Self-adaptive detection circuit for multiple NTC (Negative Temperature Coefficient) probes

By adapting to multiple NTC probe detection circuits, the hardware version increase and communication requirements caused by NTC specification changes in the existing technology are solved, unified management of NTC probe detection circuits is achieved, and management efficiency is improved.

CN223361621UActive Publication Date: 2025-09-19GUANGDONG SINUOWEI INTELLIGENT TECH CO LTD
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Patent Information

Application Number
CN202422858141.9
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-11-21
Publication Date
2025-09-19
Estimated Expiration
2034-11-21

AI Technical Summary

Technical Problem

The circuits designed on existing BMS boards are usually designed for a single NTC. This means that when customers use NTCs with different specifications, they need to change the pull-up resistor, increase the product hardware version, and frequently ask customers for the NTC model, making unified management difficult.

Method used

An adaptive multi-NTC probe detection circuit is designed, including a reference temperature detection circuit, a 10K NTC detection circuit, and a 100K NTC detection circuit. The MCU module controls the conduction of the corresponding detection circuit, and the NTC specification is judged by setting an error of 2°C to achieve adaptive identification and detection.

Benefits of technology

The hardware version is unified, eliminating the need to communicate with customers about NTC models and improving management efficiency.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a self-adaptive multi-NTC probe detection circuit, which comprises a reference temperature detection circuit, an MCU module, a 10K NTC detection circuit and a 100K NTC detection circuit, the reference temperature detection circuit, the 10K NTC detection circuit and the 100K NTC detection circuit are respectively connected with the MCU module, and the conduction of the 10K NTC detection circuit or the 100K NTC detection circuit is controlled through the MCU module. The reference temperature detection circuit continuously detects the current environment temperature, the MCU module compares a temperature value collected by the 10K NTC detection circuit or the 100K NTC detection circuit with the environment temperature, if the temperature value is smaller than a set error, the detection circuit is always switched on, and otherwise, the detection circuit is switched off. According to the utility model, two NTCs with different specifications can be identified and detected in a self-adaptive manner, the unification of hardware versions is realized, and the work of communication with clients about NTC models in the early stage is saved.
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Description

Technical Field

[0001] The utility model relates to the technical field of NTC detection, in particular to an adaptive multiple NTC probe detection circuit. Background Art

[0002] Because different customers require NTC probes with different specifications, including 10K and 100K, the circuits on most BMS boards are designed for a single NTC. When customers use different NTC specifications, the pull-up resistors on the board also need to be modified accordingly, which increases the number of product hardware versions and hinders unified product management. Furthermore, during each technical meeting with customers, we need to inquire about their NTC model. Utility Model Content

[0003] The purpose of the utility model is to overcome the deficiencies of the prior art and provide an adaptive multiple NTC probe detection circuit.

[0004] The technical solution of the utility model is as follows:

[0005] An adaptive multi-NTC probe detection circuit includes a reference temperature detection circuit, an MCU module, a 10K NTC detection circuit, and a 100K NTC detection circuit. The reference temperature detection circuit, the 10K NTC detection circuit, and the 100K NTC detection circuit are respectively connected to the MCU module. The MCU module controls the conduction of the 10K NTC detection circuit or the 100K NTC detection circuit. The reference temperature detection circuit continuously detects the current ambient temperature. The MCU module compares the temperature value collected by the 10K NTC detection circuit or the 100K NTC detection circuit with the ambient temperature. If the temperature is less than a set error, the detection circuit is always turned on; otherwise, it is turned off.

[0006] Furthermore, the reference temperature detection circuit includes a resistor R7, a resistor R11, a thermistor and a first analog-to-digital converter, one end of the resistor R7 is connected to the power supply, the other end of the resistor R7 is connected to the digital ground through the thermistor, one end of the resistor R11 is connected to the first analog-to-digital converter, and the other end of the resistor R11 is connected between the resistor R7 and the thermistor.

[0007] Furthermore, the 10K NTC detection circuit includes a 10K thermistor, a second analog-to-digital converter, a resistor R8, a resistor R12 and a first NPN transistor, and the 100K The NTC detection circuit includes a 100K thermistor, a third analog-to-digital converter, a resistor R9, a resistor R13, and a second NPN transistor. One end of the resistor R8 is connected to the power supply, and the other end of the resistor R8 is connected to the C pole of the first NPN transistor. The 10K thermistor is connected between the resistor R8 and the C pole of the first NPN transistor through the second analog-to-digital converter. The B pole of the first NPN transistor is connected to the MCU module through the resistor R12. One end of the resistor R9 is connected to the power supply, and the other end of the resistor R9 is connected to the C pole of the second NPN transistor. The 100K thermistor is connected between the resistor R9 and the C pole of the second NPN transistor through the third analog-to-digital converter. The B pole of the second NPN transistor is connected to the MCU module through the resistor R13. The E pole of the first NPN transistor and the E pole of the second NPN transistor are commonly connected to the digital ground.

[0008] Furthermore, the setting error is 2°C.

[0009] Compared with the existing technology, the beneficial effect of the present invention is that the present invention can adaptively identify and detect two NTCs of different specifications, realize the unification of hardware versions, and save the early communication work with customers about NTC models. BRIEF DESCRIPTION OF THE DRAWINGS

[0010] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0011] Figure 1 This is a circuit block diagram of an adaptive multiple NTC probe detection circuit provided by the utility model;

[0012] Figure 2 This is a circuit diagram of the reference temperature detection circuit of the present utility model;

[0013] Figure 3 This is a circuit diagram of the 10K NTC detection circuit and the 100K NTC detection circuit described in the present invention. DETAILED DESCRIPTION

[0014] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0015] In order to illustrate the technical solution of the present invention, specific embodiments are provided below.

[0016] Example

[0017] See also Figure 1 This embodiment provides an adaptive multi-NTC probe detection circuit, including a reference temperature detection circuit, an MCU module, a 10K NTC detection circuit, and a 100K NTC detection circuit. The reference temperature detection circuit, the 10K NTC detection circuit, and the 100K NTC detection circuit are respectively connected to the MCU module. The MCU module controls the conduction of the 10K NTC detection circuit or the 100K NTC detection circuit. The reference temperature detection circuit continuously detects the current ambient temperature. The MCU module compares the temperature value collected by the 10K NTC detection circuit or the 100K NTC detection circuit with the ambient temperature. If the temperature is less than a set error (2°C), the detection circuit is always turned on; otherwise, it is turned off. In this way, the actual specification of the NTC used can be determined, and the unnecessary NTC detection circuit can be turned off.

[0018] Specifically:

[0019] Combine Figure 2 As shown, the reference temperature detection circuit includes a resistor R7, a resistor R11, a thermistor, and a first analog-to-digital converter. One end of resistor R7 is connected to the power supply, and the other end of resistor R7 is connected to the digital ground through the thermistor. One end of resistor R11 is connected to the first analog-to-digital converter, and the other end of resistor R11 is connected between resistor R7 and the thermistor. The current ambient temperature is continuously detected through the thermistor.

[0020] Combine Figure 3As shown, the 10K NTC detection circuit includes a 10K thermistor, a second analog-to-digital converter, a resistor R8, a resistor R12 and a first NPN transistor Q5, a 100K The NTC detection circuit includes a 100K thermistor, a third analog-to-digital converter, a resistor R9, a resistor R13, and a second NPN transistor. One end of the resistor R8 is connected to the power supply, and the other end of the resistor R8 is connected to the C pole of the first NPN transistor Q5. The 10K thermistor is connected between the resistor R8 and the C pole of the first NPN transistor Q5 through the second analog-to-digital converter. The B pole of the first NPN transistor Q5 is connected to the MCU module through the resistor R12. One end of the resistor R9 is connected to the power supply, and the other end of the resistor R9 is connected to the C pole of the second NPN transistor Q6. The 100K thermistor is connected between the resistor R9 and the C pole of the second NPN transistor Q6 through the third analog-to-digital converter. The B pole of the second NPN transistor Q6 is connected to the MCU module through the resistor R13. The E pole of the first NPN transistor Q5 and the E pole of the second NPN transistor Q6 are commonly connected to the digital ground. By controlling the MCU_NTC10 network to be pulled high, the first NPN transistor Q5 can be turned on, and NTC10_AD can collect a value, which is compared with the value collected by the reference temperature detection circuit. If the error is less than 2°C, the first NPN transistor Q5 is kept on, otherwise the first NPN transistor Q5 is turned off; by controlling the MCU_NTC100 network to be pulled high, the second NPN transistor Q6 can be turned on, and NTC100_AD can collect a value, which is compared with the value collected by the reference temperature detection circuit. If the error is less than 2°C, the second NPN transistor Q6 is kept on, otherwise the second NPN transistor Q6 is turned off.

[0021] This adaptive multi-NTC probe detection circuit can adaptively identify and detect two different specifications of NTC, achieving the unification of hardware versions and eliminating the need for early communication with customers about NTC models.

[0022] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. An adaptive multiple NTC probe detection circuit, characterized by: The system includes a reference temperature detection circuit, an MCU module, a 10K NTC detection circuit, and a 100K NTC detection circuit. The reference temperature detection circuit, the 10K NTC detection circuit, and the 100K NTC detection circuit are respectively connected to the MCU module. The MCU module controls the conduction of the 10K NTC detection circuit or the 100K NTC detection circuit. The reference temperature detection circuit continuously detects the current ambient temperature. The MCU module compares the temperature value collected by the 10K NTC detection circuit or the 100K NTC detection circuit with the ambient temperature. If the temperature is less than a set error, the detection circuit is always turned on; otherwise, it is turned off.

2. The adaptive multiple NTC probe detection circuit according to claim 1, characterized in that: The reference temperature detection circuit includes a resistor R7, a resistor R11, a thermistor and a first analog-to-digital converter, one end of the resistor R7 is connected to the power supply, the other end of the resistor R7 is connected to the digital ground through the thermistor, one end of the resistor R11 is connected to the first analog-to-digital converter, and the other end of the resistor R11 is connected between the resistor R7 and the thermistor.

3. The adaptive multiple NTC probe detection circuit according to claim 1, characterized in that: The 10K NTC detection circuit includes a 10K thermistor, a second analog-to-digital converter, a resistor R8, a resistor R12 and a first NPN transistor. The 100K NTC detection circuit includes a 100K thermistor, a third analog-to-digital converter, a resistor R9, a resistor R13 and a second NPN transistor. One end of the resistor R8 is connected to the power supply, and the other end of the resistor R8 is connected to the C pole of the first NPN transistor. The 10K thermistor is connected between the resistor R8 and the C pole of the first NPN transistor through the second analog-to-digital converter. The B pole of the first NPN transistor is connected to the MCU module through the resistor R12, one end of the resistor R9 is connected to the power supply, and the other end of the resistor R9 is connected to the C pole of the second NPN transistor. The 100K thermistor is connected between the resistor R9 and the C pole of the second NPN transistor through a third analog-to-digital converter, the B pole of the second NPN transistor is connected to the MCU module through the resistor R13, and the E pole of the first NPN transistor and the E pole of the second NPN transistor are commonly connected to the digital ground.

4. The adaptive multiple NTC probe detection circuit according to claim 1, characterized in that: The setting error is 2°C.