Fixture for ferroelectric analyzer sample test and ferroelectric analyzer

Abstract

The utility model discloses a clamp used for a ferroelectric analyzer sample test and a ferroelectric analyzer. The clamp comprises a pedestal; the first electrode is arranged on the base; the second electrode is slidably arranged on the base; the elastic assembly is arranged on the base; wherein the elastic assembly is used for pushing the second electrode, so that the head of the second electrode and the head of the first electrode clamp a to-be-tested sample of the ferroelectric analyzer; the diameter of the head of the first electrode and the diameter of the head of the second electrode are both micron-sized. The clamping force between the first electrode and the second electrode can be adjusted by changing the elastic force of the elastic assembly, so that the clamping force between the first electrode and the second electrode is in a proper range, and the problem that a small-size sample is crushed is avoided. In addition, the size of the head of the first electrode and the size of the head of the second electrode are both small, and when a small-size sample is clamped, the problem of breakdown or short circuit is not prone to occurring. Therefore, the clamp is more suitable for testing the small-size ferroelectric analyzer sample.

Description

TECHNICAL FIELD

[0001] The utility model relates to the technical field of fixture, especially is a kind of for ferroelectric analyzer sample test's fixture and ferroelectric analyzer. BACKGROUND

[0002] Ferroelectric material refers to a kind of material with ferroelectric effect, and it is a branch of pyroelectric material.Ferroelectric material and its application research have become one of the most popular research topics in condensed matter physics, solid-state electronics field.Crystal, its reason is in that they have quite excellent performance.For example, the electrostatic capacitor based on ferroelectric material has the characteristics such as super-high power density (super-fast charging and discharging rate), high voltage resistance and good reliability, is the key component widely used in electronic devices and power system.Many electro-optic crystals, piezoelectric materials are ferroelectric crystals.Ferroelectric crystals have important significance both in technology or theory.

[0003] Hysteresis loop is an important index to characterize the performance of ferroelectric material.Ferroelectric analyzer is an instrument for characterizing hysteresis loop.Ferroelectric crystal includes ferroelectric ceramic, ferroelectric single crystal, ferroelectric epitaxial film, etc.In the prior art, the test of ferroelectric crystal or ferroelectric block is according to the demand of the fixture of ferroelectric analyzer, and the sample is prepared into 2mm~10mm diameter, but in recent years, many people have found excellent performance in small size ceramic and single crystal ferroelectric material, high-quality ferroelectric thin film nanocrystal, for example, thin film based on PtTiO 3 And BaTiO 3 It has been proved to have higher Pm (maximum polarization), larger Eb (maximum electric field that dielectric can withstand) and better Ue (energy density).The traditional commercial fixture does not have a fixture suitable for small size sample, on the one hand, the existing fixture clamping force is large, easy to crush small size sample;On the other hand, small size sample is prone to breakdown or short circuit problem.

[0004] Therefore, the prior art still needs to be improved and developed. INVENTION CONTENTS

[0005] The technical problem to be solved by the utility model is that, in view of the above defects of the prior art, a fixture for ferroelectric analyzer sample test and ferroelectric analyzer are provided, to solve the problem that the fixture of the prior art ferroelectric analyzer is not suitable for small size sample.

[0006] The technical scheme adopted by the utility model to solve the technical problem is as follows:

[0007] A fixture for ferroelectric analyzer sample test, wherein it comprises:

[0008] Base;

[0009] a first electrode disposed on the base;

[0010] a second electrode slidingly disposed on the base;

[0011] a resilient assembly disposed on the base;

[0012] wherein the resilient assembly is configured to push the second electrode so that the head of the second electrode and the head of the first electrode hold a sample to be tested of a ferroelectric analyzer;

[0013] the diameter of the head of the first electrode and the diameter of the head of the second electrode are both micron level.

[0014] the clamp for sample testing of a ferroelectric analyzer, wherein a sleeve is disposed outside the head of the first electrode, the sleeve is formed with a receiving groove, and the head of the first electrode extends from the bottom of the receiving groove.

[0015] the clamp for sample testing of a ferroelectric analyzer, wherein the first electrode comprises:

[0016] a first insulating portion disposed on the base;

[0017] a first needle disposed on the first insulating portion and extending towards the second electrode;

[0018] wherein the sleeve is sleeved on one end of the first needle towards the second electrode.

[0019] the clamp for sample testing of a ferroelectric analyzer, wherein the second electrode comprises:

[0020] a second insulating portion slidingly disposed on the base;

[0021] a second needle disposed on the second insulating portion and extending towards the first electrode;

[0022] wherein the resistance of the first needle and the resistance of the second needle are both less than 1Ω.

[0023] the clamp for sample testing of a ferroelectric analyzer, wherein the first needle and the second needle each comprise:

[0024] a tapered portion;

[0025] a rod portion disposed on the tapered portion;

[0026] wherein the diameter of the rod portion is 500-1000μm.

[0027] the clamp for sample testing of a ferroelectric analyzer, wherein the tail of the second electrode is provided with a guide column;

[0028] The elastic assembly comprises:

[0029] The vertical plate is formed with a guide hole;

[0030] The elastic member is located between the tail of the second electrode and the vertical plate;

[0031] The guide column is arranged in the guide hole.

[0032] The base is further provided with a first port and a second port, the first port is electrically connected with the first electrode, and the second port is electrically connected with the second electrode.

[0033] The first port is a BNC port or a banana head terminal, and the second port is a BNC port.

[0034] The clamp further comprises:

[0035] The transparent cover covers the first electrode, the second electrode and the elastic assembly.

[0036] The ferroelectric analyzer comprises the clamp for testing a ferroelectric analyzer sample.

[0037] Beneficial effects: the clamping force between the first electrode and the second electrode can be adjusted by changing the elastic force of the elastic assembly, so that the clamping force between the first electrode and the second electrode is within a suitable range, and the problem of small-size samples being crushed does not occur. In addition, the size of the head of the first electrode and the size of the head of the second electrode are both small, and the problem of breakdown or short circuit does not easily occur when small-size samples are clamped. Therefore, the clamp is more suitable for testing small-size ferroelectric analyzer samples. BRIEF DESCRIPTION OF DRAWINGS

[0038] Figure 1 is a perspective view of the clamp for testing a ferroelectric analyzer sample in the embodiment of the utility model.

[0039] Figure 2 is Figure 1 is an enlarged view of A in figure

[0040] Figure 3 is a top view of the clamp for testing a ferroelectric analyzer sample in the embodiment of the utility model.

[0041] Figure 4 is a side view of the clamp for testing a ferroelectric analyzer sample in the embodiment of the utility model.

[0042] Figure 5It is the structural schematic view of the transparent cover in the embodiment of the utility model.

[0043] Figure 6 It is the hysteresis loop and the current electric field loop of the test sample of the clamp for ferroelectric analyzer sample test in the embodiment of the utility model.

[0044] Mark explanation:

[0045] 10, base; 20, first electrode; 21, first insulating part; 22, first thimble; 30, second electrode; 31, second insulating part; 32, second thimble; 33, guide column; 3a, conical part; 3b, rod part; 40, elastic assembly; 41, vertical plate; 42, elastic piece; 50, sleeve; 51, accommodating groove; 61, first port; 62, second port; 70, transparent cover. Specific implementation

[0046] In order to make the purpose, technical scheme and advantage of the utility model more clear and definite, the utility model is further described in detail below with reference to the drawings and examples. It should be understood that the specific examples described herein are only used to explain the utility model, and are not used to limit the utility model.

[0047] Please refer to Figures 1-6 , some preferable embodiments of the clamp for ferroelectric analyzer sample test are provided.

[0048] As Figure 1 shown, the clamp for ferroelectric analyzer sample test comprises:

[0049] Base 10;

[0050] First electrode 20, arranged on the base 10;

[0051] Second electrode 30, slidingly arranged on the base 10;

[0052] Elastic assembly 40, arranged on the base 10;

[0053] Wherein, the elastic assembly 40 is used for pushing the second electrode 30, so that the head of the second electrode 30 and the head of the first electrode 20 clamp the sample to be tested of the ferroelectric analyzer; the diameter of the head of the first electrode 20 and the diameter of the head of the second electrode 30 are micron level.

[0054] Specifically, the first electrode 20 is fixed to the base 10, the second electrode 30 can slide relative to the base 10, and the sliding direction of the second electrode 30 is the direction towards the first electrode 20. The first electrode 20 and the second electrode 30 are electrically connected with two input ends of the ferroelectric analyzer respectively. The head of the first electrode 20 faces the second electrode 30, and the head of the second electrode 30 faces the first electrode 20. The elastic assembly 40 is used to push the second electrode 30, so that the head of the first electrode 20 and the head of the second electrode 30 clamp the sample to be tested of the ferroelectric analyzer. The diameter of the head of the first electrode 20 and the diameter of the head of the second electrode 30 are micron level, and usually the diameter of the head of the first electrode 20 and the diameter of the head of the second electrode 30 are equal.

[0055] By changing the elastic force of the elastic assembly 40, the clamping force between the first electrode 20 and the second electrode 30 can be adjusted, so that the clamping force between the first electrode 20 and the second electrode 30 is within a suitable range, and the problem of small size sample being crushed does not occur. In addition, the size of the head of the first electrode 20 and the size of the head of the second electrode 30 are small, and when clamping a small size sample, the problem of breakdown or short circuit is not easy to occur. Therefore, the clamp of the present application is more suitable for testing small size ferroelectric analyzer samples.

[0056] In order to limit the sliding of the second electrode 30, a guide structure can be provided to guide the sliding of the second electrode 30. The guide structure can be a guide hole, a guide groove or a guide rail, etc. The guide structure can be provided on the base 10, and a sliding block can be provided on the second electrode 30 to slide on the guide hole, the guide groove or the guide rail.

[0057] In a preferred embodiment of the utility model, please refer to Figures 1-2 , the head of the first electrode 20 is provided with a sleeve 50 outside, the sleeve 50 forms a containing groove 51, and the head of the first electrode 20 extends from the bottom of the containing groove 51.

[0058] Specifically, the head of the first electrode 20 is provided with a sleeve 50 outside, the sleeve 50 is sleeved outside the head of the first electrode 20, the sleeve 50 forms a containing groove 51 on the end face towards the second electrode 30, the head of the first electrode 20 extends from the bottom of the containing groove 51 and extends into the containing groove 51 but does not extend out of the containing groove 51. The containing groove 51 is used to contain non-conductive liquid, so as to further reduce the possibility of short circuit between the head of the first electrode 20 and the head of the second electrode 30. The non-conductive liquid can be silicone oil.

[0059] In a preferred embodiment of the utility model, please refer to Figures 1-2 , the first electrode 20 comprises:

[0060] a first insulation part 21 arranged on the base 10;

[0061] The first needle 22 is arranged on the first insulating part 21 and extends towards the second electrode 30.

[0062] The sleeve 50 is sleeved on one end of the first needle 22 towards the second electrode 30.

[0063] Specifically, the first electrode 20 comprises a first insulating part 21 and a first needle 22. The first insulating part 21 surrounds a first part of the first needle 22, and the sleeve 50 surrounds a second part of the first needle 22. The first part of the first needle 22 is away from the second electrode 30, and the second part of the first needle 22 is close to the second electrode 30. An end of the second part of the first needle 22 towards the second electrode 30 serves as a head of the first electrode 20. The first insulating part 21 isolates the first needle 22 from the base 10.

[0064] In a preferred embodiment of the utility model, please refer to Figures 3-4 The second electrode 30 comprises:

[0065] The second insulating part 31 is slidably arranged on the base 10.

[0066] The second needle 32 is arranged on the second insulating part 31 and extends towards the first electrode 20.

[0067] Specifically, the second electrode 30 comprises a second insulating part 31 and a second needle 32. The second insulating part 31 surrounds a first part of the second needle 32, and a second part of the second needle 32 is exposed. The first part of the second needle 32 is away from the first electrode 20, and the second part of the second needle 32 is close to the first electrode 20. An end of the second part of the second needle 32 towards the first electrode 20 serves as a head of the second electrode 30. The second insulating part 31 isolates the second needle 32 from the base 10. The central axis of the first needle 22 and the central axis of the second needle 32 are coincident.

[0068] In a preferred embodiment of the utility model, the resistance of the first needle 22 and the resistance of the second needle 32 are both less than 1Ω.

[0069] Specifically, the resistance of the first needle 22 and the resistance of the second needle 32 are both made of materials with small resistance, and the resistance of the first needle 22 and the resistance of the second needle 32 are both less than 1Ω. For example, the first needle 22 and the second needle 32 can both be made of brass.

[0070] In a preferred embodiment of the utility model, please refer to Figures 2-4 The first needle 22 and the second needle 32 both comprise:

[0071] a tapered portion 3a;

[0072] a rod portion 3b, disposed on the tapered portion 3a;

[0073] The diameter of the rod portion 3b is 500-1000 microns.

[0074] Specifically, the first needle 22 and the second needle 32 can have the same structure. The tapered portion 3a is tapered, the tapered portion 3a of the first needle 22 is disposed on the first insulating portion 21, and the tapered portion 3a of the second needle 32 is disposed on the second insulating portion 31. The rod portion 3b is disposed on the tapered portion 3a, the rod portion 3b of the first needle 22 serves as the head of the first electrode 20, the rod portion 3b of the second needle 32 serves as the head of the second electrode 30, the diameter of the rod portion 3b is micron level, for example, it can be 500-1000 microns, and for another example, the diameter of the rod portion 3b is 600-800 microns.

[0075] The first needle 22 and the second needle 32 can further include an embedded portion connected with the tapered portion 3a; the embedded portion of the first needle 22 is embedded in the first insulating portion 21, and the embedded portion of the second needle 32 is embedded in the second insulating portion 31. The embedded portion is conducive to more stable connection of the first needle 22 on the first insulating portion 21 and more stable connection of the second needle 32 on the second insulating portion 31.

[0076] In a preferred embodiment of the present application, please refer to Figure 1 、 Figure 3 and Figure 4 The tail of the second electrode 30 is provided with a guide column 33; the elastic assembly 40 includes:

[0077] A vertical plate 41 is formed with a guide hole;

[0078] An elastic member 42 is located between the tail of the second electrode 30 and the vertical plate 41;

[0079] The guide column 33 is arranged in the guide hole.

[0080] Specifically, the second insulating portion 31 serves as the tail of the second electrode 30, the second insulating portion 31 is provided with a guide column 33 on the side away from the first electrode 20, the guide column 33 is inserted into the guide hole, and the movement direction of the guide column 33 is limited by the guide hole, so that the second electrode 30 moves in the direction away from the first electrode 20. The elastic member 42 provides the elastic force for the sliding of the second electrode 30 in the direction towards the first electrode 20, and the elastic member 42 can be a spring.

[0081] The guide column 33 can be made of insulating material, and the inner embedding part of the second stylus 32 can extend into the guide column 33. The first insulating part 21, the second insulating part 31 and the guide column 33 can all be made of polytetrafluoroethylene. The outer diameter of the first insulating part 21 and the outer diameter of the second insulating part 31 can be in millimeter level, for example, 5 mm. The first insulating part 21 and the second insulating part 31 can further be wrapped with a metal shell.

[0082] In a preferred embodiment of the present application, the tension stiffness coefficient of the elastic member 42 is less than 100 N / m.

[0083] Specifically, the tension stiffness coefficient of the elastic member 42 is small, for example, less than 100 N / m. When the elastic member 42 with small tension stiffness coefficient is used, the clamping force between the first electrode 20 and the second electrode 30 is small, and the small-size sample is not easy to be crushed.

[0084] In a preferred embodiment of the present application, please refer to Figures 3-5 , the base 10 is further provided with a first port 61 and a second port 62, the first port 61 is electrically connected with the first electrode 20, and the second port 62 is electrically connected with the second electrode 30.

[0085] Specifically, the first electrode 20, the second electrode 30 and the elastic assembly 40 are all arranged on the upper surface of the base 10, and the first port 61 and the second port 62 are both arranged on the side surface of the base 10. The first port 61 is electrically connected with the first electrode 20, and the second port 62 is electrically connected with the second electrode 30. The first port 61 and the second port 62 serve as output ends of the clamp, and the first port 61 and the second port 62 are respectively electrically connected with two input ends of the ferroelectric analyzer. The first electrode 20 and the first port 61 can be electrically connected by using a cable, and the second electrode 30 and the second port 62 can be electrically connected by using a cable.

[0086] In a preferred embodiment of the present application, the first port 61 is a BNC (Bayonet Neill-Concelman) port or a banana head terminal, and the second port 62 is a BNC port.

[0087] Specifically, the first port 61 can be a BNC port or a banana head terminal. The second port 62 is a BNC port. The BNC port is a common RF (Radio Frequency) terminal coaxial cable terminator, and the banana head terminal has a slightly bulging banana shape.

[0088] In a preferred embodiment of the present application, please refer to Figure 1 and Figure 5 , the clamp further comprises:

[0089] A transparent cover 70 covers the first electrode 20, the second electrode 30 and the elastic assembly 40.

[0090] Specifically, the clamp can further be provided with a transparent cover 70, which covers the base 10 and covers the first electrode 20, the second electrode 30 and the elastic assembly 40, so as to not only protect the first electrode 20, the second electrode 30 and the clamped sample to be tested of the ferroelectric analyzer, but also facilitate observation of the clamping state of the sample to be tested of the ferroelectric analyzer, for example, observation of whether the sample is crushed or not, and observation of whether the sample is displaced or not. The transparent cover 70 can be made of acrylic material. The transparent cover 70 is provided with a notch, which avoids the first port 61, the second port 62 and the guide column 33.

[0091] As shown in the accompanying drawings, Figure 6 For a piezoelectric ceramic with a transverse width of 1mm, the clamp is used for testing, and the voltage corresponding to 80kV / cm is 800V. A normal P-E hysteresis loop (i.e. P-E polarization electric field loop) and I-E current electric field loop can be obtained by applying 800V.

[0092] Based on the clamp for sample testing of a ferroelectric analyzer according to any one of the above embodiments, the utility model further provides a ferroelectric analyzer, which comprises the clamp for sample testing of a ferroelectric analyzer according to any one of the above embodiments, and is specifically as described above.

[0093] The ferroelectric analyzer provided by the utility model has all the beneficial effects of the clamp for sample testing of a ferroelectric analyzer according to any one of the above technical solutions, and thus the above beneficial effects are not repeated here.

[0094] It should be understood that the application of the utility model is not limited to the above examples, and those skilled in the art can improve or transform the utility model according to the above description, and all these improvements and transformations shall belong to the protection scope of the claims of the utility model.

Claims

1. A fixture for sample testing in a ferroelectric analyzer, characterized in that, It includes: Base; The first electrode is disposed on the base; The second electrode is slidably disposed on the base; An elastic component is disposed on the base; The elastic component is used to push the second electrode so that the head of the second electrode and the head of the first electrode clamp the sample to be tested in the ferroelectric analyzer. The diameter of the head of the first electrode and the diameter of the head of the second electrode are both on the order of micrometers.

2. The fixture for sample testing in a ferroelectric analyzer according to claim 1, characterized in that, A kit is provided on the head of the first electrode, and a receiving groove is formed on the kit. The head of the first electrode extends out from the bottom of the receiving groove.

3. The fixture for sample testing in a ferroelectric analyzer according to claim 2, characterized in that, The first electrode includes: A first insulating part is disposed on the base; A first ejector pin is disposed on the first insulating portion and extends toward the second electrode; The kit is fitted onto the end of the first pin that faces the second electrode.

4. The fixture for sample testing in a ferroelectric analyzer according to claim 3, characterized in that, The second electrode includes: The second insulating part is slidably disposed on the base; The second pin is disposed on the second insulating portion and extends toward the first electrode; The resistance of both the first pin and the second pin is less than 1Ω.

5. The fixture for sample testing in a ferroelectric analyzer according to claim 4, characterized in that, Both the first ejector pin and the second ejector pin include: Conical part; The rod portion is disposed in the tapered portion; The diameter of the rod is 500–1000 μm.

6. The fixture for sample testing in a ferroelectric analyzer according to claim 1, characterized in that, The tail end of the second electrode is provided with a guide post; The elastic component includes: The upright plate has guide holes. An elastic element is located between the tail of the second electrode and the vertical plate; The guide post passes through the guide hole.

7. The fixture for sample testing in a ferroelectric analyzer according to claim 1, characterized in that, The base is also provided with a first port and a second port, the first port being electrically connected to the first electrode and the second port being electrically connected to the second electrode.

8. The fixture for sample testing in a ferroelectric analyzer according to claim 7, characterized in that, The first port is a BNC port or a banana plug terminal, and the second port is a BNC port.

9. The fixture for sample testing in a ferroelectric analyzer according to any one of claims 1-8, characterized in that, The clamp also includes: A transparent cover encloses the first electrode, the second electrode, and the elastic component.

10. A ferroelectric analyzer, characterized in that, It includes a fixture for testing ferroelectric analyzer samples as described in any one of claims 1 to 9.

Images