Chip detection clamp

Abstract

The utility model provides a clamp for chip detection, and belongs to the technical field of chip detection. The chip detection clamp comprises a carrier plate and a fixing assembly. And a plurality of placing grooves are formed in the upper surface of the carrier plate. The fixing assembly comprises an electric sliding table, a lifting plate, an elastic piece, a fixing plate and a telescopic piece, during use, a plurality of chips can be placed in the plurality of placing grooves in a one-to-one correspondence mode, then the lifting plate can be driven by the electric sliding table to move downwards, and then the elastic piece, the telescopic piece and the fixing plate are driven to move downwards; according to the technical scheme, the elastic piece elastically extrudes the fixing plate, the telescopic piece can contract, then the fixing plate can clamp and fix the chips in the containing groove, the multiple chips are clamped and fixed, the multiple chips can be clamped and fixed at the same time at a time, and then the detection efficiency can be improved.

Description

Technical Field

[0001] This application relates to the field of chip testing, and more specifically, to a chip testing fixture. Background Technology

[0002] Chips are a product of modern technology. Their function is to perform computing and processing tasks. They are an indispensable element of technological progress and are widely used in various fields such as aerospace, automobiles, industry, and consumer electronics. After production, chips need to be tested to ensure that they can work properly. During the testing process, the chips need to be clamped and fixed to ensure the stability and accuracy of the testing.

[0003] In related chip testing fixture technologies, a lead screw drives two clamping components to clamp and fix the chip from both sides. The overall structure is relatively simple, but it can only clamp one chip at a time, which affects the testing efficiency. Utility Model Content

[0004] To overcome the above shortcomings, this application provides a chip inspection fixture, which aims to improve the problem that only one chip can be clamped at a time, which affects the inspection efficiency.

[0005] This application provides a chip testing fixture, including a carrier board and a fixing assembly.

[0006] The upper surface of the carrier plate is provided with a placement groove, and there are several placement grooves.

[0007] The fixing assembly includes an electric slide, a lifting plate, elastic elements, a fixing plate, and telescopic elements. The bottom end of the electric slide is connected to the carrier plate, and the lifting plate is connected to the moving end of the electric slide. Several elastic elements are provided, and the top ends of each elastic element are connected to the lifting plate. Several fixing plates are provided, and each fixing plate is connected to the bottom end of one of the elastic elements. The fixing plates are located above one of the placement slots. Several telescopic elements are provided, and the top ends of each telescopic element are connected to the lifting plate. The bottom ends of each telescopic element are connected to one of the fixing plates.

[0008] In one specific implementation, pin slots are provided on both sides of several placement slots, and several pin slots are provided, which are evenly arranged.

[0009] In one specific implementation, a retrieval slot is provided on both sides of several placement slots, and two retrieval slots are arranged symmetrically.

[0010] In one specific implementation, the lower surface of the carrier plate is provided with support legs, and four support legs are provided, which are respectively fixedly connected to the four corners of the lower surface of the carrier plate.

[0011] In one specific implementation, several elastic elements are slidably sleeved on the outside of several telescopic elements, and all of the elastic elements are springs.

[0012] In one specific implementation, each of the telescopic components includes a fixed rod and a sliding rod. The top end of each fixed rod is fixedly connected to the lower surface of the lifting plate, and the top end of each sliding rod is slidably sleeved on the body of the fixed rod. The bottom ends of each sliding rod are respectively fixedly connected to the center of the upper surface of each of the fixed plates.

[0013] In one specific implementation, the chip testing fixture further includes two sets of testing components. These two sets of testing components are respectively located above the pin slots on both sides of the placement slot. Each set of testing components includes a connecting plate and testing probes. Both connecting plates are fixedly connected to the lower surface of the lifting plate. The two sets of testing probes are symmetrically arranged above both sides of the fixed plate. Each set of testing probes contains a plurality of probes, which are fixedly connected to the lower surface of the connecting plate. Each of the plurality of testing probes is located above a plurality of pin slots, with each probe corresponding to a pin slot.

[0014] In one specific implementation, the upper surfaces of both connecting plates are provided with connecting rods, and the top ends of both connecting rods are fixedly connected to the lower surface of the lifting plate.

[0015] In one specific implementation, a connecting support plate is provided on the lower surface of both connecting plates, and a plurality of connecting support plates are provided. The plurality of connecting support plates are respectively provided corresponding to the pin slots on both sides of the plurality of placement slots, and the tips of the plurality of detection probes are uniformly fixedly connected to the lower surface of the plurality of connecting support plates.

[0016] The beneficial effects of this utility model are as follows: The chip testing fixture obtained by the above design can place several chips one by one into several placement slots. Then, the electric slide can drive the lifting plate to move downward, thereby driving the elastic element, telescopic element and fixing plate to move downward. The elastic element elastically compresses the fixing plate, and the telescopic element will contract, thereby allowing the fixing plate to clamp and fix the chips inside the placement slots, thus clamping and fixing several chips at the same time, thereby improving the testing efficiency. Attached Figure Description

[0017] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained from these drawings without creative effort.

[0018] Figure 1 This is a first-view structural diagram of the chip testing fixture provided in the embodiments of this application;

[0019] Figure 2 This is a schematic diagram of the second-view structure of the chip detection fixture provided in an embodiment of this application;

[0020] Figure 3 A schematic diagram of the carrier plate structure provided for an embodiment of this application;

[0021] Figure 4 A schematic diagram of the partial structure of the fixing component and the detection component provided in the embodiments of this application;

[0022] Figure 5 A schematic diagram of the telescopic component structure provided for an embodiment of this application.

[0023] In the diagram: 100-Carrier plate; 110-Placement slot; 111-Pin slot; 112-Removal slot; 113-Support leg; 200-Fixing assembly; 210-Electric slide; 220-Lifting plate; 230-Elastic element; 240-Fixing plate; 250-Telescopic element; 251-Fixing rod; 252-Sliding rod; 300-Detection assembly; 310-Connecting plate; 311-Connecting rod; 312-Connecting support plate; 320-Detection probe. Detailed Implementation

[0024] The technical solutions in the embodiments of this application will now be described with reference to the accompanying drawings.

[0025] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, not all of them. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0026] Please see Figure 1 This application provides a chip testing fixture, including a carrier board 100 and a fixing assembly 200.

[0027] Please see Figure 1-3 The upper surface of the carrier board 100 is provided with a placement slot 110, and a plurality of placement slots 110 are provided. Both sides of the plurality of placement slots 110 are provided with pin slots 111, and a plurality of pin slots 111 are provided. The plurality of pin slots 111 are evenly arranged so that the chip can be placed inside the placement slot 110 and the pins on the chip can be inserted into the pin slots 111. Both sides of the plurality of placement slots 110 are provided with a take-out slot 112, and the two take-out slots 112 are symmetrically arranged so that the take-out slots 112 facilitate the user to take out the chip inside the placement slot 110.

[0028] In this embodiment, the lower surface of the carrier plate 100 is provided with support legs 113, and four support legs 113 are provided. The four support legs 113 are respectively fixedly connected to the four corners of the lower surface of the carrier plate 100.

[0029] Please see Figure 1-5 The fixed component 200 includes an electric slide 210, a lifting plate 220, an elastic element 230, a fixed plate 240, and a telescopic element 250. The bottom end of the electric slide 210 is connected to the carrier plate 100, the lifting plate 220 is connected to the moving end of the electric slide 210, and several elastic elements 230 are provided, with the top ends of the several elastic elements 230 all connected to the lifting plate 220.

[0030] In the specific setup, there are several fixed plates 240, each of which is connected to the bottom end of several elastic members 230. The fixed plates 240 are located above several placement slots 110. There are several telescopic members 250, the top ends of which are connected to the lifting plate 220, and the bottom ends of which are connected to several fixed plates 240.

[0031] In this application, a plurality of elastic elements 230 are slidably sleeved on the outside of a plurality of telescopic elements 250, and the plurality of elastic elements 230 are all springs. The plurality of telescopic elements 250 include a fixed rod 251 and a sliding rod 252. The top end of the fixed rod 251 is fixedly connected to the lower surface of the lifting plate 220, and the top end of the sliding rod 252 is slidably sleeved on the rod body of the fixed rod 251. The bottom ends of the plurality of sliding rods 252 are fixedly connected to the center of the upper surface of the plurality of fixed plates 240, respectively.

[0032] Please see Figure 1-4The chip testing fixture also includes a testing component 300. Two sets of testing components 300 are provided, and the two sets of testing components 300 are respectively located above the pin slots 111 on both sides of the placement slot 110. Both sets of testing components 300 include a connecting plate 310 and a testing probe 320. Both connecting plates 310 are fixedly connected to the lower surface of the lifting plate 220. Both connecting plates 310 are provided with connecting rods 311 on their upper surfaces, and the top ends of both connecting rods 311 are fixedly connected to the lower surface of the lifting plate 220.

[0033] In the specific setup, two sets of detection probes 320 are symmetrically arranged above both sides of the fixed plate 240. Each set of detection probes 320 has several units, and the several detection probes 320 are fixedly connected to the lower surface of the connecting plate 310.

[0034] In this embodiment, a connecting support plate 312 is provided on the lower surface of both connecting plates 310. A plurality of connecting support plates 312 are provided, and the plurality of connecting support plates 312 are respectively provided corresponding to the pin slots 111 on both sides of the plurality of placement slots 110. The top ends of the plurality of detection probes 320 are uniformly fixedly connected to the lower surface of the plurality of connecting support plates 312.

[0035] In this application, a plurality of detection probes 320 are respectively located above a plurality of pin slots 111. The detection probes 320 are configured to correspond to the pin slots 111. The detection probes 320 are connected to an external detection circuit. The detection probes 320 can be inserted into the pin slots 111.

[0036] Specifically, the working principle of this chip testing fixture is as follows: Several chips can be placed one-to-one into several placement slots 110, with the chip leads inserted into the lead slots 111. Then, the electric slide 210 is opened, causing the lifting plate 220 to move downwards, which in turn moves the elastic element 230 and the fixing plate 240 downwards. The elastic element 230 elastically compresses the fixing plate 240, causing the fixing rod 251 to enter the sliding rod 252, allowing the fixing plate 240 to clamp and fix the chips inside the placement slots 110. This clamps and fixes several chips simultaneously. The lifting plate 220 continues to move downwards and compress the elastic element 230, causing several detection probes 320 to move downwards. These probes can then be inserted into the lead slots 111 and contact the chip leads for testing. This allows for the simultaneous clamping and fixing of several chips, thus improving testing efficiency.

[0037] The above are merely embodiments of this application and are not intended to limit the scope of protection of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of protection of this application. It should be noted that similar reference numerals and letters in the following figures indicate similar items; therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0038] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A chip inspection fixture, characterized in that, include A carrier plate (100) has a placement groove (110) on its upper surface, and the placement groove (110) has a plurality of grooves. A fixing component (200) includes an electric slide (210), a lifting plate (220), elastic elements (230), a fixing plate (240), and a telescopic component (250). The bottom end of the electric slide (210) is connected to the carrier plate (100), and the lifting plate (220) is connected to the moving end of the electric slide (210). Several elastic elements (230) are provided, and the top ends of each elastic element (230) are connected to the lifting plate (220). The fixing plate (250)... A plurality of plates (240) are provided, and the plurality of fixed plates (240) are respectively connected to the bottom ends of the plurality of elastic members (230). The plurality of fixed plates (240) are respectively located above the plurality of placement slots (110). A plurality of telescopic members (250) are provided, and the top ends of the plurality of telescopic members (250) are all connected to the lifting plate (220). The bottom ends of the plurality of telescopic members (250) are respectively connected to the plurality of fixed plates (240).

2. The chip inspection fixture according to claim 1, characterized in that, Each of the placement slots (110) has pin slots (111) on both sides, and each pin slot (111) has several of them, and the pin slots (111) are evenly arranged.

3. A chip inspection fixture according to claim 2, characterized in that, Each of the placement slots (110) has a take-out slot (112) on both sides, and the two take-out slots (112) are arranged symmetrically.

4. A chip inspection fixture according to claim 1, characterized in that, The lower surface of the carrier plate (100) is provided with support legs (113), and four support legs (113) are provided. The four support legs (113) are respectively fixedly connected to the four corners of the lower surface of the carrier plate (100).

5. A chip inspection fixture according to claim 1, characterized in that, Several elastic elements (230) are slidably sleeved on the outside of several telescopic elements (250), and the several elastic elements (230) are all springs.

6. A chip inspection fixture according to claim 5, characterized in that, Each of the telescopic components (250) includes a fixed rod (251) and a sliding rod (252). The top end of each fixed rod (251) is fixedly connected to the lower surface of the lifting plate (220). The top end of each sliding rod (252) is slidably sleeved on the body of the fixed rod (251). The bottom ends of each sliding rod (252) are respectively fixedly connected to the center of the upper surface of each fixed plate (240).

7. A chip inspection fixture according to claim 2, characterized in that, It also includes detection components (300), which are provided in two sets. The two sets of detection components (300) are respectively located above the pin slots (111) on both sides of the placement slot (110). Each set of detection components (300) includes a connecting plate (310) and a detection probe (320). The two connecting plates (310) are fixedly connected to the lower surface of the lifting plate (220). The two sets of detection probes (320) are symmetrically arranged above both sides of the fixing plate (240). Each set of detection probes (320) is provided with a plurality of probes. The plurality of detection probes (320) are fixedly connected to the lower surface of the connecting plate (310). The plurality of detection probes (320) are respectively located above the plurality of pin slots (111) one by one. The detection probes (320) are correspondingly arranged with the pin slots (111).

8. A chip inspection fixture according to claim 7, characterized in that, The upper surfaces of the two connecting plates (310) are provided with connecting rods (311), and the top ends of the two connecting rods (311) are fixedly connected to the lower surface of the lifting plate (220).

9. A chip inspection fixture according to claim 8, characterized in that, The lower surfaces of both connecting plates (310) are provided with connecting support plates (312), and there are several connecting support plates (312). The several connecting support plates (312) are respectively provided with corresponding pin slots (111) on both sides of several placement slots (110). The top ends of several detection probes (320) are uniformly fixedly connected to the lower surfaces of several connecting support plates (312).

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