Memory chip testing device

Abstract

The utility model discloses a memory chip testing device, which comprises a testing seat and a plurality of chips to be tested, the testing seat is provided with a plurality of testing grooves, the surface of the testing seat is provided with side plates at two sides of the testing grooves, and the surface of the testing seat is provided with baffle plates in front of the testing grooves. Channels communicated with the outside are arranged on the inner wall surfaces of the test grooves, clamps are arranged at the positions, right facing the channels, above the test seat, slots are formed in the clamps, and chips to be tested are inserted into the slots. According to the utility model, the structure is simple, the two side surfaces of the to-be-tested chip can be extruded by the second diversion parts, so that the two sides of the to-be-tested chip can be centered and directly face the test groove, and when the to-be-tested chip descends, the to-be-tested chip can be extruded by the first diversion parts, so that the to-be-tested chip can be accurately and vertically opposite to the test seat; moreover, the installation and subsequent disassembly of a plurality of to-be-tested chips can be completed at a time through the lifting assembly, and the convenience is greatly improved.

Description

Technical Field

[0001] The utility model relates to the technical field of memory chip testing, in particular to a memory chip testing device. Background Art

[0002] Memory chips, also known as semiconductor memories, refer to semiconductor media devices that use electrical energy to store information. Their storage and reading processes are reflected in the storage or release of electrons.

[0003] Currently, memory chips are tested after production. During chip testing, a test socket is required. However, the current test socket has a simple structure and cannot quickly position the chip. Moreover, only one test chip can be accurately placed into the test slot of the test socket at a time. Subsequently, each chip needs to be taken out of the test slot one by one, making the loading and subsequent disassembly process more troublesome. Summary of the Invention

[0004] The technical problem to be solved by the present invention is to provide a memory chip testing device which, after being inserted into a fixture, can complete the precise alignment of the chip to be tested and the subsequent rapid disassembly, so as to solve the problems raised in the above-mentioned background technology.

[0005] The utility model is realized through the following technical scheme: a memory chip testing device, comprising a test seat and a plurality of chips to be tested, the test seat being provided with a plurality of test slots, the surface of the test seat being provided with side panels on both sides of the test slots, the surface of the test seat being provided with baffles in front of the test slots, the inner wall surfaces of the test slots being provided with channels communicating with the outside world, a fixture being provided above the test seat opposite to the channel, the fixture being provided with slots, the chips to be tested being inserted into the slots, and a lifting assembly being provided on one side of the test seat for synchronously driving the fixture to move up and down.

[0006] As a preferred technical solution, the inner side surfaces of the side panels and the baffle are both flush with the inner side surfaces of the test slot, the end of the baffle facing the fixture is bent outward to form a first guide portion, the end of the side panel facing the baffle is bent outward to form a second guide portion, and the end of the chip to be tested away from the baffle is set in contact with the inner wall surface of the slot.

[0007] As an optimal technical solution, the lifting assembly includes a push plate and multiple electric push rods. The push plate is arranged on the surface of multiple clamps. The push plates protrude opposite the clamps to form a fixed part. The other end of the fixed part is fixedly connected to the clamp. The electric push rods are respectively arranged at both ends of the push plate, and the piston rods of the electric push rods are fixedly connected to the push plates. A fixing frame is installed on the outside of the electric push rod, and the other end of the fixing frame is installed on the test seat.

[0008] As a preferred technical scheme, the push plate is provided with a positioning hole near the electric push rod, the positioning hole is provided with a positioning column, one end of the positioning column is installed on the test seat, and the other end is installed with a limiting block, and the inner side surface of the limiting block is in surface contact with the push plate.

[0009] As a preferred technical scheme, the clamp is made of high-strength insulating plastic material.

[0010] As a preferred technical scheme, the height of the baffle is lower than that of the side plate, and the two sides of the to-be-tested chip are in surface contact with the side plate.

[0011] The utility model discloses the beneficial effect is: the utility model discloses simple structure, multiple to-be-tested chips can be inserted into the slot, in the process of to-be-tested chip insertion, the two side surfaces of to-be-tested chip can be extruded by the second flow guide part, so that to-be-tested chip can be two sides in the middle and be perpendicular to the test groove, and when to-be-tested chip drops, can be extruded by the first flow guide part, so that to-be-tested chip can be accurate and perpendicular to the test seat, and through the lifting assembly, the installation of multiple to-be-tested chips and subsequent disassembly can be completed at one time, greatly increase the convenience. BRIEF DESCRIPTION OF DRAWINGS

[0012] In order to more clearly illustrate the technical scheme in the embodiment of the utility model or prior art, the following will be briefly introduced the drawings needed to be used in the embodiment or prior art description, obviously, the drawings in the following description only some embodiments of the utility model, for those skilled in the art, under the premise of not paying creative labor, other drawings can also be obtained according to these drawings.

[0013] Figure 1 It is the overall structure schematic diagram of the utility model;

[0014] Figure 2 It is the side view of the utility model;

[0015] Figure 3 It is the structure schematic diagram of the utility model after removing to-be-tested chip.

[0016] Among them, 1, test seat;2, test groove;3, side plate;4, baffle;5, to-be-tested chip;6, clamp;7, fixed part;8, push plate;9, positioning column;10, limiting block;11, electric push rod;12, fixed frame;13, channel;14, slot. DETAILED DESCRIPTION

[0017] The following describes embodiments of the present invention in detail. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended only to explain the present invention and are not to be construed as limiting the present invention.

[0018] All features disclosed in this specification, or all steps in the disclosed methods or processes, except mutually exclusive features and / or steps, can be combined in any manner.

[0019] Any feature disclosed in this specification (including any appended claims, abstract and drawings), unless otherwise stated, may be replaced by other equivalent or similar features. That is, unless otherwise stated, each feature is only an example of a series of equivalent or similar features.

[0020] like Figure 1 、 Figure 2 and Figure 3 As shown, a memory chip testing device of the present invention includes a test seat 1 and a plurality of chips to be tested 5, wherein the test seat 1 is provided with a plurality of test slots 2, and the surface of the test seat 1 is provided with side panels 3 on both sides of the test slot 2, and the surface of the test seat 1 is provided with baffles 4 in front of the test slot 2, and the inner wall surface of the test slot 2 is provided with a channel 13 connected to the outside world, and a clamp 6 is provided above the test seat 1 opposite to the channel 13, and a slot 14 is provided on the clamp 6, and the chips to be tested 5 are inserted into the slot 14, and a lifting component for synchronously driving the clamp 6 to move up and down is installed on one side of the test seat 1.

[0021] In this embodiment, the inner side surfaces of the side panel 3 and the baffle 4 are both flush with the inner side surfaces of the test slot 2, the end of the baffle 4 facing the fixture 6 is bent outward to form a first guide portion, and the end of the side panel 3 facing the baffle 4 is bent outward to form a second guide portion, and the end of the chip to be tested 5 away from the baffle 4 is set in contact with the inner wall surface of the slot 14.

[0022] In this embodiment, the lifting assembly includes a push plate 8 and a plurality of electric push rods 11. The push plate 8 is arranged on the surface of the plurality of clamps 6. The push plate 8 protrudes at the position opposite to the clamp 6 to form a fixing portion 7. The other end of the fixing portion 7 is fixedly connected to the clamp 6. The electric push rods 11 are respectively arranged at both ends of the push plate 8, and the piston rods of the electric push rods 11 are fixedly connected to the push plate 8. A fixing frame 12 is installed on the outside of the electric push rod 11, and the other end of the fixing frame 12 is installed on the test seat 1.

[0023] Among them, after the push plate descends, the fixing portion can smoothly enter the channel, so that the clamp can fully descend and enter the channel.

[0024] In this embodiment, the push plate 8 is provided with a positioning hole near the electric push rod 11, and a positioning column 9 is provided in the positioning hole. One end of the positioning column 9 is installed on the test seat 1, and the other end is installed with a limit block 10. The inner side surface of the limit block 10 is arranged to contact the surface of the push plate 8.

[0025] In this embodiment, the clamp 6 is made of high-strength insulating plastic material to avoid electrical conduction that may affect the test results.

[0026] In this embodiment, the height of the baffles 4 is lower than the side panels 3, and both sides of the chip to be tested 5 are in contact with the side panels 3, so that the chip to be tested can pass over the baffles and be inserted into the slot.

[0027] When in use, since the fixture is in an upward state, the fixture is higher than the baffle device. At this time, the chip to be tested can be directly inserted into the slot. During the insertion process, both sides of the chip to be tested will be squeezed by the second guide part, so that the chip to be tested can be centered and opposite to the test seat. After being inserted into place, the electric push rod can be started to extend the piston rod of the electric push rod. The extension of the piston rod pushes the push plate, so that the push plate moves downward steadily along the positioning column. The movement of the push plate drives the fixing part and multiple fixtures, and the multiple fixtures can synchronously drive multiple chips to be tested to move downward. After the chip to be tested falls, it will contact the first guide part on the baffle. The squeezing between the first guide part can make the four sides of the chip to be tested accurately opposite to the sides of the test seat. As the fixture continues to fall, the lower half of the fixture can enter the channel, and the chip to be tested can contact the contact points in the test slot, and the downward pressure of the fixture can ensure the stability of the contact, so as to ensure the quality of the detection.

[0028] After the test is completed, the electric push rod can synchronously drive the push plate and the clamp to rise, and the clamp can remove multiple chips to be tested from the test slot at one time, making it convenient to disassemble them.

[0029] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any changes or substitutions that do not require creative effort should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be based on the scope of protection defined in the claims.

Claims

1. A memory chip testing device, characterized in that: The invention comprises a test seat (1) and a plurality of chips to be tested (5), wherein the test seat (1) is provided with a plurality of test slots (2), a surface of the test seat (1) is provided with side panels (3) on both sides of the test slots (2), a surface of the test seat (1) is provided with baffles (4) in front of the test slots (2), an inner wall surface of the test slots (2) is provided with a channel (13) communicating with the outside, a clamp (6) is provided above the test seat (1) and opposite to the channel (13), a slot (14) is provided on the clamp (6), and the chips to be tested (5) are inserted into the slots (14), and a lifting component for synchronously driving the clamp (6) to move up and down is installed on one side of the test seat (1).

2. The memory chip testing device according to claim 1, wherein: The inner side surfaces of the side plate (3) and the baffle (4) are both flush with the inner side surface of the test slot (2); one end of the baffle (4) facing the fixture (6) is bent outward to form a first guide portion; one end of the side plate (3) facing the baffle (4) is bent outward to form a second guide portion; and one end of the chip to be tested (5) away from the baffle (4) is arranged to abut against the inner wall surface of the slot (14).

3. The memory chip testing device according to claim 1, wherein: The lifting assembly comprises a push plate (8) and a plurality of electric push rods (11). The push plate (8) is arranged on the surface of a plurality of clamps (6). The push plate (8) protrudes at a position opposite to the clamp (6) to form a fixing portion (7). The other end of the fixing portion (7) is fixedly connected to the clamp (6). The electric push rods (11) are respectively arranged at both ends of the push plate (8), and the piston rods of the electric push rods (11) are fixedly connected to the push plate (8). A fixing frame (12) is installed on the outside of the electric push rod (11), and the other end of the fixing frame (12) is installed on the test seat (1).

4. The memory chip testing device according to claim 3, wherein: The push plate (8) is provided with a positioning hole near the electric push rod (11), and a positioning column (9) is provided in the positioning hole. One end of the positioning column (9) is installed on the test seat (1), and the other end is installed with a limit block (10). The inner side surface of the limit block (10) is in contact with the surface of the push plate (8).

5. The memory chip testing device according to claim 1, wherein: The clamp (6) is made of high-strength insulating plastic material.

6. The memory chip testing device according to claim 1, wherein: The height of the baffles (4) is lower than that of the side plates (3), and both sides of the chip to be tested (5) are in contact with the side plates (3).

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