High and low temperature test box for sensor

Abstract

The utility model discloses a sensor high-low temperature test box, and belongs to the technical field of sensor testing. The device mainly comprises a containing box. The mounting plate is mounted in the accommodating box; the supporting part comprises a tray mounted at the top of the mounting plate, a clamping block is arranged on one side of the front of the top of the tray, an arc-shaped groove is formed in the top of the clamping block, a plurality of groups of supporting rods are arranged on the other side of the top of the tray, and the supporting rods are triangularly arranged; the two sets of fixing blocks are arranged at the front end of the clamping block and one side of the supporting rod correspondingly, and locking plates are rotationally installed at the tops of the fixing blocks; a plurality of springs are installed between the supporting rod and the clamping block, and a top block is installed at the top of each spring and makes contact with the bottom of the sensor. According to the high and low temperature test box for the sensor, the supporting part is arranged, so that the sensor can be quickly fixed and disassembled before testing, and the practicability of the device is improved.

Description

TECHNICAL FIELD

[0001] The application relates to the technical field of sensor testing, in particular to a sensor high-low temperature test box. BACKGROUND

[0002] The working principle of the high-low temperature test box is mainly based on thermodynamics and physical principles, and the temperature in the test box is precisely controlled through the cooperative work of multiple systems to simulate the environment under different temperature conditions. The heating system usually adopts an electric heating wire or an electric heating tube as a heating element to generate heat, and the hot air is sent into the test box through an air circulation system to achieve the purpose of temperature rise. The refrigeration system uses compressor refrigeration technology to absorb and discharge heat through the circulation of refrigerant in evaporators, condensers and other components to achieve temperature reduction.

[0003] For example, the patent with the publication number CN210815300U specifically discloses a programmable high-low temperature test box. Multiple sample clamps are regularly arranged in the experimental chamber, and the sample clamps are detachably connected with the horizontal guide rails. This not only allows simultaneous testing of multiple batteries, but also standardizes the placement position of the batteries to prevent short circuiting caused by collision during testing.

[0004] In the above patent, the device sets multiple sample clamps, and the sample clamps are detachably connected with the horizontal guide rails. This not only allows simultaneous testing of multiple batteries, but also standardizes the placement position of the batteries. However, during testing, the shells of individual workpieces may melt, which may cause the workpieces to adhere to the inside of the test box. After the shells of the workpieces melt, residues may be left that are difficult to remove, which increases the difficulty of cleaning the test box and the samples. When removing the adhered workpieces, the operator may face the risk of burns, cuts and other safety risks. Therefore, it is necessary to provide a sensor high-low temperature test box with a pop-up device to solve the above problems.

[0005] It should be noted that the above information disclosed in this background section is only used to understand the background technology of the present application concept, and therefore, it can contain information that does not constitute prior art. SUMMARY

[0006] Based on the above problems existing in the prior art, the present application aims to provide a sensor high-low temperature test box that can quickly remove workpieces.

[0007] The technical scheme adopted by the application to solve the technical problems is: a sensor high-low temperature test box, comprising a containing box; a mounting plate installed inside the containing box; a support part comprising a tray installed on the top of the mounting plate, a clamping block is arranged on the front side of the top of the tray, an arc-shaped groove is arranged on the top of the clamping block, a plurality of groups of supporting rods are arranged on the other side of the top of the tray, and the supporting rods are arranged in a triangular shape; at least two groups of fixing blocks are arranged on the front end of the clamping block and one side of the supporting rod respectively, and a locking plate is rotatably arranged on the top of the fixing block; a plurality of groups of springs are arranged between the supporting rods and the clamping block, the springs are fixed on the top of the tray, a top block is arranged on the top of the spring, and the top block is in contact with the bottom of the sensor.

[0008] Further, a torsion spring is arranged at the connection between the locking plate and the fixing block.

[0009] Further, the support part is made of polytetrafluoroethylene material.

[0010] Further, a plurality of slide rails are arranged on the inner side of the containing box, and the mounting plate is slidably installed between the two groups of slide rails.

[0011] Further, a handle is arranged on the outer side of the mounting plate.

[0012] The sensor high-low temperature test box provided by the application has the advantages that the sensor can be quickly fixed and disassembled before testing through the arrangement of the support part, the design of the spring and the top block makes the sensor installation and disassembly process on the tray more convenient and fast, and the practicality of the device is increased.

[0013] In addition to the purposes, features and advantages described above, the application has other purposes, features and advantages. The application will be further described below with reference to the drawings. BRIEF DESCRIPTION OF DRAWINGS

[0014] The drawings accompanying the specification of the application form a part of the specification and serve to further illustrate the application, its exemplary embodiments and its description, and do not constitute an improper limitation of the application. In the drawings:

[0015] Figure 1 It is the overall schematic view of the sensor high-low temperature test box in the application;

[0016] Figure 2 It is Figure 1 the internal structure schematic view of the containing box in the application;

[0017] Figure 3 It is Figure 2 the structure schematic view of the support part in the application;

[0018] In the drawings, various reference signs represent:

[0019] 1. High and low temperature test chamber; 11. Base; 12. Cooling chamber; 13. Heating chamber; 14. Control panel; 2. Housing box; 21. Slide rail; 22. Mounting plate; 23. Handle; 3. Fixing assembly; 31. Tray; 4. Support part; 41. Locking block; 42. Groove; 43. Support rod; 44. Fixing block; 45. Locking plate; 46. Spring; 47. Top block. Detailed Implementation

[0020] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.

[0021] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort should fall within the scope of protection of the present application.

[0022] like Figures 1-2 As shown, this application provides a sensor high and low temperature test chamber, including a high and low temperature test chamber 1, which is installed in a sensor factory for conducting high and low temperature tests on sensors after production, thereby evaluating the production quality of the products.

[0023] The high and low temperature test chamber 1 includes a base 11, and a housing 2 is provided on the top of the base 11. The housing 2 is used to place electronic components such as sensors to be tested. A cooling chamber 12 and a heating chamber 13 are integrated inside the base 11. The cooling chamber 12 and the heating chamber 13 are both connected to the housing 2 and provide cooling and heating functions respectively. A control panel 14 is also provided on the outside. The operator can easily set and adjust the temperature through the control panel 14, so that the temperature inside the housing 2 can be freely changed under the operator's control. The high and low temperature test chamber 1 is a traditional cold and heat test chamber, and no further restrictions are imposed here.

[0024] like Figures 2-3 As shown, the inner side of the housing 2 is provided with multiple sets of slide rails 21, and an installation plate 22 is slidably installed between two sets of slide rails 21. A fixing component 3 is provided on the top of the installation plate 22, which is used to install the sensor. A handle 23 is provided on the outer side of the installation plate 22, which is suitable for the operator to pull the installation plate 22 out of the housing 2.

[0025] The fixing assembly 3 comprises a tray 31 detachably mounted on the top of the mounting plate 22, facilitating the mounting and dismounting of the sensor and allowing different specifications of the tray 31 to be replaced according to actual needs, and the tray 31 is provided with a supporting part 4, which comprises a clamping block 41 fixedly installed on the top of the tray 31 at the front side of one side, and the top of the clamping block 41 is provided with an arc-shaped groove 42, the size of which is matched with the size of the front end of the sensor, ensuring the stability and accuracy of the sensor during installation.

[0026] Meanwhile, a plurality of supporting rods 43 are arranged on the other side of the top of the tray 31, and the supporting rods 43 are arranged in a triangular shape and used to support the rear half of the sensor, thereby enhancing the firmness of the entire supporting structure, and when the sensor is installed, it is stably installed on the top of the tray 31 through the joint action of the supporting rods 43 and the clamping block 41.

[0027] Meanwhile, a fixing block 44 is arranged at the front end of the clamping block 41 and one side of the supporting rod 43, the top of the fixing block 44 is rotatably connected with a locking plate 45, the locking plate 45 is used to contact the top of the sensor, and a torsional spring is arranged at the connection between the locking plate 45 and the fixing block 44, when installed, first rotate the two locking plates 45, then install the sensor on the top of the clamping block 41 and the supporting rod 43, and finally release the locking plate 45, so that the locking plate 45 returns to the original position under the action of the torsional spring and tightly contacts the top of the sensor, thereby firmly fixing the sensor on the tray 31.

[0028] Meanwhile, a plurality of springs 46 are arranged between the supporting rod 43 and the clamping block 41, the springs 46 are fixed on the top of the tray 31, and a top block 47 is fixedly installed on the top of the spring 46, the top block 47 contacts the bottom of the sensor, when the sensor is installed, the sensor first contacts the top block 47, the top block 47 is pressed and the spring 46 is compressed, so that it is deformed, the test sensor continues to move downward until it is fixed by the clamping block 41 and the locking plate 45, and when the sensor needs to be removed, first release the sensor from the locking plate 45, the spring 46 begins to recover the deformation and drives the top block 47 to move upward, under the action of the restoring force of the spring 46, the top block 47 pushes the sensor outward, at this time, the worker can easily remove the sensor.

[0029] In order to quickly remove the sensor from the tray 31 after testing, the supporting part 4 is made of polytetrafluoroethylene material with smooth surface, even if the shell of the sensor melts during high-temperature testing, the molten material will not adhere to the supporting part 4, thereby simplifying the dismounting process of the sensor and avoiding additional cleaning work caused by adhesion.

[0030] In summary, the device is provided by setting the support part 4, so that the sensor can be quickly fixed and disassembled before testing, and the design of the spring 46 and the top block 47 makes the sensor installation and disassembly process on the tray 31 more convenient and fast, increasing the practicability of the device.

[0031] The above only describes the preferred embodiments of the present application and is not intended to limit the present application. Those skilled in the art can make various modifications and changes to the present application. Any modification, equivalent replacement, improvement, etc. within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A sensor high-low temperature test chamber, characterized by: Include: Accommodation box (2); Mounting plate (22), the mounting plate (22) is installed inside the accommodation box (2); Support part (4), the support part (4) includes a tray (31) installed on the top of the mounting plate (22), the top of the tray (31) is provided with a clamping block (41) on the front side, the top of the clamping block (41) is provided with an arc-shaped groove (42), the other side of the top of the tray (31) is provided with a plurality of groups of supporting rods (43), the supporting rods (43) are arranged in a triangular shape; At least two groups of fixing blocks (44), two groups of the fixing blocks (44) are respectively arranged at the front end of the clamping block (41) and one side of the supporting rod (43), the top of the fixing block (44) is rotatably provided with a locking plate (45); A plurality of springs (46) are arranged between the supporting rod (43) and the clamping block (41), the spring (46) is fixed on the top of the tray (31), the top of the spring (46) is provided with a top block (47), and the top block (47) is in contact with the bottom of the sensor.

2. The sensor high-low temperature test chamber of claim 1, wherein: The connecting part of the locking plate (45) and the fixing block (44) is provided with a torsion spring.

3. The sensor high-low temperature test chamber of claim 2, wherein: The support part (4) is made of polytetrafluoroethylene material.

4. The sensor high-low temperature test chamber of claim 1, wherein: The inner side of the accommodation box (2) is provided with a plurality of slide rails (21), and the mounting plate (22) is slidably installed between the two groups of slide rails (21).

5. The sensor high-low temperature test chamber of claim 4, wherein: The outer side of the mounting plate (22) is provided with a handle (23).

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