Anti-static chip test fixture
By using anti-static HIPS materials, a limiting plate, and an electromagnet to design a chip testing fixture, the problem of poor fixation effect of traditional fixtures is solved, achieving stable chip positioning and electrostatic protection, thus ensuring testing accuracy and safety.
Patent Information
- Application Number
- CN202422427719.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-09
- Publication Date
- 2025-11-14
- Estimated Expiration
- 2034-10-09
AI Technical Summary
Traditional chip testing fixtures are not very effective at securing chips, which can easily lead to chip displacement during testing and affect the test results.
The first and second shells are made of anti-static HIPS material. The design incorporates a limiting plate, electromagnet, and magnet. The chip is fixed by electromagnetic attraction, and anti-static pads and anti-static rings are used to release static electricity, ensuring the chip is in a stable position.
It improves chip fixation, prevents positional shifts, ensures the accuracy of test results, and effectively prevents electrostatic damage to the chip.
Smart Images
Figure CN223551753U_ABST
Abstract
Description
Technical Field
[0001] This utility model belongs to the field of chip testing technology, and more specifically, it relates to an anti-static chip testing fixture. Background Technology
[0002] In the manufacturing process of electronic products, chips are one of the most important components. Their performance and reliability affect the quality of the entire product. To ensure the performance and reliability of chips, comprehensive testing and inspection are required during the production process. Chip testing usually requires the use of specialized test fixtures. These test fixtures can provide a stable testing environment for the chips and ensure the accuracy of the test results. Currently, traditional chip test fixtures often have poor chip fixation and are prone to displacement during testing, which can affect the test results. Utility Model Content
[0003] To address the aforementioned technical problems, this utility model provides an anti-static chip testing fixture, thereby solving the technical problem that traditional chip testing fixtures often have poor chip fixation effects in the prior art.
[0004] The purpose and effect of this utility model of an anti-static chip testing fixture are achieved by the following specific technical means:
[0005] An anti-static chip testing fixture includes a chip body, a first outer shell on top of the chip body, a testing component on top of the first outer shell, a second outer shell below the chip body, two sets of limiting plates inside the second outer shell, the top of the second outer shell connected to the first outer shell, a connecting magnet on the bottom of the second outer shell, a placement platform on the bottom of the second outer shell, and an electromagnet inside the placement platform. Both the first and second outer shells are made of HIPS material.
[0006] According to a preferred embodiment, the top of the second outer shell is provided with two sets of grooves, and each of the two sets of grooves is provided with multiple sets of second locking posts. The multiple sets of second locking posts are locked at the bottom of the limiting plate. The bottom of the first outer shell is fixedly connected with two sets of locking blocks, and the two sets of locking blocks are locked at the top of the limiting plate. The top of the second outer shell is provided with multiple sets of locking slots, and the bottom of the first outer shell is fixedly connected with multiple sets of first locking posts. The multiple sets of first locking posts are locked in the locking slots.
[0007] According to a preferred embodiment, a second sponge pad is adhered to the top of the second outer shell, and the top of the second sponge pad contacts the chip body. A first sponge pad is adhered to the bottom of the first outer shell, and the bottom of the first sponge pad is adhered to the first sponge pad, and the bottom of the first sponge pad contacts the chip body. Both sets of limiting plates pass through the second sponge pad and are engaged in the groove. Handles are provided at both ends of the first outer shell.
[0008] According to a preferred embodiment, the top of the first housing is provided with multiple sets of connecting posts, and the top of the multiple sets of connecting posts is provided with the same set of connecting plates. The test component includes a contact plate, the top of the first housing is provided with the contact plate, the bottom of the contact plate is provided with multiple sets of contacts, multiple sets of springs are provided between the contact plate and the connecting plate, a pressing rod is engaged at the top of the contact plate, the top of the pressing rod passes through the connecting plate, and a pressing block is provided at the top of the pressing rod.
[0009] According to a preferred embodiment, the pins of the chip body all pass through the first housing, the pins of the chip body all contact the contact, the tops of the multiple sets of springs are fixedly connected to the connecting plate, and the bottoms of the multiple sets of springs are fixedly connected to the contact plate.
[0010] According to a preferred embodiment, the bottom of the placement platform is provided with a base, the top of the base is provided with an anti-static pad, one end of the base is fixedly connected to a fixing post, one end of the fixing post is provided with a connecting line, and one end of the connecting line is provided with an anti-static ring.
[0011] According to a preferred embodiment, the bottom of the connecting magnet is magnetically connected to the electromagnet.
[0012] Compared with the prior art, the present invention has the following beneficial effects:
[0013] 1. The chip body is fixed by the cooperation of the first shell and the second shell, and the user can easily install and fix the first shell and the second shell. By snapping the first shell into the placement platform and connecting an external power source to energize the electromagnet, the electromagnet and the magnet are magnetically connected, thereby fixing the position of the chip body and improving the fixing effect.
[0014] 2. The first and second housings are made of HIPS material, which has excellent anti-static properties. The anti-static pads effectively prevent static electricity. The anti-static rings and connecting wires work together to release static electricity stored on the user's body and conduct it to the ground, preventing electrostatic discharge from damaging the chip during chip testing. Attached Figure Description
[0015] Figure 1This is a schematic diagram of the structure of an anti-static chip testing fixture according to the present invention;
[0016] Figure 2 This is an exploded view of an anti-static chip testing fixture according to the present invention.
[0017] Figure 3 This is a schematic diagram of the disassembled test component in an anti-static chip test fixture according to this utility model;
[0018] Figure 4 This is a schematic diagram of the structure of the first outer shell in the anti-static chip testing fixture of this utility model.
[0019] In the diagram, the correspondence between component names and drawing numbers is as follows:
[0020] 10. Chip body; 11. Base; 12. Antistatic pad; 13. Fixing post; 14. Connecting wire; 15. Antistatic ring; 16. Placement platform; 17. Electromagnet; 18. Connecting magnet; 19. Second outer shell; 20. Second locking post; 21. Limiting plate; 22. Second sponge pad; 23. First sponge pad; 24. Locking block; 25. First locking post; 26. First outer shell; 27. Connecting post; 28. Contact plate; 29. Spring; 30. Pressing rod; 31. Connecting plate; 32. Pressing block; 33. Contact; 34. Handle. Detailed Implementation
[0021] The embodiments of this utility model will be described in further detail below with reference to the accompanying drawings and examples. The following examples are for illustrative purposes only and should not be construed as limiting the scope of this utility model.
[0022] Example:
[0023] As attached Figure 1 To be continued Figure 4 As shown:
[0024] This utility model provides an anti-static chip testing fixture, which includes a chip body 10, a first outer shell 26 on top of the chip body 10, a testing component on the top of the first outer shell 26, allowing the user to perform chip testing on the chip body 10 through the testing component, and a second outer shell 19 below the chip body 10. Two sets of limiting plates 21 are fitted inside the second outer shell 19, limiting the position of the chip body 10 to prevent it from shifting within the first outer shell 26 and the second outer shell 19. The top of the second outer shell 19 is connected to the first outer shell 26. The first outer shell 26 and the second outer shell 19 can not only... The chip body 10 is fixed and protected. A connecting magnet 18 is attached to the bottom of the second housing 19, and a placement platform 16 is provided at the bottom of the second housing 19. An electromagnet 17 is attached inside the placement platform 16. The user can supply power to the electromagnet 17 through an external power source, so that the electromagnet 17 can work. When the user inserts the second housing 19 into the placement platform 16, the connecting magnet 18 and the electromagnet 17 are magnetically connected, fixing the position of the chip body 10 and preventing poor contact between the contact 33 and the pin of the chip body 10 due to the movement of the chip body 10 during the test.
[0025] The top of the second outer shell 19 has two sets of grooves, each containing multiple sets of second locking posts 20. The user can insert two sets of limiting plates 21 into the grooves, causing the second locking posts 20 to engage with the bottom of the limiting plates 21, thus fixing the limiting plates 21. The limiting plates 21 limit the chip body 10, ensuring it is secured to the top of the second outer shell 19, preventing positional shift during testing. The bottom of the first outer shell 26 is fixedly connected to two sets of locking blocks 24. When the bottom of the first outer shell 26 is connected to the top of the second outer shell 19, the locking blocks 24 engage with the top of the limiting plates 21. The top of the second outer shell 19 has multiple sets of locking slots, and the bottom of the first outer shell 26 is fixedly connected to multiple sets of first locking posts 25. When the bottom of the first outer shell 26 is connected to the top of the second outer shell 19, this... The first locking pins 25 are inserted into the slots at the bottom of the first outer shell 26. The top of the second outer shell 19 is bonded with a second sponge pad 22, the top of which contacts the chip body 10 and protects the bottom surface of the chip body 10. The bottom of the first outer shell 26 is bonded with a first sponge pad 23, the bottom of which is also bonded with a first sponge pad 23, which contacts the chip body 10 and protects the top of the chip body 10 to prevent surface damage during testing. Both sets of limiting plates 21 pass through the second sponge pads 22 and are locked in the grooves. Both ends of the first outer shell 26 are provided with handles 34, which allow the user to connect or disconnect the first outer shell 26 from the second outer shell 19.
[0026] The user can insert the limiting plate 21 through the second sponge pad 22 into the groove opened on the top of the second housing 19, and then align the first locking post 25 at the bottom of the first housing 26 with the slot at the top of the second housing 19 and press the second housing 19 to insert the first locking post 25 into the slot, thus completing the connection between the first housing 26 and the second housing 19.
[0027] Please refer to, for example Figure 2 , Figure 3 and Figure 4 As shown, the top of the first housing 26 is provided with multiple sets of connecting posts 27, and the top of the multiple sets of connecting posts 27 is provided with the same set of connecting plates 31. The test component includes a contact plate 28, which is used to install contacts 33. The top of the first housing 26 is provided with the contact plate 28, and the bottom of the contact plate 28 is provided with multiple sets of contacts 33. When the contacts 33 contact the pins of the chip body 10, the user can test the chip body 10. Multiple sets of springs 29 are provided between the contact plate 28 and the connecting plate 31. A pressing rod 30 is clamped on the top of the contact plate 28. The top of the pressing rod 30 passes through the connecting plate 31, and the top of the pressing rod 30 is provided with a pressing block 32. The user can press the pressing block 32 to move the pressing rod 30 downward. At the same time, the pressing rod 30 drives the contact plate 28. The contact 33 moves downwards, allowing it to contact the pins of the chip body 10. All pins of the chip body 10 pass through the first housing 26. The top of the first housing 26 has multiple through holes, allowing the pins to pass through and contact the contact 33. The tops of multiple sets of springs 29 are fixedly connected to the connecting plate 31, and the bottoms of multiple sets of springs 29 are fixedly connected to the contact plate 28. When the user needs to test, they press down on the pressing block 32, causing the pressing rod 30 to move the contact plate 28 downwards, compressing and tightening the springs 29 until the contact 33 contacts the pins of the chip body 10, allowing the test to proceed. After the test, the pressing block 32 is released, and the springs 29 reset, causing the contact plate 28 to reset.
[0028] Both the first outer shell 26 and the second outer shell 19 are made of HIPS material, which has excellent anti-static properties. The bottom of the placement platform 16 is provided with a base 11, and the top of the base 11 is provided with an anti-static pad 12. The anti-static pad 12 can effectively prevent static electricity. One end of the base 11 is fixedly connected to a fixing post 13, and one end of the fixing post 13 is provided with a connecting line 14. One end of the connecting line 14 is provided with an anti-static ring 15. The user can wear the anti-static ring 15 on the forearm to release the static electricity in the human body and conduct the static electricity to the ground through the connecting line 14.
[0029] The embodiments of this utility model are given for illustrative and descriptive purposes only, and are not intended to be exhaustive or to limit the utility model to the forms disclosed. Many modifications and variations will be apparent to those skilled in the art. The embodiments were chosen and described in order to better illustrate the principles and practical applications of this utility model, and to enable those skilled in the art to understand this utility model and design various embodiments with various modifications suitable for a particular purpose.
Claims
1. An anti-static chip testing fixture, comprising a chip body (10), characterized in that: A first outer shell (26) is provided above the chip body (10). A test component is provided on the top of the first outer shell (26). A second outer shell (19) is provided below the chip body (10). Two sets of limiting plates (21) are installed inside the second outer shell (19). The top of the second outer shell (19) is connected to the first outer shell (26). A connecting magnet (18) is installed at the bottom of the second outer shell (19). A placement platform (16) is provided at the bottom of the second outer shell (19). An electromagnet (17) is installed inside the placement platform (16). Both the first outer shell (26) and the second outer shell (19) are made of HIPS material.
2. The anti-static chip testing fixture as described in claim 1, characterized in that: The second outer shell (19) has two sets of grooves on its top, and each set of grooves has multiple sets of second locking posts (20). The multiple sets of second locking posts (20) are locked at the bottom of the limiting plate (21). The bottom of the first outer shell (26) is fixedly connected to two sets of locking blocks (24). The two sets of locking blocks (24) are locked at the top of the limiting plate (21). The top of the second outer shell (19) has multiple sets of slots. The bottom of the first outer shell (26) is fixedly connected to multiple sets of first locking posts (25). The multiple sets of first locking posts (25) are locked in the slots.
3. The anti-static chip testing fixture as described in claim 2, characterized in that: The second outer shell (19) has a second sponge pad (22) bonded to its top, and the top of the second sponge pad (22) contacts the chip body (10). The first outer shell (26) has a first sponge pad (23) bonded to its bottom, and the bottom of the first sponge pad (23) contacts the chip body (10). Both sets of limiting plates (21) pass through the second sponge pad (22) and are engaged in the groove. The first outer shell (26) has handles (34) at both ends.
4. The anti-static chip testing fixture as described in claim 1, characterized in that: The first housing (26) has multiple sets of connecting posts (27) on its top, and the top of the multiple sets of connecting posts (27) has the same set of connecting plates (31). The test component includes a contact plate (28), the first housing (26) has the contact plate (28) on its top, the contact plate (28) has multiple sets of contacts (33) on its bottom, the contact plate (28) has multiple sets of springs (29) between the contact plate (28) and the connecting plate (31), the top of the contact plate (28) has a pressing rod (30) engaged, the top of the pressing rod (30) passes through the connecting plate (31), and the top of the pressing rod (30) has a pressing block (32).
5. The anti-static chip testing fixture as described in claim 4, characterized in that: The pins of the chip body (10) all pass through the first outer shell (26), the pins of the chip body (10) all contact the contact (33), the tops of the multiple sets of springs (29) are fixedly connected to the connecting plate (31), and the bottoms of the multiple sets of springs (29) are fixedly connected to the contact plate (28).
6. The anti-static chip testing fixture as described in claim 1, characterized in that: The bottom of the placement platform (16) is provided with a base (11), the top of the base (11) is provided with an antistatic pad (12), one end of the base (11) is fixedly connected with a fixing post (13), one end of the fixing post (13) is provided with a connecting line (14), and one end of the connecting line (14) is provided with an antistatic ring (15).
7. The anti-static chip testing fixture as described in claim 1, characterized in that: The bottom of the connecting magnet (18) is magnetically connected to the electromagnet (17).