Laser chip conveying device

Abstract

The utility model discloses a laser chip conveying device and method, and the device comprises a feeding conveyor, a no-load conveyor, an aging platform deck, a test transfer table, a test platform deck, a discharging conveyor, a defective product conveyor, and a chip manipulator. The chip manipulator is selectively in seamless butt joint with one of the feeding conveyor, the no-load conveyor and the test transfer table, and is configured to suck a laser chip and then freely move to a preset position in the horizontal direction and the vertical direction; the laser chip conveying device and method have the advantages of being low in cost, high in efficiency, low in labor intensity, high in quality output, high in productivity improvement and the like, and a great change is brought to production and testing of laser chips.

Description

Technical Field

[0001] The utility model relates to the field of mechanical automation, in particular to a laser chip transmission device. Background Art

[0002] Laser chips, a key branch of the semiconductor chip field, play a vital role as core materials in the upstream laser industry. After undergoing precision pre-processing processes such as scribing and eutectic bonding, they are formed into Chip On Submount (COS, hereinafter referred to as laser chips), becoming the cornerstone material for core devices such as semiconductor lasers, fiber lasers, and solid-state lasers. Rigorous testing and aging screening are indispensable to the R&D and mass production cycles of laser chips, ensuring that they meet quality standards before entering the subsequent manufacturing process and ultimately being used in lasers. Therefore, aging testing plays a vital role in the overall laser manufacturing process and is a key step in ensuring product quality and stability.

[0003] The aging test process of laser chips is unique and has the following characteristics:

[0004] 1. Process complexity and multiple cycles: This process not only covers the basic process of testing-burn-in-retesting, but may also involve multiple cycles, significantly increasing the frequency and complexity of disassembly and transportation.

[0005] 2. Extensive parameter coverage: The testing process involves a wide variety of key measurement parameters, including optical and electrical parameters, requiring high accuracy and comprehensiveness.

[0006] 3. Time-consuming: The burn-in phase, in particular, typically takes several hours or even dozens of hours, posing a challenge to test efficiency.

[0007] 4. The key value of data: The collected intermediate parameters are irreplaceable and important for adjusting subsequent R&D directions, process optimization, and quality control of production and manufacturing;

[0008] 5. Vulnerability risk: Multiple steps, multiple disassembly and assembly, complex testing processes, and long-term operation can easily lead to contamination and additional damage, increasing the risk of product defective rates;

[0009] 6. The difficulty of achieving automation: Given that aging testing involves numerous sophisticated process steps, including material handling, precise identification, automated placement, current regulation, power and spectrum monitoring, and data recording and management, its automation requires a deep integration of high-end technologies such as mechanics, electrical engineering, software, and optics, posing an extremely challenging challenge.

[0010] Given the complexity and uniqueness of aging testing, there is currently a lack of fully automatic aging testing equipment for laser chips on the market, while most other links in the laser production chain have been fully automated or semi-automated.

[0011] Therefore, it is necessary to design a new laser chip transmission device and method to solve the above technical problems. Utility Model Content

[0012] The purpose of the utility model is to provide a low-cost, high-capacity laser chip transmission device.

[0013] To achieve the aforementioned objectives, the present invention adopts the following technical solutions: a laser chip conveying device, comprising a feed conveyor, an empty conveyor, an aging platform, a test turntable, a test platform, a discharge conveyor, a defective product conveyor and a chip manipulator, wherein the feed conveyor is arranged in the middle layer, the empty load is arranged in the lower layer, the test turntable, the test platform, the discharge conveyor and the defective product conveyor are respectively arranged in the upper layer, the aging platform is configured to move up and down, and selectively seamlessly dock with one of the feed conveyor, the empty load conveyor and the test turntable, the test turntable, the test platform and the discharge conveyor are arranged in the same straight line along the front-to-back direction, and each adjacent two are seamlessly docked, the test platform is located between the test turntable and the discharge conveyor, the defective product conveyor and the discharge conveyor are arranged at intervals on the left and right, and the chip manipulator is configured to absorb the laser chip and then realize its free movement in the horizontal and vertical directions to a predetermined position.

[0014] The laser chip conveying device of this utility model realizes significant optimization of production and manufacturing costs with its ingenious structural design. The performance of a single device is comparable to that of three devices, while the overall investment cost remains unchanged. At the same time, in terms of human resource allocation, at least 2 to 3 operators can be reduced, which greatly reduces labor costs. It has excellent work efficiency and can realize 7x24 hours uninterrupted operation. The test cycle of a single laser chip is shortened to a minimum of 15 seconds, which greatly improves work efficiency. In terms of improving working conditions, it significantly reduces the physical burden and labor intensity of operators in the process of clamping laser chips and subsequent data collection and analysis. Through automated processes, the device effectively avoids errors caused by human factors and does not rely on operators with different levels of proficiency, thereby ensuring steady improvement and high consistency of product quality. More importantly, under the same working time and floor space, the laser chip conveying device of this utility model can achieve a proportional and substantial increase in production capacity, at least 1.5 times the increase, which significantly improves production efficiency and economic benefits. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 This is a three-dimensional diagram of the laser chip transmission device of the present invention.

[0016] Figure 2 This is a three-dimensional exploded view of the laser chip transmission device of the present invention from another angle.

[0017] Figure 3 This is a three-dimensional diagram of the aging carrier of the laser chip conveying device of the present invention.

[0018] Figure 4 A three-dimensional diagram of a chip box placed on a carrier.

[0019] Figure 5 Exploded view of the chip box and carrier separated. DETAILED DESCRIPTION

[0020] See also Figures 1 to 5 As shown, the laser chip conveying device 100 of the present invention includes a feed conveyor 10, an empty conveyor 20, an aging platform 30, a test turntable 40, a test turntable 50, a discharge conveyor 60, a defective product conveyor 70, and a chip robot 80. The laser chip conveying device 100 is arranged in three layers along the vertical direction, including an upper layer, a middle layer, and a lower layer. The middle layer is located between the upper and lower layers. The feed conveyor 10 is arranged in the middle layer, the empty conveyor 20 is arranged in the lower layer, and the test turntable 40, the test turntable 50, the discharge conveyor 60, and the defective product conveyor 70 are arranged in the upper layer. The aging platform 30 is configured to be able to move up and down and is used to selectively align horizontally with one of the feed conveyor 10, the empty conveyor 20, and the test turntable 40.

[0021] The infeed conveyor 10, the unloaded conveyor 20, the aging platform 30, the test turntable 40, the test platform 50, the outfeed conveyor 60, and the defective product conveyor 70 each include a motor, a driving wheel, a driven wheel, and a synchronous belt connecting the driving and driven wheels. The motor is connected to the driving wheel to drive its rotation, and the synchronous belt is tensioned between the driving and driven wheels. When the motor directly drives the driving wheel, the driving wheel transfers power to the synchronous belt. The synchronous belt, moving at the same linear velocity as the driving wheel, transfers power to the driven wheel, thereby driving the driven wheel to rotate at a predetermined speed and direction. While maintaining a constant linear velocity, the synchronous belt pulls the carrier 201 on it in horizontal motion. The chip cassette 202 on the carrier 201 and its stored laser chip (not shown) move synchronously with the carrier 201. The aging platform 30, the test turntable 40, and the test platform 50 have essentially the same structure.

[0022] The feeding conveyor 10 is arranged horizontally, and the feeding direction is from back to front. When the feeding conveyor 10 is running, it moves the carrier 201 loaded with the chip box 202 and the laser chip from the back end to the front end.

[0023] The empty conveyor 20 is vertically parallel to the feed conveyor 10 , and the front ends or rear ends of the two are vertically aligned.

[0024] The aging platform 30 is moved up and down by a screw guide slide (not shown) and is seamlessly aligned with any one of the feed conveyor 10, the empty conveyor 20 and the test turntable 40 at a precise time.

[0025] The test turntable 40 , the test carrier 50 and the discharge conveyor 60 are arranged in the same straight line along the front-to-back direction, and each adjacent two are seamlessly connected and aligned to achieve smooth operation. The test carrier 50 is arranged between the test turntable 40 and the discharge conveyor 60 .

[0026] The defective product conveyor 70 and the discharge conveyor 60 are arranged at intervals on the left and right, and the front ends and rear ends of the two are aligned on the left and right.

[0027] The chip manipulator 80 adopts a gantry-type truss manipulator. The chip manipulator 80 spans the two horizontal beams of the X-axis through the Y-axis and the Z-axis to form a gantry structure. The chip manipulator 80 is used to accurately absorb the laser chip and then realize its free movement in the horizontal direction (left and right, front and back) and vertical direction (up and down) until the laser chip is placed in the predetermined precise position.

[0028] The conveying method of the laser chip conveying device 100 of the present invention includes the following steps:

[0029] S1, the carrier 201 loaded with the chip box 202 is placed manually by an operator or automatically by a robot at the rear end of the feed conveyor 10, and the feed conveyor 10 pulls the carrier 201 to move to the front end of the feed conveyor 10;

[0030] S2, the aging platform 30 moves up and down until it is aligned with the front end of the feed conveyor 10, and the feed conveyor 10 continues to pull the carrier 201 to move onto the aging platform 30;

[0031] S3, the aging platform 30 carries the carrier 201 and moves upward until it is horizontally aligned with the test turntable 40 and maintained for a predetermined time;

[0032] S4, the robot arm of the aging device (not shown) vacuum-suctions the laser chip and moves it to the aging base until the chip box is empty;

[0033] S5, the aging platform 30 drags the empty carrier 201 and the empty chip box 202 thereon downward until the front end of the empty conveyor 20 is aligned, and then the aging platform 30 pulls the empty carrier 201 to the empty conveyor 20 for temporary storage;

[0034] S6, after the laser chip is aged on the aging base, the empty carrier is pulled to the aging platform 30 by the empty conveyor 20. Then, the aging platform 30 carries the empty carrier 201 and moves upward until the test transfer platform 40 is horizontally aligned.

[0035] S7, the robot arm of the aging device picks up the aged laser chips and places them in the chip box 202 on the empty carrier 201 until the chip box 202 is full of laser chips;

[0036] S8, the aging stage 30 pulls the carrier 201 to move the chip box 202 loaded with laser chips to the test transfer table 40;

[0037] S9: The test turntable 40 pulls the carrier 201 to move the chip box 202 loaded with laser chips onto the test carrier 50. The chip manipulator 80 picks up the laser chip and moves it to the test device for testing. The test items include at least one of power, spot-divergence angle, spectrum, and polarization.

[0038] S10, the laser chips that pass the test are picked up by the chip manipulator 80 and moved to the chip box 202 on the carrier 201 on the test carrier 50, and the laser chips that fail the test are picked up by the chip manipulator 80 and moved to the chip box 202 on the carrier 201 on the defective product conveyor 70;

[0039] Finally, the test platform 50 pulls the carrier 201 and the chip box 202 loaded with the tested laser chips to move to the discharge conveyor 60 for discharge backwards, and the defective product conveyor 70 simultaneously discharges the laser chips that have failed the test.

[0040] The laser chip conveying device 100 and method of the present invention achieve significant optimization of production and manufacturing costs with its ingenious structural design. The performance of a single device is comparable to that of three devices, while the overall investment cost remains unchanged. At the same time, in terms of human resource allocation, at least 2 to 3 operators can be reduced, significantly reducing labor costs; the work efficiency is excellent, and it can achieve 7x24 hours of uninterrupted operation around the clock. The test cycle of a single laser chip is shortened to a minimum of 15 seconds, greatly improving work efficiency; in terms of improving working conditions, it significantly reduces the physical burden and labor intensity of operators in clamping laser chips and subsequent data collection and analysis processes; through automated processes, the device effectively avoids errors caused by human factors and does not rely on operators with different levels of proficiency, thereby ensuring steady improvement and high consistency of product quality; more importantly, under the same working time and floor space, the laser chip conveying device 100 of the present invention can achieve a proportional and significant increase in production capacity, at least 1.5 times the increase, significantly improving production efficiency and economic benefits.

[0041] In summary, the laser chip conveying device 100 of the present invention has brought about a great revolution in the production and testing of laser chips with its multiple advantages such as low cost, high efficiency, low labor intensity, high quality output and high productivity improvement.

[0042] Although the preferred embodiments of the present invention have been disclosed for illustrative purposes, those skilled in the art will appreciate that various modifications, additions and substitutions are possible, without departing from the scope and spirit of the invention as disclosed in the accompanying claims.

Claims

1. A laser chip transmission device, characterized in that: It includes a feed conveyor, an empty conveyor, an aging platform, a test turntable, a test platform, a discharge conveyor, a defective product conveyor and a chip manipulator. The feed conveyor is arranged on the middle layer, the empty load is arranged on the lower layer, the test turntable, the test platform, the discharge conveyor and the defective product conveyor are respectively arranged on the upper layer, the aging platform is configured to move up and down, and selectively seamlessly dock with one of the feed conveyor, the empty load conveyor and the test turntable. The test turntable, the test platform and the discharge conveyor are arranged in the same straight line along the front-to-back direction, and each adjacent two are seamlessly docked. The test platform is located between the test turntable and the discharge conveyor, and the defective product conveyor and the discharge conveyor are arranged at intervals on the left and right. The chip manipulator is configured to absorb the laser chip and then realize its free movement in the horizontal and vertical directions to a predetermined position.

2. The laser chip conveying device according to claim 1, characterized in that: The feed conveyor, empty conveyor, aging platform, test transfer platform, test platform, discharge conveyor or defective product conveyor includes a motor, a driving wheel, a driven wheel and a synchronous belt connecting the driving wheel and the driven wheel. The motor is connected to the driving wheel to drive the driving wheel to rotate, and the synchronous belt is tensioned on the driving wheel and the driven wheel.

3. The laser chip conveying device according to claim 1, wherein: The empty conveyor and the feed conveyor are parallel to each other, and the front ends or rear ends of the two are aligned up and down.

4. The laser chip conveying device according to claim 1, wherein: The aging platform is moved up and down by a screw guide rail slide.

5. The laser chip conveying device according to claim 1, wherein: The front end and the rear end of the defective product conveyor are aligned left and right respectively with the discharging conveyor.

6. The laser chip conveying device according to claim 1, wherein: The sheet manipulator is a gantry-type truss manipulator.

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