Flash memory test board and test device

Abstract

The utility model provides a flash memory test board and a test device, and relates to the technical field of flash memory test. The flash memory test board and the test device comprise a substrate, one side of the substrate is provided with a data connection port, the upper side of the substrate is provided with two test chips, four corners of the substrate are provided with preformed holes, the upper side of the substrate is fixedly provided with a plurality of mounting racks, the inner wall of each mounting rack is provided with a test seat, and the test seats are arranged on the inner walls of the mounting racks. Clamping grooves are formed in the two sides of each testing seat; sliding grooves are formed in the two sides of each mounting frame, and a sliding disc is slidably connected to the inner wall of each sliding groove. According to the flash memory test board and the test device, the test seat is manually pressed to move downwards, the effect of limiting insertion is achieved, the effect of prolonging the service life of the flash memory test board and the test device is achieved, the test seat is manually pressed to move downwards, and the effect of convenient mounting and dismounting is achieved; the effect of improving the use convenience of the flash memory test board and the test device is achieved.

Description

TECHNICAL FIELD

[0001] The utility model relates to a flash memory test board and testing device belong to flash memory test technical field. BACKGROUND

[0002] With the rapid development of today's semiconductor technology, under the trend of semiconductor transistor size smaller and smaller, chip function increasingly complex, testing has become a key link before product landing production, and with the more stringent acceptable quality level (AQL) certification, the method of testing is also constantly innovating, in the production process of flash memory chip, usually need to carry out SLT system level test, to improve the yield and quality level of chip factory, specifically, test device is matched with test board, to test the flash memory chip through the chip test board.

[0003] Although the existing flash memory test board and testing device can carry out daily test operation to flash memory chip, but in actual use process, the tested chip needs to be placed in the test seat, and then the test seat is fastened and installed on the test board through bolts to test the flash memory chip, when installing through bolts, the test seat is easily extruded to the test board due to too tight screwing, which is easy to cause damage to the test board, thereby shortening the service life of the flash memory test board and testing device, and when installing and dismounting, the workers need to screw multiple bolts, which brings inconvenience to the use of workers, thereby the flash memory test board and testing device are insufficient in use convenience. UTILITY MODEL CONTENTS

[0004] (I) Technical problem solved

[0005] The utility model provides a kind of flash memory test board and testing device, to solve the problem of short service life of flash memory test board and testing device in prior art and insufficient use convenience of flash memory test board and testing device.

[0006] (II) Technical solution

[0007] Firstly, the application embodiment provides a kind of flash memory test board, including substrate, the substrate one side is provided with data connection port, the substrate upper side is provided with two test chips, the substrate four corners are all set up with reserved hole, the substrate upper side is fixed with several installation frames, every installation frame inner wall is provided with test seat, every test seat two sides are all set up with clamping slot;

[0008] Every installation frame two sides are all set up with sliding slot, every sliding slot inner wall is slidably connected with sliding disc, every sliding disc lower end is fixed with spring, and every adjacent two sliding discs are fixed with limiting plate in the vicinity of end.

[0009] The upper end of each limiting plate is provided with a connecting structure, and the connecting structure is provided with a clamping block.

[0010] Preferably, the connecting structure comprises a connecting frame, the upper end of each connecting frame is rotationally connected with a clamping block, the side, away from the test seat, of each clamping block is provided with a limiting hole, the inner wall of each limiting hole is provided with a limiting frame, the upper end of each limiting frame is fixed with a counterweight, and both sides of each mounting frame are provided with a stabilizing groove.

[0011] Preferably, one end of each connecting frame is rotationally connected to the upper end of each limiting plate, the other end of each connecting frame is rotationally connected to the lower end of the clamping block, the outer surface of each clamping block is in contact with the inner wall of each clamping groove, the outer surface of each test seat is in contact with the inner wall of each mounting frame, and each test seat is electrically connected to the substrate through insertion.

[0012] Preferably, the outer surface of each clamping block is slidingly connected to the inner wall of each sliding groove, each sliding groove penetrates one side of the mounting frame, the outer surface of each limiting frame is in contact with the inner wall of each limiting hole, the vertical section of each limiting frame is T-shaped, the outer surface of each limiting frame is slidingly connected to the inner wall of each stabilizing groove, and the middle of each counterweight is fixed to one end of each limiting frame.

[0013] Preferably, the outer surface of each sliding disc is slidingly connected to the inner wall of each sliding groove, one end of each limiting plate is fixed to one side of each sliding disc, the outer surface of each limiting plate is in contact with the outer surface of the test seat, and the outer surface of each limiting plate is slidingly connected to the inner wall of each sliding groove.

[0014] Preferably, the upper end of each spring is fixed to the lower end of each sliding disc, the lower end of each spring is fixed to the lower end of each sliding groove, and the horizontal section of each sliding disc is circular.

[0015] In the second aspect, the embodiments of the present application provide a test device, which comprises the flash memory test board as described in the above embodiments.

[0016] The flash memory test board and test device have the following beneficial effects:

[0017] (1) The flash memory test board and test device can realize the effect of limiting insertion through the mutual operation of the mounting frame, test seat, limiting plate, sliding disc and spring, can ensure that the pins are electrically connected while ensuring that the substrate is not extruded by the test seat, can prevent the test board from being damaged due to extrusion, and can prolong the service life of the flash memory test board and test device.

[0018] (2) the flash memory test board and test device, through manual pressing test seat moves down operation, so that the mounting bracket, test seat, limit board, connecting frame, clamping block, card slot, limit hole, limit frame, counterweight block mutual cooperation operation, realize the effect of convenient installation and removal, provide convenient prerequisite condition for the installation and removal operation of the staff, and then achieve the effect of improving the convenience of flash memory test board and test device. BRIEF DESCRIPTION OF DRAWINGS

[0019] Figure 1 It is the perspective view of the utility model;

[0020] Figure 2 It is the partial structure schematic view of the utility model;

[0021] Figure 3 It is the perspective view of the utility model Figure 2 It is the A part structure enlarged view of the utility model;

[0022] Figure 4 It is the mounting bracket structure schematic view of the utility model.

[0023]

MAIN COMPONENT SYMBOL EXPLANATION

[0024] 1, base plate; 2, data connection port; 3, test chip; 4, reserved hole; 5, mounting bracket; 6, test seat; 7, sliding slot; 8, sliding disc; 9, spring; 10, limit board; 11, connecting frame; 12, clamping block; 13, card slot; 14, limit hole; 15, limit frame; 16, counterweight block; 17, stable slot. DETAILED DESCRIPTION

[0025] The utility model embodiment provides a kind of flash memory test board.

[0026] Please refer to Figure 1 、 Figure 2 、 Figure 3 And Figure 4, including the substrate 1, the substrate 1 is the test board body, the substrate 1 side is provided with data connection port 2, data connection port 2 carries out data connection and the role of power supply, the substrate 1 upside is provided with two test chips 3, test chip 3 tests the storage performance of the module to be tested, the substrate 1 four corners are provided with reserved hole 4, reserved hole 4 installs on the test device effect, the substrate 1 upside is fixed with several mounting racks 5, mounting rack 5 installs the effect of test seat 6, every mounting rack 5 inner wall is provided with test seat 6, every test seat 6 both sides are provided with clamping groove 13, clamping groove 13 section is trapezoidal setting, can ensure that the clamping block 12 is stably slid into it;Every mounting rack 5 both sides are provided with sliding slot 7, every sliding slot 7 inner wall is slidably connected with sliding disc 8, every sliding disc 8 lower end is fixed with spring 9, every adjacent two sliding discs 8 proximal end is fixed with limiting plate 10;Every limiting plate 10 upper end is provided with connecting structure, connecting structure includes connecting frame 11, every connecting frame 11 upper end is rotatably connected with clamping block 12, every clamping block 12 away from test seat 6 one side is provided with limiting hole 14, every limiting hole 14 inner wall is provided with limiting frame 15, every limiting frame 15 upper end is fixed with counterweight 16, every mounting rack 5 both sides are provided with stable groove 17.

[0027] Please refer again Figure 1 、 Figure 2 、 Figure 3 And Figure 4 , it is worth noting that every connecting frame 11 one end is rotatably connected on every limiting plate 10 upper end, every connecting frame 11 the other end is rotatably connected in clamping block 12 lower end, every clamping block 12 outer surface and every clamping groove 13 inner wall contact, every test seat 6 outer surface and every mounting rack 5 inner wall contact, every test seat 6 is electrically connected with substrate 1 by inserting, every clamping block 12 outer surface is slidably connected in every sliding slot 7 inner wall, every sliding slot 7 penetrates in mounting rack 5 one side, every limiting frame 15 outer surface and every limiting hole 14 inner wall contact, every limiting frame 15 vertical section is T type setting, every limiting frame 15 outer surface is slidably connected in every stable groove 17 inner wall, every counterweight 16 middle is fixed in every limiting frame 15 one end.

[0028] Please refer again Figure 1 、 Figure 2 、 Figure 3 And Figure 4 , it is worth noting that every sliding disc 8 outer surface is slidably connected in every sliding slot 7 inner wall, every limiting plate 10 one end is fixed in every sliding disc 8 one side, every limiting plate 10 outer surface and test seat 6 outer surface contact, every limiting plate 10 outer surface is slidably connected in every sliding slot 7 inner wall, every spring 9 upper end is fixed in every sliding disc 8 lower end, every spring 9 lower end is fixed in every sliding slot 7 lower end, every sliding disc 8 horizontal section is circular setting.

[0029] The utility model discloses a convenient installation and dismounting effect is provided for the installation and dismounting work of staff, and further reaches the effect who improves the convenient use of flash memory test board and test device, when using: first through the manual pressing test seat 6 and carry out the down operation, make test seat 6 in the limit of the inner wall of mounting frame 5 to the limit board 10 that contact with it carry out extrusion operation, the limit board 10 that is extruded carries out the down operation under the stability of sliding slot 7, the limit board 10 of down moves drive fixed slide plate 8 carry out the down operation under the limit of sliding slot 7, the spring 9 of down moving slide plate 8 carries out compression operation, make slide plate 8 obtain compression space and continue to move down, until spring 9 is compressed to limit, at this time, slide plate 8 stops down, make test seat 6 also stop down, and at this time, the lead of test seat 6 lower end is just inserted and electrically connected on the substrate 1, and at this time, there is still a certain distance between test seat 6 and substrate 1, complete the effect of limit insertion, can guarantee the lead insertion electrical connection simultaneously and also can guarantee that substrate 1 is exempted from the extrusion of test seat 6, prevent the damage of test board from being extruded to occur, and further reach the effect of prolonging the service life of flash memory test board and test device, simultaneously through the manual pressing test seat 6 and carry out the down operation, make test seat 6 drive limit board 10 and carry out the down operation, the limit board 10 of down moving is inserted into the card slot 13 that test seat 6 sets up through the connecting frame 11 drive clamping block 12, and the limit hole 14 of limit board 10 another side sets up is just aligned with the limit frame 15, limit frame 15 is under the counterweight of counterweight block 16, and moves down under gravity, and the limit frame 15 of moving down can be inserted into limit hole 14, at this time, clamping block 12 is limited, make test seat 6 be fastened and install in mounting frame 5, when disassembling, by the manual pulling counterweight block 16 and move up, test seat 6 can be disassembled, complete the effect of convenient installation and dismounting, provide the convenient prerequisite condition for the installation and dismounting work of staff, and further reach the effect of improving the convenient use of flash memory test board and test device.

[0030] Working principle: through the manual pressing test seat 6 and carry out the down operation, make the limit board 10 that is connected with test seat 6 drive slide plate 8 and carry out the compression operation to spring 9, realize the effect of limit insertion, can guarantee the lead insertion electrical connection simultaneously and also can guarantee that substrate 1 is exempted from the extrusion of test seat 6, prevent the damage of test board from being extruded to occur, and further reach the effect of prolonging the service life of flash memory test board and test device, simultaneously through the manual pressing test seat 6 and carry out the down operation, make the limit board 10 that is connected with test seat 6 drive clamping block 12 and carry out the movement operation through connecting frame 11, realize the effect of convenient installation and dismounting, provide the convenient prerequisite condition for the installation and dismounting work of staff, and further reach the effect of improving the convenient use of flash memory test board and test device.

[0031] The embodiment of the application further provides a test device, which comprises at least one test board, the test board being the test board in any of the above embodiments, and the test device tests the performance of the chip to be tested by controlling the test board; the test principle of the test device is the same as that of the test board in the above embodiment, and details are not repeated here.

[0032] The basic principle and main features of the present application and the advantages of the present application are shown and described above. Those skilled in the art should understand that the present application is not limited by the above embodiments, and the above embodiments and descriptions in the specification are only to illustrate the principles of the present application. Without departing from the spirit and scope of the present application, various changes and improvements can be made to the present application, and these changes and improvements all fall within the scope of the claimed present application. The scope of protection of the present application is defined by the appended claims and their equivalents.

Claims

1. A flash memory test board, comprising a substrate (1), a data connection port (2) being provided on one side of the substrate (1), two test chips (3) being provided on the upper side of the substrate (1), and reserved holes (4) being provided at four corners of the substrate (1), characterized in that: A plurality of mounting frames (5) are fixed on the upper side of the base plate (1), a test seat (6) is provided on the inner wall of each mounting frame (5), and a card slot (13) is provided on both sides of each test seat (6); Each of the mounting frames (5) is provided with a slide groove (7) on both sides, the inner wall of each slide groove (7) is slidably connected to a slide plate (8), a spring (9) is fixed to the lower end of each slide plate (8), and a limit plate (10) is fixed to the adjacent ends of each two adjacent slide plates (8); The upper end of each of the limiting plates (10) is provided with a connecting structure, and a clamping block (12) is provided on the connecting structure; the connecting structure can slide with the clamping block (12) in the width direction of the mounting frame (5) to drive the clamping block (12) to be inserted into the corresponding clamping slot (13) to limit the test seat (6).

2. A flash memory test board according to claim 1, characterized in that: The connection structure comprises a connection frame (11), the upper end of each connection frame (11) is rotatably connected to a clamping block (12), a limiting hole (14) is provided on the side of each clamping block (12) away from the test seat (6), a limiting frame (15) is provided on the inner wall of each limiting hole (14), a counterweight (16) is fixed to the upper end of each limiting frame (15), and a stabilizing groove (17) is provided on both sides of each mounting frame (5).

3. The flash memory test board according to claim 2, wherein: One end of each connecting frame (11) is rotatably connected to the upper end of each limiting plate (10), and the other end of each connecting frame (11) is rotatably connected to the lower end of the card block (12). The outer surface of each card block (12) contacts the inner wall of each card slot (13), and the outer surface of each test seat (6) contacts the inner wall of each mounting frame (5). Each test seat (6) is plugged into and electrically connected to the base plate (1).

4. The flash memory test board according to claim 2, wherein: The outer surface of each of the clamping blocks (12) is slidably connected to the inner wall of each of the slide grooves (7), each of the slide grooves (7) passes through one side of the mounting frame (5), the outer surface of each of the limiting frames (15) contacts the inner wall of each of the limiting holes (14), the vertical sections of each of the limiting frames (15) are T-shaped, the outer surface of each of the limiting frames (15) is slidably connected to the inner wall of each of the stabilizing grooves (17), and the middle portion of each of the counterweight blocks (16) is fixed to one end of each of the limiting frames (15).

5. The flash memory test board according to claim 1, wherein: The outer surface of each sliding plate (8) is slidably connected to the inner wall of each sliding groove (7), one end of each limiting plate (10) is fixed to one side of each sliding plate (8), the outer surface of each limiting plate (10) is in contact with the outer surface of the test seat (6), and the outer surface of each limiting plate (10) is slidably connected to the inner wall of each sliding groove (7).

6. The flash memory test board according to claim 1, wherein: The upper end of each spring (9) is fixed to the lower end of each sliding plate (8), and the lower end of each spring (9) is fixed to the lower end of each sliding groove (7). The cross section of each sliding plate (8) is circular.

7. A testing device, characterized in that: A flash memory test board comprising the flash memory test board according to any one of claims 1 to 6.

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