Circuit board grading detection system

Abstract

The utility model relates to the technical field of circuit board detection, and provides a circuit board grading detection system which comprises an initial detection device, a primary fine detection device and a secondary fine detection device, the initial detection device comprises a shell, a base, a plurality of mechanical arms and a first detection probe, and the shell is provided with a first discharge port, a second discharge port and a feed port; the base is rotationally arranged in the shell; one end of the mechanical arm is connected with the base; the first detection probe is arranged at the top of the shell; a feed port of the primary fine detection device is connected with the first discharge port, and a third discharge port and a qualified discharge port are formed in the bottom of the primary fine detection device; a feeding hole of the secondary fine detection device is respectively connected with the second discharging hole and the third discharging hole; and an available discharging hole and an unavailable discharging hole are formed in the bottom of the secondary fine detection device. The problem of circuit board detection errors caused by missing detection, false detection and the like is solved through secondary detection. And degradation detection is carried out, so that the problem that a large number of degraded usable circuit boards are stored in unqualified products due to high standards is solved.

Description

Technical Field

[0001] This utility model belongs to the field of circuit board testing technology, and specifically relates to a circuit board grading testing system. Background Technology

[0002] Circuit boards utilize a well-designed circuit layout to ensure electrical connections between the electronic components mounted on them. If the circuit layout is faulty, the circuit board will malfunction and become a defective product. To avoid this problem, suspended or vertical probe cards are typically used to contact the solder pads or electrodes of the circuit board to inspect the circuit layout, ensuring the circuit board is a defect-free product. However, during testing, some unqualified circuit boards may be missed or falsely detected, while others may be downgraded and unqualified due to missed or false detections. Similarly, among qualified circuit boards, there may be unqualified boards due to missed or false detections. Summary of the Invention

[0003] Therefore, it is necessary to provide a circuit board classification and testing system to address the problem that, due to missed detections or false detections during testing, there may be usable or downgraded circuit boards among the unqualified circuit boards, and similarly, there may be unqualified circuit boards among the qualified circuit boards.

[0004] To achieve the above objectives, the present invention adopts the following solution:

[0005] A circuit board grading and inspection system, comprising:

[0006] The system comprises a preliminary inspection device, a first-level fine inspection device, and a second-level fine inspection device. The preliminary inspection device includes a housing, a base, several robotic arms, and a first detection probe. The bottom of the housing has a first discharge port and a second discharge port, and the top of the housing has a feed port. The base is rotatably disposed inside the housing. One end of each of the robotic arms is connected to the base, and the other end is equipped with a gripper for detachably connecting the circuit board to be inspected. The first detection probe is disposed on the top of the housing, and the horizontal projection of the first detection probe coincides with the horizontal projection of the first discharge port. The feed port of the first-level fine inspection device is connected to the first discharge port, and the bottom of the first-level fine inspection device has a third discharge port and a qualified discharge port. The qualified discharge port is connected to a first storage box for storing qualified circuit boards. The feed port of the second-level fine inspection device is connected to the second discharge port and the third discharge port, respectively. The bottom of the second-level fine inspection device has a usable discharge port and an unusable discharge port. The usable discharge port is connected to a second storage box for storing downgraded circuit boards, and the unusable discharge port is connected to a third storage box for storing unusable circuit boards.

[0007] Preferably, the gripper includes a baffle disposed opposite to the baffle and an opening and closing plate disposed corresponding to the baffle. One end of the baffle is fixedly connected to one end of the robotic arm, the opening and closing plate is hinged to the bottom of the baffle, and the opening and closing plate is rotatable in a predetermined direction.

[0008] Preferably, a drive motor is provided at one end of the opening and closing plate, and the drive motor is electrically connected to the first detection probe.

[0009] Preferably, the primary precision inspection device includes a first frame, a first transport component, and a second detection probe. The first frame is disposed below the housing, the third discharge port and the qualified discharge port are both disposed at the bottom of the first frame, and the inlet of the primary precision inspection device is disposed on one side of the first frame. The first transport component is disposed inside the first frame and is used to transport circuit boards that have passed the inspection by the first detection probe along the extension direction of the inlet of the primary precision inspection device. The second detection probe is disposed on the first frame and located above the first transport component, and is used for secondary inspection of circuit boards that have passed the inspection by the first detection probe.

[0010] Preferably, the first transport component includes a telescopic rod and a clamping member disposed at one end of the telescopic rod. The telescopic rod is disposed on one side of the first frame and is opposite to the feed inlet of the first-stage precision inspection device. The telescopic rod can drive the clamping member to slide back and forth between a first position and a second position. In the first position, the clamping member is located directly above the qualified discharge port. In the second position, the end of the clamping member is located directly above the third discharge port. The clamping member is used for detachably connecting the circuit board that has passed the inspection by the first detection probe.

[0011] Preferably, the clamping member is electrically connected to the second detection probe.

[0012] Preferably, the qualified discharge port is located on one side of the third discharge port and close to the inlet of the primary precision inspection device.

[0013] Preferably, the secondary precision inspection device includes a second frame, a second transport component, and a third detection probe. The second frame is disposed below the housing and located on one side of the first frame. The usable discharge port and the unusable discharge port are disposed at the bottom of the second frame. The inlet of the secondary precision inspection device is disposed on one side of the second frame. The second transport component is disposed inside the second frame and is used to transport circuit boards that fail the test by the first detection probe along the extension direction of the inlet of the secondary precision inspection device. The third detection probe is disposed on the second frame and located above the second transport component, and is used for secondary inspection of circuit boards that fail the test by the first detection probe.

[0014] Preferably, the unusable discharge port is located on one side of the usable discharge port and is close to the inlet of the secondary precision inspection device.

[0015] The technical solution adopted in this application can achieve the following beneficial effects:

[0016] 1. By conducting a second inspection on circuit boards that have passed the first inspection, the problem of missed or false inspections that lead to circuit board testing errors can be solved.

[0017] 2. By downgrading circuit boards that fail the first and second inspections, those that do not meet high standards can be used in lower-standard process equipment. This solves the problem of storing a large number of downgraded usable circuit boards in the defective products due to high standards, thereby solving the problem of high costs. Attached Figure Description

[0018] Figure 1 This is an overall schematic diagram of the circuit board grading and testing system disclosed in the embodiments of this application.

[0019] Figure 2 This is a schematic diagram of the initial inspection device of the circuit board grading inspection system disclosed in the embodiments of this application.

[0020] Figure 3 This is a schematic diagram of the initial inspection device of the circuit board grading inspection system disclosed in this application.

[0021] Figure 4 This is a schematic diagram of the first-level precision inspection device of the circuit board grading inspection system disclosed in the embodiments of this application.

[0022] Figure 5 This is a schematic diagram of the first transport component of the circuit board grading and testing system disclosed in an embodiment of this application.

[0023] Figure 6 This is a schematic diagram of the secondary precision inspection device of the circuit board grading inspection system disclosed in the embodiments of this application.

[0024] The components include: a preliminary inspection device 100, a housing 110, a first discharge port 111, a second discharge port 112, a base 120, a robotic arm 130, a gripper 140, a baffle 141, an opening and closing plate 142, a first-level precision inspection device 200, a first frame 210, a qualified discharge port 211, a first storage box 2111, a third discharge port 212, a first transport component 220, a telescopic rod 221, a clamping component 222, a second detection probe 230, a second-level precision inspection device 300, a second frame 310, a usable discharge port 311, a second storage box 3111, an unusable discharge port 312, a third storage box 3121, a second transport component 320, and a third detection probe 330. Detailed Implementation

[0025] To facilitate understanding of this application, a more complete description will be provided below with reference to the accompanying drawings. Preferred embodiments of this application are shown in the drawings. However, this application can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to provide a more thorough and complete understanding of the disclosure of this application.

[0026] It should be noted that when a device is considered to be "connected" to another device, it can be directly connected to the other device or there may be an intervening device present. The terms "inside," "top," "upper," "lower," "above," "below," and similar expressions used herein are for illustrative purposes only and do not represent the only possible implementation.

[0027] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the specification of this application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0028] See Figures 1 to 6A circuit board grading and inspection system is provided, comprising: a preliminary inspection device 100, a first-level fine inspection device 200, and a second-level fine inspection device 300. The preliminary inspection device 100 includes a housing 110, a base 120, a plurality of robotic arms 130, and a first inspection probe. The bottom of the housing 110 is provided with a first discharge port 111 and a second discharge port 112, and the top of the housing 110 is provided with a feed port. The base 120 is rotatably disposed inside the housing 110. One end of each of the robotic arms 130 is connected to the base 120, and the other end is provided with a gripper 140 for detachably connecting to the circuit board to be inspected. The first inspection probe is disposed on the top of the housing 110, and the horizontal projection of the first inspection probe is perpendicular to the top of the housing 110. The horizontal projections of the first discharge port 111 coincide; the inlet of the first-stage precision inspection device 200 is connected to the first discharge port 111, and the bottom of the first-stage precision inspection device 200 is provided with a third discharge port 212 and a qualified discharge port 211; the qualified discharge port 211 is connected to the first storage box 2111 for storing qualified circuit boards; the inlet of the second-stage precision inspection device 300 is connected to the second discharge port 112 and the third discharge port 212 respectively, and the bottom of the second-stage precision inspection device 300 is provided with a usable discharge port 311 and an unusable discharge port 312; the usable discharge port 311 is connected to the second storage box 3111 for storing downgraded circuit boards; the unusable discharge port 312 is connected to the third storage box 3121 for storing unusable circuit boards.

[0029] Specifically, the housing 110 adopts, but is not limited to, a cuboid or cylindrical support body made of materials such as pipes or plates. The bottom of the housing 110 is supported at a high position by a support frame. The base 120 is located inside the housing 110. One end of the base 120 is connected to the bottom of the housing 110 by a motor or manual rotation (the motor uses a gear-less design, rotating the base 120 once per revolution, allowing sufficient time for the first detection probe to perform its detection). The motor rotation drives the base 120 to rotate. The base 120 adopts, but is not limited to, a shaft or cylinder. Several slots are provided at the end of the base 120 away from the motor. Each slot is detachably connected (using, but not limited to, pins, buckles, threads, etc.) to a robotic arm 130. Driven by the base 120, the robotic arm 130 moves in a circular motion along with the base 120. The length of the robotic arm 130 is less than the distance from the circumference of the base 120 to the housing. The distance between the inner walls of the body 110; the end of the robotic arm 130 away from the base 120 is provided with a claw 140, which adopts, but is not limited to, a robotic arm, a mechanical tray or other fixing device that facilitates the storage of circuit boards; the first detection probe is set on the top of the housing 110 and is located directly above the first discharge port 111; taking the housing 110 as a cylinder as an example, the feed port is set on the top of the housing 110, the feed port, the first discharge port 111 and the second discharge port 112 are equidistant on the horizontal projection, and the side of the feed port in the rotation direction of the base 120 is the first discharge port 111 (if the base 120 rotates clockwise, the first discharge port in the clockwise direction of the feed port is the first discharge port 111, and the second is the second discharge port 112, and vice versa), and the length of the first discharge port 111 and the second discharge port 112 is much larger than the size of the circuit board, and the first detection probe is located at the end of the first discharge port 111 near the housing 110.

[0030] The inlet of the first-level precision inspection device 200 is connected to the first outlet 111. The first-level precision inspection device 200 adopts a circuit board testing device or a device that integrates transportation and circuit board testing. The first-level precision inspection device 200 is provided with two outlets, namely the third outlet 212 and the qualified outlet 211. The qualified outlet 211 is connected to the first storage box 2111.

[0031] The inlet of the first-level precision inspection device 200 is connected to the second outlet 112 and the third outlet 212 respectively. The second precision inspection device adopts the same or similar circuit board detection device as the first precision inspection device. The second-level precision inspection device 300 is also provided with two outlets, namely the usable outlet 311 and the unusable outlet 312, and is provided with a second storage box 3111 and a third storage box 3121 respectively. The second storage box 3111 is for circuit boards that can be used after downgrading, and the third storage box 3121 is for circuit boards that cannot be used after downgrading.

[0032] The first detection probe, the second detection probe 230, and the third detection probe 330 are all common circuit board detection probes in the prior art, and their existing structures are clear and will not be described in detail here.

[0033] Furthermore, the circuit boards to be tested enter the housing 110 through the inlet (transported one by one via a conveyor belt or placed manually) and are fixed by the gripper 140. Driven by the robotic arm 130, the gripper 140 rotates from the inlet of the housing 110 towards the first outlet 111. When it reaches the first outlet 111, the first detection probe tests the circuit board. If the test is successful, the gripper 140 is manually opened (or the gripper 140 is electrically connected to the first detection probe), and the circuit board falls from the gripper 140 into the first outlet 111. (Successful circuit boards exit from the first outlet 111.) (Slide out) into the first-level precision inspection device 200 for a second precision inspection. After the precision inspection, if the circuit board is still qualified, it will enter the first storage box 2111 from the qualified discharge port 211 for storage or use in the next process. If it is unqualified, it will flow into the second-level precision inspection device 300 from the third discharge port 212 for a third downgrade inspection. If the inspection is qualified, it will flow out from the usable discharge port 311 and be stored in the second storage box 3111 for storage or downgraded use in another process. If the inspection is unqualified, it will flow out from the unusable discharge port 312 and be stored in the third storage box 3121, and then be uniformly processed.

[0034] The circuit board, secured by the gripper 140, rotates from the feed inlet of the housing 110 to the first discharge outlet 111 under the drive of the gripper 140 and the robotic arm 130. When it reaches the first discharge outlet 111, the first detection probe detects the circuit board. If the detection fails, the base 120 continues to drive the robotic arm 130, the gripper 140, and the circuit board on the gripper 140 to rotate. When it reaches the second discharge outlet 112, the gripper 140 is manually opened (or the gripper 140 is electrically connected to the first detection probe). The circuit board (with sexual connection) falls from the claw 140 into the second discharge port 112 (the unqualified circuit board slides out from the first discharge port 111) and enters the secondary fine inspection device 300 for a second downgrade test. If the test is qualified, it flows out from the usable discharge port 311 and is stored in the second storage box 3111 for storage or downgraded use in another process; if the test is unqualified, it flows out from the unusable discharge port 312 and is stored in the third storage box 3121, and then undergoes unified processing.

[0035] The feed inlet of the secondary precision inspection device 300 is connected to the second discharge port 112 and the third discharge port 212 respectively. Therefore, the feed inlet of the secondary precision inspection device 300 contains both circuit boards that failed the initial inspection device 100 and circuit boards that failed the secondary inspection by the primary precision inspection device 200.

[0036] The technical solution of the circuit board grading and inspection system adopted in this application can achieve the following beneficial effects:

[0037] 1. By conducting a second inspection on circuit boards that have passed the first inspection, the problem of missed or false inspections that lead to circuit board testing errors can be solved.

[0038] 2. By downgrading circuit boards that fail the first and second inspections, those that do not meet high standards can be used in lower-standard process equipment. This solves the problem of storing a large number of downgraded usable circuit boards in the defective products due to high standards, thereby solving the problem of high costs.

[0039] Based on the above scheme, the gripper 140 includes a baffle 141 disposed opposite to the baffle 141 and an opening and closing plate 142 disposed corresponding to the baffle 141. One end of the baffle 141 is fixedly connected to one end of the robotic arm 130, and the opening and closing plate 142 is hinged to the bottom of the baffle 141, and the opening and closing plate 142 can rotate in a predetermined direction.

[0040] The baffles 141 are adjusted according to the shape of the circuit board. If the circuit board is circular, the two baffles 141 are arc-shaped; if the circuit board is a standard quadrilateral, the two baffles 141 are two opposing U-shaped shapes; if the circuit board is triangular, the two baffles 141 are two opposing <-shaped shapes. One end of the baffle 141 is fixed to the robotic arm 130 by means of threaded bolts, clips, etc. Taking the standard quadrilateral circuit board as an example, a sleeve of the same length as the baffle 141 is set at the bottom of the baffle 141. A rotating shaft is set inside the sleeve, and a return spring is fitted on the rotating shaft. The opening and closing plates 142 are fixedly connected to both ends of the rotating shaft (the opening and closing plates 142 cover the bottom of the baffle 141 so that its bottom is completely covered, and the two opening and closing plates 142 have the same shape). The rotating shaft is rotated manually or by a motor, causing the opening and closing plate 142 to reverse. Through the rotating shaft and the return spring, the opening and closing plate 142 covers the bottom of the baffle 141 to form a storage area. The circuit board is placed in the storage area and rotates accordingly. The reverse rotating shaft causes the circuit board to fall into the first discharge port 111 or the second discharge port 112. Then, the return spring resets the opening and closing plate 142 and continues to cover the bottom of the baffle 141. When the base 120 rotates it to the feed port of the housing 110, the circuit board can be placed directly. The operation is simpler and more convenient, and the problem of circuit board detection errors caused by manual touching of the circuit board is reduced. At the same time, the automatic recovery solves the problem of the base 120 needing to stop when rotating, improving the continuity of its detection and transportation.

[0041] To achieve automated control, an optimized implementation scheme is provided, wherein a drive motor is provided at one end of the opening and closing plate 142, and the drive motor is electrically connected to the first detection probe.

[0042] Specifically, a missing gear is provided at one end of the rotating shaft, and a gear set is provided on the drive motor. The gear set includes a frame, a main gear connected to the drive motor, and a secondary gear rotatably connected to the frame and meshing with the main gear. The main gear meshes with the missing gear on one side of the rotating shaft, and the secondary gear meshes with the missing gear on the other side, thereby achieving synchronous up-and-down flipping. When the first detection probe passes the test, the drive motor rotates one revolution, thereby causing the opening and closing plate 142 to flip downward. When the first detection probe fails the test, the drive motor rotates one revolution after 3 seconds (the time is adjusted according to the rotation speed of the base 120 to ensure that the chuck 140 rotates from the first discharge port 111 to the second discharge port 112 after this time). The operation is simpler and more convenient, reducing labor intensity and realizing automated control.

[0043] Furthermore, in order to achieve precise positioning, a locator (laser positioning) is set on the first detection probe, and a sensing plate is set on one side of the baffle 141. The sensing plate is electrically connected to the drive motor on the robotic arm 130. When the locator emits a laser and illuminates the sensing plate, the drive motor performs a rotation operation, thus solving the problem of inaccurate flipping.

[0044] In the above scheme, for more accurate detection, the primary precision inspection device 200 includes a first frame 210, a first transport component 220, and a second detection probe 230. The first frame 210 is located below the housing 110. The third discharge port 212 and the qualified discharge port 211 are both located at the bottom of the first frame 210. The feed inlet of the primary precision inspection device 200 is located on one side of the first frame 210. The first transport component 220 is located inside the first frame 210 and is used to transport the circuit boards that have passed the detection by the first detection probe along the extension direction of the feed inlet of the primary precision inspection device 200. The second detection probe 230 is located on the first frame 210 and above the first transport component 220, and is used for secondary detection of the circuit boards that have passed the detection by the first detection probe.

[0045] Specifically, the first transport component 220 uses, but is not limited to, telescopic cylinders, conveyor belts, and other transport equipment, and is located inside the first frame 210. The second detection probe 230 is located on the top of the first frame 210 and directly above the beginning of the first transport component 220. The feed end of the first transport component 220 is connected to the first discharge port 111. The circuit boards that are inspected for the second time are sorted in a second way by manual sorting or mechanical sorting. Qualified circuit boards enter the first storage box 2111 from the qualified discharge port 211, and unqualified circuit boards enter the secondary fine inspection device 300 from the third discharge port 212 for downgrading inspection.

[0046] Based on the above scheme, the first transport component 220 includes a telescopic rod 221 and a clamping member 222 disposed at one end of the telescopic rod 221. The telescopic rod 221 is disposed on one side of the first frame 210 and is disposed opposite to the feed inlet of the first-level precision inspection device 200. The telescopic rod 221 can drive the clamping member 222 to slide back and forth between a first position and a second position. When the clamping member 222 is in the first position, it is located directly above the qualified discharge port 211. When the clamping member 222 is in the second position, its end is located directly above the third discharge port 212. The clamping member 222 is used for detachably connecting the circuit board that has passed the inspection by the first detection probe.

[0047] For automated control, the clamp 222 is electrically connected to the second detection probe 230.

[0048] Specifically, the qualified discharge port 211 is located on one side of the third discharge port 212 and is close to the feed port of the primary precision inspection device 200.

[0049] One end of the telescopic rod 221 is fixedly connected to the first frame 210, and the extension direction of the telescopic rod 221 coincides with the extension direction of the first discharge port 111. The other end of the telescopic rod 221 is provided with a clamping member 222. The clamping member 222 is, but is not limited to, a robotic gripper, a claw 140 with the same structure as the initial inspection device 100, etc. The qualified discharge port 211 and the third discharge port 212 are both located at the bottom of the first frame 210 and directly below the telescopic rod 221. The second detection probe 230 is located inside the first frame 210 and close to the feed port (qualified discharge port 211) of the first-level fine inspection device 200. The extension and retraction of the telescopic rod 221 is manually controlled, and sufficient time is allowed during control to allow the second detection probe 230 to perform detection.

[0050] Furthermore, when the telescopic rod 221 is not in operation, it is in an extended state, and the clamping member 222 is located at the inlet of the primary precision inspection device 200. Circuit boards that pass the first inspection in the initial inspection device 100 fall from the first outlet 111 into the inlet of the primary precision inspection device 200 and slide into the clamping assembly. At this time, the second detection probe 230 performs a second inspection on the circuit boards in the clamping member 222. If the inspection is qualified, the clamping member 222 opens, allowing the circuit boards that have undergone the second inspection to flow out from the qualified outlet 211; if the inspection is unqualified, the telescopic rod 221... The rod 221 moves from the first position to the second position. The second detection probe 230 controls the clamp 222 to open after 3 seconds (the time is adjusted according to the extension speed of the telescopic rod 221) and fall into the third discharge port 212. The third discharge port 212 and the qualified discharge port 211 can adopt an inverted octagonal inlet, and a triangular prism groove is formed between the third discharge port 212 and the qualified discharge port 211, making it easier for the circuit board to slide down. During the detection process, the telescopic rod 221 is always in the process of extending and retracting back and forth between the first position and the second position.

[0051] To achieve the goal of no missed inspections, a transport device is set up between the first discharge port 111 and the inlet of the first static inspection device. The transport device uses belt transport and manual positioning to ensure that the circuit board can smoothly enter the clamping component 222.

[0052] In the above scheme, to improve operational convenience, the secondary precision inspection device 300 includes a second frame 310, a second transport component 320, and a third detection probe 330. The second frame 310 is located below the housing 110 and on one side of the first frame 210. The usable discharge port 311 and the unusable discharge port 312 are located at the bottom of the second frame 310. The feed inlet of the secondary precision inspection device 300 is located on one side of the second frame 310. The second transport component 320 is located inside the second frame 310 and is used to transport circuit boards that fail the first detection probe along the extension direction of the feed inlet of the secondary precision inspection device 300. The third detection probe 330 is located on the second frame 310 and above the second transport component, and is used for secondary inspection of circuit boards that fail the first detection probe. The unusable discharge port 312 is located on one side of the usable discharge port 311 and close to the feed inlet of the secondary precision inspection device 300.

[0053] Specifically, the structure and layout of the second frame 310, the second transport component 320, and the third detection probe 330 are the same as those of the first frame 210, the first transport component 220, and the second detection probe 230. The third detection probe 330 is electrically connected to the clamping component 222 in the second transport component 320. In the secondary precision inspection device 300, the positions of the qualified discharge port 211 and the third discharge port 212 are modified to be the unusable discharge port 312 and the usable discharge port 311, and the third storage box 3121 and the second storage box 3111 are respectively provided at their ends. The second discharge port 112 and the third discharge port 212 are connected by a guide groove and are collected by belt transport. The distance is manually adjusted or mechanically adjusted, and then they enter the feed port of the secondary precision inspection device 300 one by one for inspection.

[0054] The specific implementation process is as follows:

[0055] The circuit board to be tested is manually placed into the feed inlet of the initial inspection device 100 and falls onto the gripper 140. The gripper 140 rotates clockwise (or counterclockwise) under the drive of the robotic arm 130 and the base 120. When the gripper 140 rotates to the position below the first detection probe, the test is performed.

[0056] If the circuit board passes the inspection, it enters the first discharge port 111 and slowly slides into the first-level precision inspection device 200. The circuit board enters the clamping part 222 of the first transport component 220, and the telescopic rod 221 retracts. At the same time, the second detection probe 230 performs a second inspection: if it passes the inspection, the clamping part 222 opens and the circuit board falls into the qualified discharge port 211 for storage; if it fails the inspection, the clamping part 222 opens after the telescopic rod 221 extends and retracts for two seconds (at this time, the telescopic rod 221 has retracted from above the qualified discharge port 211 to above the third discharge port 212), causing it to fall into the second-level precision inspection device 300 along the third discharge port 212.

[0057] If the circuit board fails the inspection, it enters the second discharge port 112 and slowly slides into the secondary precision inspection device 300. At the same time, the circuit board that has passed the two inspections also slowly slides into the secondary precision inspection device 300 from the third discharge port 212 and falls into the clamping part 222 of the second transport component 320. The telescopic rod 221 retracts, and the third detection probe 330 performs a downgrade inspection: if it fails, the clamping part 222 opens and the circuit board falls into the unusable discharge port 312 for storage; if it passes, the clamping part 222 opens after the telescopic rod 221 extends and retracts for two seconds (at this time, the telescopic rod 221 has retracted from above the unusable discharge port 312 to above the usable discharge port 311), allowing it to fall into the usable discharge port 311; thus completing the inspection and sorting downgrade inspection of qualified products.

[0058] The above-described embodiments merely illustrate the device deployment method of this application, and their descriptions are relatively specific and detailed, but they should not be construed as limiting the scope of the patent application. It should be noted that for those skilled in the art, several adjustments and improvements can be made without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A circuit board grading and inspection system, characterized in that, include: The preliminary inspection device includes a housing, a base, several robotic arms, and a first detection probe. The bottom of the housing has a first discharge port and a second discharge port, and the top of the housing has a feed port. The base is rotatably disposed inside the housing. One end of each of the robotic arms is connected to the base, and the other end is equipped with a gripper for detachably connecting to the circuit board to be inspected. The first detection probe is disposed on the top of the housing, and the horizontal projection of the first detection probe coincides with the horizontal projection of the first discharge port. A primary precision inspection device, wherein the inlet of the primary precision inspection device is connected to the first outlet, and the bottom of the primary precision inspection device is provided with a third outlet and a qualified outlet; The qualified discharge port is connected to the first storage box for storing qualified circuit boards; as well as A secondary precision inspection device is provided, wherein the inlet of the secondary precision inspection device is connected to the second outlet and the third outlet respectively, and the bottom of the secondary precision inspection device is provided with a usable outlet and an unusable outlet. The usable outlet is connected to the second storage box for storing downgraded circuit boards; the unusable outlet is connected to the third storage box for storing unusable circuit boards.

2. The circuit board grading and testing system according to claim 1, characterized in that, The gripper includes a baffle disposed opposite to the baffle and an opening and closing plate disposed corresponding to the baffle. One end of the baffle is fixedly connected to one end of the robotic arm, and the opening and closing plate is hinged to the bottom of the baffle and can rotate in a predetermined direction.

3. The circuit board grading and testing system according to claim 2, characterized in that, A drive motor is provided at one end of the opening and closing plate, and the drive motor is electrically connected to the first detection probe.

4. The circuit board grading and testing system according to claim 1, characterized in that, The primary precision inspection device includes a first frame, a first transport component, and a second detection probe. The first frame is located below the housing. The third discharge port and the qualified discharge port are both located at the bottom of the first frame. The inlet of the primary precision inspection device is located on one side of the first frame. The first transport component is located inside the first frame and is used to transport circuit boards that have passed the inspection by the first detection probe along the extension direction of the inlet of the primary precision inspection device. The second detection probe is located on the first frame and above the first transport component, and is used for secondary inspection of the circuit boards that have passed the inspection by the first detection probe.

5. The circuit board grading and inspection system according to claim 4, characterized in that, The first transport component includes a telescopic rod and a clamping member disposed at one end of the telescopic rod. The telescopic rod is disposed on one side of the first frame and is opposite to the feed inlet of the first-level precision inspection device. The telescopic rod can drive the clamping member to slide back and forth between a first position and a second position. When the clamping member is in the first position, it is located directly above the qualified discharge port. When the clamping member is in the second position, its end is located directly above the third discharge port. The clamping member is used for detachably connecting a circuit board that has passed the inspection by the first detection probe.

6. The circuit board grading and testing system according to claim 5, characterized in that, The clamping member is electrically connected to the second detection probe.

7. The circuit board grading and testing system according to claim 5, characterized in that, The qualified discharge port is located on one side of the third discharge port and is close to the inlet of the first-level precision inspection device.

8. The circuit board grading and testing system according to claim 4, characterized in that, The secondary precision inspection device includes a second frame, a second transport component, and a third detection probe. The second frame is located below the housing and on one side of the first frame. The usable discharge port and the unusable discharge port are located at the bottom of the second frame. The inlet of the secondary precision inspection device is located on one side of the second frame. The second transport component is located inside the second frame and is used to transport circuit boards that fail the test by the first detection probe along the extension direction of the inlet of the secondary precision inspection device. The third detection probe is located on the second frame and above the second transport component, and is used for secondary inspection of circuit boards that fail the test by the first detection probe.

9. The circuit board grading and testing system according to claim 8, characterized in that, The unusable discharge port is located on the same side as the usable discharge port and is close to the inlet of the secondary precision inspection device.

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