Diode performance testing device

Abstract

The utility model discloses a diode performance testing device, and belongs to the technical field of universal meters. The device mainly comprises a test box which comprises a mounting cavity; the mounting cavity is divided into two groups of chambers by the first partition plate; the universal meter is arranged in one group of the cavities; and the second partition plate divides the cavity far away from the universal meter into two groups of storage layers, and the two groups of storage layers are respectively provided with an electricity testing clamp and an extension part. According to the diode performance testing device, the universal meter, the electricity testing clamp and the extension part can be safely stored by arranging the testing box, and meanwhile, the interior of the mounting cavity is divided into multiple groups of chambers for storage by arranging the first partition plate and the second partition plate in the mounting cavity; and therefore, articles required by working personnel during working can be conveniently stored, the practicability of the device is improved, and the effect that the electric energy meter can be conveniently stored and carried when not used is achieved.

Description

Technical Field

[0001] This application relates to the field of multimeter technology, specifically a diode performance testing device. Background Technology

[0002] A diode is an electronic component that allows current to flow in one direction while blocking it in the other. It is commonly used in circuits as a switch, rectifier, or protection device. Diodes have two polarities: the positive terminal is the anode, and the negative terminal is the cathode. Diodes have a wide range of applications in electronics, such as in rectifier circuits to convert AC signals to DC signals, and as inverters, voltage regulators, and modems. After diodes are manufactured, their performance needs to be tested, and most existing diode testing equipment uses a multimeter for this purpose.

[0003] For example, the patent with publication number CN220323416U discloses a clamp-type digital multimeter. By setting clamps, the multimeter can be easily clamped and fixed. By adding a constant current discharge module, it can quickly and accurately perform constant current discharge, avoiding the risk of arcing and high current pulse waves generated by direct short-circuit discharge of capacitors, thus protecting circuit components and user safety. By setting a display screen, LED lights, and a sound generator, the charging status of the capacitor can be displayed or given audible prompts.

[0004] In the aforementioned patent, the multimeter is equipped with clamps for easy clamping and fixing at various workstations. However, the multimeter lacks a storage and protection device, leaving its test leads and probes exposed when not in use. This makes it inconvenient to carry and store, and can easily lead to problems such as tangled wires and mess. Therefore, it is necessary to provide a diode performance testing device with a storage structure to solve the above problems.

[0005] It should be noted that the information disclosed in this background section is only for understanding the background technology of this application concept, and therefore may include information that does not constitute prior art. Summary of the Invention

[0006] Based on the aforementioned problems in the existing technology, the problem to be solved by this application is to provide a diode performance testing device that allows the multimeter to be conveniently stored and carried when not in use.

[0007] The technical solution adopted by this application to solve its technical problem is: a diode performance testing device, including a test box, the test box including a mounting cavity; a first partition, the first partition dividing the mounting cavity into two sets of chambers; a multimeter, the multimeter being installed in one of the sets of chambers; a second partition, the second partition dividing the chamber away from the multimeter into two sets of storage layers, the two sets of storage layers being respectively provided with a voltage measuring clip and an extension.

[0008] Furthermore, a circuit board is provided on one side of the multimeter, and a through slot is provided on the outside of the test box, the through slot being adapted to the size of the circuit board.

[0009] Furthermore, one end of the current testing clamp is provided with an interface, one end of the extension is provided with a wire, and the end away from the guide is provided with a snap-fit ​​post, the size of which is adapted to the size of the interface.

[0010] Furthermore, the first partition is provided with multiple sets of slots, and the second partition is slidably installed on one of the sets of slots.

[0011] Furthermore, the test box has a hinged lid at the opening, and a heat dissipation mesh is provided on the top of the lid.

[0012] The beneficial effects of this application are: The diode performance testing device provided by this application, by setting a test box, allows the multimeter, test clamp and extension to be safely stored. At the same time, by setting a first partition and a second partition in the mounting cavity, the mounting cavity is divided into multiple groups of storage chambers, which makes it convenient for the staff to store the items needed during work, thus increasing the practicality of the device.

[0013] In addition to the purposes, features, and advantages described above, this application has other purposes, features, and advantages. A further detailed description of this application will be provided below with reference to the figures. Attached Figure Description

[0014] The accompanying drawings, which form part of this application, are used to provide a further understanding of this application. The illustrative embodiments and descriptions of this application are used to explain this application and do not constitute an undue limitation of this application. In the drawings:

[0015] Figure 1 This is an overall schematic diagram of a diode performance testing device according to this application;

[0016] Figure 2 for Figure 1 Diagram showing the opening of the test box;

[0017] Figure 3 for Figure 2 Schematic diagram of the internal structure of the test box;

[0018] Figure 4 for Figure 3 Installation diagram of the center-mounted electrical clamp and its extension;

[0019] The following are the labeling elements in the figure:

[0020] 1. Test box; 11. Box cover; 12. Heat dissipation mesh; 13. Through slot; 2. Mounting cavity; 21. First partition; 211. Slot; 22. Second partition; 3. Multimeter; 31. Circuit board; 4. Chamber; 41. Shelf; 42. Clamp; 5. Test clamp; 51. Interface; 6. Extension; 61. Snap-fit ​​post. Detailed Implementation

[0021] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.

[0022] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort should fall within the scope of protection of the present application.

[0023] like Figures 1-3 As shown, this application provides a diode performance testing device, including a test box 1 with an opening and an internal mounting cavity 2. A multimeter 3 is installed inside the mounting cavity 2, and a power module (not shown in the figure) is installed inside the multimeter 3 for performing performance testing on the manufactured diodes.

[0024] Meanwhile, a cover 11 is hinged at the opening of the test box 1, and a heat dissipation mesh 12 is provided on the top of the cover 11. The heat dissipation mesh 12 keeps the multimeter 3 inside the mounting cavity 2 within a suitable temperature range, ensuring the accuracy and stability of the test.

[0025] The mounting cavity 2 is provided with a first partition 21, which divides the mounting cavity 2 into two sets of chambers 4. The multimeter 3 can be detachably installed in one set of chambers 4. A circuit board 31 is provided on one side of the multimeter 3. At the same time, a through groove 13 is provided on the outside of the test box 1, which is adapted to the size of the circuit board 31. When the multimeter 3 is installed inside the test box 1, the circuit board 31 can be stably installed in the through groove 13, which facilitates the testing and use by the staff.

[0026] Meanwhile, multiple sets of slots 211 are provided on the first partition 21, and a second partition 22 is slidably installed on one of the slots 211. The second partition 22 divides another set of chambers 4 into two sets of storage layers 41. Two sets of voltage test clips 5 are placed inside one set of storage layers 41. The voltage test clips 5 are suitable for direct installation on the circuit board 31. Meanwhile, two sets of clamping blocks 42 are fixedly installed inside the other set of storage layers 41. An extension 6 is clamped on the clamping block 42. The extension 6 is a conventional voltage tester.

[0027] When a diode needs to be tested, first open the cover 11, then take out the two sets of test clips 5 from the storage layer 41 and install them on the circuit board 31. Then clamp the positive and negative terminals of the diode to be tested into the two sets of test clips 5 respectively. At this time, the conductivity of the diode can be judged according to the reading on the multimeter 3.

[0028] like Figure 4 As shown, one end of the current testing clamp 5 is provided with an interface 51, which is suitable for connecting to an external line. At the same time, one end of the extension 6 is provided with a wire, and the other end is provided with a snap-fit ​​post 61. The size of the snap-fit ​​post 61 is adapted to the size of the interface 51. The current testing clamp 5 and the extension 6 are suitable for installation and connection with the cooperation of the interface 51 and the snap-fit ​​post 61.

[0029] When the diode to be tested is not easy to remove, first install the test clamp 5 and the extension part 6 together, and then connect the wires on the extension part 6 to the circuit board 31. At this time, the test range of the test clamp 5 is extended, so that it can test diodes at different positions and heights.

[0030] In summary, by setting up the test box 1, the multimeter 3, the electrical clamp 5, and the extension part 6 can all be safely stored in this device. At the same time, by setting the first partition 21 and the second partition 22 in the mounting cavity 2, the interior of the mounting cavity 2 is divided into multiple groups of storage chambers 4, which makes it convenient for the staff to store the items needed during work, thus increasing the practicality of the device.

[0031] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A diode performance testing device, comprising a test box (1), characterized in that: The test box (1) includes: Installation cavity (2); A first partition (21) divides the mounting cavity (2) into two sets of chambers (4); A multimeter (3) is installed in one of the chambers (4); The second partition (22) divides the chamber (4) away from the multimeter (3) into two sets of storage layers (41), and the two sets of storage layers (41) are respectively provided with a test clip (5) and an extension (6). The storage layer (41) is equipped with two sets of clamps (42), and the extension (6) is installed inside the clamps (42); A circuit board (31) is provided on one side of the multimeter (3), and a through slot (13) is provided on the outside of the test box (1), the through slot (13) being adapted to the size of the circuit board (31); When the multimeter (3) is installed inside the test box (1), the circuit board (31) is installed inside the through slot (13).

2. The diode performance testing device according to claim 1, characterized in that: One end of the measuring clamp (5) is provided with an interface (51), one end of the extension (6) is provided with a wire, and the end away from the guide is provided with a snap-fit ​​post (61). The size of the snap-fit ​​post (61) is adapted to the size of the interface (51).

3. The diode performance testing device according to claim 2, characterized in that: The first partition (21) is provided with multiple sets of slots (211), and the second partition (22) is slidably mounted on one of the sets of slots (211).

4. The diode performance testing device according to claim 1, characterized in that: The test box (1) is hinged to a lid (11) at the opening, and a heat dissipation mesh (12) is provided on the top of the lid (11).

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