slide rail (not shown in the figure) extending in the height direction is provided on the side wall of the support portion 222, and a slider (not shown in the figure) is provided on the side wall of the pressure head 230. The slider slides along the slide rail to adjust the distance between the pressure head 230 and the crystal 110 to detect samples of different sizes.

[0072] Alternatively, a slide rail (not shown in the figure) extending in the height direction is provided on the side wall of the indenter 230, and a slider (not shown in the figure) is provided on the side wall of the support portion 222. The slider slides along the slide rail to adjust the distance between the indenter 230 and the crystal 110 to detect samples of different sizes.

[0073] Figure 6 for Figure 2 A top view of the adjustable clamping device in FIG. Figure 7 for Figure 6 A full cross-sectional view of the adjustable clamping device along AA. Figure 6 and Figure 7 As shown, the support portion 222 can also be fixed to the indenter 230 in the following manner. As an embodiment, a plurality of adjustment holes 232 are provided on the side wall of the indenter 230 at intervals along the direction of applied pressure, and a positioning portion 2221 is provided on the side wall of the support portion 222. The positioning portion 2221 can be connected to one of the adjustment holes 232. The positioning portion 2221 can be connected to the adjustment holes 232 at different positions, thereby adjusting the distance between the indenter 230 and the crystal 110 to detect samples of different sizes. For example, the adjustment hole 232 can be a threaded hole. The positioning portion 2221 can be a smooth hole. The support portion 222 and the indenter 230 can be fixed by fasteners.

[0074] As another embodiment, a plurality of adjustment holes 232 are provided on the side wall of the support portion 222 at intervals along the height direction, and a positioning portion 2221 is provided on the side wall of the indenter 230. The positioning portion 2221 can be connected to one of the adjustment holes 232. The positioning portion 2221 can be connected to the adjustment holes 232 at different positions to adjust the distance between the indenter 230 and the crystal 110 to detect samples of different sizes. For example, the adjustment hole 232 can be a through hole. The positioning portion 2221 can be a stud with an external thread. After the adjustment hole 232 is inserted into the positioning portion 2221, it is tightened with a nut to fix the support portion 222 and the indenter 230.

[0075] In addition, the indenter 230 includes a pressure needle 231, which is used to tightly fit the sample to the crystal 110. The pressure per unit area applied by the pressure needle 231 is greater. The height of the indenter 230 can be adjusted by adjusting the pressure needle 231.

[0076] Figure 8 for Figure 2 Schematic diagram of the structure of another state of the adjustable pressing device. Figure 8 As shown, the operation process of the infrared spectrum testing device 1 is as follows:

[0077] First, the adjustable clamping device 20 is installed on the optical detection device 10. At this point, the adjustable clamping device 20 is in a natural state, and the indenter 230 is perpendicular to the bottom surface of the base 210. Then, the self-locking member 213 is moved along the self-locking hole 2110 from the front to the back of the base 210 to place the sample between the indenter 230 and the crystal 110. Next, the connecting member 220 is adjusted to an appropriate angle so that the distance between the indenter 230 and the crystal 110 matches the size of the test sample. The self-locking member 213 is then moved along the self-locking hole 2110 from the back to the front of the base 210 to abut against the rotating portion 221. The friction between the self-locking member 213 and the rotating portion 221 locks the rotating portion 221, and the indenter 230 tightly fits the sample to the crystal 110. Finally, the optical detection device 10 is operated to complete the detection output spectrum of the sample, and the molecular structure and chemical composition of the sample are determined based on the spectrum.

[0078] The various embodiments or implementation methods in this specification are described in a progressive manner. Each embodiment focuses on the differences from other embodiments, and the same or similar parts between the various embodiments can be referenced to each other.

[0079] Throughout this specification, reference to terms such as "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples" means that a specific feature, structure, material, or characteristic described in conjunction with an embodiment or example is included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0080] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some or all of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present application.

Claims

1. An adjustable pressing device for pressing a sample placed on an optical detection device, characterized in that: The adjustable pressing device comprises: a base, detachably mounted on the optical detection device; a connecting member, rotatably connected to the base; The pressing head is used to press the sample; the pressing head is connected to the connecting member, and the connecting member at least drives the pressing head to perform pitch rotation.

2. The adjustable pressing device according to claim 1, characterized in that: The connecting member includes a rotating portion and a supporting portion connected to each other, the rotating portion is rotatably connected to the base, and the supporting portion is connected to the outer side wall of the pressure head.

3. The adjustable pressing device according to claim 2, characterized in that: The base includes a base body, a mounting groove is formed on the base body, and the mounting groove has a notch facing the pressure head. The rotating part extends into the mounting groove and is rotatably connected to the base body.

4. The adjustable pressing device according to claim 3, characterized in that: The base also includes a self-locking part, and a self-locking hole is provided on the base body. The self-locking hole extends from the side wall of the base body away from the rotating part to the groove wall of the installation groove. The self-locking part moves along the self-locking hole and passes through the self-locking hole to abut the rotating part.

5. The adjustable pressing device according to claim 4, characterized in that: The rotating portion is provided with at least one positioning groove, and the self-locking member is inserted into the positioning groove.

6. The adjustable pressing device according to any one of claims 2 to 5, characterized in that: The support portion is movably connected to the pressure head, and the support portion can be fixed relative to different positions of the pressure head in a height direction.

7. The adjustable pressing device according to claim 6, characterized in that: One of the support portion and the side wall of the pressure head is provided with a plurality of adjustment holes spaced apart along the height direction, and the other is provided with a positioning portion, which can be matched and connected with each of the adjustment holes.

8. The adjustable pressing device according to claim 6, characterized in that: One of the support portion and the side wall of the pressure head is provided with a slide rail extending in a height direction, and the other is provided with a slider, and the slider slides along the slide rail.

9. The adjustable pressing device according to any one of claims 1 to 5, characterized in that: Fixed feet are provided on opposite sides of the base, and the fixed feet are configured to be detachably connected to the optical detection device.

10. An infrared spectrum testing device, characterized in that: It comprises an optical detection device and the adjustable pressing device according to any one of claims 1 to 9, wherein the adjustable pressing device is detachably connected to the optical detection device.

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