Tantalum capacitor surge test tool
By designing a tantalum capacitor surge test fixture with nickel-plated phosphorus-copper alloy clips and a plug-in anti-reverse insertion PCB board, the problem of the test socket being unable to withstand high temperatures and frequent damage is solved, achieving efficient and reliable tantalum capacitor testing, reducing maintenance costs and improving test accuracy.
Patent Information
- Application Number
- CN202422516319.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-17
- Publication Date
- 2025-09-23
- Estimated Expiration
- 2034-10-17
AI Technical Summary
The test sockets of existing tantalum capacitor surge test equipment cannot withstand instantaneous high temperatures and are easily damaged, which affects test results and increases production costs. Frequent replacement of test sockets also reduces production efficiency.
A tantalum capacitor surge test fixture was designed, which includes a PCB board, a test clip, and a banana plug. The clip is made of nickel-plated phosphorus copper alloy, which is resistant to pollution, high temperature, and not easy to deform. The clip and PCB board are fixed with screws. The clip combination forms a stable clamping structure. The PCB board is pluggable and anti-reverse plug-in to ensure connection accuracy and convenience.
It improves the reliability and safety of the test, reduces the equipment maintenance cost, ensures the accuracy and reliability of the test results, adapts to tantalum capacitors of different sizes, has strong applicability, and can stably clamp in extreme conditions to avoid the test being affected by loosening or explosion.
Smart Images
Figure CN223377352U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of testing equipment, and in particular to a tantalum capacitor surge testing tool. Background Art
[0002] During the surge current test of tantalum capacitors, at the moment the energy storage capacitor discharges the capacitor under test, the current generation precedes the voltage generation by a phase angle, so the surge current is generated almost instantaneously and lasts much shorter than the polarization time of the capacitor. The dielectric layer inside the tantalum capacitor has not yet completed polarization and lacks dielectric properties. At this point, the tantalum capacitor is just a conductor with a very complex network structure and resistance. Because the tantalum powder used in tantalum capacitors is composed of tantalum powder particles with different particle radii, there must be areas with different channel gaps. Due to the adhesion effect of current passing through the conductor, the current flowing through the conductor is proportional to the square of the aperture and the square of the conductor's center radius. Therefore, in areas with larger channels, that is, areas with higher channel resistance, the heat generated here will be very high because the resistance increases with the cross-sectional area of the channel diameter. The resulting partial field strength and heat in the dielectric layer here will be much higher than in other areas. The high field strength and temperature in a very short period of time can instantly cause the dielectric layer to break down and generate a large amount of heat, triggering a chain reaction and causing the product to heat up and explode.
[0003] The surge current test of tantalum capacitors is mainly to eliminate early failures caused by unreasonable internal impedance distribution of capacitors due to the production process, thereby improving the reliability of tantalum capacitors in applications. During the surge current test, tantalum capacitors frequently overheat and explode.
[0004] Currently, tantalum capacitor surge test equipment uses standard high-temperature burn-in test sockets. These are expensive and have an operating temperature range of -55-80°C. They cannot withstand sudden high temperatures and can be damaged, such as melting and deformation, broken contact copper sheets, and contamination. The quality of these test sockets directly impacts the test results of tantalum capacitors. Furthermore, frequent replacement of burn-in test sockets not only increases production costs but also reduces efficiency.
[0005] In summary, a test socket that can withstand high temperature, explosion, is not easily deformed, and is resistant to pollution is needed to adapt to surge current testing. Utility Model Content
[0006] The purpose of the utility model is to provide a tantalum capacitor surge test tool to overcome the deficiency that the test tool in the prior art cannot withstand the tantalum capacitor surge test.
[0007] In order to achieve the above purpose, the utility model adopts the following technical solutions:
[0008] A tantalum capacitor surge test fixture includes a PCB board, on which are arranged several groups of test clips and several banana plugs; each group of test clips on the PCB board includes two first test clips and one second test clip, and the banana plugs arranged on the PCB board serve as connectors for connecting to test equipment. The PCB board serves as the basic carrier of the entire test fixture, and its plug-in and anti-reverse insertion design ensures accuracy during connection and use, avoiding damage to the equipment or test errors caused by reverse insertion. At the same time, the plug-in and unplugging operations are convenient and fast, improving test efficiency and allowing the PCB board to be quickly replaced in different test scenarios to meet different testing needs.
[0009] Furthermore, the first test clip is a metal sheet with a bent lower portion and a certain curvature at the upper portion, and the second test clip is a metal sheet with a bent lower portion.
[0010] Furthermore, the first test clip and the second test clip are both made of nickel-plated phosphorus copper alloy.
[0011] Furthermore, the first and second test clips have fixing holes at their lower bends, and are connected to the PCB with fixing screws. These fixing screws provide a reliable mechanical connection, making disassembly and installation easier, allowing for quick replacement of damaged test clips or for replacement of clips of different specifications, thus improving the maintainability of the test fixture.
[0012] Furthermore, the bending angle of the lower bending parts of the first test clip and the second test clip is 90°.
[0013] The bent lower portion of the first test clip allows for a stable connection to the PCB through the fixing holes, ensuring that it will not loosen or shift during testing. The curved upper portion fits better on the surface of the tantalum capacitor, providing a more stable clamping force. Made of nickel-plated phosphorus-copper alloy, it not only offers excellent conductivity but is also resistant to contamination, making it less susceptible to environmental influences during extended use. Its high-temperature resistance allows it to withstand high temperature fluctuations during surge testing without damage. Its resistance to deformation ensures that the clip can always maintain the correct clamping position, ensuring test reliability even in extreme situations such as surges or explosions of the tantalum capacitor. The second test clip's lower bend and fixing hole design are similar to those of the first test clip, ensuring a secure connection to the PCB. Made of the same nickel-plated phosphorus-copper alloy, it shares the same excellent properties as the first test clip. When used in conjunction with the two first test clips, it forms a stable clamping structure, ensuring the tantalum capacitor remains in a fixed position during testing, ensuring accurate testing.
[0014] Furthermore, the two first test clips are arranged side by side on the PCB board, and the second test clip is arranged opposite the two first test clips. The two first test clips are arranged side by side on the PCB board, forming a clamping structure with the second test clip opposite. This layout can better adapt to the shape and size of the tantalum capacitor, ensuring that the capacitor can be stably clamped in the correct position during the test process. The minimum spacing between the first test clip and the second test clip is smaller than the size of the capacitor being tested, and the maximum spacing is larger than the size of the capacitor being tested, so that the clips can adapt to tantalum capacitors of different sizes, thereby improving the applicability of the test tooling.
[0015] Furthermore, the PCB board is a pluggable anti-reverse insertion PCB board.
[0016] Furthermore, the different spacing between the banana plugs limits the installation direction of the test board and the test equipment, reducing the polarity errors caused by human factors. During the connection process, the test signal can be stably transmitted, ensuring the accuracy and reliability of the test data.
[0017] Furthermore, the minimum distance between the first test clip and the second test clip is smaller than the size of the capacitor to be measured.
[0018] Furthermore, the maximum distance between the first test clip and the second test clip is greater than the size of the capacitor to be tested.
[0019] Compared with the prior art, the present invention has the following beneficial technical effects:
[0020] The utility model provides a tantalum capacitor surge test tool, including a plug-in anti-reverse insertion PCB board, a test clip group, and a banana head, and the test clip is fixed with screws. The design of the plug-in anti-reverse insertion PCB board improves the convenience and safety of use, and also makes the maintenance and replacement of the PCB board more convenient, reducing the maintenance cost of the equipment. The shape of the test clip group can adapt to the shape of the tantalum capacitor, ensuring that the capacitor can be stably fixed in the test clip during the test process, avoiding the test results being affected by looseness. The first test clip and the second test clip are both made of nickel-plated phosphorus copper alloy, which has excellent properties of anti-pollution, high temperature resistance, and non-deformation. It can work stably in the high-demand environment of tantalum capacitor surge testing and withstand the impact of capacitor explosion, greatly improving the reliability and safety of the test tool.
[0021] Furthermore, the test clip is connected to the PCB board with fixing screws, which makes replacement convenient and quick, improves the stability of the connection, and enhances the maintainability of the equipment.
[0022] In summary, the tantalum capacitor surge test tool of the present invention has a reasonable design, simple structure, convenient operation, low cost, and easy replacement. It can meet the requirements of various tantalum capacitor surge tests and provides a reliable tool for quality inspection and performance evaluation of tantalum capacitors. BRIEF DESCRIPTION OF THE DRAWINGS
[0023] Figure 1 This is a schematic diagram of the overall structure of a tantalum capacitor surge test tool in an embodiment of the present utility model.
[0024] Figure 2 This is a schematic diagram of the installation of a capacitor under test in a tantalum capacitor surge test tool in an embodiment of the present utility model.
[0025] In the figure, 1 is the PCB board, 2 is the first test clip, 3 is the second test clip, 4 is the banana plug, 5 is the capacitor under test, and 6 is the fixing screw. DETAILED DESCRIPTION
[0026] In order to help those skilled in the art better understand the present invention, the following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts should fall within the scope of protection of the present invention.
[0027] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that the numbers used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.
[0028] Example:
[0029] like Figures 1 to 2The figure shows a tantalum capacitor surge test fixture according to an embodiment of the present invention, comprising a PCB board 1, on which are arranged several groups of test clips and several banana heads 4; preferably, in this embodiment, there are 8 groups of test clips, and each group of test clips corresponds to two banana heads 4. Each group of test clips on the PCB board 1 includes two first test clips 2 and one second test clip 3, and the banana heads 4 arranged on the PCB board 1 serve as connectors to connect test equipment. The PCB board 1 serves as the basic carrier of the entire test fixture, and the plug-in anti-reverse insertion design ensures accuracy during connection and use, avoiding damage to the equipment or test errors caused by reverse insertion. At the same time, the plug-in and unplugging operations are convenient and fast, which improves the efficiency of the test, so that the PCB board 1 can be quickly replaced in different test scenarios to meet different test needs.
[0030] Preferably, in this embodiment, the first test clip 2 is a metal sheet with a bent lower portion and a certain curvature at the upper portion, and the second test clip 3 is a metal sheet with a bent lower portion.
[0031] Preferably, in this embodiment, the first test clip 2 and the second test clip 3 are both made of nickel-plated phosphorus copper alloy.
[0032] Preferably, in this embodiment, fixing holes are provided at the lower bends of the first and second test clips 2 and 3, and are connected to the PCB 1 using fixing screws 6. The fixing screws 6 provide a reliable mechanical connection, facilitating disassembly and installation, allowing for quick replacement of damaged test clips or for replacement of clips of different specifications, thereby improving the maintainability of the test fixture.
[0033] Preferably, in this embodiment, the bending angle of the lower bending parts of the first test clip 2 and the second test clip 3 is 90°.
[0034] The bent lower portion of the first test clip 2 allows the clip to be stably connected to the PCB board 1 through the fixing holes, ensuring that it will not loosen or shift during the test. The curved upper portion can better fit the surface of the tantalum capacitor and provide a more stable clamping force. Made of nickel-plated phosphorus copper alloy, it not only has good conductivity but is also resistant to pollution and is not easily affected by external environmental factors during long-term use. Its high-temperature resistance allows it to withstand high temperature changes during surge testing without damage. Its non-deformation feature ensures that the clip can always maintain the correct clamping state, ensuring the reliability of the test even in extreme situations such as surges or explosions of the tantalum capacitor. The bent lower portion and fixing hole design of the second test clip 3 are similar to those of the first test clip 2, ensuring a firm connection to the PCB board 1. Made of the same nickel-plated phosphorus copper alloy, it has the same excellent properties as the first test clip 2. Used in conjunction with the two first test clips 2, it forms a stable clamping structure, ensuring that the tantalum capacitor is fixed in position during the test, providing a guarantee for accurate testing.
[0035] Preferably, the two first test clips 2 described in this embodiment are arranged side by side on the PCB board 1, and the second test clip 3 is arranged opposite the two first test clips 2. The two first test clips 2 are arranged side by side on the PCB board 1, forming a clamping structure with the second test clip 3 opposite. This layout can better adapt to the shape and size of the tantalum capacitor, ensuring that the capacitor can be stably clamped in the correct position during the test. The minimum distance between the first test clip 2 and the second test clip 3 is smaller than the size of the capacitor 5 to be tested, and the maximum distance is larger than the size of the capacitor 5 to be tested, so that the clips can adapt to tantalum capacitors of different sizes, thereby improving the applicability of the test tooling.
[0036] Preferably, the PCB board 1 in this embodiment is a pluggable anti-reverse insertion PCB board.
[0037] Preferably, the banana plugs 4 of this embodiment have different spacings, which restricts the installation direction of the test board and the test equipment, reducing the polarity errors of the test board installation caused by human factors. During the connection process, the test signal can be stably transmitted, ensuring the accuracy and reliability of the test data.
[0038] Preferably, in this embodiment, the minimum distance between the first test clip 2 and the second test clip 3 is smaller than the size of the capacitor 5 to be measured.
[0039] Preferably, in this embodiment, the maximum distance between the first test clip 2 and the second test clip 3 is greater than the size of the capacitor 5 to be tested.
Claims
1. A tantalum capacitor surge test tool, characterized in that: The invention comprises a PCB board (1), on which a plurality of groups of test clips and a plurality of banana plugs (4) are arranged; each group of test clips on the PCB board (1) comprises two first test clips (2) and one second test clip (3); and the banana plugs (4) arranged on the PCB board (1) serve as connectors for connecting test equipment.
2. The tantalum capacitor surge test tool according to claim 1, characterized in that: The first test clip (2) is a metal sheet with a bent lower portion and a certain curvature at the upper portion, and the second test clip (3) is a metal sheet with a bent lower portion.
3. The tantalum capacitor surge test tool according to claim 2, characterized in that: The first test clip (2) and the second test clip (3) are both made of nickel-plated phosphorus copper alloy.
4. The tantalum capacitor surge test tool according to claim 2, characterized in that: Fixing holes are provided at the lower bends of the first test clip (2) and the second test clip (3), and are connected to the PCB board (1) using fixing screws (6).
5. The tantalum capacitor surge test tool according to claim 2, characterized in that: The bending angle of the lower bending parts of the first test clip (2) and the second test clip (3) is 90°.
6. The tantalum capacitor surge test tool according to claim 1, characterized in that: The two first test clips (2) are arranged side by side on the PCB board (1), and the second test clip (3) is arranged opposite to the two first test clips (2).
7. The tantalum capacitor surge test tool according to claim 1, characterized in that: The PCB board (1) is a plug-in type anti-reverse insertion PCB board.
8. The tantalum capacitor surge test tool according to claim 7, characterized in that: The spacing between the banana heads (4) is different.
9. The tantalum capacitor surge test tool according to claim 1, characterized in that: The minimum distance between the first test clip (2) and the second test clip (3) is smaller than the size of the capacitor (5) to be tested.
10. The tantalum capacitor surge test tool according to claim 9, characterized in that: The maximum distance between the first test clip (2) and the second test clip (3) is greater than the size of the capacitor (5) to be tested.