Clamp for chip testing

Abstract

The utility model discloses a chip test fixture, including support module and a plurality of clamping modules, the clamping modules are installed on the support module, the support module includes a vertical plate, a working plate, a plurality of clamping installation plates and a plurality of support plates, the clamping installation plates are fixedly installed on the vertical plate, the working plate is installed on the vertical plate, and the clamping installation plates are installed on the working plate. The supporting plates are arranged between the adjacent clamping mounting plates, the supporting plates are fixedly mounted on the vertical plate, the working plate is fixedly mounted on the supporting plates, and the working plate is provided with a plurality of detection stations for placing chips to be detected. According to the clamp for testing the chip, the bracket module and the plurality of clamping modules are linked, so that the chip to be tested is automatically clamped and fixed, the detection is convenient, and the clamp has the advantages of stable structure, high efficiency, high practicability and the like.

Description

Technical Field

[0001] The utility model belongs to the technical field of chip testing, and in particular relates to a fixture for chip testing. Background Art

[0002] With the rapid development of semiconductor technology, chip integration and performance continue to improve, placing increasing demands on chip testing accuracy and efficiency. During chip testing, chips need to be secured to facilitate inspection by testing equipment. Many existing chip fixtures are relatively simple and require manual operation, which is time-consuming, labor-intensive, and inefficient.

[0003] Therefore, further improvements are made to the above problems. Utility Model Content

[0004] The main purpose of the utility model is to provide a chip testing fixture, which is linked by a bracket module and a plurality of clamping modules to automatically clamp and fix the chip to be tested, making it easy to detect. It has the advantages of stable structure, high efficiency and high practicality.

[0005] To achieve the above objectives, the present invention provides a chip testing fixture, comprising a bracket module and a plurality of clamping modules, wherein the clamping modules are mounted on the bracket module, wherein:

[0006] The support module includes a vertical plate, a working plate, a plurality of clamping and mounting plates, and a plurality of support plates. The clamping and mounting plates are fixedly mounted on the vertical plates. The support plates are provided between adjacent clamping and mounting plates and are fixedly mounted on the vertical plates. The working plate is fixedly mounted on the support plates. The working plate is provided with a plurality of detection stations for placing chips to be tested.

[0007] The clamping module includes a driving unit and a clamping unit, wherein:

[0008] The driving unit includes a cylinder, a top wheel mounting frame, a top wheel, a first inclined slide rail, a second inclined slide rail, a first slider and a second slider, wherein the cylinder, the first inclined slide rail and the second inclined slide rail are all fixedly mounted on the clamping mounting plate, and the first inclined slide rail and the second inclined slide rail are both located above the cylinder; the top wheel mounting frame is connected to the driving end of the cylinder, and the top wheel is mounted on the top wheel mounting frame, the first slider is mounted on the first inclined slide rail, and the second slider is mounted on the second inclined slide rail;

[0009] The clamping unit includes a first mounting block, a second mounting block, a first fixed block, a second fixed block, a first clamping block and a second clamping block, the first mounting block is mounted on the first slider and the second mounting block is mounted on the second slider, the top wheel is located between the first mounting block and the second mounting block, the first fixed block is mounted on the first mounting block and the second fixed block is mounted on the second mounting block, the first clamping block is mounted on the first fixed block and the second clamping block is mounted on the second fixed block, and the first clamping block and the second clamping block are used to clamp the chip to be tested.

[0010] As a further preferred technical solution of the above technical solution, the bottom end of the first inclined slide rail and the bottom end of the second inclined slide rail are close to each other.

[0011] As a further preferred technical solution of the above technical solution, the bottom end of the first mounting block is provided with a first inclined surface and the bottom end of the second mounting block is provided with a second inclined surface, and the top wheel acts on the first inclined surface and the second inclined surface.

[0012] As a further preferred technical solution of the above technical solution, a first spring mounting rod is provided at the top of the first mounting block, a second spring mounting rod is provided at the top of the second mounting block, and a tension spring is provided between the first spring mounting rod and the second spring mounting rod.

[0013] As a further preferred technical solution of the above technical solution, the detection station is provided with a chip placement groove. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 It is a structural diagram of the present utility model.

[0015] Figure 2 It is a structural diagram of the present utility model.

[0016] Figure 3 It is a structural schematic diagram of the clamping module of the present utility model.

[0017] Figure 4 It is a structural schematic diagram of the clamping module of the present utility model.

[0018] The accompanying drawings include: 100, bracket module; 110, vertical plate; 120, working plate; 121, detection station; 130, clamping mounting plate; 140, support plate; 200, clamping module; 210, driving unit; 211, cylinder; 212, top wheel mounting frame; 213, top wheel; 214, first inclined slide rail; 215, second inclined slide rail; 216, first slider; 217, second slider; 220, clamping unit; 221, first mounting block; 2211, first inclined surface; 2212, first spring mounting rod; 222, second mounting block; 2221, second inclined surface; 2222, second spring mounting rod; 223, first fixed block; 224, second fixed block; 225, first clamping block; 226, second clamping block; 300, chip. DETAILED DESCRIPTION

[0019] The following description is intended to disclose the present invention and enable those skilled in the art to implement the present invention. The preferred embodiments described below are provided for illustrative purposes only, and those skilled in the art will readily appreciate other obvious variations. The basic principles of the present invention as defined in the following description may be applied to other embodiments, variations, improvements, equivalents, and other technical solutions that do not depart from the spirit and scope of the present invention.

[0020] The utility model discloses a fixture for chip testing. The specific embodiments of the utility model will be further described below in conjunction with preferred embodiments.

[0021] In the embodiments of the present invention, those skilled in the art will note that the chip and the like involved in the present invention may be regarded as prior art.

[0022] Preferred embodiment.

[0023] like Figure 1-4 As shown, the present invention discloses a chip testing fixture, comprising a support module 100 and a plurality of clamping modules 200, wherein the clamping modules 200 are mounted on the support module 100, wherein:

[0024] The support module 100 includes a vertical plate 110, a working plate 120, a plurality of clamping and mounting plates 130, and a plurality of support plates 140. The clamping and mounting plates 130 are fixedly mounted on the vertical plate 110. The support plates 140 are arranged between adjacent clamping and mounting plates 130 and are fixedly mounted on the vertical plate 110. The working plate 120 is fixedly mounted on the support plates 140. The working plate 120 is provided with a plurality of detection stations 141 for placing the chips 300 to be tested.

[0025] The clamping module 200 includes a driving unit 210 and a clamping unit 220, wherein:

[0026] The driving unit 210 includes a cylinder 211, a top wheel mounting frame 212, a top wheel 213, a first inclined slide rail 214, a second inclined slide rail 215, a first slider 216, and a second slider 217. The cylinder 211, the first inclined slide rail 214, and the second inclined slide rail 215 are all fixedly mounted on the clamping mounting plate 130, and the first inclined slide rail 214 and the second inclined slide rail 215 are both located above the cylinder 211. The top wheel mounting frame 212 is connected to the driving end of the cylinder 211, and the top wheel 213 is mounted on the top wheel mounting frame 212. The first slider 216 is mounted on the first inclined slide rail 214, and the second slider 217 is mounted on the second inclined slide rail 215.

[0027] The clamping unit 220 includes a first mounting block 221, a second mounting block 222, a first fixed block 223, a second fixed block 224, a first clamping block 225 and a second clamping block 226, the first mounting block 221 is mounted on the first slider 216 and the second mounting block 222 is mounted on the second slider 217, the top wheel 213 is located between the first mounting block 221 and the second mounting block 222, the first fixed block 223 is mounted on the first mounting block 221 and the second fixed block 223 is mounted on the second mounting block 222, the first clamping block 225 is mounted on the first fixed block 223 and the second clamping block 226 is mounted on the second fixed block 224, the first clamping block 225 and the second clamping block 226 are used to clamp the chip 300 to be tested.

[0028] Specifically, the bottom end of the first inclined slide rail 214 and the bottom end of the second inclined slide rail 215 are close to each other.

[0029] More specifically, a first inclined surface 2211 is provided at the bottom end of the first mounting block 221 and a second inclined surface 2221 is provided at the bottom end of the second mounting block 222 , and the top wheel 213 acts on the first inclined surface 2211 and the second inclined surface 2221 .

[0030] Furthermore, a first spring mounting rod 2212 is provided at the top of the first mounting block 221 , a second spring mounting rod 2222 is provided at the top of the second mounting block 222 , and a tension spring (not shown) is provided between the first spring mounting rod 2212 and the second spring mounting rod 2222 .

[0031] Furthermore, the detection station 141 is provided with a chip placement slot (not shown).

[0032] For this utility model:

[0033] The chip to be inspected is placed on the inspection station, and then the cylinder is started to drive the top wheel mounting frame to reset, so that the top wheel no longer presses against the inclined surfaces of the first mounting block and the second mounting block, so that the first mounting block and the second mounting block move downward toward each other along their respective inclined slide rails due to the action of gravity and the tensioning spring, so that the first clamping block and the second clamping block act on the chip after moving downward to limit and fix the chip, and the tensioning spring makes the first mounting block and the second mounting block tightened toward each other for stable inspection. After the inspection is completed, the cylinder is started to drive the top wheel mounting frame to move upward, thereby driving the top wheel to move upward and act on the inclined surfaces of the first mounting block and the second mounting block, so that the first mounting block and the second mounting block move upward along their respective inclined slide rails, and finally the first clamping block and the second clamping block release the chip, so that the inspected chip can be taken out and the chip to be inspected can be put back in.

[0034] It is worth mentioning that the technical features such as chips involved in this utility model patent application should be regarded as prior art. The specific structure, working principle and possible control method and spatial layout method of these technical features can be selected by conventional options in the field and should not be regarded as the inventive point of this utility model patent. This utility model patent will not be further elaborated.

[0035] For those skilled in the art, it is still possible to modify the technical solutions described in the aforementioned embodiments, or to replace some of the technical features therein with equivalents. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present utility model should be included in the scope of protection of the present utility model.

Claims

1. A chip testing fixture, characterized in that: It includes a bracket module and several clamping modules, wherein the clamping modules are installed on the bracket module, wherein: The support module includes a vertical plate, a working plate, a plurality of clamping and mounting plates, and a plurality of support plates. The clamping and mounting plates are fixedly mounted on the vertical plates. The support plates are provided between adjacent clamping and mounting plates and are fixedly mounted on the vertical plates. The working plate is fixedly mounted on the support plates. The working plate is provided with a plurality of detection stations for placing chips to be tested. The clamping module includes a driving unit and a clamping unit, wherein: The driving unit includes a cylinder, a top wheel mounting frame, a top wheel, a first inclined slide rail, a second inclined slide rail, a first slider and a second slider, wherein the cylinder, the first inclined slide rail and the second inclined slide rail are all fixedly mounted on the clamping mounting plate, and the first inclined slide rail and the second inclined slide rail are both located above the cylinder; the top wheel mounting frame is connected to the driving end of the cylinder, and the top wheel is mounted on the top wheel mounting frame, the first slider is mounted on the first inclined slide rail, and the second slider is mounted on the second inclined slide rail; The clamping unit includes a first mounting block, a second mounting block, a first fixed block, a second fixed block, a first clamping block and a second clamping block, the first mounting block is mounted on the first slider and the second mounting block is mounted on the second slider, the top wheel is located between the first mounting block and the second mounting block, the first fixed block is mounted on the first mounting block and the second fixed block is mounted on the second mounting block, the first clamping block is mounted on the first fixed block and the second clamping block is mounted on the second fixed block, and the first clamping block and the second clamping block are used to clamp the chip to be tested.

2. A chip testing fixture according to claim 1, characterized in that: The bottom end of the first inclined slide rail and the bottom end of the second inclined slide rail are close to each other.

3. A chip testing fixture according to claim 2, characterized in that: The bottom end of the first mounting block is provided with a first inclined surface and the bottom end of the second mounting block is provided with a second inclined surface, and the top wheel acts on the first inclined surface and the second inclined surface.

4. A chip testing fixture according to claim 3, characterized in that: A first spring mounting rod is provided at the top end of the first mounting block, a second spring mounting rod is provided at the top end of the second mounting block, and a tension spring is provided between the first spring mounting rod and the second spring mounting rod.

5. The chip testing fixture according to claim 1, characterized in that: The detection station is provided with a chip placement slot.

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