Chip capacitor double-sided insulation testing device

Abstract

The utility model discloses a chip capacitor double-sided insulation testing device, which comprises a casing, a back plate and a workbench, the back plate is mounted in the casing, and the workbench is positioned on one side of the back plate; the workbench divides the casing into an upper test area and a lower test area, the upper test area is provided with an upper test head, the lower test area is provided with a lower test head, and the upper test head and the lower test head are respectively provided with a corresponding test probe used for testing a double-sided capacitor; the workbench is provided with a test sample loading and unloading area for loading and unloading a test sample, a carrier plate conveying mechanism for transversely conveying the test sample, and a test sample placing area positioned between the upper and lower test heads; the test probes of the upper and lower test heads are respectively contacted with two sides of the chip capacitor so as to carry out double-sided capacitor insulation test. According to the utility model, the capacitor carrier plate is automatically conveyed to the test sample placement area through the carrier plate conveyor, the upper and lower test heads are started, and the two sides of the chip capacitor are respectively contacted above and below the capacitor, so that the device capable of automatically testing the double-sided insulation resistance of the MLCC product is provided.

Description

TECHNICAL FIELD

[0001] The utility model relates to electronic components technical field, concretely relates to a chip capacitor double -sided insulation testing arrangement. BACKGROUND

[0002] According to the preparation need in the field of electronic components, the reliability test requirement of the electrical performance of components is higher and higher. Taking MLCC (chip multilayer ceramic capacitor) as an example, it is found that different test results exist when different polarity voltage is applied to the limit capacity MLCC product insulation resistance value test during the electrical performance test of MLCC, that is, the insulation resistance value is qualified when one polarity voltage is applied, and the insulation resistance value is unqualified when another polarity voltage is applied. Only one-way insulation test cannot 100% eliminate unqualified products. In order to ensure the high reliability of products, at present, the two-way insulation resistance value of the limit capacity product is tested by manual according to the following process: pre-charging → placing on the desktop one by one → testing insulation resistance value → discharging → changing polarity pre-charging → testing insulation resistance value → discharging. But the manual test process is complex and tedious, which cannot meet the production demand. At present, there is no automatic test equipment on the market that can test the double-sided insulation resistance value of the limit capacity MLCC product.

[0003] In view of this, the present patent application is proposed. UTILITY MODEL CONTENT

[0004] The utility model aims at providing a chip capacitor double -sided insulation testing arrangement, solves the above said current for the double -sided insulation test process of chip capacitor complex and tedious, cannot satisfy the production demand.

[0005] The utility model realizes by the following technical scheme:

[0006] A chip capacitor double -sided insulation testing arrangement, including the casing, backboard, workstation, the backboard is installed in the casing, the workstation is located in the one side of backboard;

[0007] The workstation divides the casing into upper test area and lower test area, the upper test area is equipped with upper test head, and the lower test area is equipped with lower test head, and the upper test head and lower test head are equipped with corresponding test probes on it, for testing the capacitor of double -sided;

[0008] The workstation is equipped with test sample feeding and discharging area for testing sample feeding and discharging, horizontal conveying test sample carrier plate conveying mechanism, test sample placement area between upper and lower test heads;

[0009] The test probes of upper and lower test heads are respectively connected to the upper end electrode and lower end electrode of chip capacitor to carry out double -sided capacitor insulation test.

[0010] In an optional embodiment, the upper test head comprises a fixed support, a Z-direction lifting mechanism, a fixed seat, an XY-direction adjusting mechanism, and a test probe card, the fixed support is mounted on the back plate, the Z-direction lifting mechanism is mounted on the fixed support, the lifting end of the Z-direction lifting mechanism is fixedly connected with the fixed seat, the XY-direction adjusting mechanism is connected with the fixed seat, and the test probe card is mounted on the XY-direction adjusting mechanism.

[0011] In an optional embodiment, the Z-direction lifting mechanism comprises a pneumatic cylinder, an adjusting screw rod, a first locking nut, a clamping plate, a second locking nut, and a guide shaft, the pneumatic cylinder is mounted on the fixed support, the adjusting screw rod is connected with the power output end of the pneumatic cylinder, the first locking nut and the second locking nut are arranged outside the adjusting screw rod and are threadedly matched, the clamping plate is located between the first locking nut and the second locking nut, the guide shaft penetrates through the fixed support and the clamping plate and is connected with the fixed seat located below, and the clamping plate and the guide shaft are movable relative to the fixed support.

[0012] In an optional embodiment, two guide shafts are arranged, and the two guide shafts are located on the two sides of the locking nuts, and the guide shafts are connected with the fixed support through linear bearings.

[0013] In an optional embodiment, the XY-direction adjusting mechanism comprises an adapter plate and an insulating base, a plurality of adjusting grooves are arranged on the fixed seat, a fixing screw is arranged in each adjusting groove, and the adapter plate and the fixed seat are connected through the fixing screws;

[0014] A plurality of adjusting holes are arranged on the adapter plate, a fixing screw is arranged in each adjusting hole, and the adapter plate and the insulating base are connected through the fixing screws;

[0015] The test probe card comprises an insulating circuit board, an insulating probe seat, and test probes.

[0016] The insulating circuit board is connected with the insulating base, the insulating probe seat is connected with the insulating circuit board, and the test probes are mounted on the insulating probe seat.

[0017] A plurality of positive anode interfaces of a forward insulation resistance tester, a positive anode interface of a forward pre-charging power supply, a negative cathode interface of a reverse insulation resistance tester, a negative cathode interface of a reverse pre-charging power supply, a forward discharge resistor, a reverse discharge resistor, a metallized pad, and a circuit board are arranged on the insulating circuit board.

[0018] In an optional embodiment, the test probe is a double-end elastic test probe, comprising a conical needle, a needle sleeve, a spring, and a flat needle, the conical needle, the spring, and the flat needle are nested in the needle sleeve, the spring is arranged between the conical needle and the flat needle, and the end of the conical needle is connected with the metallized pad of the insulating circuit board in conduction.

[0019] In an optional embodiment, the lower test head adopts the same structure as the upper test head, and the upper test head and the lower test head are symmetrically arranged on both sides of the workbench.

[0020] In an optional embodiment, the carrier plate conveying mechanism comprises a stepper motor belt module, a carrier plate positioning frame, and a limit signal switch group. The stepper motor belt module comprises a stepper motor, a driving wheel, a driven wheel, an annular synchronous belt, a tensioning adjusting mechanism, and a ball linear guide rail module. The carrier plate positioning frame is connected to the annular synchronous belt and connected to the ball linear guide rail module. The ball linear guide rail module is arranged on the back plate and located between the driving wheel and the driven wheel.

[0021] The tensioning adjusting mechanism comprises a tensioning plate, an axle, an adjusting screw, and a fixing screw rod. The tensioning plate is embedded in the back plate and is in sliding fit with the back plate to move. The axle penetrates through the tensioning plate, and the driven wheel is arranged on the axle. The adjusting screw is in threaded connection with the tensioning plate at the side of the tensioning plate. The fixing screw rod penetrates through the strip-shaped hole on the back plate to lock the tensioning plate.

[0022] In an optional embodiment, the carrier plate positioning frame comprises a connecting plate, a positioning pin, and a clamping piece. The connecting plate is connected to the ball slider on the ball linear guide rail module. The positioning pin is located at both ends of the connecting plate and used to cooperate with the positioning hole on the carrier plate to fix the carrier plate. The clamping piece is fixed at the middle part of the connecting plate. The annular synchronous belt passes through the middle of the clamping piece and the connecting plate.

[0023] In an optional embodiment, a carrier plate guiding and limiting mechanism is further included. The carrier plate guiding and limiting mechanism comprises a first compression wheel group, a second compression wheel group, and a floating compression wheel group.

[0024] The first compression wheel group comprises a mounting bracket and a plurality of first compression wheels. The mounting bracket is fixedly mounted on the back plate. The plurality of first compression wheels are mounted on the mounting bracket.

[0025] The second compression wheel group comprises a plurality of second compression wheels and a support. Each second compression wheel is mounted on the workbench through the support.

[0026] The floating compression wheel group comprises a plurality of floating compression wheels. Each floating compression wheel comprises a pressing plate, a pin shaft, a bearing, a sliding block, and a compression spring. The pressing plate is fixed on the workbench. The pressing plate is internally provided with a groove. One end of the compression spring is connected to the pressing plate, and the other end of the compression spring is connected to the sliding block. One end of the sliding block extends to the outside of the groove. The sliding block is provided with a clamping through slot. The bearing is located in the clamping through slot. The pin shaft penetrates through the bearing and is connected to the sliding block.

[0027] The second compression wheel set and the floating compression wheel set are located on one side of the test sample placement area, and each floating compression wheel of the floating compression wheel set is arranged between the second compression wheels.

[0028] Preferably, the shell is provided with a protective cover, an electrical controller and an electrical interface, and the electrical interface is connected with a sorting indication screen.

[0029] Compared with the prior art, the utility model has the advantages and beneficial effects that:

[0030] The utility model discloses a kind of double-sided insulation test devices of chip capacitor, and the capacitor carrier plate is automatically conveyed to test sample placement area by carrier plate conveyor, and starts up and down test head, and the test probe of up and down test head respectively contacts the two sides of chip capacitor above and below capacitor, to carry out double-sided capacitor insulation test, provide a kind of device that can automatically test MLCC product double-sided insulation resistance. BRIEF DESCRIPTION OF DRAWINGS

[0031] In order to more clearly illustrate the technical scheme of the exemplary embodiments of the utility model, the following will be briefly introduced to the drawings needed to be used in the embodiment, it should be understood that the following drawings only show some embodiments of the utility model, therefore should not be regarded as the limitation to the scope, for ordinary skilled person in the art, under the premise of not paying creative labor, other related drawings can also be obtained according to these drawings.In the drawings:

[0032] Figure 1 It is the structure schematic view of a kind of double-sided insulation test devices of chip capacitor provided by the utility model embodiment.

[0033] Figure 2 It is the three-dimensional structure schematic view of a kind of double-sided insulation test devices of chip capacitor provided by the utility model embodiment.

[0034] Figure 3 It is the structure schematic view of upper test head.

[0035] Figure 4 It is the cooperation structure schematic view of adjusting screw rod and locking nut, clamping plate in upper test head.

[0036] Figure 5 It is the structure schematic view of XY direction adjusting mechanism.

[0037] Figure 6 It is the structure schematic view of test probe card.

[0038] Figure 7 It is the structure schematic view of test probe.

[0039] Figure 8 It is the structure schematic view of carrier plate conveying mechanism.

[0040] Figure 9 Structure diagram of the tension adjusting mechanism.

[0041] Figure 10 Structure diagram of the carrier plate positioning frame.

[0042] Figure 11 Structure diagram of the carrier plate guiding and limiting mechanism.

[0043] Figure 12 Structure diagram of the first compression wheel set.

[0044] Figure 13 Structure diagram of the second compression wheel set.

[0045] Figure 14 Structure diagram of the floating compression wheel set.

[0046] Markings in the drawings and corresponding component names:

[0047] 1 - machine shell, 2 - back plate, 3 - workbench, 4 - upper test head, 401 - fixed support, 402 - air cylinder, 403 - adjusting screw, 404 - first locking nut, 405 - clamping plate, 406 - second locking nut, 407 - guide shaft, 408 - linear bearing, 409 - fixed seat, 410 - adapter plate, 411 - insulating base, 412 - adjusting slot, 413 - fixing screw, 414 - adjusting hole, 415 - fixing screw, 416 - test probe card, 4161 - insulating circuit board, 4162 - insulating probe base, 4163 - test probe, 41631 - conical needle, 41632 - needle sleeve, 41633 - spring, 41634 - flat needle, 5 - lower test head, 6 - carrier plate conveying mechanism, 601 - stepper motor belt module, 6011 - stepper motor, 6012 - driving wheel, 6013 - driven wheel, 6014 - ring synchronous belt, 6015 - tension adjusting mechanism, 60151 - tension plate, 60152 - axle, 60153 - adjusting screw, 60154 - fixed screw, 6016 - ball linear guide rail module, 602 - carrier plate positioning frame, 6021 - connecting plate, 6022 - positioning pin, 6023 - clamping piece, 603 - limiting signal switch group, 7 - test sample placement area, 8 - carrier plate guiding and limiting mechanism, 801 - first compression wheel set, 8011 - mounting support, 8012 - first compression wheel, 802 - second compression wheel set, 8021 - second compression wheel, 8022 - support, 803 - floating compression wheel set, 8031 - pressing plate, 8032 - pin shaft, 8033 - bearing, 8034 - sliding block, 8035 - compression spring, 9 - protective cover, 10 - electrical controller, 11 - electrical interface, 12 - sorting indication screen, 13 - capacitor carrier plate. DETAILED DESCRIPTION

[0048] In order to make the purpose, technical scheme and advantages of the utility model clearer and more understandable, the utility model will be further described in detail below in combination with embodiments and drawings. The schematic embodiments of the utility model and the description thereof are only used to explain the utility model and not as a limitation on the utility model.

[0049] In the following description, a large number of specific details are set forth in order to provide a thorough understanding of the utility model. However, it will be apparent to one of ordinary skill in the art that the utility model can be practiced without these specific details. In other instances, well-known structures, circuits, materials or processes have not been described in detail in order to avoid obscuring the utility model.

[0050] Throughout the specification, references to "one embodiment", "an embodiment", "one example", or "an example" mean that a particular feature, structure, or characteristic described in connection with the embodiment or example is included in at least one embodiment of the utility model. The appearances of the phrases "in one embodiment", "an embodiment", "in one example", or "an example" in various places in the specification are not necessarily all referring to the same embodiment or example. Furthermore, the particular features, structures, or characteristics can be combined in any suitable manner in one or more embodiments or examples. In addition, the skilled person will appreciate that the drawings provided herein are for illustrative purposes only and are not necessarily drawn to scale. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0051] In the description of the utility model, the orientations or positional relationships indicated by the terms "front", "back", "left", "right", "up", "down", "vertical", "horizontal", "high", "low", "inner", "outer" and the like are based on the orientations or positional relationships shown in the drawings, and are only for the convenience of describing the utility model and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the scope of protection of the utility model.

[0052] Embodiment 1:

[0053] As shown in Figures 1-14 A double-sided insulation testing device for chip capacitors includes a casing 1, a back plate 2, and a workbench 3. The back plate 2 is fixedly installed in the casing 1, and the workbench 3 is located on one side of the back plate 2 and connected to the back plate 2. The back plate 2 and the workbench 3 form an L-shaped structure.

[0054] The workbench 3 divides the shell 1 into an upper test area and a lower test area, the upper test area is provided with an upper test head 4, the lower test area is provided with a lower test head 5, and the upper test head 4 and the lower test head 5 are provided with corresponding test probes 4163.

[0055] The workbench 3 is provided with a test sample feeding and discharging area for feeding and discharging test samples, a horizontal conveying test sample carrier conveying mechanism 6, and a test sample placing area 7 located between the upper and lower test heads 5. The workbench 3 is provided with a storage slot for placing a sample to be tested, which is a cuboid and serves as the test sample placing area 7.

[0056] The sample to be tested is fed onto the capacitor carrier 13, which is placed on the workbench 3, and then the capacitor carrier 13 is automatically conveyed to the test sample placing area 7 by the carrier conveying mechanism. The upper and lower test heads 5 are started, and the test probes 4163 of the upper and lower test heads 5 respectively contact the two sides of the chip capacitor above and below the capacitor to perform double-sided capacitor insulation testing, thereby providing a device capable of automatically testing the double-sided insulation resistance of MLCC products.

[0057] Further, the upper test head 4 includes a fixed support 401, a Z-direction lifting mechanism, a fixed seat 409, an XY-direction adjusting mechanism, and a test probe card 416.

[0058] The fixed support 401 is installed on the back plate 2 through a threaded rod, the Z-direction lifting mechanism is installed on the fixed support 401, the Z-direction lifting mechanism is fixedly connected to the fixed seat 409 at the liftable end, the fixed seat 409 is lifted by the lifting end of the Z-direction lifting mechanism, the XY-direction adjusting mechanism is connected to the fixed seat 409, the test probe card 416 is installed on the XY-direction adjusting mechanism, and the test probe card 416 includes test probes 4163.

[0059] The Z-direction lifting mechanism includes a gas cylinder 402, an adjusting screw rod 403, a first locking nut 404, a clamping plate 405, a second locking nut 406, and a guide shaft 407. A cavity is formed in the fixed support 401, the gas cylinder 402 is fixedly installed at the top of the fixed support 401, the gas cylinder 402 is a general part on the market, and the adjusting valve on the gas cylinder 402 adjusts the speed of the piston rod extending and retracting.

[0060] The adjusting screw rod 403 is connected to the power output end of the air cylinder 402, the adjusting screw rod 403 extends into the cavity of the fixed support 401, the first locking nut 404 and the second locking nut 406 are arranged outside the adjusting screw rod 403 and are threadedly matched, the clamping plate 405 is located between the first locking nut 404 and the second locking nut 406, the guide shaft 407 penetrates through the fixed support 401 and the clamping plate 405 and is connected to the fixed seat 409 located below, and the clamping plate 405 and the guide shaft 407 are movable relative to the fixed support 401. The guide shaft 407 is provided with two, the two guide shafts 407 are located on the two sides of the locking nut, and the guide shaft 407 and the fixed support 401 are connected through the linear bearing 408 fixed at the bottom of the fixed support 401.

[0061] When the height of the test probe 4163 is adjusted, the air cylinder 402 is started, the adjusting screw rod 403 is rotated, the first locking nut 404 and the second locking nut 406 are moved along the adjusting screw rod 403, the clamping plate 405 is moved, and the guide shafts 407 on the two sides of the clamping plate 405 guide the movement of the clamping plate 405, thereby improving the stability in the lifting process.

[0062] The XY direction adjusting mechanism includes the adapter plate 410 and the insulating base 411, the fixed seat 409 is provided with a plurality of adjusting slot holes 412, the adjusting slot hole 412 is a strip-shaped slot hole, the adjusting slot hole 412 is provided with a fixing screw 413, and the adapter plate 410 and the fixed seat 409 are connected through the fixing screw 413; the position of the adapter plate 410 on the fixed seat 409 can be adjusted by adjusting the position of the fixing screw 413 in the adjusting slot hole 412, and the adapter plate 410 is moved left and right, so that the horizontal position of the test probe 4163 is finely adjusted.

[0063] The adapter plate 410 is provided with a plurality of adjusting holes 414, the adjusting hole 414 is also a strip-shaped slot hole, the adjusting hole 414 is provided with a fixing screw 415, and the adapter plate 410 and the insulating base 411 are connected through the fixing screw 415; the position of the test probe 4163 in the horizontal direction can be finely adjusted by adjusting the position of the fixing screw 415 in the adjusting hole 414, and the test probe 4163 is moved forward and backward, so that the XY direction position of the test probe 4163 can be adjusted.

[0064] In the embodiment, the up-down, left-right and forward-backward fine adjustment can ensure that the test probe 4163 has appropriate pressing force, good centering and reliable contact with the electrodes of the chip capacitor during the test process.

[0065] Embodiment 2:

[0066] In this embodiment, the test probe card 416 includes an insulating circuit board 4161, an insulating probe base 4162, and test probes 4163. The insulating circuit board 4161 is connected to the insulating base 411. The insulating probe base 4162 is connected to the insulating circuit board 4161. The test probes 4163 are installed on the insulating probe base 4162.

[0067] The insulating circuit board 4161 is provided with a plurality of positive polarity insulating resistance test instrument positive polarity interfaces, a positive polarity pre-charging power supply positive polarity interface, a negative polarity insulating resistance test instrument negative polarity interface, a negative polarity pre-charging power supply negative polarity interface, a positive polarity discharge resistance, a negative polarity discharge resistance, a metallized pad, and a circuit board.

[0068] Specifically, the insulating circuit board 4161 is provided with 5 positive polarity insulating resistance test instrument positive polarity interfaces, 1 positive polarity pre-charging power supply positive polarity interface, 1 discharge resistance interface, 5 negative polarity insulating resistance test instrument negative polarity interfaces, 1 negative polarity pre-charging power supply negative polarity interface, 1 positive polarity discharge resistance, 1 negative polarity discharge resistance, 40 metallized pads, and 1 circuit board.

[0069] In this embodiment, the probes for forward pre-charging, forward insulating resistance testing, forward discharging, reverse pre-charging, reverse insulating resistance testing, and reverse discharging are integrated on one test head, which enables simultaneous testing of up to 40 chip capacitors and insulating resistance testing of MLCC products with extreme capacity.

[0070] Further, in this embodiment, the test probes 4163 are double-ended elastic test probes 4163, which include a conical needle 41631, a needle sleeve 41632, a spring 41633, and a flat needle 41634. The conical needle 41631, the spring 41633, and the flat needle 41634 are nested in the needle sleeve 41632. The spring 41633 is arranged between the conical needle 41631 and the flat needle 41634. The end of the conical needle 41631 is connected to the insulating circuit board 4161 for conduction. The conical needle 41631, the spring 41633, and the flat needle 41634 are coaxial and nested in the needle sleeve 41632. Due to the pre-compression of the spring 41633, the elastic test probe 4163 is double-ended and floating with pre-compression force.

[0071] In this embodiment, the flat head probe with adjustable pressing force is used to contact the upper electrode of the chip capacitor, and the conductive contact of the lower layer of the carrier plate is used to contact the lower electrode of the chip capacitor. This greatly reduces the appearance damage during testing.

[0072] In the present patent application, the lower test head 5 adopts the same structure as the upper test head 4, and the upper test head 4 and the lower test head 5 are symmetrically arranged on both sides of the workbench 3 to perform insulation tests on the two sides of the chip capacitor.

[0073] Embodiment 3:

[0074] On the basis of Embodiment 1 or Embodiment 2, the carrier plate conveying mechanism 6 comprises a stepper motor belt module 601, a carrier plate positioning frame 602, and a limit signal switch group 603. The stepper motor belt module 601 comprises a stepper motor 6011, a driving wheel 6012, a driven wheel 6013, an annular synchronous belt 6014, a tensioning adjustment mechanism 6015, and a ball linear guide rail module 6016. The stepper motor 6011 is fixed on the side of the back plate 2 opposite to the workbench 3. The output shaft of the stepper motor 6011 is fixedly connected with the driving wheel 6012 through the back plate 2. The driven wheel 6013 is located at the other end of the back plate 2. The annular synchronous belt 6014 is sleeved on the driving wheel 6012 and the driven wheel 6013. The carrier plate positioning frame 602 is connected with the annular synchronous belt 6014 and moves with the movement of the annular synchronous belt 6014. The carrier plate positioning frame 602 is connected with the ball linear guide rail module 6016, which is arranged on the back plate 2 and located between the driving wheel 6012 and the driven wheel 6013.

[0075] The tensioning adjustment mechanism 6015 comprises a tensioning plate 60151, an axle 60152, adjustment screws 60153, and a fixed screw 60154. The tensioning plate 60151 is embedded in the back plate 2 and is in sliding fit with the back plate 2 to move. The axle 60152 penetrates through the tensioning plate 60151, and the driven wheel 6013 is sleeved on the axle 60152. The adjustment screws 60153 are in threaded connection with the tensioning plate 60151 on the side of the tensioning plate 60151. Two adjustment screws 60153 are arranged. The position of the tensioning plate 60151 is adjusted by changing the screwing depth of the adjustment screws 60153 in the tensioning plate 60151, so as to adjust the distance between the driven wheel 6013 and the driving wheel 6012, and realize the adjustment of the tensioning degree of the annular synchronous belt 6014. Two strip-shaped holes are arranged on the back plate 2. The fixed screw 60154 penetrates through the strip-shaped holes on the back plate 2 to abut against and lock the tensioning plate 60151 from the back of the tensioning plate 60151. The function of the fixed screw 60154 is to lock the tensioning plate 60151 with the adjusted position on the back plate 2, so as to prevent the tensioning plate 60151 from loosening.

[0076] The ball linear guide rail module 6016 in the present embodiment can adopt a mature precision linear guide mechanism on the market, which comprises a linear guide rail and a ball slider. The ball slider is in sliding fit with the linear guide rail.

[0077] In the embodiment, the carrier plate positioning frame 602 comprises a connecting plate 6021, positioning pins 6022 and clamping pieces 6023. The connecting plate 6021 is connected to the ball sliding block on the ball linear guide module 6016. The positioning pins 6022 are located at both ends of the connecting plate 6021 and used to cooperate with the positioning holes on the capacitor carrier plate 13 to fix the capacitor carrier plate 13. The clamping pieces 6023 are fixed in the middle of the connecting plate 6021. The upper half of the ring-shaped synchronous belt 6014 passes through the middle of the clamping pieces 6023 and the connecting plate 6021.

[0078] When the capacitor carrier plate 13 is transported, the stepper motor 6011 works to drive the ring-shaped synchronous belt 6014 to transport and move the connecting plate 6021, so as to transport the sample to be tested from the feeding and discharging area to between the upper test head 4 and the lower test head 5.

[0079] The limiting signal switch group 603 comprises a plurality of switches and is used to start and stop the work.

[0080] Further, in order to improve the stability of the capacitor carrier plate 13 during transportation, the carrier plate guiding and limiting mechanism 8 is further arranged in the embodiment, and the carrier plate guiding and limiting mechanism 8 is located on both sides of the test area.

[0081] The carrier plate guiding and limiting mechanism 8 comprises a first pressing wheel group 801, a second pressing wheel group 802 and a floating pressing wheel group 803.

[0082] The first pressing wheel group 801 comprises a mounting bracket 8011 and a plurality of first pressing wheels 8012. The mounting bracket 8011 is fixedly installed on the back plate 2, and the first pressing wheels 8012 are installed on the mounting bracket 8011. Each first pressing wheel has a certain spacing with the workbench 3.

[0083] The second pressing wheel group 802 comprises a plurality of second pressing wheels 8021 and a support 8022. The second pressing wheels 8021 are installed on the workbench 3 through the support 8022. Three second pressing wheels 8021 can be arranged. Each second pressing wheel 8021 is linearly arranged on the workbench 3, and each second pressing wheel 8021 also has a certain spacing with the workbench 3.

[0084] The floating top tension wheel group 803 comprises a plurality of floating top tension wheels, each of which comprises a pressing plate 8031, a pin shaft 8032, a bearing 8033, a sliding block 8034 and a tension spring 8035, the pressing plate 8031 is fixed on the workbench 3, the pressing plate 8031 is internally provided with a groove, the tension spring 8035 is in the groove, one end of the tension spring 8035 is connected with the pressing plate 8031, the other end of the tension spring 8035 is connected with the sliding block 8034, one end of the sliding block 8034 extends to the outside of the groove, the sliding block 8034 is provided with a clamping through groove, the bearing 8033 is located in the clamping through groove, and the pin shaft 8032 penetrates through the bearing 8033 and is connected with the sliding block 8034.

[0085] The second pressing wheel group 802 and the floating top tension wheel group 803 are located on one side of the test sample placement area 7 and are located on both sides of the test area together with the first pressing wheel group 801, and the second pressing wheel group 802 is arranged close to the test sample placement area 7.

[0086] When the capacitor carrier plate 13 is transported to the test area, the two ends of the capacitor carrier plate 13 are respectively pressed below a plurality of first pressing wheels 8012 and second pressing wheels 8021, and one side of the capacitor carrier plate 13 also contacts the floating top tension wheel, the bearing 8033 on the pressing plate 8031 is used to press the capacitor carrier plate 13 through the action of the tension spring 8035 and the sliding block 8034, so that the capacitor carrier plate 13 can be prevented from moving forward and backward and up and down during the test through the two-side pressing wheel groups and the one-side floating top tension wheel group 803, and the stable and reliable contact between the upper and lower test probes 4163 and the conductive contacts of the capacitor and the carrier plate is ensured. The capacitor carrier plate 13 in the embodiment can adopt the existing product on the market.

[0087] Better, in the embodiment, the casing 1 is provided with a protective cover 9, an electrical controller 10 and an electrical interface 11, and the electrical interface 11 is connected with a sorting indication screen 12. The protective cover 9 is arranged at the test area, the protective cover 9 is provided with a handle, the middle part of the protective cover 9 is provided with an observation window, and the protective cover 9 is in a closed state during the operation of the equipment. The electrical controller 10 is a commonly used device on the market, the sorting indication screen 12 and the casing 1 are connected through the electrical interface 11, unqualified products can be selected out by observing the test results displayed on the sorting indication screen 12, and qualified products can be collected, the capacitor sorting is completed, the foolproofness is realized, and the missed test is avoided.

[0088] The chip capacitor double-face insulation test device has the following advantages:

[0089] 1. The device has simple structure, easy-to-use function and convenient operation, and the test efficiency is greatly improved.

[0090] 2. The automatic test of double-side insulation resistance of MLCC products with limit capacity is realized;

[0091] 3. The foolproof measure is provided in the sorting process, and the situation of missing test does not occur;

[0092] 4. The test head can ensure that the pressure degree of contact with the terminal electrode of the chip capacitor is moderate and reliable;

[0093] 5. The safety shield 9 is provided with protection, and the electric injury of the operator in the test process is avoided.

[0094] The above specific embodiments have further detailed the purposes, technical schemes and beneficial effects of the utility model, and it should be understood that the above is only the specific embodiment of the utility model, and is not used for limiting the protection scope of the utility model, and any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the utility model should be included in the protection scope of the utility model.

Claims

1. A chip capacitor double-sided insulation test device, characterized in that: It comprises a housing (1), a back panel (2), and a workbench (3), wherein the back panel (2) is installed in the housing (1), and the workbench (3) is located on one side of the back panel (2); The workbench (3) divides the housing (1) into an upper test area and a lower test area, the upper test area is provided with an upper test head (4), the lower test area is provided with a lower test head (5), and the upper test head (4) and the lower test head (5) are both provided with corresponding test probes (4163); The workbench (3) is provided with a test sample loading and unloading area for loading and unloading test samples, a carrier conveying mechanism (6) for laterally conveying the test samples, and a test sample placement area (7) located between the upper and lower test heads (5); The test probes (4163) of the upper and lower test heads (5) respectively conduct the upper electrode and the lower electrode of the chip capacitor to perform a double-sided capacitor insulation test.

2. A chip capacitor double-sided insulation test device according to claim 1, characterized in that: The upper test head (4) includes a fixed bracket (401), a Z-direction lifting mechanism, a fixed seat (409), an XY-direction adjustment mechanism, and a test probe card (416). The fixed bracket (401) is installed on the back plate (2), the Z-direction lifting mechanism is installed on the fixed bracket (401), the lifting end of the Z-direction lifting mechanism is fixedly connected to the fixed seat (409), the XY-direction adjustment mechanism is connected to the fixed seat (409), and the test probe card (416) is installed on the XY-direction adjustment mechanism.

3. A chip capacitor double-sided insulation test device according to claim 2, characterized in that: The Z-direction lifting mechanism includes a cylinder (402), an adjusting screw (403), a first locking nut (404), a clamp (405), a second locking nut (406), and a guide shaft (407). The cylinder (402) is mounted on the fixed bracket (401). The adjusting screw (403) is connected to the power output end of the cylinder (402). The first locking nut (404) and the second locking nut (406) are both arranged on the outside of the adjusting screw (403) and threadedly engaged. The clamp (405) is located between the first locking nut (404) and the second locking nut (406). The guide shaft (407) passes through the fixed bracket (401) and the clamp (405) and is connected to the fixed seat (409) located below. The clamp (405) and the guide shaft (407) can move relative to the fixed bracket (401).

4. A chip capacitor double-sided insulation test device according to claim 3, characterized in that: Two guide shafts (407) are provided, and the two guide shafts (407) are located on both sides of the locking nut. The guide shafts (407) are connected to the fixing bracket (401) via a linear bearing (408).

5. A chip capacitor double-sided insulation test device according to claim 4, characterized in that: The XY-direction adjustment mechanism comprises an adapter plate (410) and an insulating base (411); a plurality of adjustment slots (412) are provided on the fixing seat (409); fixing screws (413) are provided in the adjustment slots (412); and the adapter plate (410) and the fixing seat (409) are connected via the fixing screws (413); The adapter plate (410) is provided with a plurality of adjustment holes (414), and fixing screws (415) are provided in the adjustment holes (414). The adapter plate (410) and the insulating base (411) are connected via the fixing screws (415); The test probe card (416) comprises an insulating circuit board (4161), an insulating probe seat (4162), and a test probe (4163); The insulating circuit board (4161) is connected to the insulating base (411), the insulating probe seat (4162) is connected to the insulating circuit board (4161), and the test probe (4163) is mounted on the insulating probe seat (4162); The insulating circuit board (4161) is provided with a plurality of positive interfaces of a forward insulation resistance tester, a positive interface of a forward pre-charging source, a negative interface of a reverse insulation resistance tester, a negative interface of a reverse pre-charging source, a forward discharge resistor, a reverse discharge resistor, a metallized pad, and a circuit board.

6. A chip capacitor double-sided insulation test device according to claim 5, characterized in that: The test probe (4163) is a double-ended elastic test probe (4163), comprising a tapered needle (41631), a needle sleeve (41632), a spring (41633), and a flat needle (41634). The tapered needle (41631), the spring (41633), and the flat needle (41634) are all nested in the needle sleeve (41632), the spring (41633) is arranged between the tapered needle (41631) and the flat needle (41634), and the end of the tapered needle (41631) is connected to the metallized pad of the insulating circuit board (4161).

7. A chip capacitor double-sided insulation test device according to any one of claims 1 to 6, characterized in that: The lower test head (5) adopts the same structure as the upper test head (4), and the upper test head (4) and the lower test head (5) are symmetrically arranged on both sides of the workbench (3).

8. The chip capacitor double-sided insulation test device according to claim 7, characterized in that: The carrier conveying mechanism (6) comprises a stepper motor belt module (601), a carrier positioning frame (602), and a limit signal switch group (603); the stepper motor belt module (601) comprises a stepper motor (6011), a driving wheel (6012), a driven wheel (6013), an annular synchronous belt (6014), a tensioning adjustment mechanism (6015), and a ball linear guide module (6016); the carrier positioning frame (602) is connected to the annular synchronous belt (6014); the carrier positioning frame (602) is connected to the ball linear guide module (6016); and the ball linear guide module (6016) is provided on the back plate (2) and located between the driving wheel (6012) and the driven wheel (6013); The tensioning adjustment mechanism (6015) comprises a tensioning plate (60151), a wheel axle (60152), an adjusting screw (60153), and a fixing screw (60154); the tensioning plate (60151) is embedded in the back plate (2) and slides with the back plate (2) to move; the wheel axle (60152) passes through the tensioning plate (60151); the driven wheel (6013) is provided on the wheel axle (60152); the adjusting screw (60153) is threadedly connected to the tensioning plate (60151) at the side of the tensioning plate (60151); and the fixing screw (60154) passes through the strip hole on the back plate (2) to resist and lock the tensioning plate (60151).

9. A chip capacitor double-sided insulation test device according to claim 8, characterized in that: The carrier plate positioning frame (602) comprises a connecting plate (6021), a positioning pin (6022), and a clip (6023); the connecting plate (6021) is connected to the ball slider on the ball linear guide module (6016); the positioning pin (6022) is located at both ends of the connecting plate (6021) and is used to cooperate with the positioning holes on the capacitor carrier plate (13) to fix the capacitor carrier plate (13); the clip (6023) is fixed to the middle of the connecting plate (6021); and the annular synchronous belt (6014) passes through the middle of the clip (6023) and the connecting plate (6021).

10. A chip capacitor double-sided insulation test device according to claim 8 or 9, characterized in that: It also includes a carrier plate guide and limiting mechanism (8), wherein the carrier plate guide and limiting mechanism (8) includes a first pressing wheel group (801), a second pressing wheel group (802), and a floating pressing wheel group (803); The first pressing wheel assembly (801) comprises a mounting bracket (8011) and a plurality of first pressing wheels (8012), wherein the mounting bracket (8011) is fixedly mounted on the back plate (2), and the plurality of first pressing wheels (8012) are mounted on the mounting bracket (8011); The second pressing wheel assembly (802) comprises a plurality of second pressing wheels (8021) and a support (8022), and each second pressing wheel (8021) is mounted on the workbench (3) via the support (8022); The floating tensioning wheel group (803) includes a plurality of floating tensioning wheels, each of which includes a pressure plate (8031), a pin (8032), a bearing (8033), a slider (8034), and a tensioning spring (8035). The pressure plate (8031) is fixed on the workbench (3). A groove is provided inside the pressure plate (8031). One end of the spring (41633) is connected to the pressure plate (8031) and the other end is connected to the slider (8034). One end of the slider (8034) extends to the outside of the groove. A holding groove is provided on the slider (8034). The bearing (8033) is located in the holding groove. The pin (8032) passes through the bearing (8033) and is connected to the slider (8034). The second pressing wheel group (802) and the floating pressing wheel group (803) are both located on one side of the test sample placement area (7), and each floating pressing wheel of the floating pressing wheel group (803) is located between the second pressing wheels (8021).

11. A chip capacitor double-sided insulation test device according to claim 10, characterized in that: The housing (1) is provided with a protective cover (9), an electrical controller (10), and an electrical interface (11), and the electrical interface (11) is connected to a sorting indicator screen (12).

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