Rapid testing structure for loop resistance of high-voltage switch of transformer substation

Abstract

The utility model relates to a rapid testing structure for loop resistance of a high-voltage switch of a transformer substation. The rapid testing structure comprises a high-voltage switch loop resistance tester, a bus tie switch, a plurality of first-section high-voltage switches, an isolating switch, a filtering device and a plurality of second-section high-voltage switches, three-phase power supply wire inlet ends of the bus tie switch and the plurality of first-section high-voltage switches are connected to a high-voltage side first-section bus, a three-phase output end of the bus tie switch is connected in series with a three-phase output end of the isolation switch, and three-phase power supply wire inlet ends of the isolation switch and the plurality of second-section high-voltage switches are connected to a high-voltage side second-section bus. The voltage sampling end of the high-voltage switch loop resistance tester is connected to the two ends of a loop to be tested through one filtering device, and the current sampling end of the high-voltage switch loop resistance tester is connected to the two ends of the loop to be tested through the other filtering device; according to the utility model, the testing time is saved, the working efficiency is improved, and meanwhile, high-frequency interference brought by a high-voltage station during testing is also avoided.

Description

TECHNICAL FIELD

[0001] The utility model relates to substation technical field especially relates to a substation high pressure switch loop resistance fast test structure. BACKGROUND

[0002] The high pressure switch is the main electrical equipment in the substation and plays a very important role, so it is particularly important to test it. Figure 1 The prior art high pressure switch loop resistance test connection structure must be extracted from the high pressure switch for high pressure switch loop resistance test, and then sent back after testing, which is time-consuming and laborious. In particular, the current high pressure switch is equipped with a closing locking electromagnet, which cannot be manually closed after being extracted from the high pressure switch cabinet, and cannot be tested for high pressure switch loop resistance. In addition, the high pressure switch cabinet is in a strong magnetic field substation, and there are many high-frequency interference sources in the substation, such as silicon controlled rectifier equipment, IGBT electronic switch, and frequent closing and opening of high-voltage equipment. The generated harmonics will enter the test equipment through the current line and voltage line of the loop resistance tester, causing great interference to the internal instrument, affecting the calculation of resistance, and even burning out the chip. Therefore, a structure is needed to quickly test the high pressure switch loop resistance of the substation without extracting the high pressure switch, and to avoid high-frequency interference in the substation. SUMMARY

[0003] The utility model provides a kind of substation high pressure switch loop resistance fast test structure, both save the time of high pressure switch extraction and return, and solve the difficulty that high pressure switch cannot be manually closed after extraction and cannot be tested for high pressure switch loop resistance, and also avoid the high-frequency interference caused by substation during testing.

[0004] To achieve the above purpose, the utility model adopts the following technical solutions:

[0005] The utility model provides a kind of substation high voltage switch loop resistance fast test structure, including high voltage switch loop resistance tester, bus tie switch, multiple one-stage high voltage switch, disconnecting switch and multiple two-stage high voltage switch;The bus tie switch is arranged in bus tie cabinet, one-stage high voltage switch is arranged in one-stage high voltage switch cabinet, the disconnecting switch is arranged in isolation cabinet, and the two-stage high voltage switch is arranged in two-stage high voltage switch cabinet;Further including filter device, the three-phase power supply incoming line end of bus tie switch and multiple one-stage high voltage switch is connected to high voltage side one-stage bus, the three-phase output end of bus tie switch is connected with the three-phase output end of disconnecting switch, and the three-phase power supply incoming line end of disconnecting switch and multiple two-stage high voltage switch is connected to high voltage side two-stage bus, and the voltage sampling end of high voltage switch loop resistance tester is connected to the two ends of measured loop by a filter device, and the current sampling end of high voltage switch loop resistance tester is connected to the two ends of measured loop by another filter device.

[0006] Further, the filter device is an adjustable anti-interference electromagnetic filter, which includes a magnetic ring and two groups of coils wound on the magnetic ring in a common mode.

[0007] Further, the measured loop includes a bus tie switch loop, multiple one-stage high voltage switch loops and multiple two-stage high voltage switch loops, and the voltage sampling end and the current sampling end of the high voltage switch loop resistance tester are connected to the bus tie switch loop, the multiple one-stage high voltage switch loops and the multiple two-stage high voltage switch loops respectively.

[0008] Further, the bus tie switch incoming line end in the bus tie switch loop is the test positive electrode, and the bus tie switch outgoing line end is the test negative electrode.

[0009] Further, the one-stage high voltage switch loop includes a one-stage high voltage switch and bus tie switch connection loop, and a one-stage high voltage switch and one-stage high voltage switch connection loop; the one-stage high voltage switch outgoing line end in the one-stage high voltage switch and bus tie switch connection loop is the test positive electrode, and the bus tie switch outgoing line end is the test negative electrode; the two one-stage high voltage switch outgoing line ends in the one-stage high voltage switch and one-stage high voltage switch connection loop are the test positive electrode and the negative electrode respectively.

[0010] Further, the two-stage high voltage switch loop includes a two-stage high voltage switch and bus tie switch connection loop, and a two-stage high voltage switch and two-stage high voltage switch connection loop; the two-stage high voltage switch outgoing line end in the two-stage high voltage switch and bus tie switch connection loop is the test positive electrode, and the bus tie switch outgoing line end is the test negative electrode; the two two-stage high voltage switch outgoing line ends in the two-stage high voltage switch and two-stage high voltage switch connection loop are the test positive electrode and the negative electrode respectively.

[0011] Compared with the prior art, the utility model has the beneficial effects that:

[0012] 1) the three-phase power supply inlet ends of the bus tie switch and the plurality of one-stage high-voltage switches are connected to a high-voltage side one-stage bus, the three-phase output ends of the bus tie switch are connected in series with the three-phase output ends of the disconnecting switch, the three-phase power supply inlet ends of the disconnecting switch and the plurality of two-stage high-voltage switches are connected to a high-voltage side two-stage bus, and then the high-voltage switch loop resistance tester is used to test each loop to be tested, thereby avoiding the time for the high-voltage switch to be pulled out and returned, and solving the difficulty that the high-voltage switch cannot be manually closed after being pulled out and the high-voltage switch loop resistance test cannot be performed;

[0013] 2) and the contact of the movable contact and the fixed contact can be determined according to the calculated loop resistance, the test time is reduced, the work efficiency is improved, and a large amount of time is saved when there are many high-voltage switch cabinets. BRIEF DESCRIPTION OF DRAWINGS

[0014] Figure 1 is a high-voltage switch loop resistance test structure schematic diagram of the prior art.

[0015] Figure 2 is a high-voltage switch loop structure schematic diagram.

[0016] Figure 3 is a filter device wiring schematic diagram.

[0017] Figure 4 is a bus tie switch loop resistance test structure schematic diagram. DETAILED DESCRIPTION

[0018] The specific embodiments of the utility model will be further described below in combination with the drawings:

[0019] See Figure 2It is the structural schematic view of the high voltage switch loop, the utility model discloses a transformer substation high voltage switch loop resistance fast test structure, including high voltage switch loop resistance tester TR, mother's unified switch QM, one section first high voltage switch Q11, one section second high voltage switch Q12, one section third high voltage switch Q13, disconnecting switch QG, two section first high voltage switch Q21, two section second high voltage switch Q22, two section third high voltage switch Q23 and filter device, the mother's unified switch QM is arranged in the mother's unified cabinet, and one section high voltage switch is arranged in one section high voltage switch cabinet, and the disconnecting switch QG is arranged in the isolation cabinet, and two section high voltage switch is arranged in two section high voltage switch cabinet, the three phase power supply incoming line end of the mother's unified switch QM and one section first high voltage switch Q11, one section second high voltage switch Q12, one section third high voltage switch Q13 are all connected to high voltage side one section bus, the three phase output end of the mother's unified switch QM is connected with the three phase output end of disconnecting switch QG, the three phase power supply incoming line end of disconnecting switch QG and two section first high voltage switch Q21, two section second high voltage switch Q22, two section third high voltage switch Q23 are connected to high voltage side two section bus, the voltage sampling end of high voltage switch loop resistance tester TR is connected to the both ends of the loop to be measured through a filter device, and the current sampling end of high voltage switch loop resistance tester TR is connected to the both ends of the loop to be measured through another filter device.

[0020] The loop to be measured includes the mother's unified switch QM loop, three one section high voltage switch loops and three two section high voltage switch loops;

[0021] The incoming line end of the mother's unified switch QM in the mother's unified switch QM loop is the test positive pole, and the outgoing line end of the mother's unified switch QM is the test negative pole;

[0022] The one section high voltage switch loop includes the connection loop of one section high voltage switch and the mother's unified switch QM, the connection loop of one section high voltage switch and one section high voltage switch;The outgoing line end of one section high voltage switch in the connection loop of one section high voltage switch and the mother's unified switch QM is the test positive pole, and the outgoing line end of the mother's unified switch QM is the test negative pole;The outgoing line ends of the two one section high voltage switches in the connection loop of one section high voltage switch and one section high voltage switch are respectively the test positive pole and the test negative pole;

[0023] The two section high voltage switch loop includes the connection loop of two section high voltage switch and the mother's unified switch QM, the connection loop of two section high voltage switch and two section high voltage switch;The outgoing line end of two section high voltage switch in the connection loop of two section high voltage switch and the mother's unified switch QM is the test positive pole, and the outgoing line end of the mother's unified switch QM is the test negative pole;The outgoing line ends of the two two section high voltage switches in the connection loop of two section high voltage switch and two section high voltage switch are respectively the test positive pole and the test negative pole.

[0024] See Figure 3The filter device is an adjusting anti-interference electromagnetic filter, which comprises a magnetic ring and two groups of coils wound on the magnetic ring in a common mode, and the two groups of coils of the adjusting anti-interference electromagnetic filter are synchronously linked to adjust when adjusting impedance.

[0025] Working principle: all high-voltage switches including disconnectors QG are shaken to the working position and manually closed;

[0026] The voltage sampling ends U+ and U- of the high-voltage switch loop resistance tester are connected to the filter device, and the output test ends of the filter device are U + , U － The current sampling ends I+ and I- of the high-voltage switch loop resistance tester are connected to the filter device, and the output test ends of the filter device are I + , I － ;

[0027] First, the loop resistance of the bus tie switch QM is tested, as shown in Figure 4 The incoming end port A phase of the bus tie switch QM is connected to the filter device test end U + , I + The outgoing end port A phase of the bus tie switch QM is connected to the filter device test end U － , I － , and the loop resistance of the A phase of the bus tie switch QM is tested, and then the loop resistance of the B phase and the C phase is tested.

[0028] The outgoing end port A phase of the first high-voltage switch Q11 is connected to the filter device test end U + , I + The outgoing end port A phase of the bus tie switch QM is connected to the filter device test end U － , I － , and the loop resistance R 1母 of the A phase is tested, and then the loop resistance of the B phase and the C phase is tested.

[0029] The outgoing end port A phase of the first high-voltage switch Q11 is connected to the filter device test end U + , I + The outgoing end port A phase of the second high-voltage switch Q12 is connected to the filter device test end U － , I － , and the loop resistance R 12 of the A phase is tested, and then the loop resistance of the B phase and the C phase is tested.

[0030] The outgoing end port A phase of the second high-voltage switch Q12 is connected to the filter device test end U + , I + The outgoing end port A phase of the bus tie switch QM is connected to the filter device test end U－ , I － , and the loop resistance R 2母 of phase A is tested, and then the loop resistance of phase B and phase C is tested respectively. A1 = (R 1母 + R 12 - R 2母 ) / 2, and the loop resistance of phase B and phase C is calculated in the same way.

[0031] The filter device test terminal U + , I + of the outgoing terminal port of phase A of the first high-voltage switch Q11 is connected, the filter device test terminal U － , I － of the outgoing terminal port of phase A of the third high-voltage switch Q13 is connected, and the loop resistance R 23 of phase A is tested, and then the loop resistance of phase B and phase C is tested respectively.

[0032] The filter device test terminal U + , I + of the outgoing terminal port of phase A of the first high-voltage switch Q11 is connected, the filter device test terminal U － , I － of the outgoing terminal port of phase A of the third high-voltage switch Q13 is connected, and the loop resistance R 13 of phase A is tested, and then the loop resistance of phase B and phase C is tested respectively. A2 = (R 12 + R 23 - R 13 ) / 2, and the loop resistance of phase B and phase C is calculated in the same way.

[0033] The loop resistance R A3 of phase A of the third high-voltage switch is tested in the same way as the loop resistance of the bus tie switch.

[0034] The loop resistance of all high-voltage switches in the second section is tested in the same way, the filter device test terminal U + , I + of the outgoing terminal port of phase A of the first high-voltage switch Q21 is connected, the filter device test terminal U － , I － of the outgoing terminal port of phase A of the bus tie switch QM is connected, and the loop resistance R 1母 of phase A is tested, and then the loop resistance of phase B and phase C is tested respectively.

[0035] The filter device test terminal U+ , I + , the outgoing terminal port A phase of the second high-voltage switch Q22 is connected to the filter device test terminal U － , I － , and the loop resistance R 12 of the A phase is tested, and then the loop resistance of the B phase and the C phase is tested respectively.

[0036] The outgoing terminal port A phase of the second high-voltage switch Q22 is connected to the filter device test terminal U + , I + , the outgoing terminal port A phase of the bus tie switch QM is connected to the filter device test terminal U － , I － , and the loop resistance R 2母 of the A phase is tested, and then the loop resistance of the B phase and the C phase is tested respectively. A1 = (R 1母 + R 12 - R 2母 ) / 2, and the loop resistance of the B phase and the C phase is calculated in the same way.

[0037] The outgoing terminal port A phase of the second high-voltage switch Q22 is connected to the filter device test terminal U + , I + , the outgoing terminal port A phase of the third high-voltage switch Q23 is connected to the filter device test terminal U － , I － , and the loop resistance R 23 of the A phase is tested, and then the loop resistance of the B phase and the C phase is tested respectively.

[0038] The outgoing terminal port A phase of the first high-voltage switch Q21 is connected to the filter device test terminal U + , I + , the outgoing terminal port A phase of the third high-voltage switch Q23 is connected to the filter device test terminal U － , I － , and the loop resistance R 13 of the A phase is tested, and then the loop resistance of the B phase and the C phase is tested respectively. A2 = (R 12 + R 23 - R 13 ) / 2, and the loop resistance of the B phase and the C phase is calculated in the same way.

[0039] The loop resistance R A3 of the A phase of the third high-voltage switch is tested in the same way as the loop resistance of the bus tie switch.

[0040] When there are N one-stage high-voltage switch loop resistance tests, one-stage (N-1)th high-voltage switch A-phase loop resistance R A(N-1) = (R (N-2)(N-1) + R (N-1)N - R (N-2)N ) / 2, and B and C phase loop resistances are calculated in the same way; one-stage Nth high-voltage switch A-phase loop resistance R AN The loop resistance of the bus tie switch is measured separately by using the high-voltage switch loop resistance tester.

[0041] When there are N two-stage high-voltage switch loop resistance tests, two-stage (N-1)th high-voltage switch A-phase loop resistance R A(N-1) = (R (N-2)(N-1) + R (N-1)N - R (N-2)N ) / 2, and B and C phase loop resistances are calculated in the same way; two-stage Nth high-voltage switch A-phase loop resistance R AN The loop resistance of the bus tie switch is measured separately by using the high-voltage switch loop resistance tester.

[0042] The above embodiments are implemented on the premise of the technical scheme of the utility model, and detailed implementation modes and specific operation processes are given, but the protection scope of the utility model is not limited to the above embodiments. The methods used in the above embodiments are all conventional methods unless otherwise specified.

Claims

1. A substation high-voltage switch loop resistance rapid test structure, comprising a high-voltage switch loop resistance tester, a bus tie switch, a plurality of first-stage high-voltage switches, an isolating switch, and a plurality of second-stage high-voltage switches; the bus tie switch is arranged in a bus tie cabinet, the first-stage high-voltage switches are arranged in a first-stage high-voltage switch cabinet, the isolating switch is arranged in an isolating cabinet, and the second-stage high-voltage switches are arranged in a second-stage high-voltage switch cabinet; characterized in that, The filter device is an adjustable anti-interference electromagnetic filter, which comprises a magnetic ring and two groups of coils.

2. The substation high voltage switch loop resistance fast test structure of claim 1, wherein, The measured circuit comprises a bus tie switch circuit, a plurality of first high-voltage switch circuits and a plurality of second high-voltage switch circuits, and the voltage sampling end and the current sampling end of the high-voltage switch circuit resistance tester are connected to the bus tie switch circuit, the plurality of first high-voltage switch circuits and the plurality of second high-voltage switch circuits respectively.

3. The substation high voltage switch loop resistance fast test structure of claim 1, wherein, The bus tie switch circuit in the bus tie switch circuit has a test positive electrode at the bus tie switch incoming end and a test negative electrode at the bus tie switch outgoing end.

4. The substation high voltage switch loop resistance fast test structure of claim 3, wherein, The first high-voltage switch circuit comprises a first high-voltage switch and bus tie switch connection circuit and a first high-voltage switch and first high-voltage switch connection circuit; the first high-voltage switch and bus tie switch connection circuit has a test positive electrode at the outgoing end of the first high-voltage switch and a test negative electrode at the outgoing end of the bus tie switch; and the first high-voltage switch and first high-voltage switch connection circuit has a test positive electrode at the outgoing end of the first high-voltage switch and a test negative electrode at the outgoing end of the first high-voltage switch.

5. The substation high voltage switch loop resistance fast test structure of claim 3, wherein, The second high-voltage switch circuit comprises a second high-voltage switch and bus tie switch connection circuit and a second high-voltage switch and second high-voltage switch connection circuit; the second high-voltage switch and bus tie switch connection circuit has a test positive electrode at the outgoing end of the second high-voltage switch and a test negative electrode at the outgoing end of the bus tie switch; and the second high-voltage switch and second high-voltage switch connection circuit has a test positive electrode at the outgoing end of the second high-voltage switch and a test negative electrode at the outgoing end of the second high-voltage switch.

6. The substation high voltage switch loop resistance fast test structure of claim 3, wherein, ​

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