V-CUT test lower needle structure
By designing the V-CUT test probe structure, the problem of traditional flying probe testing equipment being unable to quickly adjust the probe position was solved, realizing rapid adjustment and precise control of the probe position, improving testing efficiency and accuracy, and ensuring the reliability of test results and operational safety.
Patent Information
- Application Number
- CN202422728612.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-09
- Publication Date
- 2025-11-14
- Estimated Expiration
- 2034-11-09
AI Technical Summary
Traditional flying probe testing equipment cannot quickly adjust the probe position, resulting in low processing efficiency and inaccurate positioning accuracy, which affects the reliability of test results.
A V-CUT test needle structure was designed, including a frame, transmission components, drive arm, slider, drive motor, rotating frame, electric cylinder, guide rail, slide block, guide rod, needle sleeve, and probe. Through the cooperation of the transmission components and electric cylinder, the probe position can be quickly adjusted and precisely controlled. It is equipped with a stabilizing frame and a buffer joint to reduce the impact of vibration, and is protected by a transparent protective plate.
It enables rapid adjustment of probe position, adapts to diverse circuit board testing needs, improves testing efficiency and accuracy, and ensures the reliability of test results and operational safety.
Smart Images
Figure CN223551763U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of circuit board testing, and in particular to a V-CUT test pin structure. Background Technology
[0002] In the V-CUT process of circuit boards, V-CUT testing is required to avoid processing quality problems caused by missed V-CUT cuts.
[0003] The V-CUT test works primarily based on high-precision inspection technology and automated testing processes. Pads are placed in the empty spaces on both sides of the cut on the circuit board, and a wire connects the two pads for testing. If there is continuity between the pads, it indicates an omission in the cut; normally, the wire should be completely cut, and the pads should not be connected. For pad testing, conventional inspection equipment uses a set (usually two) of flying probes to inspect pre-set pads on the circuit board to ensure the effectiveness of the manufacturing process.
[0004] However, with the increasing diversification of processed circuit boards, traditional flying probe testing is unable to meet the higher testing accuracy requirements. When testing different circuit boards with probes at fixed positions, the distance between the test points varies. The probes used in the bed of needles fixture need to be manually adjusted according to the distance between the test points of different circuit boards. The equipment cannot be quickly adjusted according to the model change, which will affect the processing efficiency. In addition, manual intervention may cause alignment accuracy problems between the flying probe fixture and the equipment, which may lead to positioning deviation and affect the reliability of the test results. Utility Model Content
[0005] To overcome the shortcomings of the V-CUT testing needle bed fixture, which requires manual adjustment of the probes used in the needle bed fixture according to the distance between the test points of different circuit boards, and the inability of the equipment to quickly adjust according to the model change, thus affecting the processing efficiency, and the possibility of alignment accuracy problems between the flying needle fixture and the equipment due to manual intervention, which may lead to positioning deviation and affect the reliability of the test results, the purpose of this utility model is to provide a V-CUT testing needle structure to solve the above problems.
[0006] A V-CUT test needle structure includes a frame, a transmission component, a drive arm, a slider, a drive motor, a rotating frame, an electric cylinder, a guide rail, a slide, a guide rod, a needle sleeve, and a probe. The frame is frame-shaped with pre-drilled mounting holes or mounting surfaces. The transmission component, consisting of a drive motor and a lead screw, is horizontally arranged within the frame. A drive arm is screwed onto the lead screw, and a slider is located at the end of the drive arm. Driven by the drive arm, the slider can move vertically and horizontally. The slider is L-shaped, with a drive motor mounted on its extended portion. A rotating mechanism is mounted on the slider. The device has a rotating frame, with the output shaft of a drive motor fixedly connected to one side of the rotating frame, causing the rotating frame to rotate on a slider. The rotating frame has symmetrical guide rails, which are inclined and gradually approach each other at their ends. Each guide rail has a sliding seat, which is set in the same direction as the guide rail. Each sliding seat is connected to a needle sleeve, and each needle sleeve contains a probe. An electric cylinder is mounted on the rotating frame, with the moving rod of the electric cylinder extending to one end of the guide rail. The end of the moving rod of the electric cylinder is connected to a guide rod. Both needle sleeves are slidably connected to the guide rod through a connecting block. When the moving rod of the electric cylinder extends, it will drive the probe on the sliding seat to move, and the tip of the probe will gradually approach each other.
[0007] Optionally, it also includes a stabilizing frame and a buffer joint, with the stabilizing frame fixedly connected to the slider, one end of the stabilizing frame connected to the buffer joint, and one end of the buffer joint connected to the end of the slider extension.
[0008] Optionally, the frame has two sets of transmission components, each set of which is connected to two symmetrically arranged drive arms, and the drive arms on the two sets of transmission components are symmetrically arranged.
[0009] Optionally, it also includes hinges, guard plates, and corner blocks. Hinges are symmetrically arranged on the upper front side of the frame, and guard plates are connected between the hinges. The guard plates are rotatably connected to the frame through the hinges, and the rotation direction of the guard plates is up and down. The guard plates are made of transparent material, and corner blocks are symmetrically arranged on the lower front side of the frame.
[0010] Optionally, the needle sheath is equipped with a quick-release mechanism.
[0011] The beneficial effects of this utility model are as follows: By setting a structure that allows for adjustment of the probe position, this utility model can quickly adjust the distance and angle between the two pads on both sides of the V-shaped cut on different board shapes during use, adapting to diverse processing needs. Precise control can be performed without manual intervention, ensuring detection efficiency and accuracy.
[0012] This invention installs a stabilizing frame and a buffer joint on the slider that drives the probe to move. These components have a stabilizing function and strengthen the support structure of the support parts. The vibration on the support parts is buffered and weakened, thus preventing the probe from being misaligned due to vibration.
[0013] This utility model protects the circuit board and flying probe mechanism in the testing station by setting a transparent protective plate, reducing the potential damage to the circuit board and flying probe mechanism caused by external factors, and ensuring the safety of operators. At the same time, the use of the transparent protective plate allows the staff to clearly observe the working status inside the testing station, which is convenient for monitoring and timely adjustment. Attached Figure Description
[0014] Figure 1 This is a three-dimensional structural diagram of the present invention.
[0015] Figure 2 This is a three-dimensional structural diagram of the drive arm, probe, and adjustment mechanism of this utility model.
[0016] Figure 3 This is a three-dimensional structural diagram of the probe and adjustment mechanism components of this utility model.
[0017] Figure 4 This is a three-dimensional structural diagram of the hinges, guard plates, and corner blocks of this utility model.
[0018] The markings in the attached diagram are as follows: 1: frame, 2: transmission component, 3: drive arm, 4: slider, 5: drive motor, 6: rotating frame, 7: electric cylinder, 71: guide rail, 72: slide block, 73: guide rod, 74: needle sleeve, 75: probe, 8: stabilizing frame, 9: buffer joint, 10: hinge, 11: guard plate, 12: corner block. Detailed Implementation
[0019] The present invention will be further described below with reference to specific embodiments. The illustrative embodiments and descriptions of the present invention are used to explain the present invention, but are not intended to limit the present invention.
[0020] A V-CUT test pin structure, such as Figure 1-4 As shown, it includes: a frame 1, which is frame-shaped and has pre-drilled mounting holes or mounting surfaces. During use, the frame 1 can be installed vertically or horizontally according to the structural requirements of the testing machine. The size and dimensions of the frame are customized according to the testing machine to ensure effective contact between the probe 75 and the circuit board. A transmission component 2 is provided inside the frame 1. The transmission component 2 consists of a transmission motor and a lead screw that spans the internal space of the frame 1. The lead screw is driven to rotate by the transmission motor. A drive arm 3 is screwed onto the lead screw of the transmission component 2. The drive arm 3 is composed of two sets of drive components. A slider 4 is provided at the end of the drive arm 3. The slider 4 moves in the XY axis direction of the plane inside the frame 1 under the drive of the transmission lead screw and the drive arm 3. At the same time, the slider 4 is driven to reciprocate in the vertical direction of the circuit board, providing the power for the probe 75 to move during testing and to intermittently contact the circuit board.
[0021] Among them, such as Figure 2and Figure 3 As shown, the slider 4 is L-shaped. Besides the sliding part inside the drive arm 3, it also has an extended portion. A drive motor 5 is fixedly mounted on this extended portion, and a rotating frame 6 is rotatably mounted on it. The output shaft of the drive motor 5 is fixedly connected to one side of the rotating frame 6, causing the rotating frame 6 to rotate on the slider 4. The rotating frame 6 has symmetrically arranged guide rails 71, each with a sliding seat 72. The sliding seats 72 are aligned with the guide rails 71, and the two guide rails 71 are inclined, with their ends gradually approaching each other. Each sliding seat 72 is connected to a needle sleeve 74 aligned with the direction of the guide rails 71. Each needle sleeve 74 contains a probe 75. The needle sleeve 74 has a quick-release and quick-install structure, allowing for rapid installation and removal of the probe 75 within the needle sleeve 74. The rotating frame 6 is equipped with… Equipped with an electric cylinder 7, the movable rod of the electric cylinder 7 extends to one end of the guide rail 71. The end of the movable rod of the electric cylinder 7 is equipped with a guide rod 73 through a connecting frame. The two ends of the guide rod 73 extend toward the two needle sleeves 74 respectively, and the two ends of the guide rod 73 are slidably connected to the two needle sleeves 74 by connecting blocks. When the movable rod of the electric cylinder 7 extends or retracts, it will drive the needle sleeves on the slide block 72 to move on the inclined guide rail 71 through the connecting blocks, and simultaneously drive the probe 75 to move. The extension and retraction of the movable rod of the electric cylinder 7 can be precisely controlled. That is to say, the distance between the tips of the two probes 75 can be precisely controlled through the electric cylinder 7. Correspondingly, according to the preset data or the calculation of the distance between the pads on both sides of the cut by the optical instrument during the flying probe test, the probe 75 can be quickly adjusted.
[0022] Specifically, during V-CUT testing, the circuit board should be installed parallel to the frame of the tester 1. This ensures that the probes 75 moving within the frame of the tester 1 can effectively contact the circuit board. Since the cuts on the circuit board may be longitudinal or transverse, the rotary motor 5 and the rotating frame 6 that drives the probes 75 to rotate at any angle can handle the detection of multi-directional cuts. During testing, the slider 4 will drive the two probes 75 to contact the circuit board simultaneously. Depending on the different distances between the pads of different board types, the position of the needle sleeve 74 on the guide rail 71 can be moved by the electric cylinder 7 to adjust the distance between the probes 75.
[0023] Among them, two sets of transmission components 2 are symmetrically arranged on the frame 1. Each set of transmission components 2 is connected to two symmetrically arranged drive arms 3, and the drive arms 3 on the two sets of transmission components 2 are symmetrically arranged. Specifically, during testing, by setting multiple sets of test probes 75 to synchronously and efficiently test the circuit board, the testing process can be accelerated.
[0024] like Figure 2As shown, it also includes: a stabilizing frame 8, which is mounted on the slider 4 and fixedly connected to the slider 4. One end of the stabilizing frame 8 is connected to a buffer joint 9, and the piston end of the buffer joint 9 is connected to the end of the extended part of the slider 4. The stabilizing frame 8 and the buffer joint 9 form a reinforced support structure. During flying probe testing, in order to improve the testing efficiency, the power cycle of the transmission component 2 and the drive arm 3 will be adjusted to a high-speed operating state. At this time, if the end of the extended part of the slider 4 is not supported by a stable support structure, it is very easy to vibrate during the test. These vibrations will be transmitted to the rotating frame 6 on which the probe 75 is mounted, which will cause the probe 75 to be affected by the vibration and may be misaligned. The stabilizing frame 8 and the buffer joint 9 thereon can effectively absorb and disperse the vibration formed at the end of the extended part of the slider 4, thereby weakening the vibration on the slider 4.
[0025] like Figure 4 As shown, it also includes: hinges 10, hinges 10 are symmetrically arranged on the upper front side of the frame 1, and transparent protective plates 11 are connected between the hinges 10. The protective plates 11 cover the components inside the frame 1. The protective plates 11 are rotatably connected to the frame 1 via the hinges 10, and the rotation direction of the protective plates 11 is up and down. Corner blocks 12 are symmetrically arranged on the lower front side of the frame 1. The corner blocks 12 will contact the two corners of the protective plates 11 except for the connecting hinges 10. There is a certain friction between the protective plates 11 and the corner blocks 12. The corner blocks 12 can clamp the closed protective plates 11 to a certain extent, preventing them from being easily opened by external force. The purpose of setting the protective plates 11 is to protect the circuit boards and flying probe mechanisms in the test station, reduce the impact of external factors on the test work, realize the separation of man and machine, and ensure the safety of the operator. At the same time, the transparent protective plates 11 can ensure that the operator can clearly observe the working status inside the test station, which is convenient for monitoring and timely adjustment.
[0026] Those skilled in the art should understand that the above embodiments do not limit the present invention in any way, and all technical solutions obtained by means of equivalent substitution or equivalent transformation fall within the protection scope of the present invention.
Claims
1. A V-CUT test pin structure, comprising a frame (1), the frame (1) being frame-shaped, having pre-drilled mounting holes or mounting surfaces; Its features are: It also includes a transmission component (2), a drive arm (3), a slider (4), a drive motor (5), a rotating frame (6), an electric cylinder (7), a guide rail (71), a slide (72), a guide rod (73), a needle sleeve (74), and a probe (75). The transmission component (2) is installed inside the frame (1). The transmission component (2) consists of a drive motor and a lead screw. The lead screw is arranged horizontally inside the frame (1). The drive arm (3) is screwed onto the lead screw of the transmission component (2). The slider (4) is provided at the end of the drive arm (3). The slider (4) can move vertically and horizontally under the drive of the drive arm (3). The slider (4) is L-shaped. The drive motor (5) is installed on its protrusion. The rotating frame (6) is rotatably installed on the slider (4). The output shaft of the drive motor (5) is fixed to one side of the rotating frame (6). The connection drives the rotating frame (6) to rotate on the slider (4). The rotating frame (6) is symmetrically provided with guide rails (71). The two guide rails (71) are set in an inclined position. The ends of the two guide rails (71) gradually approach each other. Each guide rail (71) is provided with a sliding seat (72). The sliding seat (72) is set in the same direction as the guide rail (71). Each sliding seat (72) is connected with a needle sleeve (74). Each needle sleeve (74) is installed with a probe (75). An electric cylinder (7) is installed on the rotating frame (6). The moving rod of the electric cylinder (7) extends to one end of the guide rail (71). The end of the moving rod of the electric cylinder (7) is connected with a guide rod (73). Both needle sleeves (74) are slidably connected to the guide rod (73) through a connecting block. When the moving rod of the electric cylinder (7) extends, it will drive the probe (75) on the sliding seat (72) to move, and the needle tip will gradually approach each other.
2. The V-CUT test pin structure according to claim 1, characterized in that: It also includes a stabilizing frame (8) and a buffer joint (9). The stabilizing frame (8) is fixedly connected to the slider (4). One end of the stabilizing frame (8) is connected to the buffer joint (9). One end of the buffer joint (9) is connected to the end of the protruding part of the slider (4).
3. The V-CUT test pin structure according to claim 2, characterized in that: The frame (1) has two sets of transmission components (2), each set of transmission components (2) is connected to two symmetrically arranged drive arms (3), and the drive arms (3) on the two sets of transmission components (2) are symmetrically arranged.
4. The V-CUT test pin structure according to claim 3, characterized in that: It also includes hinges (10), guard plates (11) and corner blocks (12). Hinges (10) are symmetrically arranged on the upper front side of the frame (1). Guard plates (11) are connected between the hinges (10). The guard plates (11) are rotatably connected to the frame (1) through the hinges (10). The rotation direction of the guard plates (11) is up and down. The guard plates (11) are made of transparent material. Corner blocks (12) are symmetrically arranged on the lower front side of the frame (1).
5. The V-CUT test pin structure according to claim 4, characterized in that: The needle sleeve (74) is equipped with a quick-installation and quick-release mechanism.