High-voltage energy storage BMS system test bench slave control simulation device

Abstract

The utility model discloses a high voltage energy storage BMS system test bench slave control simulation device comprising a plurality of independent slave control modules, and each module comprises an MCU minimum system, a hardware version identification, an automatic addressing DI / DO circuit, a CAN communication circuit, an LED operation lamp and an SWD debugging interface. Connection of at least 12 modules is realized through cascade communication management among the modules, and requirements of different battery pack string numbers are met through burning test software. The power supply input part is provided with multiple protection circuits, and stable operation is ensured. The upper computer adjusts the voltage and temperature data of the single battery in real time, and the test safety and efficiency are improved through software simulation data. An automatic addressing function simplifies installation configuration, and a dial switch independently controls power supply to facilitate simulation of slave control faults. According to the device, the problems of complexity and poor stability of a traditional test bench are solved, an efficient, flexible and reliable test solution is provided, and the universality, the expansibility and the safety are greatly improved.

Description

Technical Field

[0001] The utility model relates to the technical field of high-voltage energy storage BMS system testing, in particular to a high-voltage energy storage BMS system test bench slave control simulation device. Background Art

[0002] During the testing process of high-voltage energy storage battery management systems (BMS), traditional test benches usually use a fixed slave control module configuration to match the number of strings and temperature acquisition channels for different battery packs. Specifically, typical slave control module products include 16 strings, 18 strings, 24 strings, 32 strings, 52 strings, 56 strings, 64 strings, 104 strings, 112 strings, and 128 strings. In order to achieve high-voltage energy storage systems with voltage levels of 1000V, 1500V, and 2000V, multiple slave control modules are usually required for cascade management. After the battery modules are connected in series to form a battery cluster, the master control module performs secondary management and control. Data exchange between the slave control module and the master control module is carried out through the CAN communication bus.

[0003] This traditional testing method has the following problems:

[0004] 1. Complexity of setup: Due to the different requirements of different battery packs, the test bench needs to match the corresponding slave control module. At the same time, according to the BMS system electrical diagram, the power supply and communication test harness, battery cell voltage acquisition harness, and temperature acquisition harness must be customized and developed. This makes the test bench setup process complicated, time-consuming, and costly.

[0005] 2. Poor stability and reliability: A large number of wiring harnesses and connectors increase the failure points of the system and reduce the stability and reliability of the test bench.

[0006] 3. Insufficient flexibility and scalability: Traditional test benches can only be used for fixed models of slave control modules. They lack flexibility and are difficult to adapt to the needs of different battery packs. The system has poor compatibility and scalability.

[0007] 4. Safety issues: There are certain safety risks when conducting hardware simulation tests under high-voltage environments.

[0008] To address these issues, approaches typically involve increasing the integration of slave control modules or developing dedicated test benches. While these approaches simplify the testing process to some extent, they still cannot completely resolve the challenges of setup complexity, poor stability, and insufficient flexibility. Furthermore, developing dedicated test benches is costly and time-consuming, making it difficult to meet the demands of rapid R&D.

[0009] Therefore, how to simplify the test bench construction process, improve the stability and reliability of the system, enhance the flexibility and scalability of the system, and ensure the safety of the test has become a technical problem to be solved by the present utility model. Utility Model Content

[0010] The technical problem solved by the present invention is to address the defects existing in the above-mentioned prior art and provide a high-voltage energy storage BMS system test bench slave control simulation device to solve the problems of test bench construction complexity, poor stability and reliability, insufficient flexibility and scalability, and safety proposed in the above-mentioned background technology.

[0011] In order to solve the above technical problems, the technical solutions adopted by the present invention are as follows:

[0012] A high-voltage energy storage BMS system test bench slave control simulation device includes multiple independent slave control modules. The connection relationship and position relationship between each slave control module and other components are as follows:

[0013] Slave control module: Each slave control module includes an MCU minimum system, a hardware version identification module, an automatic addressing DI / DO circuit, a CAN communication circuit, an LED operating light, and an SWD debugging interface;

[0014] MCU minimum system: located at the core of the slave control module, responsible for the control and communication of the entire slave control module;

[0015] Hardware version identification module: connected to the MCU minimum system, used to identify the hardware version of the slave control module;

[0016] Automatic addressing DI / DO circuit: connected through the GPIO interface of the MCU, responsible for automatic addressing and cascade management of the slave control module;

[0017] CAN communication circuit: connected to the MCU minimum system, used for communication between slave control modules and with the host computer;

[0018] LED running light: connected to the GPIO interface of the MCU to indicate the operating status of the module;

[0019] SWD debug interface: connected to the MCU for debugging and burning software.

[0020] Power input part: connect to external adjustable DC power supply, input voltage range is 9-36V;

[0021] Input transient voltage clamp protection circuit: connected in parallel with the power supply input terminal through a bidirectional TVS tube;

[0022] Reverse polarity protection circuit: realized by Schottky diode, with the positive pole connected to the positive pole of the power supply, and the negative pole connected to the positive pole of the electrolytic capacitor and the LC filter circuit;

[0023] LC filter circuit: connected to the back end of the reverse polarity protection circuit to provide power supply filtering function;

[0024] DC / DC power supply circuit: uses SGM61410 chip, connected to the output end of the LC filter circuit, and outputs a stable 5V voltage;

[0025] LDO power supply circuit: connected to the output end of the DC / DC power supply circuit, outputs 3.3V voltage to power the MCU's minimum system unit.

[0026] Dip switch power supply control: The VDD positive power supply of each independent MCU minimum system unit is independently controlled by a dip switch, which is installed on the slave control module to facilitate power supply abnormality testing.

[0027] Automatic addressing DI / DO circuit: Multiple slave control modules are cascaded through the DI / DO circuit. Each DI input is connected through the MCU's GPIO interface, and the DO output is connected to the DI input of the next slave control module to achieve automatic addressing.

[0028] CAN communication box: connects the host computer and the slave control module to realize data communication through the CAN bus. The CAN communication circuit of the slave control module is connected to the CAN communication box through the CAN transceiver, which facilitates real-time modification and monitoring of battery cell voltage and temperature data.

[0029] Overall connection relationship: The slave control module realizes the cascade connection of multiple slave control modules through cascade communication management. Each module is powered and managed by burning test software to adapt to the string number requirements of different battery packs.

[0030] As a further solution of the present invention, the DC / DC power supply circuit adopts a synchronous buck power management chip, model SGM61410, which supports a wide voltage input range of 5-42V and an output voltage of 5V, and supplies power to the CAN communication transceiver chip and the LDO input.

[0031] As a further solution of the present invention, the LDO power supply circuit outputs 3.3V to power each independent MCU minimum system unit for simulating a slave control module.

[0032] As a further solution of the present invention, the automatic addressing DI / DO circuit performs input detection and output control after addressing through the GPIO of the MCU minimum system, thereby realizing automatic addressing cascade management among multiple slave control modules.

[0033] As a further solution of the present invention, the host computer is connected to multiple slave control modules via a CAN communication box to achieve real-time modification and monitoring of battery cell voltage and temperature data.

[0034] As a further solution of the present invention, the input transient voltage clamping protection of the power supply input part is achieved by connecting a bidirectional TVS tube in parallel with the power supply input terminal, and the reverse connection protection is achieved by a Schottky diode.

[0035] As a further solution of the present invention, the dip switch controls the VDD power supply positive pole of each independent MCU minimum system unit for simulating power supply abnormality test of the slave control module.

[0036] Compared with the prior art, the beneficial effects of the present invention are:

[0037] 1. Modular Design and Flexibility: Each slave control module is independently designed and equipped with cascade communication management capabilities, enabling cascade connections of at least 12 slave control modules. This modular design greatly enhances the system's flexibility, enabling it to adapt to the string count requirements of different battery packs and significantly reducing the complexity of traditional high-voltage energy storage BMS system test bench construction.

[0038] 2. Real-time Data Adjustment and Security: The device can adjust the current battery cell voltage and temperature data in real time through the host computer, enabling cell type and temperature fault testing in the BMS system. This function is achieved through software simulation data, ensuring the safety and efficiency of the testing process and avoiding the potential risks associated with traditional hardware simulation.

[0039] 3. Multiple protection circuit design: The power input includes input transient voltage clamping protection circuits, reverse polarity protection circuits, and ESD protection circuits to ensure stable system operation in various electrical environments. This multi-protection design improves system reliability and safety, avoids system failures caused by power supply problems, and ensures the accuracy of test data.

[0040] 4. Automatic addressing function: Cascade management is performed between slave control modules through automatic addressing DI / DO circuits. The automatic addressing function simplifies the system installation and configuration process, reduces the complexity of human intervention, and improves the system's automation level and work efficiency.

[0041] 5. Independent Power Supply Control and Slave Fault Simulation: The VDD positive supply voltage for each independent MCU minimum system unit is independently controlled via a DIP switch, facilitating power supply anomaly testing. This design provides greater testing flexibility, allowing for independent testing of each module's power supply status and facilitating slave fault simulation and troubleshooting.

[0042] 6. Efficient and Accurate Fault Simulation: Software simulation enables real-time modification of battery cell voltage and temperature data, improving testing safety and efficiency. This approach can quickly and accurately simulate various operating conditions and fault conditions, providing a powerful tool for BMS system development and testing, significantly improving testing efficiency and reliability. Additional aspects and advantages of this utility model will be described in part in the following description and will become apparent from the following description or learned through practice of the utility model. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0044] Figure 1 This is the overall structural block diagram of the slave control simulation device of the utility model.

[0045] Figure 2 This is the schematic diagram of the power supply input circuit and DC / DC power supply circuit of this utility model

[0046] Figure 3 This is the LDO power supply circuit and power indicator light circuit diagram of this utility model

[0047] Figure 4 Power supply control circuit for the DIP switch of this utility model Figure 1 .

[0048] Figure 5 Power supply control circuit for the DIP switch of this utility model Figure 2 .

[0049] Figure 6 This is the circuit diagram of the utility model cascade expansion automatic addressing DI / DO output

[0050] Figure 7 This is the communication circuit diagram of the independent MCU minimum system unit of this utility model.

[0051] Figure 8 This is the automatic addressing management circuit diagram of the utility model.

[0052] Figure 9 The principle of the external expansion cascade interface of the slave control simulation device of this utility model Figure 1 .

[0053] Figure 10 The principle of the external expansion cascade interface of the slave control simulation device of this utility model Figure 2 . DETAILED DESCRIPTION

[0054] The following is a clear and complete description of the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only a part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0055] See also Figure 1 —10. In an embodiment of the present invention, a high-voltage energy storage BMS system test bench slave control simulation device includes multiple independent slave control modules. The connection relationship and position relationship between each slave control module and other components are as follows:

[0056] Slave control module: Each slave control module includes an MCU minimum system, a hardware version identification module, an automatic addressing DI / DO circuit, a CAN communication circuit, an LED operating light, and an SWD debugging interface;

[0057] MCU minimum system: located at the core of the slave control module, responsible for the control and communication of the entire slave control module;

[0058] Hardware version identification module: connected to the MCU minimum system, used to identify the hardware version of the slave control module;

[0059] Automatic addressing DI / DO circuit: connected through the GPIO interface of the MCU, responsible for automatic addressing and cascade management of the slave control module;

[0060] CAN communication circuit: connected to the MCU minimum system, used for communication between slave control modules and with the host computer;

[0061] LED running light: connected to the GPIO interface of the MCU to indicate the operating status of the module;

[0062] SWD debug interface: connected to the MCU for debugging and burning software.

[0063] Power input part: connect to external adjustable DC power supply, input voltage range is 9-36V;

[0064] Input transient voltage clamp protection circuit: connected in parallel with the power supply input terminal through a bidirectional TVS tube;

[0065] Reverse polarity protection circuit: realized by Schottky diode, with the positive pole connected to the positive pole of the power supply, and the negative pole connected to the positive pole of the electrolytic capacitor and the LC filter circuit;

[0066] LC filter circuit: connected to the back end of the reverse polarity protection circuit to provide power supply filtering function;

[0067] DC / DC power supply circuit: uses SGM61410 chip, connected to the output end of the LC filter circuit, and outputs a stable 5V voltage;

[0068] LDO power supply circuit: connected to the output end of the DC / DC power supply circuit, outputs 3.3V voltage to power the MCU's minimum system unit.

[0069] Dip switch power supply control: The VDD positive power supply of each independent MCU minimum system unit is independently controlled by a dip switch, which is installed on the slave control module to facilitate power supply abnormality testing.

[0070] Automatic addressing DI / DO circuit: Multiple slave control modules are cascaded through the DI / DO circuit. Each DI input is connected through the MCU's GPIO interface, and the DO output is connected to the DI input of the next slave control module to achieve automatic addressing.

[0071] CAN communication box: connects the host computer and the slave control module to realize data communication through the CAN bus. The CAN communication circuit of the slave control module is connected to the CAN communication box through the CAN transceiver, which facilitates real-time modification and monitoring of battery cell voltage and temperature data.

[0072] Overall connection relationship: The slave control module realizes the cascade connection of multiple slave control modules through cascade communication management. Each module is powered and managed by burning test software to adapt to the string number requirements of different battery packs.

[0073] As a further solution of the present invention, the DC / DC power supply circuit adopts a synchronous buck power management chip, model SGM61410, which supports a wide voltage input range of 5-42V and an output voltage of 5V, and supplies power to the CAN communication transceiver chip and the LDO input.

[0074] As a further solution of the present invention, the LDO power supply circuit outputs 3.3V to power each independent MCU minimum system unit for simulating a slave control module.

[0075] As a further solution of the present invention, the automatic addressing DI / DO circuit performs input detection and output control after addressing through the GPIO of the MCU minimum system, thereby realizing automatic addressing cascade management among multiple slave control modules.

[0076] As a further solution of the present invention, the host computer is connected to multiple slave control modules via a CAN communication box to achieve real-time modification and monitoring of battery cell voltage and temperature data.

[0077] As a further solution of the present invention, the input transient voltage clamping protection of the power supply input part is achieved by connecting a bidirectional TVS tube in parallel with the power supply input terminal, and the reverse connection protection is achieved by a Schottky diode.

[0078] As a further solution of the present invention, the dip switch controls the VDD power supply positive pole of each independent MCU minimum system unit for simulating power supply abnormality test of the slave control module.

[0079] Example 1:

[0080] This embodiment describes in detail the implementation and application effects of the slave control simulation device of the high-voltage energy storage BMS system test bench for the specific application scenario of the high-voltage energy storage BMS system test bench.

[0081] The development of high-voltage energy storage battery management systems requires precise acquisition and monitoring of battery cell voltage and temperature, while simulating various fault conditions to evaluate system performance, safety, and reliability. Traditional test benches, which must be tailored to the needs of individual battery packs, are complex to build, lack stability, and offer limited flexibility, posing potential safety risks.

[0082] To overcome these issues, this utility model provides a slave control simulation device for a high-voltage energy storage BMS system test bench. This modular design features a slave control module that includes a minimum MCU system, a hardware version identification module, an automatic addressing DI / DO circuit, a CAN communication circuit, an LED operating light, and an SWD debugging interface. Each slave control module is managed through cascade communication, enabling cascade connections of at least 12 slave control modules. This cascade management is achieved by burning test software to accommodate the string count requirements of different battery packs.

[0083] The specific application scenarios are as follows:

[0084] When testing high-voltage energy storage systems, the test bench needs to simulate battery packs with voltage levels of 1000V, 1500V, or 2000V. First, the power input of the slave control simulation device is connected to an external adjustable DC power supply with an input voltage range of 9-36V. The power input includes input transient voltage clamping protection circuits, reverse polarity protection circuits, and ESD protection circuits to ensure stable operation of the system in various electrical environments.

[0085] Each slave module's power supply is independently controlled via a DIP switch, enabling testing for power supply anomalies during the test. The slave modules are connected to the host computer via a CAN communication circuit, enabling real-time adjustment and monitoring of battery cell voltage and temperature data. The host computer sends commands via the CAN communication box, modifying the battery cell voltage and temperature data in the slave modules in real time to simulate various operating conditions and fault conditions.

[0086] During testing, the automatic addressing DI / DO circuit uses the MCU's GPIO interface to perform input detection and output control after addressing, enabling automatic addressing cascade management between slave modules. Each slave module's MCU minimum system is burned with test software via the SWD debug interface, enabling real-time monitoring and data reporting of the slave module.

[0087] Through this design, the high-voltage energy storage BMS system test bench slave control simulation device of the utility model effectively solves the problems of complex construction, poor stability, insufficient flexibility and safety of traditional test benches. Specifically:

[0088] 1. Simplified test bench construction process: Modular design and cascade management make system construction easier, reduce the number of wiring harnesses and connectors, and improve construction efficiency.

[0089] 2. Improved system stability and reliability: Multiple protection circuit design ensures stable operation of the system in various electrical environments and reduces the possibility of failure.

[0090] 3. Enhanced system flexibility and scalability: Through the DIP switch and automatic addressing function, the number and position of slave control modules can be flexibly configured according to actual needs to adapt to the testing requirements of different battery packs.

[0091] 4. Improved test safety and efficiency: By adjusting the battery cell voltage and temperature data in real time through the host computer and using software to simulate data, safety hazards in high-voltage environments are avoided. At the same time, various fault conditions can be simulated quickly and accurately, improving test efficiency.

[0092] In summary, this embodiment demonstrates the specific application of the present invention in the testing of high-voltage energy storage BMS systems. Through innovative structures such as modular design, real-time data adjustment, multiple protection circuits, automatic addressing function and independent power supply control, the versatility and scalability of the test bench are significantly improved.

[0093] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential features of the present invention. Therefore, the embodiments should be considered in all respects as illustrative and non-restrictive, and the scope of the present invention is defined by the appended claims rather than the foregoing description, and it is intended that all variations that come within the meaning and range of equivalents of the claims be embraced within the present invention.

Claims

1. A high-voltage energy storage BMS system test bench slave control simulation device, characterized in that: The device includes multiple independent slave control modules. The connection and position relationship between each slave control module and other components are as follows: Slave control module: Each slave control module includes an MCU minimum system, a hardware version identification module, an automatic addressing DI / DO circuit, a CAN communication circuit, an LED operating light, and an SWD debugging interface; MCU minimum system: located at the core of the slave control module, responsible for the control and communication of the entire slave control module; Hardware version identification module: connected to the MCU minimum system, used to identify the hardware version of the slave control module; Automatic addressing DI / DO circuit: connected through the GPIO interface of the MCU, responsible for automatic addressing and cascade management of the slave control module; CAN communication circuit: connected to the MCU minimum system, used for communication between slave control modules and with the host computer; LED running light: connected to the GPIO interface of the MCU to indicate the operating status of the module; SWD debug interface: connected to MCU for debugging and burning software; Power input part: connect to external adjustable DC power supply, input voltage range is 9-36V; Input transient voltage clamp protection circuit: connected in parallel with the power supply input terminal through a bidirectional TVS tube; Reverse polarity protection circuit: realized by Schottky diode, with the positive pole connected to the positive pole of the power supply, and the negative pole connected to the positive pole of the electrolytic capacitor and the LC filter circuit; LC filter circuit: connected to the back end of the reverse polarity protection circuit to provide power supply filtering function; DC / DC power supply circuit: uses SGM61410 chip, connected to the output end of the LC filter circuit, and outputs a stable 5V voltage; LDO power supply circuit: connected to the output end of the DC / DC power supply circuit, outputs 3.3V voltage to power the MCU minimum system unit; Dip switch power supply control: The VDD power supply positive pole of each independent MCU minimum system unit is independently controlled by a dip switch, which is installed on the slave control module to facilitate power supply abnormality testing; Automatic addressing DI / DO circuit: Multiple slave control modules are cascaded through the DI / DO circuit. Each DI input is connected through the GPIO interface of the MCU, and the DO output is connected to the DI input of the next slave control module to achieve automatic addressing. CAN communication box: connects the host computer and the slave control module to realize data communication through the CAN bus. The CAN communication circuit of the slave control module is connected to the CAN communication box through the CAN transceiver, which facilitates real-time modification and monitoring of battery cell voltage and temperature data; Overall connection relationship: The slave control module realizes the cascade connection of multiple slave control modules through cascade communication management. Each module is powered and managed by burning test software to adapt to the string number requirements of different battery packs.

2. A high-voltage energy storage BMS system test bench slave control simulation device according to claim 1, characterized in that: The DC / DC power supply circuit adopts a synchronous buck power management chip, model SGM61410, which supports a wide voltage input range of 5-42V and an output voltage of 5V, and supplies power to the CAN communication transceiver chip and the LDO input.

3. A high-voltage energy storage BMS system test bench slave control simulation device according to claim 1, characterized in that: The LDO power supply circuit outputs 3.3V to power each independent MCU minimum system unit for simulating the slave control module.

4. A high-voltage energy storage BMS system test bench slave control simulation device according to claim 1, characterized in that: The automatic addressing DI / DO circuit performs input detection and output control after addressing through the GPIO of the MCU minimum system to realize automatic addressing cascade management between multiple slave control modules.

5. A high-voltage energy storage BMS system test bench slave control simulation device according to claim 1, characterized in that: The host computer is connected to multiple slave control modules via a CAN communication box to achieve real-time modification and monitoring of battery cell voltage and temperature data.

6. A high-voltage energy storage BMS system test bench slave control simulation device according to claim 1, characterized in that: The input transient voltage clamp protection of the power supply input part is achieved by connecting a bidirectional TVS tube in parallel with the power supply input terminal, and the reverse connection protection is achieved by a Schottky diode.

7. A high-voltage energy storage BMS system test bench slave control simulation device according to claim 1, characterized in that: The VDD power supply positive electrode of each independent MCU minimum system unit is controlled by the dip switch for simulating power supply abnormality test of the slave control module.

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